CN112433150A - Rapid mechanical switch testing system and method for high-voltage direct-current circuit breaker - Google Patents

Rapid mechanical switch testing system and method for high-voltage direct-current circuit breaker Download PDF

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Publication number
CN112433150A
CN112433150A CN202011353874.7A CN202011353874A CN112433150A CN 112433150 A CN112433150 A CN 112433150A CN 202011353874 A CN202011353874 A CN 202011353874A CN 112433150 A CN112433150 A CN 112433150A
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CN
China
Prior art keywords
voltage
mechanical switch
tested
equipment
switching
Prior art date
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Pending
Application number
CN202011353874.7A
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Chinese (zh)
Inventor
秦逸帆
徐党国
龙凯华
宁琳如
彭兆伟
蔡巍
赵媛
张静岚
卢毅
谢丽芳
杨大伟
杨敏祥
牛铮
李志刚
李大卫
崔贺平
吴刚
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State Grid Corp of China SGCC
North China Electric Power Research Institute Co Ltd
Electric Power Research Institute of State Grid Jibei Electric Power Co Ltd
Original Assignee
State Grid Corp of China SGCC
North China Electric Power Research Institute Co Ltd
Electric Power Research Institute of State Grid Jibei Electric Power Co Ltd
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Application filed by State Grid Corp of China SGCC, North China Electric Power Research Institute Co Ltd, Electric Power Research Institute of State Grid Jibei Electric Power Co Ltd filed Critical State Grid Corp of China SGCC
Priority to CN202011353874.7A priority Critical patent/CN112433150A/en
Publication of CN112433150A publication Critical patent/CN112433150A/en
Priority to PCT/CN2021/117033 priority patent/WO2022110963A1/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272Apparatus, systems or circuits therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272Apparatus, systems or circuits therefor
    • G01R31/3274Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H71/00Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
    • H01H71/10Operating or release mechanisms
    • H01H71/12Automatic release mechanisms with or without manual release
    • H01H71/24Electromagnetic mechanisms
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/53Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback
    • H03K3/57Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback the switching device being a semiconductor device

Abstract

The embodiment of the specification provides a system and a method for testing a quick mechanical switch of a high-voltage direct-current circuit breaker. The system comprises: the device comprises a plurality of to-be-tested quick mechanical switches arranged in series, at least one position sensor arranged in the to-be-tested quick mechanical switches, impulse voltage generating equipment, voltage measuring equipment and computer equipment, wherein the computer equipment can send a switching-off command, when the to-be-tested quick mechanical switches reach a preset opening distance, a discharging command is sent to the impulse voltage generating equipment, and after the impulse voltage generating equipment finishes discharging, the voltage withstanding capability of the to-be-tested quick mechanical switches is determined according to motion information in the switching-off process of the to-be-tested quick mechanical switches, impulse voltage generated by the impulse voltage generating equipment and voltage change in the switching-off process of the to-be-tested quick mechanical switches, so that the accuracy of the dynamic voltage-sharing performance test of the main branch quick mechanical switch of the high-voltage direct-current circuit breaker is improved.

Description

Rapid mechanical switch testing system and method for high-voltage direct-current circuit breaker
Technical Field
The embodiment of the specification relates to the technical field of high voltage and insulation, in particular to a rapid mechanical switch testing system and method for a high-voltage direct-current circuit breaker.
Background
In recent years, the flexible direct-current transmission technology has rapidly developed by virtue of the advantages of independent and flexible power regulation capability, small harmonic content, no need of inter-station communication, capability of providing alternating-current voltage support for wind power plants and the like. Compared with an alternating current system, direct current fault current lacks a natural zero point, reliable on-off needs to be realized, a current zero point needs to be artificially created, and huge energy stored in inductive elements of the direct current system needs to be absorbed, so that the design difficulty of the direct current circuit breaker is greatly increased compared with the alternating current circuit breaker. The high-voltage direct-current circuit breaker is used as core equipment for cutting off fault current and plays an important role in guaranteeing stable operation of a flexible direct-current power grid.
The quick mechanical switch is one of core components of the high-voltage direct-current circuit breaker, can establish insulation within a few milliseconds, and provides guarantee for the successful on-off of the high-voltage direct-current circuit breaker. Because the voltage level of the direct current system is improved, a main branch of the direct current circuit breaker needs to be connected with a plurality of quick mechanical switches in series, and when a fault occurs, the plurality of quick mechanical switches need to reach effective opening distance in a short time to endure operation overvoltage.
Because the direct current circuit breaker is connected with a plurality of quick mechanical switches in series and has a high operation impulse voltage value, once a good voltage-sharing measure is not taken or a single switch does not reach a specified position within a required time, the impulse voltage borne by the direct current circuit breaker is higher than that of other switches, so that the switch is broken down, and then the other switches are broken down successively.
Therefore, the dynamic voltage-sharing performance of the main branch fast mechanical switch of the high-voltage direct-current circuit breaker is an important index for ensuring the reliable on-off of equipment. Because the theory of operation and the operating mode of high voltage direct current circuit breaker are different from alternating current circuit breaker, do not have international or national standard to refer to at present, lead to the assurance to quick mechanical switch's whole situation not enough for quick mechanical switch's performance detection accuracy is not high.
Disclosure of Invention
An object of the embodiments of the present specification is to provide a system and a method for testing a fast mechanical switch of a high-voltage dc circuit breaker, so as to improve accuracy of testing a dynamic voltage-sharing performance of a fast mechanical switch of a main branch of the high-voltage dc circuit breaker.
In order to solve the above problem, an embodiment of the present specification provides a rapid mechanical switch testing system for a high voltage dc circuit breaker, including: the device comprises a plurality of to-be-tested quick mechanical switches arranged in series, at least one position sensor arranged in the to-be-tested quick mechanical switches, impulse voltage generation equipment, voltage measurement equipment and computer equipment; the rapid mechanical switch to be tested is in a switching-on state and is used for starting switching-off according to a switching-off instruction sent by computer equipment; the position sensor is used for generating a position signal according to motion information in the brake opening process of the rapid mechanical switch to be detected; the impulse voltage generating equipment is electrically connected with the fast switch to be tested and used for generating impulse voltage at two ends of the fast mechanical switch to be tested according to a discharging instruction sent by computer equipment; the voltage measuring equipment is electrically connected with the rapid mechanical switch to be tested and the impulse voltage generating equipment and is used for generating a first voltage signal according to the voltage change in the switching-off process of the rapid mechanical switch to be tested; generating a second voltage signal according to the impulse voltage generated by the impulse voltage generating device; the computer equipment is used for sending a switching-off instruction and sending a discharging instruction to the impulse voltage generating equipment when the quick mechanical switch to be tested reaches a preset opening distance; and after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the rapid mechanical switch to be tested according to the position signal, the first voltage signal and the second voltage signal.
In order to solve the above problem, an embodiment of the present specification further provides a method for testing a fast mechanical switch of a high voltage direct current circuit breaker applied to the above system, where the method includes: sending a brake opening instruction to indicate the rapid mechanical switch to be tested to perform brake opening; when the quick mechanical switch to be tested reaches a preset opening distance, sending a discharge instruction to impulse voltage generation equipment to indicate the impulse voltage generation equipment to generate impulse voltage at two ends of the quick mechanical switch to be tested; after the impulse voltage generating equipment finishes discharging, determining the voltage endurance capacity of the rapid mechanical switch to be tested according to the motion information in the switching-off process of the rapid mechanical switch to be tested, the impulse voltage generated by the impulse voltage generating equipment and the voltage change in the switching-off process of the rapid mechanical switch to be tested.
According to the technical scheme provided by the embodiment of the specification, the embodiment of the specification builds a rapid mechanical switch testing system of the high-voltage direct-current circuit breaker, and comprises a plurality of rapid mechanical switches to be tested, at least one position sensor arranged in the rapid mechanical switches to be tested, impulse voltage generating equipment, voltage measuring equipment and computer equipment, wherein the rapid mechanical switches to be tested are arranged in series; the rapid mechanical switch to be tested is in a switching-on state and is used for starting switching-off according to a switching-off instruction sent by computer equipment; the position sensor is used for generating a position signal according to motion information in the brake opening process of the rapid mechanical switch to be detected; the impulse voltage generating equipment is electrically connected with the fast switch to be tested and used for generating impulse voltage at two ends of the fast mechanical switch to be tested according to a discharging instruction sent by computer equipment; the voltage measuring equipment is electrically connected with the rapid mechanical switch to be tested and the impulse voltage generating equipment and is used for generating a first voltage signal according to the voltage change in the switching-off process of the rapid mechanical switch to be tested; generating a second voltage signal according to the impulse voltage generated by the impulse voltage generating device; the computer equipment is used for sending a switching-off instruction and sending a discharging instruction to the impulse voltage generating equipment when the quick mechanical switch to be tested reaches a preset opening distance; after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the fast mechanical switch to be tested according to the position signal, the first voltage signal and the second voltage signal, so that the accuracy of the dynamic voltage-sharing performance test of the main branch fast mechanical switch of the high-voltage direct-current circuit breaker is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without any creative effort.
Fig. 1 is a schematic structural diagram of a rapid mechanical switch testing system of a high-voltage direct-current circuit breaker according to an embodiment of the present disclosure;
FIG. 2 is a schematic structural diagram of a fast mechanical switch to be tested according to an embodiment of the present disclosure;
fig. 3 is a flow chart of a fast mechanical switch testing method applied to the high voltage dc circuit breaker of the system of fig. 1 according to an embodiment of the present disclosure;
fig. 4 is a timing diagram illustrating an implementation of a fast mechanical switch testing method applied to the hvdc breaker of the system shown in fig. 1 according to an embodiment of the present disclosure;
fig. 5 is a functional block diagram of an electronic device according to an embodiment of the present disclosure.
Description of reference numerals:
1. a vacuum arc-extinguishing chamber; 2. a switch mechanism link; 3. a switch bracket; 4. a brake separating coil; 5. a repulsive force plate; 6. a closing coil; 7. a switching section; 8. a buffer mechanism; 9. a position sensor; 10. a position sensor; 11. a position sensor; 12. a voltage-sharing resistor; 13. a voltage-sharing capacitor; 14. an upper wire holder; 15. a lower wiring seat; 16. a conductive copper bar; 17. a fast mechanical switch; 18. a high voltage dc circuit breaker cradle; 19. a surge voltage generating device; 20. a pulse transformer; 21. a computer device; 22. high voltage direct current breaker main branch.
Detailed Description
The embodiment of the specification provides a rapid mechanical switch testing system and a rapid mechanical switch testing method for a high-voltage direct-current circuit breaker. In order to make those skilled in the art better understand the technical solutions in the embodiments of the present disclosure, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present specification without any creative effort shall fall within the protection scope of the present specification.
In an embodiment of the present description, the high voltage dc circuit breaker is a circuit breaker incorporating power electronics for breaking a dc circuit. The high-voltage direct-current circuit breaker can not only cut off and connect a high-voltage line and various no-load and load currents when a power system normally operates, but also automatically switch various overload and short-circuit currents under the action of a relay protection device when the power system breaks down, so that the accident range is prevented from being enlarged.
In the embodiment of the specification, arc extinction is difficult because the direct current does not have a zero crossing point like the alternating current and the overvoltage is high; in addition, the inductance of the dc circuit is large, and therefore, the energy to be absorbed by the dc circuit breaker is large. To address this problem, existing high voltage direct current circuit breakers may be classified into mechanical high voltage direct current circuit breakers, solid state high voltage direct current circuit breakers, and hybrid high voltage direct current circuit breakers. The mechanical direct current breaker can cut off very large current, has the advantages of low cost, low loss and the like, but has lower breaking speed; the solid-state direct current breaker is high in breaking speed, high in related loss and high in price; to overcome the disadvantages of both, a hybrid circuit breaker may be formed by integrating a mechanical dc circuit breaker and a solid-state dc circuit breaker into one device. The hybrid direct current breaker combines the good static characteristic of a mechanical switch and the good dynamic performance of a power electronic device, conducts normal running current by using a quick mechanical switch, and breaks short-circuit current by using a solid power electronic device, has the advantages of small on-state loss, short on-off time, no need of special cooling equipment and the like, and is a new direction for the research and development of the current high-voltage direct current breaker.
The quick mechanical switch is one of core components of the high-voltage direct-current circuit breaker, can establish insulation within a few milliseconds, and provides guarantee for the successful on-off of the high-voltage direct-current circuit breaker. Therefore, the dynamic voltage-sharing performance of the main branch fast mechanical switch of the high-voltage direct-current circuit breaker is an important index for ensuring the reliable on-off of equipment. Because the theory of operation and the operating mode of high voltage direct current circuit breaker are different from alternating current circuit breaker, do not have international or national standard to refer to at present, lead to the assurance to quick mechanical switch's whole situation not enough for quick mechanical switch's performance detection accuracy is not high. Considering that if the process of breaking the direct-current fault current of the high-voltage direct-current circuit breaker when the direct-current system fails can be simulated, the voltage resistance of the quick mechanical switch is determined according to the voltage generated at two ends of the quick mechanical switch when the direct-current system fails, the voltage change at two ends of the quick mechanical switch in the process of breaking the direct-current fault current of the high-voltage direct-current circuit breaker and the motion information of the quick mechanical switch in the opening process, the problem is expected to be solved, and therefore the accuracy of the dynamic voltage-sharing performance test of the main branch quick mechanical switch of the high-voltage direct-current circuit breaker is improved. Based on this, this specification embodiment provides a quick mechanical switch test system of high voltage direct current circuit breaker.
Referring to fig. 1, fig. 1 is a functional structure diagram of a fast mechanical switch testing system of a high voltage dc circuit breaker according to an embodiment of the present disclosure. The rapid mechanical switch testing system of the high-voltage direct-current circuit breaker can comprise a plurality of rapid mechanical switches 17 to be tested which are arranged in series, and at least one position sensor, impulse voltage generating equipment, voltage measuring equipment and computer equipment 21 which are arranged in the rapid mechanical switches 17 to be tested.
In some embodiments, as shown in fig. 2, fig. 2 is a schematic structural diagram of the fast mechanical switch 17 to be tested according to an embodiment of the present disclosure. The fast mechanical switch 17 may include a vacuum arc-extinguishing chamber 1, a switching mechanism connecting rod 2, a switch bracket 3, a switching-off coil 4, a repulsive force disc 5, a closing coil 6, a switching section 7, a position sensor 9, a position sensor 10, a position sensor 11, an upper wire holder 14 and a lower wire holder 15.
Specifically, the upper terminal 14 and the lower terminal 15 may be used to conduct current and are wired and fixed when a plurality of fast mechanical switches 17 are connected in series; the switch bracket 3 can be used for fixing a quick mechanical switch 17; the switch mechanism connecting rod 2 is connected with the vacuum arc-extinguishing chamber 1 and the repulsion plate 5, and can control the switch to be opened or closed through the up-and-down motion; the opening coil 6 is fixed on the switch bracket 3 and used for being electrified when receiving an opening instruction; the repulsion plate 5 is connected with the switching mechanism connecting rod 2 and is used for generating repulsion when the opening coil is electrified and driving the switching mechanism connecting rod 2 and the moving contact of the switching mechanism connecting rod 2 to move downwards so as to perform opening; the repulsion plate 5 is also used for generating suction force when the closing coil is electrified and driving the switching mechanism connecting rod 2 and the moving contact connected with the switching mechanism connecting rod 2 to move upwards so as to perform closing; the closing coil 6 is fixed on the switch bracket 3 and used for electrifying when receiving a closing instruction
In some embodiments, the at least one position sensor generates a position signal according to the movement information during the opening of the fast mechanical switch 17 to be tested. Specifically, the position sensor may determine whether the repulsive disc moves to a designated position by observing the position of the repulsive disc. For example, the at least one position sensor may include a position sensor 9, a position sensor 10, and a position sensor 11, the position sensor 9, the position sensor 10, and the position sensor 11 are located on the switch bracket 3, before starting the test, the fast mechanical switch 17 to be tested is in a closed state, the repulsive disc 5 is located at the same height as the position sensor 9, after the fast mechanical switch 17 to be tested receives a brake opening instruction, the repulsive disc drives the switch mechanism link 2 and the moving contact of the switch mechanism link 2 to move downward, the position sensor 9 may detect whether the repulsive disc 5 starts to move downward, and the position sensor 10 and the position sensor 11 may detect whether the repulsive disc 5 moves to a position at the same height as the position sensor 10 and the position sensor 11.
In some embodiments, the fast mechanical switch 17 may further comprise a damping mechanism 8 located below the switch mechanism link 2 for damping forces generated during the switching action.
In some embodiments, the fast mechanical switch 17 may further include a voltage-sharing circuit, where the voltage-sharing circuit includes a voltage-sharing resistor 12 and a voltage-sharing capacitor 13, and is connected in parallel with the vacuum interrupter 1, so as to ensure that the voltages of the fast mechanical switches 17 are consistent when a plurality of fast mechanical switches 17 are connected in series.
In some embodiments, as shown in fig. 2, a plurality of fast mechanical switches 17 under test constitute a main branch 22 of the hvdc breaker. Wherein, for a high voltage direct current breaker, the number of the main branch quick mechanical switches 17 can be determined according to the equipment voltage level.
In some embodiments, a plurality of fast mechanical switches 17 to be tested are disposed on the hvdc breaker frame 18 and are connected in series by the conductive copper bars 16 to form the main branch 22 of the hvdc breaker. The conductive copper bar 16 is respectively connected with the lower wiring seat 15 of the upper-level quick mechanical switch 17 to be tested and the upper wiring seat 14 of the lower-level quick mechanical switch 17 to be tested. The wire holder 14 on the first-stage fast mechanical switch 17 to be tested can be electrically connected with the impulse voltage generating device 19; the connection to ground is possible for the connection base 15 of the final fast mechanical switch 17.
In the embodiment of the present disclosure, the impulse voltage generating device 19 is electrically connected to the fast switch to be tested, and after the computer device 21 sends a discharging instruction, impulse voltages are generated at two ends of the fast mechanical switch 17 to be tested, so as to simulate a process of switching on/off a dc fault current of the high-voltage dc circuit breaker when a dc system fails.
In some embodiments, the surge voltage generation device 19 may include a surge voltage generator and a pulse transformer 20. The impulse voltage generator is a high voltage generating device which generates pulse waves and is used for researching the insulation performance of electric equipment when the electric equipment is subjected to atmospheric overvoltage and operation overvoltage. As shown in fig. 2, the surge voltage generator may comprise a Marx loop. The Marx loop is a circuit which is invented by German scientist Marx in 1925 and is used for realizing high-voltage output by charging capacitors in parallel and discharging capacitors in series. The Marx loop comprises multiple stages of switch gaps, in the series discharging process, the front stages of switch gaps need to be triggered to discharge, and the rear stages of switch gaps are sequentially conducted, so that the discharging process is realized. Specifically, in the discharging process, the switch gaps of the previous stages are not discharged, the switch gaps of the next stages are not discharged, if the switch gaps of the previous stages are discharged, the switch gaps of the next stages are discharged one by one in sequence, the switch gap synchronization effect is good, and otherwise, the synchronization effect is not good.
In some embodiments, the Marx loop may further include a wave head resistor and a wave tail resistor for generating a surge voltage of a preset waveform. Specifically, the impulse voltage of the waveform meeting the test requirement can be output by adjusting the wave head resistance and the wave tail resistance.
In some embodiments, the pulse transformer 20 is a transformer that generates a pulse wave electromotive force. In the present embodiment, the pulse transformer 20 may be used to achieve synchronous triggering of the surge voltage. Specifically, the pulse transformer 20 may trigger the discharging of the first N-stage switch gaps, and sequentially turn on the following switch gaps, thereby improving the synchronization effect of the switch gaps. Wherein N can be a natural number greater than 2, preferably N can be 2 or 3.
In some embodiments, the pulse transformer 20 is constructed similar to a typical control transformer and may be constructed with an electrically conductive winding and a magnetically conductive core. In order to realize synchronous triggering, the pulse transformer 20 may be a hundred kilovolts pulse transformer with high magnetic permeability and high saturation magnetic induction. In order to realize high-speed triggering, a peaking capacitor can be used, a sharpening switch with a special structural design is used, microsecond-level front edge pulse voltage output by a secondary side of the pulse transformer is sharpened, and finally nanosecond-level front edge steep pulses are generated on a load.
In some embodiments, the surge voltage generation device 19 may also be electrically connected to the voltage measurement device, for example, by a high voltage wire. When the surge voltage generating device generates a surge voltage, the voltage measuring device may generate a second voltage signal according to the surge voltage generated by the surge voltage generating device and transmit the second voltage signal to the computer device 21.
In some embodiments, the voltage measuring device may also be electrically connected to each fast mechanical switch 17 under test. Specifically, the voltage measuring device and each of the upper wire holder 14 and the lower wire holder 15 of the fast mechanical switch 17 to be measured may be connected by using a high-voltage wire, so that the voltage measuring device measures the voltage change in the opening process of the fast mechanical switch 17 to be measured when the impulse voltage generating device generates the impulse voltage, generates the first voltage signal, and sends the first voltage signal to the computer device 21.
In some embodiments, the computer device 21 may be configured to send a switching-off command, and send a discharging command to the impulse voltage generating device when the fast mechanical switch 17 to be tested reaches a preset opening distance; and after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the rapid mechanical switch 17 to be tested according to the position signal, the first voltage signal and the second voltage signal. Specifically, the computer device 21 may include an instruction generator, configured to send a discharging instruction to the impulse voltage generating device when the rapid mechanical switch 17 to be tested reaches a preset opening distance; and the signal collector is used for collecting a position signal generated by the position sensor according to the motion information in the switching-off process of the rapid mechanical switch 17 to be measured, and a first voltage signal and a second voltage signal sent by the voltage measuring equipment.
Specifically, after the computer device 21 sends the opening instruction, the fast mechanical switch 17 to be tested starts opening, and the computer device 21 determines whether the fast mechanical switch 17 to be tested reaches the preset opening distance according to the position signal generated by the position sensor. Because the computer device 21 sends the discharge instruction to the impulse voltage generating device starts to discharge with a certain delay, the computer device can send the discharge instruction when judging that the rapid mechanical switch 17 to be tested reaches the preset opening distance, so that when the impulse voltage generating device starts to discharge, the rapid mechanical switch 17 to be tested is at the specified opening distance. And after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the rapid mechanical switch 17 to be tested according to the position signal, the first voltage signal and the second voltage signal. If it is determined according to the position signal, the first voltage signal and the second voltage signal that the fast mechanical switch 17 to be tested does not have distance movement, the movement deviation of the fast mechanical switch 17 to be tested and the deviation of the withstand voltage of the fast mechanical switch 17 to be tested are both within the allowable range, and the fast mechanical switch 17 to be tested does not have phenomena of discharging, flashover and the like, it can be considered that the fast mechanical switch 17 to be tested passes the test.
In some embodiments, the system may further include a control protection device, configured to receive a switching-off instruction sent by the computer device 21, and send the switching-off instruction to the fast mechanical switch 17 to be tested; receiving a position signal generated by the at least one position sensor, sending the position signal to the computer device 21.
In some embodiments, the control protection device may include a controller, configured to receive a switching-off instruction sent by the computer device 21, and energize a switching-off coil according to the switching-off instruction, so as to switch off the fast mechanical switch 17 to be tested; and the information collector is used for collecting the position signal generated by the position sensor and sending the position signal to the computer equipment 21.
In some embodiments, the computer device 21 may establish communication connections with the surge voltage generation device, the voltage measurement device, and the control protection device, respectively, for information transfer. Specifically, the communication connection may include a wired connection, such as a wired connection established by connecting a data line; the communication connection may also include a wireless connection, such as by way of a wireless network.
According to the technical scheme provided by the embodiment of the specification, the embodiment of the specification builds a rapid mechanical switch testing system of the high-voltage direct-current circuit breaker, and comprises a plurality of rapid mechanical switches to be tested, at least one position sensor arranged in the rapid mechanical switches to be tested, impulse voltage generating equipment, voltage measuring equipment and computer equipment, wherein the rapid mechanical switches to be tested are arranged in series; the rapid mechanical switch to be tested is in a switching-on state and is used for starting switching-off according to a switching-off instruction sent by computer equipment; the position sensor is used for generating a position signal according to motion information in the brake opening process of the rapid mechanical switch to be detected; the impulse voltage generating equipment is electrically connected with the fast switch to be tested and used for generating impulse voltage at two ends of the fast mechanical switch to be tested according to a discharging instruction sent by computer equipment; the voltage measuring equipment is electrically connected with the rapid mechanical switch to be tested and the impulse voltage generating equipment and is used for generating a first voltage signal according to the voltage change in the switching-off process of the rapid mechanical switch to be tested; generating a second voltage signal according to the impulse voltage generated by the impulse voltage generating device; the computer equipment is used for sending a switching-off instruction and sending a discharging instruction to the impulse voltage generating equipment when the quick mechanical switch to be tested reaches a preset opening distance; after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the fast mechanical switch to be tested according to the position signal, the first voltage signal and the second voltage signal, so that the accuracy of the dynamic voltage-sharing performance test of the main branch fast mechanical switch of the high-voltage direct-current circuit breaker is improved.
Please refer to fig. 3. The illustrated embodiment also provides a fast mechanical switch testing method applied to the high voltage direct current circuit breaker of the system as shown in fig. 1, which may include the following steps.
S310: sending a brake opening instruction to indicate the rapid mechanical switch to be tested to perform brake opening;
s320: when the quick mechanical switch to be tested reaches a preset opening distance, sending a discharge instruction to impulse voltage generation equipment to indicate the impulse voltage generation equipment to generate impulse voltage at two ends of the quick mechanical switch to be tested;
s330: after the impulse voltage generating equipment finishes discharging, determining the voltage endurance capacity of the rapid mechanical switch to be tested according to the motion information in the switching-off process of the rapid mechanical switch to be tested, the impulse voltage generated by the impulse voltage generating equipment and the voltage change in the switching-off process of the rapid mechanical switch to be tested.
In some embodiments, motion information of the rapid mechanical switch to be detected in the opening process can be detected according to a position sensor; correspondingly, whether the quick mechanical switch to be tested reaches a preset opening distance is judged according to the motion information.
Specifically, as shown in fig. 4, fig. 4 is a timing chart of the execution of the above method. Wherein, t0A brake opening instruction is sent to the computer equipment 21 to the moment of controlling the protection equipment, and the test is started at the moment; t is t1When the rapid mechanical switch 17 to be tested receives a brake opening instruction sent by the control protection device, repulsion is generated when the brake opening coil is electrified, and the moving contact of the switch mechanism connecting rod are driven to move downwards, so that brake opening is carried out. At the moment, the rapid mechanical switch starts to move, the motion information of the rapid mechanical switch to be detected in the opening process can be monitored through the position sensor 9, and the generated position signal is transmitted to the control protection equipment. Δ t1The time difference is a fixed time delay, namely the time difference from the time when the computer equipment sends the opening command to the time when the rapid mechanical switch to be tested starts opening.
In the examples of the present specification, t2The moment of issuing a discharge instruction for the computer device 21; at this time, the fast mechanical switch 17 to be tested has moved for a certain time, but does not reach the specified distance, because the computer device 21 controls to send the discharging instruction to the impulse voltage generating device, and then the impulse voltage generating device applies the impulse voltage to the fast mechanical switch 17 to be tested, there is a certain time delay, therefore, the computer device 21 needs to send the discharging instruction in advance to control the impulse voltage generating device to discharge. Wherein, Δ t2-1The time from the movement of the fast mechanical switch to be tested to the sending of the discharging instruction by the computer device 21, that is, the time of the movement of the fast mechanical switch to be tested with the preset opening distance is the fixed time delay.
In this specificationIn the examples, t3The moment when the surge voltage generation device receives the discharge command. At this time, the discharge command issued by the computer device 21 is received by the surge voltage generation device and is ready to issue a surge voltage. Δ t3-2The time delay of signal transmission is a fixed time delay, that is, the time difference between the discharge command sent by the computer device 21 and the channel discharge command received by the impulse voltage generating device.
In the examples of the present specification, t4And (3) starting to generate impulse voltage for impulse voltage generating equipment, and recording the moment of the impulse voltage waveform by voltage measuring equipment, wherein the moment is also the moment when the rapid mechanical switch to be tested moves to the specified opening distance. At this time, the surge voltage generating device finishes discharging and the withstand voltage is completed. Wherein, Δ t4-3The time from the receiving of the discharge command by the impulse voltage generating device to the completion of the discharge is a fixed time delay.
In the examples of the present specification,. DELTA.t4-1The time for the rapid mechanical switch to be measured to move to the specified opening distance is calculated. This delay should be a fixed delay. Under actual conditions, the impulse voltage is completely applied to the two ends of the fast mechanical switch to be tested of the main branch circuit at the moment.
In some embodiments, after the surge voltage generation device completes discharging, the voltage withstanding capability of the fast mechanical switch to be tested may be determined according to the position signal, the first voltage signal and the second voltage signal. If the quick mechanical switch to be tested is judged not to have distance movement according to the position signal, the first voltage signal and the second voltage signal, the movement deviation of the quick mechanical switch to be tested and the deviation of the withstand voltage of the quick mechanical switch to be tested are both within an allowable range, and the quick mechanical switch to be tested does not have phenomena of discharging, flashover and the like, the quick mechanical switch to be tested can be considered to pass the test.
According to the technical scheme provided by the embodiment of the specification, the testing method provided by the embodiment of the specification can send the opening instruction to indicate the rapid mechanical switch to be tested to open; when the quick mechanical switch to be tested reaches a preset opening distance, sending a discharge instruction to impulse voltage generation equipment to indicate the impulse voltage generation equipment to generate impulse voltage at two ends of the quick mechanical switch to be tested; after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the rapid mechanical switch to be tested according to the motion information of the rapid mechanical switch to be tested in the opening process, the impulse voltage generated by the impulse voltage generating equipment and the voltage change of the rapid mechanical switch to be tested in the opening process, thereby improving the accuracy of the dynamic voltage-sharing performance test of the main branch rapid mechanical switch of the high-voltage direct-current circuit breaker.
Fig. 5 is a functional structure diagram of an electronic device according to an embodiment of the present disclosure, where the electronic device may include a memory and a processor.
In some embodiments, the memory may be used to store the computer programs and/or modules, and the processor may implement various functions of the fast mechanical switch test of the high voltage dc circuit breaker by operating or executing the computer programs and/or modules stored in the memory and calling up the data stored in the memory. The memory can mainly comprise a program storage area and a data storage area, wherein the program storage area can store an operating system and an application program required by at least one function; the storage data area may store data created according to the use of the user terminal. Further, the memory may include high-speed random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a flash memory card (FlashCard), at least one magnetic disk storage device, a flash memory device, or other volatile solid state storage device.
The processor may be a Central Processing Unit (CPU), other general purpose processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The processor may execute the computer instructions to perform the steps of: sending a brake opening instruction to indicate the rapid mechanical switch to be tested to perform brake opening; when the quick mechanical switch to be tested reaches a preset opening distance, sending a discharge instruction to impulse voltage generation equipment to indicate the impulse voltage generation equipment to generate impulse voltage at two ends of the quick mechanical switch to be tested; after the impulse voltage generating equipment finishes discharging, determining the voltage endurance capacity of the rapid mechanical switch to be tested according to the motion information in the switching-off process of the rapid mechanical switch to be tested, the impulse voltage generated by the impulse voltage generating equipment and the voltage change in the switching-off process of the rapid mechanical switch to be tested.
It should be noted that, in the present specification, each embodiment is described in a progressive manner, and the same or similar parts in each embodiment may be referred to each other, and each embodiment focuses on differences from other embodiments. In particular, as for the apparatus embodiment and the apparatus embodiment, since they are substantially similar to the method embodiment, the description is relatively simple, and reference may be made to some descriptions of the method embodiment for relevant points.
After reading this specification, persons skilled in the art will appreciate that any combination of some or all of the embodiments set forth herein, without inventive faculty, is within the scope of the disclosure and protection of this specification.
In the 90 s of the 20 th century, improvements in a technology could clearly distinguish between improvements in hardware (e.g., improvements in circuit structures such as diodes, transistors, switches, etc.) and improvements in software (improvements in process flow). However, as technology advances, many of today's process flow improvements have been seen as direct improvements in hardware circuit architecture. Designers almost always obtain the corresponding hardware circuit structure by programming an improved method flow into the hardware circuit. Thus, it cannot be said that an improvement in the process flow cannot be realized by hardware physical modules. For example, a Programmable Logic Device (PLD), such as a Field Programmable Gate Array (FPGA), is an integrated circuit whose logic functions are determined by programming the device by a user. A digital system is "integrated" on a PLD by the designer's own programming without requiring the chip manufacturer to design and fabricate application-specific integrated circuit chips. Furthermore, nowadays, instead of manually making an integrated circuit chip, such programming is often implemented by "logic compiler" (software), which is similar to a software compiler used in program development and writing, but the original code before compiling is also written by a specific programming Language, which is called Hardware Description Language (HDL), and HDL is not only one but many, such as abel (advanced bootexpression Language), ahdl (alternate Language description Language), traffic, pl (kernel universal programming Language), HDCal, JHDL (advanced description Language), langva, Lola, HDL, pamm, hardsrapld (Hardware description Language), vhigh description Language (vhigh-Language), etc., which are currently used in most general. It will also be apparent to those skilled in the art that hardware circuitry that implements the logical method flows can be readily obtained by merely slightly programming the method flows into an integrated circuit using the hardware description languages described above.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
From the above description of the embodiments, it is clear to those skilled in the art that the present specification can be implemented by software plus a necessary general hardware platform. Based on such understanding, the technical solutions of the present specification may be essentially or partially implemented in the form of software products, which may be stored in a storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., and include instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments of the present specification.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
The description is operational with numerous general purpose or special purpose computing system environments or configurations. For example: personal computers, server computers, hand-held or portable devices, tablet-type devices, multiprocessor systems, microprocessor-based systems, set top boxes, programmable consumer electronics, network PCs, minicomputers, mainframe computers, distributed computing environments that include any of the above systems or devices, and the like.
This description may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The specification may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
While the specification has been described with examples, those skilled in the art will appreciate that there are numerous variations and permutations of the specification that do not depart from the spirit of the specification, and it is intended that the appended claims include such variations and modifications that do not depart from the spirit of the specification.

Claims (10)

1. A quick mechanical switch test system of a high voltage direct current breaker, comprising: the device comprises a plurality of to-be-tested quick mechanical switches arranged in series, at least one position sensor arranged in the to-be-tested quick mechanical switches, impulse voltage generation equipment, voltage measurement equipment and computer equipment;
the rapid mechanical switch to be tested is in a switching-on state and is used for starting switching-off according to a switching-off instruction sent by computer equipment;
the position sensor is used for generating a position signal according to motion information in the brake opening process of the rapid mechanical switch to be detected;
the impulse voltage generating equipment is electrically connected with the fast switch to be tested and used for generating impulse voltage at two ends of the fast mechanical switch to be tested according to a discharging instruction sent by computer equipment;
the voltage measuring equipment is electrically connected with the rapid mechanical switch to be tested and the impulse voltage generating equipment and is used for generating a first voltage signal according to the voltage change in the switching-off process of the rapid mechanical switch to be tested; generating a second voltage signal according to the impulse voltage generated by the impulse voltage generating device;
the computer equipment is used for sending a switching-off instruction and sending a discharging instruction to the impulse voltage generating equipment when the quick mechanical switch to be tested is preset with a distance; and after the impulse voltage generating equipment finishes discharging, determining the voltage withstanding capability of the rapid mechanical switch to be tested according to the position signal, the first voltage signal and the second voltage signal.
2. The system of claim 1, wherein the fast mechanical switch under test comprises:
the switch mechanism connecting rod is used for controlling the opening and closing of the rapid mechanical switch to be tested;
the opening coil is used for electrifying when the opening instruction is received;
and the repulsion plate is connected with the switching mechanism connecting rod and is used for generating repulsion when the opening coil is electrified and driving the switching mechanism connecting rod and the moving contact of the switching mechanism connecting rod to move downwards so as to perform opening.
3. The system of claim 2, wherein the generating a position signal according to the action of the fast mechanical switch to be tested during opening comprises: generating a position signal according to a change in position of the repulsive force plate.
4. The system of claim 1, wherein the fast mechanical switch under test further comprises:
and the voltage equalizing circuit is used for keeping the voltage division of each quick mechanical switch to be tested consistent.
5. The system of claim 4, wherein the voltage equalization circuit is comprised of a capacitor and a resistor.
6. The system of claim 1, wherein the surge voltage generation device comprises:
the wave head resistor and the wave tail resistor are used for generating impulse voltage with preset waveforms;
and the pulse transformer is used for triggering all stages of synchronous impulse voltage simultaneously.
7. The system of claim 1, wherein the voltage measurement device comprises:
the low-voltage-level resistance-capacitance pressure divider is used for measuring voltage change of each quick mechanical switch to be tested in the switching-off process;
and the high-voltage grade resistance-capacitance voltage divider is used for measuring the surge voltage generated by the surge voltage generating equipment.
8. The system of claim 1, further comprising:
the control protection equipment is used for receiving a switching-off instruction sent by the computer equipment and sending the switching-off instruction to the to-be-tested quick mechanical switch; receiving a position signal generated by the at least one position sensor, and sending the position signal to the computer device.
9. A fast mechanical switch testing method for a high voltage direct current circuit breaker applied to a fast mechanical switch testing system for a high voltage direct current circuit breaker according to any of the claims 1-8, the method comprising:
sending a brake opening instruction to indicate the rapid mechanical switch to be tested to perform brake opening;
when the quick mechanical switch to be tested reaches a preset opening distance, sending a discharge instruction to impulse voltage generation equipment to indicate the impulse voltage generation equipment to generate impulse voltage at two ends of the quick mechanical switch to be tested;
after the impulse voltage generating equipment finishes discharging, determining the voltage endurance capacity of the rapid mechanical switch to be tested according to the motion information in the switching-off process of the rapid mechanical switch to be tested, the impulse voltage generated by the impulse voltage generating equipment and the voltage change in the switching-off process of the rapid mechanical switch to be tested.
10. The method according to claim 9, characterized in that the motion information during the opening process of the fast mechanical switch to be tested is detected according to a position sensor;
correspondingly, whether the quick mechanical switch to be tested reaches a preset opening distance is judged according to the motion information.
CN202011353874.7A 2020-11-27 2020-11-27 Rapid mechanical switch testing system and method for high-voltage direct-current circuit breaker Pending CN112433150A (en)

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PCT/CN2021/117033 WO2022110963A1 (en) 2020-11-27 2021-09-07 Rapid mechanical switch test system and method of high-voltage direct-current circuit breaker

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CN113655377A (en) * 2021-06-28 2021-11-16 国网新源控股有限公司 Method and device for detecting failure fault of circuit breaker of pumped storage generator motor
CN113671366A (en) * 2021-08-25 2021-11-19 西安西电开关电气有限公司 Signal processing method, application device thereof and storage medium
CN113848474A (en) * 2021-11-02 2021-12-28 国网江苏省电力有限公司电力科学研究院 State detection system and detection method of rapid mechanical switch
CN114264947A (en) * 2021-12-17 2022-04-01 特变电工西安柔性输配电有限公司 Bypass switch testing device and testing method for flexible direct current power module
WO2022110963A1 (en) * 2020-11-27 2022-06-02 国网冀北电力有限公司电力科学研究院 Rapid mechanical switch test system and method of high-voltage direct-current circuit breaker

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022110963A1 (en) * 2020-11-27 2022-06-02 国网冀北电力有限公司电力科学研究院 Rapid mechanical switch test system and method of high-voltage direct-current circuit breaker
CN113655377A (en) * 2021-06-28 2021-11-16 国网新源控股有限公司 Method and device for detecting failure fault of circuit breaker of pumped storage generator motor
CN113655377B (en) * 2021-06-28 2023-11-03 国网新源控股有限公司 Breaker failure fault detection method and device for pumped storage generator motor
CN113671366A (en) * 2021-08-25 2021-11-19 西安西电开关电气有限公司 Signal processing method, application device thereof and storage medium
CN113671366B (en) * 2021-08-25 2024-01-23 西安西电开关电气有限公司 Signal processing method, application device thereof and storage medium
CN113848474A (en) * 2021-11-02 2021-12-28 国网江苏省电力有限公司电力科学研究院 State detection system and detection method of rapid mechanical switch
CN114264947A (en) * 2021-12-17 2022-04-01 特变电工西安柔性输配电有限公司 Bypass switch testing device and testing method for flexible direct current power module

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