CN112378610A - Quick peripheral component interconnection card vibration test fixture set - Google Patents
Quick peripheral component interconnection card vibration test fixture set Download PDFInfo
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- CN112378610A CN112378610A CN202011180955.1A CN202011180955A CN112378610A CN 112378610 A CN112378610 A CN 112378610A CN 202011180955 A CN202011180955 A CN 202011180955A CN 112378610 A CN112378610 A CN 112378610A
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- vibration test
- peripheral component
- pci express
- card
- vibration
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- 238000012360 testing method Methods 0.000 title claims abstract description 131
- 230000002093 peripheral effect Effects 0.000 title claims abstract description 47
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
- G01M7/04—Monodirectional test stands
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- Mounting Of Printed Circuit Boards And The Like (AREA)
Abstract
The invention provides a vibration test fixture group of a quick peripheral component interconnection card, which is detachably assembled on vibration test equipment, is used for fixing the quick peripheral component interconnection card on the vibration test equipment, is used for the vibration test equipment to carry out vibration test operation on the quick peripheral component interconnection card, and comprises a first fixture, a second fixture, a quick peripheral component interconnection connector and a bracket fixing screw. The first fixture and the bracket fixing screw are used for accommodating a bracket of the peripheral component interconnect express card. The quick peripheral component interconnection connector is fixed on the second jig and used for inserting a golden finger of the quick peripheral component interconnection card, and the first jig and the second jig are detachably assembled on the vibration testing equipment so as to fix the quick peripheral component interconnection card on the vibration testing equipment.
Description
Technical Field
The present invention relates to a tool, and more particularly, to a tool set for testing a peripheral component interconnect card.
Background
With the advent of Peripheral Component Interconnect Express (PCI-E or PCIe) bus specifications, which have superior transmission speed and transmission stability over the previous PCI bus specifications, there is a possibility of completely replacing the PCI bus specification. Accordingly, the development demand for a fast pci card is also increasing.
However, in the prior art, there is no vibration test apparatus capable of simulating the assembly state of the pci express card, so that the influence or even the damage degree of the vibration (which may be generated by the external environment, the host, the server, or other factors) on the pci express card in the assembly state cannot be evaluated, and the structure of the pci express card cannot be improved, reinforced, and optimized, and the problem of functionality of the pci express card in the using process may be further caused. Thus, there is room for improvement in the prior art.
Disclosure of Invention
In view of the prior art, there is no vibration test apparatus and its derived problems that can simulate the assembled status of the PCI express card. It is a primary objective of the claimed invention to provide a tool set for testing PCI express cards in a vibration manner, which solves at least one of the problems of the prior art.
To achieve the above and other related objects, a first aspect of the present invention provides a pci express card tool set detachably assembled to a test board of a vibration test apparatus for fixing a pci express card to the vibration test apparatus for the vibration test apparatus to perform a vibration test operation on the pci express card, and the tool set includes: a first fixture, which is provided with a bracket containing hole and a first fixing hole and is locked and fixed on the test board by a first locking means, and the bracket containing hole is used for containing a bracket of the rapid peripheral component interconnection card; the second fixture is provided with a connector accommodating groove and is fixedly locked on the test board through a second locking means; the quick peripheral component interconnection connector is fixedly arranged in the connector accommodating groove and used for inserting and connecting a golden finger of the quick peripheral component interconnection card; and a bracket fixing screw correspondingly penetrating through the bracket and the first fixing hole to fix the quick peripheral component interconnection card to the first jig.
In an embodiment of the first aspect, the pci express card vibration test fixture set further includes at least one first locking screw, and the first locking means is configured to utilize the at least one first locking screw to correspondingly penetrate through at least one first locking hole of the first fixture so as to lock the first fixture to the test board.
In an embodiment of the first aspect, the at least one first fastening screw is four in number.
In an embodiment of the first aspect, the second fixture includes: a second body; the second cover body is connected and fixed on the second body and forms the connector accommodating groove with the second body in an enclosing way; and a second base connected with the second body and provided with at least one second locking hole.
In an embodiment of the first aspect, the pci express card vibration test fixture set further includes at least one second locking screw, and the second locking means is configured to utilize the at least one second locking screw to correspondingly penetrate through the at least one second locking hole of the second base to lock the second fixture to the test board.
In an embodiment of the first aspect, the number of the at least one second locking screw is three.
In an embodiment of the first aspect, the second fixture further includes at least one cover fixing screw, and the at least one cover fixing screw is used to correspondingly penetrate through the at least one cover through hole of the second cover, so as to fix the second cover to the second body.
In an embodiment of the first aspect, the at least one cover through hole is formed corresponding to the connector accommodating groove.
In an embodiment of the first aspect, the at least one cover fixing screw is three in number.
As described above, the present invention provides a tool set for testing the vibration of a peripheral component interconnect express card, which uses a first tool, a second tool, a peripheral component interconnect express connector and a bracket fixing screw to accommodate and fix the peripheral component interconnect express card, and fixes the peripheral component interconnect express card to a vibration testing device, so that the vibration testing device can perform a vibration testing operation on the peripheral component interconnect express card. Therefore, after the vibration test equipment performs the vibration test operation on the fast peripheral component interconnection card in the simulated assembly state, the influence or even the damage degree of the vibration (which may be generated by the external environment, a host, a server or other factors) on the fast peripheral component interconnection card in the assembly state can be evaluated, the structure of the fast peripheral component interconnection card is improved, reinforced and optimized, and the problem that the fast peripheral component interconnection card has functionality in the use process can be further avoided.
Drawings
Fig. 1 is a perspective view of a tool set for testing pci express cards according to a preferred embodiment of the invention.
Fig. 2 is an exploded view of a tool set for testing pci express cards according to a preferred embodiment of the present invention.
FIG. 3 is an exploded view of the tool set for testing PCI express card vibration test and the test board of the vibration test equipment according to the preferred embodiment of the present invention.
FIG. 4 is a perspective view of the test board assembled to the vibration test apparatus by the PCI express card vibration test fixture set according to the preferred embodiment of the present invention.
Fig. 5 is an exploded view of the pci express card vibration test fixture set and the pci express card according to the preferred embodiment of the present invention.
Fig. 6 is a perspective view of a testing board for fixing a pci express card to a vibration testing apparatus according to a preferred embodiment of the present invention.
Fig. 7 is a perspective view of the pci express card vibration test fixture set for fixing the pci express card to the vibration test equipment according to the preferred embodiment of the present invention.
Description of the element reference numerals
1 quick peripheral component interconnection card vibration test fixture set
11 first tool
12 second tool
121 second body
122 second cover body
123 second base
124 cover fixing screw
13 peripheral component interconnect express connector
14 bracket fixing screw
15 first locking screw
16 second locking screw
2 vibration testing device
21 testing board
22 testing platform
23 fixed plate
24 fixed column
3 quick peripheral assembly interconnection card
31 bracket
32 golden finger
D1 first vibration direction
D2 second vibration direction
H1 bracket accommodating hole
H2 first fixing hole
H3 first locking hole
H4 second locking hole
H5 second fixing hole
H6 body locking hole
H7, H8 test board through hole
T-connector accommodating groove
Detailed Description
The following describes in more detail embodiments of the present invention with reference to the schematic drawings. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to scale, which is intended merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
Referring to fig. 1 and fig. 2, fig. 1 is a perspective view of a pci express card vibration test fixture set according to a preferred embodiment of the present invention, and fig. 2 is an exploded view of the pci express card vibration test fixture set according to the preferred embodiment of the present invention. As shown in the drawings, a PCI Express (PCI-E or PCIe) card vibration test fixture set 1 includes a first fixture 11, a second fixture 12, a PCI Express connector 13 and a bracket fixing screw 14. In the present embodiment, the pci express card vibration test fixture set 1 further includes at least one first locking screw 15 (four are shown and one is indicated in the drawings) and at least one second locking screw 16 (three are shown and one is indicated in the drawings).
The first fixture 11 has a bracket receiving hole H1, a first fixing hole H2, and at least a first locking hole H3 corresponding to the first locking screw 15.
The second fixture 12 has a connector receiving slot T, and includes a second body 121, a second cover 122, a second base 123 and at least one cover fixing screw 124 (three are drawn and one is indicated).
The second cover 122 is connected and fixed to the second body 121, and encloses a connector receiving slot T with the second body 121. The second base 123 is connected to the second body 121 and defines at least one second fastening hole H4 corresponding to the second fastening screw 16.
The cover fixing screw 124 correspondingly penetrates through at least one second fixing hole H5 formed in the second cover 122 and at least one body locking hole H6 formed in the second body 121, so as to fix the second cover 122 to the second body 121.
A peripheral component interconnect express (PCIe Connector, also referred to as a PCIe Connector slot) 13 is fixedly disposed in the Connector receiving groove T of the second fixture 12. The bracket fixing screws 14 correspond to the first fixing holes H2 of the first fixture 11.
Next, please refer to fig. 1 to 7 together, wherein fig. 3 is an exploded view of the testing board of the vibration testing apparatus and the tool set for testing the pci express card according to the preferred embodiment of the present invention; FIG. 4 is a perspective view of the test board assembled to the vibration test apparatus by the PCI express card testing fixture set according to the preferred embodiment of the present invention; FIG. 5 is an exploded view of the PCI express card vibration test fixture set and the PCI express card according to the preferred embodiment of the present invention; FIG. 6 is a perspective view of a test board for fixing a PCI express card to a vibration test apparatus according to a preferred embodiment of the present invention; fig. 7 is a perspective view of the pci express card vibration test fixture set according to the preferred embodiment of the present invention, fixing the pci express card to the vibration test equipment.
As shown in the figure, the pci express vibration test fixture set 1 is detachably assembled on a test board 21 of a vibration test apparatus 2, and is used to fix a pci express card 3 to the vibration test apparatus 2, so that the vibration test apparatus 2 can perform a vibration test operation on the pci express card 3.
The first jig 11 is locked to the test board 21 by a first locking means. In the present embodiment, the first locking means is to use the first locking screw 15 to sequentially pass through the first locking hole H3 of the first jig 11 and the test board through hole H7 of the test board 21, so as to lock the first jig 11 on the test board 21, but not limited thereto. In other embodiments of the present invention, the first locking means may be other means that can lock the first jig 11 to the test board 21 by using a clamping structure, a slot, a clamping slot, a key slot, or the like.
The second fixture 12 is locked to the test board 21 by a second locking means. In the present embodiment, the second locking means is to use the second locking screw 16 to sequentially pass through the second locking hole H4 of the second base 123 and the test board through hole H8 of the test board 21, so as to lock the second fixture 12 on the test board 21, but not limited thereto. The second locking means may be other means capable of locking the second jig 12 to the test board 21. In addition, the second locking means may be different from the first locking means.
After the first jig 11 and the second jig 12 are locked to the test board 21, as shown in fig. 4, the peripheral component interconnect express card 3 is accommodated and inserted. In more detail, a gold finger 32 of the pci express card 3 is correspondingly inserted into the pci express connector 13. A cradle 31 of the pci express card 3 is correspondingly received in the cradle receiving hole H1 of the first fixture 11, as shown in fig. 5.
Then, the bracket fixing screws 14 are correspondingly and sequentially inserted through the bracket 31 and the first fixing holes H2 to fix the pci express card 3 to the first fixture 11, as shown in fig. 6. At this time, the pci express card vibration test fixture 1 may fix the pci express card 3 to the vibration test equipment 2, and allow the vibration test equipment 2 to perform a vibration test operation on the pci express card 3, as shown in fig. 7.
In the present embodiment, the vibration testing apparatus 2 includes a testing board 21, a testing platform 22, a fixing board 23 and a plurality of fixing posts 24. The vibration testing device 2 usually performs vibration testing operation after being powered on, and analyzes a test object, which is substantially the same as a general vibration testing device, and thus, the description thereof is omitted. The vibration test equipment 2 performs a vibration test operation on the pci express card 3. The drawings illustrate the vibration in a first vibration direction D1 and a second vibration direction D2 repeatedly, but not limited thereto. The vibration direction of the vibration test operation generally depends on the vibration test apparatus 2, and the vibration test apparatus 2 can perform the vibration test operation in the X-axis direction, the Y-axis direction, and the Z-axis direction.
When the bracket 31 of the pci express card 3 is received in the bracket receiving hole H1 of the first jig 11 and the gold finger 32 of the pci express card 3 is inserted into the pci express connector 13, the assembled pci express card 3 can be simulated. In addition, the PCI express card tool set 1 is detachably assembled to the test board 21 of the vibration test apparatus 2. Therefore, when the vibration test apparatus 2 is performing the vibration test work, it can be regarded as performing the vibration test work on the peripheral component interconnect express card 3 in an assembled state.
In addition, in order to perform the vibration test smoothly, the first jig 11 and the second jig 12 should be made of a material and have a structure that does not generate resonance at the vibration frequency of the vibration test operation, and the upper limit of the vibration frequency is usually about 500 Hz. After analyzing the material and structure of the first fixture 11 and the second fixture 12, no resonance will occur at the vibration frequency below 500 Hz.
In summary, the tool set for testing the interconnection card of the peripheral component is provided by the present invention, wherein the first tool, the second tool, the interconnection connector of the peripheral component and the bracket fixing screw are used for accommodating and fixing the interconnection card of the peripheral component to simulate the assembly state of the interconnection card of the peripheral component, and the interconnection card of the peripheral component in the assembly state is fixed to the vibration testing device, so that the vibration testing device can perform the vibration testing operation on the interconnection card of the peripheral component. Therefore, compared with the prior art, the vibration testing device can evaluate the influence or even the damage degree of the vibration (which may be generated by the external environment, the host, the server or other factors) on the fast peripheral component interconnect card in the assembly state after performing the vibration testing operation on the fast peripheral component interconnect card in the simulated assembly state, and can further avoid the problem of functionality of the fast peripheral component interconnect card in the use process by improving, reinforcing and optimizing the structure of the fast peripheral component interconnect card.
The above detailed description of the preferred embodiments is intended to more clearly illustrate the features and spirit of the present invention, and is not intended to limit the scope of the present invention to the particular embodiments disclosed above. On the contrary, it is intended to cover various modifications and equivalent arrangements included within the scope of the claims.
Claims (9)
1. A tool set for testing vibration of PCI express card is featured as assembling it on a test board of vibration test equipment in detachable mode for fixing a PCI express card on said vibration test equipment for carrying out vibration test operation on said PCI express card by said vibration test equipment and containing:
a first fixture, which is provided with a bracket containing hole and a first fixing hole and is locked and fixed on the test board by a first locking means, and the bracket containing hole is used for containing a bracket of the rapid peripheral component interconnection card;
the second fixture is provided with a connector accommodating groove and is fixedly locked on the test board through a second locking means;
the quick peripheral component interconnection connector is fixedly arranged in the connector accommodating groove and used for inserting and connecting a golden finger of the quick peripheral component interconnection card; and
and a bracket fixing screw correspondingly penetrates through the bracket and the first fixing hole so as to fix the quick peripheral component interconnection card to the first jig.
2. The PCI express card vibration test fixture set of claim 1, wherein: the tool set for testing the vibration of the quick peripheral component interconnection card further comprises at least one first locking screw, and the first locking means correspondingly penetrates through at least one first locking hole of the first tool by utilizing the at least one first locking screw so as to lock the first tool on the test board.
3. The PCI express card vibration test fixture set of claim 2, wherein: the number of the at least one first locking screw is four.
4. The PCI express card vibration test fixture set of claim 1, wherein: the second fixture comprises:
a second body;
the second cover body is connected and fixed on the second body and forms the connector accommodating groove with the second body in an enclosing way; and
the second base is connected with the second body and is provided with at least one second locking hole.
5. The PCI express card vibration test fixture set of claim 4, wherein: the tool set for testing the vibration of the peripheral component interconnect express card further comprises at least one second locking screw, and the second locking means correspondingly penetrates through the at least one second locking hole of the second base by the at least one second locking screw so as to lock the second tool on the test board.
6. The PCI express card vibration test fixture set of claim 5, wherein: the number of the at least one second locking screw is three.
7. The PCI express card vibration test fixture set of claim 4, wherein: the second fixture further comprises at least one cover body fixing screw, and the at least one cover body fixing screw is used for correspondingly penetrating through the at least one cover body through hole of the second cover body so as to fix the second cover body on the second body.
8. The PCI express card vibration test fixture set of claim 7, wherein: the at least one cover body through hole is arranged corresponding to the connector accommodating groove.
9. The PCI express card vibration test fixture set of claim 8, wherein: the number of the at least one cover body fixing screw is three.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011180955.1A CN112378610A (en) | 2020-10-29 | 2020-10-29 | Quick peripheral component interconnection card vibration test fixture set |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011180955.1A CN112378610A (en) | 2020-10-29 | 2020-10-29 | Quick peripheral component interconnection card vibration test fixture set |
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| Publication Number | Publication Date |
|---|---|
| CN112378610A true CN112378610A (en) | 2021-02-19 |
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|---|---|---|---|
| CN202011180955.1A Pending CN112378610A (en) | 2020-10-29 | 2020-10-29 | Quick peripheral component interconnection card vibration test fixture set |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6530279B1 (en) * | 2002-03-07 | 2003-03-11 | Screening Systems, Inc. | Fixture for holding electronic components for vibration testing |
| CN201707185U (en) * | 2010-05-31 | 2011-01-12 | 宜特科技(昆山)电子有限公司 | Stationary fixture for PCB vibration and impact test |
| CN102998072A (en) * | 2011-09-15 | 2013-03-27 | 英业达股份有限公司 | Sway testing device |
| CN105300638A (en) * | 2015-10-09 | 2016-02-03 | 浪潮电子信息产业股份有限公司 | Remote monitoring method for PCIE card falling in server whole-machine package vibration testing |
| CN109870281A (en) * | 2019-02-18 | 2019-06-11 | 中电科仪器仪表有限公司 | A kind of fixture and its application method for PXI series module vibration test |
| CN210347047U (en) * | 2019-09-11 | 2020-04-17 | 南京国电南自电网自动化有限公司 | PCBA vibration test anchor clamps |
-
2020
- 2020-10-29 CN CN202011180955.1A patent/CN112378610A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6530279B1 (en) * | 2002-03-07 | 2003-03-11 | Screening Systems, Inc. | Fixture for holding electronic components for vibration testing |
| CN201707185U (en) * | 2010-05-31 | 2011-01-12 | 宜特科技(昆山)电子有限公司 | Stationary fixture for PCB vibration and impact test |
| CN102998072A (en) * | 2011-09-15 | 2013-03-27 | 英业达股份有限公司 | Sway testing device |
| CN105300638A (en) * | 2015-10-09 | 2016-02-03 | 浪潮电子信息产业股份有限公司 | Remote monitoring method for PCIE card falling in server whole-machine package vibration testing |
| CN109870281A (en) * | 2019-02-18 | 2019-06-11 | 中电科仪器仪表有限公司 | A kind of fixture and its application method for PXI series module vibration test |
| CN210347047U (en) * | 2019-09-11 | 2020-04-17 | 南京国电南自电网自动化有限公司 | PCBA vibration test anchor clamps |
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Application publication date: 20210219 |