CN112067513A - Method for detecting distribution of diamond abrasive particles on tool bit blank - Google Patents
Method for detecting distribution of diamond abrasive particles on tool bit blank Download PDFInfo
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- CN112067513A CN112067513A CN202011266434.8A CN202011266434A CN112067513A CN 112067513 A CN112067513 A CN 112067513A CN 202011266434 A CN202011266434 A CN 202011266434A CN 112067513 A CN112067513 A CN 112067513A
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- diamond
- tool bit
- abrasive particles
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Abstract
The invention discloses a method for detecting distribution of diamond abrasive particles on a tool bit blank, and belongs to the technical field of nondestructive testing. The method comprises the following steps: s100: carrying out radiant heating on the surface to be detected of the diamond tool bit blank; s200: acquiring temperature distribution information of a surface to be detected; s300: converting the temperature distribution information into an infrared thermography; s400: and analyzing the temperature difference presented by the infrared thermograph to obtain the position distribution information of the diamond abrasive particles on the surface of the diamond tool bit blank. The method has the advantages that the high thermal conductivity of the diamond abrasive particles is utilized, the position distribution information of the diamond abrasive particles on the tool bit blank is obtained according to the principle that the surface temperature of the diamond abrasive particles is lower than that of a metal binding agent material of the diamond tool bit blank, whether the diamond abrasive particles are vacant or not is judged, the problem that the light reflection intensity of the single crystal diamond is influenced by the angle when the single crystal diamond is detected by using an optical detection method is effectively solved, the accuracy is high, the operation is simple and convenient, the cost is low, and the method can be applied to.
Description
Technical Field
The invention relates to the technical field of nondestructive testing, in particular to a method for detecting distribution of diamond abrasive particles on a tool bit blank.
Background
Diamond is a high-hardness material commonly used in industry at present, and has the characteristics of high hardness, good mechanical property and thermal conductivity, so that the diamond becomes an ideal tool material for precision cutting at present, and is widely applied to processing of brittle and hard materials such as stone, hard alloy, engineering ceramic, optical glass, semiconductor materials and the like.
Research and development of diamond tools have been dedicated to research on the influence of the structure of the diamond segments on the performance of products, and according to the current research results, the service life and the working efficiency of the diamond tool are closely related to the spacing between diamond abrasive grains on the surface of the diamond tool, the concentration of the diamond abrasive grains and the granularity of diamond. The diamond cutter manufactured by the traditional method has the defects that the diamond abrasive particles are randomly distributed, and the utilization rate of the diamond abrasive particles is extremely low during working, so that the traditional diamond cutter has low working efficiency, short service life and the like. Research shows that the ordered arrangement of the diamond abrasive grains on the cutter can obviously improve the performance of the diamond cutter, so that the ordered arrangement of the diamond abrasive grains in a matrix becomes a hotspot in the diamond cutter manufacturing industry.
The method for detecting the distribution of diamond abrasive particles in the diamond tool bit blank in the production and manufacturing process of the diamond tool is divided into two methods; one of them is the traditional detection method, that is, randomly sampling on the tool bit blank, and observing the quantity and distribution of diamond abrasive grains under a microscope, so as to estimate the distribution of diamond abrasive grains on the whole tool bit blank. The other method is a digital imaging detection method, which realizes the detection of the distribution of diamond abrasive particles by using a machine vision means, but due to the characteristic of anisotropy of diamond single crystals, misjudgment is easily caused under an optical field of view, and the detection method has extremely high requirements on an optical system and an imaging system and a complex vision algorithm.
Disclosure of Invention
The invention aims to provide a method for detecting distribution of diamond abrasive particles on a tool bit blank, so as to solve one or more technical problems in the prior art and provide at least one beneficial choice or creation condition.
The technical scheme adopted for solving the technical problems is as follows:
a method for detecting the distribution of diamond abrasive particles on a cutter head blank comprises the following steps:
s100: carrying out radiant heating on the surface to be detected of the diamond tool bit blank;
s200: acquiring temperature distribution information of the surface to be detected;
s300: converting the temperature distribution information into an infrared thermography;
s400: and analyzing the temperature difference presented by the infrared thermograph to obtain the position distribution information of the diamond abrasive particles on the surface of the diamond tool bit blank.
The diamond tool bit blank to be detected is subjected to radiation heating by utilizing the high heat conductivity characteristic of the diamond abrasive particles, after the temperature is raised, the surface temperature of the diamond abrasive particles is lower than the temperature of the metal bond material in the area nearby the diamond abrasive particles, and the surface temperature distribution information of the diamond tool bit blank is collected and converted into an infrared thermal image which can be distinguished by naked eyes, so that the positions of the diamond abrasive particles on the diamond tool bit blank are obtained through analysis, and finally, whether the diamond tool bit blank subjected to cold press molding has the condition of abrasive particle vacancy or not can be judged. The whole detection process is simple and rapid in detection speed, high in accuracy and low in cost, and the nondestructive detection of the diamond tool bit blank is realized.
As a further improvement of the above technical solution, the step S100 includes the steps of:
s110: arranging a flash lamp above the diamond tool bit blank, and adjusting the distance between the flash lamp and the surface to be detected of the diamond tool bit blank and setting an illumination angle;
s120: and starting the flash lamp to perform radiant heating on the surface to be detected.
The flash lamp is used for providing a heat source for the diamond tool bit blank, instantaneous high-power illumination can be generated and irradiated on the diamond tool bit blank, so that the surface of the diamond tool bit blank is rapidly heated, and the whole detection speed is accelerated.
As a further improvement of the technical scheme, the power of the flash lamp is more than 50W. By adopting the power of more than 50W, the sufficient heat on the surface of the diamond tool bit blank to be detected can be ensured in a short time, and the heating speed is accelerated.
As a further improvement of the technical scheme, the flash lamp is an incandescent lamp with an annular light source or a halogen flash lamp. Compared with the commonly used LED flash lamp, the incandescent lamp or the halogen flash lamp has higher heat generation efficiency, and is cheaper and easy to install. The incandescent lamp or the halogen flash lamp with the annular light source is adopted, so that the surface to be detected of the diamond tool bit blank can be uniformly illuminated.
As a further improvement of the technical scheme, the illumination angle is set in the range of 30-60 degrees. The arrangement is such that the surface to be detected of the diamond tool bit blank is uniformly illuminated.
As a further improvement of the above technical solution, the time of the radiation heating in the step S120 is set in the range of 0.1 to 1S. The power of the flash lamp is large, and the illumination time is controlled to be most suitable within 0.1 to 1 s.
As a further improvement of the above technical solution, the step S200 includes the following steps:
s210: arranging an infrared thermal imager right above the diamond tool bit blank, and adjusting the distance between a lens of the infrared thermal imager and the surface to be detected of the diamond tool bit blank;
s220: and starting the thermal infrared imager, and measuring the surface to be detected to acquire temperature distribution information of the surface to be detected.
And when the surface temperature of the diamond tool bit blank rises, an infrared thermal imager is adopted, and an infrared detector and an optical imaging objective lens of the infrared thermal imager are utilized to receive the infrared radiation energy distribution pattern of the diamond tool bit blank and reflect the infrared radiation energy distribution pattern to a photosensitive element of the infrared detector, so that the temperature distribution information of the diamond tool bit blank is effectively collected.
As a further improvement of the above technical solution, the step S300 includes the following steps:
s310: transmitting the temperature distribution information acquired by the thermal infrared imager to a processing terminal provided with image data processing software;
s320: and operating image data processing software to convert the temperature distribution information into an infrared thermography. The thermal infrared imager is connected to the processing terminal, the temperature distribution information collected by the thermal infrared imager is transmitted to the processing terminal, the image data processing software installed on the processing terminal is started, the temperature distribution information is presented in the form of an infrared thermograph, workers can conveniently observe the infrared thermograph visually, moreover, the temperature data difference on the infrared thermograph can be used for carrying out statistical analysis, and the position distribution condition of diamond abrasive particles on the tool bit blank body is obtained.
The invention has the beneficial effects that: according to the method for detecting the distribution of the diamond abrasive particles on the tool bit blank, the position distribution information of the diamond abrasive particles on the tool bit blank is obtained according to the fact that the surface temperature of the diamond abrasive particles is lower than that of a metal bonding agent material of the diamond tool bit blank by utilizing the high thermal conductivity of the diamond abrasive particles, whether the diamond abrasive particles are vacant or not is judged, and the problem that the angle influence is caused when the traditional machine vision optical detection method is used for detecting the light reflection intensity of the single crystal diamond is effectively solved. The purpose of quickly and accurately identifying the diamond abrasive particles on the diamond tool bit blank is realized in an infrared nondestructive detection mode, and the method has the advantages of high accuracy, simplicity and convenience in operation and low cost, and is applied to detection of the diamond tool bit blank in a cold press molding process.
Drawings
The invention is further described with reference to the accompanying drawings and examples;
FIG. 1 is a schematic flow chart of a method for detecting distribution of diamond abrasive grains on a segment blank according to the present invention;
FIG. 2 is a detailed flowchart of step S100 in FIG. 1;
FIG. 3 is a detailed flowchart of step S200 in FIG. 1;
FIG. 4 is a detailed flowchart of step S300 in FIG. 1;
FIG. 5 is a schematic diagram of the apparatus for detecting the distribution of diamond abrasive grains on a segment blank according to the present invention;
FIG. 6 is a schematic surface texture of a sample of a diamond tip blank to be inspected.
The drawings are numbered as follows: 100. a diamond tool bit blank; 110. a metal binder material; 120. diamond abrasive grains; 200. a flash lamp; 300. a thermal infrared imager; 400. and processing the terminal.
Detailed Description
Reference will now be made in detail to the present preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, if words such as "a plurality" are described, the meaning is one or more, the meaning of a plurality is two or more, more than, less than, more than, etc. are understood as excluding the present number, and more than, less than, etc. are understood as including the present number.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
Referring to fig. 1 to 6, several examples of the method of detecting the distribution of diamond abrasive grains on a segment blank according to the present invention will be described.
The method for detecting the distribution of the diamond abrasive particles on the cutter head blank specifically comprises the following steps:
(1) step S100: the surface to be inspected of the diamond tip blank 100 is subjected to radiant heating. Because the diamond abrasive particles 120 have high thermal conductivity, and the thermal conductivity of diamond is tens of times that of the metal bond material 110, after the diamond segments blank 100 is heated, the surface temperature of the diamond abrasive particles 120 is lower than the temperature of the metal bond material 110 nearby, and the position distribution of the diamond abrasive particles 120 on the diamond segments blank 100 can be obtained through obvious temperature difference.
Specifically, the step S100 includes the following steps:
step S110: the flash lamp 200 is arranged above the diamond segments blank 100, and the distance between the flash lamp 200 and the surface to be detected of the diamond segments blank 100 and the illumination angle are adjusted.
The power of the flash lamp 200 is more than 50W, and sufficient heat can be ensured to be obtained on the surface to be detected of the diamond tool bit blank 100 in a short time.
The flash lamp 200 is a halogen flash lamp with an annular light source. Compared with a common LED flash lamp, the halogen flash lamp is high in heating efficiency, generates instantaneous high-power illumination, can achieve rapid temperature rise of the surface to be detected of the diamond tool bit blank 100, and is low in price and easy to install.
The halogen flash lamp is provided with an annular light source with a curved surface shape, can be but is not limited to a halogen lamp annular optical fiber cold light source with the model of WC-150 and the specification of 21V150W, and can control the illumination angle within the range of 30-60 degrees according to the size of the surface to be detected of the diamond tool bit blank 100, so that the surface to be detected of the diamond tool bit blank 100 is uniformly illuminated.
Of course, a ring flash lamp with model AR400 and power of 400W may be selected.
In the present embodiment, the distance between the diamond segment blank 100 and the flash lamp was controlled to be 0.4m, and the illumination angle was set to be 60 °.
S120: and starting the flash lamp 200 to enable the flash lamp 200 to generate instantaneous high-power illumination to radiatively heat the surface to be detected. Wherein, the time of radiation heating is controlled to be 0.1 to 1s, so that the overhigh surface temperature of the diamond tool bit blank is avoided.
(2) Step S200: and acquiring the temperature distribution information of the surface to be detected.
Specifically, the step S200 includes the following steps:
s210: and arranging an infrared thermal imager 300 right above the diamond tool bit blank 100, wherein the operating wavelength of the infrared thermal imager 300 is 2-14 mu m, the resolution is one of 160x120, 240x180, 320x240, 384x288, 640x480 and the like, and the thermal sensitivity is within 0.2 ℃.
Then, the distance between the lens of the thermal infrared imager 300 and the surface to be detected of the diamond segments blank 100 is adjusted to be 0.4 m.
S220: and starting the thermal infrared imager 300, and measuring the surface to be detected to acquire temperature distribution information of the surface to be detected. In the case of an annular light source, thermal infrared imager 300 may be positioned directly above diamond tip blank 100 to measure the temperature of the surface to be inspected directly against the diamond tip blank.
In the embodiment, the thermal infrared imager 300 is selected as HT-A1, the operating wavelength is 8 μm to 14 μm, the resolution is 640x480, and the thermal sensitivity is 0.07 ℃.
(3) Step S300: and converting the temperature distribution information into an infrared thermography.
Specifically, the step S300 includes the following steps:
s310: the thermal infrared imager 300 is connected to the processing terminal 400, so that the temperature distribution information collected by the thermal infrared imager 300 can be transmitted to the processing terminal 400 installed with image data processing software through a wire. The processing terminal 400 may be an industrial personal computer having an image data processing function.
S320: and operating image data processing software installed in the processing terminal 400 to convert the temperature distribution information into a visual infrared thermography.
When the temperature of any object in nature is higher than absolute zero (0K, namely-273 ℃), it will emit infrared radiation, and the infrared thermal imaging technology is to use an infrared detector and an optical imaging objective to receive the infrared radiation energy of the measured object and reflect the energy distribution on a photosensitive component of the infrared detector, so as to obtain an infrared thermal image. This infrared thermographic image corresponds to the thermal distribution field of the object surface. When heat flow spreads and transfers inside the object, corresponding "hot" and "cold" regions are formed on the surface of the object due to the difference in thermophysical properties of the material or the conduction, and the temperature difference is displayed as images of different colors by the thermal infrared imager. One can use this technique to assess the quality, composition or condition, etc. of the inspected object.
(4) Step S400: the temperature difference exhibited by the infrared thermographic image is analyzed to obtain information on the position distribution of the diamond abrasive grains 120 on the surface of the diamond tip blank 100.
Because the thermal conductivity of the artificial diamond abrasive particles can reach 2000W/m.K (the thermal conductivity of iron is 40 multiplied by 1.163W/m.K), and the size of the diamond abrasive particles is dozens of times larger than the particles of the metal bond materials around the diamond abrasive particles, when the surface to be detected of the diamond tool bit blank body is heated by equivalent radiation, the surface heat of the diamond abrasive particles can be rapidly transferred to the periphery of the diamond tool bit blank body, and thus the surface temperature of the diamond abrasive particles 120 is obviously lower than the temperature of the metal bond materials 110 in the nearby area.
After acquiring the infrared thermograph, a manual analysis mode can be adopted, namely, the worker can judge the specific distribution position of the diamond abrasive particles and whether the abrasive particles are vacant according to the temperature difference displayed by the infrared thermograph. And a machine analysis mode can also be adopted, namely, after the industrial personal computer runs the image data processing software of the industrial personal computer to obtain an infrared thermograph, the temperature data on the infrared thermograph can be collected for comparative analysis, and the position and the quantity of the diamond abrasive particles are analyzed according to the condition that the surface temperature of the diamond abrasive particles is obviously lower than the temperature of the metal bond material in the nearby area.
In order to effectively prove the technical effect of the invention, a detection device consisting of a flash lamp, a thermal infrared imager and an industrial personal computer is used, a test piece with known diamond abrasive particle distribution is adopted to be verified under the detection device, the test piece completes the detection work through the steps, the original data obtained by the industrial personal computer processes the image, a frame of image with better experimental result is selected, the extraction of information such as the position, vacancy and the like of the diamond abrasive particles is completed through the image data processing technology, the detection is carried out for five times, and the result is shown in table 1.
TABLE 1 time consuming and accuracy of the test method
| Number of measurements | Detecting adsorption quantity (particle) | Actual adsorption quantity (particle) | Rate of accuracy | Detection time(s) |
| 1 | 112 | 112 | 100% | 0.67 |
| 2 | 111 | 112 | 99.1% | 0.72 |
| 3 | 112 | 112 | 100% | 0.65 |
| 4 | 112 | 112 | 100% | 0.70 |
| 5 | 112 | 112 | 100% | 0.70 |
In table 1, the detection of the adsorption amount refers to the statistical result of the detection device for automatically detecting the diamond abrasive grains, and the actual adsorption amount refers to the statistical result of the diamond abrasive grain counting by observing the collected image with naked eyes. As can be seen from Table 1, the detection result accuracy of the detection device is about 99%, the detection time is about 0.7s, and the detection method is simple, rapid and high in accuracy.
While the preferred embodiments of the present invention have been described in detail, the invention is not limited to the embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the invention, for example, the distribution of diamond abrasive particles in each layer can be detected during the production of the segment blank to ensure that the distribution requirement of three-dimensional space is met, and such equivalent modifications or substitutions are included in the scope of the claims.
Claims (8)
1. A method for detecting the distribution of diamond abrasive particles on a cutter head blank is characterized by comprising the following steps:
s100: carrying out radiant heating on the surface to be detected of the diamond tool bit blank (100);
s200: acquiring temperature distribution information of the surface to be detected;
s300: converting the temperature distribution information into an infrared thermography;
s400: and analyzing the temperature difference presented by the infrared thermography to acquire the position distribution information of the diamond abrasive particles (120) on the surface of the diamond tool bit blank body (100).
2. The method according to claim 1, wherein the step S100 comprises the steps of:
s110: arranging a flash lamp (200) above the diamond tool bit blank (100), and adjusting the distance between the flash lamp (200) and the surface to be detected of the diamond tool bit blank (100) and setting an illumination angle;
s120: and starting the flash lamp (200) to perform radiant heating on the surface to be detected.
3. The method according to claim 2, wherein the power of the flash lamp (200) is 50W or more.
4. A method according to claim 3, characterized in that the flash lamp (200) is a halogen flash lamp with an annular light source.
5. The method of claim 4, wherein the illumination angle is set in a range of 30 ° to 60 °.
6. The method according to claim 5, wherein the time for the radiant heating in step S120 is set to 0.1 to 1S.
7. The method according to any one of claims 1 to 6, wherein the step S200 comprises the steps of:
s210: arranging a thermal infrared imager (300) right above the diamond tool bit blank (100), and adjusting the distance between a lens of the thermal infrared imager (300) and the surface to be detected of the diamond tool bit blank (100);
s220: and starting the thermal infrared imager (300) and measuring the surface to be detected to acquire temperature distribution information of the surface to be detected.
8. The method according to claim 7, wherein the step S300 comprises the steps of:
s310: transmitting the temperature distribution information collected by the thermal infrared imager (300) to a processing terminal (400) provided with image data processing software;
s320: and operating image data processing software to convert the temperature distribution information into an infrared thermography.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185551A (en) * | 2013-03-11 | 2013-07-03 | 湖南大学 | In-place active infrared detecting device and method for sand wheel blocked area |
| CN104977231A (en) * | 2015-07-08 | 2015-10-14 | 华东交通大学 | Emery line particle on-line automatic detection device |
| US20160061666A1 (en) * | 2014-08-26 | 2016-03-03 | The Government Of The United States Of America, As Represented By The Secretary Of The Navy | Extended infrared imaging system |
| KR20180049947A (en) * | 2016-11-04 | 2018-05-14 | (주)아모레퍼시픽 | Apparatus for detecting foreign material in container |
| CN209132133U (en) * | 2018-08-23 | 2019-07-19 | 信丰崇辉科技有限公司 | Diamond cutting secant detection system |
-
2020
- 2020-11-13 CN CN202011266434.8A patent/CN112067513A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185551A (en) * | 2013-03-11 | 2013-07-03 | 湖南大学 | In-place active infrared detecting device and method for sand wheel blocked area |
| US20160061666A1 (en) * | 2014-08-26 | 2016-03-03 | The Government Of The United States Of America, As Represented By The Secretary Of The Navy | Extended infrared imaging system |
| CN104977231A (en) * | 2015-07-08 | 2015-10-14 | 华东交通大学 | Emery line particle on-line automatic detection device |
| KR20180049947A (en) * | 2016-11-04 | 2018-05-14 | (주)아모레퍼시픽 | Apparatus for detecting foreign material in container |
| CN209132133U (en) * | 2018-08-23 | 2019-07-19 | 信丰崇辉科技有限公司 | Diamond cutting secant detection system |
Non-Patent Citations (2)
| Title |
|---|
| 张永宏 主编: "《现代薄膜材料与技术》", 31 August 2016, 西北工业大学出版社 * |
| 张金玉 等: "《红外热波检测及其图像序列处理技术》", 30 June 2015, 国防工业出版社 * |
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Application publication date: 20201211 |