CN112379206A - Capacitive fingerprint module performance testing device and module performance testing method - Google Patents
Capacitive fingerprint module performance testing device and module performance testing method Download PDFInfo
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- CN112379206A CN112379206A CN202011346140.6A CN202011346140A CN112379206A CN 112379206 A CN112379206 A CN 112379206A CN 202011346140 A CN202011346140 A CN 202011346140A CN 112379206 A CN112379206 A CN 112379206A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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Abstract
The invention discloses a capacitive fingerprint module performance testing device, which comprises: the control unit can be directly connected with the tested capacitive fingerprint module to acquire module image information; and a current detection unit connected with the control unit; the current detection unit receives an instruction of the control unit, collects current information of the tested capacitive fingerprint module and returns the information to the control unit, and the control unit obtains a current value after filtering and calculating and outputs the current value. The invention can quickly and automatically test the multiple functions of each port of the module (testing current, testing tube voltage drop, testing impedance, testing image quality and the like), and can transfer and store the measured data, thereby greatly reducing the measuring and counting time, being convenient to use and improving the working efficiency.
Description
Technical Field
The invention belongs to the electronic field, and particularly relates to a capacitive fingerprint module performance testing device and a capacitive fingerprint module performance testing method.
Background
In the mass production process of the capacitive fingerprint module, indexes such as current, tube voltage drop, impedance and image quality need to be tested so as to control the quality of the module.
The traditional measuring method adopts different professional measuring instruments to test indexes such as current, tube voltage drop, impedance, image quality and the like. In the module mass production process, the test mode needs to be continuously switched when the measuring instrument is used for testing the module, the efficiency is low, and the data are counted to waste time.
Disclosure of Invention
In order to solve the above-mentioned defects, ensure the quality of the capacitive fingerprint module product and improve the testing efficiency, on the one hand, the invention provides a capacitive fingerprint module performance testing device, which can rapidly realize the multi-item detection of a single port of the module, and automatically detect the current, the tube voltage drop, the impedance and the image quality of the module, thereby completely meeting the requirements.
The utility model provides a capacitanc fingerprint module capability test device, includes:
the control unit can be directly connected with the tested capacitive fingerprint module to acquire module image information; and
the current detection unit is connected with the control unit;
the current detection unit receives an instruction of the control unit, collects current information of the tested capacitive fingerprint module and returns the information to the control unit, and the control unit obtains a current value after filtering and calculating and outputs the current value.
Optionally, the capacitive fingerprint module performance testing device further comprises a display unit, and the display unit is connected with the control unit and displays information of the control unit.
Optionally, the control unit is an MCU controller.
Optionally, the control unit is directly connected with the tested capacitive fingerprint module through an SPI/IIC/CAN communication mode.
Optionally, the current detection unit is an integrated current collection chip.
Optionally, the current detection unit includes a sampling resistor, a current detection chip, a filter circuit and an ADC voltage acquisition chip, the current detection chip is connected with the sampling resistor and the filter circuit respectively, the filter circuit is further connected with the ADC voltage acquisition chip, the ADC voltage acquisition chip transmits acquired information back to the control unit, and the sampling resistor is connected with the module power supply and the external power supply respectively during detection. The integrated current detection chip is used for collecting the current of each state of the fingerprint module in real time, and a high-voltage side connection mode is adopted, so that the problem that the capacitive fingerprint module is not grounded together with an actual power supply ground is avoided, and the anti-interference capability of the module in the test process is enhanced; and the integrated chip is adopted, so that the problem of inaccurate measurement precision caused by too many devices, errors of discrete devices and the like is solved.
Optionally, the capacitive fingerprint module performance testing device further comprises a tube voltage drop detection unit, the control unit controls the tube voltage drop detection unit to work, the tube voltage drop detection unit collects voltage information of the capacitive fingerprint module to be tested and transmits the information back to the control unit, and the control unit outputs a tube voltage drop value.
The MCU controller is used for sending a detection signal to the tube voltage drop detection unit, so that a certain pin of the switch chip selection module is controlled to measure, and data are stored and sent to the upper computer. Need not the manual pin that switches the module in the measurement process to by host computer statistics and save data, convenient and fast, the raising the efficiency that can be obvious.
Optionally, the tube voltage drop detection unit includes a tube voltage drop detection circuit, an electronic switch chip, and an ADC voltage acquisition chip, where the electronic switch chip is connected to the control unit, the ADC voltage acquisition chip, and the tube voltage drop detection circuit, and the ADC voltage acquisition chip is further connected to the control unit.
And the MCU is used for controlling a switch chip in the impedance detection unit to select a certain pin of the module for testing, and the data is stored and sent to the upper computer. In the measuring process, the measuring pin and the testing mode do not need to be manually switched, the measuring speed is high, the measuring time is greatly shortened, and the method has high value.
Optionally, the capacitive fingerprint module performance testing device further comprises an impedance detection unit, the impedance detection unit is connected with the control unit, the control unit controls the impedance detection unit to work, the impedance detection unit collects impedance information of the tested capacitive fingerprint module and transmits the information back to the control unit, and the control unit outputs an impedance value.
Optionally, the impedance detection unit includes an impedance detection circuit, an electronic switch chip and an ADC voltage acquisition chip, and the electronic switch chip is connected to the impedance detection circuit and the ADC voltage acquisition chip respectively.
On one hand, the invention also provides a performance test method of the capacitive fingerprint module.
The capacitive fingerprint module performance testing method adopts the capacitive fingerprint module performance testing device to collect image information of a tested capacitive fingerprint module and detect current of the tested capacitive fingerprint module.
Optionally, the detecting the current of the capacitive fingerprint module to be detected includes the following steps:
d01, the SPI sends a command to make the tested capacitive fingerprint module in a working state.
And D02, reading the current collected at the moment by the MCU controller and storing the current.
D03, the SPI sends a command to enable the tested capacitive fingerprint module to be in a sleep state.
And D04, reading the current collected at the moment by the MCU controller and storing the current.
D05, the MCU controller sends the read current value to the display device for display.
Optionally, the testing method further detects a voltage drop of the tested capacitive fingerprint module tube, and the detection includes the following steps:
g01, turning off the module power.
And G02, collecting the voltage by an ADC voltage collecting chip, and converting the collected tube voltage into a digital signal.
G03 the MCU reads the digital signal.
G04, the MCU converts the read value into a tube pressure drop value, and sends the tube pressure drop value to a display device (an upper computer) and judges whether the module is good or bad to display.
Optionally, the testing method further detects impedance of the capacitive fingerprint module to be tested, and the detection includes the following steps:
and Z01, turning off the module power supply.
And Z02, the ADC voltage acquisition chip acquires the impedance voltage and converts the acquired impedance voltage into a digital signal.
Z03 the MCU reads the digital signal.
And Z04, converting the read value into an impedance value by the MCU, sending the impedance value to a display device (an upper computer) and judging whether the module is good or bad to display.
Compared with the prior art, the invention has the beneficial effects that:
the control unit directly sends the instruction to respectively control each module to work, and can test the current of the module, the tube voltage drop of each pin, the impedance, the image quality of the module and the like even under the condition of not independently outputting the module.
The invention can quickly and automatically test the multiple functions of each port of the module, can transfer and store the measured data, greatly reduces the measuring and counting time, is convenient to use and improves the working efficiency.
The invention avoids the trouble that related instruments are needed to detect the voltage drop, the impedance and the current of the module in the prior art, adopts the MCU control, can report the acquired data to the upper computer for module quality judgment and data recording, and can save a large amount of time.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
FIG. 1 is a block diagram of the working principle of a testing device in embodiment 1 of the present invention;
FIG. 2 is a flow chart of current collection of a current detecting unit according to the present invention;
FIG. 3 is a flow chart of a current detecting unit according to the present invention;
FIG. 4 is a circuit diagram of one embodiment of a current sensing unit according to the present invention;
fig. 5 is a functional block diagram of a capacitive fingerprint module performance testing apparatus according to embodiment 2 of the present invention;
FIG. 6 is a flow chart of the operation of a pipe pressure drop detecting unit according to the present invention;
FIG. 7 is a schematic block diagram of a tube drop detection unit according to the present invention;
FIG. 8 is a circuit diagram of one embodiment of a tube drop detection unit of the present invention;
fig. 9 is a functional block diagram of a capacitive fingerprint module performance testing apparatus according to embodiment 3 of the present invention;
FIG. 10 is a flowchart illustrating the operation of an impedance detection unit according to the present invention;
FIG. 11 is a flow chart of the detection of an impedance detection unit according to the present invention;
FIG. 12 is a circuit diagram of an embodiment of an impedance detection unit according to the present invention;
fig. 13 is a functional block diagram of a capacitive fingerprint module performance testing apparatus according to embodiment 4 of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solution of the present invention will be described in detail below with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Example 1
Referring to fig. 1, fig. 1 is a functional block diagram of a performance testing apparatus for a capacitive fingerprint module according to the present embodiment.
The utility model provides a capacitanc fingerprint module capability test device, includes can be directly with the control unit and the current detection unit that are connected by test capacitanc fingerprint module, this control unit links to each other with the current detection unit, controls the current detection unit and carries out current detection. The current detection unit detects the current of the tested capacitive fingerprint module by sending an instruction through the control unit, and the tested capacitive fingerprint module is directly connected with the control unit to acquire module image information.
When the module image information needs to be collected, the control unit is connected with IO of the tested capacitive fingerprint module, the MCU control unit can directly read various data information of the capacitive fingerprint module by sending a series of instructions, and the information is filtered and converted to obtain the collected module image information.
When the current of the tested capacitive fingerprint module needs to be detected, the current detection unit is connected with the module power supply and the external power supply of the tested capacitive fingerprint module respectively, the control unit sends an instruction to enable the current detection unit to work, the current detection unit processes the collected current through filtering and the like, and then the control unit obtains the data returned by the current detection unit, and the current value is obtained after filtering and calculation and the result is output.
Optionally, the capacitive fingerprint module performance testing device further comprises a display unit, and the display unit is connected with the control unit and displays information of the control unit.
Optionally, the control unit may be an MCU controller, or may be another control chip.
Optionally, the control unit and the tested capacitive fingerprint module CAN be directly connected in an SPI communication mode, and also CAN be directly connected in IIC, CAN and other communication modes.
Optionally, the current detection unit is an integrated current collection chip.
Alternatively, referring to fig. 2-4, fig. 2 is a flowchart illustrating a working process of a current detection unit according to the present invention, fig. 3 is a flowchart illustrating a detection process of a current detection unit according to the present invention, and fig. 4 is a circuit diagram illustrating an embodiment of a current detection unit according to the present invention.
The current detection unit comprises a sampling resistor, a current detection chip, a filter circuit and an ADC voltage acquisition chip, the current detection chip is respectively connected with the sampling resistor and the filter circuit, the filter circuit is also connected with the ADC voltage acquisition chip, the ADC voltage acquisition chip transmits acquired information back to the control unit, and the sampling resistor is connected with the module power supply and the external power supply respectively during detection.
When detecting by test capacitanc fingerprint module electric current, be connected sampling resistor respectively with the module power and the external power supply of being tested capacitanc fingerprint module, detect the operation step as follows:
d01, the SPI sends a command to make the tested capacitive fingerprint module in a working state.
And D02, reading the current collected at the moment by the MCU controller and storing the current.
D03, the SPI sends a command to enable the tested capacitive fingerprint module to be in a sleep state.
And D04, reading the current collected at the moment by the MCU controller and storing the current.
D05, the MCU controller sends the read current value to a display device (an upper computer) for display.
Example 2
Referring to fig. 5, fig. 5 is a functional block diagram of the capacitive fingerprint module performance testing apparatus according to the present embodiment.
The utility model provides a capacitanc fingerprint module capability test device, including can be directly with the control unit who is tested capacitanc fingerprint module and links to each other, current detection unit and pipe drop detection unit, this control unit links to each other with current detection unit, control current detection unit carries out current detection, pipe drop detection unit is connected with the control unit, the work of control unit control pipe drop detection unit, pipe drop detection unit gathers and is tested capacitanc fingerprint module voltage information and passes this information back the control unit, the control unit outputs the output tube voltage drop value.
The current detection unit detects the current of the tested capacitive fingerprint module by sending an instruction through the control unit, and the tested capacitive fingerprint module is directly connected with the control unit to acquire module image information.
When the module image information needs to be collected, the control unit is connected with IO of the tested capacitive fingerprint module, the MCU control unit can directly read various data information of the capacitive fingerprint module by sending a series of instructions, and the information is filtered and converted to obtain the collected module image information.
When the current of the tested capacitive fingerprint module needs to be detected, the current detection unit is connected with the module power supply and the external power supply of the tested capacitive fingerprint module respectively, the control unit sends an instruction to enable the current detection unit to work, the current detection unit processes the collected current through filtering and the like, and then the control unit obtains the data returned by the current detection unit, and the current value is obtained after filtering and calculation and the result is output.
When the tube voltage drop needs to be collected, the tube voltage drop detection unit is connected with the tested capacitive fingerprint module IO, the control unit controls the tube voltage drop detection unit to work, the tube voltage drop detection unit collects voltage information of the tested capacitive fingerprint module and transmits the voltage information back to the control unit, and the control unit outputs a tube voltage drop value to be detected. When the tube voltage drop detection unit works, the tested capacitive fingerprint module cannot supply power.
Optionally, the capacitive fingerprint module performance testing device further comprises a display unit, and the display unit is connected with the control unit and displays information of the control unit.
Optionally, the control unit may be an MCU controller, or may be another control chip.
Optionally, the control unit and the tested capacitive fingerprint module CAN be directly connected in an SPI communication mode, and also CAN be directly connected in IIC, CAN and other communication modes.
Optionally, the current detection unit is an integrated current collection chip.
Alternatively, referring to fig. 6-8, fig. 6 is a flowchart illustrating the operation of a tube pressure drop detecting unit according to the present invention, fig. 7 is a schematic block diagram illustrating the tube pressure drop detecting unit according to the present invention, and fig. 8 is a circuit diagram illustrating an embodiment of the tube pressure drop detecting unit according to the present invention.
The tube voltage drop detection unit comprises a tube voltage drop detection circuit, an electronic switch chip and an ADC voltage acquisition chip, wherein the electronic switch chip is respectively connected with the control unit, the ADC voltage acquisition chip and the tube voltage drop detection circuit, and the ADC voltage acquisition chip is also connected with the control unit.
When needing to detect by test capacitanc fingerprint module pipe pressure drop, with electronic switch chip and by test capacitanc fingerprint module IO switch-on, detect the operation step as follows:
g01, turning off the module power.
And G02, collecting the voltage by an ADC voltage collecting chip, and converting the collected tube voltage into a digital signal.
G03 the MCU reads the digital signal.
G04, the MCU converts the read value into a tube pressure drop value, and sends the tube pressure drop value to a display device (an upper computer) and judges whether the module is good or bad to display.
Example 3
Referring to fig. 9, fig. 9 is a functional block diagram of the capacitive fingerprint module performance testing apparatus according to the present embodiment.
The utility model provides a capacitanc fingerprint module capability test device, including can be directly with the control unit who is connected by test capacitanc fingerprint module, current detection unit and impedance detection unit, this control unit links to each other with current detection unit, control current detection unit carries out current detection, impedance detection unit is connected with the control unit, the work of control unit control impedance detection unit, impedance detection unit gathers by test capacitanc fingerprint module impedance information and passes this information back the control unit, the control unit output impedance value.
The current detection unit detects the current of the tested capacitive fingerprint module by sending an instruction through the control unit, and the tested capacitive fingerprint module is directly connected with the control unit to acquire module image information.
When the module image information needs to be collected, the control unit is connected with IO of the tested capacitive fingerprint module, the MCU control unit can directly read various data information of the capacitive fingerprint module by sending a series of instructions, and the information is filtered and converted to obtain the collected module image information.
When the current of the tested capacitive fingerprint module needs to be detected, the current detection unit is connected with the module power supply and the external power supply of the tested capacitive fingerprint module respectively, the control unit sends an instruction to enable the current detection unit to work, the current detection unit processes the collected current through filtering and the like, and then the control unit obtains the data returned by the current detection unit, and the current value is obtained after filtering and calculation and the result is output.
When the impedance of the tested capacitive fingerprint module needs to be detected, the impedance detection unit is respectively communicated with the tested capacitive fingerprint module IO, the control unit controls the impedance detection unit to work, the impedance detection unit collects the impedance information of the tested capacitive fingerprint module and transmits the information back to the control unit, and the control unit outputs an impedance value. When detecting the capacitive fingerprint module impedance under test, the capacitive fingerprint module under test can not supply power.
Optionally, the capacitive fingerprint module performance testing device further comprises a display unit, and the display unit is connected with the control unit and displays information of the control unit.
Optionally, the control unit may be an MCU controller, or may be another control chip.
Optionally, the control unit and the tested capacitive fingerprint module CAN be directly connected in an SPI communication mode, and also CAN be directly connected in IIC, CAN and other communication modes.
Optionally, the current detection unit is an integrated current collection chip.
Alternatively, referring to fig. 10-12, fig. 10 is a flowchart illustrating a working process of an impedance detecting unit according to the present invention, fig. 11 is a flowchart illustrating a detecting process of an impedance detecting unit according to the present invention, and fig. 12 is a circuit diagram illustrating an embodiment of an impedance detecting unit according to the present invention.
The impedance detection unit comprises an impedance detection circuit, an electronic switch chip and an ADC voltage acquisition chip, wherein the electronic switch chip is respectively connected with the impedance detection circuit and the ADC voltage acquisition chip.
When need detect by test capacitanc fingerprint module impedance, with electronic switch chip and by test capacitanc fingerprint module IO switch-on, detect the operation step as follows:
and Z01, turning off the module power supply.
And Z02, the ADC voltage acquisition chip acquires the impedance voltage and converts the acquired impedance voltage into a digital signal.
Z03 the MCU reads the digital signal.
And Z04, converting the read value into an impedance value by the MCU, sending the impedance value to a display device (an upper computer) and judging whether the module is good or bad to display.
Example 4
Referring to fig. 13, fig. 13 is a functional block diagram of a performance testing apparatus for a capacitive fingerprint module according to the present embodiment.
The utility model provides a capacitanc fingerprint module capability test device, includes the control unit, current detection unit, pipe drop detecting element and the impedance detecting element that can directly link to each other with by test capacitanc fingerprint module, and this control unit links to each other with current detection unit, and control current detection unit carries out current detection. The current detection unit detects the current of the tested capacitive fingerprint module by sending an instruction through the control unit, and the tested capacitive fingerprint module is directly connected with the control unit to acquire module image information. And the tube voltage drop detection unit is connected with the control unit, collects the voltage information of the tested capacitive fingerprint module and transmits the information back to the control unit, and the control unit outputs a tube voltage drop value. The impedance detection unit is connected with the control unit, the control unit controls the impedance detection unit to work, the impedance detection unit collects impedance information of the tested capacitive fingerprint module and transmits the information back to the control unit, and the control unit outputs an impedance value.
When the module image information needs to be collected, the control unit is connected with IO of the tested capacitive fingerprint module, the MCU control unit can directly read various data information of the capacitive fingerprint module by sending a series of instructions, and the information is filtered and converted to obtain the collected module image information.
When the current of the tested capacitive fingerprint module needs to be detected, the current detection unit is connected with the module power supply and the external power supply of the tested capacitive fingerprint module respectively, the control unit sends an instruction to enable the current detection unit to work, the current detection unit processes the collected current through filtering and the like, and then the control unit obtains the data returned by the current detection unit, and the current value is obtained after filtering and calculation and the result is output.
When the tube voltage drop needs to be collected, the tube voltage drop detection unit is connected with the tested capacitive fingerprint module IO, the control unit controls the tube voltage drop detection unit to work, the tube voltage drop detection unit collects voltage information of the tested capacitive fingerprint module and transmits the voltage information back to the control unit, and the control unit outputs a tube voltage drop value to be detected. When the tube voltage drop detection unit works, the tested capacitive fingerprint module cannot supply power.
When the impedance of the tested capacitive fingerprint module needs to be detected, the impedance detection unit is respectively communicated with the tested capacitive fingerprint module IO, the control unit controls the impedance detection unit to work, the impedance detection unit collects the impedance information of the tested capacitive fingerprint module and transmits the information back to the control unit, and the control unit outputs an impedance value. When detecting the capacitive fingerprint module impedance under test, the capacitive fingerprint module under test can not supply power.
Optionally, the capacitive fingerprint module performance testing device further comprises a display unit, and the display unit is connected with the control unit and displays information of the control unit.
Optionally, the control unit may be an MCU controller, or may be another control chip.
Optionally, the control unit and the tested capacitive fingerprint module CAN be directly connected in an SPI communication mode, and also CAN be directly connected in IIC, CAN and other communication modes.
Optionally, the current detection unit is an integrated current collection chip.
According to the invention, the MCU control unit respectively controls each module to work, even if the module is not required to be independently output, the current of the module, the tube voltage drop and impedance of each pin and image information can be measured, so that multifunctional detection can be conveniently and rapidly carried out on each port of the module, and data can be stored.
In the description of the present invention, it should be noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may for example be fixed or indirectly connected through intervening media, or may be interconnected between two elements or may be in the interactive relationship between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. In the description of the present invention, "a plurality" means two or more unless specifically stated otherwise.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims of the present application and in the drawings described above, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The utility model provides a capacitanc fingerprint module capability test device, includes:
the control unit can be directly connected with the tested capacitive fingerprint module to acquire module image information; and
the current detection unit is connected with the control unit;
the current detection unit receives an instruction of the control unit, collects current information of the tested capacitive fingerprint module and returns the information to the control unit, and the control unit obtains a current value after filtering and calculating and outputs the current value.
2. The capacitive fingerprint module performance testing device of claim 1, further comprising a display unit, wherein the display unit is connected to the control unit and displays information of the control unit.
3. The capacitive fingerprint module performance testing device of claim 1, wherein the control unit is an MCU controller; or
The control unit is directly connected with the tested capacitive fingerprint module through an SPI/IIC/CAN communication mode; or
The current detection unit is an integrated current acquisition chip.
4. The capacitive fingerprint module performance testing device of any one of claims 1-2, wherein the current detection unit comprises a sampling resistor, a current detection chip, a filter circuit and an ADC voltage acquisition chip, the current detection chip is connected to the sampling resistor and the filter circuit, respectively, the filter circuit is further connected to the ADC voltage acquisition chip, the ADC voltage acquisition chip transmits acquired information back to the control unit, and the sampling resistor is connected to the module power supply and the external power supply during detection, respectively.
5. The capacitive fingerprint module performance testing device of any one of claims 1 to 2, further comprising a tube voltage drop detecting unit, wherein the control unit controls the tube voltage drop detecting unit to operate, the tube voltage drop detecting unit collects voltage information of the capacitive fingerprint module to be tested and transmits the information back to the control unit, and the control unit outputs a tube voltage drop value; optionally, the tube voltage drop detection unit includes a tube voltage drop detection circuit, an electronic switch chip, and an ADC voltage acquisition chip, where the electronic switch chip is connected to the control unit, the ADC voltage acquisition chip, and the tube voltage drop detection circuit, and the ADC voltage acquisition chip is further connected to the control unit.
6. The capacitive fingerprint module performance testing device of any one of claims 1 to 2, further comprising an impedance detection unit, wherein the impedance detection unit is connected to the control unit, the control unit controls the impedance detection unit to operate, the impedance detection unit collects impedance information of the capacitive fingerprint module to be tested and transmits the information back to the control unit, and the control unit outputs an impedance value; optionally, the impedance detection unit includes an impedance detection circuit, an electronic switch chip and an ADC voltage acquisition chip, and the electronic switch chip is connected to the impedance detection circuit and the ADC voltage acquisition chip respectively.
7. A performance testing method of a capacitive fingerprint module, which adopts the performance testing device of any one of claims 1 to 6 to collect the image information of the capacitive fingerprint module to be tested and detect the current of the capacitive fingerprint module to be tested.
8. The method for testing the performance of the capacitive fingerprint module according to claim 7, wherein the step of detecting the current of the capacitive fingerprint module to be tested comprises the steps of:
d01, the SPI sends a command to make the tested capacitive fingerprint module in a working state.
And D02, reading the current collected at the moment by the MCU controller and storing the current.
D03, the SPI sends a command to enable the tested capacitive fingerprint module to be in a sleep state.
And D04, reading the current collected at the moment by the MCU controller and storing the current.
D05, the MCU controller sends the read current value to the display device for display.
9. The method for testing the performance of the capacitive fingerprint module according to claim 7, wherein the method further comprises detecting the voltage drop of the capacitive fingerprint module under test, the detecting comprises the following steps:
g01, turning off the module power.
And G02, collecting the voltage by an ADC voltage collecting chip, and converting the collected tube voltage into a digital signal.
G03 the MCU reads the digital signal.
G04, MCU converts the read value into tube voltage drop value, sends to the display device and judges whether the module is good or bad to display.
10. The method for testing the performance of the capacitive fingerprint module according to claim 7, wherein the method further comprises detecting the impedance of the capacitive fingerprint module to be tested, the detecting comprises the following steps:
and Z01, turning off the module power supply.
And Z02, the ADC voltage acquisition chip acquires the impedance voltage and converts the acquired impedance voltage into a digital signal.
Z03 the MCU reads the digital signal.
And Z04, the MCU converts the read value into an impedance value, sends the impedance value to the display device and judges whether the module is good or bad for displaying.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011346140.6A CN112379206A (en) | 2020-11-26 | 2020-11-26 | Capacitive fingerprint module performance testing device and module performance testing method |
Applications Claiming Priority (1)
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113030621A (en) * | 2021-03-18 | 2021-06-25 | 江阴邦融微电子有限公司 | Fingerprint sensor testing device with anti-interference function and testing method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113030621A (en) * | 2021-03-18 | 2021-06-25 | 江阴邦融微电子有限公司 | Fingerprint sensor testing device with anti-interference function and testing method |
| CN113030621B (en) * | 2021-03-18 | 2023-10-31 | 江阴邦融微电子有限公司 | Fingerprint sensor testing device with anti-interference function and testing method |
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