CN112097684B - Visual measurement system and method based on multi-attitude band structured light - Google Patents
Visual measurement system and method based on multi-attitude band structured light Download PDFInfo
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- CN112097684B CN112097684B CN202011277654.0A CN202011277654A CN112097684B CN 112097684 B CN112097684 B CN 112097684B CN 202011277654 A CN202011277654 A CN 202011277654A CN 112097684 B CN112097684 B CN 112097684B
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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Abstract
The invention provides a three-dimensional vision measurement system and a measurement method based on multi-posture band-structured light. The measuring method comprises the steps of installing a CCD camera and a band structure light optical system, manufacturing a band structure light and acquiring a four-dimensional image of the surface of a product. According to the three-dimensional vision measurement system based on the multi-posture band structured light, the band structured light is symmetrically arranged at the two sides of the CCD camera in a multi-angle posture, so that light source dead zones during photographing can be eliminated by synchronously irradiating light sources at different angles, a product surface image with clear edges is obtained, and the accurate measurement of the product is achieved.
Description
Technical Field
The invention relates to the technical field of vision measurement, in particular to a vision measurement system and a measurement method based on multi-attitude band structured light.
Background
In the production process of stamping parts, machined parts, plates and the like, visual measurement is generally required to be carried out on the products in order to ensure the product quality, so as to check whether the sizes of the products are qualified or not, whether other defects exist or not and the like. The existing measuring method generally irradiates a product area by utilizing a plurality of linear structured lights, adopts an area array camera for imaging, and processes a product surface image projected by the linear structured lights so as to judge whether the product has defects or not. Compared with a two-dimensional image method, the method can measure the height of the product and obviously improve the accuracy. However, such methods are difficult to detect the shape change of the non-irradiated area of the light, and cannot obtain the gray value of the surface of the product, so that the precision is low and the application is limited.
Disclosure of Invention
In order to solve the problems, the invention provides a vision measuring system and a measuring method based on multi-posture band structured light.
In order to realize the technical effects, the technical scheme of the invention is as follows:
the utility model provides a three-dimensional vision measurement system based on multi-attitude band structure light, includes conveying platform, CCD camera, band structure light optical system and computer, conveying platform is used for carrying the product that awaits measuring, the CCD camera is used for shooing the surface image of the product that awaits measuring, band structure light optical system is used for producing a plurality of band structure lights of following the motion direction of the product that awaits measuring and with different angle gesture symmetrical layout in CCD camera both sides, the computer is used for receiving the image that the CCD camera was shot carries out information processing.
Preferably, a plurality of the band structure lights are uniformly distributed on two sides of the CCD camera, and the distribution angle ranges from 0 to 180 degrees.
Preferably, the optical system with the band structure comprises a plurality of light sources with the band structure, which are symmetrically arranged on two sides of the CCD camera along the movement direction of the product to be measured, wherein the light sources with the band structure comprise a laser, a powell prism and a mask, and the mask is additionally arranged below the powell prism.
Preferably, the mask is a rectangular mask or a mask with features, etc.
In addition, the invention provides a measuring method of a three-dimensional vision measuring system based on multi-pose band structured light, which comprises the following steps:
s1, mounting the CCD camera and a band structure light optical system, wherein the band structure light optical system is symmetrically distributed on two sides of the CCD camera;
s2, manufacturing the band structured light, wherein the process is as follows: starting a laser in the optical system with the structured light, and enabling a laser beam generated by the laser to sequentially pass through a Bawell prism and a mask to generate the structured light with a specific size range and clear edges;
s3, starting the CCD camera to acquire the four-dimensional coordinates of any point on the surface of the product, wherein the process is as follows: the method comprises the steps of enabling a product to be detected to move forwards on a conveying platform at a certain speed, continuously scanning and photographing by a CCD camera to obtain a two-dimensional image of the surface of the product, transmitting the two-dimensional image to a computer, receiving the image by the computer, processing information to obtain a three-dimensional coordinate of any point on the surface of the product, and obtaining a four-dimensional coordinate of any point on the surface of the product by superposing gray values of all points in the image.
Preferably, in step S2, the generated band structure light is a parallel band laser line with a width of 5-20mm, and the upper and lower edges of the parallel band laser line have clear outlines and straightness less than 0.1mm, which is specifically selected according to the measurement precision requirement.
Preferably, in step S3, the process of obtaining the three-dimensional coordinates of any point on the surface of the product is as follows: the three-dimensional coordinates of the projection edge profile can be calculated based on the calibration data of the CCD camera by combining the width and the incidence angle of the band structure light and the theoretically projected coordinates on a plane with the projection width and the projection coordinates of the band structure light in a two-dimensional image; three-dimensional coordinates of a plurality of lines on the surface of a product can be obtained through a plurality of band-structured lights which are symmetrically arranged at two sides of a CCD camera in different angle postures, and three-dimensional coordinates (X, Y and Z) of any point on the surface of the product to be measured are obtained through mathematical fitting.
Preferably, in step S3, the four-dimensional coordinates are (X, Y, Z, P), where P is a gray scale value obtained from the brightness of the band-structured light in the two-dimensional image.
The invention has the beneficial effects that:
(1) the invention provides a three-dimensional vision measurement system based on multi-pose band structured light, which is characterized in that a mask is additionally arranged below a Powell prism, so that the band structured light with clear edges is manufactured.
(2) Through a plurality of band structured lights symmetrically arranged at two sides of the CCD camera in a multi-angle posture, light source dead zones during photographing can be eliminated by synchronously irradiating light sources at different angles, product surface images with clear edges are obtained, and accurate measurement of products is achieved.
(3) Based on the clear edge contour and brightness of the light with the multi-strip structure, the four-dimensional coordinates of any point on the surface of the product can be calculated and obtained. The measurement precision is high, compared with the existing line structured light measurement method, the efficiency is improved by 2-5 times, and the precision can achieve the pixel-level precision.
Drawings
FIG. 1 is a schematic diagram of a three-dimensional vision measurement system based on multi-pose band structured light according to the present invention;
FIG. 2 is a schematic diagram of a band structure light of the present invention, wherein FIG. 2-a is a schematic diagram of a band structure light distribution, and FIG. 2-b is a schematic diagram of a band structure light projected onto a surface of a transport platform to form a light band;
FIG. 3 is a schematic diagram of the present invention with structured light to eliminate visual blind spots;
FIG. 4 is a schematic representation of the principle of light generation with the band structure of the present invention;
FIG. 5 is a schematic diagram of a rectangular mask of the present invention;
FIG. 6 is a schematic diagram of a featured mask of the present invention;
FIG. 7 is a schematic diagram of the coordinates of the upper and lower edges of a strip structured light in a CCD camera as it is incident on the surface of a transport platform according to the present invention;
FIG. 8 is a schematic diagram of the coordinates of the upper and lower edges of the structured light respectively obtained by the CCD camera when the two structured lights are incident on the surface of the conveying platform;
FIG. 9 is a schematic diagram of X coordinates of the front and rear edges of a structured light as a product to be measured passes through the structured light;
FIG. 10 is a three-dimensional profile curve obtained by sequential scanning of multiple structured light bands with a CCD camera;
FIG. 11 is a schematic diagram of the principle of projection of an internal image with structured light edges.
In the figure: 1CCD camera, 2 belt structured light optical systems, 21 laser, 22 Bawell prism, 23 mask, 231 rectangle mask, 232 rectangle light-passing area, 233 belt characteristic mask, 234 belt characteristic light-passing area, 235 characteristic pattern, 24 light, 25 belt structured light, 3 conveying platform, 4 product to be measured.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention more readily understood by those skilled in the art, and thus will more clearly and distinctly define the scope of the invention.
Referring to fig. 1, a three-dimensional vision measuring system based on multi-pose band structured light comprises a conveying platform 3, a CCD camera 1, a band structured light optical system 2 and a computer (not shown in the figure), wherein the conveying platform 3 is used for conveying a product 4 to be measured, the CCD camera 1 is used for shooting a surface image of the product 4 to be measured, the band structured light optical system 2 is used for generating a plurality of band structured light 25 symmetrically arranged at two sides of the CCD camera 1 at different angular poses along the moving direction of the product to be measured, and the computer is used for receiving the image shot by the CCD camera 1 and performing information processing. Wherein the arrow direction in the figure is the moving direction of the product 4 to be measured.
The plurality of band structured lights 25 are uniformly arranged on both sides of the CCD camera 1, and the angle range of the arrangement is 0 to 180 °. The light 25 of the band structure of this application is the clear banded light of outline, and it is mutual noninterference, and covers the full width of conveying platform 3 (if conveying platform 3 width exceedes the light 25 width of band structure, can adopt the mode that many light sources covered side by side).
As shown in fig. 2 to 6, a plurality of the band structured lights 25 are symmetrically arranged and arranged in a multi-angle manner as shown in fig. 2-a, such as: the plurality of band structure lights 25 can be uniformly distributed in a circular arc shape on two sides of the CCD camera 1, the central angle range of the distribution is 0-180 degrees, and the lights are projected on the surface of the conveying platform 3 to form a graph shown in a graph 2-b. This kind of light source overall arrangement mode can solve the problem of light source blind area, for example, it is alpha to establish the contained angle of awaiting measuring product 4 and conveying platform 3, the contained angle of taking structure light 25 and conveying platform 3 is beta, when the contained angle alpha of awaiting measuring product 4 and conveying platform 3 is greater than the contained angle beta of taking structure light 25 and conveying platform 3, the c region on the product 4 surface of awaiting measuring can't be shone by the light source forever, thereby form the vision blind area, this application adopts behind the light source of multi-angle and symmetrical overall arrangement, can be synchronous with different angles, the irradiation of the structure light source of symmetrical distribution, the light source blind area when shooing can be eliminated.
Preferably, the optical system 2 for band structure light includes a plurality of light sources for band structure light symmetrically arranged on both sides of the CCD camera 1 along the moving direction of the product 4 to be measured, the light sources for band structure light include a laser 21, a powell prism 22 and a mask 23, and the mask 23 is installed below the powell prism 22.
Preferably, the mask 23 is a rectangular mask 231 or a featured mask 233. The rectangular mask 231 is provided with a rectangular light transmission area 232, the mask 233 with the features is provided with a light transmission area 234 with the features, and the upper edge and the lower edge of the mask with the features are provided with feature patterns 235 such as feature squares, so that the identification precision of the edge of the irradiation area of the band structure light 25 can be improved.
In addition, the invention provides a measuring method of a three-dimensional vision measuring system based on multi-pose band structured light, which comprises the following steps:
s1, mounting the CCD camera 1 and the optical system 2 with the structure light, wherein the optical system 2 with the structure light is symmetrically distributed on two sides of the CCD camera 1;
s2, manufacturing the band structured light, wherein the process is as follows: starting a laser 21 in the optical system 2 with a band structure, passing a laser beam generated by the laser 21 through a Bawell prism 22 and a mask 23 in sequence, if the mask 23 is not added, directly generating a light ray 24 with a certain width as shown in FIG. 4 after the laser beam passes through the Bawell prism 22, wherein the upper edge and the lower edge of the generated light ray 24 are not clear enough, the mask 23 is added under the Bawell prism 22, and the light ray 24 passes through a light passing area on the mask 23 to generate a band structure light 25 with a specific size range (length and width range) and a clear edge;
s3, starting the CCD camera 1 to acquire the four-dimensional coordinates of any point on the surface of the product 4 to be detected, wherein the process is as follows: the product 4 to be detected moves forwards on the conveying platform 3 at a certain speed, the CCD camera 1 continuously scans and photographs to obtain a two-dimensional image of the surface of the product 4 to be detected and transmits the two-dimensional image to the computer, the computer receives the image and then processes the information to obtain the three-dimensional coordinate of any point on the surface of the product 4 to be detected, and the four-dimensional coordinate of any point on the surface of the product 4 to be detected is obtained by superposing the gray values of all points in the two-dimensional image shot by the CCD camera 1, so that the four-dimensional image of the surface of the product is obtained.
Preferably, in step S2, the generated band structure light 25 is a parallel band laser line with a width of 5-20mm, and the upper and lower edges thereof have a clear profile and a straightness of less than 0.1mm, which is specifically selected according to the measurement precision requirement.
When this application is making structure light 25, install mask 23 additional in powell prism 22 below, through the size that changes the length and the width that lead to light region on mask 23, confirm the size range that structure light 25 shines the product 4 surface that awaits measuring, obtain clear and accurate structure light 25 upper and lower marginal profile simultaneously.
As shown in fig. 7 to 11, in the step S3, the process of obtaining the three-dimensional coordinates of any point on the surface of the product 4 to be measured includes: by combining the width and the incidence angle of the band structure light 25 and theoretically the projection coordinate on the surface of the conveying platform 3 with the projection width and the projection coordinate of the band structure light 25 in a two-dimensional image, the three-dimensional coordinate of the projection edge profile can be calculated based on the calibration data of the CCD camera 1; through the plurality of band structured lights 25 symmetrically arranged at different angular postures at two sides of the CCD camera 1, three-dimensional coordinates of a plurality of lines on the surface of the product 4 to be measured can be obtained, and three-dimensional coordinates (X, Y, Z) of any point on the surface of the product 4 to be measured can be obtained through mathematical fitting.
In step S3, the four-dimensional coordinates are (X, Y, Z, P), where P is a gray scale value obtained from the brightness of the band-structured light in the two-dimensional image.
The derivation process specifically comprises: taking a strip structure light 25 as an example, when the strip structure light 25 directly irradiates the surface of the conveying platform 3, the included angle between the strip structure light 25 and the conveying platform 3 in the XOZ coordinate system shown in fig. 7 is θ1The X-axis coordinate of the upper and lower edges of the band structured light 25 acquired in the CCD camera 1 is XaAnd XbAnd the Z coordinate is 0.
When the product 4 to be measured passes through the band structure light 25, the X coordinate of the front and rear edges of the band structure light 25 is Xa1And Xb1The corresponding Z coordinates are:
Za1=(Xa-Xa1)*tan(θ1)
Zb1=(Xb-Xb1)*tan(θ1)
for a plurality of strip structured lights 25, the X-axis coordinates have a fixed distance relationship, and the included angles of the two strip structured lights 25 are respectively theta1And theta2The base coordinates are respectively Xa、XbAnd Xc、XdThen the coordinate systems of the images scanned by the two strips of structured light 25 can be unified into one coordinate system.
The three-dimensional profile curve as shown in fig. 10 can be obtained by continuously scanning the CCD camera 1 based on the plurality of band structured lights 25. The density of the contour lines can be increased by increasing the amount of the band structured light 25 and decreasing the scanning speed, improving the measurement accuracy.
Wherein, the cameraThe shot two-dimensional image information comprises three parameters (U, V and P), wherein U and V are pixel coordinates, and P is the gray value of the pixel point. By calibrating to obtain a conversion matrix R from the pixels to the world coordinate system, (X, Y, Z) = (U, V, θ)1) And R is shown in the specification. Further introducing the gray value P of the point, obtaining four-dimensional data (X, Y, Z, P) = (U, V, theta) of each point on the edge curve of the band structure light 251,P)R。
Calculating the physical coordinates of the internal images of the upper and lower edges of the light 25 with the structure by adopting a space spline curve fitting mode, wherein C is any point in the edge contour line, and the intersection point N of the same surface of the screenshot Y value and each edge contour line1(X1,Y,Z1)、N2(X2,Y,Z2)、N3(X3,Y,Z3)、N4(X4,Y,Z4) And respectively obtaining the data through 3 times of spline curve fitting.
The gray value calculation process is shown in FIG. 11, and it is known that points a and b are adjacent pixels and the pixel coordinate is (U)a,Va,Pa) And (U)b,Vb,Pb) Corresponding to the physical point A coordinate (X)a,Ya,Za,Pa) And B coordinate (X)b,Yb,Zb,Pb) World coordinates for C are (X)c,Yc,Zc) The gray scale calculation method of the projection point c is as follows: p = (Z)C-ZA)/(ZB-ZA)*(Pb-Pa)。
In the present disclosure, terms such as "upper", "lower", "left", "right", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only relational terms determined for convenience in describing structural relationships of the respective portions of the present disclosure, and are not to be construed as limiting the present disclosure.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.
Claims (3)
1. The measuring method is characterized in that the vision measuring system comprises a conveying platform, a CCD camera, a band structure light optical system and a computer, wherein the conveying platform is used for conveying a product to be measured, the CCD camera is used for shooting a surface image of the product to be measured, the band structure light optical system is used for generating a plurality of band structure lights which are symmetrically distributed on two sides of the CCD camera in different angle postures along the moving direction of the product to be measured, the computer is used for receiving the image shot by the CCD camera and processing information, the band structure lights are uniformly distributed on two sides of the CCD camera, the angle range of the distribution is 0-180 degrees, the band structure light optical system comprises a plurality of band structure light sources which are symmetrically distributed on two sides of the CCD camera along the moving direction of the product to be measured, and the band structure light sources comprise a laser, a plurality of light sources are arranged, The mask is additionally arranged below the Bawell prism and is a rectangular mask or a mask with characteristics; the measuring method of the vision measuring system based on the multi-pose band structured light comprises the following steps:
s1, mounting the CCD camera and a band structure light optical system, wherein the band structure light optical system is symmetrically distributed on two sides of the CCD camera;
s2, manufacturing the band structured light, wherein the process is as follows: starting a laser in the optical system with the structured light, and enabling a laser beam generated by the laser to sequentially pass through a Bawell prism and a mask to generate the structured light with a specific size range and clear edges;
s3, starting the CCD camera to acquire the four-dimensional coordinates of any point on the surface of the product, wherein the process is as follows: enabling a product to be detected to move forwards on a conveying platform at a certain speed, continuously scanning and photographing by a CCD camera to obtain a two-dimensional image of the surface of the product, transmitting the two-dimensional image to a computer, receiving the image by the computer, processing the information to obtain a three-dimensional coordinate of any point on the surface of the product, and overlapping gray values of all points in the image to obtain a four-dimensional coordinate of any point on the surface of the product; in step S3, the process of obtaining the three-dimensional coordinates of any point on the surface of the product is as follows: calculating the three-dimensional coordinate of the projection edge profile based on the calibration data of the CCD camera by combining the width and the incidence angle of the band structure light and the theoretically projected coordinate on a plane with the projection width and the projection coordinate of the band structure light in a two-dimensional image; three-dimensional coordinates of a plurality of lines on the surface of a product can be obtained through a plurality of band-structured lights which are symmetrically arranged at two sides of a CCD camera in different angle postures, and three-dimensional coordinates (X, Y and Z) of any point on the surface of the product to be measured are obtained through mathematical fitting.
2. The measuring method of claim 1, wherein the generated band structure light is a parallel band laser line with a width of 5-20mm, and the upper and lower edges of the parallel band laser line have a sharp profile and a straightness of less than 0.1mm in step S2.
3. The method as claimed in claim 1, wherein in step S3, the four-dimensional coordinates are (X, Y, Z, P), where P is a gray-scale value obtained from the brightness of the structured light in the two-dimensional image.
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| CN114719757B (en) * | 2022-03-23 | 2024-01-30 | 太原科技大学 | Steel plate length measuring system based on line structured light and measuring method thereof |
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