CN112147157A - Light source imaging system for detecting surface defects of parts - Google Patents

Light source imaging system for detecting surface defects of parts Download PDF

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Publication number
CN112147157A
CN112147157A CN202011117797.5A CN202011117797A CN112147157A CN 112147157 A CN112147157 A CN 112147157A CN 202011117797 A CN202011117797 A CN 202011117797A CN 112147157 A CN112147157 A CN 112147157A
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CN
China
Prior art keywords
light source
light sources
image sensor
imaging system
detected
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202011117797.5A
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Chinese (zh)
Inventor
贡亮
郑慧峰
孙亚滨
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Wuxi Wensheng Intelligent Technology Co ltd
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Wuxi Wensheng Intelligent Technology Co ltd
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Priority to CN202011117797.5A priority Critical patent/CN112147157A/en
Publication of CN112147157A publication Critical patent/CN112147157A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515Objects of complex shape, e.g. examined with use of a surface follower device
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8809Adjustment for highlighting flaws

Abstract

The invention discloses a light source imaging system for detecting surface defects of parts, which comprises a rotating platform, a plurality of light sources, a first image sensor and a second image sensor, wherein the rotating platform is used for bearing and driving the parts to be detected to rotate; the plurality of light sources are arranged around the rotating platform in a surrounding mode, and light emitting surfaces of the plurality of light sources face the rotating platform; the first image sensor is arranged at the top of any one of the light sources so as to collect the side view of the part to be detected; the second image sensor is arranged right above the rotating platform so as to acquire a top view of the part to be detected. The invention can effectively highlight the surface defects of the part to be detected in the scene of applying to the part with complex reflection, thereby enabling the image sensor to acquire high-quality images and facilitating the surface defect detection of the part with complex reflection.

Description

Light source imaging system for detecting surface defects of parts
Technical Field
The invention relates to the technical field of machine vision, in particular to a light source imaging system for detecting surface defects of parts.
Background
With the development of science and technology in the society of today, mechanical automation plays a very important role in the manufacturing industry. Wherein machine vision is increasingly used in product quality monitoring. For example, after a part is produced in a production line, in order to ensure the product quality, the workpiece is not provided with surface flaws on the outgoing side, and a manufacturer can use machine vision to perform quality inspection at the last station.
However, the prior art light source imaging system for machine vision only aims at parts with regular surfaces (generally plane or with fixed size and fixed structural profile), obvious defect characteristics and single defect occurrence position distribution. For parts with complex structures, various defects and complex light reflection, when images are acquired, additional noise is caused by shadows and light reflection, so that the quality of acquired images is low, and the detection difficulty is increased or the detection is directly hindered.
Therefore, there is a need in the art for a light source imaging system capable of detecting surface defects of a reflective part with a complex shape, for detecting the surface defects of the reflective part with the complex shape.
Disclosure of Invention
Technical problem to be solved
The invention can solve the problem that the existing imaging system can not detect the surface flaws of the reflecting part with the complex shape.
(II) technical scheme
In order to achieve the above object, the present invention adopts the following technical solution, a light source imaging system for detecting surface defects of a part, comprising a rotating platform for bearing and driving the part to be detected to rotate, a plurality of light sources, a first image sensor and a second image sensor; the plurality of light sources are arranged around the rotating platform in a surrounding mode, and light emitting surfaces of the plurality of light sources face the rotating platform; the first image sensor is arranged at the top of any one of the light sources so as to collect the side view of the part to be detected; the second image sensor is arranged right above the rotating platform so as to acquire a top view of the part to be detected.
As a preferred technical scheme of the invention, the rotary platform comprises a driving device, a rotating shaft and a plane carrier; the rotating shaft is arranged at the output end of the driving device and is driven by the driving device to rotate; the center of the plane carrier is arranged at the upper end of the rotating shaft, and the part to be detected is arranged at the center of the upper part of the plane carrier.
As a preferred technical scheme of the invention, the plurality of light sources comprise a plurality of upper layer light sources and a plurality of lower layer light sources; the upper light sources are correspondingly arranged at the upper parts of the lower light sources one by one, and the lower walls of the upper light sources are attached to the upper walls of the lower light sources; and the light-emitting surface of the lower layer light source and the light-emitting surface of the upper layer light source corresponding to the lower layer light source are positioned on the same plane.
As a preferred technical solution of the present invention, the lower surface of the lower light source is higher than the top of the part to be detected.
As a preferred technical solution of the present invention, the number of values of the upper layer light source and the lower layer light source is four, six, eight, ten, twelve or sixteen; the upper layer light sources and the lower layer light sources are all centered on the rotating platform and form a regular quadrangle, a hexagon, an octagon, a decagon, a dodecagon or a hexadecagon in a surrounding mode.
As a preferred embodiment of the present invention, the first image sensor and the second image sensor are located on the same plane; the plane of the first image sensor and the plane of the second image sensor are perpendicular to the plane of the upper surface of the rotating platform.
As a preferable technical scheme of the invention, the size of the cavity formed by surrounding the plurality of light sources is matched with the size of the part to be detected.
As a preferred technical solution of the present invention, an included angle between the lens surface of the first image sensor and the upper surface of the rotating platform is 45 degrees.
As a preferable technical scheme of the invention, included angles of light rays irradiated on the upper surface of the part to be detected by the plurality of light sources are all lower than 15 degrees.
As a preferred technical scheme of the invention, the upper surface of the rotary platform is provided with a non-reflective flannelette layer; the color of the non-reflective flannelette layer is any one of three primary colors.
(III) advantageous effects
According to the invention, by using the light-on observation experience in manual visual inspection for reference, a multi-angle observation method in manual inspection is simulated, and when the method is applied to a scene of a part with complex light reflection, the surface defect of the part to be detected can be effectively highlighted, so that an image sensor can acquire a high-quality image, and the surface defect detection of the part with complex light reflection is facilitated.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is an axial schematic view of the present invention;
fig. 2 is a side view schematic of the present invention.
In the figure: 1. rotating the platform; 101. a drive device; 102. a rotating shaft; 103. a planar carrier; 2. a light source; 201. an upper layer light source; 202. a lower light source; 3. a first image sensor; 4. a second image sensor; 5. and detecting the part.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it is to be understood that the terms "longitudinal", "upper", "lower", "left", "right", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are used only for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
As shown in fig. 1 to 2, a light source imaging system for detecting surface defects of a part includes a rotating platform 1 for bearing and driving a part to be detected 5 to rotate, a plurality of light sources 2, a first image sensor 3 and a second image sensor 4, wherein:
the light sources 2 are arranged around the rotating platform 1 in a surrounding mode, the light emitting surfaces of the light sources 2 face the rotating platform, each light source can emit light beams which emit to the rotating platform 1, so that light can be supplemented to the part 5 to be detected which is placed on the rotating platform 1, the size of a containing cavity formed by the surrounding of the light sources 2 is matched with the size of the part 5 to be detected, the surface defect of the part 5 to be detected is highlighted, the surface defect of the part 5 to be detected can be clearly seen in images collected by the first image sensor 3 and the second image sensor 4, the opening and closing modes of the light sources 2, the single rotation angle and the rotation frequency of the rotating platform 1 are determined according to the shape of the part 5 to be detected, the shapes of the light sources 2 are cuboids, and the light emitting surfaces of the light sources 2 are rectangles with the;
the first image sensor 3 is arranged at the top of any one light source 2 to collect a side view of the part to be detected 5, and an included angle between the lens surface of the first image sensor 3 and the upper surface of the rotating platform 1 is 45 degrees;
the second image sensor 4 is arranged right above the rotary platform 1 to collect a top view of the part 5 to be detected, and the first image sensor 3 and the second image sensor 4 are positioned on the same plane; the plane where the first image sensor 3 and the second image sensor 4 are located is perpendicular to the plane where the upper surface of the rotating platform 1 is located, included angles of light rays of the light sources 2 irradiating the upper surface of the part 5 to be detected are all lower than 15 degrees, and low flat light is formed.
Specifically, the rotary platform 1 includes a driving device 101, a rotating shaft 102 and a planar carrier 103; the rotating shaft 102 is mounted at the output end of the driving device 101 to rotate under the driving of the driving device 101; the center of the plane carrier 103 is installed at the upper end of the rotating shaft 102, the part 5 to be detected is arranged at the center of the upper part of the plane carrier 103, optionally, a connecting hole is formed in the center of the plane carrier 103, and the top end of the rotating shaft 102 is inserted into the connecting hole and is fixedly connected with the plane carrier 103 through a flange. Or, the bottom surface of the central position of the planar carrier 103 is provided with a connecting groove, and the size of the connecting groove is in interference fit with the size of the rotating shaft 102, so that the top end of the rotating shaft 102 is clamped in the connecting groove, in fig. 1, the planar carrier 103 is circular, but the protection scope of the present invention is not limited thereto, and the planar carrier 103 may also be oval, triangular, square or other shapes.
Specifically, the plurality of light sources 2 include a plurality of upper layer light sources 201 and a plurality of lower layer light sources 202; the upper light sources 201 are correspondingly arranged on the upper portions of the lower light sources 202 one by one, the lower walls of the upper light sources 201 are attached to the upper walls of the lower light sources 202, and when the upper light sources 201 and the lower light sources 202 are arranged specifically, the upper light sources 201 and the lower light sources 202 are aligned in pairs, and a slit allowance tolerance is reserved between every two light sources; the light-emitting surface of the lower light source 202 and the light-emitting surface of the upper light source 201 corresponding to the lower light source 202 are located on the same plane, the lower surface of the lower light source 202 is higher than the top of the part 5 to be detected, and the number of the upper light source 201 and the lower light source 202 is four, six, eight, ten, twelve or sixteen; a plurality of upper light sources 201 and a plurality of lower light sources 202 all use rotary platform 1 as the center, encircle and form regular quadrangle, hexagon, octagon, decagon, dodecagon or hexadecagon, and during the specific use, upper light sources 201 are used for highlighting the surface defect that the degree of depth is less such as shallow pit, the area is great, and lower light sources 202 are used for highlighting the surface defect that length is longer, the width is less such as mar.
Specifically, a non-reflective flannelette layer is arranged on the upper surface of the rotary platform 1; the color of the non-reflective flannelette layer is any one of three primary colors, and it should be noted that the optical three primary colors specifically include any one of red, green and blue. The non-reflective flannelette is arranged, so that flaw detection can be conveniently carried out on the side surface of a part with a small area.
In conclusion, the light source imaging system provided by the invention can effectively highlight the surface defects of the part to be detected 5 in the scene of applying the light source imaging system to the part with complex reflection, so that the image sensor can acquire high-quality images, and the surface defect detection of the part with complex reflection is facilitated.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. The utility model provides a light source imaging system for detecting part surface defect, is including being used for bearing and driving rotary platform (1), a plurality of light sources (2), first image sensor (3) and second image sensor (4) that wait to detect part (5) rotation, its characterized in that:
the light sources (2) are arranged around the rotating platform (1) in a surrounding mode, and light emitting surfaces of the light sources (2) face the rotating platform;
the first image sensor (3) is arranged at the top of any one of the light sources (2) to acquire a side view of the part to be detected (5);
the second image sensor (4) is arranged right above the rotary platform (1) so as to acquire a top view of the part to be detected (5).
2. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: the rotary platform (1) comprises a driving device (101), a rotating shaft (102) and a plane carrier (103); the rotating shaft (102) is mounted at the output end of the driving device (101) to rotate under the driving of the driving device (101); the center of the plane carrier (103) is arranged at the upper end of the rotating shaft (102), and the part (5) to be detected is arranged at the center of the upper part of the plane carrier (103).
3. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: the light sources (2) comprise upper light sources (201) and lower light sources (202); the upper layer light sources (201) are correspondingly arranged at the upper parts of the lower layer light sources (202), and the lower walls of the upper layer light sources (201) are attached to the upper walls of the lower layer light sources (202); the light-emitting surface of the lower layer light source (202) and the light-emitting surface of the upper layer light source (201) corresponding to the lower layer light source are positioned on the same plane.
4. A light source imaging system for detecting surface defects of a part according to claim 3, wherein: the lower surface of the lower layer light source (202) is higher than the top of the part (5) to be detected.
5. A light source imaging system for detecting surface defects of a part according to claim 3, wherein: the upper layer light source (201) and the lower layer light source (202) are four, six, eight, ten, twelve or sixteen in number; the upper layer light sources (201) and the lower layer light sources (202) are all surrounded to form a regular quadrangle, a hexagon, an octagon, a decagon, a dodecagon or a hexadecagon by taking the rotating platform (1) as a center.
6. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: the first image sensor (3) and the second image sensor (4) are positioned on the same plane; the plane of the first image sensor (3) and the plane of the second image sensor (4) are perpendicular to the plane of the upper surface of the rotating platform (1).
7. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: the size of the cavity formed by surrounding the light sources (2) is matched with the size of the part (5) to be detected.
8. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: the included angle between the lens surface of the first image sensor (3) and the upper surface of the rotating platform (1) is 45 degrees.
9. The light source imaging system for detecting surface defects of a part as claimed in claim 1, wherein: included angles of light rays of the light sources (2) irradiating the upper surface of the part to be detected (5) are all lower than 15 degrees.
10. A light source imaging system for detecting surface defects of parts according to any one of claims 1 to 9, wherein: the upper surface of the rotary platform (1) is provided with a non-reflective flannelette layer; the color of the non-reflective flannelette layer is any one of three primary colors.
CN202011117797.5A 2020-10-19 2020-10-19 Light source imaging system for detecting surface defects of parts Pending CN112147157A (en)

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201170775Y (en) * 2007-05-23 2008-12-24 厦门福信光电集成有限公司 Light source for automatic optical detection
CN103230882A (en) * 2013-03-28 2013-08-07 重庆绿色智能技术研究院 Optical detection apparatus of parts
CN106226316A (en) * 2016-08-31 2016-12-14 江苏大学 A kind of single camera wide visual field vision thread detecting device and detection method thereof
CN208833676U (en) * 2018-09-21 2019-05-07 河源职业技术学院 A kind of Machine Vision Detection platform
CN209327186U (en) * 2018-11-08 2019-08-30 航天新长征大道科技有限公司 A kind of apparent flaws detection device
CN209764751U (en) * 2019-04-12 2019-12-10 北京深度奇点科技有限公司 Surface defect detection system
CN110632091A (en) * 2019-11-12 2019-12-31 银河水滴科技(北京)有限公司 Defect detecting apparatus, system and method thereof
CN111505849A (en) * 2020-06-16 2020-08-07 湖南大学 L CD display screen finished product flaw detection imaging device and method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201170775Y (en) * 2007-05-23 2008-12-24 厦门福信光电集成有限公司 Light source for automatic optical detection
CN103230882A (en) * 2013-03-28 2013-08-07 重庆绿色智能技术研究院 Optical detection apparatus of parts
CN106226316A (en) * 2016-08-31 2016-12-14 江苏大学 A kind of single camera wide visual field vision thread detecting device and detection method thereof
CN208833676U (en) * 2018-09-21 2019-05-07 河源职业技术学院 A kind of Machine Vision Detection platform
CN209327186U (en) * 2018-11-08 2019-08-30 航天新长征大道科技有限公司 A kind of apparent flaws detection device
CN209764751U (en) * 2019-04-12 2019-12-10 北京深度奇点科技有限公司 Surface defect detection system
CN110632091A (en) * 2019-11-12 2019-12-31 银河水滴科技(北京)有限公司 Defect detecting apparatus, system and method thereof
CN111505849A (en) * 2020-06-16 2020-08-07 湖南大学 L CD display screen finished product flaw detection imaging device and method

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