CN111999637A - IGBT test system - Google Patents

IGBT test system Download PDF

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Publication number
CN111999637A
CN111999637A CN202010947234.2A CN202010947234A CN111999637A CN 111999637 A CN111999637 A CN 111999637A CN 202010947234 A CN202010947234 A CN 202010947234A CN 111999637 A CN111999637 A CN 111999637A
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CN
China
Prior art keywords
igbt
module
electrically connected
test system
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010947234.2A
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Chinese (zh)
Inventor
万鹏
万辉
赖洋林
徐向军
万誉
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Kuaibei New Energy Technology Shanghai Co ltd
Shanghai Tn Industrial Co ltd
Original Assignee
Kuaibei New Energy Technology Shanghai Co ltd
Shanghai Tn Industrial Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kuaibei New Energy Technology Shanghai Co ltd, Shanghai Tn Industrial Co ltd filed Critical Kuaibei New Energy Technology Shanghai Co ltd
Priority to CN202010947234.2A priority Critical patent/CN111999637A/en
Publication of CN111999637A publication Critical patent/CN111999637A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2608Circuits therefor for testing bipolar transistors

Abstract

An embodiment of the present invention provides an IGBT test system, including: the cooling system comprises a cabinet body, a primary loop, a control device and a cooling device, wherein the primary loop, the control device and the cooling device are mounted on the cabinet body; the primary loop includes: the circuit breaker is electrically connected with the fuse, the fuse is electrically connected with the alternating current contactor, the alternating current contactor is electrically connected with the reactor, the reactor is electrically connected with the IGBT module, and the IGBT module is electrically connected with the capacitor bank module; the circuit breaker adopts manual operation and is used for cutting off or switching on a primary circuit; the fuse is used for automatically cutting off the primary loop when the primary loop has short circuit fault or overload; the reactor is used as a load of a primary loop and is used for returning electric energy to a power grid; the capacitor bank module is used as a direct current energy storage unit to store electric charges, the operation parameters of the IGBT module are comprehensively tested through the interaction of the primary loop, the control device and the cooling device, the reactance is used as a load, the energy consumption of the system is effectively reduced, and the safe operation of the system is ensured.

Description

IGBT test system
Technical Field
The embodiment of the invention relates to the technical field of IGBT, in particular to an IGBT testing system.
Background
In recent years, with the continuous promotion of clean energy construction in China, power semiconductor devices such as high-power Insulated Gate Bipolar Transistors (IGBT), Fast Recovery Diodes (FRD) and the like are more and more widely used, and the demand on the high-power IGBT semiconductor devices is more and more increased particularly in the industries such as extra-high voltage direct current transmission, flexible direct current transmission systems, power generation systems and the like.
The quality detection problem of high-capacity IGBT modules with various specifications is more and more prominent, a comprehensive testing means for high-power IGBT semiconductor devices is lacked, the operation monitoring of power electronic equipment is difficult, and the system comprehensive state tracking work of the operating equipment is difficult to realize.
Because the development personnel, the operation and maintenance personnel of the power electronic equipment lack corresponding detection and test means to test various parameter indexes of the inspection device, and simultaneously, because the signal is high voltage and high current, the power consumption is large in each test, and great hidden danger is brought to the long-term safe and stable operation of the equipment.
Disclosure of Invention
The embodiment of the invention provides an IGBT test system, which is used for solving the problem of high power consumption in the IGBT test process in the prior art, realizing comprehensive state tracking of equipment and ensuring long-term safe and stable operation of the equipment.
An embodiment of the present invention provides an IGBT test system, including: the cooling system comprises a cabinet body, and a primary loop, a control device and a cooling device which are arranged on the cabinet body;
the primary loop includes: the circuit breaker, the fuse, the alternating current contactor, the reactor, the IGBT module and the capacitor bank module;
the circuit breaker is electrically connected with the fuse, the fuse is electrically connected with the alternating current contactor, the alternating current contactor is electrically connected with the reactance, the reactance is electrically connected with the IGBT module, and the IGBT module is electrically connected with the capacitor bank module;
the circuit breaker adopts manual operation and is used for cutting off or switching on the primary loop; the fuse is used for automatically cutting off the primary loop when the primary loop is in short circuit fault or overload; the reactance is used as a load of the IGBT test system and used for returning electric energy to a power grid; the capacitor bank module is used as a direct current energy storage unit for storing charges.
Optionally, the control device includes: the system comprises a human-computer interaction interface, a controller, a temperature detection circuit, a current detection circuit, a voltage detection circuit, an IGBT (insulated gate bipolar translator) driving circuit and an alternating current contactor control circuit;
the human-computer interaction interface is electrically connected with the controller and is used for displaying all parameters of the system running state, setting the running mode and running threshold parameters of the system and controlling the running or stopping of the control device;
the controller is respectively electrically connected with the temperature detection circuit, the current detection circuit, the voltage detection circuit, the IGBT drive circuit and the alternating current contactor control circuit.
Optionally, the cooling device includes: the water cooling module, the radiator and the water pump;
the water cooling module, the radiator and the water pump are connected with each other by pipelines;
the IGBT module is arranged on the water cooling module and used for cooling the heating area of the IGBT module.
Optionally, the temperature detection circuit is connected to the internal temperature test point of the IGBT module and the temperature test point of the water-cooling module, respectively, and is configured to detect the internal temperature of the IGBT module and the temperature of the water-cooling module.
Optionally, the current detection circuit is configured to detect a magnitude of a current flowing through the IGBT module and a magnitude of the primary loop current.
Optionally, the magnitude of the current flowing through the IGBT module is used to determine the reactive power and the active power of the IGBT test system.
Optionally, the voltage detection circuit is electrically connected to the capacitor bank module and configured to detect a voltage value on the capacitor bank module.
Optionally, the IGBT driving circuit is electrically connected to the IGBT module, and is configured to drive the IGBT module to turn on and off.
Optionally, the ac contactor control circuit controls the ac contactor to open and close.
Optionally, the controller includes: the device comprises a program counter, an instruction register, an instruction decoder, a timing generator and an operation controller.
An embodiment of the present invention provides an IGBT test system, including: the cooling system comprises a cabinet body, a primary loop, a control device and a cooling device, wherein the primary loop, the control device and the cooling device are mounted on the cabinet body; the primary loop includes: the circuit breaker is electrically connected with the fuse, the fuse is electrically connected with the alternating current contactor, the alternating current contactor is electrically connected with the reactor, the reactor is electrically connected with the IGBT module, and the IGBT module is electrically connected with the capacitor bank module; the circuit breaker adopts manual operation and is used for cutting off or switching on a primary circuit; the fuse is used for automatically cutting off the primary loop when the primary loop has short circuit fault or overload; the reactor is used as a load of a primary loop and is used for returning electric energy to a power grid; the capacitor bank module is used as a direct current energy storage unit to store electric charges, the operation parameters of the IGBT module are comprehensively tested through the interaction of the primary loop, the control device and the cooling device, the reactance is used as a load, the energy consumption of the system is effectively reduced, and the safe operation of the system is ensured.
Drawings
Fig. 1 is a schematic structural diagram of an IGBT test system according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a primary loop of an IGBT testing system according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a primary loop structure of another IGBT testing system according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a control device of an IGBT test system according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a cooling device of an IGBT test system according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
Fig. 1 is a schematic structural diagram of an IGBT test system according to an embodiment of the present invention, where the embodiment is applicable to an IGBT test situation, and the system may be implemented in a hardware and/or software manner.
As shown in fig. 1, the IGBT test system provided in this embodiment includes: a cabinet 100, and a primary circuit 110, a control device 120, and a cooling device 130 mounted to the cabinet 100;
referring to fig. 2 and fig. 3, fig. 2 is a schematic diagram of a primary loop structure of an IGBT test system according to an embodiment of the present invention, and fig. 3 is a schematic diagram of a primary loop structure of another IGBT test system according to an embodiment of the present invention, where the primary loop includes: a circuit breaker 200, a fuse 210, an ac contactor 220, a reactor 230, an IGBT module 240, and a capacitor bank module 250;
the circuit breaker 200 is electrically connected with the fuse 210, the fuse 210 is electrically connected with the ac contactor 220, the ac contactor 220 is electrically connected with the reactor 230, the reactor 230 is electrically connected with the IGBT module 240, and the IGBT module 240 is electrically connected with the capacitor bank module 250;
the circuit breaker 200 is manually operated and is used for cutting off or connecting a primary circuit; the fuse 210 is used to automatically cut off the primary circuit 110 when the primary circuit has a short-circuit fault or an overload; the reactance 230 serves as a load of the IGBT test system for returning electrical energy to the grid; the capacitor bank module 250 serves as a dc energy storage unit to store charge.
The circuit breaker 220 is manually operated, and has multiple protection functions such as overload, short circuit and under-voltage protection, high breaking capacity, convenient operation, safety and the like; the fuse 210 is equivalent to a fuse, and is used for automatically cutting off a primary circuit when the primary circuit has a short circuit fault or is overloaded, so that electrical equipment is prevented from being damaged, and an accident is prevented from spreading; the reactor 230 is used as a load of the IGBT test system, absorbs reactive power in the IGBT test system and returns the reactive power to a power grid in the form of electric energy, so that the electric energy loss of the system is reduced, and the service life of a device is prolonged. The capacitor bank module 250 is formed by connecting a plurality of capacitors in parallel, the IGBT module 240 is electrically connected to the capacitor bank module 250, and the charging and discharging of the capacitor bank module 250 are controlled by the on and off of the IGBT module 240.
The technical scheme of this embodiment, IGBT test system include the cabinet body and the cabinet body on the primary loop of installation, controlling means and cooling device, the primary loop still includes: the circuit breaker, the fuse, ac contactor, the reactance, IGBT module and electric capacity group module, the circuit breaker is connected with the fuse electricity, the fuse is connected with ac contactor electricity, ac contactor is connected with the reactance electricity, the reactance is connected with the IGBT module electricity, the IGBT module is connected with electric capacity group module electricity, through the corresponding setting of each part in IGBT test system, it is big to have solved IGBT test system power consumption, test system work safety's problem, reached and effectively reduced IGBT test system power consumption, guarantee test system job stabilization, reliable effect.
Example two
Fig. 4 is a schematic structural diagram of a control device of an IGBT test system according to an embodiment of the present invention, and the present embodiment is further optimized based on the foregoing embodiment;
optionally, the control device includes: the system comprises a human-computer interaction interface 310, a controller 320, a temperature detection circuit 330, a current detection circuit 340, a voltage detection circuit 350, an IGBT drive circuit 360 and an AC contactor control circuit 370;
the human-computer interaction interface 310 is electrically connected with the controller 320 and is used for displaying various parameters of the system operation state, setting the operation mode and operation threshold parameters of the system, and controlling the operation or stop of the device;
the controller 320 is electrically connected to the temperature detection circuit 330, the current detection circuit 340, the voltage detection circuit 350, the IGBT drive circuit 30, and the ac contactor control circuit 370, respectively.
The human-computer interface 310 may be an industrial touch screen, and is configured to display each parameter of the system operation state, where each parameter specifically includes: the system comprises a temperature parameter, a current parameter and a voltage parameter, wherein the operation mode of the system is set to comprise an IGBT temperature test, an IGBT current test and an IGBT voltage test, the operation threshold parameter comprises a temperature threshold, a current threshold and a voltage threshold, and the control device stops operation;
optionally, the controller 320 includes: the device comprises a program counter, an instruction register, an instruction decoder, a time sequence generator and an operation controller;
the controller is a master device of the IGBT test system, and is composed of a program counter, an instruction register, an instruction decoder, a timing generator and an operation controller, and can control the operating states of the temperature detection circuit 330, the current detection circuit 340, the voltage detection circuit 350, the IGBT drive circuit 30, the ac contactor control circuit 370 and the IGBT test system, and coordinate and direct the operation of the whole system.
Fig. 5 is a schematic structural diagram of a cooling device of an IGBT test system according to an embodiment of the present invention, and optionally, the cooling device includes: a water cooling module 410, a radiator 420 and a water pump 430;
the water cooling module 410, the radiator 420 and the water pump 430 are connected with each other by pipelines;
the IGBT module is mounted on the water cooling module 410, and is used to cool the heat generating area of the IGBT module.
Wherein, the IGBT module is installed on water-cooling module 410, and water-cooling module 410, radiator 420 and water pump 430 use the pipe connection between two liang, and cooling liquid flows in the pipeline and reaches the effect to the IGBT module cooling, effectively guarantees IGBT module life.
Optionally, the temperature detection circuit 330 is connected to the internal temperature test point of the IGBT module and the temperature test point of the water cooling module 410, respectively, and is configured to detect the internal temperature of the IGBT module and the temperature of the water cooling module 410.
The temperature detection circuit 330 detects the internal temperature of the IGBT module, and when the internal temperature of the IGBT module reaches a set temperature threshold, the controller automatically controls the test system to be turned off, so as to ensure safe and stable operation of the test system.
Optionally, the current detection circuit 340 is configured to detect a magnitude of a current flowing through the IGBT module and a magnitude of a primary loop current.
Optionally, the magnitude of the current flowing through the IGBT module is used to determine the reactive power and the effective power of the IGBT test system.
Optionally, the voltage detection circuit 350 is electrically connected to the capacitor bank module, and is configured to detect a voltage value of the capacitor bank module.
The current detection circuit 340 detects the magnitude of the current flowing through the IGBT module and the magnitude of the primary loop current, the voltage detection circuit 350 detects the magnitude of the voltage value on the capacitor bank module, and the values of the current and the voltage can be directly displayed on the display screen of the human-computer interaction interface 310, which is beneficial for the detection personnel to visually record the waveform changes of the current and the voltage.
Optionally, the IGBT driving circuit 360 is electrically connected to the IGBT module, and is configured to drive the IGBT module to turn on and off.
The IGBT is an insulated gate bipolar transistor and is a composite full-control voltage-driven power semiconductor device composed of BJTs (bipolar junction transistors) and MOS (insulated gate field effect transistors), the IGBT module comprises a plurality of IGBTs connected in parallel, the grid electrodes of the IGBTs are connected with an IGBT driving circuit 360, the IGBT driving circuit 360 controls the on and off of the IGBT module by driving the IGBTs, and then the charging and discharging of a capacitor bank module connected with the IGBT module are controlled.
Optionally, the ac contactor control circuit 370 controls the ac contactor to open and close.
With continued reference to fig. 2, 3, and 4, the specific process of the IGBT withstand voltage test is to supply power to the test system by turning on the circuit breaker 200, set the test mode as the withstand voltage test mode through the human-computer interaction interface 310, click a start button on the human-computer interaction interface 310, start the test, send a signal to the controller 320 through the human-computer interaction interface 310, close the ac contactor 220 by controlling the ac contactor control circuit 370 by the controller 320, and simultaneously control the on and off of the IGBT module 240 by the controller 320 through the IGBT driving circuit 360, charge the capacitor bank module 250 when conducting, so that the voltage at both ends of the capacitor bank module 250 is continuously increased; while the controller 320 controls the IGBT module 240 to be turned on to charge the capacitor bank module 250, the temperature of the IGBT module 240 is detected by the temperature detection circuit 330, the current of the IGBT module 240 is detected by the current detection circuit 340, the voltage value of the capacitor bank module 240 is detected by the voltage detection circuit 350, and the detected data is displayed by the controller 320 through the human-computer interface 310. When the voltage value of the capacitor bank module 240 reaches the set voltage withstanding test value, the controller 320 controls the on and off of the IGBT module 240 through the IGBT driving circuit 360 to control the current flowing through the IGBT module 240 and keep the voltage at the two ends of the capacitor bank module 250 unchanged, and detects the voltage withstanding performance of the IGBT module 240 according to the test time required by the specification. Because the test system uses the reactor 230 as a load, almost all the electric energy is returned to the power grid, so the test energy consumption is low; during testing, through the preset temperature threshold and the preset voltage threshold, when the temperature of the IGBT module 240 is detected by the temperature detection circuit 340 and the voltage value of the capacitor bank module 250 exceeds the corresponding threshold detected by the voltage detection circuit 350, the controller 320 automatically controls the system to be turned off, so as to ensure the safety of the test system.
The specific process of the IGBT high-current test is that the circuit breaker 200 is switched on to supply power to a test system, a test mode is set to be a current test mode through the human-computer interaction interface 310, a start button on the human-computer interaction interface 310 is clicked to start the test, the human-computer interaction interface 310 sends a signal to the controller 320, the controller 320 controls the alternating current contactor control circuit 370 to close the alternating current contactor 220, meanwhile, the controller 320 controls the IGBT module 240 to be switched on and off through the IGBT drive circuit 360, and the capacitor bank module 250 is charged when the IGBT module is switched on, so that the voltage at two ends of the capacitor bank 250 is continuously increased; while the controller 320 controls the IGBT module 240 to be turned on to charge the capacitor bank module 250, the temperature of the IGBT module 240 is detected by the temperature detection circuit 330, the current of the IGBT module 240 is detected by the current detection circuit 340, the voltage value of the capacitor bank module 250 is detected by the voltage detection circuit 350, and the detected data is displayed by the controller 320 through the human-computer interface 310. When the voltage value of the capacitor bank module 250 reaches the set current test voltage value, the controller 320 controls the on and off of the IGBT module 240 through the IGBT driving circuit 360 to control the current flowing through the IGBT module 240 to be continuously increased and keep the voltage at the two ends of the capacitor bank module 240 unchanged, the current value flowing through the IGBT module 240 is continuously increased to the set large current test value to be kept unchanged, and the large current performance of the IGBT module 240 is detected according to the test time required by the specification. Because the test system uses the reactor 230 as a load, almost all the electric energy is returned to the power grid, so the test energy consumption is low; during testing, through the preset temperature threshold and the preset voltage threshold, when the temperature of the IGBT module 240 is detected by the temperature detection circuit 330 and the voltage value of the capacitor bank module 250 exceeds the corresponding threshold detected by the voltage detection circuit 350, the controller 320 automatically controls the system to be turned off, so as to ensure the safety of the test system.
According to the technical scheme, through the interaction of the human-computer interaction interface, the controller, the temperature detection circuit, the current detection circuit, the voltage detection circuit, the IGBT driving circuit and the alternating current contactor control circuit in the control device, the primary loop and the water cooling system, the problem of comprehensive testing of temperature, current and voltage parameters in the IGBT module is solved, and the reactance is used as a load, so that the energy consumption in the testing process is effectively reduced, and the safe operation of the testing system is ensured.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. An IGBT test system, comprising: the cooling system comprises a cabinet body, and a primary loop, a control device and a cooling device which are arranged on the cabinet body;
the primary loop includes: the circuit breaker, the fuse, the alternating current contactor, the reactor, the IGBT module and the capacitor bank module;
the circuit breaker is electrically connected with the fuse, the fuse is electrically connected with the alternating current contactor, the alternating current contactor is electrically connected with the reactance, the reactance is electrically connected with the IGBT module, and the IGBT module is electrically connected with the capacitor bank module;
the circuit breaker adopts manual operation and is used for cutting off or switching on the primary loop; the fuse is used for automatically cutting off the primary loop when the primary loop is in short circuit fault or overload; the reactance is used as a load of the IGBT test system and used for returning electric energy to a power grid; the capacitor bank module is used as a direct current energy storage unit for storing charges.
2. The IGBT test system according to claim 1, wherein the control device comprises: the system comprises a human-computer interaction interface, a controller, a temperature detection circuit, a current detection circuit, a voltage detection circuit, an IGBT (insulated gate bipolar translator) driving circuit and an alternating current contactor control circuit;
the human-computer interaction interface is electrically connected with the controller and is used for displaying all parameters of the system running state, setting the running mode and running threshold parameters of the system and controlling the running or stopping of the control device;
the controller is respectively electrically connected with the temperature detection circuit, the current detection circuit, the voltage detection circuit, the IGBT drive circuit and the alternating current contactor control circuit.
3. The IGBT test system of claim 1, wherein the cooling device comprises: the water cooling module, the radiator and the water pump;
the water cooling module, the radiator and the water pump are connected with each other by pipelines;
the IGBT module is arranged on the water cooling module and used for cooling the heating area of the IGBT module.
4. The IGBT test system according to claim 1, wherein the temperature detection circuit is connected to an internal temperature test point of the IGBT module and a temperature test point of the water cooling module, respectively, for detecting the internal temperature of the IGBT module and the temperature of the water cooling module.
5. The IGBT test system of claim 2, wherein the current detection circuit is configured to detect a magnitude of the current flowing through the IGBT module and a magnitude of the primary loop current.
6. The IGBT test system of claim 5, wherein the magnitude of the current flowing through the IGBT module is used to determine the reactive power and the real power of the IGBT test system.
7. The IGBT test system of claim 2, wherein the voltage detection circuit is electrically connected to the capacitor bank module for detecting a magnitude of a voltage value across the capacitor bank module.
8. The IGBT test system of claim 2, wherein the IGBT drive circuit is electrically connected with the IGBT module for driving the IGBT module to turn on and off.
9. The IGBT test system of claim 2, wherein the ac contactor control circuit controls the ac contactor to open and close.
10. The IGBT test system of claim 2, wherein the controller comprises: the device comprises a program counter, an instruction register, an instruction decoder, a timing generator and an operation controller.
CN202010947234.2A 2020-09-10 2020-09-10 IGBT test system Pending CN111999637A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010947234.2A CN111999637A (en) 2020-09-10 2020-09-10 IGBT test system

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Application Number Priority Date Filing Date Title
CN202010947234.2A CN111999637A (en) 2020-09-10 2020-09-10 IGBT test system

Publications (1)

Publication Number Publication Date
CN111999637A true CN111999637A (en) 2020-11-27

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Application Number Title Priority Date Filing Date
CN202010947234.2A Pending CN111999637A (en) 2020-09-10 2020-09-10 IGBT test system

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113447775A (en) * 2021-06-23 2021-09-28 云南电网有限责任公司电力科学研究院 Fuse testing device for nitrogen insulation switch cabinet voltage transformer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113447775A (en) * 2021-06-23 2021-09-28 云南电网有限责任公司电力科学研究院 Fuse testing device for nitrogen insulation switch cabinet voltage transformer
CN113447775B (en) * 2021-06-23 2022-09-27 云南电网有限责任公司电力科学研究院 Fuse testing device for nitrogen insulation switch cabinet voltage transformer

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