CN112394363A - Multi-line scanning distance measuring system - Google Patents
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- CN112394363A CN112394363A CN202011133524.XA CN202011133524A CN112394363A CN 112394363 A CN112394363 A CN 112394363A CN 202011133524 A CN202011133524 A CN 202011133524A CN 112394363 A CN112394363 A CN 112394363A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/484—Transmitters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4865—Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak
Abstract
The invention discloses a multi-line scanning distance measuring system, comprising: a transmitter including a column light source composed of a plurality of light sources for transmitting a pulse beam to a target; the collector comprises a plurality of sampling areas, each sampling area comprises a pixel array consisting of a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence mode to independently control the working modes of the pixels; a plurality of sampling regions are associated with the column light sources, and only a subset of the pixels within a sampling region are activated for collecting the reflected pulsed light beam; the rotating assembly is used for controlling the emitter and the collector to synchronously rotate so as to complete 360-degree scanning on the target and form a plurality of scanning lines in a target field of view; and the processing circuit is connected with the emitter and the collector and used for synchronizing the trigger signals of the emitter and the collector, processing photon signals of the pixel collected light beams and calculating the distance information of the target based on the flight time of the pulse light beams from emission to reception of the collector.
Description
Technical Field
The invention relates to the technical field of distance measurement, in particular to a multi-line scanning distance measuring system.
Background
A distance measurement may be performed on a target using a time of flight (TOF) principle to obtain a depth image including a depth value of the target, and a distance measurement system based on the time of flight principle has been widely used in the fields of consumer electronics, unmanned driving, AR/VR, and the like. A distance measuring system based on the time-of-flight principle generally comprises an emitter and a collector, the field of view of a target is illuminated by a pulsed light beam emitted by the emitter and a reflected light beam is collected by the collector, and the distance to the object is calculated by calculating the time required for the light beam to be received from emission to reflection.
At present, the laser radar based on the flight time method is mainly divided into a mechanical type and a non-mechanical type, the distance measurement of 360-degree large visual field is realized through a rotating base in the mechanical type, and the laser radar has the advantages of concentrated light beam intensity, large measurement range and high precision. The mechanical laser radar can be a single-line laser radar and a multi-line laser radar, wherein the single-line laser radar is only provided with one emitter and one collector, the scanning range is limited, and therefore the multi-line laser radar is provided, but the multi-line laser radar needs to be strictly aligned when a system is adjusted, so that the main reasons that the existing multi-line laser radar is difficult in design process, high in manufacturing cost and difficult to produce in quantity are caused.
Disclosure of Invention
The invention mainly aims to provide a multi-line scanning distance measuring system to solve the technical problems that the multi-line laser radar in the prior art needs to be strictly aligned when the system is adjusted, so that the existing multi-line laser radar is difficult in design process, high in manufacturing cost and difficult in mass production.
In order to solve the technical problems, the invention adopts the following technical scheme:
a multiline scan distance measurement system comprising: a transmitter including a column light source composed of a plurality of light sources for transmitting a pulse beam to a target object; the collector comprises a plurality of sampling areas with the same number as the light sources, each sampling area comprises a pixel array consisting of a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence mode so as to independently control the working modes of the pixels; the plurality of sampling areas are associated with the column light source and only a subset of pixels within the sampling areas are activated for collecting the reflected pulsed light beam; the rotating assembly is connected with the emitter and the collector and used for controlling the emitter and the collector to synchronously rotate so as to complete 360-degree scanning of the target object and form a plurality of scanning lines in a target field of view; and the processing circuit is connected with the emitter and the collector and used for synchronizing the trigger signals of the emitter and the collector, processing photon signals of the pixel acquisition light beams and calculating the distance information of the target object based on the flight time of the pulse light beams from emission to reception of the collector.
Preferably, the column of light sources includes a plurality of the light sources arranged at intervals in a vertical direction.
Preferably, the transmitter further comprises a transmitting optical assembly for receiving and shaping the pulse light beam emitted by the light source and projecting the shaped light beam to the target object.
Preferably, the collector comprises a receiving optical assembly, the receiving optical assembly and the emitting optical assembly being configured to comprise the same telecentric lens.
Preferably, the collector further comprises a plurality of readout circuits connected with the plurality of sampling regions in a one-to-one correspondence, and is used for recording the flight time of the photons from emission to collection, outputting photon time signals, and constructing a histogram by using the photon time signals.
Preferably, the readout circuit comprises a TDC circuit and a histogram memory, and all pixels in the sampling region share one TDC circuit; or, the readout circuit includes a TDC circuit array and a histogram memory, the number of TDC circuits in the TDC circuit array is the same as the number of pixels in the sampling region, and each pixel is connected to the TDC circuit in a one-to-one correspondence.
Preferably, the size of the sampling region is determined according to an offset caused by system tolerance.
Preferably, the position of the pixel in the activated state within the sampling region is determined in a precalibrated manner.
Preferably, the subset of pixels is configured to be one sensing region, the sensing region comprising at least two of the pixels.
Preferably, the emitter and the collector are attached to the rotating assembly, which controls the emitter and the collector to rotate synchronously in a horizontal direction around the same rotation axis.
The invention has the beneficial effects that: through designing the sampling area, then no longer need strictly carry out the alignment one by one of light source and pixel in the installation and debugging process, only need in the demarcation in-process confirm the reflected light beam the formation of image position can, only the subset of the pixel in the sampling area is activated and is used for gathering the light beam of reflection and generating photon signal when carrying out distance measurement, can greatly reduced ranging system's the use degree of difficulty like this, improve the range finding precision, avoid because the problem that the range finding precision that leads to descends of being difficult to the alignment. In addition, a subset of pixels in an activated state in a sampling region is determined to be used as a sensing region in a pre-calibration mode, for example, a room with small ambient light can be selected for calibration, a control circuit controls all pixels in the sampling region to be activated, pixels with the strongest signal intensity are determined to be used as a subset of pixels to be activated in a traversing mode to be used for collecting a reflected light beam in a ranging process, and the rest pixels are in an off state, so that the ranging accuracy can be improved.
Drawings
FIG. 1 is a system block diagram of a multi-line scanning distance measuring system according to an embodiment of the present invention;
FIG. 2 is a system block diagram of a multiline scan distance measurement system in accordance with another embodiment of the present invention;
fig. 3 is a functional block diagram of a collector of an embodiment of the invention.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the embodiments of the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It should be noted that the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.
Fig. 1 is a system block diagram of a multi-line scanning distance measuring system according to an embodiment of the present invention, wherein the distance measuring system 10 includes a transmitter 11, a collector 12, a rotating assembly 13, and a processing circuit 14. Wherein the emitter 11 is used for emitting a pulse light beam to the target area, the pulse light beam is emitted into the target area space to illuminate the target object in the space, and the pulse light beam reflected by the target is received by the collector 12. Rotating assembly 13 is used to control emitter 11 and collector 12 to rotate synchronously around rotation axis y along the horizontal direction to complete 360-degree scanning of the target field of view, so as to form a plurality of scanning lines in the target field of view. Where emitter 11 and collector 12 are attached to rotating assembly 13, they may be disposed on the same substrate or on different substrates. Processing circuit 14 is connected to transmitter 11 and collector 12, and is used for synchronizing the trigger signals of transmitter 11 and collector 12 to calculate the flight time required by the pulse beam from transmission to reception by collector 12, so as to calculate the distance information of the target.
Specifically, the distance D of the corresponding point on the target object can be calculated by the following equation (1):
D＝c·t/2(1)
wherein c is the speed of light and t is the flight time.
With continued reference to fig. 1, the emitter 11 includes, among other things, a driver 111, a light source 112, and an emitting optical assembly 113. The driver 111 is used for controlling the light source 112 to emit a pulse light beam outwards at certain time intervals. The light source 112 may be a single light source or a one-dimensional light source array composed of a plurality of light sources. The light source may be a Light Emitting Diode (LED), a Laser Diode (LD), an Edge Emitting Laser (EEL), a Vertical Cavity Surface Emitting Laser (VCSEL), or the like. In one embodiment, light source 112 is configured as a one-dimensional column of light sources arranged by a plurality of light sources at intervals along the vertical direction (the direction of rotation axis y), each light source emitting a pulse subset comprising n pulsed light beams under the control of driver 111, eventually forming a plurality of scan lines in the target field of view as rotating assembly 13 controls emitter 11 to make 360 degree horizontal rotation about rotation axis y, the number of light sources in the column of light sources determining the resolution of the ranging system in the vertical direction. It will be appreciated that the light beam emitted by the light source 112 may also be controlled by a portion of the processing circuitry 14 or by a sub-circuit present independently of the processing circuitry 14.
The emission optical assembly 113 receives the light beam emitted from the light source 112 and shapes the light beam for projection onto a target area. In one embodiment, the transmit optical assembly 113 receives the pulsed light beam from the light source 112 and optically modulates, e.g., diffracts, refracts, reflects, etc., the pulsed light beam, and subsequently transmits the modulated light beam, e.g., a focused light beam, a flood light beam, a structured light beam, etc., into space. The emitting optical component 113 may be in the form of one or more combinations of lenses, liquid crystal elements, diffractive optical elements, microlens arrays, Metasurface (Metasurface) optical elements, masks, mirrors, MEMS mirrors, etc.
With continued reference to fig. 1, collector 12 includes a pixel array 122 and a receiving optical assembly 123, where receiving optical assembly 123 is configured to receive at least a portion of the light beam reflected back from the target and direct the light beam onto pixel array 122 to form an imaging spot. The pixel array 122 is arranged in association with the light source array 112, that is, each light source corresponds to each pixel, and the light beam emitted by the light source is irradiated to a certain point of the target object and then reflected back to the corresponding pixel, and generally, in order to receive as much light signal in the reflected light beam as possible, the size of a single light spot is usually set to correspond to a sensing region including a plurality of pixels, for example, to correspond to 2 × 2 ═ 4 pixels, and then each light source is associated with each sensing region. The pixels may be single photon sensing devices such as APD (avalanche photo diode), SPAD (single photon avalanche diode), SiPM (silicon photomultiplier tube), each pixel may respond to an incident single photon and output a photon signal indicating a corresponding arrival time of the received photon at each pixel, and the collection of the weak light signal and the calculation of the flight time are realized by using, for example, a time-dependent single photon counting method (TCSPC).
In one embodiment, the receiving optical assembly 123 further includes an aperture disposed at the focal plane of the lens for limiting the ambient light interference and adjusting the light intensity of the reflected pulsed light beam to be uniformly distributed over the pixels, such as sipms, which integrate more single photon response elements and have larger dimensions. Furthermore, an internal reflection channel can be arranged between the small hole and the pixel, and a light beam passing through the small hole is reflected for multiple times by the internal reflection channel and then emitted to the pixel to form a square light spot with the size approximately the same as that of the pixel, so that all response elements are fully utilized.
Typically, the readout circuit 121, which is connected to the pixel array 122, includes one or more of a signal amplifier, a time-to-digital converter (TDC), a digital-to-analog converter (ADC), and the like. These circuits may be integrated with the pixels or may be part of the processing circuit 14. In one embodiment, the readout circuit 121 includes a TDC circuit for recording the time of flight of the photons from emission to collection and outputting a photon time signal, and accessing the histogram memory with the photon time signal, with multiple measurements input into the histogram memory to construct a histogram.
According to the ranging system, the pixel array is arranged in association with the column light sources, namely, each light source corresponds to a pixel one by one, when the system is assembled, each light source needs to be strictly aligned with the corresponding sensing area, namely, a light spot enters the center position of the sensing area, so that the difficulty of an assembly process is increased, and in the ranging process of the system, the ranging precision is reduced due to the deviation of the light spot caused by temperature, oscillation and the like, so that the service life of the ranging system is influenced.
Fig. 2 is a system block diagram of a multi-line scanning distance measuring system 20 according to an embodiment of the present invention, which includes an emitter 21, a collector 22, a rotating assembly 13 and a processing circuit 14. Wherein the transmitter 21 includes a first row of light sources formed by a plurality of light sources arranged at intervals in a vertical direction for emitting a pulsed light beam toward the target object, preferably the light sources are VCSEL light sources; the collector 22 includes a plurality of sampling regions, each of which includes a pixel array composed of a plurality of pixels and a plurality of control circuits, each of which is associated with one pixel and independently controls the operation mode (activation or deactivation of the pixel) of the corresponding pixel; the sampling regions are associated with column light sources, each sampling region is associated with a respective light source, and only a subset of the pixels within the sampling region are activated for collecting the reflected pulsed light beam and generating photon signals; the rotating assembly 13 is used for controlling the emitter 21 and the collector 22 to rotate in the horizontal direction, and the function of the rotating assembly is the same as that of the distance measuring system of the previous embodiment; the processing circuit 14 is connected to the transmitter 21 and the collector 22, and is used for calculating the distance information of the target, and the specific calculation process is the same as that of the ranging system in the foregoing embodiment, and is not described herein again.
The number of sources of the emitter 21 determines the scanning resolution. In one embodiment, the emitter 21 further comprises a second column of light sources consisting of a plurality of light sources, and the second column of light sources is staggered from the first column of light sources in the vertical direction. The system further comprises a third row of light sources, a fourth row of light sources and the like, wherein all the row of light sources are staggered in the vertical direction to ensure that scanning lines formed by light beams emitted by all the light sources in a target field of view are not coincident, and as the setting of the sampling areas is associated with the row of light sources, the sampling areas are correspondingly set according to the setting of the row of light sources, including the addition of the same number of sampling areas and the staggered arrangement of the sampling areas.
Fig. 3 is a schematic diagram of the distance measuring system shown in fig. 2, and it should be noted that the collector 22 includes a plurality of sampling regions, fig. 3 only schematically shows one sampling region 221 and a readout circuit 313 thereof in the collector 22, the sampling region 221 includes a pixel array composed of a plurality of pixels 311 and a plurality of control circuits 312, the number of which is the same as that of the pixels 311, each control circuit 312 is associated with each pixel 311 and is used for independently controlling the operation mode of the corresponding pixel connected thereto, that is, controlling the pixel to be in an activated or closed state. A readout circuit 313 is associated with the sampling region 221 for processing the photon signals output by the sampling region, the readout circuit 313 comprising a TDC circuit 314 and a histogram memory 315. The readout circuit 313 may include one TDC circuit and one histogram memory, with one TDC circuit shared by all pixels within the sampling region 221. In another embodiment, the readout circuit 313 may include an array of TDC circuits and a histogram memory, where the number of TDC circuits is the same as the number of pixels in the sampling region 221, each pixel is connected to a TDC circuit in a one-to-one correspondence, each TDC circuit receives a photon signal from a pixel and outputs a photon time signal, and all photon time signals are distributed in the same histogram memory.
As in the embodiment shown in fig. 2, it is assumed that the column light source comprises two light sources 211, 212, and since the sampling regions are associated with the column light source, preferably, the number of light sources and the number of sampling regions are the same and correspond to each other, i.e. the collector comprises two sampling regions 221, 222. Based on the multi-line scanning distance measuring system involved in the prior art, assuming that 4 pixels are used as one sensing region for receiving the reflected light beam and a process design of strict alignment needs to be considered, the light beam emitted from the light source 211 needs to be incident into the sampling region 221 to form the imaging spot 225. In the present embodiment, a plurality of pixels more than the sensing area are designed to form a sampling area 221 for receiving the light beam reflected by the target after being emitted by the light source 211, and the size of the sampling area is determined according to the offset caused by the system tolerance, specifically, the side length of the sensing area plus the offset is taken as the size of the sampling area, for example, as shown in fig. 2, the sensing area is 2 × 2mm and includes 4 pixels, and the offset caused by the system tolerance is about 4mm, the size of the sampling area can be designed to be 10 × 10mm and includes 100 pixels. It is to be understood that the above data are illustrative only and are not limiting upon the present invention.
By designing the sampling region, the system does not need to strictly align the light sources and the sensing regions one by one in the installation and adjustment process, only the imaging position of the reflected light beam needs to be determined in the calibration process, and only the subset of the pixels in the sampling region is activated to collect the reflected light beam and generate a photon signal when distance measurement is carried out. The method includes the steps that a subset of pixels in an activated state in a sampling area is determined to be used as a sensing area in a pre-calibration mode, for example, a room with small ambient light can be selected for calibration, a control circuit controls all pixels in the sampling area to be activated, pixels with the strongest signal intensity are determined to be used as a subset of pixels to be activated in a traversing mode to be used for collecting a reflected light beam in a distance measurement process, and the rest pixels are in an off state. As shown in fig. 2, the pixel position corresponding to the spot 224 formed when the reflected beam enters the sampling region during the ranging process can be determined according to the result of the pre-calibration, and the position does not necessarily belong to the central position of the sampling region or need not be strictly aligned with the light source 221, so that the design difficulty of the system can be effectively reduced.
Furthermore, considering that the spot emission offset is caused by the influence factors such as temperature variation and mechanical oscillation of the device in the ranging process, in this embodiment, the incident position of the spot can be tracked in real time in the ranging process. For example, in the ranging process, the position of the sensing area corresponding to the light spot is calibrated once again at intervals, which is beneficial to improving the ranging accuracy. For example, after a period of time, recalibrating to determine that the reflected light beam enters the sampling region at this time to form the light spot 223, taking a pixel region corresponding to the light spot 223 as a sensing region, and controlling a pixel in the sensing region to activate and collect the reflected light beam by the control circuit.
Wherein, the emitter 21 further includes an emitting optical component, and the collector 22 further includes a receiving optical component, and preferably, the emitting optical component and the receiving optical component are configured to include the same telecentric lens. The light beams emitted by the VCSEL column light sources can be projected with a large field angle after passing through the telecentric lens, and meanwhile, the light beams projected by each light source can be collimated. And the receiving optical assembly adopts the same telecentric lens to realize the conjugate relation between the center of the transmitter and the center of the receiver, thereby reducing the offset error of the light spots.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several equivalent substitutions or obvious modifications can be made without departing from the spirit of the invention, and all the properties or uses are considered to be within the scope of the invention.
Claims (10)
1. A multiline scan distance measurement system comprising:
a transmitter including a column light source composed of a plurality of light sources for transmitting a pulse beam to a target object;
the collector comprises a plurality of sampling areas with the same number as the light sources, each sampling area comprises a pixel array consisting of a plurality of pixels and a plurality of control circuits, and the control circuits are connected to the pixels in a one-to-one correspondence mode so as to independently control the working modes of the pixels; the plurality of sampling areas are associated with the column light source and only a subset of pixels within the sampling areas are activated for collecting the reflected pulsed light beam;
the rotating assembly is connected with the emitter and the collector and used for controlling the emitter and the collector to synchronously rotate so as to complete 360-degree scanning of the target object and form a plurality of scanning lines in a target field of view;
and the processing circuit is connected with the emitter and the collector and used for synchronizing the trigger signals of the emitter and the collector, processing photon signals of the pixel acquisition light beams and calculating the distance information of the target object based on the flight time of the pulse light beams from emission to reception of the collector.
2. The multiline scan distance measurement system of claim 1 wherein said column light source includes a plurality of said light sources spaced apart in a vertical direction.
3. The multiline scan distance measurement system of claim 1 wherein said transmitter further includes transmit optics for receiving and shaping the pulsed light beam from said light source and directing the shaped beam toward said target object.
4. The multiline scan distance measurement system of claim 3 wherein said collector includes receive optics and said transmit optics are configured to include the same telecentric lens.
5. The multiline scan distance measurement system of claim 1 wherein said collector further includes a plurality of readout circuits connected in one-to-one correspondence with said plurality of sampling regions for recording the time of flight of photons from emission to collection and outputting photon time signals and utilizing the photon time signals to construct a histogram.
6. The multi-line scanning distance measuring system of claim 5 wherein said readout circuit includes a TDC circuit and a histogram memory, all pixels in said sample area sharing one said TDC circuit;
or, the readout circuit includes a TDC circuit array and a histogram memory, the number of TDC circuits in the TDC circuit array is the same as the number of pixels in the sampling region, and each pixel is connected to the TDC circuit in a one-to-one correspondence.
7. The multiline scan distance measurement system of claim 1 wherein the size of the sampling region is determined by the offset due to system tolerances.
8. The multi-line scanning distance measuring system of claim 1 wherein the location of said pixels in an active state within said sample area is determined by precalibration.
9. The multiline scan distance measurement system of claim 1 wherein said subset of pixels is configured to be a sensing region, said sensing region including at least two of said pixels.
10. The multiline scan distance measurement system of claim 1 wherein the transmitter and the collector are attached to the rotating assembly which controls the transmitter and the collector to rotate synchronously in a horizontal direction about the same axis of rotation.
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| PCT/CN2020/138388 WO2022082985A1 (en) | 2020-10-21 | 2020-12-22 | Multiline scanning distance measuring system |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113759382A (en) * | 2021-10-19 | 2021-12-07 | 上海兰宝传感科技股份有限公司 | Distance measuring circuit and application thereof |
| CN113900077A (en) * | 2021-09-30 | 2022-01-07 | 深圳市汇顶科技股份有限公司 | Laser radar transmitting device, laser radar device and electronic equipment |
| CN114114300A (en) * | 2022-01-25 | 2022-03-01 | 深圳市灵明光子科技有限公司 | Scattered point redistribution distance measuring device and laser detection system |
| WO2022083198A1 (en) * | 2020-10-21 | 2022-04-28 | 深圳奥锐达科技有限公司 | Multi-line scanning distance measurement system |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103365125A (en) * | 2012-04-11 | 2013-10-23 | 上海微电子装备有限公司 | Process base fringing field leveling method |
| CN109917350A (en) * | 2019-04-15 | 2019-06-21 | 上海禾赛光电科技有限公司 | Laser radar and laser detection equipment |
| CN110986816A (en) * | 2019-10-20 | 2020-04-10 | 深圳奥比中光科技有限公司 | Depth measurement system and measurement method thereof |
| CN111722241A (en) * | 2020-05-18 | 2020-09-29 | 深圳奥锐达科技有限公司 | Multi-line scanning distance measuring system and method and electronic equipment |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5056914A (en) * | 1990-07-12 | 1991-10-15 | Ball Corporation | Charge integration range detector |
| CN107367737A (en) * | 2016-05-13 | 2017-11-21 | 北醒（北京）光子科技有限公司 | A kind of multi-thread rotation sweep detection method |
| DE102018108340A1 (en) * | 2018-04-09 | 2019-10-10 | Sick Ag | Opto-electronic sensor and method for detection and distance determination of objects |
| CN110609293B (en) * | 2019-09-19 | 2022-05-27 | 深圳奥锐达科技有限公司 | Distance detection system and method based on flight time |
| CN211148917U (en) * | 2019-10-15 | 2020-07-31 | 深圳奥锐达科技有限公司 | Distance measuring system |
-
2020
- 2020-10-21 CN CN202011133524.XA patent/CN112394363B/en active Active
- 2020-12-22 WO PCT/CN2020/138388 patent/WO2022082985A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103365125A (en) * | 2012-04-11 | 2013-10-23 | 上海微电子装备有限公司 | Process base fringing field leveling method |
| CN109917350A (en) * | 2019-04-15 | 2019-06-21 | 上海禾赛光电科技有限公司 | Laser radar and laser detection equipment |
| CN110986816A (en) * | 2019-10-20 | 2020-04-10 | 深圳奥比中光科技有限公司 | Depth measurement system and measurement method thereof |
| CN111722241A (en) * | 2020-05-18 | 2020-09-29 | 深圳奥锐达科技有限公司 | Multi-line scanning distance measuring system and method and electronic equipment |
Non-Patent Citations (1)
| Title |
|---|
| 张权;张云亭;郭明霞;李威;张敬;: "屈光参差性弱视患者立体视觉相关皮层的fMRI评价", 中国医学影像技术, no. 04 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022083198A1 (en) * | 2020-10-21 | 2022-04-28 | 深圳奥锐达科技有限公司 | Multi-line scanning distance measurement system |
| CN113900077A (en) * | 2021-09-30 | 2022-01-07 | 深圳市汇顶科技股份有限公司 | Laser radar transmitting device, laser radar device and electronic equipment |
| CN113759382A (en) * | 2021-10-19 | 2021-12-07 | 上海兰宝传感科技股份有限公司 | Distance measuring circuit and application thereof |
| CN114114300A (en) * | 2022-01-25 | 2022-03-01 | 深圳市灵明光子科技有限公司 | Scattered point redistribution distance measuring device and laser detection system |
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|---|---|
| WO2022082985A1 (en) | 2022-04-28 |
| CN112394363B (en) | 2023-12-12 |
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