CN112285169A - System and method for distinguishing material attributes based on touch device - Google Patents
System and method for distinguishing material attributes based on touch device Download PDFInfo
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- CN112285169A CN112285169A CN202011132245.1A CN202011132245A CN112285169A CN 112285169 A CN112285169 A CN 112285169A CN 202011132245 A CN202011132245 A CN 202011132245A CN 112285169 A CN112285169 A CN 112285169A
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- 239000000463 material Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims description 14
- 238000004891 communication Methods 0.000 claims abstract description 13
- 238000012360 testing method Methods 0.000 claims description 6
- 239000002184 metal Substances 0.000 abstract description 9
- 239000012535 impurity Substances 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052752 metalloid Inorganic materials 0.000 description 1
- 150000002738 metalloids Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000011257 shell material Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
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Abstract
The invention discloses a system for distinguishing material properties based on a touch device, which comprises a capacitive sensor unit, a touch control unit and an MCU (microprogrammed control unit), wherein the MCU is connected with the touch control unit; the touch control unit comprises a capacitive touch controller and a burning interface, wherein the output end of the touch controller is provided with an I2C, connecting a host of the communication interface; the MCU control unit comprises an MCU controller electrically connected with the touch controller, and the output end of the MCU controller is directly connected with a standard USB interface. The touch control unit reads the real-time data of the capacitive sensor, detects the tiny capacitance variation, timely detects whether the material contains metal impurities, prevents the formed product from being influenced in use, and greatly improves the convenience and efficiency of material distinguishing.
Description
Technical Field
The invention relates to the technical field of capacitive touch, in particular to a system and a method for distinguishing material attributes based on a touch device.
Background
In recent years, with the improvement of the scientific and technical level, particularly with the rapid development of the fields of computer technology, network technology, communication technology, control technology and the like, the social informatization is also developing rapidly, the relationship between the work life and the communication of people is becoming more and more compact, and more intelligent control systems are produced under the situation. Along with the rise of intelligent technology, the method has been applied in different fields, but because the influence of metal materials on signals in some communication fields is large, the attribute requirements on shell materials are strict, and metal impurities cannot exist, because the metal impurities cannot be judged by naked eyes, analysis can only be performed by some technical means, once metal impurities are mixed in the production process or raw materials are produced, the influence on final finished products is inevitably generated, the material loss is caused, the production cost is increased, and the customer experience is poor. In recent years, with the application of intelligent control, the problems become more and more trivial, and because of the problems, many fields with higher material requirements may have many problems in production and manufacturing. Therefore, it is important to quickly detect the influence of the metal on the material and to determine whether or not there is an impurity having a metal or metalloid property. In view of the foregoing, it is desirable to design a system and method for differentiating material properties based on a touch device.
Disclosure of Invention
The invention aims to provide a system and a method for distinguishing material attributes based on a touch device.
In order to achieve the above object, the present invention provides a system for distinguishing material properties based on a touch device, comprising a capacitive sensor unit, a touch control unit and an MCU control unit, wherein the MCU control unit is connected to the touch control unit, the touch control unit is connected to the capacitive sensor unit, the capacitive sensor unit comprises a capacitive sensor and a cover plate, and the cover plate is used to protect the capacitive sensor;
the touch control unit comprises a capacitive touch controller electrically connected with the capacitive sensor and a burning interface, the burning interface is used for directly testing or accessing a host, and the output end of the touch controller is provided with a circuit 12The host of the communication interface C is connected, and a pull-up resistor which can ensure the pull-up capability is arranged on the communication interface 12C;
the MCU control unit comprises an MCU controller electrically connected with the touch controller, and the output end of the MCU controller is directly connected with a standard USB interface.
Preferably, the MCU controller is an MCU control chip.
Preferably, the pull-up resistor is a pull-up resistor of 3.3K ohms.
Preferably, a switching FPC is connected to the capacitive sensor.
A method of distinguishing material properties based on a touch device, comprising the steps of:
firstly, I on the host2C, accessing the communication interface into the touch controller or accessing a standard USB interface on the host into the MCU controller;
and secondly, the capacitance sensor senses the capacitance variation of the material, the touch controller receives the data of the capacitance sensor, directly reports the data to the host or transmits the data to the MCU controller, and the data are transmitted to the host through the standard USB interface.
Therefore, the system and the method for distinguishing the material attributes based on the touch device with the structure read the real-time data of the capacitive sensor through the touch control unit, detect the tiny capacitance variation, timely detect whether the material contains metal impurities or not, prevent the formed product from being influenced in use, and greatly improve the convenience and the efficiency of material distinguishing.
The technical solution of the present invention is further described in detail by the accompanying drawings and embodiments.
Drawings
FIG. 1 is a flow chart of an embodiment of a system and method for distinguishing material properties based on a touch device according to the present invention;
FIG. 2 is a schematic structural diagram of a capacitive sensor cell according to an embodiment of the present invention, wherein the capacitive sensor cell is configured to distinguish material properties based on a touch device;
FIG. 3 is a schematic diagram of a system for distinguishing material properties based on a touch device according to the present invention;
FIG. 4 is a block diagram of a control portion of a system for differentiating material properties based on a touch device according to the present invention;
fig. 5 is a schematic circuit diagram of an MCU control unit of a system for distinguishing material properties based on a touch device according to the present invention.
Detailed Description
The technical solution of the present invention is further illustrated by the accompanying drawings and examples.
Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. The use of "first," "second," and similar terms in the present application do not denote any order, quantity, or importance, but rather the terms are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
Examples
Fig. 1 is a flowchart of an embodiment of a system and a method for distinguishing material properties based on a touch device according to the present invention, fig. 2 is a schematic structural diagram of a capacitive sensor unit according to an embodiment of a system and a method for distinguishing material properties based on a touch device according to the present invention, fig. 3 is a schematic structural diagram of a system for distinguishing material properties based on a touch device according to the present invention, fig. 4 is a structural diagram of a control portion of a system for distinguishing material properties based on a touch device according to the present invention, and fig. 5 is a schematic circuit diagram of an MCU control unit of a system for distinguishing material properties based on a touch device according to the present invention. As shown in the figure, the invention provides a system for distinguishing material properties based on a touch device, which comprises a capacitive sensor unit 1, a touch control unit 2 and an MCU control unit 3, wherein the MCU control unit 3 is connected with the touch control unit 2, and the touch control unit 2 and the capacitive sensor unit1, the capacitive sensor unit 1 comprises a capacitive sensor 11 and a cover plate 12, and the cover plate 12 is used for protecting the capacitive sensor 11, so that the capacitive sensor 11 cannot be easily damaged by materials in the test of various materials, and the phenomenon that the test cannot be performed is caused; the touch control unit 2 comprises a capacitive touch controller 21 electrically connected with the capacitive sensor 11 and a burning interface, the burning interface is used for directly testing or accessing a host, the testing and burning interfaces are the same, great convenience is brought to customers, and the output end of the touch controller 21 and the I-shaped contact surface2C host connection of the communication interface, I2A pull-up resistor which can ensure the pull-up capability is arranged on the communication interface C, the pull-up resistor is a 3.3K ohm pull-up resistor, and in order to enable signals of the touch controller to be more stable, secondary filtering decoupling and other processing are carried out on a power supply provided by the system; the MCU control unit 3 includes an MCU controller 31 electrically connected to the touch controller 21, and an output terminal of the MCU controller 31 is directly connected to a standard USB interface. The MCU controller 31 is an MCU control chip. The capacitance type sensor is adopted to collect capacitance signal variation, and the collected data can be directly sent to the MCU controller or the host computer through the touch control chip, so that the metal impurities can be detected, other or auxiliary systems are not needed, the capacitance type sensor has the advantages of simple structure and strong adaptability, very weak capacitance signal variation can be detected, only one group of 3.3V or 5V power supply is needed for external connection, and subsequent installation and maintenance of a client are facilitated.
The relay FPC 4 is connected to the capacitive sensor 11.
A method of distinguishing material properties based on a touch device, comprising the steps of:
firstly, I on the host2C, accessing the communication interface into the touch controller or accessing a standard USB interface on the host into the MCU controller;
and secondly, the capacitance sensor senses the capacitance variation of the material, the touch controller receives the data of the capacitance sensor, directly reports the data to the host or transmits the data to the MCU controller, and the data are transmitted to the host through the standard USB interface.
Therefore, the system and the method for distinguishing the material attributes based on the touch device with the structure read the real-time data of the capacitive sensor through the touch control unit, detect the tiny capacitance variation, timely detect whether the material contains metal impurities or not, prevent the formed product from being influenced in use, and greatly improve the convenience and the efficiency of material distinguishing.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solutions of the present invention and not for limiting the same, and although the present invention is described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that: modifications and equivalents may be made to the invention without departing from the spirit and scope of the invention.
Claims (5)
1. A system for distinguishing material properties based on a touch device, comprising:
the touch control system comprises a capacitive sensor unit, a touch control unit and an MCU control unit, wherein the MCU control unit is connected with the touch control unit, the touch control unit is connected with the capacitive sensor unit, the capacitive sensor unit comprises a capacitive sensor and a cover plate, and the cover plate is used for protecting the capacitive sensor;
the touch control unit comprises a capacitive touch controller electrically connected with the capacitive sensor and a burning interface, the burning interface is used for directly testing or accessing a host, and the output end of the touch controller is provided with an I2The host computer of the communication interface C is connected, and a pull-up resistor which ensures the pull-up capability is arranged on the I2C communication interface;
the MCU control unit comprises an MCU controller electrically connected with the touch controller, and the output end of the MCU controller is directly connected with a standard USB interface.
2. The system for distinguishing material properties based on a touch device of claim 1, wherein: the MCU controller is an MCU control chip.
3. The system for distinguishing material properties based on a touch device of claim 2, wherein: the pull-up resistor is a 3.3K ohm pull-up resistor.
4. A system for distinguishing material properties based on a touch device as claimed in claim 3 wherein: and the capacitive sensor is connected with a switching FPC.
5. A method of distinguishing material properties based on a touch device according to any of claims 1-4, comprising the steps of:
firstly, I on the host2C, accessing the communication interface into the touch controller or accessing a standard USB interface on the host into the MCU controller;
and secondly, the capacitance sensor senses the capacitance variation of the material, the touch controller receives the data of the capacitance sensor, directly reports the data to the host or transmits the data to the MCU controller, and the data are transmitted to the host through the standard USB interface.
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CN202011132245.1A CN112285169A (en) | 2020-10-21 | 2020-10-21 | System and method for distinguishing material attributes based on touch device |
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CN202011132245.1A CN112285169A (en) | 2020-10-21 | 2020-10-21 | System and method for distinguishing material attributes based on touch device |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201004056Y (en) * | 2007-01-30 | 2008-01-09 | 格兰富水泵(上海)有限公司 | Impurity capacitance sensor for detecting liquid |
CN102298477A (en) * | 2011-09-19 | 2011-12-28 | 深圳市汇顶科技有限公司 | Method and system for making touch controller adaptive to capacitive touch sensor |
CN107192745A (en) * | 2017-05-26 | 2017-09-22 | 苏州芯沃科电子科技有限公司 | A kind of test using capacitance sensor system and detection method for detecting lotus seeds |
CN213181351U (en) * | 2020-10-19 | 2021-05-11 | 苏州芯沃科电子科技有限公司 | Device for detecting material impurities based on capacitance principle |
-
2020
- 2020-10-21 CN CN202011132245.1A patent/CN112285169A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201004056Y (en) * | 2007-01-30 | 2008-01-09 | 格兰富水泵(上海)有限公司 | Impurity capacitance sensor for detecting liquid |
CN102298477A (en) * | 2011-09-19 | 2011-12-28 | 深圳市汇顶科技有限公司 | Method and system for making touch controller adaptive to capacitive touch sensor |
CN107192745A (en) * | 2017-05-26 | 2017-09-22 | 苏州芯沃科电子科技有限公司 | A kind of test using capacitance sensor system and detection method for detecting lotus seeds |
CN213181351U (en) * | 2020-10-19 | 2021-05-11 | 苏州芯沃科电子科技有限公司 | Device for detecting material impurities based on capacitance principle |
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