CN112365477A - Defect detection method and device - Google Patents
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Abstract
The invention provides a defect detection method and a defect detection device, wherein the method comprises the following steps: acquiring a product image, and converting the product image into a vector diagram; acquiring position parameters of the vector diagram, wherein the position parameters comprise: one or more of size, pixel, and coordinate; and processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline. The defect detection method can meet the requirement of acquiring defect data in a complex service scene, and greatly reduces the problem of inaccurate data caused by various coordinate errors in the data marking process.
Description
Technical Field
The present invention relates to the field of defect detection technologies, and in particular, to a defect detection method, a defect detection apparatus, a computer device, and a non-transitory computer-readable storage medium.
Background
Because various defect product images exist in the current service scene, and the defect data is more and more complicated to acquire, the labeling process is time-consuming and labor-consuming, and the labeling result is inaccurate.
Disclosure of Invention
The invention provides a defect detection method for solving the technical problems, which can meet the requirement of acquiring defect data in a complex service scene and greatly reduce the problem of inaccurate data caused by various coordinate errors in the data marking process.
The technical scheme adopted by the invention is as follows:
a method of defect detection, comprising the steps of: acquiring a product image, and converting the product image into a vector diagram; acquiring position parameters of the vector diagram, wherein the position parameters comprise: one or more of size, pixel, and coordinate; and processing the vector diagram according to the position parameters of the vector diagram to obtain the defect outline.
According to one embodiment of the present invention, processing the vector graphics according to their position parameters comprises: when the size of the vector diagram is smaller than a preset threshold value, amplifying the vector diagram by a first preset proportion; and when the size of the vector diagram is larger than or equal to the preset threshold, reducing the vector diagram by a second preset proportion.
According to one embodiment of the present invention, processing the vector graphics according to their position parameters comprises: acquiring edge coordinates of the vector diagram; judging whether the edge coordinates of the vector diagram are within a preset range or not; if the edge coordinate is not in the preset range, acquiring the distance between the edge coordinate and the preset range; and moving the vector diagram according to the distance so as to enable the vector diagram to be completely in a preset range.
According to one embodiment of the invention, when the vector image is reduced, enlarged or moved, the vector image is enlarged, reduced or moved in a frame-by-frame animation manner.
According to one embodiment of the invention, acquiring a defect profile comprises: positioning the defects in the processed vector diagram by adopting a cursor positioning mode; acquiring coordinates of a cursor moving along the defect; and connecting the coordinates in sequence to obtain the defect outline.
According to an embodiment of the present invention, after obtaining the defect profile, the method further includes: and restoring the coordinates of the obtained defect outline according to the step of processing the vector diagram to obtain the defect coordinates in the original vector diagram.
According to one embodiment of the invention, converting the product image into a vector image comprises: converting the product image into a binary file stream; converting the stream of binary files to image data of base 64; the image data of the base64 is converted into a vector image by an additional function of the browser.
The invention also provides a defect detection device, comprising: the first acquisition module is used for acquiring a product image; the conversion module is used for converting the product image into a vector diagram; a second obtaining module, configured to obtain position parameters of the vector diagram, where the position parameters include: one or more of size, pixel, and coordinate; and the processing module is used for processing the vector diagram according to the position parameters of the vector diagram so as to obtain the defect outline.
The invention also proposes a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the defect detection method according to the above when executing the program.
The invention also proposes a non-transitory computer-readable storage medium on which a computer program is stored which, when executed by a processor, implements the defect detection method described above.
The invention has the beneficial effects that:
firstly, obtaining a product image, and converting the product image into a vector diagram; and acquiring the position parameters of the vector diagram, and processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline. Therefore, the defect data acquisition under a complex service scene can be met, and the problem of inaccurate data caused by various coordinate errors in the data labeling process is greatly reduced.
Drawings
FIG. 1 is a flow chart of a defect detection method according to an embodiment of the invention;
fig. 2 is a block diagram of a defect detection apparatus according to an embodiment of the invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
FIG. 1 is a flowchart illustrating a defect detection method according to an embodiment of the invention.
As shown in fig. 1, the defect detection method of the embodiment of the invention may include the following steps:
and S1, acquiring the product image and converting the product image into a vector diagram.
According to one embodiment of the invention, converting a product image into a vector image comprises: converting the product image into a binary file stream; converting the stream of binary files to image data of base 64; the image data of base64 is converted into a vector image by an additional function of the browser. Among them, Base64 is one of the most common encoding methods for transmitting 8-Bit byte codes on a network, and Base64 is a method for representing binary data based on 64 printable characters. The image data of base64 is converted into vector graphics by the additional function of the browser, for example, the image data of base64 can be converted into vector graphics by the dom element in the window and the XMLSerializer class.
That is to say, through the mode of converting the product image into the vector diagram, can guarantee when acquireing the defect data, guarantee the authenticity of product image, improve the accuracy of acquireing the defect data.
And S2, acquiring position parameters of the vector diagram, wherein the position parameters comprise: one or more of size, pixel, and coordinate.
Specifically, a coordinate system is established with the 4 times size of the product image and the 4 times size of the upper left corner as the origin, the position of the vector diagram can be obtained by obtaining mouse click and movement events, for example, the edge position of the mouse click vector diagram can be obtained, the edge coordinates of the vector diagram can be obtained, and the size of the vector diagram can be obtained according to the distance between the edge coordinates.
And S3, processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline.
According to one embodiment of the invention, processing a vector map according to its position parameters comprises: when the size of the vector diagram is smaller than a preset threshold value, amplifying the vector diagram by a first preset proportion; and when the size of the vector diagram is larger than or equal to the preset threshold value, reducing the vector diagram by a second preset proportion. The preset threshold, the first preset proportion and the second preset proportion can be calibrated according to actual conditions.
Specifically, in order to ensure accuracy of the size of the acquired defect data, when the size of the vector diagram is small, the vector diagram may be enlarged in an enlarging manner; likewise, when the size of the vector diagram is large, the vector diagram can be reduced in a reduction manner. And acquiring coordinates of the enlarged or reduced vector diagram, so that the defect coordinates are restored after the defect outline is acquired, and the real defect coordinates are obtained.
According to another embodiment of the present invention, processing a vector map according to its position parameters comprises: acquiring edge coordinates of the vector diagram; judging whether the edge coordinates of the vector diagram are within a preset range or not; if the edge coordinate is not in the preset range, acquiring the distance between the edge coordinate and the preset range; and moving the vector diagram according to the distance so that the vector diagram is completely in a preset range. It should be noted that the preset range is generally within a canvas with a drawing defect, and in general, when the drawing defect occurs, the vector diagram is placed in the middle of the canvas.
Specifically, when the vector diagram is not within the preset range, for example, is not on a canvas on which a defect is drawn, the vector diagram is moved within the preset range, and the distance by which the vector diagram is moved may be acquired according to the distance between the vector edge coordinates and the preset range, so that the vector diagram is within the preset range.
It should be noted that when the vector diagram is moved to the preset range, if the size of the vector diagram is not satisfactory, the vector diagram is scaled in the manner of the above embodiment.
Further, according to an embodiment of the present invention, when the vector image is reduced, enlarged or moved, the vector image is enlarged, reduced or moved in a frame-by-frame animation.
The frame-by-frame animation method is: the image canvas is converted according to different screen refresh rates, namely the same refresh rate is kept as the display equipment, and each frame of canvas is visually displayed to move, so that the snapping delay experience can not occur.
According to one embodiment of the invention, acquiring a defect profile comprises: positioning the defects in the processed vector diagram by adopting a cursor positioning mode; acquiring coordinates of a cursor moving along the defect; and connecting the coordinates in sequence to obtain the defect outline.
Further, after obtaining the defect profile, the method further includes: and restoring the coordinates of the obtained defect outline according to the step of processing the vector diagram to obtain the defect coordinates in the original vector diagram.
Specifically, a cursor positioning method is adopted, for example, coordinates passed by the mouse when moving are acquired, and a defect outline is drawn along the edge of the defect on a processed vector diagram. And in the process of cursor movement, obtaining the coordinates during movement, and obtaining each coordinate of the defect outline. After the defect outline is obtained, the coordinates of the defect outline are restored, and then the coordinates of the defect outline in the original vector diagram can be obtained. For example, the process of processing the vector image includes: magnifying twice, moving the coordinate to the right by 10cm, and then reducing the coordinate of the defect outline by twice, and moving the coordinate to the left by 10cm to obtain the coordinate of the defect outline in the original vector diagram; as another example, the process of processing the vector diagram includes: and reducing by two times, moving upwards by 10cm, and then, amplifying by two times, and moving downwards by 10cm to obtain the coordinates of the defect outline in the original vector diagram.
After the defect outline is obtained, the defect marking mode can be obtained according to the defect outline, and the defect is marked through the corresponding marking mode, so that the defect marking accuracy can be improved, the marking time is reduced, and the marking efficiency is improved.
In an embodiment of the invention, the defect detection method is further packaged, developed into an independent module application in js language and provided for developers to use; in the webpage application project, the js module application is instantiated in the project, and a label inlet is provided to be used as a display window.
In conclusion, the problem that data inaccuracy caused by various coordinate errors in the data labeling process is greatly reduced in order to meet complex service scene labeling and various product defect picture defect data acquisition in the industrial field is solved, the shortcut key is provided to be used in combination with the webpage end, the labeling time and the labeling cost are greatly reduced, the labeling efficiency is provided, the application is developed into the js module, the js module can be conveniently provided for developers to use, and the access cost and the learning cost are reduced.
In summary, the invention first obtains a product image and converts the product image into a vector diagram; and acquiring the position parameters of the vector diagram, and processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline. Therefore, the defect data acquisition under a complex service scene can be met, and the problem of inaccurate data caused by various coordinate errors in the data labeling process is greatly reduced.
Corresponding to the defect detection method of the above embodiment, the invention further provides a defect detection device.
Fig. 2 is a block diagram of a defect detection apparatus according to an embodiment of the invention.
As shown in fig. 2, the defect detecting apparatus according to the embodiment of the present invention may include: a first obtaining module 10, a converting module 20, a second obtaining module 30 and a processing module 40.
The first acquiring module 10 is used for acquiring a product image. The conversion module 20 is used for converting the product image into a vector diagram. The second obtaining module 30 is configured to obtain position parameters of the vector diagram, where the position parameters include: one or more of size, pixel, and coordinate. The processing module 40 is configured to process the vector diagram according to the position parameter of the vector diagram to obtain a defect contour.
According to an embodiment of the present invention, the processing module 40 processes the vector diagram according to the position parameter of the vector diagram, and is specifically configured to amplify the vector diagram by a first preset proportion when the size of the vector diagram is smaller than a preset threshold; and when the size of the vector diagram is larger than or equal to the preset threshold value, reducing the vector diagram by a second preset proportion.
According to an embodiment of the present invention, the processing module 40 processes the vector diagram according to the position parameter of the vector diagram, specifically, for obtaining the edge coordinate of the vector diagram; judging whether the edge coordinates of the vector diagram are within a preset range or not; if the edge coordinate is not in the preset range, acquiring the distance between the edge coordinate and the preset range; and moving the vector diagram according to the distance so that the vector diagram is completely in a preset range.
According to one embodiment of the invention, when the vector image is reduced, enlarged or moved, the vector image is enlarged, reduced or moved in a frame-by-frame animation mode.
According to an embodiment of the present invention, when acquiring the defect outline, the processing module 40 is specifically configured to locate the defect in the processed vector diagram by using a cursor positioning manner; acquiring coordinates of a cursor moving along the defect; and connecting the coordinates in sequence to obtain the defect outline.
According to an embodiment of the present invention, the processing module 40 is further configured to, after obtaining the defect contour, restore the coordinates of the obtained defect contour according to the step of processing the vector diagram to obtain the coordinates of the defect in the original vector diagram.
According to one embodiment of the invention, the conversion module 20 converts the product image into a vector diagram, in particular for converting the product image into a binary file stream; converting the stream of binary files to image data of base 64; the image data of base64 is converted into a vector image by an additional function of the browser.
It should be noted that details not disclosed in the defect detection apparatus of the embodiment of the present invention refer to details disclosed in the defect detection method of the embodiment of the present invention, and are not repeated herein.
According to the defect detection device, the first acquisition module acquires a product image, the conversion module converts the product image into a vector diagram, the second acquisition module acquires the position parameters of the vector diagram, and the processing module processes the vector diagram according to the position parameters of the vector diagram to acquire a defect outline.
The invention further provides a computer device corresponding to the embodiment.
The computer device according to the embodiment of the present invention includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the defect detection method according to the above-described embodiment of the present invention may be implemented.
According to the computer device of the embodiment of the invention, when the processor executes the computer program stored on the memory, the product image is firstly obtained and converted into the vector diagram; and acquiring the position parameters of the vector diagram, and processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline. Therefore, the defect data acquisition under a complex service scene can be met, and the problem of inaccurate data caused by various coordinate errors in the data labeling process is greatly reduced.
The invention also provides a non-transitory computer readable storage medium corresponding to the above embodiment.
A non-transitory computer-readable storage medium of an embodiment of the present invention has stored thereon a computer program that, when executed by a processor, can implement the defect detection method according to the above-described embodiment of the present invention.
According to the non-transitory computer-readable storage medium of an embodiment of the present invention, when a processor executes a computer program stored thereon, a product image is first acquired and converted into a vector diagram; and acquiring the position parameters of the vector diagram, and processing the vector diagram according to the position parameters of the vector diagram to acquire the defect outline. Therefore, the defect data acquisition under a complex service scene can be met, and the problem of inaccurate data caused by various coordinate errors in the data labeling process is greatly reduced.
In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. The meaning of "plurality" is two or more unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (10)
1. A method of defect detection, comprising the steps of:
acquiring a product image, and converting the product image into a vector diagram;
acquiring position parameters of the vector diagram, wherein the position parameters comprise: one or more of size, pixel, and coordinate;
and processing the vector diagram according to the position parameters of the vector diagram to obtain the defect outline.
2. The defect detection method of claim 1, wherein processing the vector graphics based on position parameters of the vector graphics comprises:
when the size of the vector diagram is smaller than a preset threshold value, amplifying the vector diagram by a first preset proportion;
and when the size of the vector diagram is larger than or equal to the preset threshold, reducing the vector diagram by a second preset proportion.
3. The defect detection method of claim 1, wherein processing the vector graphics based on position parameters of the vector graphics comprises:
acquiring edge coordinates of the vector diagram;
judging whether the edge coordinates of the vector diagram are within a preset range or not;
if the edge coordinate is not in the preset range, acquiring the distance between the edge coordinate and the preset range;
and moving the vector diagram according to the distance so as to enable the vector diagram to be completely in a preset range.
4. A defect detection method according to claim 2 or 3, characterized in that, when the vector image is reduced, enlarged or moved,
and adopting a frame-by-frame animation mode to enlarge, reduce or move the vector diagram.
5. The defect detection method of claim 4, wherein obtaining the defect profile comprises:
positioning the defects in the processed vector diagram by adopting a cursor positioning mode;
acquiring coordinates of a cursor moving along the defect;
and connecting the coordinates in sequence to obtain the defect outline.
6. The defect detection method of claim 5, further comprising, after obtaining the defect profile:
and restoring the coordinates of the obtained defect outline according to the step of processing the vector diagram to obtain the defect coordinates in the original vector diagram.
7. The defect detection method of claim 1, wherein converting the product image into a vector image comprises:
converting the product image into a binary file stream;
converting the stream of binary files to image data of base 64;
the image data of the base64 is converted into a vector image by an additional function of the browser.
8. A defect detection apparatus, comprising:
the first acquisition module is used for acquiring a product image;
the conversion module is used for converting the product image into a vector diagram;
a second obtaining module, configured to obtain position parameters of the vector diagram, where the position parameters include: one or more of size, pixel, and coordinate;
and the processing module is used for processing the vector diagram according to the position parameters of the vector diagram so as to obtain the defect outline.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the defect detection method according to any of claims 1-7 when executing the program.
10. A non-transitory computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the defect detection method according to any one of claims 1 to 7.
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Application publication date: 20210212 |