CN112380127B - Test case regression method, device, equipment and storage medium - Google Patents

Test case regression method, device, equipment and storage medium Download PDF

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CN112380127B
CN112380127B CN202011277814.1A CN202011277814A CN112380127B CN 112380127 B CN112380127 B CN 112380127B CN 202011277814 A CN202011277814 A CN 202011277814A CN 112380127 B CN112380127 B CN 112380127B
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regression
test case
error
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module
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CN112380127A (en
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沈旭
王芳
杨晶晶
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Haiguang Information Technology Co Ltd
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    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
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Abstract

The application provides a test case regression method, a device, equipment and a storage medium, wherein the method comprises the following steps: when an error occurs in the current test case, searching an error information historical record, and judging whether a previous error record of the same type as the current test case exists in the error information historical record; if the prior error record does not exist in the error information historical record, acquiring the configured regression parameter of the current test case; and regressing the current test case based on the regression parameters to generate a regressive waveform of the current test case. The method and the device can reduce the occupation of computing resources and disk resources in the regression of the test cases of the integrated circuit, and improve the regression efficiency.

Description

Test case regression method, device, equipment and storage medium
Technical Field
The present application relates to the field of integrated circuit technologies, and in particular, to a test case regression method, apparatus, device, and storage medium.
Background
A System On Chip (SOC) is a System or product formed by combining a plurality of integrated circuits with specific functions on one Chip, and includes a complete hardware System and embedded software carried by the hardware System. In a broad sense, an SOC is a micro miniature system, and if the Central Processing Unit (CPU) is the brain, the SOC is a system that includes the brain, heart, eyes, and hands.
SOC-related content includes design, system integration, chip design, production, packaging, test verification, etc. of integrated circuits. With the development of information technology, the SOC has more and more functions and larger scale, and accordingly, the verification environment corresponding to the SOC is more and more complex. Taking SOC design verification as an example, different levels of verification environments generally exist, such as a bottom layer IP (IP core, referred to as "IP" for short) environment, a subsystem environment in the middle layer and a top layer SOC environment, which are reusable circuit modules with specific functions and are generally applied in a system chip. In each verification environment, a large number of test cases exist, regression needs to be carried out to meet the requirements of the passing rate and the coverage rate, and then the verification target is completed.
The verification environment is more and more complex, more and more test cases are used, in order to improve the efficiency, the existing technical scheme generally performs regression on the error case only after the test case makes an error, and generates a waveform for a user to position the problem, but when a large number of similar errors occur, a large amount of computing resources and disk resources are occupied, even the capacity of the disk is exceeded, and the whole regression is damaged.
Disclosure of Invention
An embodiment of the present application aims to provide a test case regression method, device, equipment, and storage medium, which are used to reduce the occupation of computing resources and disk resources in test case regression and improve regression efficiency.
A first aspect of an embodiment of the present application provides a test case regression method, including: when an error occurs in the current test case, retrieving an error information history record, and judging whether a previous error record of the same type as that of the current test case exists in the error information history record or not; if the prior error record does not exist in the error information historical record, acquiring the configured regression parameter of the current test case; and performing regressive on the current test case based on the regression parameters to generate a regressive waveform of the current test case.
In one embodiment, the regression parameters include: a regression time range; the regressing the current test case based on the regression parameters to generate a regressive waveform of the current test case includes: analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range; and performing regressive on the current test case to generate a regressive waveform of the current test case in the regression time interval.
In one embodiment, the regression parameters include: regression module information; the generating the re-regression waveform of the current test case comprises: and selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval.
In one embodiment, the regression module information includes: test module information of the configured current test case; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps: and the target module is a tested test module in the current test case, and a re-regression waveform of the current test case on the test module is generated in the regression time interval.
In one embodiment, the regression module information includes: configured associated module information related to the test module; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps: the target module includes: the test module and the association module; and generating a regressive waveform of the current test case on the test module and the correlation module in the regression time interval.
In an embodiment, the retrieving the error information history record when the current test case has an error, and determining whether there is a previous error record of the same type as the current test case in the error information history record includes: when the current test case has an error, acquiring the configured retrieval parameters of the current test case; and searching the error information historical record, judging whether the prior error record which accords with the search parameter exists in the error information historical record, if so, determining that the prior error record exists in the error information historical record, otherwise, determining that the prior error record does not exist in the error information historical record.
In one embodiment, the retrieving parameters includes: an error reporting time characteristic, an error reporting position characteristic and an error reporting data characteristic; the prior error record is an error record which simultaneously contains the error reporting time characteristic, the error reporting position characteristic and the error reporting data characteristic in the error information historical record.
In one embodiment, the method further comprises: and if the prior error record does not exist in the error information historical record, updating the error record of the current test case into the error information historical record.
A second aspect of the embodiments of the present application provides a test case regression device, including: the retrieval module is used for retrieving the error information historical record when the current test case has an error, and judging whether the error information historical record has the prior error record of the same type as the current test case; an obtaining module, configured to obtain a configured regression parameter of the current test case if the previous error record does not exist in the error information history record; and the generating module is used for performing regressive on the current test case based on the regression parameters to generate a regressive waveform of the current test case.
In one embodiment, the regression parameters include: a regression time range; the generation module is configured to: analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range; and performing regressive on the current test case to generate a regressive waveform of the current test case in the regression time interval.
In one embodiment, the regression parameters include: regression module information; the generation module is further to: and selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval.
In one embodiment, the regression module information includes: test module information of the configured current test case; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps: and the target module is a tested test module in the current test case, and a re-regression waveform of the current test case on the test module is generated in the regression time interval.
In one embodiment, the regression module information includes: configured associated module information related to the test module; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps: the target module includes: the test module and the association module; and generating a regressive waveform of the current test case on the test module and the correlation module in the regression time interval.
In one embodiment, the retrieval module is configured to: when the current test case has an error, acquiring the configured retrieval parameters of the current test case; and searching the error information historical record, judging whether the prior error record which accords with the search parameter exists in the error information historical record, if so, determining that the prior error record exists in the error information historical record, otherwise, determining that the prior error record does not exist in the error information historical record.
In one embodiment, the retrieving parameters includes: an error reporting time characteristic, an error reporting position characteristic and an error reporting data characteristic; the prior error record is an error record which simultaneously contains the error reporting time characteristic, the error reporting position characteristic and the error reporting data characteristic in the error information historical record.
In one embodiment, the method further comprises: and the updating module is used for updating the error record of the current test case into the error information historical record if the prior error record does not exist in the error information historical record.
A third aspect of embodiments of the present application provides an electronic device, including: a memory to store a computer program; the processor is configured to execute the method of the first aspect and any embodiment thereof in the embodiments of the present application to perform regression on the test case.
A fourth aspect of embodiments of the present application provides a non-transitory electronic device-readable storage medium, including: a program which, when run by an electronic device, causes the electronic device to perform the method of the first aspect and any embodiment thereof.
According to the test case regression method, the test case regression device, the test case regression equipment and the storage medium, when an error occurs in the current test case, the number of cases requiring regressive is reduced by screening the test cases requiring regressive according to the history records of error information in the regression process, and specific waveforms are generated for the test cases requiring regressive by combining with a user configuration file, so that the occupation of computing resources and magnetic disk resources is reduced, and the regression efficiency is improved.
Drawings
To more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments of the present application will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and that those skilled in the art can also obtain other related drawings based on the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram of an electronic device according to an embodiment of the present application;
FIG. 2 is a flowchart illustrating a test case regression method according to an embodiment of the present disclosure;
FIG. 3 is a flowchart illustrating a test case regression method according to an embodiment of the present disclosure;
FIG. 4 is a flowchart illustrating a test case regression method according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a test case regression device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. In the description of the present application, the terms "first," "second," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
As shown in fig. 1, the present embodiment provides an electronic apparatus 1 including: at least one processor 11 and a memory 12, one processor being exemplified in fig. 1. The processor 11 and the memory 12 are connected by a bus 10. The memory 12 stores instructions executable by the processor 11, and the instructions are executed by the processor 11, so that the electronic device 1 may execute all or part of the flow of the method in the embodiments described below, so as to regress the test cases of the integrated circuit.
In an embodiment, the electronic device 1 may be a mobile phone, a tablet computer, a notebook computer, a desktop computer, or the like.
In a test scenario of an integrated circuit in an SOC chip, a test case may refer to a description of a test task performed on a specific circuit module, and the content of the test case includes information such as a test target, a test environment, input data, a test step, an expected result, and a test script, and finally a test document may be formed for verifying whether a design requirement of a specific circuit is satisfied.
As shown in fig. 2, a test case regression method according to an embodiment of the present application includes: for the test scenario, only a small amount of log information can be printed during primary regression, no waveform is generated, and the state of the test case can be checked. When the test case has an error, the test case is regressed, more log information is printed, and a waveform is generated at the same time for a user to position the problem, so that the efficiency is improved.
However, the above method still has the following problems:
1. when more similar errors occur, all the test cases with errors are subjected to regressive to generate waveforms, and a large amount of computing resources are occupied for a long time. The large probability of generating a large number of erroneously similar waveform files points to the same problem. However, the same problem only requires that one waveform file be generated for the user to locate the problem, and the remaining waveform files have no practical significance. In addition, a large amount of written waveform files and log files can reduce the performance of the magnetic disk and occupy a large amount of magnetic disk space, so that the regression efficiency is reduced.
2. For the same error type, it is also possible to generate huge waveforms in the re-regression stage, occupying a large amount of disk resources. Typical reasons are the following 2:
a. the complete use case itself is too long.
b. The circuit scale of the object to be tested is large in itself.
Please refer to fig. 3, which is a test case regression method according to an embodiment of the present application, and the method may be executed by the electronic device 1 shown in fig. 1, and may be applied to the test case regression scenario for the SOC chip shown in fig. 2 to perform regression on the test case of the integrated circuit in the SOC chip, so as to improve regression efficiency. The method comprises the following steps:
step 301: when the current test case has an error, searching the error information history record, and judging whether the error information history record has a previous error record of the same type as the current test case, if so, entering the step 302, otherwise, skipping the re-regression process, and directly ending.
In this step, the test process can be detected in real time, when the current test case reports an error, the error information is intelligently analyzed, the error information history record is retrieved, the error information history record can be in the form of an error information list, and whether the previous error record of the same type as the current test case exists in the error information history record or not is judged by retrieving the error information list, so as to determine whether to regress the current test case or not.
In one embodiment, the error information may be retrieved accurately.
Step 302: and acquiring the configured regression parameters of the current test case.
In this step, if there is no previous error record in the error information history record, it is stated that re-regression is prepared for the current test case, and the regression parameters configured by the user for the current test case are obtained.
In an embodiment, the regression parameters configured by the user for the current test case may be obtained in a form of opening an interface to the user, for example, a user configuration table is provided, and the regression parameters are specified by the user according to the specific situation of the circuit to be tested.
Step 303: and regressing the current test case based on the regression parameters to generate a regressive waveform of the current test case.
In this step, for the current test case which has been reported with an error and has no error history, the regression is regressed based on the regression parameters pre-configured by the user, and the regression parameters can define regression conditions to restrict the range of regressing the current test case, so as to avoid blind full-range regressing, reduce resource occupation, and improve efficiency.
Step 304: and updating the error record of the current test case into the error information history record.
In this step, if there is no previous error record in the error information history record, the error report information and the regression information of the current test case may be recorded in the error information history record, for example, may be updated to the error information list, so as to facilitate subsequent use.
According to the test case regression method, when the current test case has errors, the test cases needing regression are screened out according to the history records of error information in the regression process, so that the number of cases needing regression is reduced. For the test cases needing regressive, specific waveforms are generated by combining user configuration files, so that the occupation of computing resources and disk resources is reduced, and the regression efficiency is improved.
Please refer to fig. 4, which is a test case regression method according to an embodiment of the present application, and the method may be executed by the electronic device 1 shown in fig. 1, and may be applied to the test case regression scenario for the SOC chip shown in fig. 2 to perform regression on the test case of the integrated circuit in the SOC chip, so as to improve regression efficiency. The method comprises the following steps:
step 401: and detecting whether the current test case has errors, if so, entering a step 402, and otherwise, ending.
Step 402: and when the current test case has an error, acquiring the configured retrieval parameters of the current test case.
In this step, the retrieval parameters may be pre-configured by the user for subsequent retrieval of the error information history.
In one embodiment, retrieving parameters may include: error reporting time characteristic, error reporting position characteristic, error reporting data characteristic and the like.
Taking verification environment a as an example, assume that verification environment a has 1271 test cases in total, where 482 test cases relate to a PCIE (peripheral component Interconnect Express, a high-speed serial computer expansion bus standard) bus. The design of a PCIE bus has a plurality of lanes, common test case error messages are similar, but the lane numbers, data or time of errors are different, for example:
the test case 1 has an error, and the error information is UVM _ ERROR@422748.61[ RxData ] UVM _ test _ top.env.pci _ uvc.lane _ uvc [0]. Scoreboard: PIPE data mismatch, expected:55, received.
After the test case 2 is tested, errors occur, and error reporting information is UVM _ ERROR@537236.31[ RxData ] UVM _ test _ top, env, pci _ uvc, lane _ uvc [1]. Scoreboard, PIPE data mismatch, expected: cd, received: fa.
For the error reporting mode of the specific platform, the user can fill a retrieval parameter in the retrieval configuration table.
Step 403: and searching the error information history record, judging whether a previous error record which accords with the search parameters exists in the error information history record, if so, determining that the previous error record exists in the error information history record, and directly ending without regressing the current test case so as to save the computing resources. Otherwise, step 404 is entered.
In one embodiment, the previous error record is an error record that includes an error reporting time characteristic, an error reporting location characteristic, and an error reporting data characteristic in the error information history.
In an embodiment, for the error reporting modes of the test case 1 and the test case 2 in the step 402, the user fills a search parameter in the search configuration table as follows:
s/UVM_ERROR@\d\.\d+\[RxData\]
uvm_test_top\.env\.pcie_uvc\.lane_uvc\[\d+\].scoreboard:PIPE data mismatched,expected:[0-9a-fA-F]+,received:[0-9a-fA-F]+/UVM_ERROR@*[RxData]uvm_test_top.env.pcie_uvc.lane_uvc[*].scoreboard:PIPE data mismatched,expected:*,received:*/；
wherein the regular expression \ d + \ d + is used to fuzzy match any time point (error reporting time characteristic). The regular expression \ d + \ ] is used to fuzzy match any one lane (error location feature). Regular expression [0-9a-fA-F ] + is used to fuzzy match arbitrary data (error reporting data features).
The error information history may then be retrieved in a fuzzy matching manner.
In an embodiment, assuming that the current test case is the test case 1, when the test case 1 is processed, firstly, an error information list is searched according to the search parameters, according to a fuzzy matching rule, the current error information list is empty, and no error record conforming to the search parameters is found, which indicates that the test case 1 is a first-occurring type of error, and it may mark that the test case 1 needs to be regressed to generate a waveform, and proceed to step 404. Step 407 may be performed to update the error information list.
In an embodiment, assuming that the current test case is the test case 2, when the test case 2 is processed, the error information list is searched based on the search parameter, and according to the fuzzy matching rule, the error which meets the search parameter is searched, which indicates that the error case similar to the error report of the test case 2 is in the regressive state, the current regressive can be skipped, so that the waveform of the test case 2 can not be generated.
Therefore, the number of the regressive waveforms can be associated with the error types instead of the test cases, and the final purpose of analyzing the errors generated by the regressive waveforms can be accurately reflected. In the development process, a regression that an error affects a large number of use cases often occurs, and the scheme of the embodiment can sharply reduce the consumption of a large number of disks under the condition.
Step 404: and acquiring the configured regression parameters of the current test case. See the description of step 302 in the above embodiments for details.
In this step, if there is no previous error record in the error information history that matches the search parameter, it is determined that there is no previous error record in the error information history.
Step 405: the regression parameters include: and (5) returning to the time range. Analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range.
In this step, for the current test case needing re-regression selected in step 403, an error time region may be defined from the time dimension, only waveforms near the error time region are generated, a regression time range may be configured by a user according to specific conditions of the circuit to be tested before regression, and it is assumed that T is the time range within which regression is performed pre Indicating the time before the error of the current test case, T post Representing the time after the error of the current test case, the regression time range can be 50000ns before and after the error of the current test case, namely T pre And T post All equal to 50000, which is generally sufficient to analyze the cause of the error problem.
In an embodiment, assuming that the current test case is the test case 1 requiring re-regression, when time positioning is performed on the re-regression waveform generation of the test case 1, an error time point T of the test case 1 is determined in a time dimension by analyzing a log file, and then a parameter T of a regression time range configured by a user is used pre And T post To determine the regression time interval of the resulting waveform as T-T pre To T + T pre . A re-regression waveform for the portion of test case 1 within the regression time interval may then be generated.
Step 406: the regression parameters include: and (5) regression module information. And selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in a regression time interval.
In this step, in a subsystem level environment and higher level environment, such as SOC level environment, the test case is often run on a complete and large-scale design circuit, but its test object is often only one or a part of the circuit module. In order to further save the computing resource, the range of the re-regression waveform can be defined from the circuit space dimension on the basis of the regression time interval, only the circuit target module related to the error of the current test case is selected, and the waveform of the target module in the regression time interval is generated.
In one embodiment, the regression module information includes: test module information of the configured current test case. The target module is a test module to be tested in the current test case, namely a circuit module object detected by the current test case. Step 406 may include: and generating a re-regression waveform of the current test case on the test module in the regression time interval.
In this step, a module configuration table may be provided for each test case, and a user configures a target module that needs to be regressed for each test case, where the target module may be a test object circuit targeted by a current test case in a tested circuit. And matching the regressed test cases to the specific circuit module needing to generate the waveform through the configuration table. If not configured by the user, the waveform for the entire complete circuit may be generated by default.
In one embodiment, the regression module information includes: configured associated module information related to the test module. The target module includes: test modules and associated modules, i.e., circuit modules associated with the error point of the current test case. Step 406 may further include: and generating a re-regression waveform of the current test case on the test module and the associated module in the regression time interval.
In this step, in an actual scenario, the error point of the current test case may be in the detected circuit module or may appear in other circuit modules that are not seemingly directly connected. In any case, the circuit module that is reported as faulty must generate a waveform. In addition, a configuration table can be provided for each check part (checker) of the verification platform, and a user configures the related module related to each check part. On the basis of the test object circuit aimed at by the current test case, the test object circuit is combined with a configured inspection piece correlation module to be used as a complete regressive target module list of the error current test case under the error condition, so that a regressive waveform is generated.
For example, taking the scenario of the verification environment a as an example, on a module object generated under the regressive condition, that is, in the spatial dimension, both the detected module configuration table and the inspection piece associated module configuration table of the test case display waveforms that need to generate PCIE related modules. A specific control file is generated based on this information to control the waveform output of the simulator. This speeds up the simulation by optimizing in two dimensions, both temporally and spatially, reducing the demands on computational resources and disk.
Step 407: and if the error information history record does not have the prior error record, updating the error record of the current test case into the error information history record. See the description of step 304 in the above embodiments for details.
In an embodiment, in the process of updating the error information history record, the error information of the current test case may be matched with the fuzzy matching table generated in step 403, and if the matching is successful, the corresponding fuzzy matching information is put into the error information list corresponding to the current test case. And if the matching fails, putting the information into original error information.
According to the test case regression method, the waveform is generated by efficiently regressing the effectively wrong test cases, so that the positioning error of a verifier is facilitated, redundant unnecessary regressions are avoided, the number of regressions and the running time and waveform file size of each regressions case can be greatly reduced, the calculation resources and the disk resources are saved, and the regression efficiency is improved. Specifically, from the viewpoint of only reducing the number of use cases, it is assumed that there are N kinds of errors in one regression, and the number of occurrences of each kind of error is M i Where i denotes the i-th error, the scheme shown in FIG. 2 would proceed
Figure BDA0002779700910000131
Secondary regression, while the schemes of FIGS. 3-4 only perform N-fold regression, when M is i When the return time is too large, the return efficiency can be greatly improved.
Please refer to fig. 5, which is a test case regression device 500 according to an embodiment of the present application, and the device may be applied to the electronic device 1 shown in fig. 1, and may be applied to the test case regression scenario for the SOC chip shown in fig. 2, so as to perform regression on the test case of the integrated circuit in the SOC chip, thereby improving the regression efficiency. The device includes: the system comprises a retrieval module 501, an acquisition module 502 and a generation module 503, wherein the principle relationship of each module is as follows:
the retrieving module 501 is configured to retrieve the error information history record when an error occurs in the current test case, and determine whether a previous error record of the same type as the current test case exists in the error information history record. See the description of step 301 in the above embodiments for details.
An obtaining module 502, configured to obtain a configured regression parameter of the current test case if no previous error record exists in the error information history record. See the description of step 302 in the above embodiments for details.
The generating module 503 is configured to perform regressive on the current test case based on the regression parameter, and generate a regressive waveform of the current test case. See the description of step 303 in the above embodiments for details.
In one embodiment, the regression parameters include: and (5) returning to the time range. The generating module 503 is configured to: analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range. And performing regressive on the current test case to generate a regressive waveform of the current test case in the regression time interval. See the description of step 405 in the above embodiments for details.
In one embodiment, the regression parameters include: and (5) regression module information. The generating module 503 is further configured to: and selecting a target module which accords with regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in a regression time interval. See the description of step 405 in the above embodiments for details.
In one embodiment, the regression module information includes: test module information of the configured current test case. Selecting a target module which accords with regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in a regression time interval, wherein the re-regression waveform comprises the following steps: the target module is a tested module in the current test case, and a re-regression waveform of the current test case on the tested module is generated in the regression time interval. See the description of step 405 in the above embodiments for details.
In one embodiment, the regression module information includes: configured associated module information related to the test module. Selecting a target module which accords with regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in a regression time interval, wherein the re-regression waveform comprises the following steps: the target module includes: a test module and an association module. And generating a regressive waveform of the current test case on the test module and the correlation module in the regression time interval. See the description of step 405 in the above embodiments for details.
In one embodiment, the retrieving module 501 is configured to: and when the current test case has an error, acquiring the configured retrieval parameters of the current test case. And searching the error information history record, judging whether a previous error record which accords with the search parameters exists in the error information history record, if so, determining that the previous error record exists in the error information history record, otherwise, determining that the previous error record does not exist in the error information history record. See the description of steps 402 to 403 in the above embodiments for details.
In one embodiment, retrieving parameters includes: an error time reporting characteristic, an error location reporting characteristic, and an error data reporting characteristic. The prior error record is an error record which simultaneously contains an error reporting time characteristic, an error reporting position characteristic and an error reporting data characteristic in the error information historical record. See the description of steps 402 to 403 in the above embodiments for details.
In one embodiment, the method further comprises: the updating module 504 is configured to update the error record of the current test case into the error information history record if the error information history record does not have a previous error record. See the description of step 407 in the above embodiments for details.
For a detailed description of the test case regression device 500, please refer to the description of the related method steps in the above embodiments.
An embodiment of the present invention further provides a non-transitory electronic device readable storage medium, including: a program that, when executed on an electronic device, causes the electronic device to perform all or part of the procedures of the methods in the above embodiments. The storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a Flash Memory (Flash Memory), a Hard Disk (Hard Disk Drive, abbreviated as HDD), a Solid State Drive (SSD), or the like. The storage medium may also comprise a combination of memories of the kind described above.
Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations fall within the scope defined by the appended claims.

Claims (15)

1. A test case regression method is characterized by comprising the following steps:
when an error occurs in the current test case, retrieving an error information history record, and judging whether a previous error record of the same type as that of the current test case exists in the error information history record or not;
if the prior error record does not exist in the error information historical record, obtaining a regression parameter configured for the current test case, wherein the regression parameter is used for restricting the range of regressive of the current case so as to avoid blind full-range regressive;
and regressing the current test case based on the regression parameters to generate a regressive waveform of the current test case.
2. The method of claim 1, wherein the regression parameters comprise: a regression time range; the regressing the current test case based on the regression parameters to generate a regressive waveform of the current test case includes:
analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range;
and performing regressive on the current test case to generate a regressive waveform of the current test case in the regression time interval.
3. The method of claim 2, wherein the regression parameters comprise: regression module information; the generating a re-regression waveform of the current test case in the regression time interval includes:
and selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval.
4. The method of claim 3, wherein the regression module information comprises: test module information of the configured current test case; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps:
and the target module is a tested test module in the current test case, and a re-regression waveform of the current test case on the test module is generated in the regression time interval.
5. The method of claim 4, wherein the regression module information comprises: configured associated module information related to the test module; selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval, wherein the re-regression waveform comprises the following steps:
the target module includes: the test module and the association module; and generating a regressive waveform of the current test case on the test module and the correlation module in the regression time interval.
6. The method as claimed in claim 1, wherein the retrieving the error information history record when the current test case has an error and determining whether there is a previous error record of the same type as the current test case in the error information history record comprises:
when the current test case has an error, acquiring the configured retrieval parameters of the current test case;
and searching the error information historical record, judging whether the prior error record which accords with the search parameter exists in the error information historical record, if so, determining that the prior error record exists in the error information historical record, otherwise, determining that the prior error record does not exist in the error information historical record.
7. The method of claim 6, wherein retrieving parameters comprises: an error reporting time characteristic, an error reporting position characteristic and an error reporting data characteristic;
the prior error record is an error record which simultaneously contains the error reporting time characteristic, the error reporting position characteristic and the error reporting data characteristic in the error information historical record.
8. The method of claim 1, further comprising:
and if the prior error record does not exist in the error information history record, updating the error record of the current test case into the error information history record.
9. A test case regression device, comprising:
the retrieval module is used for retrieving the error information historical record when the current test case has an error, and judging whether the error information historical record has the prior error record of the same type as the current test case;
an obtaining module, configured to obtain a regression parameter configured for the current test case if the previous error record does not exist in the error information history record, where the regression parameter is used to constrain a range of regressions for the current case, so as to avoid blind full-range regressions;
and the generating module is used for performing regressive on the current test case based on the regression parameters to generate a regressive waveform of the current test case.
10. The apparatus of claim 9, wherein the regression parameters comprise: a regression time range; the generation module is configured to:
analyzing the log information of the current test case to obtain the error time of the current test case, and calculating a regression time interval based on the error time and the regression time range, wherein the regression time interval comprises the error time and is within the regression time range;
and performing regressive on the current test case to generate a regressive waveform of the current test case in the regression time interval.
11. The apparatus of claim 10, wherein the regression parameters comprise: regression module information; the generation module is further to:
and selecting a target module which accords with the regression module information in the current test case, and generating a re-regression waveform of the current test case on the target module in the regression time interval.
12. The apparatus of claim 9, wherein the retrieval module is configured to:
when the current test case has an error, acquiring the configured retrieval parameters of the current test case;
and searching the error information historical record, judging whether the prior error record which accords with the search parameter exists in the error information historical record, if so, determining that the prior error record exists in the error information historical record, otherwise, determining that the prior error record does not exist in the error information historical record.
13. The apparatus of claim 9, further comprising:
and the updating module is used for updating the error record of the current test case into the error information historical record if the prior error record does not exist in the error information historical record.
14. An electronic device, comprising:
a memory to store a computer program;
a processor configured to perform the method of any one of claims 1 to 8 to regress test cases.
15. A non-transitory electronic device readable storage medium, comprising: program which, when run by an electronic device, causes the electronic device to carry out the method of any one of claims 1 to 8.
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