CN112162214A - Periodic test device and method for leakage detection circuit - Google Patents
Periodic test device and method for leakage detection circuit Download PDFInfo
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Abstract
The invention discloses a periodic test device and a periodic test method for an electric leakage detection circuit, which comprise a current sensing circuit, a life self-test main control chip, an electric leakage protection chip, a rectifying circuit, an electric leakage signal analog circuit, a test circuit and an alarm circuit; the invention can realize automatic on-line periodic automatic test of key devices of the single-phase/three-phase leakage detection circuit system, such as leakage protection chips, tripping control elements, trippers, induction coils and the like, and the connection of electric circuits among electronic elements on the premise of not influencing the normal on-line leakage detection and protection functions of the leakage detection circuit system, so as to determine whether a detection circuit or element fails and whether the circuit connection relationship is normal, and automatically drive an alarm or the tripper to cut off a power supply after detecting the abnormality.
Description
Technical Field
The invention relates to the technical field of electric leakage detection, in particular to a periodic test device and a periodic test method for an electric leakage detection circuit.
Background
50/60HZ frequency alternating current is widely adopted in power consumption of industry, agriculture, traffic, national defense, enterprises, hospitals, schools, residents and the like, and in order to ensure the safety of human life and property, leakage detection circuit devices are required to be installed in alternating current power supply systems at all levels and resident household power consumption, so that leakage or electric shock accidents can be effectively detected, a power supply is cut off in time, and safety accidents are avoided. However, most of the currently used leakage detection circuit devices are not provided with a circuit or have an automatic service life detection function, and when the leakage detection circuit devices cannot be normally used due to aging or device failure and other factors, great potential safety hazards always exist due to the fact that the leakage detection circuit devices cannot be found in time. Although a manual test button is arranged in the special leakage detection circuit device or the leakage protection equipment and can be used for testing whether the leakage protection circuit is normal or not by pressing the button, in the actual use process, few people regularly use the test circuit before and after the alternating current electric equipment is started to be used every time, meanwhile, the power supply can be triggered and cut off by using the test button method, the normal use is influenced, and the circuit is easily burnt out due to too long operation time of the test button. In addition, there are a few enterprises and organizations that develop, design and apply for related leakage self-diagnosis products and technical patents, but all of them are single-phase leakage self-diagnosis modes, and self-diagnosis tests are required to be performed from the positive half period of the alternating current to the negative half period of the alternating current, and thus they cannot be applied to three-phase leakage detection modes.
For example, a "leakage detection protection circuit capable of self-checking at regular time" disclosed in chinese patent literature has a publication number: CN103219702B, filing date thereof: 03.21.2013, comprising a main loop, a leakage detection circuit, a timing self-detection circuit and a leakage protection circuit, the leakage detection circuit comprises a control chip and a leakage current induction coil, the leakage protection circuit comprises a main loop switch and a control part of the main loop switch, the main loop is electrically connected between the power input end and the power output end, the main loop also comprises a low-resistance fault induction coil, the live wire and the zero wire of the main loop penetrate through the leakage current induction coil and the low-resistance fault induction coil, the signal input end of the control chip is electrically connected with the leakage current induction coil and the low-resistance fault induction coil, the signal output end of the control chip is electrically connected with the signal input end of the control part of the main loop switch, when the leakage current induction coil induces leakage current or the low-resistance fault induction coil induces a low-resistance fault, the control chip sends a control signal to a control part of the main loop switch; the timing self-checking circuit comprises a controller and an analog loop switch. The leakage detection protection circuit of this application need the manual work press the simulation and return the switch and just can realize leakage detection circuit self-checking, burns out the circuit easily.
Disclosure of Invention
The invention mainly solves the problems that the test button of the leakage detection circuit in the prior art is too long in operation time and easy to burn out the circuit and self-diagnosis test needs to be executed from the positive half period of alternating current to the negative half period of alternating current; the periodic test device and method for the leakage detection circuit adopt a brand new self-diagnosis mode, so that the periodic test device and method can be applied to a single-phase/three-phase leakage detection mode.
The technical problem of the invention is mainly solved by the following technical scheme: a periodic test device of an electric leakage detection circuit comprises a current sensing circuit, a life self-testing main control chip, an electric leakage protection chip, a rectifying circuit, an electric leakage signal simulation circuit, a test circuit and an alarm circuit, wherein the input end of the current sensing circuit is connected with alternating current, the output end of the current sensing circuit is connected with the electric leakage protection chip, the input end of the rectifying circuit is connected with the alternating current, the output end of the rectifying circuit is connected with the power end of the life self-testing main control chip through a resistor R8, the output end of the rectifying circuit is also connected with the power end of the electric leakage protection chip through a resistor R7, the control output end of the life self-testing main control chip is respectively connected with the detection end of the electric leakage protection chip and the control end of the electric leakage signal simulation circuit, the alarm output end of the life self-testing main control chip is connected with the alarm circuit, and the input end of the electric leakage, the output end of the leakage signal simulation circuit is grounded, and the test circuit is respectively connected with the life self-test main control chip and the leakage protection chip. The system function of the electric leakage detection loop is detected through the service life self-testing main control chip, and the system function can be applied to a single-phase/three-phase electric leakage detection mode.
Preferably, the test circuit includes a first trip control element, a second trip control element and a release, a control end of the second trip control element is connected to an output OS of the leakage protection chip, a first end of the second trip control element is grounded, a second end of the second trip control element is connected to a first end of the first trip control element and an SCR port of the life self-testing main control chip, a second end of the first trip control element is connected to the release, a control end of the first trip control element is connected to a test end TCON of the life self-testing main control chip, and a control end of the first trip control element is further connected to a power supply end of the leakage protection chip through a resistor R1. The first tripping control element and the second tripping control element are both MOS tubes, and the self-checking function is realized by controlling the conduction of the MOS tubes.
Preferably, the leakage signal simulation circuit comprises a resistor R2, a resistor R3, a triode Q3 and a capacitor C2, wherein one end of the resistor R3 is connected with a zero line of alternating current, the other end of the resistor R3 is connected with a collector of a triode Q1, an emitter of the triode Q3 is grounded, a base of the triode Q3 is connected with an emitter of the triode Q3 through a capacitor C2, and a base of the triode Q3 is further connected with a simulation leakage control output end FT of the lifetime self-testing main control chip through the resistor R2. And generating a leakage analog signal by a leakage signal analog circuit.
Preferably, the service life self-test main control chip is a single-chip controller with functions of timing, filtering, comparing, logic control, voltage clamping, alarming and driving output. The service life self-test main control chip can perform periodic self-test according to setting, and the purpose that automatic online periodic test is used for detecting whether key elements and loops of the single-phase/three-phase alternating-current power supply leakage detection circuit system work normally is achieved.
Preferably, the self-checking device further comprises a timer, a first trigger, a second trigger and a self-checking passing lamp, wherein a second end of the second tripping control element is connected with a first plug-in port, a control end of the second tripping control element is connected with a second plug-in port, the first plug-in port is connected with a first input end of the first trigger, the second plug-in port is connected with a second input end of the first trigger, an output end of the first trigger is connected with an input end of the second trigger, an output end of the second trigger is connected with the self-checking passing lamp, a power supply end of the timer is connected with a power supply end of the self-checking main control chip, an enabling end of the timer is connected with a control output end of the self-checking main control chip, and an output end of the timer is connected with an enabling end of the second trigger. The self-testing device is characterized in that a detachable self-testing circuit composed of a timer, a first trigger, a second trigger and a self-testing passing lamp is arranged, the self-testing circuit is used for detecting the circuit working state of the self-testing main control chip, the working state of the self-testing main control chip does not directly affect the circuit, real-time online detection is not needed, the detection period is long, the detection of the self-testing main control chip can be detected by adopting a detachable circuit device, the detachable self-testing circuit is inserted when the system is powered on, the working state of the self-testing main control chip can be detected in the first detection period, and therefore, the self-testing main control chips can be manually detected respectively.
A periodic test method for a leakage detection circuit comprises the following steps:
step S1, the system is powered on initially, and step S2 is executed after the preset time is up;
step S2, determining connectivity of the first tripping control element and the second tripping control element by comparing the input voltage of the detection end of the life self-testing main control chip with a set threshold;
step S3, the life self-testing main control chip controls the leakage signal simulation circuit to generate a simulation leakage signal and provide the simulation leakage signal to the leakage protection chip, and the leakage protection chip enters a self-testing mode;
step S4, simulating the generation of a leakage control signal, and simultaneously sending a control signal to a service life self-testing main control chip through a TCON control end to turn off a first tripping control element;
step S5, the leakage protection chip receives the simulation leakage signal and drives the second tripping control element to be conducted, the SCR voltage of the detection end of the life self-test main control chip is reduced, the leakage detection circuit system is judged to be normal, and the life self-test main control chip removes the simulation leakage signal and restores to a normal mode to wait for the next time; if the life self-testing main control chip cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, the life self-testing main control chip immediately repeats detection of the analog leakage signal for many times, and if the life self-testing main control chip still cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, the life self-testing main control chip drives to output an alarm signal or drives to cut off a power supply.
Preferably, in step S1, after the system is powered on, the internal power supply voltage of the self-test life master chip rises, in step S2, the detection end of the self-test life master chip is connected to the first trip control element and the second trip control element to be tested, and the connection between the first trip control element and the second trip control element is determined if the input voltage value is within the set threshold range by comparing the input voltage of the detection end of the self-test life master chip with the internal set reference voltage threshold.
Preferably, in step S3, when the self-test is started, the life self-test main control chip sends a self-test mode start signal to the leakage protection chip, the life self-test main control chip controls the leakage signal simulation circuit to generate a simulation leakage signal and provide the simulation leakage signal to the leakage protection chip, the leakage protection chip enters the self-test mode, meanwhile, the second trip control element provides a positive voltage from the life self-test main control chip, if the leakage detection circuit works normally, the leakage protection chip receives the simulation leakage signal and drives the second trip control element to conduct, if the voltage of the detection end of the life self-test main control chip decreases, the leakage detection circuit system is determined to be normal, and the life self-test main control chip removes the simulation leakage signal and restores to the normal mode to wait for the next time; if the life self-testing main control chip cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, continuously sending a plurality of analog leakage signals within a set time period to carry out periodic detection, and if the analog leakage signal cannot be detected or the second tripping control element cannot be driven to be conducted, driving the life self-testing main control chip to output an alarm signal or driving a power supply to be cut off.
The invention has the beneficial effects that: compared with the existing electric leakage detection circuit technology, the scheme can realize automatic on-line periodic automatic test on key devices of the single-phase/three-phase electric leakage detection circuit system, such as an electric leakage protection chip, a tripping control element, a tripper, an induction coil and the like, and the connection of electric loops among electronic elements on the premise of not influencing the normal on-line electric leakage detection and protection functions of the electric leakage detection circuit system so as to determine whether a detection circuit or element fails and whether the circuit connection relationship is normal, and automatically drive an alarm or the tripper to cut off a power supply after the abnormality is detected.
Drawings
Fig. 1 is a schematic circuit diagram of a periodic test apparatus for a leakage detecting circuit according to a first embodiment.
Detailed Description
The technical scheme of the invention is further specifically described by the following embodiments and the accompanying drawings.
The first embodiment is as follows: a periodic test device of a leakage detection circuit is disclosed, as shown in figure 1, which is used for detecting elements in a single-phase/three-phase leakage detection circuit, such as a current induction coil, a leakage protection chip U1, a tripping control element, such as an MOS tube Q1, an MOS tube Q2, a tripper D1 and a loop, and comprises a life self-testing main control chip U2, a rectifier bridge D4-D11, a leakage signal simulation circuit and an alarm circuit, wherein a power supply end of the life self-testing main control chip U2 is electrically connected with alternating current through the rectifier bridge D4-D11 and a resistor R7, a control output end of the life self-testing main control chip U2 is connected with a detection end of the leakage protection chip U84, a control output end of the life self-testing main control chip U6345 is also connected with a control end of the leakage signal simulation circuit, an input end of the leakage signal simulation circuit is connected with a zero line of the alternating current, an output end of the leakage signal simulation circuit is grounded, a test enable control input end of the life self-testing main control, the detection end of the connectivity of a tripping loop of the service life self-testing main control chip U2 is connected with the source end of the Q1 and the drain end of the Q2, and the alarm output end of the service life self-testing main control chip U2 is connected with an alarm circuit. The grid of the tripping control element is connected with the output end OS of the leakage protection chip U1, the drain of the MOS tube Q2 is connected with the source of the MOS tube Q1 and the SCR port of the life self-testing main control chip U2, the drain of the MOS tube Q1 is connected with a release D1, the grid of the MOS tube Q1 is connected with a VCC power supply end through a resistor R1, the grid of the MOS tube Q1 is also connected with a testing control port TCON of the life self-testing main control chip U2, the leakage signal simulation circuit comprises a resistor R2, a resistor R3, a triode Q3 and a capacitor C2, a zero line is connected with the collector of the triode Q1 through a resistor R3, the emitter of the triode Q3 is grounded, the base of the triode Q3 is connected with the emitter of the triode Q3 through the capacitor C2, and the base of the triode Q3 is connected with the simulation leakage control output end of the life self-testing main control chip; the alarm output end EOL of the service life self-testing main control chip U2 is connected with an alarm circuit; the service life self-testing main control chip U2 is a single chip controller with functions of timing, filtering, comparing, logic control, voltage clamping, alarming and driving output.
This embodiment can effectively detect leakage detection circuitry key device and return circuit include: the current induction coil L1, the earth leakage protection chip U1, the MOS tube Q1, the MOS tube Q2, the release D1 and the related loop; the connection relationship of the circuit elements in the leakage detection circuit is common, and the description is omitted in this embodiment; in this embodiment, the life self-test main control chip U2 detects the drain terminal voltage of the MOS transistor Q2 of the leakage detection circuit system through the pin 1 port, and when the voltage value is lower than a set reference threshold voltage, it is determined as an undervoltage state, and drives to output an alarm signal; the service life self-testing main control chip U2 detects a series loop of the MOS tube Q2 and the tripper D1 through a pin 1 port, and triggers a driving alarm if a tripping control element or the tripper fails, is open/short-circuited and the like is abnormal; the service life self-testing main control chip U2 controls the turn-off of the MOS tube Q1 in the self-testing period through a pin 4 port, so that the tripper cannot be triggered in the self-testing period; after the self-detection period starts, a service life self-detection main control chip U2 pin 2 generates a simulation leakage signal, and a U2 pin 4 end outputs a low level signal to turn off an MOS transistor Q1 to cut off a tripping loop; meanwhile, the drain electrode of the MOS tube Q2 is provided with positive voltage by the pin 1 end of the U2 of the life self-testing main control chip, if the work is normal, the leakage protection chip U1 receives the analog leakage signal, amplifies and compares the analog leakage signal, and then drives the MOS tube Q2 to be conducted, the pin 1 end voltage of the U2 of the life self-testing main control chip is reduced, the life self-testing main control chip judges that the leakage detection circuit system is normal when detecting the voltage change condition, and removes the analog leakage signal; on the contrary, if the life self-test main control chip U2 pin 6 generates the analog leakage signal, the leakage protection chip cannot work normally and detects the leakage signal and outputs the analog leakage signal to drive the MOS transistor Q2 to conduct, the analog leakage signal is generated and detected in the detection period for 4 consecutive times, if the leakage detection circuit system still cannot work normally and drives the MOS transistor Q2 to conduct, it is determined that the leakage detection circuit system is abnormal, and the life self-test main control chip U2 pin 5 outputs the alarm square wave signal or drives other execution mechanisms through 5 pins; the online periodic life self-testing method of the electric leakage detection circuit system can periodically generate a simulation electric leakage signal to detect the functions of the electric leakage detection circuit system; pin 1 of the life self-testing main control chip U2 is a detection end, pin 6 of the life self-testing main control chip U2 is an analog leakage control output end, pin 5 of the life self-testing main control chip U2 is an alarm output end, and pin 4 of the life self-testing main control chip U2 is a tripping loop on-off control end.
A method for periodically testing a leakage detection circuit comprises the following steps,
step S1, the system is powered on initially, and step S2 is executed after the preset time is reached, after the system is powered on, the power supply voltage in the self-test life master control chip U2 rises, and after the system is powered on, the first self-test period starts at 1.25 seconds, and then is once every 2 hours. The period in this embodiment is set manually, and there is no limitation to only one detection period.
Step S2, determining connectivity of a tripping control element and a tripping loop by comparing the input voltage of the detection end of the service life self-testing main control chip U2 with a set threshold; the detection end of the life self-testing main control chip U2 is connected with the drain electrode of the MOS tube Q2 to be tested and the source electrode of the MOS tube Q1, and through the comparison of the input voltage of the detection end of the life self-testing main control chip U2 and the internal set reference voltage threshold value, if the input voltage value is within the set threshold value range, the connection of the tripping control element is judged.
Step S3, the life self-testing master control chip U2 leakage signal simulation circuit generates a simulation leakage signal and provides the simulation leakage signal to the leakage protection chip U1, and the leakage protection chip U1 enters a self-testing mode; when the self-test starts the cycle, the life self-test main control chip U2 sends a self-test mode start signal to the leakage protection chip U1. The life self-testing main control chip U2 leakage signal analog circuit generates analog leakage signal and provides it to the leakage protection chip U1, the leakage protection chip U1 enters into self-test mode, at the same time, the tripper control element drain provides positive voltage from the life self-testing main control chip U2, if the leakage detection circuit works normally, the leakage protection chip U1 receives analog leakage signal, will drive the MOS tube Q2 to conduct, the life self-testing main control chip U2 pin detection terminal voltage drop will determine the leakage detection circuit system is normal, the life self-testing main control chip U2 removes analog leakage signal and recovers to the normal mode to wait for the next time; if the self-testing service life main control chip U2 cannot detect the analog leakage signal or cannot drive the MOS transistor Q2 to be conducted, a plurality of analog leakage signals are continuously generated within a set time period to carry out periodic detection, and if the analog leakage signal cannot be detected or the MOS transistor Q2 cannot be driven to be conducted, the self-testing service life main control chip U2 drives to output an alarm signal or drive to cut off a power supply.
And step four, when the analog leakage control signal is generated, the U2 sends a control signal through the TCON control end to turn off the MOS tube Q1 of the tripping loop, so that the tripper is ensured not to be triggered in the test mode period.
Step five, the leakage protection chip U1 receives the analog leakage signal to drive the tripping control element to be conducted, the life self-testing main control chip U2 judges that the leakage detection circuit system is normal when the voltage of the detection terminal is reduced, and the life self-testing main control chip U2 removes the analog leakage signal and restores to a normal mode to wait for the next time; if the life self-testing main control chip U2 cannot detect the analog leakage signal or cannot drive the MOS transistor Q2 to be conducted, the detection of the analog leakage signal is immediately repeated for many times, and if the analog leakage signal cannot be detected or the MOS transistor Q2 cannot be driven to be conducted, the life self-testing main control chip U2 drives to output an alarm signal or drives to cut off the power supply.
The fourth step and the fifth step are more specific: after normal power-on, the life self-TEST main control chip U2 controls the pin 6 to turn on the triode Q3 through FT and the series resistor R2 to generate an analog leakage signal at the end of NEU and provide the analog leakage signal for the leakage protection chip U1 pin 1 to enter a TEST mode enable signal TESE _ EN, the leakage protection chip U1 enters a self-TEST mode, the U2 outputs a signal through a TEST control output end TCON to control the MOSFET Q1, and the MOS tube Q1 is turned off to ensure that a release cannot be released in the TEST mode. Meanwhile, the drain terminal of the MOS tube Q2 is provided with positive voltage by the pin 1 of the self-test service life main control chip U2, if the leakage detection circuit works normally, the leakage protection chip U1 receives a simulated leakage signal to conduct the MOS tube Q2, the voltage of the pin 1 of the self-test service life main control chip U2 is reduced and is detected by an internal circuit of the U2, the leakage detection circuit system is judged to be normal, and the self-test service life main control chip U2 automatically removes the simulated leakage signal output by the pin 6 and restores to a normal mode to wait for the next self-test period; on the contrary, if the analog leakage signal cannot be detected or the MOS transistor Q2 cannot be driven to be turned on, the detection is performed in 4 consecutive analog leakage signal detection periods, and if the analog leakage signal cannot be detected or the MOS transistor Q2 cannot be driven to be turned on, it is proved that the leakage protection detection circuit or the thyristor drive circuit cannot normally operate due to device failure or circuit open/short circuit, and the pin 5 of the self-test life master control chip U2 drives to output an alarm signal or drive to cut off the power supply. The period of the output alarm pulse signal is 320ms, and the duty ratio is 50%. The online life self-test system of the leakage detection circuit system can automatically detect key elements and loops periodically (the first time of power-on is 1.25 seconds, the self-test is started, and the periodic self-test is selectable after 2 hours/1 day/1 week).
Compared with the existing electric leakage detection circuit technology, the method can automatically and periodically test key devices of the single-phase/three-phase electric leakage detection circuit system, such as an electric leakage protection special chip, a tripping control element, a tripper, an induction coil and the like, and the connection of electric loops among all electronic elements on line on the premise of not influencing the normal on-line electric leakage detection and protection functions of the electric leakage detection circuit system, so as to determine whether a detection circuit or element fails and whether the circuit connection relationship is normal, and automatically drive an alarm or the tripper to cut off a power supply after the abnormality is detected, so that the whole process does not need manual intervention, and the use safety of the electric leakage detection circuit device is effectively guaranteed.
Second embodiment, a periodic testing apparatus for leakage detection circuit, which is different from the first embodiment in that the present embodiment further includes a timer and a first flip-flop, the second trigger and a self-test pass lamp, the drain terminal of the MOS transistor Q2 is electrically connected with a first socket, the gate of the MOS transistor Q2 is also electrically connected with a second socket, the first socket is connected with the first input terminal of the first trigger, the second socket is connected with the second input terminal of the first trigger, the power supply terminal of the timer is connected with the power supply terminal of the self-life-test main control chip U2, the enable terminal of the timer is connected with the control output terminal of the self-life-test main control chip U2, the output terminal of the timer is connected with the enable terminal of the second trigger, the output terminal of the first trigger is connected with the input terminal of the second trigger, the output terminal of the second trigger is connected with the self-test pass lamp, and the rest structures are the same as those in the first embodiment. The detachable self-checking circuit is composed of a timer, a first trigger, a second trigger and a self-checking passing lamp, and is used for detecting the circuit working state of the service life self-checking main control chip U2, because the working state of the service life self-checking main control chip U2 does not directly affect the circuit, real-time online detection is not needed, the detection period is long, so that the detection of the service life self-checking main control chip U2 can be detected by adopting detachable circuit devices, only when the system is powered on, the detachable self-checking circuit is inserted, the working state of the service life self-checking main control chip U2 can be detected in the first detection period, and therefore, the plurality of service life self-checking main control chips U2 can be manually detected respectively.
The above-described embodiments are only preferred embodiments of the present invention, and are not intended to limit the present invention in any way, and other variations and modifications may be made without departing from the spirit of the invention as set forth in the claims.
Claims (8)
1. A periodic test device for leakage detection circuit is characterized by comprising
The device comprises a current sensing circuit, a life self-test main control chip, a leakage protection chip, a rectifying circuit, a leakage signal simulation circuit, a test circuit and an alarm circuit, wherein the input end of the current sensing circuit is connected with alternating current, the output end of the current sensing circuit is connected with the leakage protection chip, the input end of the rectifying circuit is connected with the alternating current, the output end of the rectifying circuit is connected with the power end of the life self-test main control chip through a resistor R8, the output end of the rectifying circuit is also connected with the power end of the leakage protection chip through a resistor R7, the control output end of the life self-test main control chip is respectively connected with the detection end of the leakage protection chip and the control end of the leakage signal simulation circuit, the alarm output end of the life self-test main control chip is connected with the alarm circuit, and the input end of the leakage signal simulation circuit, the output end of the leakage signal simulation circuit is grounded, and the test circuit is respectively connected with the life self-test main control chip and the leakage protection chip.
2. The periodic test device of an electrical leakage detection circuit according to claim 1,
the testing circuit comprises a first tripping control element, a second tripping control element and a tripper, wherein the control end of the second tripping control element is connected with the output end OS of the leakage protection chip, the first end of the second tripping control element is grounded, the second end of the second tripping control element is respectively connected with the first end of the first tripping control element and the SCR port of the life self-testing main control chip, the second end of the first tripping control element is connected with the tripper, the control end of the first tripping control element is connected with the testing end TCON of the life self-testing main control chip, and the control end of the first tripping control element is further connected with the power supply end of the leakage protection chip through a resistor R1.
3. The leakage detection circuit periodic test device according to claim 1 or 2,
leakage signal analog circuit includes resistance R2, resistance R3, triode Q3 and electric capacity C2, resistance R3's one end is connected with the zero line of alternating current, resistance R3's the other end is connected with triode Q1's collecting electrode, triode Q3's emitter ground, triode Q3's base is passed through electric capacity C2 and is connected with triode Q3's projecting pole, triode Q3's base is still connected with life-span self-test main control chip's simulation leakage control output FT through resistance R2.
4. The leakage detection circuit periodic test device according to claim 1 or 2,
the service life self-testing main control chip is a single-chip controller with functions of timing, filtering, comparing, logic control, voltage clamping, alarming and driving output.
5. The leakage detection circuit periodic test device of claim 2,
the self-checking device comprises a timer, a first trigger, a second trigger and a self-checking passing lamp, wherein a second end of the second tripping control element is connected with a first inserting port, a control end of the second tripping control element is connected with a second inserting port, the first inserting port is connected with a first input end of the first trigger, the second inserting port is connected with a second input end of the first trigger, an output end of the first trigger is connected with an input end of the second trigger, an output end of the second trigger is connected with the self-checking passing lamp, a power supply end of the timer is connected with a power supply end of a service life self-checking main control chip, an enabling end of the timer is connected with a control output end of the service life self-checking main control chip, and an output end of the timer is connected with an enabling end of the second trigger.
6. A method for periodically testing an electric leakage detection circuit, using an electric leakage detection circuit periodic test apparatus according to any one of claims 1 to 5, comprising the steps of:
step S1, the system is powered on initially, and step S2 is executed after the preset time is up;
step S2, determining connectivity of the first tripping control element and the second tripping control element by comparing the input voltage of the detection end of the life self-testing main control chip with a set threshold;
step S3, the life self-testing main control chip controls the leakage signal simulation circuit to generate a simulation leakage signal and provide the simulation leakage signal to the leakage protection chip, and the leakage protection chip enters a self-testing mode;
step S4, simulating the generation of a leakage control signal, and simultaneously sending a control signal to a service life self-testing main control chip through a TCON control end to turn off a first tripping control element;
step S5, the leakage protection chip receives the simulation leakage signal and drives the second tripping control element to be conducted, the SCR voltage of the detection end of the life self-test main control chip is reduced, the leakage detection circuit system is judged to be normal, and the life self-test main control chip removes the simulation leakage signal and restores to a normal mode to wait for the next time; if the life self-testing main control chip cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, the life self-testing main control chip immediately repeats detection of the analog leakage signal for many times, and if the life self-testing main control chip still cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, the life self-testing main control chip drives to output an alarm signal or drives to cut off a power supply.
7. The method according to claim 6, wherein the step of periodically testing the leakage detection circuit,
in step S1, after the system is powered on, the internal power supply voltage of the self-test life master chip rises, in step S2, the detection end of the self-test life master chip is connected to the first trip control element and the second trip control element to be tested, and the connection between the first trip control element and the second trip control element is determined if the input voltage value is within the set threshold range by comparing the input voltage of the detection end of the self-test life master chip with the internal set reference voltage threshold.
8. The method according to claim 6, wherein the step of periodically testing the leakage detection circuit,
in step S3, when the self-test is started, the life self-test main control chip sends a self-test mode start signal to the leakage protection chip, the life self-test main control chip controls the leakage signal analog circuit to generate an analog leakage signal and provide the analog leakage signal to the leakage protection chip, the leakage protection chip enters the self-test mode, meanwhile, the second trip control element provides a positive voltage from the life self-test main control chip, if the leakage detection circuit works normally, the leakage protection chip receives the analog leakage signal and drives the second trip control element to conduct, and if the voltage of the detection end of the life self-test main control chip decreases, it is determined that the leakage detection circuit system is normal, and the life self-test main control chip removes the analog leakage signal and restores to the normal mode to wait for the next time; if the life self-testing main control chip cannot detect the analog leakage signal or cannot drive the second tripping control element to be conducted, continuously sending a plurality of analog leakage signals within a set time period to carry out periodic detection, and if the analog leakage signal cannot be detected or the second tripping control element cannot be driven to be conducted, driving the life self-testing main control chip to output an alarm signal or driving a power supply to be cut off.
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