CN112346363A - Equipment control method and device - Google Patents
Equipment control method and device Download PDFInfo
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- CN112346363A CN112346363A CN202011093386.7A CN202011093386A CN112346363A CN 112346363 A CN112346363 A CN 112346363A CN 202011093386 A CN202011093386 A CN 202011093386A CN 112346363 A CN112346363 A CN 112346363A
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Abstract
The present disclosure provides an apparatus control method, including: acquiring at least one group of test operation parameters for testing target equipment; determining the test operation efficiency of the target equipment aiming at each test operation parameter; establishing a correlation mathematical model between the test operation parameters and the test operation efficiency; acquiring actual operation parameters of the target equipment; determining the actual operation efficiency of the target equipment aiming at the actual operation parameters according to the correlation mathematical model; and performing efficiency optimization operation aiming at the target equipment according to the actual operation efficiency. The present disclosure also provides an apparatus control device, an electronic apparatus, and a computer-readable storage medium.
Description
Technical Field
The present disclosure relates to the field of control technologies, and in particular, to an apparatus control method, an apparatus control device, an electronic apparatus, and a computer-readable storage medium.
Background
The high-efficiency operation of the equipment has important significance for ensuring the production safety, improving the enterprise profits and realizing energy conservation and consumption reduction.
In the process of realizing the disclosed concept, the inventor finds that the reference operation parameters of the equipment under the highest operation efficiency can be determined in the factory test process, and then guides the parameter setting of the equipment in the future operation process by using the reference operation parameters.
However, since the device is cumulatively consumed during the operation process, and the actual operation environment of the device may be different from the test environment, the operation efficiency of the device under the reference operation parameter may be poor, which may affect the operation efficiency and the operation cost of the device, and may even damage the operation safety and the operation overall effect of the device.
Disclosure of Invention
In view of this, the present disclosure provides an apparatus control method and apparatus with high apparatus operation efficiency and good operation effect.
One aspect of the present disclosure provides an apparatus control method, including obtaining at least one set of test operating parameters for testing a target apparatus; determining the test operation efficiency of the target equipment aiming at each test operation parameter; establishing a correlation mathematical model between the test operation parameters and the test operation efficiency; acquiring actual operation parameters of the target equipment; determining the actual operation efficiency of the target equipment aiming at the actual operation parameters according to the correlation mathematical model; and performing efficiency optimization operation aiming at the target equipment according to the actual operation efficiency.
Optionally, the obtaining at least one set of test operating parameters for testing the target device includes obtaining at least one of the following parameters of the target device for each of at least one test rotation speed: flow parameters, head parameters and output power parameters.
Optionally, the establishing of the correlation mathematical model between the test operation parameters and the test operation efficiency includes establishing a correlation curve between the test operation parameters and the test operation efficiency; wherein the correlation curve indicates at least one operating efficiency interval.
Optionally, the determining the actual operating efficiency of the target device with respect to the actual operating parameter according to the correlation mathematical model includes determining whether the actual operating efficiency of the target device is within a preset operating efficiency interval according to the correlation curve.
Optionally, the performing, according to the actual operation efficiency, an efficiency optimization operation for the target device includes adjusting an operation rotation speed of the target device when the actual operation efficiency is not within the preset operation efficiency interval; and/or adjusting the valve opening of the target device.
Optionally, performing an efficiency optimization operation for the target device according to the actual operation efficiency includes using a test operation parameter associated with the preset operation efficiency interval as a target operation parameter; and adjusting the actual operation parameter of the target equipment to the target operation parameter.
Optionally, the method further includes determining a ratio of an operating time of the target device to a total operating time for the preset operating efficiency interval; and when the ratio is lower than a preset threshold value, performing efficiency optimization operation aiming at the target equipment.
Another aspect of the present disclosure provides an apparatus control device, including a first obtaining module, configured to obtain at least one set of test operation parameters for testing a target device; the first processing module is used for determining the test operation efficiency of the target equipment aiming at each test operation parameter; the second processing module is used for establishing a correlation mathematical model between the test operation parameters and the test operation efficiency; the second acquisition module is used for acquiring the actual operation parameters of the target equipment; the third processing module is used for determining the actual operation efficiency of the target equipment aiming at the actual operation parameters according to the correlation mathematical model; and the fourth processing module is used for carrying out efficiency optimization operation aiming at the target equipment according to the actual operation efficiency.
Optionally, the first obtaining module includes a first obtaining submodule, configured to obtain at least one of the following parameters of the target device for each of at least one test rotation speed: flow parameters, head parameters and output power parameters.
Optionally, the second processing module includes a first processing sub-module, configured to establish a correlation curve between the test operation parameter and the test operation efficiency; wherein the correlation curve indicates at least one operating efficiency interval.
Optionally, the third processing module includes a second processing sub-module, configured to determine whether the actual operation efficiency of the target device is within a preset operation efficiency interval according to the association curve.
Optionally, the fourth processing module includes a third processing sub-module, configured to adjust an operating speed of the target device when the actual operating efficiency is not within the preset operating efficiency range; and/or adjusting the valve opening of the target device.
Optionally, the fourth processing module includes a fourth processing sub-module, configured to take a test operation parameter associated with the preset operation efficiency interval as a target operation parameter; and adjusting the actual operation parameter of the target equipment to the target operation parameter.
Optionally, the apparatus further includes a determining module, configured to determine a ratio of an operating time of the target device for the preset operating efficiency interval to a total operating time; and the fifth processing module is used for performing efficiency optimization operation aiming at the target equipment when the ratio is lower than a preset threshold value.
Another aspect of the present disclosure provides an electronic device. The electronic device includes one or more processors; and a memory for storing one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the methods of embodiments of the present disclosure.
Another aspect of the disclosure provides a computer-readable storage medium having stored thereon executable instructions that, when executed by a processor, cause the processor to implement a method of an embodiment of the disclosure.
According to the embodiment of the disclosure, a correlation mathematical model between the operation parameters and the operation efficiency is established based on the test operation parameters and the test operation efficiency of the target equipment, then the actual operation parameters of the target equipment are obtained, the actual operation efficiency corresponding to the actual operation parameters is determined according to the established correlation mathematical model, and then the target equipment is optimized according to the actual operation efficiency. Because the actual operation parameters are obtained in the actual operation process of the target equipment, the determined actual operation efficiency can truly reflect the actual operation state of the target equipment, and operation and maintenance personnel can better monitor the operation state of the target equipment. In addition, the target equipment is optimized according to the actual operation efficiency, the operation state of the target equipment can be adapted to the actual operation environment of the target equipment, the target equipment can be ensured to efficiently operate in the actual operation environment, the waste of operation cost can be effectively avoided, and the operation safety and the operation overall effect are improved.
Drawings
For a more complete understanding of the present disclosure and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
FIG. 1 schematically illustrates a device control system architecture according to an embodiment of the present disclosure;
FIG. 2 schematically illustrates a flow chart of a device control method according to an embodiment of the present disclosure;
FIG. 3 schematically illustrates a flow chart of a device control method according to another embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating a correlation curve between test operating parameters and test operating efficiency according to an embodiment of the present disclosure;
FIG. 5 schematically illustrates a block diagram of a device control apparatus according to an embodiment of the present disclosure;
FIG. 6 schematically illustrates a block diagram of an electronic device suitable for implementing device control methods and apparatus according to an embodiment of the present disclosure.
Detailed Description
Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It is to be understood that such description is merely illustrative and not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, operations steps, operations, or components.
All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.
Where a convention analogous to "at least one of A, B and C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B and C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).
Various embodiments of the present disclosure provide an apparatus control method and a test device to which the method can be applied. The method comprises the steps of obtaining at least one group of test operation parameters for testing target equipment, then determining the test operation efficiency of the target equipment for each test operation parameter, then establishing a correlation mathematical model between the test operation parameters and the test operation efficiency, obtaining the actual operation parameters of the target equipment, determining the actual operation efficiency of the target equipment for the actual operation parameters according to the correlation mathematical model, and finally performing efficiency optimization operation for the target equipment according to the actual operation efficiency.
As shown in fig. 1, the system architecture 100 includes at least one monitoring device (a plurality of monitoring devices, such as monitoring devices 101, 102, 103, are shown) and a control platform 104, wherein the monitoring device is used for testing a target device to obtain an operating parameter of the target device. In the system architecture 100, the control platform 104 obtains at least one set of test operation parameters for testing the target device from the monitoring devices (e.g., the monitoring devices 101, 102, 103), then determines the test operation efficiency of the target device for each test operation parameter, then establishes a correlation mathematical model between the test operation parameters and the test operation efficiency, and further obtains the actual operation parameters of the target device from the monitoring devices, determines the actual operation efficiency of the target device for the actual operation parameters according to the correlation mathematical model, and finally performs the efficiency optimization operation for the target device according to the actual operation efficiency.
The present disclosure will be described in detail below with reference to the drawings and specific embodiments.
Fig. 2 schematically shows a flow chart of a device control method according to an embodiment of the present disclosure.
As shown in fig. 2, the method may include operations S210 to S260, for example.
In operation S210, at least one set of test operation parameters for testing the target device is acquired.
In the embodiment of the present disclosure, the target device may be a device whose main component is a rotating structure and the device working medium is a fluid substance, for example, a water pump, a fan, a cooling tower, or an end fan. Wherein the sensor may be utilized to acquire at least one set of test operating parameters for testing the target device.
The test operating parameters may include at least one of a flow parameter, a head parameter, and an output power parameter. Where the flow parameter may be the mass or volume of fluid material delivered by the target device per unit time period, the flow parameter may be measured using a flow meter. The output power parameter may be the work performed by the target device on the fluid medium per unit time period, which may be measured using a power analyzer.
The lift parameter may be work performed by the target device on a unit weight of the fluid medium, that is, an increment of energy of the unit weight of the fluid medium after passing through the target device, and specifically, the lift parameter may be calculated by the following formula:
in the above formula, H represents a head parameter, m; p is a radical of1Represents the pressure at the inlet of the target device, Pa; p is a radical of2Represents the pressure at the outlet of the target device, Pa; v. of1Represents the flow velocity of the fluid medium at the inlet of the target device, m/s; v. of2Represents the flow velocity of the fluid medium at the outlet of the target device, m/s; z is a radical of1Represents the height at the entrance of the target device, m; z is a radical of2Represents the height, m, at the exit of the target device; ρ represents the density of the fluid medium, kg/m3(ii) a g represents the acceleration of gravity, m/s2。
Specifically, obtaining at least one set of test operating parameters for testing the target device may include obtaining at least one set of test operating parameters of the target device for each of at least one test rotational speed. For each test rotation speed, the test operation parameters of the target equipment can be changed by adjusting the valve closing degree of the target equipment, so that at least one set of operation parameters for each rotation speed of the target equipment is obtained. The test process may be performed when the target device leaves a factory, or before the target device is put into use.
Next, in operation S220, a test operation efficiency of the target device for each test operation parameter is determined.
In the disclosed embodiment, the test operation efficiency is a ratio of an actual power parameter to an output power parameter of the target device during the test process, and is generally used to characterize the maximum operation efficiency that can be achieved by the target device. Wherein the test operating efficiency may be calculated by:
in the above formula, η represents the test operation efficiency of the target equipment, Q represents the flow parameter of the target equipment, H represents the head parameter of the target equipment, and P representsOutput ofRepresenting an output power parameter of the target device.
Specifically, for each group of test operation parameters of each rotating speed of the target device, the test operation efficiency of the target device for each group of test operation parameters is determined respectively.
Next, in operation S230, a correlation mathematical model between the test operation parameters and the test operation efficiency is established.
In the embodiment of the present disclosure, in particular, the correlation mathematical model between the test operation parameter and the test operation efficiency is used to characterize the correlation between the test operation parameter and the test operation efficiency, and may be, for example, a machine learning model or a correlation curve, preferably a correlation curve.
When the correlation mathematical model between the test operation parameters and the test operation efficiency is established, the correlation mathematical model may be established for each rotation speed of the target device, and specifically, the correlation mathematical model may be established for all the test operation parameters of each rotation speed and the corresponding test operation efficiency.
Next, in operation S240, actual operating parameters of the target device are acquired.
In the embodiment of the present disclosure, specifically, the actual operation parameter of the target device is an operation parameter of the target device in an actual operation process, and may include an actual rotation speed parameter, an actual flow parameter, an actual lift parameter, and an actual work output parameter. The method for obtaining the actual operation parameters of the target device is similar to the method for obtaining the test operation parameters of the target device in operation S210, and is not described herein again. The actual operation parameters of the target device can be obtained in real time, and can also be obtained once every preset time period.
Next, in operation S250, an actual operating efficiency of the target device with respect to the actual operating parameter is determined according to the correlation mathematical model.
In this disclosure, specifically, the actual operation parameter of the target device may be used as input data of the correlation mathematical model, and the obtained output data of the correlation mathematical model is the actual operation efficiency of the target device for the actual operation parameter.
Next, in operation S260, an efficiency optimization operation for the target device is performed according to the actual operation efficiency.
In the embodiment of the present disclosure, specifically, during the operation of the target device, the actual operation efficiency of the target device may be low due to the influence of the fluid medium property or the loss of the device parts, and when the reagent operation efficiency of the target device is lower than the preset value, the efficiency optimization operation is performed on the target device. The fluid medium property may be, for example, the density, viscosity, or solute of the fluid medium.
When the efficiency optimization operation is performed on the target equipment, the actual operation parameters of the target equipment can be adjusted so that the actual operation parameters of the target equipment are matched with the fluid medium properties, or the parts with loss can be maintained so as to improve the actual operation efficiency of the target equipment.
In the embodiment of the disclosure, a correlation mathematical model between operation parameters and operation efficiency is established based on test operation parameters and test operation efficiency of target equipment, then actual operation parameters of the target equipment are obtained, actual operation efficiency corresponding to the actual operation parameters is determined according to the established correlation mathematical model, and then optimization operation is performed on the target equipment according to the actual operation efficiency. Because the actual operation parameters are obtained in the actual operation process of the target equipment, the determined actual operation efficiency can truly reflect the actual operation state of the target equipment, and operation and maintenance personnel can better monitor the operation state of the target equipment. In addition, the target equipment is optimized according to the actual operation efficiency, the operation state of the target equipment can be adapted to the actual operation environment of the target equipment, the target equipment can be ensured to efficiently operate in the actual operation environment, the waste of operation cost can be effectively avoided, and the operation safety and the operation overall effect are improved.
Fig. 3 schematically shows a flow chart of a device control method according to another embodiment of the present disclosure.
As shown in FIG. 3, the method may include operations S210-S220, S310, S240, S320-S330, for example.
In operation S210, at least one set of test operation parameters for testing the target device is acquired.
Next, in operation S220, a test operation efficiency of the target device for each test operation parameter is determined.
Operations S210 and S220 are similar to the previous embodiments and are not described again.
Next, in operation S310, a correlation curve between the test operation parameter and the test operation efficiency is established, wherein the correlation curve indicates at least one operation efficiency interval.
In the embodiment of the present disclosure, specifically, the correlation curve between the test operation parameter and the test operation efficiency may be Q-H-P- η, where Q represents a flow parameter of the target device, H represents a head parameter of the target device, P identifies an output power parameter of the target device, and η represents an operation efficiency parameter of the target device. When the correlation curve between the test operation parameter and the test operation efficiency is established, the correlation curve corresponding to each rotation speed can be established for each rotation speed of the target equipment.
According to the value range of the operating efficiency eta in the correlation curve, the value range of the operating efficiency eta can be divided into at least one operating efficiency interval, and each operating efficiency interval corresponds to different operating efficiency standards, for example, the value range (85% -100%) of the eta can be set as an optimal operating efficiency interval, the value range (75% -85%) of the eta can be set as a qualified operating efficiency interval, and the value range (0% -75%) of the eta can be set as an unqualified operating efficiency interval.
Fig. 4 schematically shows a graph of a correlation curve between a test operation parameter and a test operation efficiency according to an embodiment of the present disclosure, and particularly schematically shows a correlation curve between a single test operation parameter and a test operation efficiency. As shown in fig. 4, fig. 4 includes an η -Q curve, an η -P curve and an η -H curve, wherein the η -Q curve is an operation efficiency-flow rate curve, the η -P curve is an operation efficiency-output power curve, and the η -H curve is an operation efficiency-lift curve. Fig. 4 shows the correlation curve of the target apparatus at a single rotation speed, and when there are a plurality of rotation speeds, the correlation curve as shown in fig. 4 exists for each rotation speed. The η - (P, Q, H) curve is similar to the correlation curve shown in fig. 4.
Next, in operation S240, actual operating parameters of the target device are acquired.
Operation S240 is similar to the previous embodiment and is not described again.
Next, in operation S320, it is determined whether the actual operating efficiency of the target device is within a preset operating efficiency interval according to the association curve.
In the embodiment of the present disclosure, specifically, after the actual operation parameters of the target device are obtained, the association curve established in step S310 is used to determine the actual operation efficiency corresponding to the actual operation parameters, and then it is determined whether the actual operation efficiency is within the preset operation efficiency interval.
When determining the actual operating efficiency corresponding to the actual operating parameter, the corresponding correlation curve may be determined according to the actual rotating speed parameter, and then the corresponding actual operating efficiency may be determined according to the actual operating parameter Q/H/P by using the corresponding correlation curve.
Next, in operation S330, when the actual operation efficiency is not within the preset operation efficiency interval, adjusting the operation rotation speed of the target device; and/or adjusting a valve opening of the target device.
In the embodiment of the present disclosure, the preset operation efficiency interval may specifically be an operation efficiency interval meeting a preset operation efficiency standard, and exemplarily, the optimal operation efficiency interval (85% to 100%) and the qualified operation efficiency interval (75% to 85%) may be set as the preset operation efficiency interval.
When the actual operation efficiency of the target device is not within the preset operation efficiency interval, it indicates that the target device is not in the efficient operation state, which easily causes resource waste, and therefore, the actual operation efficiency of the target device needs to be optimized. Wherein, optimizing the actual operating efficiency of the target device may include adjusting an operating speed of the target device; and/or adjusting a valve opening of the target device.
Optionally, the embodiment of the present disclosure may further include taking a test operation parameter associated with the preset operation efficiency interval as a target operation parameter, and adjusting an actual operation parameter of the target device to the target operation parameter. The actual operation parameters of the target equipment are adjusted to the target operation parameters, so that the target equipment operates according to the target operation parameters, the target equipment is favorably kept in a high-efficiency operation state, and resource waste can be effectively avoided.
Optionally, the embodiment of the present disclosure may further include obtaining an actual operation parameter of the target device within a preset time, then determining an actual operation efficiency of the target device within the preset time, and determining an occupation ratio of an operation time of the target device in a preset operation efficiency interval to a total operation time according to the determined actual operation efficiency; and when the ratio is lower than a preset threshold value, performing efficiency optimization operation aiming at the target equipment. The method for performing the efficiency optimization operation on the target device is similar to the foregoing method, and is not described herein again.
In the embodiment of the disclosure, the actual operation efficiency of the target device is monitored and counted in real time, and when the actual operation efficiency of the target device is not within the preset operation efficiency interval, the efficiency of the target device is optimized, so that the dynamic monitoring and optimization of the operation state of the target device are realized, which is helpful for timely finding and correcting the abnormal operation state of the target device, so that the target device can be in an efficient operation state for a long time, which can effectively avoid the waste of the operation cost, and in addition, the operation safety of the target device can be effectively ensured by monitoring the operation state of the target device in real time.
Fig. 5 schematically shows a block diagram of a device control apparatus according to an embodiment of the present disclosure.
As shown in fig. 5, the apparatus may include a first obtaining module 501, a first processing module 502, a second processing module 503, a second obtaining module 504, a third processing module 505, and a fourth processing module 506.
Specifically, the first obtaining module 501 is configured to obtain at least one set of test operation parameters for testing the target device; a first processing module 502, configured to determine test operation efficiency of the target device for each test operation parameter; the second processing module 503 is configured to establish a correlation mathematical model between the test operation parameters and the test operation efficiency; a second obtaining module 504, configured to obtain actual operating parameters of the target device; a third processing module 505, configured to determine, according to the associated mathematical model, actual operation efficiency of the target device for the actual operation parameter; and a fourth processing module 506, configured to perform an efficiency optimization operation for the target device according to the actual operation efficiency.
In the embodiment of the disclosure, a correlation mathematical model between operation parameters and operation efficiency is established based on test operation parameters and test operation efficiency of target equipment, then actual operation parameters of the target equipment are obtained, actual operation efficiency corresponding to the actual operation parameters is determined according to the established correlation mathematical model, and then optimization operation is performed on the target equipment according to the actual operation efficiency. Because the actual operation parameters are obtained in the actual operation process of the target equipment, the determined actual operation efficiency can truly reflect the actual operation state of the target equipment, and operation and maintenance personnel can better monitor the operation state of the target equipment. In addition, the target equipment is optimized according to the actual operation efficiency, the operation state of the target equipment can be adapted to the actual operation environment of the target equipment, the target equipment can be ensured to efficiently operate in the actual operation environment, the waste of operation cost can be effectively avoided, and the operation safety and the operation overall effect are improved.
As an optional embodiment, the first obtaining module includes a first obtaining sub-module, configured to obtain at least one of the following parameters of the target device for each of the at least one test rotation speed: flow parameters, head parameters and output power parameters.
As an optional embodiment, the second processing module includes a first processing sub-module, configured to establish a correlation curve between the test operation parameter and the test operation efficiency; wherein the correlation curve indicates at least one operating efficiency interval.
As an optional embodiment, the third processing module includes a second processing sub-module, configured to determine whether the actual operating efficiency of the target device is within a preset operating efficiency interval according to the association curve.
As an optional embodiment, the fourth processing module includes a third processing sub-module, configured to adjust an operating speed of the target device when the actual operating efficiency is not within the preset operating efficiency range; and/or adjusting a valve opening of the target device.
As an optional embodiment, the fourth processing module includes a fourth processing sub-module, configured to take a test operation parameter associated with the preset operation efficiency interval as a target operation parameter; and adjusting the actual operation parameters of the target equipment to the target operation parameters.
As an optional embodiment, the apparatus further includes a determining module, configured to determine a ratio of a running time of the target device to a total running time for a preset running efficiency interval; and the fifth processing module is used for performing efficiency optimization operation aiming at the target equipment when the ratio is lower than a preset threshold value.
Alternatively, at least part of the functions of any of the modules, sub-modules, or any of the modules in the first obtaining module 501, the first processing module 502, the second processing module 503, the second obtaining module 504, the third processing module 505, and the fourth processing module 506 may be implemented in one module. Any one or more of the modules according to the embodiments of the present disclosure may be implemented by being split into a plurality of modules. Any one or more of the modules according to the embodiments of the present disclosure may be implemented at least in part as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented in any other reasonable manner of hardware or firmware by integrating or packaging the circuit, or in any one of three implementations, or in any suitable combination of any of the software, hardware, and firmware. Or one or more of the modules according to embodiments of the disclosure, may be implemented at least partly as computer program modules which, when executed, may perform corresponding functions.
For example, any plurality of the first obtaining module 501, the first processing module 502, the second processing module 503, the second obtaining module 504, the third processing module 505, and the fourth processing module 506 may be combined and implemented in one module, or any one of the modules may be split into a plurality of modules. Alternatively, at least part of the functionality of one or more of these modules may be combined with at least part of the functionality of the other modules and implemented in one module. Alternatively, at least one of the first obtaining module 501, the first processing module 502, the second processing module 503, the second obtaining module 504, the third processing module 505 and the fourth processing module 506 may be at least partially implemented as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented by hardware or firmware in any other reasonable manner of integrating or packaging a circuit, or implemented by any one of three implementations of software, hardware and firmware, or any suitable combination of any of them. Alternatively, at least one of the first obtaining module 501, the first processing module 502, the second processing module 503, the second obtaining module 504, the third processing module 505 and the fourth processing module 506 may be at least partially implemented as a computer program module, which when executed may perform a corresponding function.
FIG. 6 schematically illustrates a block diagram of an electronic device suitable for implementing device control methods and apparatus according to an embodiment of the present disclosure. The computer system illustrated in FIG. 6 is only one example and should not impose any limitations on the scope of use or functionality of embodiments of the disclosure.
As shown in fig. 6, a computer system 600 according to an embodiment of the present disclosure includes a processor 601, which can perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM)602 or a program loaded from a storage section 608 into a Random Access Memory (RAM) 603. Processor 601 may include, for example, a general purpose microprocessor (e.g., a CPU), an instruction set processor and/or associated chipset, and/or a special purpose microprocessor (e.g., an Application Specific Integrated Circuit (ASIC)), among others. The processor 601 may also include onboard memory for caching purposes. Processor 601 may include a single processing unit or multiple processing units for performing different actions of a method flow according to embodiments of the disclosure.
In the RAM 603, various programs and data necessary for the operation of the system 600 are stored. The processor 601, the ROM 602, and the RAM 603 are connected to each other via a bus 604. The processor 601 performs various operations of the method flows according to the embodiments of the present disclosure by executing programs in the ROM 602 and/or RAM 603. It is to be noted that the programs may also be stored in one or more memories other than the ROM 602 and RAM 603. The processor 601 may also perform various operations of the method flows according to embodiments of the present disclosure by executing programs stored in the one or more memories.
Optionally, system 600 may also include an input/output (I/O) interface 605, where input/output (I/O) interface 605 is also connected to bus 604. The system 600 may also include one or more of the following components connected to the I/O interface 605: an input portion 606 including a keyboard, a mouse, and the like; an output portion 607 including a display such as a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, and a speaker; a storage section 608 including a hard disk and the like; and a communication section 609 including a network interface card such as a LAN card, a modem, or the like. The communication section 609 performs communication processing via a network such as the internet. The driver 610 is also connected to the I/O interface 606 as needed. A removable medium 611 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive bay 610 as necessary, so that a computer program read out therefrom is mounted in the storage section 608 as necessary.
Alternatively, the method flows according to embodiments of the present disclosure may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable storage medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network through the communication section 609, and/or installed from the removable medium 611. The computer program, when executed by the processor 601, performs the above-described functions defined in the system of the embodiments of the present disclosure. Alternatively, the systems, devices, apparatuses, modules, units, etc. described above may be implemented by computer program modules.
The present disclosure also provides a computer-readable storage medium, which may be contained in the apparatus/device/system described in the above embodiments; or may exist separately and not be assembled into the device/apparatus/system. The computer-readable storage medium carries one or more programs which, when executed, implement the method according to an embodiment of the disclosure.
Alternatively, the computer-readable storage medium may be a non-volatile computer-readable storage medium, which may include, for example but is not limited to: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present disclosure, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. For example, a computer-readable storage medium may optionally include one or more memories other than the ROM 602 and/or RAM 603 and/or ROM 602 and RAM 603 described above.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
Those skilled in the art will appreciate that various combinations and/or combinations of features recited in the various embodiments and/or claims of the present disclosure can be made, even if such combinations or combinations are not expressly recited in the present disclosure. In particular, various combinations and/or combinations of the features recited in the various embodiments and/or claims of the present disclosure may be made without departing from the spirit or teaching of the present disclosure. All such combinations and/or associations are within the scope of the present disclosure.
The embodiments of the present disclosure have been described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described separately above, this does not mean that the measures in the embodiments cannot be used in advantageous combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the present disclosure, and such alternatives and modifications are intended to be within the scope of the present disclosure.
Claims (10)
1. An apparatus control method comprising:
acquiring at least one group of test operation parameters for testing target equipment;
determining the test operation efficiency of the target equipment aiming at each test operation parameter;
establishing a correlation mathematical model between the test operation parameters and the test operation efficiency;
acquiring actual operation parameters of the target equipment;
determining the actual operation efficiency of the target equipment aiming at the actual operation parameters according to the correlation mathematical model;
and performing efficiency optimization operation aiming at the target equipment according to the actual operation efficiency.
2. The method of claim 1, wherein the obtaining at least one set of test operating parameters for testing a target device comprises:
acquiring the following at least one parameter of the target device for each test rotating speed in at least one test rotating speed:
flow parameters, head parameters and output power parameters.
3. The method of claim 1, wherein said establishing a mathematical model of the correlation between the test operating parameters and the test operating efficiencies comprises:
establishing a correlation curve between the test operation parameters and the test operation efficiency;
wherein the correlation curve indicates at least one operating efficiency interval.
4. The method of claim 3, wherein said determining an actual operating efficiency of said target device for said actual operating parameter from said associated mathematical model comprises:
and determining whether the actual operation efficiency of the target equipment is within a preset operation efficiency interval or not according to the correlation curve.
5. The method of claim 4, wherein said performing an efficiency optimization operation for the target device based on the actual operating efficiency comprises:
when the actual operating efficiency is not within the preset operating efficiency interval,
adjusting the operating speed of the target device; and/or the presence of a gas in the gas,
adjusting a valve opening of the target device.
6. The method of claim 4, wherein said performing an efficiency optimization operation for the target device based on the actual operating efficiency comprises:
taking the test operation parameters associated with the preset operation efficiency interval as target operation parameters;
adjusting the actual operating parameter of the target device to the target operating parameter.
7. The method of any of claims 4 to 6, further comprising:
determining the ratio of the running time of the target equipment for the preset running efficiency interval to the total running time;
and when the ratio is lower than a preset threshold value, performing efficiency optimization operation aiming at the target equipment.
8. An apparatus control device comprising:
the device comprises a first acquisition module, a second acquisition module and a control module, wherein the first acquisition module is used for acquiring at least one group of test operation parameters for testing target equipment;
the first processing module is used for determining the test operation efficiency of the target equipment aiming at each test operation parameter;
the second processing module is used for establishing a correlation mathematical model between the test operation parameters and the test operation efficiency;
the second acquisition module is used for acquiring the actual operation parameters of the target equipment;
the third processing module is used for determining the actual operation efficiency of the target equipment aiming at the actual operation parameters according to the correlation mathematical model;
and the fourth processing module is used for carrying out efficiency optimization operation aiming at the target equipment according to the actual operation efficiency.
9. An electronic device, comprising:
one or more processors; and
a memory for storing one or more programs,
wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any of claims 1-7.
10. A computer readable storage medium having stored thereon executable instructions which, when executed by a processor, cause the processor to carry out the method of any one of claims 1 to 7.
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