CN112153365A - Digital test image display system, test method and application - Google Patents
Digital test image display system, test method and application Download PDFInfo
- Publication number
- CN112153365A CN112153365A CN201910560394.9A CN201910560394A CN112153365A CN 112153365 A CN112153365 A CN 112153365A CN 201910560394 A CN201910560394 A CN 201910560394A CN 112153365 A CN112153365 A CN 112153365A
- Authority
- CN
- China
- Prior art keywords
- test
- image
- scene
- digital
- digitized
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Abstract
The invention discloses a digital test image display system, which comprises a dynamic scene conversion system, a dynamic scene conversion system and a digital image processing system, wherein the dynamic scene conversion system is used for constructing a digital test image into optical signals of the same image; and the virtual image projection system is used for carrying out amplification projection on the optical signal to obtain a real test scene. The display system can meet various performance indexes of the photoelectric imaging system and performance test requirements of different scenes through the rapid switching of different digital test images, and is flexible, convenient and fast. The test scene of the actual optical signal formed in the invention can directly enter various photoelectric imaging systems to be tested without being displayed by a receiving screen, so that the test system has compact structure and small volume, can complete various performance index tests of the photoelectric imaging systems and tests of actual use scenes under different conditions in a laboratory environment, obviously reduces the test cost and improves the test efficiency.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of photoelectric equipment, in particular to a digital test image display system, a test method and application.
[ background of the invention ]
Optoelectronic imaging systems (such as security cameras) need to perform performance index tests and tests of actual use scenarios under various conditions. At present, the performance index test is completed by using a standard test board, but the test method needs to replace various different standard test boards to test corresponding performance indexes, the test boards are various, and because the standard test boards are often limited in size, the system test needs to be satisfied after passing through a huge high-precision collimator, the construction cost is high, and the performance index test of a full field of view is often difficult to complete at one time; in addition, the test of the actual use scene of the photoelectric imaging system under various different conditions usually needs to be installed in the actual use environment, and the actual use performance of the system under different conditions (such as normal environmental conditions and various extreme environmental conditions) in the actual use scene can be obtained through long-time trial operation and data acquisition and analysis, so as to find out whether ghost images exist under specific illumination conditions or not. The test process is complex, the test environment is high in construction cost, time and labor are wasted, and the labor cost and the time cost of the system are greatly increased.
[ summary of the invention ]
In view of the above problems, it is an object of the present invention to provide a digital test image display system including: the dynamic scene conversion system is used for constructing the digital test image into an optical signal of the same image; and the virtual image projection system is used for carrying out amplification projection on the optical signal to obtain a real test scene. The invention constructs various digital test images, such as a standard test board test image for performance index test and a test image of an actual use scene, then the dynamic scene conversion system constructs the digital test images into optical signals of the same image, and the test images are projected to a target area through the projection system to become real test scene signals, thereby solving the problems that various different standard test boards are required to be frequently replaced in the performance index test of the existing photoelectric imaging system, and products are required to be installed in the actual use environment to obtain the actual use performance through long-time trial operation and data acquisition and analysis. The digital test image display system simulates an actual long-distance test scene by using a compact structure, so that the space size of the test system is small, and long-distance and ultra-long-distance tests can be completed in a laboratory; the test environment adopts a modular design, different performance indexes and actual use scene test requirements can be met through simple switching of different digital test images, the method has wide adaptability and application value, the test cost is obviously reduced, and the test efficiency is improved.
In some embodiments of the present invention, the dynamic scene conversion system comprises a storage unit for storing a digitized test image, a dynamic scene conversion driving system for injecting the digitized test image into the dynamic scene conversion unit, and a dynamic scene conversion unit for constructing the injected digitized test image into an optical signal of the same image.
In some embodiments of the present invention, the dynamic scene conversion unit includes a light source and a DMD chip (digital micromirror chip), the dynamic scene conversion driving system injects the digital test image stored in the storage unit into the DMD chip (digital micromirror chip) of the dynamic scene conversion unit after receiving the instruction, the DMD chip changes an array switch according to the injected digital test image to form a specific array pattern, and the light source illuminates the array pattern formed by the DMD chip to form an optical signal with the same image as the injected digital test image. In some embodiments of the present invention, to further enhance the quality of the optical signal, the dynamic scene conversion unit further includes a condenser lens, an optical filter, and an illumination lens, and the light source sequentially passes through the condenser lens, the optical filter, and the illumination lens to form an optical signal with an image identical to the injected digital test image on the DMD chip.
In some embodiments of the present invention, the virtual image projection system includes a scene projection lens, which is used to enlarge and project the light signal generated by the dynamic scene conversion system to a proper distance, so as to become a real test scene.
In some embodiments of the present invention, the digitized test image may be a digitized test image constructed by digital image simulation techniques.
In some embodiments of the present invention, the digitized test images include digitized test images for performance index testing and/or digitized test images for actual use scenario testing under different conditions.
In some embodiments of the present invention, the digitized test images for performance index testing include a standard resolution plate test image, a standard distortion plate test image, a ronchi ruling test plate test image, a standard star plate test image, a standard discrimination plate test image, a standard field match test plate test image, a standard color test plate test image.
In some embodiments of the invention, the digitized test images for actual use scene testing under different conditions comprise digitized test images under extreme lighting conditions.
In some embodiments of the invention, the display system further comprises a turntable for projecting the test scene to different areas of the system under test. Specifically, in the test of the photoelectric imaging system, for the test of the photoelectric imaging system with a large field of view and high resolution, when a constructed test scene cannot cover the whole optical field of view of the tested system, the performance index of the whole optical field of view and the test of an actual use scene cannot be completed through one test. At this time, a test scene of a local area meeting the imaging resolution of the photoelectric imaging system can be constructed according to the resolution requirement of the system to be tested, and then the test scene of the local area is imaged to different view field areas of the photoelectric imaging system through a rotary table (such as a two-dimensional rotary table and a three-dimensional rotary table), so that the performance index test and the actual use scene test of the different view field areas of the system to be tested are completed.
The invention also discloses an application of the digital test image display system in performance index test and/or actual use scene test of the photoelectric imaging system under different conditions. The testing method of the photoelectric imaging system based on the digital testing image display system can remarkably improve the testing efficiency of the photoelectric imaging system, and can complete various performance index tests of the photoelectric imaging system and tests of actual use scenes under almost all different conditions in a laboratory environment. And the performance index test and the actual use scene test of various photoelectric imaging systems can be met by rapidly switching test images or test scenes or test modules, so that a comprehensive test evaluation report of the photoelectric imaging system is provided. Compared with the prior art that a standard test board is adopted for performance index test and the photoelectric imaging system needs to be installed in an actual use environment for actual use scene test under various conditions, the test for the photoelectric imaging system greatly reduces the test cost and the test time.
The invention also discloses a test method of the photoelectric imaging system, which comprises the following steps: s1, constructing a standard digital test image (library) by adopting a digital image simulation technology; s2: constructing corresponding digital test images into optical signals of the same image by adopting a digital optical processing technology; s3: projecting the test scene constructed in the step S2 to a preset distance by adopting a virtual image display technology to form a real test scene signal of the photoelectric imaging system; s4: the photoelectric imaging system detects the test scene signal in the step S3 and performs imaging; s5: and the photoelectric imaging system performs image analysis on the imaging image in the step S4 and the corresponding digital test image stored in the photoelectric imaging system to obtain a test result of the photoelectric imaging system.
The invention relates to a digital test image display system, which comprises a dynamic scene conversion system, a dynamic scene conversion system and a dynamic scene conversion system, wherein the dynamic scene conversion system is used for constructing a digital test image into optical signals of the same image; and the virtual image projection system is used for carrying out amplification projection on the optical signal to obtain a real test scene. The display system can construct a digital standard test image library according to different test requirements, so that real test scene signals of various performance index tests and scene tests are obtained, designability is high, and diversified requirements are met. The performance testing requirements of various performance indexes and different scenes can be met through the rapid switching of different testing images, and the method is flexible and convenient. The formed test scene of the actual optical signal can directly enter various photoelectric imaging systems to be tested without being displayed by a receiving screen, so that the test system has a compact structure and a small volume. The photoelectric imaging system performance testing system can complete various performance index tests of the photoelectric imaging system and tests of actual use scenes under different conditions in a laboratory environment, remarkably reduces testing cost and improves testing efficiency.
[ description of the drawings ]
FIG. 1 is a schematic diagram of a digital test image display system according to the present invention;
FIG. 2 is a flow chart of a method for testing an optoelectronic imaging system according to the present invention;
FIG. 3 is a schematic diagram of an embodiment of an optical path structure;
FIG. 4 is a relative illumination curve of a security camera under test at a working distance of 160m according to an embodiment of the present invention;
FIG. 5 is a phase vignetting coefficient curve of a security camera to be measured at a working distance of 160m in an embodiment of the present invention;
FIG. 6 is a relative illumination curve of a security camera to be tested at a working distance of 15m in an embodiment of the present invention;
FIG. 7 is a phase vignetting coefficient curve of a security camera to be measured at a working distance of 15m in an embodiment of the present invention;
FIG. 8 is a schematic diagram of a fixed frequency grid distortion test target configuration;
FIG. 9 is a schematic diagram of a standard distortion test image of the present invention.
[ detailed description ] embodiments
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Referring to fig. 1, a digital test image display system according to the present invention includes a dynamic scene conversion system 100 for constructing a digital test image into an optical signal of the same image; and the virtual image projection system 200 is configured to perform amplification projection on the optical signal to obtain a real test scene.
In some embodiments of the present invention, dynamic scene conversion system 100 comprises a memory unit 110, a dynamic scene conversion driving system 120, and a dynamic scene conversion unit 130, memory unit 110 is used for storing digitized test images, dynamic scene conversion driving system 120 is used for injecting the digitized test images into dynamic scene conversion unit 130, and dynamic scene conversion unit 130 is used for constructing the injected digitized test images into optical signals of the same image.
In some embodiments of the present invention, the dynamic scene conversion unit 130 includes a light source (not shown) and a DMD chip (digital micromirror chip, not shown), and the dynamic scene conversion driving system 120 injects the digital test image stored in the storage unit 110 into the DMD chip (digital micromirror chip) of the dynamic scene conversion unit 130 after receiving the instruction, and the DMD chip changes the array switches according to the injected digital test image to form a specific array pattern. The light source illuminates the array pattern formed by the DMD chip to form an optical signal of the same image as the injected digitized test image.
In some embodiments of the present invention, to further enhance the light signal quality, the dynamic scene conversion unit 130 further includes a condenser lens, a filter, and an illumination lens. The light source sequentially passes through the condenser lens, the optical filter and the illuminating lens to form an optical signal with the same image as the injected digital test image on the DMD chip.
In some embodiments of the present invention, the virtual image projection system 200 includes a scene projection lens for magnifying and projecting the light signal generated by the dynamic scene conversion system to a suitable distance to become a real test scene. By reasonably designing parameters such as the caliber, the focal length, the magnification and the like of the scene projection lens, the test picture or the scene constructed by the dynamic scene conversion system is placed in the object focus of the scene projection lens, so that the test picture or the scene constructed by the dynamic scene conversion system forms an upright amplified virtual image on a screen after passing through the scene projection lens, and the virtual image is a real test scene signal required by the test.
In some embodiments of the present invention, in order to meet the test requirements of the photoelectric imaging at different working distances and different fields of view, the virtual image projection system should be designed as a zoom system, and the test requirements at different working distances and different fields of view can be met by focusing. For the condition that the working distance and the dynamic range of the view field are large, a plurality of different virtual image projection systems can be designed, each virtual image projection system covers the working distance and the view field in a certain range, and the focusing or the replacement of a projection lens through the virtual image projection system can meet the actual test requirement in the actual use.
In some embodiments of the present invention, the digitized test image may be a digitized test image constructed by digital image simulation techniques. For example, a standard library of digitized test images may be constructed using black and white or color digital image simulation techniques.
In some embodiments of the present invention, the digitized test images include digitized test images for performance index testing and/or digitized test images for actual use scenario testing under different conditions.
In some embodiments of the present invention, the performance index tests include field of view, resolution, distortion, focus error, astigmatism, aberration, depth of field, color balance, and the like.
In some embodiments of the present invention, the digitized test images for performance index testing include a standard resolution plate test image, a standard distortion plate test image, a standard ronchi ruling test plate test image, a standard star plate test image, a standard discrimination plate test image, a standard field match test plate test image, a standard color test plate test image.
In some embodiments of the present invention, the digitized test image may be constructed according to an existing standard test plate, which may or may not be the same as the image of the existing standard test plate.
In some embodiments of the present invention, the actual usage scenario test includes a performance test of the optoelectronic imaging system under normal environmental conditions and extreme environmental conditions, and finds whether ghost images exist under specific illumination conditions.
In some embodiments of the present invention, the digital test images for testing the actual use scene under different conditions include a view simulation test image under a normal environment, a view simulation test image under an extreme bright lighting condition, a view simulation test image under an extreme dark lighting condition, and a view simulation test image under a saturated lighting condition in a local area.
Referring to fig. 2, a testing method of a photoelectric imaging system according to the present invention includes the following steps: s1: constructing a standard digital test image by adopting a digital image simulation technology; s2: constructing corresponding digital test images into optical signals of the same image by adopting a digital optical processing technology; s3: enlarging and projecting the image constructed in the step S2 to a preset distance to form a real test scene signal of the photoelectric imaging system; s4: the photoelectric imaging system images the test scene signal detected in the step S3; s5: and the photoelectric imaging system to be tested performs image analysis to obtain a test result.
The present invention will be further described below by taking a distortion test of a security camera as an example.
In this specific embodiment, a suitable projection lens is first selected according to the DMD chip parameters and the security camera parameters to be detected, and the specific process is as follows:
the parameters of the detected security camera are as follows:
measured security camera parameters
Parameters of a DMD chip selected in the dynamic scene conversion system are as follows:
DMD chip parameters
| Array size | Micromirror cell size | Highest resolution achievable |
| 1024×768 | 14μm×14μm | 35.71lp/mm |
(1) Calculating the amplification ratio beta of the whole test system according to the DMD chip size and the size of the sensor of the tested security camera
In the above equation, a2 is the dimension of the security camera sensor to be tested in a certain direction, a1 is the dimension of the DMD chip in the same direction, and the magnifications β calculated by using the dimensions in different directions may be different (when the aspect ratios of the security camera sensor to be tested and the DMD chip are not the same), in order to ensure that the constructed test scene can cover the whole optical field of view of the camera to be tested, the maximum magnification β is taken as the final design value.
In this example, β ≈ 1.21. Also, in order to ensure that the constructed test scene can cover the whole optical field of view of the tested camera, a certain design margin is considered, and finally the magnification β is 1.25.
(2) Calculating the focal length f1 of scene projection lens according to the magnification beta
In the above formula, f2 is the focal length of the security camera to be measured, i.e. 100 mm. The focal length of the scene projection lens is 80mm by the above formula.
(3) Determining light-passing aperture of scene projection lens according to lens interval
The light-transmitting aperture of the scene projection lens needs to be matched with the lens of the security camera to be measured in pupil to a certain degree, so that the relative illumination at the sensor (image surface) of the security camera to be measured finally tends to be consistent, and the influence on image quality and system test due to different vignetting coefficients among fields caused by mismatching of system design is avoided. Preferably, the exit pupil of the scene projection lens is overlapped with the entrance pupil of the measured security camera lens, and the diameter of the exit pupil of the scene projection lens is not smaller than that of the entrance pupil of the measured security camera lens. In actual use, complete matching of the pupils is difficult to achieve, and at the moment, the lens spacing and the light transmission aperture need to be reasonably determined, so that the vignetting coefficients of different final fields of view are basically consistent.
In this embodiment, an ideal lens is used to replace the scene projection lens and the lens of the security camera to be tested, and the schematic diagram of the optical path structure of the whole scheme is shown in fig. 3.
In this embodiment, the distance D between the scene projection lens and the security camera lens to be measured is 10mm, and the clear aperture D1 of the scene projection lens is 50 mm.
When testing the performance of the tested security camera at different working distances, the corresponding object distance l1Sum image distance l2As shown in the table below.
| Working distance/m of measured security camera | Object distance l1/mm | Image distance l2/mm |
| 15 | 79.573 | 100.674 |
| 160 | 79.960 | 100.063 |
By adopting the test scheme, on the basis of meeting the field coverage of the test environment, the pupil matching is good. The corresponding relative lighting condition and vignetting coefficient of the security camera under test at the working distance of 160m are shown in fig. 4 and 5, and the corresponding relative lighting condition and vignetting coefficient of the security camera under test at the working distance of 15m are shown in fig. 6 and 7.
The following further describes the specific steps of performing distortion test on the security camera to be tested by using the digital test image display system in the invention by combining the selected scene projection lens and the security camera to be tested:
s1 construction of digitized test image
In particular, in this embodiment, a digitized test image for distortion testing is constructed (or selected from a library of constructed digitized test images). In the past, a distortion test of a photoelectric imaging system is generally performed by using a 'fixed frequency grid distortion test target', and as shown in fig. 8, test targets with different sizes are selected according to different system view field ranges.
In the present embodiment, a digitized test image as shown in fig. 9 is constructed to perform a distortion test of a security camera (photoelectric imaging system). As shown in fig. 9, the digitized test image consists of an array of solid dots and cross-hairs. The diameter of the solid dots is
The spacing between adjacent solid dots (grid spacing) is
The aspect ratio of the solid dot array is 4:3 (28 solid dots are arranged in the length direction and 21 solid dots are arranged in the width direction); the intersection point of the crossed lines is positioned at the center of the solid dot array, the line width is 56 mu m, and the two crossed lines are orthogonal and are respectively parallel to the length direction and the width direction of the solid dot array.
S2 constructing the corresponding digitized test images into optical signals of the same image;
and injecting the digital test image for security camera distortion test in the step S1 into the DMD-based dynamic scene conversion unit through the dynamic scene conversion driver system, and constructing a real optical signal with the same pattern as the injected digital test image.
S3 projecting the test scene constructed in the step S2 to a preset distance to become a test scene signal of the photoelectric imaging system;
the distance from the DMD chip to the scene projection lens is controlled through the focusing design of the scene projection lens, specifically in the case of the scene projection lens, the imaging object distance of the DMD chip relative to the scene projection lens is controlled to be l 1-79.573 mm, and then the imaging object distance of a test scene relative to a tested security camera can be 15 m; and controlling the imaging object distance of the DMD chip relative to the scene projection lens to be l 1-79.960 mm, so that the imaging object distance of the test scene relative to the tested security camera can be 160 m. The scene projection of different working distances in a large range can be realized through a tiny focusing design, and therefore the distortion test of the tested security lens under different working distances is realized.
S4 photoelectric imaging system imaging the test scene signal detected in step S3
Specifically, in the embodiment, the cross-shaped line in the digital test image for the distortion test in the invention is utilized to adjust the security camera to be tested, eliminate the translation and rotation between the security camera to be tested and the DMD chip, and finish the image acquisition of the test pattern on the basis.
S5 photoelectric imaging system obtains distortion test data of the photoelectric imaging system to be tested by carrying out image analysis on the collected image
Specifically, in this embodiment, distortion data at different positions of the security camera to be tested is calculated for the image collected in step S4 according to the distortion definition and the system view field corresponding relationship, so as to complete the distortion test for the security camera to be tested.
In the above embodiments, the present invention has been described only by way of example, but various modifications may be made by those skilled in the art without departing from the spirit and scope of the invention after reading the present patent application.
Claims (11)
1. A digital test image display system, comprising:
the dynamic scene conversion system is used for constructing the digital test image into an optical signal of the same image;
and the virtual image projection system is used for carrying out amplification projection on the optical signal to obtain a real test scene.
2. The display system of claim 1, wherein the dynamic scene conversion system comprises a memory unit for storing digitized test images, a dynamic scene conversion driver system for injecting digitized test images into the dynamic scene conversion unit, and a dynamic scene conversion unit for constructing the injected digitized test images into light signals of the same image.
3. The display system according to claim 2, wherein the dynamic scene conversion unit includes a light source and a DMD chip, the dynamic scene conversion driving system injects the digital test image stored in the storage unit into the DMD chip of the dynamic scene conversion unit after receiving the instruction, the DMD chip changes an array switch according to the injected digital test image to form a specific array pattern, and the light source illuminates the array pattern formed by the DMD chip to form an optical signal having the same image as the injected digital test image.
4. The display system of claim 1, wherein the digitized test image is a digitized test image constructed by digital image simulation techniques.
5. The display system of claim 1, wherein the digitized test images include digitized test images for performance index testing and/or digitized test images for actual use scenario testing under different conditions.
6. The display system of claim 5, wherein the digitized test images for performance index testing comprise a standard resolution board test image, a standard distortion board test image, a standard Langchi ruling board test image, a standard star board test image, a standard discrimination board test image, a standard field match board test image, a standard color board test image.
7. The display system of claim 5, wherein the digitized test images for actual use scene testing under different conditions comprise digitized test images under extreme lighting conditions.
8. A display system as recited in claim 1, wherein said virtual image projection system comprises a scene projection lens.
9. The display system of claim 1, further comprising a turntable for projecting the test scene to different regions.
10. A display system as claimed in any one of claims 1 to 9 for use in performance index testing and actual use scenario testing under different conditions for optoelectronic imaging systems.
11. A test method of a photoelectric imaging system comprises the following steps:
s1: constructing a standard digital test image library by adopting a digital image simulation technology;
s2: constructing a corresponding digital test image into a test scene by adopting a digital light processing technology;
s3: projecting the test scene constructed in the step S2 to a preset distance by adopting a virtual image display technology to form a real test scene signal of the photoelectric imaging system;
s4: the photoelectric imaging system detects the test scene signal in the step S3 and performs imaging;
s5: and the photoelectric imaging system performs image analysis on the imaging image in the step S4 to obtain a test result of the photoelectric imaging system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910560394.9A CN112153365A (en) | 2019-06-26 | 2019-06-26 | Digital test image display system, test method and application |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910560394.9A CN112153365A (en) | 2019-06-26 | 2019-06-26 | Digital test image display system, test method and application |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112153365A true CN112153365A (en) | 2020-12-29 |
Family
ID=73869706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910560394.9A Pending CN112153365A (en) | 2019-06-26 | 2019-06-26 | Digital test image display system, test method and application |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112153365A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201173856Y (en) * | 2007-06-29 | 2008-12-31 | 北京创世都旅科技发展有限公司 | Detection system for detecting digital cameras complete machine performance |
| CN103413309A (en) * | 2013-08-12 | 2013-11-27 | 西北工业大学 | CCD camera nonlinearity degree calibration method based on structured light three-dimensional measurement system |
| CN104198162A (en) * | 2014-09-17 | 2014-12-10 | 中国科学院光电技术研究所 | Testing device and testing method for complete optical imaging camera system transfer function |
| CN104280218A (en) * | 2014-10-20 | 2015-01-14 | 中国科学院光电研究院 | Large visual field full-wave band target simulation testing system |
| CN107607298A (en) * | 2017-09-27 | 2018-01-19 | 马彪 | The performance measurement method and its detection device of a kind of optical lens |
| CN109520712A (en) * | 2018-12-03 | 2019-03-26 | 江苏慧光电子科技有限公司 | Optical detecting method, system and optical device manufacture system |
-
2019
- 2019-06-26 CN CN201910560394.9A patent/CN112153365A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201173856Y (en) * | 2007-06-29 | 2008-12-31 | 北京创世都旅科技发展有限公司 | Detection system for detecting digital cameras complete machine performance |
| CN103413309A (en) * | 2013-08-12 | 2013-11-27 | 西北工业大学 | CCD camera nonlinearity degree calibration method based on structured light three-dimensional measurement system |
| CN104198162A (en) * | 2014-09-17 | 2014-12-10 | 中国科学院光电技术研究所 | Testing device and testing method for complete optical imaging camera system transfer function |
| CN104280218A (en) * | 2014-10-20 | 2015-01-14 | 中国科学院光电研究院 | Large visual field full-wave band target simulation testing system |
| CN107607298A (en) * | 2017-09-27 | 2018-01-19 | 马彪 | The performance measurement method and its detection device of a kind of optical lens |
| CN109520712A (en) * | 2018-12-03 | 2019-03-26 | 江苏慧光电子科技有限公司 | Optical detecting method, system and optical device manufacture system |
Non-Patent Citations (1)
| Title |
|---|
| 朱桂斌、杜鹢: "《图像通信系统》", 国防工业出版社, pages: 66 - 71 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP3374817B1 (en) | Autofocus system for a computational microscope | |
| CN100401012C (en) | Device for measuring in three dimensions a topographical shape of an object | |
| US8339463B2 (en) | Camera lens calibration system | |
| US9088729B2 (en) | Imaging apparatus and method of controlling same | |
| CN102687056B (en) | Sensor for microscopy | |
| JP5159986B2 (en) | Imaging apparatus and imaging method | |
| CN105744266B (en) | The inclinometric system and measurement method of camera module | |
| CN107024339B (en) | Testing device and method for head-mounted display equipment | |
| US20070014001A1 (en) | Confocal microscope | |
| CN111947894B (en) | Measuring method, system, device and terminal equipment | |
| CN103180769B (en) | Microscope, image acquiring device and image-taking system | |
| CN103063410A (en) | Automatic detection system and detection method for ultraviolet or visible light optical system parameters | |
| US20120147232A1 (en) | Imaging apparatus | |
| CN111274959B (en) | Oil filling taper sleeve pose accurate measurement method based on variable field angle | |
| TR201811449T4 (en) | Method for observing linear dimensions of three-dimensional objects. | |
| CN102884395A (en) | Height measuring method and height measuring device | |
| US8817246B2 (en) | Lens test device and method | |
| WO2019097524A1 (en) | Accelerating digital microscopy scans using empty/dirty area detection | |
| DE102019212936A1 (en) | IMAGE TEST DEVICE | |
| RU2580870C2 (en) | High-resolution imaging system | |
| CN103176349A (en) | Lens detection device and method | |
| CN112153365A (en) | Digital test image display system, test method and application | |
| CN111829445A (en) | High-precision optical extensometer based on double prisms | |
| CN203011676U (en) | An automatic detection system for ultraviolet or visible light optical system parameters | |
| CN107037576B (en) | Optical microscopic imaging device and imaging method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |