CN112033316B - Track waveform determining method and device, electronic equipment and storage medium - Google Patents

Track waveform determining method and device, electronic equipment and storage medium Download PDF

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CN112033316B
CN112033316B CN202010697233.7A CN202010697233A CN112033316B CN 112033316 B CN112033316 B CN 112033316B CN 202010697233 A CN202010697233 A CN 202010697233A CN 112033316 B CN112033316 B CN 112033316B
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distance
track
waveform
distance sensor
straight line
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CN112033316A (en
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王源
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Shenzhen Eberry Technology Co ltd
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Shenzhen Eberry Technology Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/08—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring roughness or irregularity of surfaces

Abstract

The application discloses a track waveform determining method and device, electronic equipment and a storage medium, and relates to the technical field of track traffic. Firstly, determining a first track waveform corresponding to a first straight line in the track extension direction through a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals according to the first straight line in a target track section; then, according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line, measuring a group of first distance measured values in the track extending direction according to a preset sampling step length; according to the relative height difference between the first distance measured value and the third distance measured value of the position corresponding to the second distance sensor on the first straight line and the first track waveform, the second track waveform corresponding to the second straight line in the track extending direction can be obtained, and the irregularity of the track on the whole can be reflected more accurately and reliably.

Description

Track waveform determining method and device, electronic equipment and storage medium
Technical Field
The present disclosure relates to the field of rail transit technologies, and in particular, to a method and an apparatus for determining a rail waveform, an electronic device, and a storage medium.
Background
The track waveform comprises steel rail short wave irregularity and steel rail long wave irregularity in the track traffic. Taking rail short wave irregularity as an example, the rail short wave irregularity mainly comprises rail surface roughness, rail surface irregularity and wheel tread irregularity, and the rail short wave irregularity can not only excite rolling vibration and noise of a wheel rail, but also cause high-frequency wheel rail contact force and impact force, and further cause damages such as Guidong contact fatigue crack, rail corrugation and the like of wheels or the surface of the rail. Therefore, the detection and analysis of the rail irregularity are the premise and the foundation for reasonably maintaining and repairing the steel rail, controlling the vibration and noise of the wheel rail and prolonging the service life of the steel rail.
In the prior art, the track waveform is usually measured on a single straight line. For example, in the CAT corrugation measuring device in germany, one or more contact acceleration distance sensors are arranged on the same straight line, and the track waveform on the single straight line is obtained through the quadratic integration of the acceleration. If the waveform of a plurality of straight lines on the track is to be measured, a plurality of contact acceleration distance sensors are required to be arranged on each of the plurality of straight lines on the track. However, for a corrugation measuring device, the overall cost is almost doubled by adding one more distance sensor, and the cost of a single corrugation measuring device is very expensive, so that in the rail transportation industry, it is not usually thought to measure the track waveform of a plurality of straight lines on the track. Then, the track waveform on the single straight line cannot reflect the track irregularity on the whole, and therefore, the reliability and the accuracy of reflecting the track irregularity by the track waveform on the single straight line are low.
Disclosure of Invention
In view of this, embodiments of the present application provide a method and an apparatus for determining a track waveform, an electronic device, and a storage medium, so as to solve the problem that the track waveform reflects track irregularity with relatively low reliability and accuracy.
In a first aspect, an embodiment of the present application provides a track waveform determining method, where the method includes:
determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals on the first straight line in the target track section;
measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
according to a set of measured second distances measured by the first distance sensor with the highest ranking of the plurality of first distance sensors, a set of measured second distances measured by the first distance sensor with the lowest ranking of the plurality of first distance sensors, a number of sampling points between the second distance sensor and the first distance sensor with the highest ranking of the plurality of first distance sensors in the track extending direction, the first distance sensor with the highest ranking of the plurality of first distance sensors, a number of sampling points between the first distance sensor with the lowest ranking of the first distance sensor in the track extending direction, a position corresponding to the second distance sensor on the first straight line, the first distance sensor with the highest ranking of the plurality of first distance sensors, and the first distance sensor with the lowest ranking of the plurality of first distance sensors in the first track waveform, determining a set of third distance measured values in the target track section measured according to a preset sampling step length at a position corresponding to the second distance sensor on the first straight line;
according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measured values.
In a second aspect, an embodiment of the present application further provides an orbit waveform determining apparatus, where the apparatus includes:
the first waveform determining unit is used for determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measurement values respectively measured according to a preset sampling step length by a plurality of first distance sensors which are arranged at intervals and correspond to the first straight line in the target track section;
the distance measuring unit is used for measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
a distance determination unit, configured to determine, according to a set of measured second distances measured by first distance sensors ranked most forward among the plurality of first distance sensors, a set of measured second distances measured by first distance sensors ranked most rearward among the plurality of first distance sensors, a number of sampling points between the second distance sensor and the first distance sensor ranked most forward among the plurality of first distance sensors in the track extending direction, a number of sampling points between the first distance sensor ranked most forward among the plurality of first distance sensors, a number of sampling points between the first distance sensor ranked most rearward in the track extending direction, a position corresponding to the second distance sensor on the first straight line, a first distance sensor ranked most forward among the plurality of first distance sensors, and a waveform value of the first distance sensor ranked most rearward among the plurality of first distance sensors in the first track waveform, respectively, determining a set of third distance measured values in the target track section measured according to a preset sampling step length at a position corresponding to the second distance sensor on the first straight line;
a second waveform determining unit for determining a second waveform according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measurements.
In a third aspect, an embodiment of the present application further provides an electronic device, including:
a processor;
a memory for storing the processor-executable instructions;
wherein the processor is configured to execute the instructions to implement the track waveform determining method according to the first aspect of the embodiment of the present application.
In a fourth aspect, the present application further provides a storage medium, where instructions executed by a processor of an electronic device enable the electronic device to perform the track waveform determination method according to the first aspect of the present application.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects: firstly, determining a first track waveform corresponding to a first straight line in the track extension direction through a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals according to the first straight line in a target track section; then, according to a preset setting, a second distance sensor is positioned on a second straight line spaced from the first straight line in the target track sectionSampling step length to measure a group of first distance measured values in the track extending direction; then, based on a set of measured second distances measured by the first distance sensor ranked the most forward of the plurality of first distance sensors, a set of measured second distances measured by the first distance sensor ranked the most backward of the plurality of first distance sensors, a number of sampling points between the second distance sensor and the first distance sensor ranked the most forward of the plurality of first distance sensors in the track extending direction, a number of sampling points between the first distance sensor ranked the most forward of the plurality of first distance sensors and the first distance sensor ranked the most backward in the track extending direction, a position on the first straight line corresponding to the second distance sensor, the first distance sensor ranked the most forward of the plurality of first distance sensors, and a waveform value of the first distance sensor ranked the most backward of the plurality of first distance sensors in the first track waveform, determining a position corresponding to the second distance sensor on the first straight line, and measuring a group of third distance measured values in the target track section according to a preset sampling step length; according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *Is a second orbital waveform, y*Is a first track waveform, SδIs a set of first distance measured values, PδThe first track waveform and the second track waveform reflect the irregularity of the track at different positions, so that the irregularity of the track on the whole can be reflected more accurately and reliably, and the additional cost of equipment is not increased.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a flow chart of a track waveform determination method according to an embodiment of the present application;
fig. 2 is a schematic interaction diagram of a server, a measurement device, and a terminal device according to an embodiment of the present application;
FIG. 3 is a flow chart of a track waveform determination method according to an embodiment of the present application;
fig. 4 is a schematic distribution diagram of the first sensor and the second sensor on the measuring apparatus according to an embodiment of the present application.
FIG. 5 is a flow chart of a method for determining a track waveform according to an embodiment of the present application;
FIG. 6 is a block diagram of functional blocks of an apparatus for determining a track waveform according to an embodiment of the present application;
FIG. 7 is a block diagram of functional blocks of an apparatus for determining a track waveform according to an embodiment of the present application;
FIG. 8 is a block diagram of functional blocks of an apparatus for determining a track waveform according to an embodiment of the present application;
fig. 9 is a circuit connection block diagram of a server according to an embodiment of the present application.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only a few embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Referring to fig. 1, an embodiment of the present application provides an orbit waveform determination method, which is applied to a server 100, where, as shown in fig. 2, the server 100 may be communicatively connected to a measurement device 200 and a terminal device 300 respectively for data interaction. The measuring device 200 may be a device that can move on a rail, such as a measuring carriage on which a plurality of first distance sensors 600 are mounted in a straight line. Specifically, the method comprises the following steps:
s11: according to a plurality of first distance sensors 600 arranged at intervals corresponding to the first straight line 400 located in the target track section, a plurality of groups of combined first chord measurement values respectively measured according to a preset sampling step length are determined, and a first track waveform corresponding to the first straight line 400 in the track extending direction is determined.
Specifically, in a specific measurement, the measuring device 200 may be placed on a rail, and the measuring device 200 may be controlled to move on the rail, so that a plurality of first distance sensors 600 may generate a plurality of sets of combined first chord values according to actual distance values collected by a preset step size and according to collected distance data. It should be noted that the first track waveform is not affected by the posture change of the measurement device 200 when moving on the track.
S12: a set of first distance measured values in the track extending direction is measured according to a predetermined sampling step length based on a second distance sensor 700 located on a second straight line 500 spaced apart from the first straight line 400 in the target track section.
S13: based on a set of second distance measured values measured by the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, a set of second distance measured values measured by the first distance sensor 600 ranked the most rearward among the plurality of first distance sensors 600, the number of sampling points between the second distance sensor 700 and the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600 in the track extending direction, the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, the number of sampling points between the first distance sensor 600 ranked the most rearward in the track extending direction, a position corresponding to the second distance sensor 700 on the first straight line 400, the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, waveform values of the first distance sensor 600 ranked the most rearward among the plurality of first distance sensors 600 in the first track waveform, respectively, a set of third distance measurements in the target track section measured according to a preset sampling step at a position on the first straight line 400 corresponding to the second distance sensor 700 is determined.
S14: according to a calculationFormula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line 500 in the track extension direction, wherein yδ *Is a second orbital waveform, y*Is a first track waveform, SδIs a set of first distance measured values, PδIs a set of third distance measured values.
The measurement result of the separate second sensor may be disturbed by the posture change of the measuring device 200 during the movement on the rail, and the disturbance of the posture change of the measuring device 200 during the movement on the rail is corrected by calculating the distance deviation of the second sensor from the position on the first straight line 400 corresponding to the second distance sensor 700, thereby obtaining a second rail waveform that filters the disturbance of the posture change of the measuring device 200 during the movement on the rail.
The track waveform determining method comprises the steps of firstly, determining a first track waveform corresponding to a first straight line 400 in the track extending direction through a plurality of groups of combined first measured values respectively measured according to preset sampling step lengths according to a plurality of first distance sensors 600 which are arranged at intervals corresponding to the first straight line 400 in a target track section; then, according to a second distance sensor 700 located on a second straight line 500 spaced from the first straight line 400 in the target track section, a set of first distance measured values in the track extending direction is measured according to a preset sampling step length; then, based on a set of second distance measured values measured by the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, a set of second distance measured values measured by the first distance sensor 600 ranked the most backward among the plurality of first distance sensors 600, a number of sampling points between the second distance sensor 700 and the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600 in the track extending direction, the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, a number of sampling points between the first distance sensor 600 ranked the most backward in the track extending direction, a position corresponding to the second distance sensor 700 on the first straight line 400, a position corresponding to the first distance sensor 700 on the first straight line 400, and the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600The device 600, the waveform values of the first distance sensor 600 in the first track waveform of the first distance sensor 600 ranked most back in the plurality of first distance sensors 600, a position corresponding to the second distance sensor 700 on the first straight line 400, and a set of third distance measured values in the target track section measured according to a preset sampling step length; according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line 500 in the track extension direction, wherein yδ *Is a second orbital waveform, y*Is a first track waveform, SδIs a set of first distance measured values, PδThe first track waveform and the second track waveform reflect the irregularity of the track at different positions, so that the irregularity of the track on the whole can be reflected more accurately and reliably, and the additional cost of equipment is not increased. Meanwhile, the measuring equipment 200 does not depend on a mechanical structure, and the transverse position of the mobile sensor does not need to be adjusted, so that the structure is greatly simplified, and the stability is enhanced; and repeated measurement is not needed, so that the labor cost in measurement is greatly saved, and the measurement efficiency is improved.
Specifically, S13 may include: equation of basis
Figure GDA0003688626970000071
A set of third distance measurements in the target track section measured according to the preset sampling step at the position corresponding to the second distance sensor 700 on the first straight line 400 is determined. Wherein, y*[i]Waveform value, y, in the first orbit waveform for a position on the first straight line 400 corresponding to the second distance sensor 700*[i-δ]For the waveform value, y, of the first distance sensor 600 in the first orbit waveform, which is the first distance sensor 600 that is the top-ranked of the plurality of first distance sensors 600*[i+n-δ]The waveform value of the first distance sensor 600 in the first orbit waveform, which is the first distance sensor 600 in the first distance sensor 600 ranked the most back, is delta, which is the waveform value of the second distance sensor 700 and the first distance sensor 600 in the first distance sensor 600 ranked the most front, isThe number of sampling points in the track extending direction, n is the number of sampling points between the first distance sensor 600 with the top in the first order and the first distance sensor 600 with the bottom in the second order among the plurality of first distance sensors 600 in the track extending direction, SFront part(i) Is a set of measured values S of the second distance measured by the first distance sensor 600 with the highest ranking of the plurality of first distance sensors 600Rear end[i]A group of second distance chord values, P, measured for the first distance sensor 600 of the plurality of first distance sensors 600 that is ranked the rearmostδ(i) Is the measured value of the third distance.
Further, according to the formula Pδ(i)＝Sx(i) Wherein S isx(i) A set of measured values of the second distance measured by the first distance sensors 600 ranked as X in the plurality of first distance sensors 600. Wherein x ∈ IvecN-2N-1, where N is the total number of sampling points included in the target track section, and the position of the second distance sensor 700 is the same as the position of the first distance sensor 600 ordered as X on the first straight line 400 in the horizontal direction.
For example, when the number of the first distance sensors 600 is 5, X may be 2, 4, 5, which is not limited herein; when the number of the first distance sensors 600 is 6, X may be 2, 3, 6, which is not limited herein. By making the position of the second distance sensor 700 the same as the coordinates of the positions of the first distance sensors 600 ordered as X on the first straight line 400 in the horizontal direction, the process of calculating the second distance measured value can be realized simply, the calculation resources are saved, and the calculation efficiency is improved.
Specifically, P is exemplified belowδ(i)＝Sx(i) The derivation process of (2):
when X is 4, delta is n4,Pδ＝P4,S4＝S8And when the number of the first sensors is 5, based on the formula
Figure GDA0003688626970000081
Figure GDA0003688626970000091
And a predetermined string value relation
Figure GDA0003688626970000092
It can be derived that,
Figure GDA0003688626970000093
thus, it can be derived that3S1[i]+λ3S5[i]＝h3[i]+S4[i]. Based on the formula
Figure GDA0003688626970000094
Figure GDA0003688626970000095
It can be derived that:
Pδ(i)＝y*[i]+λδy*[i-δ]+λδy*[i+n-δ]+h3[i]+S4[i]then can obtain Pδ[i]＝S4[i]. When X is 3, 5, 6, etc., the derivation process is the same as the above process, and is not limited herein.
Specifically, as shown in fig. 3, S12 may include: according to a second distance sensor 700 respectively corresponding to a plurality of second straight lines 500 spaced from the first straight line 400 in the target track section, a set of first distance measured values respectively corresponding to the plurality of second straight lines 500 in the track extending direction is respectively measured according to a preset sampling step length.
For example, as shown in fig. 4, one second straight line 500 is provided at one side of the first straight line 400, and two second straight lines 500 are provided at the other side of the first straight line 400. The abscissa between the plurality of second distance sensors 700 may be the same or different.
Based on the calculation manner of S13, a set of measured values of the third distance in the target track section, which are measured according to the preset sampling step, determined at the position corresponding to the second distance sensor 700 on each second straight line 500 on the first straight line 400, can be obtained.
Specifically, S14 includes: according to the formula yδ *＝y*+(Sδ-Pδ) Second track waveforms corresponding to the plurality of second straight lines 500 in the track extending direction are determined.
The method further comprises the following steps:
s15: the track surface waveform in the track extending direction is determined from the second track waveforms corresponding to the plurality of second straight lines 500, respectively.
Understandably, the rail surface waveform can reflect the unevenness of the rail on the whole more truly and reliably.
Optionally, the number of the second straight lines 500 is greater than a preset number, the second straight lines 500 are respectively located at two sides of the first straight line 400, and the first straight line 400 and the second straight lines 500 are arranged at equal intervals, and the intervals are smaller than a preset threshold. The preset number may be 4, 5, 6, etc., and is not limited herein. Through the arrangement, the distribution of the second straight line 500 in the target track section has the characteristics of density and uniformity, and the finally obtained track surface waveform can reflect the overall irregularity of the track more truly and reliably.
Alternatively, as shown in fig. 5, S11 may include:
s51: measuring a plurality of groups of combined chord measuring values in the target track section according to a preset sampling step length based on a plurality of first distance sensors 600 and a measuring method of a multi-point and multi-order chord measuring method, wherein the first distance sensors 600 are arranged at intervals corresponding to the first straight line 400 in the target track section; wherein the combined chord value comprises detailed shape information of the measurement object.
Specifically, according to the determined chord measuring order, the measured chord length is subjected to halving treatment to obtain a plurality of halving points; if the number of the target measuring points to be measured is one, determining an optimal unilateral point chord measuring method arrangement mode from multiple arrangement modes of the target measuring point at different equally-divided points; if the number of the target measuring points to be measured is more than one, determining an optimal double-measuring-point chord measuring method arrangement mode by adjusting the position of an added measuring point to be added on the basis of the optimal single-side point chord measuring method arrangement mode; and judging whether the number of target measuring points in the optimal double-measuring-point chord measuring method arrangement mode meets the requirement, if not, continuously obtaining the optimal three-measuring-point chord measuring method arrangement mode by adjusting the position of one added measuring point to be added on the basis of the optimal double-measuring-point chord measuring method arrangement mode until the number of the target measuring points in the current optimal target measuring-point chord measuring method arrangement mode meets the requirement.
S52: based on the measuring process of the multi-measuring-point multi-order chord measuring method and the fact that the multiple groups of combined chord measuring value matrixes are equal to the product of the measuring matrix and a matrix formed by adjacent discretization of the geometrical configuration of the track, a measuring model for measuring the short wave irregularity of the track is established.
The method comprises the following steps of establishing a mathematical expression of the measuring process of a multi-measuring-point multi-order chord measuring method:
Figure GDA0003688626970000111
k＝c1,c2,…,cS(ii) a Wherein c isiIndicating the position of the ith sensor, the k value corresponding to S measurement points, hkChord value, lambda, obtained for the kth measuring point positionkThe proportional value of the sensor arranged at the kth measuring point position is a negative number;
Figure GDA0003688626970000112
is λkIs conjugated with (i) and
Figure GDA0003688626970000113
ykas the value of the track irregularity at position k, y0The value of the track irregularity at the beginning of the chord line, yn+1The track irregularity at the end of the chord line, and n is the order of the multipoint chord measurement method.
And integrating the matrixes of the measured chord value vectors, wherein the integration aims to adopt the matrixes to uniformly describe, and integrates the measured results into a linear equation set so as to facilitate the establishment of a post-processing model. Based on a mathematical expression of a measuring process of a multi-measuring-point multi-order chord measuring method and a product that a plurality of groups of combined chord measuring value matrixes are equal to a measuring matrix and a matrix formed by adjacent discretization of the geometric shape and position of the steel rail, a measuring model is established: h is M.F;
Figure GDA0003688626970000114
Figure GDA0003688626970000115
wherein H represents a combined chord measurement value matrix; m represents a measurement matrix, the first line of M corresponds to the measurement point arrangement information of the 1 st measurement point, wherein the c1+1 th element is 1, the second line corresponds to the information of the second measurement point, wherein the c2+1 th element is 1, and the values of the 3 rd line elements are the same; the F matrix is a matrix formed by measurement objects y and has the following structure:
Figure GDA0003688626970000116
the matrix f (y) is a combination of the measurement objects y, the number of independent unknowns of the matrix is only size (y), and size (y) is the length of the vector y.
S53: and reconstructing a least square optimization model comprising the target orbit geometric form and position corresponding to the measurement model based on the principle that the error of the optimal target orbit geometric form and position and the measured multiple groups of combined measured values is minimum.
And constructing a least square optimization model comprising the optimal orbit geometric configuration y based on the principle that the error between the optimal orbit geometric configuration y and the measured combined chord measurement value H is minimum. The least squares optimization model can be described simply as finding an optimal orbit geometry y such that its error with the measured combined chord value H is minimal, i.e.:
Figure GDA0003688626970000121
the optimization model of the above formula implies partial constraint, namely, the matrix F (y) is coupled, and the optimization solution needs to decouple the matrix F (y) first; wherein, M represents a measuring matrix, the matrix F (y) represents the combination of the measuring objects y, H represents a chord measuring value matrix, which is a matrix formed by the readings of a plurality of measuring point sensors, each row corresponds to the reading of one sensor along the mileage direction, and each column corresponds to the reading of all the sensors after a certain movement.
S54: and performing inversion solving on the least square optimization model, and determining a first orbit waveform corresponding to the first straight line 400 in the orbit extending direction.
The least square optimization model belongs to a convex optimization problem with constraint, but the constraint is hidden in an objective function, so that the direct solution is inconvenient, and the matrix F (y) is decoupled firstly.
Therefore, in the embodiment of the present application, the measurement matrix M is divided into rows, and the matrix a is defined based on the split measurement matrix Mk(k＝c1,c2,…,cS)：
Figure GDA0003688626970000122
Splitting chord value matrix H according to rows and defining vector H based on the split chord value matrix Hk(k＝c1,c2,…,cS)：
hk＝{hk,1 hk,2 … hk,N-n-1 hk,N-n}T；k＝i,j；
The following two independent systems of linear equations can thus be obtained:
Ak·y＝hk；k＝c1,c2,…,cS；
the least squares optimization model can be converted into:
Figure GDA0003688626970000131
where E represents the total residual value objective function, the optimization objective is to minimize it, U represents the relative error vector, Ai(i ═ c1, …, cs) denotes a temporary matrix generated from the ith row of the measurement matrix M, hc1Represents the transpose of the c1 th row vector (as a column vector) of the chord value matrix H.
Figure GDA0003688626970000132
The least square optimization model belongs to a typical convex optimization model, and the least square solution is equivalent to solving the following linear equation set:
Figure GDA0003688626970000133
wherein the subscript k is a cyclic variable, i.e. AkDenotes the kth Ai(i＝c1,…,cs)，hkIs the kth hc1。
Wherein, y*And the optimal solution of the measuring object, namely the rail irregularity measuring result.
At a single station, the optimization model can be described simply as:
Figure GDA0003688626970000134
corresponding, single-point time least-squares solution y*This is achieved by solving the following system of linear equations: a. thei TAi·y*＝Ai Thi. Wherein, y is, AiRepresenting a temporary matrix generated from the ith row of the measurement matrix M, Ai TIs AiTranspose of hkDenotes the kthc1，Ak TIs shown as AkTranspose of (a), y*And the optimal solution of the measuring object, namely the rail irregularity measuring result.
Optionally, the method further comprises: and issuing a second track waveform corresponding to the second straight line 500 in the track extending direction to the terminal device 300 for display.
Referring to fig. 6, an orbit waveform determining apparatus 600 is further provided in the embodiment of the present application, and is applied to the server 100, where, as shown in fig. 2, the server 100 may be communicatively connected to the measuring device 200 and the terminal device 300 respectively for data interaction. The measuring device 200 may be a device that can move on a rail, such as a measuring carriage, on which a plurality of first distance sensors 600 are mounted in a straight line. It should be noted that the track waveform determining apparatus 600 provided in the embodiment of the present application has the same basic principle and technical effect as those of the above embodiments, and for the sake of brief description, reference may be made to the corresponding contents in the above embodiments for the part of the embodiment of the present application that is not mentioned. The apparatus 600 comprises a first waveform determining unit 601, a distance measuring unit 602, a distance determining unit 603, a second waveform determining unit 604, wherein,
the first waveform determining unit 601 is configured to determine a first track waveform corresponding to the first straight line 400 in the track extending direction according to a plurality of sets of combined first measured values respectively measured according to a preset sampling step size by the plurality of first distance sensors 600 disposed at intervals corresponding to the first straight line 400 located in the target track section.
A distance measuring unit 602, configured to measure a set of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor 700 located on a second straight line 500 spaced apart from the first straight line 400 in the target track section.
A distance determination unit 603 configured to determine, based on a set of measured second distance values measured by the first distance sensor 600 ranked the forefront among the plurality of first distance sensors 600, a set of measured second distance values measured by the first distance sensor 600 ranked the rearmost among the plurality of first distance sensors 600, a number of sampling points between the second distance sensor 700 and the forefront among the plurality of first distance sensors 600 in the track extending direction, a number of sampling points between the first distance sensor 600 ranked the forefront among the plurality of first distance sensors 600, a number of sampling points between the rearmost first distance sensor 600 ranked in the track extending direction, a position corresponding to the second distance sensor 700 on the first straight line 400, the forefront among the plurality of first distance sensors 600, waveform values of the rearmost first distance sensor 600 ranked among the plurality of first distance sensors 600 in the first track waveform, respectively, determining a set of third distance measurements in the target track section at a predetermined sampling step corresponding to the second distance sensor 700 at the position on the first straight line 400
A second waveform determining unit 604 for determining the second waveform according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line 500 in the track extension direction, wherein yδ *Is a second orbital waveform, y*Is a first track waveform, SδIs a set of first distance measured values, PδIs a set of third distance measured values.
The track waveform determining apparatus 600 may perform the following functions when executed: firstly, determining a first track waveform corresponding to a first straight line 400 in the track extending direction through a plurality of groups of combined first chord measurement values respectively measured according to a preset sampling step length by a plurality of first distance sensors 600 correspondingly arranged at intervals according to the first straight line 400 positioned in a target track section; then, according to a second distance sensor 700 located on a second straight line 500 spaced from the first straight line 400 in the target track section, a set of first distance measured values in the track extending direction is measured according to a preset sampling step length; then, based on a set of measured second distances measured by the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, a set of measured second distances measured by the first distance sensor 600 ranked the most rearward among the plurality of first distance sensors 600, the number of sampling points between the second distance sensor 700 and the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600 in the track extending direction, the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, the number of sampling points between the first distance sensor 600 ranked the most rearward in the track extending direction, a position corresponding to the second distance sensor 700 on the first straight line 400, the first distance sensor 600 ranked the most forward among the plurality of first distance sensors 600, waveform values of the first distance sensor 600 ranked the most rearward among the plurality of first distance sensors 600 in the first track waveform respectively, determining a set of third distance measurements in the target track section at a predetermined sampling step corresponding to the second distance sensor 700 at the position on the first straight line 400(ii) a According to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line 500 in the track extension direction, wherein yδ *Is a second orbital waveform, y*Is a first track waveform, SδIs a set of first distance measured values, PδThe first track waveform and the second track waveform reflect the irregularity of the track at different positions, so that the overall irregularity of the track can be reflected more accurately and reliably, and the additional cost of equipment cost is not increased. Meanwhile, the measuring equipment 200 does not depend on a mechanical structure, and the transverse position of the mobile sensor does not need to be adjusted, so that the structure is greatly simplified, and the stability is enhanced; and repeated measurement is not needed, so that the labor cost in measurement is greatly saved, and the measurement efficiency is improved.
Optionally, the distance determination unit 603 is specifically configured to calculate a distance according to the formula
Figure GDA0003688626970000161
Determining a set of third distance measured values in the target track section at a predetermined sampling step length at a position corresponding to the second distance sensor 700 on the first straight line 400, wherein y*[i]A waveform value y in the first track waveform for a position on the first straight line 400 corresponding to the second distance sensor 700*[i-δ]A waveform value, y, of the first distance sensor 600 in the first orbit waveform for the first distance sensor 600 that is the most front-ranked of the plurality of first distance sensors 600*[i+n-δ]The waveform value of the first distance sensor 600 in the first orbit waveform, which is the first distance sensor 600 in the first distance sensor 600 ranked furthest back, δ is the number of sampling points between the second distance sensor 700 and the first distance sensor 600 in the first distance sensor 600 ranked furthest front in the orbit extension direction, n is the number of sampling points between the first distance sensor 600 in the first distance sensor 600 ranked furthest front and the first distance sensor 600 ranked furthest back in the orbit extension direction, SFront side(i) Is a set of measured values S of the second distance measured by the first distance sensor 600 with the highest ranking of the plurality of first distance sensors 600Rear end[i]A set of second distance chord values, P, measured for the first distance sensor 600 of the plurality of first distance sensors 600 that is ranked furthest backδ(i) Is the measured value of the third distance.
Optionally, the distance determining unit 603 is specifically configured to determine the distance according to equation Pδ(i)＝Sx(i) Wherein S isx(i) A set of measured second distances for the first distance sensors 600 ordered as X of the plurality of first distance sensors 600, wherein X ∈ Ivec，IvecN-2N-1, where N is the total number of sampling points included in the target track section, and the position of the second distance sensor 700 is the same as the position of the first distance sensor 600 ordered as X on the first straight line 400 in the horizontal direction.
Optionally, the distance measuring unit 602 is specifically configured to measure, according to a preset sampling step, a set of first distance measured values respectively corresponding to a plurality of second straight lines 500 located in the target track section and spaced from the first straight line 400, according to one second distance sensor 700 respectively corresponding to the plurality of second straight lines 500;
the second waveform determining unit 604 is specifically configured to determine the waveform according to the equation yδ *＝y*+(Sδ-Pδ) Determining second track waveforms corresponding to the second straight lines 500 in the track extending direction;
as shown in fig. 7, the apparatus 600 further comprises:
a track surface waveform generating unit 605, configured to determine a track surface waveform in the track extending direction according to the second track waveforms corresponding to the second straight lines 500.
As shown in fig. 8, the first waveform determining unit 601 includes:
the information measurement module 701 is used for measuring a plurality of groups of combined chord measuring values in a target track section according to a preset sampling step length based on a plurality of first distance sensors 600 and a measuring method of a multi-point and multi-order chord measuring method, wherein the first distance sensors 600 are arranged at intervals corresponding to a first straight line 400 in the target track section; wherein the combined chord value comprises detailed shape information of the measurement object.
The model establishing module 702 is configured to establish a measurement model for measuring short-wave irregularity of the track based on a measurement process of a multi-point and multi-order chord measurement method and a condition that a plurality of groups of combined chord measurement value matrixes are equal to a product of a measurement matrix and a matrix formed by adjacent discretization of geometrical configuration and position of the track.
A model reconstructing module 703, configured to reconstruct a least square optimization model corresponding to the measurement model and including the target orbit geometric form and position based on a principle that an error between the optimal target orbit geometric form and the measured multiple groups of combined measured values is minimum.
A waveform determining module 704, configured to perform an inversion solution on the least square optimization model, and determine a first orbit waveform corresponding to the first straight line 400 in the orbit extending direction.
The foregoing description has been directed to specific embodiments of this disclosure. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
Fig. 9 is a schematic structural diagram of an electronic device according to an embodiment of the present application. Referring to fig. 9, at a hardware level, the electronic device includes a processor, and optionally further includes an internal bus, a network interface, and a memory. The Memory may include a Memory, such as a Random-Access Memory (RAM), and may further include a non-volatile Memory, such as at least 1 disk Memory. Of course, the electronic device may also include hardware required for other services.
The processor, the network interface, and the memory may be connected to each other by an internal bus, which may be an ISA (Industry Standard Architecture) bus, a PCI (Peripheral Component Interconnect) bus, an EISA (Extended Industry Standard Architecture) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one double-headed arrow is shown in FIG. 9, but this does not indicate only one bus or one type of bus.
And the memory is used for storing programs. In particular, the program may include program code comprising computer operating instructions. The memory may include both memory and non-volatile storage and provides instructions and data to the processor.
The processor reads a corresponding computer program from the non-volatile memory into the memory and then runs to form the track waveform determination device on a logical level. The processor is used for executing the program stored in the memory and is specifically used for executing the following operations:
determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals on the first straight line in the target track section;
measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
according to a set of measured second distances measured by the first distance sensor ranked the most forward among the plurality of first distance sensors, a set of measured second distances measured by the first distance sensor ranked the most backward among the plurality of first distance sensors, a number of sampling points between the second distance sensor and the first distance sensor ranked the most forward among the plurality of first distance sensors in the track extending direction, a number of sampling points between the first distance sensor ranked the most forward among the plurality of first distance sensors and the first distance sensor ranked the most backward in the track extending direction, a position corresponding to the second distance sensor on the first straight line, a first distance sensor ranked the most forward among the plurality of first distance sensors, and a waveform value of the first distance sensor ranked the most backward among the plurality of first distance sensors in the first track waveform, respectively, determining a set of third distance measured values in the target track section measured according to a preset sampling step length at a position corresponding to the second distance sensor on the first straight line;
according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measured values.
The method performed by the track waveform determining apparatus disclosed in the embodiment of fig. 1 of the present application may be applied to or implemented by a processor. The processor may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in a processor or instructions in the form of software. The Processor may be a general-purpose Processor, including a Central Processing Unit (CPU), a Network Processor (NP), and the like; but also Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components. The various methods, steps, and logic blocks disclosed in the embodiments of the present application may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present application may be directly implemented by a hardware decoding processor, or implemented by a combination of hardware and software modules in the decoding processor. The software module may be located in ram, flash memory, rom, prom, or eprom, registers, etc. storage media as is well known in the art. The storage medium is located in a memory, and a processor reads information in the memory and completes the steps of the method in combination with hardware of the processor.
The electronic device may also execute the method of fig. 1 and implement the functions of the track waveform determining apparatus in the embodiment shown in fig. 1, which are not described herein again in this embodiment of the present application.
Of course, besides the software implementation, the electronic device of the present application does not exclude other implementations, such as a logic device or a combination of software and hardware, and the like, that is, the execution subject of the following processing flow is not limited to each logic unit, and may also be hardware or a logic device.
Embodiments of the present application further propose a computer-readable storage medium storing one or more programs, the one or more programs comprising instructions, which when executed by a portable electronic device comprising a plurality of application programs, enable the portable electronic device to perform the method of the embodiment shown in fig. 1, and in particular to perform the following operations:
determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals on the first straight line in the target track section;
measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
according to a set of measured second distances measured by the first distance sensor with the highest ranking of the plurality of first distance sensors, a set of measured second distances measured by the first distance sensor with the lowest ranking of the plurality of first distance sensors, a number of sampling points between the second distance sensor and the first distance sensor with the highest ranking of the plurality of first distance sensors in the track extending direction, the first distance sensor with the highest ranking of the plurality of first distance sensors, a number of sampling points between the first distance sensor with the lowest ranking of the first distance sensor in the track extending direction, a position corresponding to the second distance sensor on the first straight line, the first distance sensor with the highest ranking of the plurality of first distance sensors, and the first distance sensor with the lowest ranking of the plurality of first distance sensors in the first track waveform, determining a set of third distance measured values in the target track section measured according to a preset sampling step length at a position corresponding to the second distance sensor on the first straight line;
according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measured values.
In short, the above description is only a preferred embodiment of the present application, and is not intended to limit the scope of the present application. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
Computer-readable media, including both permanent and non-permanent, removable and non-removable media, may implement the information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Disks (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, as for the system embodiment, since it is substantially similar to the method embodiment, the description is relatively simple, and reference may be made to the partial description of the method embodiment for relevant points.

Claims (9)

1. A method for determining a track waveform, the method comprising:
determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measuring values respectively measured according to a preset sampling step length by a plurality of first distance sensors correspondingly arranged at intervals on the first straight line in the target track section;
measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
equation of basis
Figure FDA0003688626960000011
Determining a set of third distance measured values in the target track section measured according to a preset sampling step length at the position corresponding to the second distance sensor on the first line, wherein y*[i]A waveform value, y, in the first orbit waveform for a position on the first line corresponding to the second distance sensor*[i-δ]A waveform value, y, in the first orbit waveform for a first distance sensor in the plurality of first distance sensors that is ranked furthest forward*[i+n-δ]The waveform value of a first distance sensor which is ranked most backwards in the plurality of first distance sensors in the first track waveform is delta, the number of sampling points between a second distance sensor and a first distance sensor which is ranked most forwards in the plurality of first distance sensors in the track extending direction is delta, the number of sampling points between a first distance sensor which is ranked most forwards in the plurality of first distance sensors and a first distance sensor which is ranked most backwards in the track extending direction is n, and SFront side(i) A set of measured values S of the second distance measured by the first distance sensor with the highest ranking of the plurality of first distance sensorsRear end[i]A set of second distance chord values, P, measured for the first distance sensor of the plurality of first distance sensors that is ranked the most backδ(i) The third distance measured value is obtained;
according to the formula yδ *＝y*+(Sδ-Pδ) Determining the first in the track extension directionA second track waveform corresponding to two straight lines, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measured values.
2. The method of claim 1, wherein P isδ(i)＝Sx(i) Wherein S isx(i) A set of measured second distances for the first distance sensors ordered as X among the plurality of first distance sensors, wherein X ∈ IvecAnd iv, (0, 1...., N-2N-1), where N is the total number of sampling points included on a first straight line in the target track section, and the position of the second distance sensor is the same as the position of the first distance sensor ordered as X on the first straight line in the horizontal direction.
3. The method according to claim 1, wherein said measuring a set of first distance measurements in a track extension direction according to a preset sampling step size from a second distance sensor located on a second line spaced apart from said first line in the target track section comprises: respectively measuring a group of first distance measured values respectively corresponding to a plurality of second straight lines in the track extending direction according to a preset sampling step length according to a second distance sensor respectively corresponding to a plurality of second straight lines which are positioned in a target track section and are arranged at intervals with the first straight lines;
the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extending direction includes: according to the formula yδ *＝y*+(Sδ-Pδ) Determining second track waveforms respectively corresponding to the second straight lines in the track extending direction;
the method further comprises the following steps: and determining the rail surface waveform in the rail extending direction according to the second rail waveforms respectively corresponding to the second straight lines.
4. The method according to claim 3, wherein the number of the second straight lines is greater than a predetermined number, the second straight lines are respectively located at two sides of the first straight line, and the first straight line and the second straight lines are arranged at equal intervals, and the intervals are smaller than a predetermined threshold.
5. The method according to claim 1, wherein the determining the first track waveform corresponding to the first straight line in the track extending direction according to the plurality of sets of combined first measured values measured according to the preset sampling step length respectively by the plurality of first distance sensors correspondingly spaced from the first straight line located in the target track section comprises:
measuring a plurality of groups of combined chord measuring values in the target track section according to a preset sampling step length based on a measuring method of a plurality of first distance sensors and a multi-point multi-order chord measuring method, wherein the first straight lines in the target track section are correspondingly arranged at intervals; wherein the combined chord measurement value comprises detailed shape information of the measurement object;
establishing a measurement model for measuring the short wave irregularity of the track based on the measurement process of a multi-measuring-point multi-order chord measuring method and the condition that a plurality of groups of combined chord measuring value matrixes are equal to the product of a measurement matrix and a matrix formed by adjacent discretization of the geometrical shape and position of the track;
reconstructing a least square optimization model corresponding to the measurement model and comprising the target orbit geometric form and position based on the principle that the error of the optimal target orbit geometric form and position and the measured multiple groups of combined measured values is minimum;
and carrying out inversion solving on the least square optimization model, and determining a first track waveform corresponding to a first straight line in the track extending direction.
6. The method of claim 1, further comprising:
and issuing a second track waveform corresponding to a second straight line in the track extending direction to terminal equipment for display.
7. An orbit waveform determination apparatus, comprising:
the first waveform determining unit is used for determining a first track waveform corresponding to a first straight line in the track extending direction according to a plurality of groups of combined first chord measurement values respectively measured according to a preset sampling step length by a plurality of first distance sensors which are arranged at intervals and correspond to the first straight line in the target track section;
the distance measuring unit is used for measuring a group of first distance measured values in the track extending direction according to a preset sampling step length according to a second distance sensor positioned on a second straight line which is arranged in the target track section at an interval with the first straight line;
a distance determination unit for determining the distance based on the equation
Figure FDA0003688626960000031
Determining a set of third distance measured values in the target track section measured according to a preset sampling step length at the position corresponding to the second distance sensor on the first line, wherein y*[i]Waveform value, y, in the first track waveform for a position on the first line corresponding to the second distance sensor*[i-δ]A waveform value, y, in the first orbit waveform for a first distance sensor in the plurality of first distance sensors that is ranked furthest forward*[i+n-δ]The waveform value of a first distance sensor which is ranked most backwards in the plurality of first distance sensors in the first track waveform is delta, the number of sampling points between a second distance sensor and a first distance sensor which is ranked most forwards in the plurality of first distance sensors in the track extending direction is delta, the number of sampling points between a first distance sensor which is ranked most forwards in the plurality of first distance sensors and a first distance sensor which is ranked most backwards in the track extending direction is n, and SFront part(i) A set of measured values S of a second distance measured by a first distance sensor ranked the top among the plurality of first distance sensorsRear end[i]Is a stand forA group of second distance chord values, P, measured by the first distance sensor in the plurality of first distance sensors that is ranked the lastδ(i) Is the measured value of the third distance;
a second waveform determining unit for determining a second waveform according to the formula yδ *＝y*+(Sδ-Pδ) Determining a second track waveform corresponding to a second straight line in the track extension direction, wherein yδ *For said second orbital waveform, y*For said first orbital waveform, SδIs a set of said first distance measurements, PδIs a set of said third distance measurements.
8. An electronic device, comprising:
a processor;
a memory for storing the processor-executable instructions;
wherein the processor is configured to execute the instructions to implement the orbit waveform determination method of any of claims 1-6.
9. A storage medium in which instructions, when executed by a processor of an electronic device, enable the electronic device to perform the track waveform determination method of any one of claims 1 to 6.
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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115388815B (en) * 2022-07-08 2024-04-02 西南交通大学 Method and device for measuring irregularity of track functional part of magnetic suspension system in static mode
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1104339A (en) * 1978-12-01 1981-07-07 Canron Corp. Railroad track monitoring and adjusting device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1324073A (en) * 1969-09-16 1973-07-18 Plasser Bahnbaumasch Franz Apparatus for measuring railway track parameters
JP2001317930A (en) * 2000-05-11 2001-11-16 Jr East Japan Information Systems Co Track maintenance system and rail shaving and correcting system
CN102221354B (en) * 2011-04-02 2013-01-09 中南大学 Method for measuring surface harshness of multi-measuring-point floating positioning
JP2014240262A (en) * 2013-06-12 2014-12-25 株式会社東芝 Track inspection apparatus
CN105083320B (en) * 2015-05-15 2018-07-27 西南交通大学 The detection method and device of rail smooth state
CN104947555A (en) * 2015-07-01 2015-09-30 中国神华能源股份有限公司 Track irregularity detection method and system based on four-point chord measuring method
CN106080658B (en) * 2016-07-13 2018-04-17 同济大学 A kind of medium-and low-speed maglev track irregularity detection method based on four sensors
JP2019015552A (en) * 2017-07-05 2019-01-31 東日本旅客鉄道株式会社 Rail wavy wear measurement device
CN107843219A (en) * 2017-10-26 2018-03-27 西南交通大学 Track geometry irregularities measurement apparatus and method
CN108725511B (en) * 2018-06-06 2019-12-20 湖南大学 Real-time position correction method for rail corrugation measuring point
CN110029544B (en) * 2019-06-03 2020-07-24 西南交通大学 Method and device for measuring track irregularity
CN111307078A (en) * 2020-02-21 2020-06-19 暨南大学 Track irregularity detection method and system based on four-point chord measurement method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1104339A (en) * 1978-12-01 1981-07-07 Canron Corp. Railroad track monitoring and adjusting device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
基于组合弦测的钢轨波磨广域测量方法;魏珲等;《西北大学学报(自然科学版)》;20180425(第02期);第199-208页 *
运营期高速铁路轨道长波不平顺静态测量方法及控制标准;杨飞等;《中国铁道科学》;20200515(第03期);第41-49页 *

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