CN112130544A - Wave control test method and related equipment - Google Patents
Wave control test method and related equipment Download PDFInfo
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Abstract
The embodiment of the invention provides a wave control testing method and related equipment, and relates to the technical field of wave control testing. The wave control test method comprises the following steps: generating a control instruction and a first test result according to the test parameters; sending the control instruction to the tested object so that the tested object generates a second test result according to the control instruction; and receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report. The wave control test method and the related equipment provided by the embodiment of the invention can carry out comprehensive wave control test on the tested object, ensure the stability and reliability of the tested object in long-term work and meet the application requirements of various different scenes.
Description
Technical Field
The invention relates to the technical field of wave control testing, in particular to a wave control testing method and related equipment.
Background
In the traditional beam control system test method, darkroom test is a very important link and is a final test standard for testing various indexes and performances of the phased array antenna and whether the control system is normal or not. Since the beam control system is generally checked by using indexes such as a directional pattern in a darkroom test result, if the directional pattern has a problem, the failure cause may be from each subsystem such as a power supply system, a feeder link system, a passive array plane, and a beam control system. If the number of possible faults is too many, problems such as difficulty in troubleshooting, long troubleshooting time, etc. may occur. Meanwhile, darkroom testing cannot traverse all use scenes and use methods, so omission occurs with high probability, and the testing is not comprehensive.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a wave control testing method and a related device, which can perform a comprehensive wave control test on a measured object, ensure the stability and reliability of the measured object in long-term operation, and meet application requirements of various different scenarios.
In order to achieve the above purpose, the embodiment of the present invention adopts the following technical solutions:
in a first aspect, an embodiment of the present invention provides a wave control testing method, where the method includes:
generating a control instruction and a first test result according to the test parameters;
sending the control instruction to a tested object so that the tested object generates a second test result according to the control instruction;
and receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report.
In an optional embodiment, the step of generating the first test result according to the test parameter includes:
and bringing the test parameters into a preset beam control algorithm, and calculating to obtain the first test result.
In an optional embodiment, the step of sending the control instruction to the object to be tested to enable the object to be tested to generate a second test result according to the control instruction includes:
and sending the control instruction to a tested object so that the tested object can analyze the test parameters from the control instruction, and bringing the test parameters into a preset beam control algorithm to calculate to obtain the second test result.
In an alternative embodiment, the test parameters include a frequency parameter, a pitch angle parameter, a rotation angle parameter, and a magnitude parameter, and the first test result and the second test result each include a phase test result and a magnitude test result;
the calculation formula of the beam control algorithm comprises:
wherein f is the frequency parameter, theta is the pitch angle parameter, phi is the rotation angle parameter, um and vm are angle correction values, xi and yi are array element coordinate values, phasec is a phase compensation value, phasew is a phase weighted value, amp0 is the amplitude parameter, ampcin is an amplitude compensation value, ampwin is an amplitude weighted value, phase is the phase test result, and amp is the amplitude test result.
In a second aspect, an embodiment of the present invention provides a wave control test device, where the wave control test device is electrically connected to both an upper computer and a tested object;
the wave control test equipment is used for generating a control instruction and a first test result according to the test parameters;
the wave control test equipment is also used for sending the control instruction to the tested object so that the tested object generates a second test result according to the control instruction;
and the wave control test equipment is also used for receiving the second test result, comparing the first test result with the second test result and generating a wave control test result report.
In an optional embodiment, the wave control testing device is further configured to receive the test parameters sent by the upper computer.
In an optional implementation manner, the wave-controlled testing device is further configured to send work progress information to the upper computer.
In a third aspect, an embodiment of the present invention provides an upper computer, where the upper computer is electrically connected to a measured object through a wave control test device;
the upper computer is used for generating a control instruction and a first test result according to the test parameters;
the upper computer is also used for sending the control instruction to the tested object through the wave control test equipment so that the tested object generates a second test result according to the control instruction;
the upper computer is also used for receiving the second test result generated by the object to be tested through the wave control test equipment, comparing the first test result with the second test result and generating a wave control test result report.
In a fourth aspect, an embodiment of the present invention provides a wave-controlled testing apparatus, where the apparatus includes:
the generating module is used for generating a control instruction and a first test result according to the test parameters;
the sending module is used for sending the control instruction to a tested object so that the tested object generates a second test result according to the control instruction;
and the receiving processing module is used for receiving the second test result, comparing the first test result with the second test result and generating a wave control test result report.
In a fifth aspect, an embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the wave-controlled testing method according to any one of the foregoing embodiments.
The wave control test method and the related equipment provided by the embodiment of the invention comprise the following steps: generating a control instruction and a first test result according to the test parameters; sending the control instruction to the tested object so that the tested object generates a second test result according to the control instruction; and receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report. And generating a first test result and a second test result according to the test parameters, and obtaining a wave control test result report according to the first test result and the second test result. During and after the development of the tested object, the comprehensive wave control test can be carried out on the tested object, and the stability and the reliability of the long-term work of the tested object are ensured. Different test parameters can be set according to application requirements of different scenes, so that the tested object can meet the application requirements of various different scenes, a reliable basis is provided for iterative design of the tested object, the quality of the tested object is guaranteed, and the research and development period of the tested object is shortened.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram illustrating a wave-controlled test system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a wave-controlled test apparatus according to an embodiment of the present invention;
fig. 3 shows a schematic structural diagram of an upper computer provided in an embodiment of the present invention;
fig. 4 is a schematic flow chart illustrating a wave control testing method according to an embodiment of the present invention;
fig. 5 is a schematic display diagram of an upper computer provided in an embodiment of the present invention;
fig. 6 shows a schematic structural diagram of a wave-controlled testing apparatus according to an embodiment of the present invention.
Icon: 10-a wave control test system; 100-an upper computer; 110-a second processor; 120-a second memory; 130-a second communication module; 140-display interface; 200-wave control test equipment; 210-a first processor; 220-a first memory; 230-a first communication module; 300-measured object; 400-wave control testing device; 410-a generation module; 420-a sending module; 430-receive processing module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
It is noted that relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The embodiment of the application provides a wave control test method, which can be applied to a wave control test system, and the wave control test system can carry out comprehensive wave control test on a tested object through the wave control test method, so that the stability and reliability of the tested object in long-term work can be guaranteed, and the application requirements of various different scenes can be met.
For example, please refer to fig. 1, which is a schematic structural diagram of an implementation of the wave-controlled testing system 10, the wave-controlled testing system 10 includes an upper computer 100, a wave-controlled testing device 200, and a tested object 300, and the upper computer 100, the wave-controlled testing device 200, and the tested object 300 are electrically connected in sequence.
The wave control test equipment 200 may be a wave control test box, and specifically may be an embedded platform; the object 300 may be a beam control system, and specifically may be a phased array beam control system.
Referring to fig. 2, a structural schematic diagram of an implementation of the wave-controlled testing apparatus 200 according to the embodiment of the present application is shown, in which the wave-controlled testing apparatus 200 includes a first memory 220, a first processor 210 and a first communication module 230, and these components communicate with each other through one or more communication buses/signal lines.
The first memory 220 is used for storing programs or data. The first Memory 220 may be, but is not limited to, a Random Access Memory (RAM), a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Read-Only Memory (EPROM), an electrically Erasable Read-Only Memory (EEPROM), and the like.
The first processor 210 is used to read/write data or programs stored in the first memory 220 and perform corresponding functions. For example, when the computer program stored in the first memory 220 is executed by the first processor 210, the wave control test method disclosed in the embodiment of the present application can be implemented. The first processor 210 may be an ARM (advanced RISC machines) processor.
The first communication module 230 is used for establishing a communication connection between the wave control test device 200 and the upper computer 100 and the object 300 to be tested. The first communication module 230 may be communicatively connected to the object 300 through an SPI (Serial Peripheral Interface) communication Interface, a serdes (Serializer-Deserializer) communication Interface, a UART (Universal Asynchronous Receiver/Transmitter) communication Interface, and/or an HDLC (High-Level Data Link Control) communication Interface. The first communication module 230 may be communicatively connected to the upper computer 100 through an ethernet interface or a USB interface.
It can be understood that the wave control test method can be applied to the wave control test device 200, and the application of the wave control test method to the wave control test device 200 can ensure the real-time performance of data, and the test speed is higher, thereby avoiding the transmission of a large amount of data between the upper computer 100 and the tested object 300.
It should be understood that the configuration shown in FIG. 2 is merely a schematic diagram of the configuration of the wave-controlled testing apparatus 200, and that the wave-controlled testing apparatus 200 may include more or fewer components than shown in FIG. 2, or have a different configuration than shown in FIG. 2. The components shown in fig. 2 may be implemented in hardware, software, or a combination thereof.
Referring to fig. 3, which is a schematic structural diagram of an implementation of the upper computer 100 according to the embodiment of the present disclosure, the upper computer 100 includes a second memory 120, a second processor 110, a second communication module 130, and a display interface 140, and these components communicate with each other through one or more communication buses/signal lines.
The second memory 120 is used for storing programs or data. The second Memory 120 may be, but is not limited to, a Random Access Memory (RAM), a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Read-Only Memory (EPROM), an electrically Erasable Read-Only Memory (EEPROM), and the like.
The second processor 110 is used to read/write data or programs stored in the second memory 120 and perform corresponding functions. For example, when the computer program stored in the second memory 120 is executed by the second processor 110, the wave control test method disclosed in the embodiment of the present application can be implemented.
The second communication module 130 is used for establishing a communication connection between the wave control test device 200 and the upper computer 100. The second communication module 130 may be communicatively connected to the wave control test device 200 through an ethernet interface or a USB interface.
The display interface 140 provides an output and input interface between the host computer 100 and the user. In this embodiment, the display interface 140 is capable of sensing a touch or mouse click operation generated from a position on the display interface 140, and handing the sensed touch or mouse click operation to the second processor 110 for processing.
It is understood that the wave control test method can be applied to the upper computer 100.
It should be understood that the structure shown in fig. 3 is only a schematic structural diagram of the upper computer 100, and the upper computer 100 may further include more or less components than those shown in fig. 3, or have a different configuration than that shown in fig. 3. The components shown in fig. 3 may be implemented in hardware, software, or a combination thereof.
First embodiment
Fig. 4 is a schematic flow chart of a wave control testing method according to an embodiment of the present invention. It should be noted that, the wave-control testing method provided by the embodiment of the present invention is not limited by fig. 4 and the following specific sequence, and it should be understood that, in other embodiments, the sequence of some steps in the wave-control testing method provided by the embodiment of the present invention may be interchanged according to actual needs, or some steps in the wave-control testing method may be omitted or deleted. The wave control testing method can be applied to the upper computer 100 or the wave control testing device 200 shown in fig. 1, and the specific flow shown in fig. 4 will be described in detail below.
Step S501, generating a control instruction and a first test result according to the test parameters.
In the present embodiment, the test parameters are provided by the upper computer 100. The upper computer 100 is based on the upper computer 100 software developed by the QT platform, and can generate a test parameter setting interface as shown in fig. 5 on the display interface 140. The user can configure the test parameters through the test parameter setting interface and send the configuration to the second processor 110 or the second memory 120. The second processor 110 may directly generate the control instruction and the first test result according to the test parameter, or send the test parameter to the first processor 210 through the second communication module 130, and the first processor 210 generates the control instruction and the first test result according to the test parameter.
The test parameters may include a frequency parameter, a pitch angle parameter, a rotation angle parameter, an amplitude parameter, and the like. The test parameters may be set in accordance with the design task book of the specific object 300 to be tested.
Step S502, the control instruction is sent to the tested object, so that the tested object generates a second test result according to the control instruction.
In this embodiment, the format of the transmission frame of the control command may be as shown in table 1 below:
TABLE 1
Among them, Byte5, Byte6, Byte12 and Byte19 are free bytes. The Byte 7-8 bytes are a pitch angle parameter in the test parameters, the Byte 9-10 bytes are a rotation angle parameter in the test parameters, the Byte 13-14 bytes are amplitude parameters in the test parameters, and the Byte 16-18 bytes are frequency parameters in the test parameters.
And S503, receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report.
In this embodiment, the report of the wave control test result can be displayed on the display interface 140 of the upper computer 100.
In this embodiment, the principle that the first processor 210 or the second processor 110 generates the first test result according to the test parameters may be: and bringing the test parameters into a preset beam control algorithm, and calculating to obtain a first test result.
Similarly, the principle of generating the second test result by the object 300 according to the control instruction may be as follows: and sending the control instruction to the object 300 to be tested so that the object 300 to be tested can analyze the test parameter from the control instruction, and bring the test parameter into a preset beam control algorithm to obtain a second test result by calculation.
It can be understood that the beam control algorithms adopted by the first processor 210, the second processor 110 and the object 300 to be tested are all the same, the test parameters of different platforms are brought into the same beam control algorithm, the first test result and the second test result are obtained through calculation respectively, and the first test result and the second test result are compared, so that whether the transmission of the parameter to be tested is abnormal or not and whether the first processor 210, the second processor 110 and the object 300 to be tested are abnormal or not can be analyzed.
In this embodiment, the first test result and the second test result each include a phase test result and an amplitude test result. The calculation formula of the beam control algorithm comprises:
wherein f is a frequency parameter, theta is a pitch angle parameter, phi is a rotation angle parameter, um and vm are angle correction values, xi and yi are array element coordinate values, phasec is a phase compensation value, phasew is a phase weighted value, amp0 is an amplitude parameter, ampcin is an amplitude compensation value, ampwin is an amplitude weighted value, phase is a phase test result, and amp is an amplitude test result.
In this embodiment, the angle correction value may be obtained from an angle correction table, the array element coordinate value may be obtained from an array element coordinate table, the phase compensation value may be obtained from a phase compensation table, the phase weighting value may be obtained from a phase weighting table, the amplitude compensation value may be obtained from an amplitude compensation table, and the amplitude weighting value may be obtained from an amplitude weighting table. The angle correction table, the array element coordinate table, the phase compensation table, the phase weighting table, the amplitude compensation table, and the amplitude weighting table may be previously stored in the first memory 220 or the second memory 120, and in the measured object 300. And the angle correction table, the array element coordinate table, the phase compensation table, the phase weighting table, the amplitude compensation table and the amplitude weighting table can be determined based on the structure of the object 300 after the circuit structure of the object 300 is determined.
The upper computer 100 may respond to the window operation of the table entry file shown in fig. 5 by the user, and issue the angle correction table, the array element coordinate table, the phase compensation table, the phase weighting table, the amplitude compensation table, and the amplitude weighting table to the first memory 220 or the second memory 120, and to the object 300 to be tested.
It is to be understood that the first processor 210 and the second processor 110 may calculate the phase test result and the amplitude test result of the first test result by substituting the test parameters into the above formula. The object 300 may analyze the test parameters from the control command, and the analyzed test parameters are substituted into the above formula to calculate the phase test result and the amplitude test result of the second test result. The first processor 210 or the second processor 110 compares the phase test result and the amplitude test result of the first test result with the phase test result and the amplitude test result of the second test result to obtain a phase error result and an amplitude error result, and generates a wave control test result report according to the phase error result and the amplitude error result. And the working personnel can obtain a wave control test conclusion according to the phase error result and the amplitude error result in the wave control test result report.
The first processor 210 or the second processor 110 may perform subtraction on the phase test result of the first test result and the phase test result of the second test result to obtain a phase error result; the first processor 210 or the second processor 110 may perform a subtraction on the amplitude test result of the first test result and the amplitude test result of the second test result to obtain an amplitude error result.
In this embodiment, the first processor 210 may update the test parameters according to the step size of the test parameters. The first processor 210 or the second processor 110 may generate a new control instruction and a first test result according to the updated test parameter, and issue the new control instruction to the object 300, where the object 300 generates a new second test result according to the new control instruction. The first processor 210 or the second processor 110 calculates a new phase error result and an amplitude error result according to the new first test result and the new second test result, and writes the new phase error result and the new amplitude error result into the wave control test result report. It is understood that the wave-controlled test method is a process of one-cycle test processing.
Second embodiment
Since the wave control testing method can be applied to the wave control testing device 200 or the upper computer 100, for convenience of understanding, the wave control testing method is applied to the wave control testing device 200 for explanation.
In this embodiment, the wave control test device 200 is configured to generate a control instruction and a first test result according to the test parameter; the wave control test device 200 is further configured to send the control instruction to the object 300 to be tested, so that the object 300 to be tested generates a second test result according to the control instruction; the wave control test device 200 is further configured to receive the second test result, compare the first test result with the second test result, and generate a wave control test result report.
It can be understood that the upper computer 100 configures test parameters for the wave control test device 200, that is, the wave control test device 200 is also configured to receive the test parameters sent by the upper computer 100. The format of the test parameters sent by the upper computer 100 received by the wave control test equipment 200 is shown in the following table 2:
TABLE 2
| Byte0-1 | Byte2 | Byte3 | Byte4～5 | Byte6～7 | Byte8～9 | Byte10～11 | Byte12～17 | Byte18～19 |
| Frame length | FCODE | Command | Beginning of range | End of range | Stepping operation | Total number of | Reservation | CRC16 |
| 0x0014 | 0x0B | ** | 0～0xffff | CRC checking |
Wherein, different Byte3 bytes represent different test parameter contents. For example, if the Byte3 Byte content is 0x00, a beam is indicated; if the Byte3 Byte content is 0x01, it represents the frequency parameter; if the content of Byte3 is 0x02, the pitch angle parameter is represented; if the Byte3 Byte content is 0x03, it represents the rotation angle parameter; if the content of Byte3 bytes is 0x04, it indicates the weighting type; if the content of Byte3 Byte is 0x05, it represents the amplitude parameter; if the content of Byte3 Byte is 0x06, it indicates the number of array elements. The upper computer 100 can completely send the test parameters to the wave control test device 200 by continuously sending 7 frames of the protocol frames.
In this embodiment, the upper computer 100 may determine whether the configuration of the test parameters is successful according to whether the receiving response instruction of the wave control test device 200 is received.
In this embodiment, the upper computer 100 may also monitor the test progress of the wave control testing device 200, in addition to configuring the testing parameters for the wave control testing device 200. That is, the wave control testing device 200 is further configured to send work progress information to the upper computer 100, and the upper computer 100 can know that the wave control testing device 200 is in a test starting progress, a test middle progress or a test stopping progress according to the work progress information.
In this embodiment, after the wave control test device 200 generates the wave control test result report, the wave control test result report may be sent to the upper computer 100, and the upper computer 100 responds to the user operation to display the wave control test result on the display interface 140.
In this embodiment, the wave control testing method is applied to the wave control testing device 200, so that a large amount of data transmission between the upper computer 100 and the tested object 300 can be avoided, and the real-time performance of the data can be ensured, so that the testing speed is higher.
Third embodiment
Since the wave control test method can be applied to the wave control test device 200 or the upper computer 100, for convenience of understanding, the wave control test method is applied to the upper computer 100 for explanation.
In this embodiment, the upper computer 100 is configured to generate a control instruction and a first test result according to the test parameter; the upper computer 100 is further configured to send a control instruction to the object 300 through the wave control testing device 200, so that the object 300 generates a second test result according to the control instruction; the upper computer 100 is further configured to receive a second test result generated by the object 300 through the wave control testing device 200, and compare the first test result with the second test result to generate a wave control test result report.
It can be understood that the wave control test device 200 is responsible for forwarding the control instruction generated by the upper computer 100, collecting a second test result generated by the object 300 to be tested, and sending the second test result to the upper computer 100.
Since the upper computer 100 is difficult to be compatible with the objects 300 to be tested having various communication interfaces, the wave control test device 200 can be used for adapting the communication interfaces to complete the transmission of communication information.
Fourth embodiment
In order to perform the corresponding steps in the above embodiments and various possible manners, an implementation manner of the wave control testing apparatus 400 is given below. Further, referring to fig. 6, fig. 6 is a functional block diagram of a wave control testing apparatus 400 according to an embodiment of the present invention. It should be noted that the basic principle and the generated technical effect of the wave-controlled testing apparatus 400 provided in the present embodiment are the same as those of the above embodiments, and for the sake of brief description, no part of the present embodiment is mentioned, and corresponding contents in the above embodiments may be referred to. The wave control test apparatus 400 includes: a generating module 410, a transmitting module 420 and a receiving processing module 430.
The generating module 410 is configured to generate a control instruction and a first test result according to the test parameter.
It is understood that the generating module 410 is used for executing the content in step S501.
The sending module 420 is configured to send the control instruction to the object 300 to be tested, so that the object 300 to be tested generates a second test result according to the control instruction.
It is understood that the sending module 420 is used for executing the content in step S502.
The receiving processing module 430 is configured to receive the second test result, compare the first test result with the second test result, and generate a wave control test result report.
It is understood that the receiving processing module 430 is used for executing the content in step S503.
Alternatively, the above modules may be stored in the form of software or Firmware (Firmware) in the first memory 220 or the second memory 120 shown in fig. 2 or 3 or be fixed in an Operating System (OS) of the upper computer 100 or the wave control testing device 200, and may be executed by the first processor 210 or the second processor 110 in fig. 2 or 3. Meanwhile, data, codes of programs, etc. required to execute the above-described modules may be stored in the first memory 220 or the second memory 120.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method can be implemented in other ways. The apparatus embodiments described above are merely illustrative, and for example, the flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, the functional modules in the embodiments of the present invention may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In summary, an embodiment of the present invention provides a wave control testing method and related devices, where the wave control testing method includes: generating a control instruction and a first test result according to the test parameters; sending the control instruction to the tested object so that the tested object generates a second test result according to the control instruction; and receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report. And generating a first test result and a second test result according to the test parameters, and obtaining a wave control test result report according to the first test result and the second test result. During and after the development of the tested object, the comprehensive wave control test can be carried out on the tested object, and the stability and the reliability of the long-term work of the tested object are ensured. Different test parameters can be set according to application requirements of different scenes, so that the tested object can meet the application requirements of various different scenes, a reliable basis is provided for iterative design of the tested object, the quality of the tested object is guaranteed, and the research and development period of the tested object is shortened. Meanwhile, the comprehensive test of the extension set of the tested object can be completed before the whole machine of the tested object is assembled, the quality of the extension set is guaranteed, and the research and development period of the whole machine is shortened.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A method of wave-controlled testing, the method comprising:
generating a control instruction and a first test result according to the test parameters;
sending the control instruction to a tested object so that the tested object generates a second test result according to the control instruction;
and receiving the second test result, comparing the first test result with the second test result, and generating a wave control test result report.
2. The wave-controlled testing method according to claim 1, wherein the step of generating the first test result according to the test parameters comprises:
and bringing the test parameters into a preset beam control algorithm, and calculating to obtain the first test result.
3. The wave-controlled testing method according to claim 1, wherein the step of sending the control command to the object to be tested to enable the object to be tested to generate a second testing result according to the control command comprises:
and sending the control instruction to a tested object so that the tested object can analyze the test parameters from the control instruction, and bringing the test parameters into a preset beam control algorithm to calculate to obtain the second test result.
4. The wave-controlled test method according to claim 2 or 3, wherein the test parameters include a frequency parameter, a pitch angle parameter, a rotation angle parameter, and a magnitude parameter, and the first test result and the second test result each include a phase test result and a magnitude test result;
the calculation formula of the beam control algorithm comprises:
wherein f is the frequency parameter, theta is the pitch angle parameter, phi is the rotation angle parameter, um and vm are angle correction values, xi and yi are array element coordinate values, phasec is a phase compensation value, phasew is a phase weighted value, amp0 is the amplitude parameter, ampcin is an amplitude compensation value, ampwin is an amplitude weighted value, phase is the phase test result, and amp is the amplitude test result.
5. The wave control test equipment is characterized in that the wave control test equipment is electrically connected with an upper computer and a tested object;
the wave control test equipment is used for generating a control instruction and a first test result according to the test parameters;
the wave control test equipment is also used for sending the control instruction to the tested object so that the tested object generates a second test result according to the control instruction;
and the wave control test equipment is also used for receiving the second test result, comparing the first test result with the second test result and generating a wave control test result report.
6. The wave-controlled test device according to claim 5, wherein the wave-controlled test device is further configured to receive the test parameters sent by the upper computer.
7. The wave-controlled testing device according to claim 5, wherein the wave-controlled testing device is further configured to send work progress information to the upper computer.
8. The upper computer is characterized in that the upper computer is electrically connected with a tested object through a wave control test device;
the upper computer is used for generating a control instruction and a first test result according to the test parameters;
the upper computer is also used for sending the control instruction to the tested object through the wave control test equipment so that the tested object generates a second test result according to the control instruction;
the upper computer is also used for receiving the second test result generated by the object to be tested through the wave control test equipment, comparing the first test result with the second test result and generating a wave control test result report.
9. A wave-controlled testing apparatus, characterized in that the apparatus comprises:
the generating module is used for generating a control instruction and a first test result according to the test parameters;
the sending module is used for sending the control instruction to a tested object so that the tested object generates a second test result according to the control instruction;
and the receiving processing module is used for receiving the second test result, comparing the first test result with the second test result and generating a wave control test result report.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the wave-controlled testing method according to any one of claims 1-4.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118050696A (en) * | 2024-04-16 | 2024-05-17 | 天津云遥宇航科技有限公司 | Satellite-borne SAR phased array antenna wave control unit test system and method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204272137U (en) * | 2014-11-18 | 2015-04-15 | 成都九洲迪飞科技有限责任公司 | A kind of active beam-forming network calibration and test macro |
| CN109286453A (en) * | 2017-07-21 | 2019-01-29 | 罗德施瓦兹两合股份有限公司 | The measuring system and measurement method with positioning system for beam forming measurement |
| JP6466617B1 (en) * | 2018-07-17 | 2019-02-06 | 株式会社日立パワーソリューションズ | Abnormal sign diagnosis system and abnormality sign diagnosis method |
| CN109324968A (en) * | 2018-09-26 | 2019-02-12 | 北京奇艺世纪科技有限公司 | A kind of system detection method and device |
| CN109581106A (en) * | 2018-11-28 | 2019-04-05 | Oppo（重庆）智能科技有限公司 | Test equipment control method, device, system and electronic equipment |
| CN111323656A (en) * | 2020-03-24 | 2020-06-23 | 南京纳特通信电子有限公司 | High-efficiency amplitude-phase test system and test method for multi-channel passive antenna array |
-
2020
- 2020-09-23 CN CN202011005880.3A patent/CN112130544A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204272137U (en) * | 2014-11-18 | 2015-04-15 | 成都九洲迪飞科技有限责任公司 | A kind of active beam-forming network calibration and test macro |
| CN109286453A (en) * | 2017-07-21 | 2019-01-29 | 罗德施瓦兹两合股份有限公司 | The measuring system and measurement method with positioning system for beam forming measurement |
| JP6466617B1 (en) * | 2018-07-17 | 2019-02-06 | 株式会社日立パワーソリューションズ | Abnormal sign diagnosis system and abnormality sign diagnosis method |
| CN109324968A (en) * | 2018-09-26 | 2019-02-12 | 北京奇艺世纪科技有限公司 | A kind of system detection method and device |
| CN109581106A (en) * | 2018-11-28 | 2019-04-05 | Oppo（重庆）智能科技有限公司 | Test equipment control method, device, system and electronic equipment |
| CN111323656A (en) * | 2020-03-24 | 2020-06-23 | 南京纳特通信电子有限公司 | High-efficiency amplitude-phase test system and test method for multi-channel passive antenna array |
Non-Patent Citations (1)
| Title |
|---|
| 符伟: "波束控制系统测试仿真平台设计研究", 《计算机工程应用技术》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118050696A (en) * | 2024-04-16 | 2024-05-17 | 天津云遥宇航科技有限公司 | Satellite-borne SAR phased array antenna wave control unit test system and method |
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