CN112089428A - X-ray anti-scattering grid based on orthogonal structure - Google Patents
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- 230000005855 radiation Effects 0.000 claims abstract description 27
- 239000011358 absorbing material Substances 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 22
- 238000010521 absorption reaction Methods 0.000 claims description 17
- 239000010409 thin film Substances 0.000 claims description 12
- 229920000049 Carbon (fiber) Polymers 0.000 claims description 10
- 229910052782 aluminium Inorganic materials 0.000 claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 10
- 239000004917 carbon fiber Substances 0.000 claims description 10
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 8
- 239000010408 film Substances 0.000 claims description 7
- 125000006850 spacer group Chemical group 0.000 claims description 7
- 229910001152 Bi alloy Inorganic materials 0.000 claims description 5
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 239000012528 membrane Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 19
- 230000015556 catabolic process Effects 0.000 abstract description 3
- 238000006731 degradation reaction Methods 0.000 abstract description 3
- 238000003745 diagnosis Methods 0.000 abstract description 3
- 238000000333 X-ray scattering Methods 0.000 abstract description 2
- 238000001914 filtration Methods 0.000 abstract description 2
- 238000012634 optical imaging Methods 0.000 abstract description 2
- 210000000056 organ Anatomy 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 238000005034 decoration Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
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- 230000005540 biological transmission Effects 0.000 description 1
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- A—HUMAN NECESSITIES
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
- A61B6/4035—Arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
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- A—HUMAN NECESSITIES
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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Abstract
The invention relates to an optical imaging device, in particular to an X-ray anti-scattering grid based on an orthogonal structure for improving the quality of an X-ray image, which is applied to an X-ray machine and CT detection equipment in the fields of medical image diagnosis and treatment, industrial nondestructive detection, security detection and the like. The present invention is used to improve radiographic images by filtering photons scattered by the examined body, organs and objects and retaining only the photons emitted by the source. The X-ray anti-scattering grid based on the orthogonal structure is provided, and aims to solve the problems that the interference of X-ray scattering radiation on the quality resolution of a detected image is reduced, the degradation of the quality of the detected image is caused by the reduction of direct X-ray radiation, the problems of low resolution, large error and the like of an X-ray detection image in the prior art are effectively improved, the image quality of X-ray image detection is obviously improved, or the radiation damage of a detected patient or an object exposed to high dose can be reduced under the condition of obtaining the same detection image quality.
Description
Technical Field
The present invention relates to an optical imaging apparatus. More specifically, the invention relates to an X-ray anti-scattering grid based on an orthogonal structure for improving the quality of an X-ray image, which is mainly applied to an X-ray machine and CT detection equipment for X-ray detection in the fields of medical image diagnosis and treatment, industrial nondestructive detection, security detection and the like.
It is an object of the present invention to devise an anti-scatter grid for improving radiographic images by filtering photons scattered by the examined body, organs and objects and retaining only photons emitted by the source.
Background
The nondestructive imaging detection technology has wide application in the fields of medical image diagnosis and treatment, life science, material science, industrial application, security inspection and the like, and X-ray imaging is one of the most important methods.
The use of digital radiological imaging is very important with respect to a variety of technical applications. Digital radiographic images are one of the main technical tools for clinicians to quickly identify and diagnose abnormalities and patients in patients. And is also an important technical means in the industrial and security fields for detecting the appearance of the contents of parts, luggage, packages and other articles, and for detecting the appearance of the structural integrity of objects, among other uses.
Radiographic imaging designs direct the generation of X-rays toward the body or object being measured, which pass through and around the body or object being measured and then strike an X-ray film or X-ray cassette or digital X-ray detector. In the context of digital X-ray detectors, these X-ray photons traverse a scintillator, which converts X-ray radiation into visible light or light photons, which are then converted into electrical signals that are processed into digital images for easier viewing, storage and transmission.
In order to reduce the arrival of scattered radiation at the detection medium, an X-ray anti-scatter-grid is proposed and used. An anti-scatter-grid typically comprises a plurality of septa made of a highly X-ray absorbing material, which are separated by a less X-ray absorbing material. The disadvantages of this approach to reducing scattered radiation are: not only the scattered radiation is absorbed into the anti-scatter-grid, but also a part of the direct radiation will be absorbed, which will degrade the X-ray detection image quality or result in that the patient or object under examination has to be exposed to a higher dose to get the same image quality.
Disclosure of Invention
The invention aims to solve the problems in the prior art, and provides an X-ray anti-scattering grid based on an orthogonal structure, which not only can reduce the influence of X-ray scattering radiation on the interference of the quality resolution of a detected image, but also can reduce the influence of the direct radiation reduction of X-rays on the quality degradation of the detected image, effectively improve the technical problems in the prior art that the X-ray detection image has lower resolution, larger error and the like, and further obviously improve the image quality of X-ray image detection, or can reduce the radiation damage of exposing a detected patient or object to higher dose under the condition of obtaining the same detection image quality.
In order to achieve the above object, the idea of the present invention is: an X-ray anti-scatter grid based on an orthogonal structure is provided, comprising two sets of arrays of a plurality of septa of a highly X-ray absorbing material, which are arranged in an orthogonal arrangement with respect to each other by grids respectively separated by a less X-ray absorbing material. Wherein, the spacers made of high X-ray absorbing material are respectively arranged at intervals and tightly attached by the thin sheets made of low X-ray absorbing material to form an orthogonal grating array structure.
Furthermore, the shape of the X-ray anti-scattering grid is a plane shape, the distance from the ray radiation source S to the grid flat plate P is the focal length F, the septa made of high X-ray absorption materials are grids respectively separated by a thin film made of low X-ray absorption materials, and two groups of the septa made of high X-ray absorption materials are formed into an array by mutually arranging the grids respectively separated by the low X-ray absorption materials in an orthogonal mode.
Furthermore, the shape of the X-ray anti-scattering grid can also be a spherical shape, the spherical radius is the distance focal distance F from the radiation source S to the spherical surface G, the septa made of high X-ray absorption materials are grids respectively separated by films made of low X-ray absorption materials, and two groups of the septa made of high X-ray absorption materials are formed into an array by mutually arranging the grids respectively separated by the low X-ray absorption materials in an orthogonal mode.
Further, the spacers of high X-ray absorbing material are typically: lead (Lead), Lead bismuth alloys, etc., and the thin films of lower X-ray absorbing materials are typically: aluminum (Al), carbon fiber (C) and Silica (SiO)2) And the like. The upper part and the lower part are covered and packaged by adopting aluminum plates or carbon fiber plates.
Further, the thickness of the spacing layers and films of the X-ray anti-scatter grid can be generally expressed by how many pairs of grid compositions are per centimeter. Such as: density 44Line, i.e. the grid density is 44 pairs of grid layers per cm, wherein the lead layer thickness is about 0.047 mm; the density 70Line, i.e., grid density of 70 pairs of grid layers per cm, with lead layer thickness of about 0.030mm or higher, with lead layer thickness being less.
Theoretically, the more the number of pairs of grating layers per cm, the better the image quality of the grating forming the grating, but the more complex the processing process of the grating, the higher the production cost is, obviously.
According to the inventive concept, the invention adopts the following technical scheme:
an orthogonal structure-based X-ray anti-scatter grid is characterized in that the orthogonal structure-based X-ray anti-scatter grid structure is as follows: consists of two sets of mutually orthogonally arranged X-ray anti-scatter grids, each set of grids comprising a plurality of septa of a high X-ray absorbing material, which are separated by grids of a lower X-ray absorbing material. Wherein, the spacers made of high X-ray absorbing material are arranged by the thin sheets made of low X-ray absorbing material at intervals and are tightly attached to form an orthogonal grating array structure.
The X-ray anti-scattering grid is in a flat plate shape, the distance from the ray radiation source S to the grid flat plate P is the focal distance, the septa made of high X-ray absorption materials are grids separated by films made of low X-ray absorption materials, and the arrangement of the septa and the planes of the films is consistent with the arrangement of the direction of rays emitted by the X-ray radiation point source at the focal position. Likewise, the spacers and membranes of another set of orthogonally arranged grids are arranged according to the same principle requirements.
The X-ray anti-scattering grid can also be in a spherical shape, the spherical radius is the distance from the ray radiation source S to the spherical surface G, the septa made of high X-ray absorption materials are grids separated by the thin film made of low X-ray absorption materials, and the arrangement of the septa and the plane of each layer of the thin film is consistent with the arrangement of the direction of the rays emitted by the X-ray radiation point source at the focal position. Likewise, the spacers and membranes of another set of orthogonally arranged grids are arranged according to the same principle requirements.
The spacers of high X-ray absorbing material described above are typically: lead (Lead), Lead bismuth alloys, etc., and the thin films of lower X-ray absorbing materials are typically: aluminum (Al), carbon fiber (C) and Silica (SiO)2) And the upper part and the lower part are covered and packaged by adopting aluminum plates or carbon fiber plates.
The thickness of the thin film and the spacing layers of the grid of the X-ray anti-scattering grid can be generally expressed by the number of pairs of grid compositions per centimeter. Such as: density 44Line, i.e. the grid density is 44 pairs of grid layers per cm; density 70Line, i.e. a grid density of 70 pairs of grid layers per cm, or higher.
The X-ray anti-scattering grid based on the orthogonal structure has the advantages that the X-ray anti-scattering grid based on the orthogonal structure is adopted to replace the existing single-group X-ray anti-scattering grid, and the scattered radiation of the X-rays is ensured to be absorbed into the anti-scattering grid so as to increase the penetration of the directly radiated part of the X-rays. Theoretically, the amount of direct X-ray radiation can be increased by about 1 time, and the degradation of image quality can be reduced, or the damage of exposing the detected patient or object to higher radiation dose can be reduced to obtain the same image quality, so that the detection quality of medical images can be obviously improved or the radiation damage of the detected patient can be greatly reduced.
Drawings
FIG. 1: is a schematic diagram of a flat-panel grid detection system for X-ray image.
FIG. 2: is a schematic diagram of an X-ray anti-scattering flat-plate grid based on an orthogonal structure.
FIG. 3: is a side view of an X-ray anti-scatter grid based on an orthogonal configuration as shown in fig. 2.
FIG. 4: is a partial cross-sectional view of an X-ray anti-scatter flat grid based on an orthogonal structure as shown in fig. 2.
FIG. 5: is a schematic diagram of an X-ray image spherical grid detection system
FIG. 6: is a schematic diagram of an X-ray anti-scattering spherical grid based on an orthogonal structure.
FIG. 7: is a side view of an X-ray anti-scatter spherical grid based on an orthogonal structure as shown in fig. 6.
FIG. 8: is a partial cross-sectional view of an X-ray anti-scatter spherical grid based on an orthogonal structure as shown in fig. 6.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings, which illustrate two preferred embodiments of the present invention and can be implemented by those skilled in the art to fully describe the present invention and to make the technical contents thereof clearer and more easily understandable. The present invention may be embodied in many different forms of embodiments, and the scope of the present invention is not limited to only the embodiments described herein.
In the drawings, elements having the same structure are designated by the same reference numerals, and elements having similar structure or function are designated by similar reference numerals. The size and thickness of each component in the drawings are arbitrarily illustrated, and the present invention is not limited to the size and thickness of each component, and the size and thickness of the components are exaggerated where appropriate in order to make the illustration clearer.
Example 1: as shown in FIG. 1, an X-ray image flat grid detecting system is provided, which comprises an X-ray tube (1) located at a focus S, an X-ray image flat grid (2) opposite to an X-ray emitting point source S and a patient (3) or an object (3) to be detected, wherein the X-ray image flat grid is arranged at a certain focus F, and an X-ray image receiving device (4) is arranged outside the grid plate.
Referring to fig. 2 and 3, an X-ray anti-scatter grid based on an orthogonal structure of the present embodiment is formed by multiple layers of septa (2.1) of high X-ray absorbing material, which are generally: the thin film (2.2) of Lead (Lead), Lead bismuth alloy, etc., lower X-ray absorbing material is typically: aluminum (Al), carbon fiber (C) and Silica (SiO)2) The materials and the upper and the lower parts of the packaging material (2.3) are covered by aluminum plates or carbon fiber plates.
Example 2: as shown in FIG. 4, an X-ray image spherical grid detecting system is provided, which comprises an X-ray tube (1) located at a focus S, an X-ray image spherical grid (2) which is at a certain focus F and is opposite to an X-ray emitting point source S, a patient to be detected (3) or an object to be detected (3) placed between the X-ray image spherical grid and the X-ray image spherical grid, and an X-ray image receiving device (4) arranged outside a grid spherical plate.
Referring to fig. 5 and 6, an X-ray anti-scatter spherical grid based on an orthogonal structure of the present embodiment is composed of multiple layers of spherical septa (2.1) of high X-ray absorbing material, which are generally: spherical films (2.2) of Lead (Lead), Lead bismuth alloys, etc., lower X-ray absorbing materials are typically: aluminum (Al), carbon fiber (C) and IISilicon oxide (SiO)2) The materials and the like, and the upper part and the lower part of the packaging material (2.2) are covered by spherical aluminum plates or carbon fiber plates.
Example 2 the technical solution is mostly the same as that of example 1, and the difference technical feature is that an X-ray anti-scatter grid plate based on an orthogonal structure in example 2 is a spherical grid with a spherical radius from a focal point X-ray source S to a focal distance F of the grid plate. And the X-ray anti-scattering grid based on the orthogonal structure in the embodiment 1 is a flat grid from the focal point X-ray source S to the focal distance F of the grid plate, and the grid in the embodiment 1 has less material, relatively more convenient processing technology and relatively lower production cost.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (4)
1. An orthogonal structure-based X-ray anti-scatter-grid, characterized in that said orthogonal structure-based X-ray anti-scatter-grid (2) structure is: the X-ray anti-scattering grid structure is composed of two groups of X-ray anti-scattering grids which are arranged orthogonally to each other, each group of grids comprises a plurality of grids separated by high X-ray absorption material septa (2.1) and lower X-ray absorption material (2.2), wherein the high X-ray absorption material septa are arranged at intervals and are tightly attached to each other through lower X-ray absorption material sheets to form an orthogonal grid array structure.
2. An X-ray anti-scatter-grid based on an orthogonal structure according to claim 1, characterized in that the X-ray anti-scatter-grid is in the shape of a flat plate, the distance from the source of radiation S to the grid plate P is the focal distance, the septa of the high X-ray absorbing material (2.1), the grid separated by the thin film of the lower X-ray absorbing material (2.2), are arranged in the plane of the septa and the thin film layers in line with the direction of the radiation emitted by the source of X-ray radiation spots at the focal position, and likewise, the septa and the thin film of another set of orthogonally arranged grids are arranged on the same principle.
3. An X-ray anti-scatter-grid based on an orthogonal structure according to claim 1, characterized in that the X-ray anti-scatter-grid can also be spherical in shape, the spherical radius being the distance from the source of radiation S to the sphere G, the septa of said high X-ray absorbing material (2.1), the grid separated by the thin film of lower X-ray absorbing material (2.2), the arrangement of the planes of the septa and the thin film layers being aligned with the direction of the radiation emitted by the source of X-ray radiation spot at the focal position. Likewise, the spacers and membranes of another set of orthogonally arranged grids are arranged according to the same principle requirements.
4. An X-ray anti-scatter-grid based on an orthogonal structure according to claim 1, characterized in that the septa of the high X-ray absorbing material (2.1) are generally: lead (Lead), Lead bismuth alloys, etc., and the lower X-ray absorbing material (2.2) films are typically: aluminum (Al), carbon fiber (C) and Silica (SiO)2) And the upper part and the lower part of the material are covered and packaged by adopting a material (2.2) with lower X-ray absorption, such as an aluminum plate or a carbon fiber plate.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2020106231908 | 2020-06-19 | ||
| CN202010623190 | 2020-06-19 |
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| CN112089428A true CN112089428A (en) | 2020-12-18 |
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| CN202010984309.4A Pending CN112089428A (en) | 2020-06-19 | 2020-09-12 | X-ray anti-scattering grid based on orthogonal structure |
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