CN112306764A - Multi-station test system and method - Google Patents
Multi-station test system and method Download PDFInfo
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- CN112306764A CN112306764A CN201910680215.5A CN201910680215A CN112306764A CN 112306764 A CN112306764 A CN 112306764A CN 201910680215 A CN201910680215 A CN 201910680215A CN 112306764 A CN112306764 A CN 112306764A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
Abstract
The application relates to a multi-station test system and a method, the test system comprises a control device, a switch switching device and a test board, the control device is connected with the switch switching device, the switch switching device is connected with the test board, the switch switching device is used for connecting more than two tested stations, the control device is used for sending a control command to the switch switching device, the switch switching device is used for switching the corresponding tested stations to be conducted with the test board according to the received control command, and the test board is used for detecting the conducted tested stations. According to the multi-station testing system and method, the switch switching device can switch different tested stations which are communicated with the testing board according to the control instruction, so that the testing board can detect each tested station, multi-station detection is realized through one testing board, the hardware cost can be reduced, the detection efficiency is improved, and the use reliability of the multi-station testing system is improved.
Description
Technical Field
The present application relates to the field of module testing technologies, and in particular, to a multi-station testing system and method.
Background
In manufacturing and testing equipment, multi-station designs are often employed. When each station is the same, the plurality of stations are arranged, so that the workload of the equipment completed in unit time is larger, when each station is different, different manufacturing and equipment requirements can be met by different stations, and the multi-station design plays an important role in improving the productivity of the equipment. However, with the increase of the working time and the use times, the fault of the station is inevitable, and the detection of the station in time is very important to enable the station which can normally work to be put into use.
The traditional multi-station test mechanism generally corresponds to one set of test hardware for each station, but the method needs the test hardware with the same number as the stations when in use, the occupied space is large, the detection cost can be improved due to the hardware equipment with a large number, and the reliability of the traditional multi-station test mechanism is low.
Disclosure of Invention
Therefore, it is necessary to provide a multi-station testing system and method for solving the problem of low reliability of the conventional multi-station testing mechanism.
The utility model provides a multistation test system, includes controlling means, switch auto-change over device and surveys test panel, controlling means connects switch auto-change over device, switch auto-change over device connects survey the test panel, switch auto-change over device is used for connecting more than two measured stations, controlling means is used for sending control command extremely switch auto-change over device, switch auto-change over device be used for according to received control command switch corresponding measured station with survey the test panel and switch on, survey the test panel and be used for detecting the measured station that switches on.
In the multi-station test system, the control device sends the control instruction to the switch switching device, so that the switch switching device switches the tested station communicated with the test board, and the test board detects the communicated tested station. The switch switching device can switch different tested stations which are communicated with the test board, so that the test board can detect each tested station, multi-station detection is realized through one test board, the hardware cost can be reduced, the detection efficiency is improved, and the use reliability of a multi-station test system is improved.
In one embodiment, the control device is an Arduino control board. The control device's control function can be realized as controlling means to Arduino control panel, and uses convenient flexibility, makes things convenient for the shang shou.
In one embodiment, the multi-station testing system further comprises an upper computer, the upper computer is connected with the control device and the testing board, and the upper computer is used for receiving feedback data of the testing board and the control device and analyzing the feedback data to obtain an analysis result. Based on the analysis result, the upper computer can carry out fault diagnosis of the station to be tested, so that the working personnel can know the abnormal condition of the station to be tested in time, and the reliability of the multi-station test system is improved.
In one embodiment, the test board and the control device are connected with the upper computer through USB transmission lines. The test board and the control device transmit feedback data to the upper computer through the USB transmission line, the transmission speed is high, the working efficiency of the multi-station test system can be improved, the USB port matched with the USB transmission line for use supports hot plugging, the USB transmission line is connected to the USB port during use to realize data transmission, the USB transmission line can be pulled out from the USB port when the system is abnormal or needs to be shut down, the response is fast, and the use convenience is high.
In one embodiment, the multi-station testing system further comprises an information prompting device, the testing board is connected with the tested station through the information prompting device, and the information prompting device is used for sending out prompting information when the testing board is communicated with the tested station. The information prompting device can indicate whether the test board is conducted with the station to be tested, and the staff can rapidly acquire the conduction state of the station to be tested through the prompting information sent by the information prompting device, so that the staff can conveniently check the conduction state.
In one embodiment, the information prompting device comprises a prompting lamp and/or a buzzer which are connected in series with a line where the corresponding station to be detected is located. The prompting lamp can realize the function of information prompting through the color or the flashing state of the lamp, the buzzer can realize the function of information prompting through sending prompting sound, and the working personnel can quickly and intuitively know the specific tested station which is communicated with the test board currently through the prompting information, so that the use convenience of the multi-station test system is improved.
In one embodiment, the control device is configured to send a control command to the switch switching device at preset time intervals. After the control device sends the control command according to the preset time interval, the switch switching device sequentially switches the corresponding tested stations to be conducted with the test board according to the received control command and the preset time interval, so that the test board sequentially detects the tested stations according to the preset time interval, the aim of simultaneously testing a plurality of tested stations can be fulfilled, the unit hour productivity of the multi-station test system is increased, and the test efficiency is improved.
In an embodiment, a multi-station testing method of the multi-station testing system is provided, which includes the following steps: the control device sends a control command to the switch switching device. The switch switching device switches the corresponding tested station to be conducted with the test board according to the received control instruction. The test board detects the conducted tested station.
According to the multi-station testing method of the multi-station testing system, the control device sends the control instruction to the switch switching device, the switch switching device is enabled to switch the tested station communicated with the testing board, and the testing board detects the communicated tested station. The switch switching device can switch different tested stations which are communicated with the test board, so that the test board can detect each tested station, multi-station detection is realized through one test board, the hardware cost can be reduced, the detection efficiency is improved, and the use reliability of a multi-station test system is improved.
In one embodiment, after the step of detecting the conducted station under test by the test board, the method further includes the steps of: the upper computer receives the feedback data of the test board and the control device and analyzes the feedback data to obtain an analysis result. Based on the analysis result, the upper computer can carry out fault diagnosis of the station to be tested, so that the working personnel can know the abnormal condition of the station to be tested in time, and the reliability of the multi-station test system is improved.
In one embodiment, after the step of switching the corresponding station to be tested to be conducted with the test board according to the received control command, the method further includes the steps of: the information prompting device sends out prompting information when the test board is communicated with the station to be tested. The information prompting device can indicate whether the test board is conducted with the station to be tested, and the staff can rapidly acquire the conduction state of the station to be tested through the prompting information sent by the information prompting device, so that the staff can conveniently check the conduction state.
Drawings
FIG. 1 is a block diagram of a multi-station test system in one embodiment;
FIG. 2 is a diagram illustrating the connection between a test board and a module under test of the multi-station test system according to one embodiment;
FIG. 3 is a block diagram of a multi-station test system according to another embodiment;
FIG. 4 is a flow diagram of a multi-station testing method in one embodiment;
FIG. 5 is a flow chart of a multi-station testing method in another embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described more fully below by way of examples in conjunction with the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In an embodiment, please refer to fig. 1, which provides a multi-station testing system, including a control device 100, a switch switching device 200 and a testing board 300, wherein the control device 100 is connected to the switch switching device 200, the switch switching device 200 is connected to the testing board 300, the switch switching device 200 is configured to connect two or more tested stations, the control device 100 is configured to send a control command to the switch switching device 200, the switch switching device 200 is configured to switch a corresponding tested station to be conducted with the testing board 300 according to the received control command, and the testing board 300 is configured to detect the conducted tested station. The control device 100 sends a control command to the switch device 200, so that the switch device 200 switches the station to be tested, which is communicated with the test board 300, and the test board 300 detects the communicated station to be tested. The switch switching device 200 can switch different tested stations conducted with the test board 300, so that the test board 300 can detect each tested station, multi-station detection is realized through one test board 300, hardware cost can be reduced, detection efficiency is improved, and use reliability of a multi-station test system is improved.
Specifically, the structure of the switch switching device 200 is not exclusive, and may be, for example, a multi-station hardware adapter plate, where the adapter plate includes an input port and two or more output ports, the input port is connected to the test board 300, each output port is connected to a corresponding station to be tested, the number of the output ports may be greater than or equal to the number of the stations to be tested, when the number of the output ports is equal to the number of the stations to be tested, one output port is connected with one station to be tested, the corresponding relation between the test board 300 and the stations is known, the problem of inconsistent station correspondence can not be caused, when the number of the output ports is larger than the number of the stations to be tested, if part of the output ports fail to work, other output ports can be used for replacing and connecting the tested station, the normal operation of the multi-station testing system is ensured, and the use reliability of the multi-station testing system is improved. The adapter plate is further connected with the control device 100, the control device 100 transmits a control command to the adapter plate to control the high-low level state of the output port of the adapter plate, when the output port is at the high level, the test board 300 is conducted with the tested station connected with the high-level output port, and the test board 300 detects the conducted tested station. When the output port is at low level, the testing board 300 is disconnected from the station to be tested connected to the high level output port, and the testing board 300 does not detect the station to be tested. The switch switching device 200 can switch different tested stations conducted with the test board 300 through the high level of the output port, so that the test board 300 can detect each tested station connected with the output port at the high level, and the switch switching device is simple to operate and convenient and fast to use.
In addition, the switch switching device 200 may also be a relay, a stationary contact of the relay is connected to the test board 300, moving contacts of the relay are respectively connected to different stations to be tested, the relay is further connected to the control device 100, the control device 100 sends a control instruction to the relay to control the working state of a coil of the relay, so that the stationary contact is conducted with the moving contacts connected to the different stations to be tested, and different conducting lines between the test board 300 and the stations to be tested are changed. The control state controls the static contact which is conducted with the static contact through the coil electrifying state of the control relay, the switching is convenient, and the automatic control of conducting circuits can be realized. It is understood that in other embodiments, the switching device 200 may be implemented in other structures, as long as the implementation is considered by those skilled in the art.
The control device 100 sends a control command to the switching device 200, and the signal type of the control command sent by the control device 100 is different according to the type of the switching device 200. For example, when the switch switching device 200 is an adapter board, the type of the control command sent by the control device 100 is a high-low level signal, the switch switching device 200 switches the corresponding station to be tested to be conducted with the test board 300 according to the high-low level state of the output port, and when the switch switching device 200 is a relay, the type of the signal sent by the control device 100 is an electric signal, the electric signal is sent to the relay to control whether a coil of the relay is electrified, so that a movable contact which is conducted with a stationary contact in the relay is controlled, and switching of different stations to be tested which are conducted with the test board 300 is realized. The control device 100 may send the control command according to the content preset by the user, or may also receive the setting command of the user in real time, and send the control command to the switch switching device 200 according to the setting command of the user, so that the degree of automation is high.
The testing board 300 is used to detect the conducted stations, and specifically, referring to fig. 2, each station is connected with a module under test, and when the testing board 300 is conducted with the station, the testing board 300 detects the module under test. The testing board 300 is not unique, for example, the testing board 300 sends a predetermined testing signal to the module under test, and the module under test is detected according to different reactions of the testing signal in the module under test. It is understood that in other embodiments, the test board 300 can be tested in other ways, as long as the skilled person can realize the test.
In one embodiment, the control device 100 is an Arduino control board. Specifically, the Arduino control board is connected to the switching device 200, and the switching device 200 switches the corresponding station to be tested to be conducted with the testing board 300 by sending a control command to the switching device 200 through the Arduino control board. According to the type difference of switch auto-change over device 200, the signal type of the control command that the Arduino control panel sent is also different, for example, when switch auto-change over device 200 is the keysets, through utilizing the Arduino serial ports to send the pin height level of different instruction control keysets to control the corresponding station of being surveyed of switch-on to reach the mesh of testing a plurality of stations of being surveyed. Arduino is an electronic product development platform based on a single-chip microcomputer system, software and hardware systems of the Arduino have high modularization, function expansion is easy, and design and originality of the Arduino are realized by combining simple electronic modules (electronic building blocks). The Arduino software system is completely open source, downloads and uses an official free IDE programming environment, has a simple development environment, does not require a developer to have too many single chip microcomputer bases, and can be connected with a sensor, a driving module, a display screen, an electronic element and the like, so that the functions of control, acquisition and output are realized. Arduino is programmed based on an entry-level C/C + + development language, the programming threshold is low, a plurality of common functions are processed in a functional mode, only functions need to be directly called or library files need to be downloaded for use, and the Arduino is easy to master and use. The Arduino control panel can be used as the control device 100 to realize the control function of the control device 100, and is convenient and flexible to use and convenient to use.
In an embodiment, referring to fig. 3, the multi-station testing system further includes an upper computer 400, the upper computer 400 is connected to the control device 100 and the testing board 300, and the upper computer 400 is configured to receive feedback data of the testing board 300 and the control device 100, and analyze the feedback data to obtain an analysis result. Based on the analysis result, the upper computer 400 can perform fault diagnosis of the tested station, so that the worker can know the abnormal condition of the tested station in time, and the reliability of the multi-station testing system is improved.
Specifically, the upper computer 400 receives feedback data of the test board 300 and the control device 100, taking the tested station as the No. 1-100 as an example, the control device 100 sends a control instruction to the switch switching device 200, the switch device switches the corresponding tested station in the No. 1-100 tested station to be conducted with the test board 300 according to the received control instruction, the test board 300 detects the conducted tested station, the control device 100 sends the feedback data to the upper computer 400, the feedback data includes the serial number of the specific tested station conducted with the test board 300 at the current time, the test board 300 detects the tested station, and sends the feedback data to the upper computer 400, and the feedback data includes the detection data of the tested station of the serial number. The upper computer 400 obtains an analysis result by analyzing the feedback data, the analysis result includes the number of the currently detected station and the detection result corresponding to the detected station of the number, the switch switching device 200 continues to switch the detected stations of other numbers to be conducted with the test board 300 according to the received control instruction, so that the test board 300 can detect the conducted detected stations, and the multi-station test system can realize the detection of a plurality of detected stations.
In one embodiment, the test board 300 and the control device 100 are connected to the host computer 400 through USB transmission lines. USB is an external bus standard that specifies the connections between devices. Survey test panel 300 and pass through USB transmission line connection host computer 400, can pass through USB transmission line transmission to host computer 400 with test data, controlling means 100 passes through USB transmission line connection host computer 400, can pass through USB transmission line transmission to host computer 400 with data, survey test panel 300 and controlling means 100 and all transmit feedback data to host computer 400 through the USB transmission line, the transmission rate is fast, can improve multistation test system's work efficiency, and support the hot plug with the supporting USB port that uses of USB transmission line, be connected to USB transmission line during the use and can realize data transmission on the USB port, when the system appears unusually or need shut down, also can follow USB transmission line and pull out the USB port department, the response is fast, it is high to use the convenience.
In one embodiment, referring to fig. 3, the multi-station testing system further includes an information prompting device 500, the testing board 300 is connected to the station under test through the information prompting device 500, and the information prompting device 500 is used for sending out a prompting message when the testing board 300 is conducted with the station under test. The information prompting device 500 can indicate whether the test board 300 is conducted with the station to be tested, and the staff can rapidly acquire the conduction state of the station to be tested through the prompting information sent by the information prompting device 500, so that the staff can conveniently check the conduction state.
Specifically, the setting position of the information prompting device 500 is not unique, for example, the information prompting device 500 may be connected in series to a line corresponding to the station to be tested, when the station to be tested is conducted with the testing board 300, a current passes between the station to be tested and the testing board 300, the current on the line enables the information prompting device 500 to work, prompt information is sent, and a worker can quickly and intuitively know the specific station to be tested which is currently conducted with the testing board 300 through the prompt information, so that the use convenience of the multi-station testing system is improved. The number of the information prompting devices 500 is not unique, and taking the number of the information prompting devices 500 equal to the number of the stations to be tested as an example, each station to be tested is connected with the switch switching device 200 through one information prompting device 500, when one station to be tested is conducted with the test board 300, the corresponding information prompting device 500 sends out prompting information, the information prompting devices 500 between the lines work independently, mutual interference cannot be generated, and the accuracy of information prompting can be improved.
In one embodiment, the information prompting device 500 includes a prompting lamp and/or a buzzer connected in series with the line of the corresponding station under test. The prompting lamp can realize the function of information prompting through the color or the flashing state of the lamp, the buzzer can realize the function of information prompting through sending prompting sound, and the working personnel can quickly and intuitively know the specific tested station which is communicated with the test board 300 currently through the prompting information, so that the use convenience of the multi-station test system is improved.
Specifically, the information prompting device 500 may include a prompting lamp connected in series to the line corresponding to the detected station, or a buzzer connected in series to the line corresponding to the detected station, or both a prompting lamp and a buzzer connected in series to the line corresponding to the detected station. When the information prompting device 500 comprises the prompting lamps connected in series with the line corresponding to the station to be tested, each station to be tested is connected with the test board 300 through the prompting lamps, and when the test board 300 is conducted with one station to be tested, the prompting lamps connected in series with the line corresponding to the conducted station to be tested send out prompting information. The warning light can realize the information suggestion through the state of lighting, the state of scintillation or warning light colour, for example, when the station under test of the circuit that the warning light is located switches on with survey test panel 300, the warning light lights, perhaps the warning light lasts the scintillation, perhaps the warning light sends green light, makes the staff fix a position at present the station under test of being tested fast, improves work efficiency. When the information prompt device 500 includes a buzzer connected in series to the line corresponding to the station to be tested, each station to be tested is connected to the test board 300 through the buzzer, and when the test board 300 is conducted with one station to be tested, the buzzer connected in series to the line corresponding to the conducted station to be tested sends out prompt information. The buzzer can realize information prompt by making sound, so that the working personnel can quickly locate the currently tested station, and the working efficiency is improved. When information prompt device 500 is including concatenating in the warning light and the buzzer that correspond the circuit of being surveyed the station place, except realizing foretell information prompt facility, when one of them device broke down, can also realize the function of information prompt through another device, in addition, two devices play the effect of mutual complementation, realize the function of information prompt jointly, for example, under the environment that light is not good, the information prompt effect of playing through the warning light is more obvious, under the better condition of light, the information prompt of realizing through the buzzer is more outstanding, both combine the use, the reliability in utilization of multistation test system has been improved.
In one embodiment, the control device 100 is configured to send a control command to the switching device 200 at preset time intervals. After the control device 100 sends the control command according to the preset time interval, the switch switching device 200 sequentially switches the corresponding tested stations according to the received control command according to the preset time interval to be conducted with the test board 300, so that the test board 300 sequentially detects the tested stations according to the preset time interval, the purpose of simultaneously testing a plurality of tested stations can be achieved, the unit hour productivity of the multi-station test system is increased, and the test efficiency is improved.
Specifically, the duration of the preset time interval is not unique, and can be adjusted according to the actual needs of the user to meet the requirements of more occasions. The preset time interval may be an execution instruction preset in the control device 100 by a user before use, and when the multi-station test system starts to operate, the control device 100 runs the execution instruction and sends the control instruction according to the preset time interval. In an expandable manner, when the multi-station testing system further includes the upper computer 400, the preset time interval may also be from the upper computer 400, and the control device 100 sends the control instruction to the switch switching device 200 according to the preset time interval after receiving the signal sent by the upper computer 400. Through presetting time interval, can realize the test in proper order to a plurality of stations that are surveyed, and time interval is adjustable, and the range of application is extensive.
In the multi-station testing system, the control device 100 sends a control command to the switch switching device 200, so that the switch switching device 200 switches the station to be tested, which is communicated with the testing board 300, and the testing board 300 detects the communicated station to be tested. The switch switching device 200 can switch different tested stations conducted with the test board 300, so that the test board 300 can detect each tested station, multi-station detection is realized through one test board 300, hardware cost can be reduced, detection efficiency is improved, and use reliability of a multi-station test system is improved.
In an embodiment, referring to fig. 4, a multi-station testing method of the multi-station testing system is provided, which includes the following steps:
step S100: the control device 100 sends a control command to the switching device 200.
The control device 100 sends a control command to the switching device 200, and the signal type of the control command sent by the control device 100 is different according to the type of the switching device 200. For example, when the switch switching device 200 is an adapter board, the type of the control command sent by the control device 100 is a high-low level signal, the switch switching device 200 switches the corresponding station to be tested to be conducted with the test board 300 according to the high-low level state of the output port, and when the switch switching device 200 is a relay, the type of the signal sent by the control device 100 is an electric signal, the electric signal is sent to the relay to control whether a coil of the relay is electrified, so that a movable contact which is conducted with a stationary contact in the relay is controlled, and switching of different stations to be tested which are conducted with the test board 300 is realized. The control device 100 may send the control command according to the content preset by the user, or may also receive the setting command of the user in real time, and send the control command to the switch switching device 200 according to the setting command of the user, so that the degree of automation is high.
Step S200: the switch switching device 200 switches the corresponding station to be tested to conduct with the test board 300 according to the received control command.
Specifically, the structure of the switch switching device 200 is not exclusive, and may be, for example, a multi-station hardware adapter plate, where the adapter plate includes an input port and two or more output ports, the input port is connected to the test board 300, each output port is connected to a corresponding station to be tested, the number of the output ports may be greater than or equal to the number of the stations to be tested, when the number of the output ports is equal to the number of the stations to be tested, one output port is connected with one station to be tested, the corresponding relation between the test board 300 and the stations is known, the problem of inconsistent station correspondence can not be caused, when the number of the output ports is larger than the number of the stations to be tested, if part of the output ports fail to work, other output ports can be used for replacing and connecting the tested station, the normal operation of the multi-station testing system is ensured, and the use reliability of the multi-station testing system is improved. The adapter plate is further connected with the control device 100, the control device 100 transmits a control command to the adapter plate to control the high-low level state of the output port of the adapter plate, when the output port is at the high level, the test board 300 is conducted with the tested station connected with the high-level output port, and the test board 300 detects the conducted tested station. When the output port is at low level, the testing board 300 is disconnected from the station to be tested connected to the high level output port, and the testing board 300 does not detect the station to be tested. The switch switching device 200 can switch different tested stations conducted with the test board 300 through the high level of the output port, so that the test board 300 can detect each tested station connected with the output port at the high level, and the switch switching device is simple to operate and convenient and fast to use.
Step S300: the testing board 300 detects the conducted station under test.
Specifically, each station to be tested is connected to a module to be tested, and when the testing board 300 is conducted with the station to be tested, the testing board 300 detects the module to be tested. The testing board 300 is not unique, for example, the testing board 300 sends a predetermined testing signal to the module under test, and the module under test is detected according to different reactions of the testing signal in the module under test. It is understood that in other embodiments, the test board 300 can be tested in other ways, as long as the skilled person can realize the test.
In one embodiment, referring to fig. 5, after step S300, step S400 is further included.
Step S400: the upper computer 400 receives the feedback data of the test board 300 and the control device 100, and analyzes the feedback data to obtain an analysis result.
Specifically, the upper computer 400 receives feedback data of the test board 300 and the control device 100, taking the tested station as the No. 1-100 as an example, the control device 100 sends a control instruction to the switch switching device 200, the switch device switches the corresponding tested station in the No. 1-100 tested station to be conducted with the test board 300 according to the received control instruction, the test board 300 detects the conducted tested station, the control device 100 sends the feedback data to the upper computer 400, the feedback data includes the serial number of the specific tested station conducted with the test board 300 at the current time, the test board 300 detects the tested station, and sends the feedback data to the upper computer 400, and the feedback data includes the detection data of the tested station of the serial number. The upper computer 400 obtains an analysis result by analyzing the feedback data, the analysis result includes the number of the currently detected station and the detection result corresponding to the detected station of the number, the switch switching device 200 continues to switch the detected stations of other numbers to be conducted with the test board 300 according to the received control instruction, so that the test board 300 can detect the conducted detected stations, and the multi-station test system can realize the detection of a plurality of detected stations.
In one embodiment, referring to fig. 5, after step S200, step S500 is further included.
Step S500: the information prompt device 500 sends prompt information when the test board 300 is conducted with the station to be tested.
Specifically, the setting position of the information prompting device 500 is not unique, for example, the information prompting device 500 may be connected in series to a line corresponding to the station to be tested, when the station to be tested is conducted with the testing board 300, a current passes between the station to be tested and the testing board 300, the current on the line enables the information prompting device 500 to work, prompt information is sent, and a worker can quickly and intuitively know the specific station to be tested which is currently conducted with the testing board 300 through the prompt information, so that the use convenience of the multi-station testing system is improved.
In the multi-station testing method of the multi-station testing system, the control device 100 sends a control command to the switch switching device 200, so that the switch switching device 200 switches the tested station communicated with the testing board 300, and the testing board 300 detects the communicated tested station. The switch switching device 200 can switch different tested stations conducted with the test board 300, so that the test board 300 can detect each tested station, multi-station detection is realized through one test board 300, hardware cost can be reduced, detection efficiency is improved, and use reliability of a multi-station test system is improved.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. The utility model provides a multistation test system, its characterized in that includes controlling means, switch auto-change over device and surveys test panel, controlling means connects switch auto-change over device, switch auto-change over device connects survey the test panel, switch auto-change over device is used for connecting more than two stations under test, controlling means is used for sending control command extremely switch auto-change over device, switch auto-change over device be used for according to received control command switch corresponding station under test with survey the test panel and switch on, survey the test panel and be used for detecting the station under test who switches on.
2. The system of claim 1, wherein the control device is an Arduino control panel.
3. The system according to claim 1, further comprising an upper computer, wherein the upper computer is connected with the control device and the test board, and the upper computer is used for receiving feedback data of the test board and the control device and analyzing the feedback data to obtain an analysis result.
4. The system of claim 3, wherein the test board and the control device are connected to the host computer through USB transmission lines.
5. The system according to claim 1, further comprising an information prompting device, wherein the test board is connected to the station under test through the information prompting device, and the information prompting device is used for sending out a prompting message when the test board and the station under test are conducted.
6. The system according to claim 5, wherein the information prompting device comprises a prompting lamp and/or a buzzer which are connected in series with a line corresponding to the station to be detected.
7. The system of claim 1, wherein the control device is configured to send control commands to the switching device at predetermined time intervals.
8. A multi-station testing method of a multi-station testing system according to any one of claims 1 to 7, comprising the steps of:
the control device sends a control instruction to the switch switching device;
the switch switching device switches the corresponding tested station to be conducted with the test board according to the received control instruction;
and the test board detects the conducted tested station.
9. The method of claim 8, wherein the step of testing the conducting station by the testing board further comprises the steps of:
and the upper computer receives the feedback data of the test board and the control device and analyzes the feedback data to obtain an analysis result.
10. The method according to claim 8, wherein the step of switching the corresponding station under test to be conducted with the test board by the switch switching device according to the received control command further comprises the steps of:
and the information prompting device sends out prompting information when the test board is communicated with the station to be tested.
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| CN201910680215.5A CN112306764A (en) | 2019-07-26 | 2019-07-26 | Multi-station test system and method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115453326A (en) * | 2022-09-29 | 2022-12-09 | 北京华峰测控技术股份有限公司 | Test machine, test control device and method |
| CN115598580A (en) * | 2022-12-12 | 2023-01-13 | 南京宏泰半导体科技有限公司（Cn） | Automatic switching calibration device and method for test station of discrete device semiconductor test system |
| CN117119176A (en) * | 2023-10-23 | 2023-11-24 | 深圳市龙之源科技股份有限公司 | Camera test circuit, camera test device and camera test method |
-
2019
- 2019-07-26 CN CN201910680215.5A patent/CN112306764A/en not_active Withdrawn
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115453326A (en) * | 2022-09-29 | 2022-12-09 | 北京华峰测控技术股份有限公司 | Test machine, test control device and method |
| WO2024067742A1 (en) * | 2022-09-29 | 2024-04-04 | 北京华峰测控技术股份有限公司 | Tester, and test control apparatus and method |
| CN115598580A (en) * | 2022-12-12 | 2023-01-13 | 南京宏泰半导体科技有限公司（Cn） | Automatic switching calibration device and method for test station of discrete device semiconductor test system |
| CN117119176A (en) * | 2023-10-23 | 2023-11-24 | 深圳市龙之源科技股份有限公司 | Camera test circuit, camera test device and camera test method |
| CN117119176B (en) * | 2023-10-23 | 2024-04-05 | 深圳市龙之源科技股份有限公司 | Camera test circuit, camera test device and camera test method |
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