CN112381754A - Method for quantitatively representing light and shade distribution of EL image of photovoltaic module based on mathematical model - Google Patents
Method for quantitatively representing light and shade distribution of EL image of photovoltaic module based on mathematical model Download PDFInfo
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- 238000012360 testing method Methods 0.000 claims abstract description 16
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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Abstract
The invention discloses a method for quantitatively representing the light and shade distribution of an EL image of a photovoltaic module based on a mathematical model, which comprises the following steps: s1: selecting a finished photovoltaic assembly, and testing the finished photovoltaic assembly in an electroluminescence system to obtain an electroluminescence picture of the whole surface of the photovoltaic assembly; s2: analyzing the electroluminescence picture obtained in the step S1, and taking the signal intensity of the electroluminescence picture as a horizontal axis and the number of signal points corresponding to the light emission intensity as a vertical axis to obtain an intensity distribution map of the electroluminescence picture; s3: analyzing the intensity distribution diagram of the electroluminescence picture obtained in the step S1, and determining that the intensity of the horizontal axis is smaller than the characteristic value X1Filtering the signal to eliminate the interference of background noise and irrelevant information; s4: and calculating and obtaining a judgment result. The invention can effectively identify the bright and dark photovoltaic modules, avoid errors of manual identification, improve the production efficiency and is suitable for large-scale production.
Description
Technical Field
The invention provides a detection method of a solar cell, particularly relates to a method for quantitatively representing the light and shade distribution of an EL image of a photovoltaic module based on a mathematical model, and belongs to the technical field of solar cells and modules.
Background
With the increasing demand for energy and the increasing enhancement of environmental protection in countries around the world, the popularization and application of clean energy have become a necessary trend. Solar energy is gaining favor from various countries as an environment-friendly, safe and pollution-free clean energy. The single solar cell cannot be directly used as a power supply. When the solar cell module is used as a power supply, a plurality of single solar cells are connected in series and in parallel and are tightly packaged into a photovoltaic module.
In recent years, with the development of the scale of photovoltaic power generation and the continuous progress of technology, and the proposal of a policy of 'photovoltaic equal price and internet access' in 2019, higher requirements are put forward for the photovoltaic industry. The conversion efficiency of the component is improved, the manufacturing cost is reduced or at least maintained, the power consumption cost is reduced, the aim of continuous pursuit of photovoltaic enterprises is achieved, and meanwhile the competitiveness of the photovoltaic enterprises is reflected.
In the aspect of efficient components, a great deal of research is carried out by many foreign scientific research units and enterprises, and a great number of novel component process technologies are developed. To achieve higher module conversion efficiency, the solar cells need to be sorted to the extent that the cells with the closest performance can be used in the same module. Due to the selection of the sorted parameters of the solar cell, errors of a testing machine and the like, the performance of the solar cell at the same gear is different, and when the performance is reflected to the electroluminescence picture at the component end, the whole brightness is shown. In the existing production line, an operator judges the electroluminescent picture of the component by naked eyes according to a certain standard so as to judge whether the component belongs to light and shade. The method is influenced by visual difference of operators and display color difference of a display, has certain randomness and uncertainty, and is time-consuming. Therefore, a method for judging the electroluminescent picture of the component needs to be invented, so that the accuracy of the result is improved, and the production efficiency is improved.
Disclosure of Invention
Aiming at the technical problem that the accuracy of a method for judging an electroluminescence picture of a photovoltaic component needs to be improved in the prior art, the invention provides a method for quantitatively representing the bright and dark distribution of an EL image of the photovoltaic component based on a mathematical model, and the influence of vision of an operator and display errors of a display is eliminated.
Therefore, the invention adopts the following technical scheme:
a method for quantitatively representing the light and shade distribution of an EL image of a photovoltaic module based on a mathematical model comprises the following steps:
s1: selecting a finished photovoltaic assembly, and testing the finished photovoltaic assembly in an electroluminescence system to obtain an electroluminescence picture of the whole surface of the photovoltaic assembly; as shown in fig. 1;
s2: analyzing the electroluminescence picture obtained in the step S1, and taking the signal intensity of the electroluminescence picture as a horizontal axis and the number of signal points corresponding to the light emission intensity as a vertical axis to obtain an intensity distribution map of the electroluminescence picture; as shown in fig. 2;
s3: analyzing the intensity distribution diagram of the electroluminescence picture obtained in the step S1, and determining that the intensity of the horizontal axis is smaller than the characteristic value X1Filtering the signal to eliminate the interference of background noise and irrelevant information;
s4: the intensity distribution map after the processing of step S3 was analyzed in the following method:
selecting a cross-axis characteristic value corresponding to the solar cell with the lowest luminous intensity in the photovoltaic module, and recording the cross-axis characteristic value as X2Selecting the characteristic value of the cross axis corresponding to the solar cell with the highest luminous intensity in the photovoltaic module and recording the characteristic value as X3And calculating the light and shade characteristic value Y of the component by the following formula:
Y＝(X3-X2)/X2
aiming at different types of photovoltaic modules, corresponding light and shade judgment values are set and recorded as Yx(ii) a If the light and shade characteristic value Y of the component is larger than the photovoltaic component of the typeLight and shade determination value Y ofxIf so, the component is bright and dark; if the component brightness characteristic value Y is smaller than the brightness judgment value Y of the photovoltaic component of the typexThen the component is not shaded.
Further, in step S1, the test conditions are: the working current is 1-10A, and the working voltage is 30-50V.
Further, in step S2, the values of the horizontal and vertical axes are both processed to be 0 to 255.
Further, in step S3, the characteristic value X1The values of (A) are: 0-150.
Further, in step S4, the brightness determination value Y is setxHas a value of 0 to 0.5.
Further, in step S1, the finished photovoltaic module is a whole, half, spliced or combined cell module; the corresponding cell is polycrystalline, single crystal PERC, single crystal TOPCon or single crystal HIT.
Compared with the prior art, the invention has the following beneficial effects:
(1) by using a scientific operation method, the labor cost of staff is saved, and the influence of staff vision and display color difference is avoided; meanwhile, the method is simple, is compatible with an online component electroluminescence system, and is suitable for large-scale production;
(2) by the preparation method, the light and shade judgment speed of the component can be increased very quickly, and the overall yield is increased;
(3) the method is relatively simple, is easy to integrate into the process flow of large-scale production, and is suitable for large-scale production.
Drawings
FIG. 1 is an overall electroluminescence image of a photovoltaic module according to the present invention;
FIG. 2 is a graph of the intensity distribution of an electroluminescent picture according to the present invention;
FIG. 3 is an electroluminescence image (light and dark sheet) of the entire surface of the photovoltaic module in example 1;
FIG. 4 is an intensity distribution graph (light and shade) of an electroluminescent picture of example 1;
FIG. 5 is an electroluminescence image (unshaded sheet) of the entire surface of the photovoltaic module in example 1;
FIG. 6 is an intensity distribution graph (non-shaded) of an electroluminescent picture of example 1.
Detailed Description
In order to make the technical solutions of the present invention better understood by those skilled in the art, the technical solutions in the embodiments of the present invention will be clearly and completely described below.
Example 1:
the invention discloses a method for quantitatively representing the bright-dark distribution of an EL image of a photovoltaic module based on a mathematical model, which comprises the following steps:
s1: selecting a finished product of a single crystal TOPCon photovoltaic module, and testing the single crystal TOPCon photovoltaic module in an electroluminescence system under the test conditions of working current 8A and working voltage 40V to obtain an electroluminescence picture of the whole surface of the photovoltaic module; as shown in fig. 1;
s2: analyzing the electroluminescence picture obtained in the step S1, and taking the signal intensity of the electroluminescence picture as a horizontal axis and the number of signal points corresponding to the light emission intensity as a vertical axis to obtain an intensity distribution map of the electroluminescence picture; wherein, the values of the horizontal axis and the vertical axis are both processed to be 0-255; as shown in fig. 2, the intensity profile of a typical assembly electroluminescent picture has a series of specific patterns, where: the first plurality of peaks are irrelevant information such as picture background noise and component numbers marked in the electroluminescence picture, and the last plurality of peaks are mainly superposition results of electroluminescence signals of all solar cells in the component;
s3: analyzing the intensity distribution diagram of the electroluminescence picture obtained in the step S1, and determining that the intensity of the horizontal axis is smaller than the characteristic value X1Filtering the signal to eliminate the interference of background noise and irrelevant information; in this embodiment, X1Is 70;
s4: the intensity distribution map after the processing of step S3 is analyzed by the following method:
selecting a cross-axis characteristic value corresponding to the solar cell with the lowest luminous intensity in the photovoltaic module, and recording the cross-axis characteristic value as X2Selecting the characteristic value of the cross axis corresponding to the solar cell with the highest luminous intensity in the photovoltaic module and recording the characteristic value as X3By, for exampleThe light and shade characteristic value Y of the component is calculated by the following formula:
Y＝(X3-X2)/X2
for different solar cell structures, there is a corresponding brightness determination value, denoted as Yx(ii) a If the light and shade characteristic value Y of the component is larger than the light and shade judgment value Y corresponding to the battery structurexIf so, the component is bright and dark; if the light and shade characteristic value Y of the component is smaller than the light and shade judgment value Y corresponding to the battery structurexThen the component is not bright or dark;
for the finished product of the single crystal TOPCon photovoltaic module of the present embodiment, the light and shade determination value is 0.4; in a specific test example, the light and shade characteristic value Y of the tested component calculated by the method is 1.19; then according to the formula, the photovoltaic module is judged as a bright and dark film; as shown in fig. 3, 4; in another specific test example, if the light and shade characteristic value Y of the tested component calculated by the method of the present invention is 0.22, the photovoltaic component is determined as a non-light and shade according to the above formula; as shown in fig. 5, 6;
and repeating the steps, testing each photovoltaic module block by block, calculating to obtain a light and shade characteristic value Y, judging according to the formula to obtain a judgment result of whether each photovoltaic module is a light and shade sheet, classifying according to the judgment result, and selecting unqualified photovoltaic modules.
Example 2:
the invention discloses a method for quantitatively representing the bright-dark distribution of an EL image of a photovoltaic module based on a mathematical model, which comprises the following steps:
s1: selecting a finished product of a single crystal PERC photovoltaic module, and testing the single crystal PERC photovoltaic module in an electroluminescence system under the test conditions of working current 8A and working voltage 40V to obtain an electroluminescence picture of the whole surface of the photovoltaic module; as shown in fig. 1;
s2: analyzing the electroluminescence picture obtained in the step S1, and taking the signal intensity of the electroluminescence picture as a horizontal axis and the number of signal points corresponding to the light emission intensity as a vertical axis to obtain an intensity distribution map of the electroluminescence picture; wherein, the values of the horizontal axis and the vertical axis are both processed to be 0-255; as shown in fig. 2, the intensity profile of a typical assembly electroluminescent picture has a series of specific patterns, where: the first plurality of peaks are irrelevant information such as picture background noise and component numbers marked in the electroluminescence picture, and the last plurality of peaks are mainly superposition results of electroluminescence signals of all solar cells in the component;
s3: analyzing the intensity distribution diagram of the electroluminescence picture obtained in the step S1, and determining that the intensity of the horizontal axis is smaller than the characteristic value X1Filtering the signal to eliminate the interference of background noise and irrelevant information; in this embodiment, X1Is 100;
s4: the intensity distribution map after the processing of step S3 is analyzed by the following method:
selecting a cross-axis characteristic value corresponding to the solar cell with the lowest luminous intensity in the photovoltaic module, and recording the cross-axis characteristic value as X2Selecting the characteristic value of the cross axis corresponding to the solar cell with the highest luminous intensity in the photovoltaic module and recording the characteristic value as X3And calculating the light and shade characteristic value Y of the component by the following formula:
Y＝(X3-X2)/X2
for different solar cell structures, there is a corresponding brightness determination value, denoted as Yx(ii) a If the light and shade characteristic value Y of the component is larger than the light and shade judgment value Y corresponding to the battery structurexIf so, the component is bright and dark; if the light and shade characteristic value Y of the component is smaller than the light and shade judgment value Y corresponding to the battery structurexThen the component is not bright or dark;
for the finished product of the single crystal PERC photovoltaic module of this embodiment, the judgment value of brightness and darkness is 0.3; in a specific test example, the light and shade characteristic value Y of the tested component calculated by the method is 0.95; then according to the formula, the photovoltaic module is judged as a bright and dark film; in another specific test example, if the brightness characteristic value Y of the tested device calculated by the method of the present invention is 0.20, the photovoltaic device is determined as a non-bright-dark sheet according to the above formula.
And repeating the steps, testing each photovoltaic module block by block, calculating to obtain a light and shade characteristic value Y, judging according to the formula to obtain a judgment result of whether each photovoltaic module is a light and shade sheet, classifying according to the judgment result, and selecting unqualified photovoltaic modules.
It is to be understood that the described embodiments are merely some embodiments of the invention and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the scope of protection of the present invention.
Claims (6)
1. A method for quantitatively representing the light and shade distribution of an EL image of a photovoltaic module based on a mathematical model is characterized by comprising the following steps: the method comprises the following steps:
s1: selecting a finished photovoltaic assembly, and testing the finished photovoltaic assembly in an electroluminescence system to obtain an electroluminescence picture of the whole surface of the photovoltaic assembly;
s2: analyzing the electroluminescence picture obtained in the step S1, and taking the signal intensity of the electroluminescence picture as a horizontal axis and the number of signal points corresponding to the light emission intensity as a vertical axis to obtain an intensity distribution map of the electroluminescence picture;
s3: analyzing the intensity distribution diagram of the electroluminescence picture obtained in the step S1, and determining that the intensity of the horizontal axis is smaller than the characteristic value X1Filtering the signal to eliminate the interference of background noise and irrelevant information;
s4: the intensity distribution map processed in step S3 is analyzed by the following method:
selecting a cross-axis characteristic value corresponding to the solar cell with the lowest luminous intensity in the photovoltaic module, and recording the cross-axis characteristic value as X2Selecting the characteristic value of the cross axis corresponding to the solar cell with the highest luminous intensity in the photovoltaic module and recording the characteristic value as X3And calculating the light and shade characteristic value Y of the component by the following formula:
Y＝(X3-X2)/X2
aiming at different types of photovoltaic modules, corresponding light and shade judgment values are set and recorded as Yx(ii) a If the component brightness characteristic value Y is larger than the brightness judgment value Y of the photovoltaic component of the typexIf so, the component is bright and dark; if the component brightness characteristic value Y is smaller than the brightness judgment value Y of the photovoltaic component of the typexThen the component is notLight and shade.
2. The method for quantitatively characterizing the shading distribution of an EL image of a photovoltaic module based on a mathematical model as claimed in claim 1, characterized in that: in step S1, the test conditions are: the working current is 1-10A, and the working voltage is 30-50V.
3. The method for quantitatively characterizing the shading distribution of an EL image of a photovoltaic module based on a mathematical model as claimed in claim 1, characterized in that: in step S2, the values of the horizontal and vertical axes are both 0 to 255.
4. The method for quantitatively characterizing the shading distribution of an EL image of a photovoltaic module based on a mathematical model as claimed in claim 3, characterized in that: in step S3, the characteristic value X1The values of (A) are: 0-150.
5. The method for quantitatively characterizing the shading distribution of an EL image of a photovoltaic module based on a mathematical model as claimed in claim 4, characterized in that: in step S4, the brightness determination value YxHas a value of 0 to 0.5.
6. The method for quantitatively characterizing the shading distribution of an EL image of a photovoltaic module based on a mathematical model as claimed in claim 4, characterized in that: in step S1, the finished photovoltaic module is a whole, half, spliced or parallel battery module; the corresponding cell is polycrystalline, single crystal PERC, single crystal TOPCon or single crystal HIT.
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