CN112023988B - Constant temperature test box of electronic product - Google Patents
Constant temperature test box of electronic product Download PDFInfo
- Publication number
- CN112023988B CN112023988B CN202010928163.1A CN202010928163A CN112023988B CN 112023988 B CN112023988 B CN 112023988B CN 202010928163 A CN202010928163 A CN 202010928163A CN 112023988 B CN112023988 B CN 112023988B
- Authority
- CN
- China
- Prior art keywords
- box unit
- air outlet
- opening
- air inlet
- air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L1/00—Enclosures; Chambers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L7/00—Heating or cooling apparatus; Heat insulating devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
Abstract
The application discloses a constant temperature test box of an electronic product, which comprises an inner box unit and an outer box unit sleeved outside, wherein an air inlet channel and an air outlet channel which are mutually independent are communicated between the inner box unit and the outer box unit; in addition, a return channel is communicated between the air outlet channel and the inner box unit; therefore, heat generated by the electronic equipment during testing can be discharged out of the outer box unit from the air outlet channel on one hand, and on the other hand, the heat can flow back to the inner box unit through the backflow channel so as to heat the electronic equipment; the technical problems that temperature drift is caused by the fact that heat generated by the electronic equipment is accumulated in the constant-temperature testing box continuously and testing accuracy is affected are solved, the technical effect of improving the constant-temperature testing accuracy of the electronic equipment is achieved, and energy can be saved.
Description
Technical Field
The invention relates to the technical field of testing devices, in particular to a constant-temperature testing box for electronic products.
Background
For electronic equipment, due to different specific use environments, especially different temperatures in the environments, performance tests and the like of the electronic equipment in constant temperature environments with different temperatures are generally required before use, so that the electronic equipment can normally work in different temperature environments.
Performance test under the above-mentioned different temperatures need be gone on in the constant temperature test box usually, and current constant temperature test box is mostly the box structure as an organic whole of collection refrigeration module and heating module, then builds the environment of different target temperature in the box respectively through refrigeration module or heating module to accomplish the performance test of product under the different target temperature.
However, it is found that the actual temperature of the constant temperature testing box may generate a temperature drift compared with the set target temperature, which brings an error to the constant temperature testing of the electronic device and seriously affects the accuracy of the constant temperature testing.
Disclosure of Invention
In order to solve at least one of the above problems, an embodiment of the present application provides a constant temperature testing box for an electronic product, where the constant temperature testing box includes an inner box unit and an outer box unit that is externally sleeved, where an air inlet channel and an air outlet channel that are independent of each other are communicated between the inner box unit and the outer box unit, then an electronic device is placed inside the inner box unit, and a fan air outlet of the electronic device is communicated with the air outlet channel; in addition, a return channel is communicated between the air outlet channel and the inner box unit; therefore, heat generated by the electronic equipment during testing can be discharged out of the outer box unit from the air outlet channel on one hand, and on the other hand, the heat can flow back to the inner box unit through the backflow channel so as to heat the electronic equipment;
that is to say, in this embodiment, by providing the independent air inlet channel, the independent air outlet channel, and the independent return channel between the inner box unit and the outer box unit, an airflow circulation is established between an external environment outside the outer box unit and an internal environment of the inner box unit, and on one hand, the airflow circulation can discharge part of heat generated by the electronic device out of the constant temperature test box through the air outlet channel in time, so as to avoid temperature drift caused by the heat; on the other hand, especially when the electronic equipment is high-calorific-value electronic equipment, partial heat generated by the electronic equipment can be returned to the inner box unit, so that the internal environment of the inner box unit is heated, and energy is saved; therefore, the technical problems that the temperature drifts and the test accuracy is influenced due to the fact that heat generated by the electronic equipment is accumulated in the constant-temperature test box continuously are solved, the technical effect of improving the constant-temperature test accuracy of the electronic equipment is achieved, and energy can be saved.
The embodiment of the application provides a constant temperature test box of electronic product, includes:
an inner box unit;
the outer box unit is sleeved outside the inner box unit,
the air outlet channel is arranged between the inner box unit and the outer box unit and is communicated with the inner box unit and the outer box unit;
the air inlet channel is arranged between the inner box unit and the outer box unit and is communicated with the inner box unit and the outer box unit;
the electronic equipment is arranged in the inner box unit, and a fan air outlet of the electronic equipment is communicated with the air outlet channel so that heat generated by the electronic equipment is exhausted out of the outer box unit through the air outlet channel; and the number of the first and second electrodes,
and a backflow channel is arranged between the air outlet channel and the inner box unit and is communicated with the air outlet channel and the inner box unit so that the heat flows back to the inner box unit from the air outlet channel through the backflow channel.
In the embodiment of the present disclosure, the inner box unit is provided with a first air outlet opening, a first air inlet opening and a first return opening, and the outer box unit is provided with a second air outlet opening and a second air inlet opening;
the air outlet channel is formed between the first air outlet opening and the second air outlet opening; the air inlet channel is formed between the first air inlet opening and the second air inlet opening; the first backflow opening and the air outlet channel form the backflow channel.
In the embodiment of the present disclosure, the first air outlet opening and the first air inlet opening are respectively disposed on a first side wall and a second side wall of the inner box unit, and the first side wall and the second side wall are oppositely disposed along a first direction; the second air outlet opening and the second air inlet opening are formed in a third side wall, close to the second side wall, of the outer box unit;
the inner box unit and the outer box unit are attached along a second direction perpendicular to the first direction; and a blocking plate is arranged between the inner box unit and the outer box unit and used for blocking the space between the inner box unit and the outer box unit from the air outlet channel and the air inlet channel.
In the embodiment of the disclosure, the first air inlet opening and the second air inlet opening are communicated in a closed manner through an air inlet pipeline; the baffle plate is provided with a second backflow opening, and the second backflow opening is communicated with the first backflow opening in a closed mode through a backflow pipeline.
In the embodiment of the present disclosure, the first air inlet opening and the second air inlet opening are communicated in a closed manner through an air inlet pipeline, and the air inlet pipeline is arranged between the inner box unit and the outer box unit; alternatively, the first and second electrodes may be,
the first air outlet opening and the second air outlet opening are communicated in a closed mode through an air outlet pipeline, and the air outlet pipeline is arranged between the inner box unit and the outer box unit; alternatively, the first and second electrodes may be,
the first air inlet opening and the second air inlet opening are communicated in a closed mode through the air inlet pipeline, the first air outlet opening and the second air outlet opening are communicated in a closed mode through the air outlet pipeline, and the air inlet pipeline and the air outlet pipeline are arranged between the inner box unit and the outer box unit respectively;
so that the air outlet channel is formed between the first air outlet opening and the second air outlet opening, and the air inlet channel is formed between the first air inlet opening and the second air inlet opening.
In the embodiment of the present disclosure, the second air inlet opening is provided with a first adjusting plate, the second air outlet opening is provided with a second adjusting plate, and the second backflow opening is provided with a third adjusting plate.
In the embodiment of the disclosure, a refrigeration module is further arranged between the inner box unit and the outer box unit, the inner box unit is provided with a cold air opening, and a cold air channel is formed between an air outlet of the refrigeration module and the cold air opening.
In the embodiment of the disclosure, the air outlet of the refrigeration module is communicated with the cold air opening in a closed manner through the cold air pipeline, so that the air outlet of the refrigeration module and the cold air opening form the cold air channel therebetween.
In the embodiment of the present disclosure, a heating module is disposed inside the inner box unit.
In the embodiment of the present disclosure, the constant temperature test box further includes a thermocouple, and the thermocouple is disposed at one end of the electronic device, which is far away from the first air outlet opening.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
in the embodiment of the application, the constant temperature test box comprises an inner box unit and an outer box unit sleeved outside, wherein an air inlet channel and an air outlet channel which are mutually independent are communicated between the inner box unit and the outer box unit; in addition, a return channel is communicated between the air outlet channel and the inner box unit; therefore, heat generated by the electronic equipment during testing can be discharged out of the outer box unit from the air outlet channel on one hand, and on the other hand, the heat can flow back to the inner box unit through the backflow channel so as to heat the electronic equipment;
that is to say, in this embodiment, by providing the independent air inlet channel, the independent air outlet channel, and the independent return channel between the inner box unit and the outer box unit, an airflow circulation is established between an external environment outside the outer box unit and an internal environment of the inner box unit, and on one hand, the airflow circulation can discharge part of heat generated by the electronic device out of the constant temperature test box through the air outlet channel in time, so as to avoid temperature drift caused by the heat; on the other hand, especially when the electronic equipment is high-calorific-value electronic equipment, partial heat generated by the electronic equipment can be returned to the inner box unit, so that the internal environment of the inner box unit is heated, and energy is saved; therefore, the technical problems that the temperature drifts and the test accuracy is influenced due to the fact that heat generated by the electronic equipment is accumulated in the constant-temperature test box continuously are solved, the technical effect of improving the constant-temperature test accuracy of the electronic equipment is achieved, and energy can be saved.
Drawings
Fig. 1 is a schematic structural diagram of the constant temperature test box in the embodiment of the present application.
Fig. 2 is a schematic view showing the structure of the circulation of the air flow in fig. 1.
Fig. 3 is a side view of the structure of fig. 1.
Reference numerals
10-inner box unit, 11-first air outlet opening, 12-first air inlet opening, 13-first return opening, 14-cold air opening,
20-outer box unit, 21-second air outlet opening, 22-second air inlet opening,
30-the electronic device,
41-air outlet channel, 42-air inlet channel, 43-reflux channel and 44-cold air channel.
52-an air inlet pipeline, 53-a return pipeline, 54-a cold air pipeline,
61-a first regulating plate, 62-a second regulating plate, 63-a third regulating plate,
70-a refrigeration module, wherein the refrigeration module is provided with a refrigerating unit,
80-a heating module, wherein the heating module is arranged on the shell,
90-baffle plate, 91-second return opening.
Detailed Description
In order to better understand the technical solution, the technical solution will be described in detail with reference to the drawings and the specific embodiments.
The inventor of the present application finds that in the conventional scheme, the temperature drift generated by the actual temperature of the constant temperature test box compared with the set target temperature is caused by heat generated by the electronic equipment during the test, and the heat is continuously accumulated in the constant temperature test box. Therefore, how to remove the heat and even utilize the heat is the problem to be solved.
The embodiment of the application provides a constant temperature test box of an electronic product, which comprises an inner box unit 10, an outer box unit 20, an air outlet channel 41 and an air inlet channel 42; wherein, the outer box unit 20 is sleeved outside the inner box unit 10, then the air outlet channel 41 is arranged between the inner box unit 10 and the outer box unit 20, and the air outlet channel 41 is communicated with the inner box unit 10 and the outer box unit 20; the air inlet channel 42 is arranged between the inner box unit 10 and the outer box unit 20, and the air inlet channel 42 is communicated with the inner box unit 10 and the outer box unit 20; then, the electronic device 30 is placed in the inner box unit 10, and an air outlet of a fan of the electronic device 30 is communicated with the air outlet channel 41, so that heat generated by the electronic device 30 is exhausted from the outer box unit 20 through the air outlet channel 41; a return duct 43 is provided between the outlet duct 41 and the inner box unit 10, and the return duct 43 communicates the outlet duct 41 and the inner box unit 10 to return the heat from the outlet duct 41 to the inner box unit 10 through the return duct 43.
Referring to fig. 1 to 3, the inner box unit and the outer box unit may be, for example, cuboids, the inner box unit is sleeved in the outer box unit, and an independent air inlet channel and an independent air outlet channel are arranged between the inner box unit and the outer box unit; thus, it will be appreciated that an airflow circuit is established between the internal environment of the inner box unit and the external environment of the outer box unit; that is, the air flow of the external environment can enter the inner box unit through the air inlet channel, and then the air flow of the internal environment of the inner box unit can be discharged out of the outer box unit through the air outlet channel; then, the electronic equipment is arranged in the inner box unit, and the fan air outlet of the electronic equipment is communicated with the air outlet channel, so that the circulating air flow can flow through the electronic equipment, heat generated by the electronic equipment can be discharged out of the outer box unit through the air outlet channel along with the circulating air flow, the heat accumulation in the inner box unit is avoided, and the temperature drift is further avoided.
In addition, in this embodiment, still communicate between air-out passageway and inner box unit and have the return flow channel, namely, the partial heat that electronic equipment produced still can make a contribution to keeping the target temperature of inner box unit through return flow channel backward flow to inner box unit, like this, this embodiment accessible adjusts the flow of air-out passageway, air-out passageway and return flow channel respectively thereby the actual temperature of control measured electronic product is unanimous with the target temperature.
For example, when a low temperature (lower than room temperature) measurement needs to be performed on the electronic device to be tested, and the set target temperature of the inner box unit is lower than the room temperature, no heat backflow is required, the backflow channel should be closed and the flow rates of the air outlet channel and the air inlet channel should be increased, and at the same time, the refrigeration module should be turned on, that is, the cold air generated by the refrigeration module should flow into the inner box unit to be cooled, and the following description is provided for the arrangement of the refrigeration module.
For example, when a high temperature (higher than room temperature) measurement needs to be performed on the electronic device to be tested, and the set target temperature of the inner box unit is higher than the room temperature, at this time, especially for the electronic device with high calorific value, because the heat generated by the electronic device is large and the temperature is high, under the condition that the heating module is not started, the actual temperature of the inner box unit can be consistent with the target temperature by adjusting the flow rates of the air inlet channel, the air outlet channel and the return channel. Specifically, when the actual temperature in the inner box unit is lower than the target temperature, the flow rates of the air inlet channel and the air outlet channel can be properly reduced, and the flow rate of the backflow channel is properly increased, so that enough heat flows back to the inner box unit and is heated; on the contrary, when the actual temperature in the inner box unit is higher than the target temperature, the flow of the air inlet channel and the air outlet channel can be properly increased, and meanwhile, the flow of the backflow channel is properly reduced or even closed, so that the heat flows back less or cannot flow back to the inner box unit, and the temperature is reduced.
That is, it can be understood that, in the case where the amount of heat generated by the electronic device is large and the temperature is high at the time of the pyrometric measurement, the inner box unit can be maintained at the target temperature only by the amount of heat of the backflow; of course, when the amount of heat returned from the electronic equipment is insufficient to maintain the target temperature, the actual temperature of the inner box unit may also be brought to the target temperature by the hot air generated by the heating module, which will be described in detail below with respect to the heating module.
In this embodiment, through the return flow channel that branches on the air-out passageway, on the one hand can discharge the heat that electronic equipment produced, prevent the accumulation of a large amount of heats, on the other hand, can still flow back to the inner box unit with the partial heat that electronic equipment produced and utilize this heat to make a contribution to maintaining the target temperature to can save the consumption of heating the module and even do not use the work of heating the module, thereby the energy saving.
In the embodiment of the application, the constant temperature test box comprises an inner box unit and an outer box unit sleeved outside, wherein an air inlet channel and an air outlet channel which are mutually independent are communicated between the inner box unit and the outer box unit; in addition, a return channel is communicated between the air outlet channel and the inner box unit; therefore, heat generated by the electronic equipment during testing can be discharged out of the outer box unit from the air outlet channel on one hand, and on the other hand, the heat can flow back to the inner box unit through the backflow channel so as to heat the electronic equipment;
that is to say, in this embodiment, by providing the independent air inlet channel, the independent air outlet channel, and the independent return channel between the inner box unit and the outer box unit, an airflow circulation is established between an external environment outside the outer box unit and an internal environment of the inner box unit, and on one hand, the airflow circulation can discharge part of heat generated by the electronic device out of the constant temperature test box through the air outlet channel in time, so as to avoid temperature drift caused by the heat; on the other hand, especially when the electronic equipment is high-calorific-value electronic equipment, partial heat generated by the electronic equipment can be returned to the inner box unit, so that the internal environment of the inner box unit is heated, and energy is saved; therefore, the technical problems that the temperature drifts and the test accuracy is influenced due to the fact that heat generated by the electronic equipment is accumulated in the constant-temperature test box continuously are solved, the technical effect of improving the constant-temperature test accuracy of the electronic equipment is achieved, and energy can be saved.
In one possible embodiment, the inner box unit 10 is provided with a first air outlet opening 11, a first air inlet opening 12 and a first return opening 13, and the outer box unit 20 is provided with a second air outlet opening 21 and a second air inlet opening 22; an air outlet channel 41 is formed between the first air outlet opening 11 and the second air outlet opening 21; an air inlet channel 42 is formed between the first air inlet opening 12 and the second air inlet opening 22; a return channel 43 is formed between the first return opening 13 and the outlet channel 41.
That is, in this embodiment, openings are respectively provided in the inner box unit and the outer box unit, then, an air outlet channel is formed between the first air outlet opening of the inner box unit and the second air outlet opening of the outer box unit, an air inlet channel is formed between the first air inlet opening of the inner box unit and the second air inlet opening of the outer box unit, and a backflow channel is formed between the first backflow opening of the inner box unit and the air outlet channel; the above-mentioned channel may be formed, for example, by providing a pipe between the two openings, or other structures may be used to form a channel structure between the two openings.
In one possible embodiment, the first air inlet opening 12 and the second air inlet opening 22 are in closed communication through an air inlet duct 52, and the air inlet duct 52 is arranged between the inner box unit 10 and the outer box unit 20; alternatively, the first and second electrodes may be,
the first air outlet opening 11 and the second air outlet opening 21 are communicated in a closed mode through an air outlet pipeline, and the air outlet pipeline is arranged between the inner box unit 10 and the outer box unit 20; alternatively, the first and second electrodes may be,
the first air inlet opening 12 and the second air inlet opening 22 are communicated in a closed mode through an air inlet pipeline 52, the first air outlet opening 11 and the second air outlet opening 21 are communicated in a closed mode through an air outlet pipeline, and the air inlet pipeline 52 and the air outlet pipeline are respectively arranged between the inner box unit 10 and the outer box unit 20;
so that an air outlet channel 41 is formed between the first air outlet opening 11 and the second air outlet opening 21, and an air inlet channel 42 is formed between the first air inlet opening 12 and the second air inlet opening 22.
Specifically, for the formation of the air inlet channel and the air outlet channel, in this embodiment, for example, the first air inlet opening and the second air inlet opening may be hermetically communicated through an air inlet duct, that is, one end of the air inlet duct is connected to the first air inlet opening, and the other end of the air inlet duct is connected to the second air inlet opening, so that the space between the inner box unit and the outer box unit is isolated through the air inlet duct, and the remaining space between the inner box unit and the outer box unit forms the air outlet channel;
or the first air outlet opening and the second air outlet opening can be communicated through an air outlet pipeline, so that the residual space between the inner box unit and the outer box unit forms an air inlet channel;
or, understandably, the air inlet pipeline and the air outlet pipeline can be arranged at the same time; thus, an air outlet channel and an air inlet channel are respectively formed through the two pipelines.
In a possible embodiment, the first air outlet opening 11 and the first air inlet opening 12 are respectively arranged on a first side wall and a second side wall of the inner box unit 10, and the first side wall and the second side wall are oppositely arranged along a first direction; the second air outlet opening 21 and the second air inlet opening 22 are arranged on a third side wall of the outer box unit 20 close to the second side wall; the inner box unit 10 and the outer box unit 20 are attached to each other in a second direction perpendicular to the first direction; a partition plate 90 is provided between the inner box unit 10 and the outer box unit 20, and the partition plate 90 partitions a space between the inner box unit 10 and the outer box unit 20 into the air outlet duct 41 and the air inlet duct 42.
That is, in the present embodiment, an example is disclosed in which a passage structure is formed between the two openings without using a pipe.
Referring to fig. 1, the first air outlet opening and the first air inlet opening are respectively disposed on a first side wall (right side wall in fig. 1) and a second side wall (left side wall in fig. 1) of the inner box unit, and the second air outlet opening and the second air inlet opening are disposed on a third side wall (left side wall in fig. 1) of the outer box unit; then, the laminating of the front and back lateral wall of inner box unit and outer container unit sets up, like this, make inner box unit and outer container unit have the space between the trilateral of left side wall, right side wall and roof, set up the baffler between inner box unit and outer container unit, this baffler for example extends to the left side wall of outer container unit from the roof of inner box unit left, and this baffler is located between second air-out opening and the second air inlet opening at the left side wall, and like this, this baffler can separate air-out passageway and inlet air passageway with the space between above-mentioned inner box unit and the outer container unit.
In this embodiment, on the one hand, the heat that electronic equipment produced flows through the space between inner box unit and the outer container unit, can play the samming effect to the inner box unit, and on the other hand, convenient understanding, both sides are established respectively to the first air inlet opening and the first air-out opening of inner box unit, and the distance is far away, and cold air or hot-air from the inflow of first air inlet opening can slowly cool down or heat up electronic equipment, have avoided the inaccurate condition of temperature that the air intake caused when being nearer electronic equipment.
In a possible embodiment, the first air inlet opening 12 and the second air inlet opening 22 are in closed communication through an air inlet duct 52; the baffle plate 90 is provided with a second return opening 91, and the second return opening 91 is in closed communication with the first return opening 13 through the return duct 53.
With reference to fig. 1 and 2, in this embodiment, an air inlet duct is disposed between the first air inlet opening and the second air inlet opening, one end of the air inlet duct is connected to the first air inlet opening in a sealing manner, and the other end of the air inlet duct is connected to the second air inlet opening in a sealing manner, so that the air flow can directly flow into the inner box unit from the second air inlet opening through the air inlet duct; then, a second backflow opening is further formed in the blocking plate, and the first backflow opening of the inner box unit is in closed communication with the second backflow opening in the blocking plate through a backflow pipeline.
In one possible embodiment, the second air inlet opening 22 is provided with a first adjusting plate 61, the second air outlet opening 21 is provided with a second adjusting plate 62, and the second return opening 91 is provided with a third adjusting plate 63.
In this embodiment, referring to fig. 3, the first adjusting plate is, for example, a slidable plate disposed at the second air inlet opening, and the size of the second air inlet opening can be adjusted by sliding the first adjusting plate; the second regulating plate and the third regulating plate are similar to the first regulating plate; namely, through the setting of above-mentioned regulating plate, can conveniently adjust above-mentioned open-ended aperture size to can conveniently adjust inlet air channel, air-out passageway and backflow channel's flow. The adjusting plates can also be realized by other gas flow adjusting devices such as valves and the like.
In a possible embodiment, a refrigeration module 70 is further disposed between the inner box unit 10 and the outer box unit 20, the inner box unit 10 is provided with a cold air opening 14, and a cold air passage 44 is formed between the air outlet of the refrigeration module 70 and the cold air opening 14; specifically, the air outlet of the refrigeration module 70 is communicated with the cold air opening 14 in a closed manner through the cold air duct 54, so that the cold air channel 44 is formed between the air outlet of the refrigeration module 70 and the cold air opening 14.
In this embodiment, for the refrigeration module, this refrigeration module can be established between inner box unit and outer container unit, and this refrigeration module is for example refrigeration compressor, then, offers cold wind opening at the lateral wall of inner box unit, for example seals the intercommunication through cold wind pipeline between this cold wind opening and the air outlet of refrigeration module to form cold wind channel.
For example, when the target temperature needs to be set to be lower than the ambient temperature, the actual temperature inside the inner box unit can be lower than the ambient temperature through the refrigeration module, so that the performance test of the electronic equipment at a lower temperature is facilitated.
In one possible embodiment, referring to fig. 1, a heating module 80 is disposed inside the inner tank unit 10, and the heating module 80 is, for example, a resistance wire, and heat generated by the resistance wire generates a heating effect on the inside of the inner tank unit, so that a desired high-temperature environment can be achieved.
In a possible embodiment, the constant temperature testing box further includes a thermocouple, and the thermocouple is disposed at an end of the electronic device 30 far from the first air outlet opening 11. Namely, a thermocouple is arranged at one end, far away from the first air outlet opening, of the electronic equipment, and the thermocouple can accurately reflect the temperature of the electronic product.
The foregoing describes the general principles of the present application in conjunction with specific embodiments, however, it is noted that the advantages, effects, etc. mentioned in the present application are merely examples and are not limiting, and they should not be considered essential to the various embodiments of the present application. Furthermore, the foregoing disclosure of specific details is for the purpose of illustration and description and is not intended to be limiting, since the foregoing disclosure is not intended to be exhaustive or to limit the disclosure to the precise details disclosed.
The block diagrams of devices, apparatuses, systems referred to in this application are only given as illustrative examples and are not intended to require or imply that the connections, arrangements, configurations, etc. must be made in the manner shown in the block diagrams. These devices, apparatuses, devices, systems may be connected, arranged, configured in any manner, as will be appreciated by those skilled in the art. Words such as "including," "comprising," "having," and the like are open-ended words that mean "including, but not limited to," and are used interchangeably therewith. The words "or" and "as used herein mean, and are used interchangeably with, the word" and/or, "unless the context clearly dictates otherwise. The word "such as" is used herein to mean, and is used interchangeably with, the phrase "such as but not limited to".
It should also be noted that in the devices, apparatuses, and methods of the present application, the components or steps may be decomposed and/or recombined. These decompositions and/or recombinations are to be considered as equivalents of the present application.
The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the application. Thus, the present application is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
The foregoing description has been presented for purposes of illustration and description. Furthermore, the description is not intended to limit embodiments of the application to the form disclosed herein. While a number of exemplary aspects and embodiments have been discussed above, those of skill in the art will recognize that certain variations, modifications, alterations, additions and sub-combinations thereof are encompassed within the scope of the invention.
Claims (10)
1. A constant temperature test box of electronic products is characterized by comprising:
an inner box unit (10);
an outer box unit (20), wherein the outer box unit (20) is sleeved outside the inner box unit (10),
the air outlet channel (41), the air outlet channel (41) is arranged between the inner box unit (10) and the outer box unit (20), and the air outlet channel (41) is communicated with the inner box unit (10) and the outer box unit (20);
the air inlet channel (42) is arranged between the inner box unit (10) and the outer box unit (20), and the air inlet channel (42) is communicated with the inner box unit (10) and the outer box unit (20);
the electronic equipment (30) is arranged in the inner box unit (10), and a fan air outlet of the electronic equipment (30) is communicated with the air outlet channel (41), so that heat generated by the electronic equipment (30) is exhausted out of the outer box unit (20) through the air outlet channel (41); and the number of the first and second electrodes,
air-out passageway (41) with be equipped with return flow channel (43) between inner box unit (10), return flow channel (43) intercommunication air-out passageway (41) with inner box unit (10), so that the heat follow air-out passageway (41) warp return flow channel (43) flow back to inner box unit (10), air inlet channel (42), air-out passageway (41) and return flow channel (43) independent setting are in inner box unit (10) with between outer box unit (20).
2. The constant temperature test chamber of claim 1,
the inner box unit (10) is provided with a first air outlet opening (11), a first air inlet opening (12) and a first return opening (13), and the outer box unit (20) is provided with a second air outlet opening (21) and a second air inlet opening (22);
wherein the air outlet channel (41) is formed between the first air outlet opening (11) and the second air outlet opening (21); the air inlet channel (42) is formed between the first air inlet opening (12) and the second air inlet opening (22); the return channel (43) is formed between the first return opening (13) and the air outlet channel (41).
3. The constant temperature test chamber of claim 2,
the first air outlet opening (11) and the first air inlet opening (12) are respectively arranged on a first side wall and a second side wall of the inner box unit (10), and the first side wall and the second side wall are oppositely arranged along a first direction; the second air outlet opening (21) and the second air inlet opening (22) are arranged on a third side wall, close to the second side wall, of the outer box unit (20);
the inner box unit (10) and the outer box unit (20) are attached to each other along a second direction perpendicular to the first direction; and a blocking plate (90) is arranged between the inner box unit (10) and the outer box unit (20), and the blocking plate (90) blocks the space between the inner box unit (10) and the outer box unit (20) from the air outlet channel (41) and the air inlet channel (42).
4. The constant temperature test box according to claim 3, characterized in that the first air inlet opening (12) and the second air inlet opening (22) are in closed communication through an air inlet pipeline (52); the blocking plate (90) is provided with a second backflow opening (91), and the second backflow opening (91) is communicated with the first backflow opening (13) in a sealing mode through a backflow pipeline (53).
5. The constant temperature test chamber of claim 2,
the first air inlet opening (12) and the second air inlet opening (22) are communicated in a closed mode through an air inlet pipeline (52), and the air inlet pipeline (52) is arranged between the inner box unit (10) and the outer box unit (20); alternatively, the first and second electrodes may be,
the first air outlet opening (11) and the second air outlet opening (21) are communicated in a closed mode through an air outlet pipeline, and the air outlet pipeline is arranged between the inner box unit (10) and the outer box unit (20); alternatively, the first and second electrodes may be,
the first air inlet opening (12) and the second air inlet opening (22) are communicated in a closed mode through the air inlet pipeline (52), the first air outlet opening (11) and the second air outlet opening (21) are communicated in a closed mode through the air outlet pipeline, and the air inlet pipeline (52) and the air outlet pipeline are respectively arranged between the inner box unit (10) and the outer box unit (20);
so that the air outlet channel (41) is formed between the first air outlet opening (11) and the second air outlet opening (21), and the air inlet channel (42) is formed between the first air inlet opening (12) and the second air inlet opening (22).
6. The thermostatic test chamber according to claim 4, characterized in that the second air inlet opening (22) is provided with a first regulating plate (61), the second air outlet opening (21) is provided with a second regulating plate (62), and the second return opening (91) is provided with a third regulating plate (63).
7. The constant temperature test box according to any one of claims 1 to 6, characterized in that a cooling module (70) is further arranged between the inner box unit (10) and the outer box unit (20), the inner box unit (10) is provided with a cold air opening (14), and a cold air channel (44) is formed between an air outlet of the cooling module (70) and the cold air opening (14).
8. The constant temperature test box according to claim 7, characterized in that the air outlet of the refrigeration module (70) is in closed communication with the cold air opening (14) through a cold air duct (54), so that the cold air channel (44) is formed between the air outlet of the refrigeration module (70) and the cold air opening (14).
9. The isothermal testing chamber according to any of claims 1 to 6, characterized in that a heating module (80) is provided inside the inner chamber unit (10).
10. The constant temperature test box according to any one of claims 2 to 6, characterized in that the constant temperature test box further comprises a thermocouple, and the thermocouple is arranged at one end of the electronic equipment (30) far away from the first air outlet opening (11).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010928163.1A CN112023988B (en) | 2020-09-07 | 2020-09-07 | Constant temperature test box of electronic product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010928163.1A CN112023988B (en) | 2020-09-07 | 2020-09-07 | Constant temperature test box of electronic product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112023988A CN112023988A (en) | 2020-12-04 |
| CN112023988B true CN112023988B (en) | 2022-04-29 |
Family
ID=73585043
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010928163.1A Active CN112023988B (en) | 2020-09-07 | 2020-09-07 | Constant temperature test box of electronic product |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112023988B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115727434A (en) | 2021-08-25 | 2023-03-03 | 三赢科技（深圳）有限公司 | Automatic temperature control device, system and method |
Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5200975A (en) * | 1990-11-29 | 1993-04-06 | Seiko Instruments Inc. | Furnace for viscoelasticity measuring device with concentric gas cooling shield |
| DE29914331U1 (en) * | 1999-08-16 | 1999-12-16 | Noekel Juergen | Arrangement for heating warming devices and the like. in hotels, laboratories and the like |
| JP2005121256A (en) * | 2003-10-14 | 2005-05-12 | Takamisawa Cybernetics Co Ltd | Temperature test device |
| CN1892244A (en) * | 2005-07-05 | 2007-01-10 | 松下电器产业株式会社 | Semiconductor test device |
| CN201129932Y (en) * | 2007-11-14 | 2008-10-08 | 陈良朝 | Heat energy recycling and circulating structure of heating furnace body |
| CN103386330A (en) * | 2013-07-09 | 2013-11-13 | 广州国技试验仪器有限公司 | Variable-volume combined-drawer-type test box controlled by individual blower fan |
| CN104525279A (en) * | 2014-11-27 | 2015-04-22 | 深圳市华测检测技术股份有限公司 | High-low temperature damp-hot test box |
| CN105445589A (en) * | 2015-12-14 | 2016-03-30 | 北京圣涛平试验工程技术研究院有限责任公司 | Temperature testing box used for high-reliability electronic element |
| CN205761213U (en) * | 2016-05-27 | 2016-12-07 | 深圳市瑞蓝技术有限公司 | Novel exhaust system high-temperature test chamber |
| CN205761215U (en) * | 2016-05-27 | 2016-12-07 | 深圳市瑞蓝技术有限公司 | There is the proof box of uniform blower system |
| CN206911371U (en) * | 2017-06-30 | 2018-01-23 | 浙江苏净净化设备有限公司 | A kind of Biohazard Safety Equipment |
| CN108167214A (en) * | 2017-12-11 | 2018-06-15 | 深圳比特微电子科技有限公司 | Temperature controlled method is carried out to equipment |
| CN110346665A (en) * | 2019-07-15 | 2019-10-18 | 上海交通大学 | A kind of width temperature range low temperature environment testing apparatus |
| US10551423B1 (en) * | 2015-01-13 | 2020-02-04 | The United States Of America As Represented By The Secretary Of The Army | System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices |
| CN211385051U (en) * | 2019-11-27 | 2020-09-01 | 广东贝尔试验设备有限公司 | Horizontal air supply mechanism of high-low temperature test box |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5908240B2 (en) * | 2011-09-22 | 2016-04-26 | パナソニックヘルスケアホールディングス株式会社 | Incubator |
| CN202921339U (en) * | 2012-11-23 | 2013-05-08 | 中怡(苏州)科技有限公司 | Thermostat |
| GB2531615B (en) * | 2015-02-02 | 2017-11-22 | Atlas Genetics Ltd | Instrument for performing a diagnostic test on a fluidic cartridge |
-
2020
- 2020-09-07 CN CN202010928163.1A patent/CN112023988B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5200975A (en) * | 1990-11-29 | 1993-04-06 | Seiko Instruments Inc. | Furnace for viscoelasticity measuring device with concentric gas cooling shield |
| DE29914331U1 (en) * | 1999-08-16 | 1999-12-16 | Noekel Juergen | Arrangement for heating warming devices and the like. in hotels, laboratories and the like |
| JP2005121256A (en) * | 2003-10-14 | 2005-05-12 | Takamisawa Cybernetics Co Ltd | Temperature test device |
| CN1892244A (en) * | 2005-07-05 | 2007-01-10 | 松下电器产业株式会社 | Semiconductor test device |
| CN201129932Y (en) * | 2007-11-14 | 2008-10-08 | 陈良朝 | Heat energy recycling and circulating structure of heating furnace body |
| CN103386330A (en) * | 2013-07-09 | 2013-11-13 | 广州国技试验仪器有限公司 | Variable-volume combined-drawer-type test box controlled by individual blower fan |
| CN104525279A (en) * | 2014-11-27 | 2015-04-22 | 深圳市华测检测技术股份有限公司 | High-low temperature damp-hot test box |
| US10551423B1 (en) * | 2015-01-13 | 2020-02-04 | The United States Of America As Represented By The Secretary Of The Army | System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices |
| CN105445589A (en) * | 2015-12-14 | 2016-03-30 | 北京圣涛平试验工程技术研究院有限责任公司 | Temperature testing box used for high-reliability electronic element |
| CN205761213U (en) * | 2016-05-27 | 2016-12-07 | 深圳市瑞蓝技术有限公司 | Novel exhaust system high-temperature test chamber |
| CN205761215U (en) * | 2016-05-27 | 2016-12-07 | 深圳市瑞蓝技术有限公司 | There is the proof box of uniform blower system |
| CN206911371U (en) * | 2017-06-30 | 2018-01-23 | 浙江苏净净化设备有限公司 | A kind of Biohazard Safety Equipment |
| CN108167214A (en) * | 2017-12-11 | 2018-06-15 | 深圳比特微电子科技有限公司 | Temperature controlled method is carried out to equipment |
| CN110346665A (en) * | 2019-07-15 | 2019-10-18 | 上海交通大学 | A kind of width temperature range low temperature environment testing apparatus |
| CN211385051U (en) * | 2019-11-27 | 2020-09-01 | 广东贝尔试验设备有限公司 | Horizontal air supply mechanism of high-low temperature test box |
Non-Patent Citations (1)
| Title |
|---|
| SDJ/W25高低温恒湿环境试验箱;熊刚等;《环境技术》;20091025(第05期);15-20 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112023988A (en) | 2020-12-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8619419B2 (en) | Computer docking station | |
| KR20110081756A (en) | Heat pump and heating medium flow rate calculation method of heat pump | |
| JP2011252717A (en) | Environmental testing device | |
| CN112023988B (en) | Constant temperature test box of electronic product | |
| Athavale et al. | Impact of active tiles on data center flow and temperature distribution | |
| JP2001124387A (en) | Air-conditioning device for vehicle | |
| CN214381895U (en) | Device for cooling server rack | |
| JP6366237B2 (en) | refrigerator | |
| CN114503337A (en) | Cooling device | |
| CN117039240A (en) | Energy storage air conditioner, energy storage air conditioner control method and energy storage battery cabinet temperature control system | |
| CN114700119A (en) | Double-air-duct environmental test box | |
| CN106196482A (en) | The control method of air conditioning system | |
| CN112234803A (en) | Frequency converter, refrigeration system and control method thereof | |
| Srichai et al. | Two-speed compressor operation in a refrigerator/freezer | |
| CN217389280U (en) | Double-air-duct high-low temperature environment test box structure | |
| CN115364910B (en) | Temperature test box | |
| CN115371323B (en) | Refrigeration equipment and air duct assembly thereof | |
| CN211477940U (en) | Cold and hot impact test equipment | |
| CN218601198U (en) | Heat pipe single tube heat transfer performance testing device | |
| CN217663390U (en) | Double-air-duct environmental test box | |
| CN210222889U (en) | Multi-temperature-zone vending machine | |
| CN218446480U (en) | Automatic driving control unit test equipment | |
| Song et al. | Experimental and simulation analysis of microchannel evaporators | |
| WO2018155429A1 (en) | Heat pump device control method and heat pump device | |
| Bullard et al. | Modeling and testing of a utility peak reducing residential hot/dry air conditioner (HDAC) using microchannel heat exchangers |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |