CN112199809B - Method and device for predicting service life of thin film capacitor and computer equipment - Google Patents
Method and device for predicting service life of thin film capacitor and computer equipment Download PDFInfo
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Abstract
The invention discloses a life prediction method and device of a thin film capacitor and computer equipment. The method comprises the following steps: counting the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals; obtaining core temperatures of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals; obtaining the actual operation time length of the film capacitor corresponding to the preset multiple core temperature intervals according to the actual operation time length of the film capacitor corresponding to the preset multiple power intervals and multiple environment temperature intervals and the core temperature corresponding to the preset multiple power intervals and multiple environment temperature intervals; and predicting the service life of the film capacitor according to the actual operation time length of the film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the film capacitor. By adopting the embodiment of the invention, the accuracy of predicting the service life of the thin film capacitor can be improved in the design stage of the wind power converter.
Description
Technical Field
The present invention relates to the field of wind power generation technologies, and in particular, to a method and an apparatus for predicting a lifetime of a thin film capacitor, and a computer device.
Background
The thin film capacitor is an electric energy storage device in the wind power converter. As shown in fig. 1, the thin film capacitor C is connected between the DC positive bus dc+ and the DC negative bus DC-, and is used for absorbing ripple current to maintain the voltage of the DC bus stable. The operational life of the thin film capacitor is primarily dependent on the dc bus voltage and core temperature. High dc bus voltages or core temperatures can lead to reduced operating life of the thin film capacitors. Typically, manufacturers of thin film capacitors will give nominal operating life of the thin film capacitors at each load voltage and each core temperature.
At present, as the core temperature of the film capacitor is changed greatly in the running process of the wind power converter, the limit value of the core temperature of the film capacitor cannot be accurately given in the design stage, and a better method for predicting the service life of the film capacitor is not available, the film capacitor can be selected and designed only by means of empirical values, so that cost waste can be brought, in addition, in order to avoid the change of the output characteristics of the wind power converter caused by the reduction of the capacitance, for example, the increase of harmonic waves, the reduction of the power control precision and the like, the capacitance of the film capacitor needs to be detected regularly in the running stage of the converter, and once the capacitance is greatly reduced, the film capacitor is replaced in time.
Disclosure of Invention
The embodiment of the invention provides a life prediction method, a life prediction device and computer equipment for a thin film capacitor, which can improve the accuracy of predicting the life of the thin film capacitor in the design stage of a wind power converter, thereby providing theoretical guidance for the type selection and design of the thin film capacitor.
In a first aspect, an embodiment of the present invention provides a method for predicting a lifetime of a thin film capacitor, where the method includes:
According to the operation data of the wind power converter in a preset time period, the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals is counted;
obtaining core temperatures of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals according to the corresponding relation between the core temperature rise and the power of the preset film capacitor;
obtaining the actual operation time length of the film capacitor corresponding to the preset multiple core temperature intervals according to the actual operation time length of the film capacitor corresponding to the preset multiple power intervals and multiple environment temperature intervals and the core temperature corresponding to the preset multiple power intervals and multiple environment temperature intervals;
and predicting the service life of the film capacitor according to the actual operation time length of the film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the film capacitor.
In a possible implementation manner of the first aspect, the step of obtaining, according to a preset correspondence between core temperature rise and power of the thin film capacitor, core temperatures of the thin film capacitor corresponding to a preset plurality of power intervals and a plurality of ambient temperature intervals includes: obtaining core temperature rises of the film capacitor corresponding to a plurality of preset power intervals according to the corresponding relation between the core temperature rises of the preset film capacitor and the power; and regarding any one of the environmental temperature intervals under the same power interval, taking the sum of the core temperature rise corresponding to the power interval and the upper limit value of the environmental temperature interval as the core temperature of the film capacitor corresponding to the power interval and the environmental temperature interval.
In a possible implementation manner of the first aspect, the step of obtaining the actual operation duration of the film capacitor corresponding to the preset plurality of core temperature intervals according to the actual operation duration of the film capacitor corresponding to the preset plurality of power intervals and the preset plurality of ambient temperature intervals and the core temperature corresponding to the preset plurality of power intervals and the preset plurality of ambient temperature intervals includes: for any core temperature interval, obtaining a core temperature sequence included in the core temperature interval; according to core temperatures of the film capacitor, which correspond to a plurality of preset power intervals and a plurality of environment temperature intervals, respectively obtaining power intervals and environment temperature intervals corresponding to the core temperatures in the core temperature sequence; according to the actual operation time lengths of the film capacitor corresponding to the preset power intervals and the preset environment temperature intervals, the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all core temperatures in the core temperature sequence are obtained; and taking the sum of the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all the core temperatures in the core temperature sequence as the actual operation time length of the film capacitor corresponding to the core temperature interval.
In a possible implementation manner of the first aspect, the step of predicting the lifetime of the thin film capacitor according to the actual operation duration and the rated operation duration of the thin film capacitor corresponding to the preset multiple core temperature intervals includes: for any core temperature interval, calculating the ratio of the actual operation time length of the film capacitor corresponding to the core temperature interval to the rated operation time length, and multiplying the ratio by the corresponding accumulated damage correction coefficient to obtain a service life parameter corresponding to the core temperature interval; calculating the sum of life parameters corresponding to a plurality of preset core temperature intervals; the inverse of the sum is predicted as the lifetime of the thin film capacitor.
In a possible implementation manner of the first aspect, the method further includes, before the step of obtaining the core temperatures of the thin film capacitor corresponding to the preset multiple power intervals and the multiple ambient temperature intervals according to the preset correspondence between the core temperature rise and the power of the thin film capacitor: determining a first direct current bus voltage and a first ambient temperature; adjusting the output power of the wind power converter according to the first direct current bus voltage and the first ambient temperature, recording the core temperature rise of the film capacitor under corresponding power, and determining the corresponding relation between the core temperature rise of the preset film capacitor and the power; the core temperature rise is the difference between the core temperature of the thin film capacitor and the first ambient temperature.
In a possible implementation manner of the first aspect, after the step of predicting a lifetime of the thin film capacitor according to an actual operation duration and a rated operation duration of the thin film capacitor corresponding to the preset plurality of core temperature intervals, the method further includes: if the service life of the thin film capacitor is smaller than the design service life of the wind power converter, correcting the structure of the wind power converter according to the direction of reducing the core temperature of the thin film capacitor; and aiming at the corrected wind power converter, redetermining the corresponding relation between the core temperature rise and the power of the preset film capacitor, and predicting the service life of the film capacitor according to the redetermined corresponding relation between the core temperature rise and the power of the preset film capacitor until the service life of the film capacitor is more than or equal to the design service life.
In a possible implementation manner of the first aspect, the step of correcting the structure of the wind power converter according to the direction of reducing the core temperature of the thin film capacitor includes: increasing the number of thin film capacitors; and/or optimizing a heat dissipation structure related to the film capacitor in the wind power converter; and/or, separating the thin film capacitor from other heat sources in the wind power converter.
In a possible implementation manner of the first aspect, after the step of predicting a lifetime of the thin film capacitor according to an actual operation duration and a rated operation duration of the thin film capacitor corresponding to the preset plurality of core temperature intervals, the method further includes: determining a second direct current bus voltage, the second direct current bus voltage being greater than the first direct current bus voltage; the corresponding relation between the core temperature rise and the power of the preset film capacitor is redetermined according to the voltage of the second direct current bus and the first ambient temperature; predicting the service life of the thin film capacitor according to the redetermined corresponding relation between the core temperature rise and the power of the preset thin film capacitor; if the service life of the thin film capacitor corresponding to the second direct current bus voltage is longer than the design service life of the wind power converter, determining that the wind power converter can operate at the second direct current bus voltage in the design service life period; if the service life of the thin film capacitor corresponding to the voltage of the second direct current bus is not longer than the design service life, calculating the proportion of the operable time of the wind power converter at the voltage of the second direct current bus to the design service life, wherein the proportion is used for controlling the wind power converter to operate.
In a possible implementation manner of the first aspect, the calculation formula of the ratio is:
wherein D is the proportion of the operational time of the wind power converter in the second DC bus voltage to the design life, A is the predicted life of the film capacitor corresponding to the first DC bus voltage, B is the predicted life of the film capacitor corresponding to the second DC bus voltage, and C is the design life of the wind power converter.
In a second aspect, an embodiment of the present invention provides a lifetime prediction device for a thin film capacitor, including:
The statistical processing module is used for counting the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals according to the operation data of the wind power converter in a preset time period;
the core temperature calculation module is used for obtaining core temperatures of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals according to the corresponding relation between the core temperature rise and the power of the preset film capacitor;
The operation time length calculation module is used for obtaining the actual operation time length of the film capacitor corresponding to the preset multiple core temperature intervals according to the actual operation time length of the film capacitor corresponding to the preset multiple power intervals and the multiple environment temperature intervals and the core temperature corresponding to the preset multiple power intervals and the multiple environment temperature intervals;
The life prediction module is used for predicting the life of the film capacitor according to the actual operation time length of the film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the film capacitor.
In a possible embodiment of the second aspect, the device is arranged in a wind power converter.
In a third aspect, an embodiment of the present invention provides a computer device having a program stored thereon, which when executed by a processor implements the lifetime prediction method of a thin film capacitor as described above.
As described above, in the design stage of the wind power converter, the embodiment of the invention can count the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals from the operation data of the wind power converter in a preset time period; then, according to the corresponding relation between the core temperature rise and the power of the preset film capacitor, core temperatures of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals are obtained; then, according to the actual operation time lengths of the film capacitor corresponding to the preset power intervals and the preset environment temperature intervals and the core temperatures corresponding to the preset power intervals and the preset environment temperature intervals, obtaining the actual operation time lengths of the film capacitor corresponding to the preset core temperature intervals; finally, according to the actual operation time length of the film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the film capacitor, the service life of the film capacitor is predicted based on the fatigue accumulation damage theory, the accuracy of predicting the service life of the film capacitor is improved, and therefore theoretical guidance is provided for film capacitor selection and design.
Drawings
The invention will be better understood from the following description of specific embodiments thereof taken in conjunction with the accompanying drawings, in which like or similar reference characters designate like or similar features.
Fig. 1 is a schematic diagram of a position of a thin film capacitor in a topological structure of a converter of a wind generating set according to an embodiment of the present invention.
Fig. 2 is a flowchart illustrating a method for predicting lifetime of a thin film capacitor according to an embodiment of the invention.
Fig. 3 is a flowchart illustrating a method for predicting lifetime of a thin film capacitor according to another embodiment of the invention.
Fig. 4 is a schematic structural diagram of a lifetime prediction device for thin film capacitors according to an embodiment of the present invention.
Detailed Description
Features and exemplary embodiments of various aspects of the invention are described in detail below. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the invention.
The embodiment of the invention provides a life prediction method and device of a thin film capacitor and computer equipment. By adopting the technical scheme provided by the embodiment of the invention, the service life of the thin film capacitor can be accurately predicted in the design stage of the wind power converter, so that theoretical guidance is provided for the selection and design of the thin film capacitor.
Fig. 2 is a flowchart illustrating a method for predicting lifetime of a thin film capacitor according to an embodiment of the invention. As shown in fig. 2, the lifetime prediction method includes steps 201 to 204.
In step 201, according to the operation data of the wind power converter in the predetermined time period, the actual operation time periods of the film capacitor corresponding to the preset power intervals and the preset environmental temperature intervals are counted.
In some embodiments, the statistical object may be one year of operational data of the wind power converter. The operation data comprise the operation power of the wind power converter, the ambient temperature of the wind power converter cabinet body and the like.
In the specific implementation, the running power of the wind power converter, the ambient temperature of the cabinet body and other data can be searched and summarized according to a certain rule to obtain the running time corresponding to different power intervals and different ambient temperature intervals of the cabinet body, which is also called actual running time.
In some embodiments, the actual operating time of the thin film capacitor corresponding to the preset plurality of power intervals and the plurality of ambient temperature intervals may be embodied as a table (see table 1) or other form.
TABLE 1
Wherein Pn represents the rated power of the wind power converter, 1.1Pn represents 1.1 times of the rated power, and the unit of the ambient temperature is DEG C.
In table 1, t01 represents the actual operating time of the film capacitance corresponding to the power interval [ Pn,1.1Pn ] and the ambient temperature interval (48, 50 ]. t02 represents the actual operating time of the film capacitance for the power interval [0.9Pn, pn ] and the ambient temperature interval (46, 48 ]. t11 represents the actual operating time of the film capacitance for the power interval [0.9Pn, pn ] and the ambient temperature interval (48, 50 ]. By analogy, t66 represents the actual operating time of the film capacitance for the power interval [0.4Pn,0.5Pn ] and the ambient temperature interval (38, 40 ].
In table 1, the gradient of the power interval is 0.1Pn, the gradient of the ambient temperature interval is 2 ℃, and the power interval and the ambient temperature interval to be counted can be determined by a person skilled in the art according to actual needs, which is not limited herein.
In step 202, according to the preset correspondence between the core temperature rise and the power of the thin film capacitor, the core temperatures of the thin film capacitor corresponding to the preset power intervals and the environment temperature intervals are obtained.
In some embodiments, core temperature rise test experiments of different power points can be carried out in the design stage of the wind power converter, and the corresponding relation between the core temperature rise and the power of the preset film capacitor is determined.
In specific implementation, the first direct current bus voltage and the first ambient temperature (i.e. the highest ambient temperature of the wind power converter cabinet body, such as 50 ℃) can be fixed, then the output power of the wind power converter is adjusted according to the first direct current bus voltage and the first ambient temperature, and the core temperature rise of the film capacitor under the corresponding power is recorded. The core temperature rise is the difference between the highest core temperature and the cabinet environment temperature. The core of the film capacitor is positioned at the innermost side of the film capacitor, and a temperature thermocouple is usually placed at the innermost side of the core to test the temperature of the core.
Table 2 is a table of correspondence between core temperature rise and power of a thin film capacitor provided in an example of the present invention, and is used to represent core temperature rise data of the thin film capacitor when the wind power converter operates at different power points.
TABLE 2
Table 2 exemplarily gives core temperature rise data for 9 power points (0.3 Pn to 1.1 Pn) for the film capacitor. Wherein the core temperature rise corresponding to the power point 1.1Pn is 35 ℃, the core temperature rise corresponding to the power point Pn is 33 ℃, and the core temperature rise corresponding to the power point … power point 0.3Pn is 12 ℃.
As can be seen from table 2, as the power of the wind power converter increases, the current Wen Bo to be borne by the thin film capacitor is higher, so that the core temperature rise of the thin film capacitor is also gradually increased.
In some embodiments, the core temperature rise of the thin film capacitor corresponding to the preset multiple power intervals may be obtained according to the preset corresponding relationship between the core temperature rise and the power of the thin film capacitor (see table 2).
For example, the core temperature corresponding to the power point 1.1Pn may be raised by 35 ℃ to be used as the core temperature corresponding to the power interval [ Pn,1.1 Pn), the core temperature corresponding to the power point Pn may be raised by 33 ℃ to be used as the core temperature corresponding to the power interval [0.9Pn, pn), …, and so on, and the core temperature corresponding to the power point 0.5Pn may be raised by 17 ℃ to be used as the core temperature corresponding to the power interval [0.4Pn,0.5 Pn).
Or the core temperature rises of all the power points in the power intervals [ Pn,1.1 Pn) may be averaged to obtain the core temperature rise corresponding to the power intervals [ Pn,1.1 Pn), the core temperature rises of all the power points in the power intervals [0.9Pn, pn) may be averaged to obtain the core temperature rises corresponding to the power intervals [0.9Pn, pn), and so on …, and the core temperature rises of all the power points in the power intervals [0.4Pn,0.5 Pn) may be averaged to obtain the core temperature rises corresponding to the power intervals [0.4Pn,0.5 Pn), which is not limited herein.
Then, for any one of the environmental temperature intervals in the same power interval, the sum of the core temperature rise corresponding to the power interval and the upper limit value of the environmental temperature interval is used as the core temperature of the film capacitor corresponding to the power interval and the environmental temperature interval.
For example, referring to table 3, for an ambient temperature interval (48 ℃,50 ℃) of the power interval [ Pn,1.1Pn ], a sum of 35 ℃ and 50 ℃ of the core temperature rise corresponding to the power interval [ Pn,1.1 Pn) may be 85 ℃ as a core temperature of the film capacitance corresponding to the power interval [ Pn,1.1 Pn) and the ambient temperature interval (48 ℃,50 ℃; for the ambient temperature interval (46 ℃,48 ℃) of the power interval [ Pn,1.1Pn ], the sum of the core temperature rise 35 ℃ and 48 ℃ corresponding to the power interval [ Pn,1.1Pn can be 83 ℃, which is the core temperature of the film capacitance corresponding to the power interval [ Pn,1.1 Pn) and the ambient temperature interval (46 ℃,48 ℃); … and so on, for the ambient temperature interval (38 ℃,40 ℃) of the power interval [0.4pn,0.5pn ], the core corresponding to the power interval [0.4pn,0.5pn ] can be warmed up by a sum of 17 ℃ and 40 ℃ to 57 ℃.
TABLE 3 Table 3
In step 203, according to the actual operation durations of the thin film capacitor corresponding to the preset power intervals and the preset ambient temperature intervals, and the core temperatures corresponding to the preset power intervals and the preset ambient temperature intervals, the actual operation durations of the thin film capacitor corresponding to the preset core temperature intervals are obtained.
The calculation process of step 203 is described in detail below.
In some embodiments, for any core temperature interval, a sequence of core temperatures included in the core temperature interval may be obtained; according to core temperatures of the film capacitor, which correspond to a plurality of preset power intervals and a plurality of environment temperature intervals, respectively obtaining power intervals and environment temperature intervals corresponding to the core temperatures in the core temperature sequence; according to the actual operation time lengths of the film capacitor corresponding to the preset power intervals and the preset environment temperature intervals, the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all core temperatures in the core temperature sequence are obtained; and taking the sum of the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all the core temperatures in the core temperature sequence as the actual operation time length of the film capacitor corresponding to the core temperature interval.
Referring to table 1, by counting operation data of the wind power converter in a predetermined period of time, actual operation time periods of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals can be obtained.
Referring to table 3, core temperatures corresponding to a plurality of preset power intervals and a plurality of ambient temperature intervals can be obtained through the preset correspondence relationship between the core temperature rise and the power of the thin film capacitor (table 2).
Then, by combining tables 1 to 3, table 4 can be obtained.
TABLE 4 Table 4
Taking the core temperature interval (80 ℃,85 ℃) as an example,
The core temperature sequence is expressed as 81 ℃,82 ℃,83 ℃,84 ℃,85 ℃, as can be seen from table 3:
The power intervals and the ambient temperature intervals corresponding to 81 ℃ are [ Pn,1.1 Pn) and (44 ℃,46 ℃) and [0.9Pn, pn) and (46 ℃,48 ℃) and then, as can be seen from the table 1, the actual operation time periods corresponding to [ Pn,1.1 Pn) and (44 ℃,46 ℃) are t03 and the actual operation time periods corresponding to [0.9Pn, pn) and (46 ℃,48 ℃) are t12;
The power interval corresponding to 82 ℃ and the ambient temperature interval are empty;
The power intervals and the ambient temperature intervals corresponding to 83 ℃ are [ Pn,1.1 Pn) and (46 ℃,48 ℃) and [0.9Pn, pn) and (48 ℃,50 ℃) and then, as can be seen from the table 1, the actual operation time periods corresponding to [ Pn,1.1 Pn) and (46 ℃,48 ℃) are t02 and the actual operation time periods corresponding to [0.9Pn, pn) and (48 ℃,50 ℃) are t11;
The power interval corresponding to 84 ℃ and the ambient temperature interval are empty;
The power interval corresponding to 85 ℃ and the ambient temperature interval are [ Pn,1.1Pn ] and (48 ℃,50 ℃), then the actual operation duration corresponding to [ Pn,1.1Pn ] and (48 ℃,50 ℃) is t01 as known from table 1;
Thus, the actual operating time period t0_1year of the film capacitor corresponding to the core temperature interval (80 ℃,85 ℃) t01+t02+t03+t11+t12, and so on, within one year, the core temperature interval (75 ℃, the actual operating time period t1_1year of 80 ℃) t04+t05+t13+t14+t21+t22+t23+t31 of the film capacitor, the core temperature interval (70 ℃, the actual operating duration t2_1 year=t06+t15+t16+t24+t25+t32+t33+t41+t42 of 75 ℃ ], the core temperature interval (65 ℃, the actual operating duration t3_1 year=t26+t34+t35+t36+t43+t44+t51+t52+t53+t61 of 70 ℃ ], the core temperature interval (60 ℃, the actual operating duration t4_1 year=t46+t54+t55+t62+t63+t64 of 65 ℃ ], the actual operating duration t5_1 year=t56+t65+t66 of 60 ℃ ] and the core temperature interval (55 ℃).
In step 204, the lifetime of the thin film capacitor is predicted according to the actual operation duration of the thin film capacitor corresponding to the preset core temperature intervals and the rated operation duration of the thin film capacitor.
The rated operation time refers to the rated allowable operation life of the thin film capacitor. Typically, manufacturers of thin film capacitors provide nominal operating durations (i.e., operating lives) of the thin film capacitors at different dc bus voltages and different core temperatures. After the service life is generally reached, the capacitance of the thin film capacitor is reduced by about 15%. Although the thin film capacitor can still be used after the operation life is reached, the reduction of the capacitance value can lead to the change of the output characteristic of the wind power converter, such as the increase of harmonic waves, the reduction of the power control precision and the like.
Table 5 shows the nominal operating time of the film capacitor at various core temperatures with a DC bus voltage of 1050V.
TABLE 5
The rated operation time length of the film capacitor at the core temperature of 85 ℃ is denoted as t0_total, the rated operation time length of the film capacitor at 80 ℃ is denoted as t1_total, the rated operation time length of the film capacitor at 75 ℃ is denoted as t2_total, the rated operation time length of the film capacitor at 70 ℃ is denoted as t3_total, the rated operation time length of the film capacitor at 65 ℃ is denoted as t4_total, and the rated operation time length of the film capacitor at 60 ℃ is denoted as t5_total.
According to the theory of fatigue cumulative damage: when damage is accumulated to a certain value, fatigue damage occurs, so that for any core temperature interval, the ratio of the actual operation time length of the film capacitor corresponding to the core temperature interval to the rated operation time length can be calculated, and the ratio is multiplied by the corresponding accumulated damage correction coefficient to obtain a service life parameter corresponding to the core temperature interval; and then, calculating the sum value of life parameters corresponding to a plurality of preset core temperature intervals, and predicting the reciprocal of the sum value as the life of the thin film capacitor.
Specifically, the predictive formula for the film capacitor life t_total at the dc bus voltage 1050V can be expressed as:
Wherein, the unit of T_total is year, Correction coefficient for cumulative damage at different core temperatures,/>The value of (2) is more than 0 and less than or equal to 1.
As described above, in the design stage of the wind power converter, the embodiment of the invention can count the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals from the operation data of the wind power converter in a preset time period; then, according to the corresponding relation between the core temperature rise and the power of the preset film capacitor, core temperatures of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals are obtained; then, according to the actual operation time lengths of the film capacitor corresponding to the preset power intervals and the preset environment temperature intervals and the core temperatures corresponding to the preset power intervals and the preset environment temperature intervals, obtaining the actual operation time lengths of the film capacitor corresponding to the preset core temperature intervals; finally, according to the actual operation time length of the film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the film capacitor, the service life of the film capacitor is predicted based on the fatigue accumulation damage theory, so that theoretical guidance is provided for the selection and design of the film capacitor.
For example, if the predicted lifetime of the thin film capacitor is longer than the design lifetime of the wind power converter, the selection of the thin film capacitor can be determined in the early design stage, and the current architecture of the wind power converter meets the lifetime requirement.
If the predicted life of the thin film capacitor is not longer than the design life of the wind power converter, the selection of the thin film capacitor is indicated, or the current structure of the wind power converter can not meet the life requirement, and at the moment, the structure of the wind power converter needs to be corrected according to the direction of reducing the core temperature of the thin film capacitor so as to improve the life of the thin film capacitor. For example,
In some embodiments, the number of thin film capacitors may be increased, reducing the core temperature of the thin film capacitors by reducing the ripple current that is split onto each thin film capacitor.
In some embodiments, a heat dissipation structure associated with the thin film capacitor in the wind power converter may be optimized, such as; the heat dissipation effect of the thin film capacitor is improved by optimizing a water cooling or air cooling heat dissipation channel of the thin film capacitor so as to reduce the core temperature of the thin film capacitor.
In some embodiments, the thin film capacitor and other heat sources in the wind power converter can be designed separately so as to reduce the influence of the other heat sources on the core temperature of the thin film capacitor.
Further, for the corrected wind power converter, the corresponding relation between the core temperature rise and the power of the preset thin film capacitor (see table 2) can be redetermined, and the service life of the thin film capacitor is predicted according to the redetermined corresponding relation between the core temperature rise and the power of the preset thin film capacitor until the service life of the thin film capacitor is more than or equal to the design service life.
Compared with the prior art that the core temperature of the film capacitor cannot exceed 75 ℃ or 80 ℃ under the highest ambient temperature and rated current operation conditions, the embodiment of the invention can determine whether the film capacitor and the wind power converter can meet the design life requirement under the highest ambient temperature and rated current operation conditions in the early design period, so that the problem of overhigh cost caused by the need of periodic detection and maintenance due to the great reduction of the capacitance of the film capacitor in the wind power converter operation stage is avoided, and the safe and stable operation of the wind power converter is maintained; on the other hand, the fatigue life of the core temperature of the thin film capacitor can be evaluated, the problem that the design cost is too high due to the fact that the type selection precision of the thin film capacitor is too high is avoided, for example, if the thin film capacitor A with moderate cost and the thin film capacitor B with too high cost can both meet the design life requirement, the thin film capacitor B has better performance than the thin film capacitor A, but the thin film capacitor A is selected.
Under reactive power demand working conditions, the dc bus voltage of the wind power converter needs to be increased to a second dc bus voltage (for example) 1120V, the dc voltage is increased, and the operation life of the thin film capacitor is reduced, so that a problem arises that if the thin film capacitor meeting the design life demand under the first dc bus voltage (1050V) is applied to the high dc bus voltage, the reactive power corresponding time ratio should be controlled to be at most? Therefore, the film capacitor can meet the service life requirement under the working condition compatible with reactive power requirement by controlling the reactive power corresponding time, and the film capacitor with higher precision does not need to be replaced.
Fig. 3 is a flowchart illustrating a method for predicting lifetime of a thin film capacitor according to another embodiment of the invention. Fig. 3 differs from fig. 2 in that, after step 204 in fig. 2, steps 205 to 209 in fig. 3 are further included for calculating the reactive corresponding time ratio.
In step 205, a second dc bus voltage (e.g., 1120V) is determined, the second dc bus voltage being greater than the first dc bus voltage (e.g., 1050V).
In step 206, the corresponding relationship between the core temperature rise and the power of the preset thin film capacitor is redetermined according to the second dc bus voltage and the first ambient temperature.
See in particular the description of table 2 section.
In step 207, the lifetime of the thin film capacitor is predicted according to the redetermined correspondence between the core temperature rise and the power of the preset thin film capacitor, i.e. steps 201 to 204 are repeatedly performed.
In step 208, if the lifetime of the film capacitor corresponding to the second dc bus voltage is greater than the design lifetime of the wind power converter, it is determined that the wind power converter may operate at the second dc bus voltage during the design lifetime.
In step 209, if the lifetime of the thin film capacitor corresponding to the second dc bus voltage is not longer than the design lifetime, the ratio of the operable time of the wind power converter at the second dc bus voltage to the design lifetime is calculated, and the wind power converter is controlled to operate according to the ratio.
Specifically, a calculation formula of the proportion D of the operable duration of the wind power converter at the second direct current bus voltage to the design life is as follows:
Wherein A is the predicted life of the film capacitor corresponding to the first DC bus voltage, B is the predicted life of the film capacitor corresponding to the second DC bus voltage, and C is the design life of the wind power converter.
In the specific implementation, if the dc bus voltage is 1050V, the predicted lifetime of the thin film capacitor is a. When the DC bus voltage is 1120V, the predicted lifetime of the thin film capacitor is B. If B is higher than the converter design life C, the dc bus can always operate at 1120V during the entire operation. If B is lower than the design life C of the converter, the 1120V operation time ratio D can be calculated according to the linear damage theory (formula (2)).
In the embodiment, the reactive corresponding time of the running of the wind power converter is controlled through the proportion D, so that the film capacitor can meet the service life requirement under the working condition of compatible reactive requirements, and the film capacitor with higher precision is not required to be replaced, thereby reducing the design cost on the premise of ensuring the safe and stable running of the converter.
Fig. 4 is a schematic structural diagram of a lifetime prediction device for thin film capacitors according to an embodiment of the present invention, and the explanation in fig. 2 can be applied to this embodiment. As shown in fig. 4, the lifetime prediction device includes: a statistical processing module 401 (which has a function corresponding to step 201), a core temperature calculation module 402 (which has a function corresponding to step 202), a run-length calculation module 403 (which has a function corresponding to step 203), and a lifetime prediction module 404 (which has a function corresponding to step 204).
The statistical processing module 401 is configured to, according to operation data of the wind power converter in a predetermined period of time, calculate actual operation durations of the film capacitor corresponding to a plurality of preset power intervals and a plurality of ambient temperature intervals.
The core temperature calculating module 402 is configured to obtain core temperatures of the thin film capacitor corresponding to a plurality of preset power intervals and a plurality of ambient temperature intervals according to a corresponding relationship between core temperature rise and power of the thin film capacitor.
The operation duration calculation module 403 is configured to obtain an actual operation duration of the film capacitor corresponding to the preset plurality of core temperature intervals according to an actual operation duration of the film capacitor corresponding to the preset plurality of power intervals and the preset plurality of ambient temperature intervals, and core temperatures corresponding to the preset plurality of power intervals and the preset plurality of ambient temperature intervals.
The life prediction module 404 is configured to predict a life of the thin film capacitor according to an actual operation duration of the thin film capacitor corresponding to the preset core temperature intervals and a rated operation duration of the thin film capacitor.
As described above, in the design stage of the wind power converter, the statistical processing module 401 is utilized to calculate the actual operation duration of the film capacitor corresponding to the preset multiple power intervals and multiple environmental temperature intervals from the operation data of the wind power converter in the preset time period; then, according to the corresponding relation between the core temperature rise and the power of the preset film capacitor, the core temperature calculation module 402 is utilized to obtain the core temperatures of the film capacitor corresponding to the preset power intervals and the environment temperature intervals; the operation duration calculation module 403 obtains the actual operation duration of the film capacitor corresponding to the preset multiple core temperature intervals according to the actual operation duration of the film capacitor corresponding to the preset multiple power intervals and multiple environment temperature intervals and the core temperatures corresponding to the preset multiple power intervals and multiple environment temperature intervals; finally, the life prediction module 404 predicts the life of the thin film capacitor based on the fatigue accumulation damage theory according to the actual operation time length of the thin film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the thin film capacitor, so as to provide theoretical guidance for the selection and design of the thin film capacitor.
It should be noted that, the lifetime prediction device of the thin film capacitor in the embodiment of the present invention may be provided in the converter controller of the wind turbine generator system, so that any hardware is not required to be changed, and the lifetime prediction device may also be a logic device with an independent operation function, which is not limited herein.
The embodiment of the invention also provides computer equipment, wherein a program is stored on the computer equipment, and the life prediction method of the thin film capacitor is realized when the program is executed by a processor.
It should be clear that, all embodiments in this specification are described in a progressive manner, and the same or similar parts between all embodiments are mutually referred to, and each embodiment focuses on everything with other embodiments. For device embodiments, reference may be made to the description of method embodiments for relevant points. The embodiments of the invention are not limited to the specific steps and structures described above and shown in the drawings. Those skilled in the art will appreciate that various alterations, modifications, and additions may be made, or the order of steps may be altered, after appreciating the spirit of the embodiments of the present invention. Also, a detailed description of known method techniques is omitted here for the sake of brevity.
The functional blocks shown in the above-described structural block diagrams may be implemented in hardware, software, firmware, or a combination thereof. When implemented in hardware, it may be, for example, an electronic circuit, an Application Specific Integrated Circuit (ASIC), suitable firmware, a plug-in, a function card, or the like. When implemented in software, the elements of an embodiment of the invention are the programs or code segments used to perform the required tasks. The program or code segments may be stored in a machine readable medium or transmitted over transmission media or communication links by a data signal carried in a carrier wave. A "machine-readable medium" may include any medium that can store or transfer information. Examples of machine-readable media include electronic circuitry, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, radio Frequency (RF) links, and the like. The code segments may be downloaded via computer networks such as the internet, intranets, etc.
Embodiments of the invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. For example, the algorithms described in particular embodiments may be modified without departing from the basic spirit of embodiments of the invention. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of embodiments of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.
Claims (12)
1. A method for predicting the lifetime of a thin film capacitor, comprising:
According to the operation data of the wind power converter in a preset time period, the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals is counted;
Obtaining core temperatures of the thin film capacitor corresponding to the preset multiple power intervals and multiple environment temperature intervals according to the preset corresponding relation between the core temperature rise and the power of the thin film capacitor;
Obtaining the actual operation time length of the thin film capacitor corresponding to a plurality of preset core temperature intervals according to the actual operation time length of the thin film capacitor corresponding to the plurality of preset power intervals and the plurality of environment temperature intervals and the core temperature corresponding to the plurality of preset power intervals and the plurality of environment temperature intervals;
And predicting the service life of the thin film capacitor according to the actual operation time length of the thin film capacitor corresponding to the preset core temperature intervals and the rated operation time length of the thin film capacitor.
2. The method according to claim 1, wherein the step of obtaining the core temperatures of the thin film capacitor corresponding to the preset power intervals and the environmental temperature intervals according to the preset correspondence between the core temperature rise and the power of the thin film capacitor comprises:
obtaining the core temperature rises of the thin film capacitor corresponding to the preset multiple power intervals according to the preset corresponding relation between the core temperature rises of the thin film capacitor and the power;
And regarding any one of the environmental temperature intervals under the same power interval, taking the sum of the core temperature rise corresponding to the power interval and the upper limit value of the environmental temperature interval as the core temperature of the film capacitor corresponding to the power interval and the environmental temperature interval.
3. The method according to claim 1, wherein the step of obtaining the actual operation duration of the thin film capacitor corresponding to the preset plurality of core temperature intervals according to the actual operation duration of the thin film capacitor corresponding to the preset plurality of power intervals and the plurality of ambient temperature intervals and the core temperatures corresponding to the preset plurality of power intervals and the plurality of ambient temperature intervals includes:
for any core temperature interval, obtaining a core temperature sequence included in the core temperature interval;
according to the core temperatures of the film capacitor, which correspond to the preset power intervals and the preset environment temperature intervals, respectively obtaining the power intervals and the environment temperature intervals corresponding to the core temperatures in the core temperature sequence;
Obtaining the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all the core temperatures in the core temperature sequence according to the actual operation time lengths of the film capacitors corresponding to the preset power intervals and the preset environment temperature intervals;
And taking the sum of the actual operation time lengths of the power intervals and the environment temperature intervals corresponding to all the core temperatures in the core temperature sequence as the actual operation time length of the film capacitor corresponding to the core temperature interval.
4. The method of claim 1, wherein predicting the lifetime of the thin film capacitor based on the actual operating time and the rated operating time of the thin film capacitor corresponding to the preset plurality of core temperature intervals comprises:
for any core temperature interval, calculating the ratio of the actual operation time length of the film capacitor corresponding to the core temperature interval to the rated operation time length, and multiplying the ratio by the corresponding accumulated damage correction coefficient to obtain a service life parameter corresponding to the core temperature interval;
Calculating the sum of life parameters corresponding to the preset core temperature intervals;
The inverse of the sum is predicted as the lifetime of the thin film capacitor.
5. The method according to any one of claims 1 to 4, further comprising, before the step of obtaining core temperatures of the thin film capacitor corresponding to the preset plurality of power intervals and the plurality of ambient temperature intervals according to the preset correspondence between core temperature rise and power of the thin film capacitor:
Determining a first direct current bus voltage and a first ambient temperature;
adjusting the output power of the wind power converter according to the first direct current bus voltage and the first ambient temperature, recording the core temperature rise of the thin film capacitor under corresponding power, and determining the corresponding relation between the preset core temperature rise of the thin film capacitor and the power;
the core temperature rise is the difference between the core temperature of the thin film capacitor and the first ambient temperature.
6. The method of claim 5, wherein after the step of predicting a lifetime of the film capacitor based on the actual operating time and the rated operating time of the film capacitor corresponding to the preset plurality of core temperature intervals, the method further comprises:
If the service life of the thin film capacitor is smaller than the design service life of the wind power converter, correcting the structure of the wind power converter according to the direction of reducing the core temperature of the thin film capacitor;
And aiming at the corrected wind power converter, redetermining the corresponding relation between the core temperature rise and the power of the preset thin film capacitor, and predicting the service life of the thin film capacitor according to the redetermined corresponding relation between the core temperature rise and the power of the preset thin film capacitor until the service life of the thin film capacitor is more than or equal to the design service life.
7. The method of claim 6, wherein the step of modifying the structure of the wind power converter according to a direction of lowering the core temperature of the thin film capacitor comprises:
Increasing the number of the thin film capacitors; and/or the number of the groups of groups,
Optimizing a heat dissipation structure related to the thin film capacitor in the wind power converter; and/or the number of the groups of groups,
And separating and designing the film capacitor from other heat sources in the wind power converter.
8. The method of claim 5, wherein after the step of predicting a lifetime of the film capacitor based on the actual operating time and the rated operating time of the film capacitor corresponding to the preset plurality of core temperature intervals, the method further comprises:
determining a second direct current bus voltage, the second direct current bus voltage being greater than the first direct current bus voltage;
The corresponding relation between the core temperature rise and the power of the preset thin film capacitor is redetermined according to the second direct current bus voltage and the first ambient temperature;
predicting the service life of the thin film capacitor according to the redetermined corresponding relation between the core temperature rise and the power of the preset thin film capacitor;
if the service life of the thin film capacitor corresponding to the second direct current bus voltage is longer than the design service life of the wind power converter, determining that the wind power converter can operate at the second direct current bus voltage in the design service life period;
if the service life of the thin film capacitor corresponding to the second direct current bus voltage is not longer than the design service life, calculating the proportion of the operable time of the wind power converter at the second direct current bus voltage to the design service life, wherein the proportion is used for controlling the wind power converter to operate.
9. The method of claim 8, wherein the ratio is calculated as:
and D is the proportion of the operable time length of the wind power converter at the second direct current bus voltage to the design life, A is the predicted life of the thin film capacitor corresponding to the first direct current bus voltage, B is the predicted life of the thin film capacitor corresponding to the second direct current bus voltage, and C is the design life of the wind power converter.
10. A lifetime prediction device for a thin film capacitor, comprising:
The statistics processing module is used for counting the actual operation time of the film capacitor corresponding to a plurality of preset power intervals and a plurality of environment temperature intervals according to the operation data of the wind power converter in a preset time period;
The core temperature calculation module is used for obtaining core temperatures of the thin film capacitor corresponding to the preset multiple power intervals and multiple environment temperature intervals according to the preset corresponding relation between the core temperature rise and the power of the thin film capacitor;
The operation time length calculation module is used for obtaining the actual operation time length of the film capacitor corresponding to the preset multiple core temperature intervals according to the actual operation time length of the film capacitor corresponding to the preset multiple power intervals and the multiple environment temperature intervals and the core temperature corresponding to the preset multiple power intervals and the multiple environment temperature intervals;
And the service life prediction module is used for predicting the service life of the thin film capacitor according to the actual operation time of the thin film capacitor corresponding to the preset multiple core temperature intervals and the rated operation time of the thin film capacitor.
11. The device according to claim 10, characterized in that the device is arranged in the wind power converter.
12. A computer device having a program stored thereon, wherein the program when executed by a processor implements the thin film capacitor life prediction method of any one of claims 1-9.
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| CN109581125A (en) * | 2018-12-25 | 2019-04-05 | 北京金风科创风电设备有限公司 | Method and device for detecting service life of power module of wind power converter and storage medium |
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| CN109581125A (en) * | 2018-12-25 | 2019-04-05 | 北京金风科创风电设备有限公司 | Method and device for detecting service life of power module of wind power converter and storage medium |
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