CN112462177A - Method for positioning critical point between induction areas of Hall element - Google Patents
Method for positioning critical point between induction areas of Hall element Download PDFInfo
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- CN112462177A CN112462177A CN202011274854.0A CN202011274854A CN112462177A CN 112462177 A CN112462177 A CN 112462177A CN 202011274854 A CN202011274854 A CN 202011274854A CN 112462177 A CN112462177 A CN 112462177A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention relates to the technical field of Hall induction, and discloses a method for positioning a critical point between induction areas of a Hall element, which can make the Hall element enter and leave a magnetic field area of a magnetic element by repeatedly moving the Hall element, can approach the critical point between the induction areas of the Hall element step by step and finally accurately position according to the change of the trigger state of the Hall element, and has the advantages of small error, high precision and easy implementation; and because the Hall element can trigger the switch to respond at the position of the critical point of the induction zone of the Hall element each time, the operation precision of the equipment can be effectively improved by taking the position of the critical point of the induction zone of the Hall element as the initial position of the Hall element, namely, the positioning method provided by the invention can meet higher use requirements.
Description
Technical Field
The invention relates to the technical field of Hall induction, in particular to a method for positioning a critical point between induction areas of a Hall element.
Background
Because the N pole and the S pole of the magnetic element are distributed in a region in space, the induction zone of the Hall element is influenced by the distribution region and the intensity of the magnetic field, and the Hall element is also influenced by the temperature and the self magnetic induction sensitivity, when the Hall element is close to the magnetic field region, the position of triggering the response of the switch is a region rather than a determined point. In practical application, however, the hall element is often required to trigger the switch response at an absolute fixed point position each time, and the operation accuracy of the device can be improved by taking the fixed point position as the initial position of the hall element. However, the positioning error in the prior art is large, and it is difficult to accurately find the absolute fixed point position of the hall element trigger switch response, so that the higher use requirement cannot be met.
Disclosure of Invention
The invention aims to provide a method for positioning a critical point between induction areas of a Hall element, which has the advantages of small error, high precision and easy implementation.
In order to achieve the above object, the present invention provides a method for positioning a critical point between sensing regions of a hall element, comprising the steps of:
s1, moving the Hall element from the outside of the magnetic field area of the magnetic element to the inside of the magnetic field area of the magnetic element along the first direction until the Hall element is triggered to be in an opening state, and immediately stopping moving, wherein the position of the Hall element is the first position;
s2, moving the Hall element from the first position to the outside of the magnetic field area of the magnetic element along the second direction until the Hall element is triggered to be in the closed state, and immediately stopping moving, wherein the position of the Hall element is the second position;
s3, moving the Hall element from the second position to the magnetic field area of the magnetic element along the first direction until the Hall element is triggered to be in an opening state, and immediately stopping moving, wherein the position of the Hall element is a third position;
s4, determining that the third position is the position of the critical point of the induction area of the Hall element, or executing the step S5;
s5, referring to the steps S2 and S3, the Hall element is continuously moved, and the position where the Hall element is located finally is the position where the critical point between the induction areas of the Hall element is located;
wherein the first direction is opposite to the second direction.
In the above positioning method, the hall element moves at a constant speed in each step.
In the above positioning method, for two steps adjacent in sequence, the moving speed of the hall element in the latter step is smaller than the moving speed of the hall element in the former step.
In the above positioning method, the magnetic element is a permanent magnet.
The invention provides a method for positioning a critical point between induction areas of a Hall element, which has the following beneficial effects compared with the prior art:
the positioning method provided by the invention has the advantages that the Hall element is repeatedly moved to enter and leave the magnetic field area of the magnetic element, meanwhile, the critical point of the induction area of the Hall element can be approached step by step according to the change of the trigger state of the Hall element, and finally, the positioning method is accurate, and has the advantages of small error, high precision and easy implementation; and because the Hall element can trigger the switch to respond at the position of the critical point of the induction zone of the Hall element each time, the operation precision of the equipment can be effectively improved by taking the position of the critical point of the induction zone of the Hall element as the initial position of the Hall element, namely, the positioning method provided by the invention can meet higher use requirements.
Drawings
FIG. 1 is a diagram illustrating step S1 according to an embodiment of the present invention;
FIG. 2 is a diagram illustrating step S2 according to an embodiment of the present invention;
FIG. 3 is a diagram illustrating step S3 according to an embodiment of the present invention;
fig. 4 is a flowchart illustrating a positioning method according to an embodiment of the present invention.
In the figure: 1. a magnetic element; 2. a Hall element.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be understood that the terms "first" and "second" are used for descriptive purposes only to distinguish one type of technical feature from another, and are not to be construed as indicating or implying any relative importance, order or quantity of such technical features, i.e., a "first" technical feature may be referred to as a "second" technical feature, a "second" technical feature may also be referred to as a "first" technical feature, and a technical feature defined as "first" or "second" may explicitly or implicitly include one or more such technical features. In addition, unless otherwise specified, "a plurality" means two or more.
Referring to fig. 1 to 4, an embodiment of the present invention provides a method for positioning a critical point between sensing regions of a hall element 2, which includes the following steps:
s1, keeping the magnetic element 1 fixed, moving the hall element 2 from the outside of the magnetic field area of the magnetic element 1 to the inside of the magnetic field area of the magnetic element 1 along the first direction, and immediately stopping moving until the hall element 2 is triggered to be in an on state, where the position of the hall element 2 is the first position a;
s2, moving the Hall element 2 from the first position A to the outside of the magnetic field area of the magnetic element 1 along the second direction until the Hall element 2 is triggered to be in the off state, and immediately stopping moving, wherein the position of the Hall element 2 is the second position B;
s3, moving the Hall element 2 from the second position B to the magnetic field area of the magnetic element 1 along the first direction until the Hall element 2 is triggered to be in an opening state, and immediately stopping moving, wherein the position of the Hall element 2 is a third position C;
s4, after positioning is finished, determining a third position C as the position of a critical point between induction areas of the Hall element 2, and taking the position as the initial position of the Hall element 2;
wherein the first direction is opposite to the second direction.
Alternatively, if it is required to more accurately position the critical point between the sensing regions of the hall element 2, the following steps may be directly performed after step S3:
s5, referring to steps S2 and S3, the hall element 2 is moved continuously, and a fourth position, a fifth position or more positions are obtained in sequence, where the final position of the hall element 2 is the position where the critical point between the sensing areas of the hall element 2 is located, and the position is used as the initial position of the hall element 2.
Compared with the prior art, the positioning method provided by the embodiment of the invention has the advantages that the Hall element 2 is repeatedly moved to enter and leave the magnetic field area of the magnetic element 1, meanwhile, the critical point of the induction area of the Hall element 2 can be approached step by step according to the change of the trigger state of the Hall element 2, and finally, the positioning is accurate, and the method has the advantages of small error, high precision and easiness in implementation; and because the hall element 2 can trigger the switch to respond at the position of the critical point of the induction zone of the hall element at each time, the operation precision of the equipment can be effectively improved by taking the position of the critical point of the induction zone of the hall element 2 as the initial position of the hall element 2, namely, the positioning method provided by the embodiment of the invention can meet higher use requirements.
Preferably, in this embodiment, in order to avoid or reduce as much as possible the error caused by the moving speed of the hall element 2 to the final positioning of the critical point in the sensing area, the hall element 2 moves at a constant speed in each step.
Further, for two steps adjacent in sequence, the moving speed of the hall element 2 in the latter step is smaller than the moving speed of the hall element 2 in the former step.
Illustratively, the moving speed of the hall element 2 in step S1 is V1In step S2, the moving speed of the hall element 2 is V2In step S3, the moving speed of the hall element 2 is V3Then V is1>V2>V3。
Preferably, in the present embodiment, the magnetic element 1 is a permanent magnet.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and substitutions can be made without departing from the technical principle of the present invention, and these modifications and substitutions should also be regarded as the protection scope of the present invention.
Claims (4)
1. A method for positioning critical points in an induction zone of a Hall element is characterized by comprising the following steps:
s1, moving the Hall element from the outside of the magnetic field area of the magnetic element to the inside of the magnetic field area of the magnetic element along the first direction until the Hall element is triggered to be in an opening state, and immediately stopping moving, wherein the position of the Hall element is the first position;
s2, moving the Hall element from the first position to the outside of the magnetic field area of the magnetic element along the second direction until the Hall element is triggered to be in the closed state, and immediately stopping moving, wherein the position of the Hall element is the second position;
s3, moving the Hall element from the second position to the magnetic field area of the magnetic element along the first direction until the Hall element is triggered to be in an opening state, and immediately stopping moving, wherein the position of the Hall element is a third position;
s4, determining that the third position is the position of the critical point of the induction area of the Hall element, or executing the step S5;
s5, referring to the steps S2 and S3, the Hall element is continuously moved, and the position where the Hall element is located finally is the position where the critical point between the induction areas of the Hall element is located;
wherein the first direction is opposite to the second direction.
2. The method for locating the critical point between the induction zones of a hall element as claimed in claim 1, wherein:
in each step, the Hall element moves at a constant speed.
3. The method for locating the critical point between the induction zones of the hall element according to claim 2, wherein:
for two steps adjacent in sequence, the moving speed of the hall element in the latter step is smaller than that in the former step.
4. The method for locating the critical point between the induction zones of a hall element as claimed in claim 1, wherein:
the magnetic element is a permanent magnet.
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Cited By (1)
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CN115267622A (en) * | 2022-07-19 | 2022-11-01 | 中国科学院近代物理研究所 | Hall probe sensing area space positioning and calibrating device and using method thereof |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115267622A (en) * | 2022-07-19 | 2022-11-01 | 中国科学院近代物理研究所 | Hall probe sensing area space positioning and calibrating device and using method thereof |
CN115267622B (en) * | 2022-07-19 | 2023-07-18 | 中国科学院近代物理研究所 | Hall probe sensing area space positioning and calibrating device and using method thereof |
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