CN111983318A - Sensor testing method, device, equipment and computer storage medium - Google Patents
Sensor testing method, device, equipment and computer storage medium Download PDFInfo
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The embodiment of the invention provides a sensor testing method, a sensor testing device, equipment and a computer storage medium, which are applied to sensor testing equipment, wherein the method comprises the following steps: acquiring the resistance value of at least one sensor to be detected; determining a first sensor meeting a preset resistance value according to the resistance value of at least one sensor to be detected; acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature; and determining the sensitivity grade of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor. The embodiment of the invention can obviously improve the testing efficiency of the sensor and reduce the personnel input cost.
Description
Technical Field
The invention belongs to the technical field of infrared detection, and particularly relates to a sensor testing method, a sensor testing device, sensor testing equipment and a computer storage medium.
Background
With the rising of emerging industries such as industrial automation, internet of things and the like, induction electronic products are applied more and more in the internet, medical treatment, industry and agriculture, and the market demand is larger and larger.
In the production test process of current response class electronic product, need the tester to test every sensor that awaits measuring one by one, not only efficiency of software testing is low, and the personnel that drop into are with high costs moreover, consequently, need a method that can improve efficiency of software testing urgently.
Disclosure of Invention
The embodiment of the invention provides a sensor testing method, a sensor testing device, sensor testing equipment and a computer storage medium, which can obviously improve the testing efficiency of a sensor and reduce the input cost of personnel.
In a first aspect, an embodiment of the present invention provides a sensor testing method, where the method includes:
acquiring the resistance value of at least one sensor to be detected;
determining a first sensor meeting a preset resistance value according to the resistance value of at least one sensor to be detected;
acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature;
and determining the sensitivity grade of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
In some implementations of the first aspect, obtaining the resistance value of the at least one sensor under test includes: detecting a first test temperature of the sensor testing equipment;
and when the first test temperature reaches a first preset test temperature, acquiring the resistance value of at least one sensor to be tested.
In some implementations of the first aspect, determining the sensitivity level of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor includes: acquiring a difference value between a first voltage value and a second voltage value of a first sensor;
and determining the sensitivity grade of each first sensor according to the difference and a preset sensitivity division rule.
In some implementations of the first aspect, after determining the sensitivity level of each first sensor, the method further comprises: and determining a display identifier corresponding to the sensitivity level of each first sensor.
In some implementations of the first aspect, the method further comprises: and determining the display identifier corresponding to the second sensor of which the resistance value of the sensor to be detected does not meet the preset resistance value.
In a second aspect, an embodiment of the present invention provides a sensor testing apparatus, including:
the resistance acquisition module is used for acquiring the resistance value of at least one sensor to be detected;
the resistance value screening module is used for determining a first sensor meeting a preset resistance value according to the resistance value of at least one sensor to be tested;
the voltage acquisition module is used for acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature;
and the sensitivity judging module is used for determining the sensitivity grade of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
In some implementations of the second aspect, the resistance obtaining module is further configured to detect a first test temperature of the sensor testing device;
and when the first test temperature reaches a first preset test temperature, acquiring the resistance value of at least one sensor to be tested.
In some implementations of the second aspect, the sensitivity determination module is further configured to obtain a difference between a first voltage value and a second voltage value of the first sensor;
and determining the sensitivity grade of each first sensor according to the difference and a preset sensitivity division rule.
In some implementations of the second aspect, the apparatus further includes a display module;
the display module is used for determining a display identifier corresponding to the sensitivity level of each first sensor;
and the display identifier is used for displaying the display identifier corresponding to the sensitivity level of the first sensor.
In some implementation manners of the second aspect, the display module is further configured to determine a display identifier corresponding to a second sensor having a resistance value that does not satisfy a preset resistance value;
and the display identifier is used for displaying the display identifier corresponding to the second sensor.
In a third aspect, the present invention provides a sensor testing apparatus comprising: a processor and a memory storing computer program instructions; the processor, when executing the computer program instructions, implements the sensor testing method described in the first aspect or any of the realizable forms of the first aspect.
In a fourth aspect, the present invention provides a computer-readable storage medium having stored thereon computer program instructions which, when executed by a processor, implement the sensor testing method of the first aspect or any of the realizable manners of the first aspect.
The embodiment of the invention provides a sensor testing method, after a sensor to be tested is placed in sensor testing equipment, the resistance values of all the sensors to be tested and the voltages of the sensors to be tested at different testing temperatures can be automatically obtained, and then the sensor testing equipment can automatically judge and obtain the sensitivity of each sensor to be tested according to the obtained resistance values and the voltages of the sensors at different testing temperatures, so that the testing efficiency of the sensors is obviously improved, and the personnel input cost is reduced.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the embodiments of the present invention will be briefly described below, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a software topology for automatically testing a sensor under test according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a sensor testing method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a sensitivity level display interface provided by an embodiment of the invention;
FIG. 4 is a schematic diagram of another sensitivity level display interface provided by embodiments of the present invention;
FIG. 5 is a schematic structural diagram of a sensor testing device according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a sensor testing apparatus according to an embodiment of the present invention.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below, and in order to make objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not to be construed as limiting the invention. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The term "and/or" herein is merely an association describing an associated object, meaning that three relationships may exist, e.g., a and/or B, may mean: a exists alone, A and B exist simultaneously, and B exists alone.
With the rising of emerging industries such as industrial automation, internet of things and the like, induction electronic products are applied more and more in the internet, medical treatment, industry and agriculture, and the market demand is larger and larger.
In the production test process of current response class electronic product, need the tester to test every sensor that awaits measuring one by one, not only efficiency of software testing is low, and the personnel that drop into are with high costs moreover, consequently, need a method that can improve efficiency of software testing urgently.
In view of the above problems, embodiments of the present invention provide a sensor testing method, apparatus, device, and computer storage medium, in which after a sensor to be tested is placed in a sensor testing device, resistance values of all sensors to be tested and voltages of the sensors to be tested at different testing temperatures can be automatically obtained, and then, the sensitivity of each sensor to be tested can be automatically determined, so that the testing efficiency of the sensor is significantly improved, and the personnel input cost is reduced.
Fig. 1 shows a software topology for automated testing of a sensor under test. The system comprises a main control unit which is used for tracking and monitoring a test flow in real time and sending out an execution instruction of each link. Through the main control unit, on one hand, a human-computer interaction instruction can be received, on the other hand, the whole test process can be controlled, so that the test process of the sensor to be tested is automated, and after the test result of the sensor to be tested is obtained, the test result of the sensor to be tested can be directly displayed on the display unit.
In some embodiments, the data acquisition unit may be configured to perform data acquisition on the external device. The external equipment is such as a chill, a blackbody furnace, a resistance acquisition device, a voltage acquisition device and the like. The main control unit can control the data acquisition unit to realize the acquisition of various related data by sending related acquisition instructions.
In some embodiments, the temperature of the chiller and the temperature of the black body furnace are collected and controlled, optionally, an RS485 communication mode may be adopted between the chiller and the main control unit to realize real-time collection and temperature control of the temperature of the black body furnace, so as to ensure that a certain temperature difference exists between the chiller and the black body. The device for collecting the resistors can be communicated with the main control unit in an RS232 communication mode, and the device for collecting the resistors is controlled to obtain resistance information of the to-be-detected sensors placed on each channel. The voltage acquisition device can be in a communication mode of an I2C bus (I2C) with the main control unit, and is controlled to acquire voltage information of the to-be-detected sensor placed on each channel.
In some embodiments, the Input/Output (I/O) control unit employs a Programmable Logic Controller (PLC), a motion control card, and other devices for processing Input/Output related signals, specifically, a PCIE-1730 board.
And the switching of different driving test environments is realized through the I/O control unit. The switching test environment can adopt a three-axis motor to push an actuating mechanism to realize switching of different test environments, wherein the different test environments refer to a test environment for acquiring the resistance of the sensor to be tested and a test environment for acquiring the voltage of the sensor to be tested at different temperatures.
In the embodiment of the invention, a tray can be selected to bear the sensor to be tested, the tray is pushed to move by the three-axis motor, and the tray bearing the sensor to be tested is placed in the test cabin.
In some embodiments, the hierarchical screening unit may screen the resistance and the voltage according to a preset resistance value and a preset sensitivity division rule, respectively.
The following describes a sensor testing method provided by an embodiment of the present invention with reference to the accompanying drawings.
Fig. 2 is a schematic flow chart illustrating a sensor testing method according to an embodiment of the present invention. As shown in fig. 2, the method may be applied to a sensor testing apparatus, the method comprising the steps of:
s210, obtaining the resistance value of at least one sensor to be measured.
After the sensor to be tested is placed in the sensor testing equipment, the sensor testing equipment can automatically acquire the resistance value of each sensor to be tested placed in the sensor testing equipment.
In some embodiments, to improve the sensitivity of monitoring the sensor under test, obtaining the resistance value of the at least one sensor under test may further include: detecting a first test temperature of the sensor testing equipment; and when the first test temperature reaches a first preset test temperature, acquiring the resistance value of at least one sensor to be tested.
As a specific example, before the sensor to be tested is placed in the test chamber of the sensor test equipment, the temperature of the blackbody furnace in the sensor test equipment is determined to meet the requirement of the first preset test temperature, and if the temperature of the blackbody furnace meets the requirement of the first preset test temperature, the device provided with the sensor to be tested is placed in the test chamber.
Alternatively, the device for placing the sensor to be measured may be a tray for carrying the sensor to be measured, and is not particularly limited herein. When the temperature of the blackbody furnace reaches the first preset test temperature, the tray bearing the sensor to be tested is controlled, and the tray bearing the sensor to be tested is automatically placed into the test cabin, wherein the warehousing action of the tray comprises but is not limited to pushing, pressing, approaching and the like.
In some embodiments, in order to increase the testing speed of the sensor under test, a plurality of sensors under test can be simultaneously placed in the sensor testing equipment.
After the sensor under test enters the test chamber, S220 is performed.
S220, determining a first sensor meeting a preset resistance value according to the resistance value of at least one sensor to be detected.
After the resistance value of the sensor to be detected is obtained, each sensor can be screened according to the resistance value, and a first sensor meeting the preset resistance value is obtained.
In some embodiments, after each sensor is screened, if there is a sensor to be measured that satisfies the preset resistance, the sensor to be measured that does not satisfy the preset resistance is determined as the second sensor.
As a specific example, for the first sensor obtained by the first screening, the test result of the first sensor may be determined to be "OK", and then the sensitivity level of the first sensor may be determined by judging the test voltage of the first sensor.
For the second sensor obtained in the first screening, the test result of the second sensor can be directly determined as "NG", i.e. the minimum requirement of the preset sensitivity is not reached.
And S230, acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature.
In some embodiments, the resistance value of the sensor to be tested is obtained, the test mode of the sensor test equipment can be directly switched to the voltage test mode, and the voltage value of each sensor in the sensor test bin under different temperature test conditions is respectively measured.
As a specific example, after the measurement mode is switched, a voltage test is performed on each sensor in the test chamber under a chiller condition to obtain a first voltage value, and after the chiller voltage test is finished, a blackbody furnace voltage test is immediately performed to obtain a second voltage value. The cold iron and the black body furnace respectively provide different temperature conditions for determining the voltage value of the sensor to be measured.
In some embodiments, after the resistance value of the sensor to be tested is tested, the sensor to be tested may be subjected to a voltage test, and after the test is completed, the sensitivity level of each sensor to be tested may be determined according to the resistance value, the first voltage value, and the second voltage value.
In some embodiments, after the resistance value of the sensor to be tested is tested, the first sensor meeting the preset resistance value is determined by resistance value screening, then the first voltage value and the second voltage value of the first sensor are tested, and finally the sensitivity level of the first sensor is determined. And determining the sensor to be measured which does not meet the preset resistance value as a second sensor.
After the sensor testing device obtains the first voltage value and the second voltage value, S240 is performed.
And S240, determining the sensitivity level of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
In some embodiments, the preset sensitivity division rule may specifically be to acquire a difference value between a first voltage value and a second voltage value of the first sensor; and determining the sensitivity grade of each first sensor according to the difference and a preset sensitivity division rule.
As a specific example, the sensitivity levels may be previously divided into A, B, C, D four levels, and the sensitivity level corresponding to each sensor may be determined according to the difference between the first voltage value and the second voltage value.
In order to more intuitively display the sensitivity level of each sensor to be tested, after the graded screening of the sensitivity is finished, the method also comprises the following steps: and determining a display identifier corresponding to the sensitivity level of each first sensor. The display interface which can be used for the sensor testing equipment displays the display identification corresponding to the sensitivity level of the first sensor.
In some embodiments, the method may further include determining a display identifier corresponding to a second sensor having a resistance value that does not satisfy a preset resistance value. The display interface used for the sensor testing equipment can display the display identification corresponding to the second sensor.
In some embodiments, in order to more clearly display the sensitivity level of the sensor to be tested, the label of each sensor to be tested placed in the test chamber may be marked, the sensitivity level of the sensor to be tested is displayed corresponding to the label of the position where the sensor to be tested is located, so as to help a tester to quickly locate the information of each sensor to be tested, and particularly, the tester can quickly determine the second sensor which does not meet the preset minimum sensitivity requirement.
As a specific example, fig. 3 shows a schematic diagram of a sensitivity level display interface. The sensitivity of 180 tested sensors is displayed, optionally, the sensitivities of different grades can be distinguished by different colors, and therefore the state of each tested sensor is displayed more visually.
As shown in fig. 4, the display interface may further display the test progress of the sensor in the test chamber in a progress bar manner, so that the tester can quickly know the test progress.
And after the testing of all the sensors in the test cabin is finished, the sensor testing equipment pushes the automatic device which reports the sensors to be tested out of the test cabin, and the testing process of the whole sensor is finished. After the sensor to be tested is replaced, the test procedure of the sensor described in the embodiment of the present invention may be performed again.
The discharging action of the tray bearing the sensor to be detected comprises but is not limited to pushing, pressing, approaching and the like.
According to the sensor testing method provided by the embodiment of the invention, after the sensor to be tested is placed in the sensor testing equipment, the resistance values of all the sensors to be tested and the voltages of the sensors to be tested at different testing temperatures can be automatically obtained, and then, the sensor testing equipment can automatically judge and obtain the sensitivity of each sensor to be tested according to the obtained resistance values and the voltages of the sensors at different testing temperatures, so that the testing efficiency of the sensors is obviously improved, and the personnel input cost is reduced.
Fig. 5 is a schematic structural diagram of a sensor testing apparatus according to an embodiment of the present invention, and as shown in fig. 5, the sensor testing apparatus may include: the resistance obtaining module 510, the resistance value screening module 520, the voltage obtaining module 530, and the sensitivity determining module 540.
In some embodiments, the resistance obtaining module 510 is configured to obtain a resistance value of at least one sensor under test.
The resistance value screening module 520 is configured to determine a first sensor meeting a preset resistance value according to the resistance value of at least one sensor to be tested.
The voltage obtaining module 530 is configured to obtain a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature.
The sensitivity determining module 540 is configured to determine a sensitivity level of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
In some embodiments, the resistance obtaining module 510 is further configured to detect a first testing temperature of the sensor testing equipment, and obtain a resistance value of the at least one sensor to be tested when the first testing temperature reaches a first preset testing temperature.
In some embodiments, the sensitivity determining module 540 is further configured to obtain a difference between the first voltage value and the second voltage value of the first sensor; and determining the sensitivity grade of each first sensor according to the difference and a preset sensitivity division rule.
In some embodiments, the sensor testing device may further include a display module.
The display module is used for determining a display identifier corresponding to the sensitivity level of each first sensor; and the display identifier is used for displaying the display identifier corresponding to the sensitivity level of the first sensor.
In some embodiments, the display module is further configured to determine a display identifier corresponding to a second sensor whose resistance value does not satisfy a preset resistance value; and the display identifier is used for displaying the display identifier corresponding to the second sensor.
It is to be understood that the sensor testing apparatus according to the embodiment of the present invention may correspond to the main execution body of the sensor testing method described in the embodiment of the present invention, and specific details of the operation and/or function of each module/unit of the sensor testing apparatus may refer to the descriptions of the corresponding parts in the sensor testing method described in the embodiment of the present invention, which are not described herein again for brevity.
According to the sensor testing device provided by the embodiment of the invention, after the sensor to be tested is placed in the sensor testing equipment, the resistance values of all the sensors to be tested and the voltages of the sensors to be tested at different testing temperatures can be automatically obtained, and then, the sensor testing equipment can automatically judge and obtain the sensitivity of each sensor to be tested according to the obtained resistance values and the voltages of the sensors at different testing temperatures, so that the testing efficiency of the sensors is obviously improved, and the input cost of personnel is reduced.
Fig. 6 is a schematic hardware structure diagram of a sensor testing device according to an embodiment of the present invention.
As shown in fig. 6, the sensor testing device 600 in the present embodiment includes an input device 601, an input interface 602, a central processor 603, a memory 604, an output interface 605, and an output device 606. The input interface 602, the central processing unit 603, the memory 604, and the output interface 605 are connected to each other via a bus 610, and the input device 601 and the output device 606 are connected to the bus 610 via the input interface 602 and the output interface 605, respectively, and further connected to other components of the sensor testing device 600.
Specifically, the input device 601 receives input information from the outside, and transmits the input information to the central processor 603 through the input interface 602; the central processor 603 processes input information based on computer-executable instructions stored in the memory 604 to generate output information, stores the output information temporarily or permanently in the memory 604, and then transmits the output information to the output device 606 through the output interface 605; the output device 606 outputs the output information to the exterior of the sensor testing device 600 for use by a user.
That is, the sensor testing apparatus shown in fig. 6 may also be implemented to include: a memory storing computer-executable instructions; and a processor which, when executing computer executable instructions, may implement the sensor testing methods described in connection with embodiments of the present invention.
In one embodiment, the sensor testing apparatus shown in fig. 6 includes: a memory 604 for storing programs; the processor 603 is configured to run the program stored in the memory to perform the sensor testing method according to the embodiment of the present invention.
An embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium has computer program instructions stored thereon; which when executed by a processor implement the methods described in embodiments of the invention.
It is to be understood that the invention is not limited to the specific arrangements and instrumentality described above and shown in the drawings. A detailed description of known methods is omitted herein for the sake of brevity. In the above embodiments, several specific steps are described and shown as examples. However, the method processes of the present invention are not limited to the specific steps described and illustrated, and those skilled in the art can make various changes, modifications and additions or change the order between the steps after comprehending the spirit of the present invention.
The functional blocks shown in the above-described structural block diagrams may be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, it may be, for example, an electronic Circuit, an Application Specific Integrated Circuit (ASIC), suitable firmware, plug-in, function card, or the like. When implemented in software, the elements of the invention are the programs or code segments used to perform the required tasks. The program or code segments may be stored in a machine-readable medium or transmitted by a data signal carried in a carrier wave over a transmission medium or a communication link. A "machine-readable medium" may include any medium that can store or transfer information. Examples of a machine-readable medium include electronic circuits, semiconductor Memory devices, Read-Only memories (ROMs), flash memories, Erasable ROMs (EROMs), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, Radio Frequency (RF) links, and so forth. The code segments may be downloaded via computer networks such as the internet, intranet, etc.
It should also be noted that the exemplary embodiments mentioned in this patent describe some methods or systems based on a series of steps or devices. However, the present invention is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, may be performed in an order different from the order in the embodiments, or may be performed simultaneously.
Aspects of the present disclosure are described above with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the disclosure. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions/acts specified in the flowchart and/or block diagram block or blocks. Such a processor may be, but is not limited to, a general purpose processor, a special purpose processor, an application specific processor, or a field programmable logic circuit. It will also be understood that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware for performing the specified functions or acts, or combinations of special purpose hardware and computer instructions.
As described above, only the specific embodiments of the present invention are provided, and it can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the system, the module and the unit described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again. It should be understood that the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the present invention, and these modifications or substitutions should be covered within the scope of the present invention.
Claims (12)
1. A method of sensor testing, the method comprising:
acquiring the resistance value of at least one sensor to be detected;
determining a first sensor meeting a preset resistance value according to the resistance value of the at least one sensor to be detected;
acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature;
and determining the sensitivity grade of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
2. The method of claim 1, wherein the obtaining the resistance value of the at least one sensor under test comprises:
detecting a first test temperature of the sensor testing device;
and when the first test temperature reaches the first preset test temperature, acquiring the resistance value of the at least one sensor to be tested.
3. The method of claim 1, wherein determining the sensitivity level of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor comprises:
acquiring a difference value between a first voltage value and a second voltage value of the first sensor;
and determining the sensitivity grade of each first sensor according to the difference and the preset sensitivity division rule.
4. The method of any of claims 1-3, wherein after said determining the sensitivity level of each of said first sensors, the method further comprises:
and determining a display identifier corresponding to the sensitivity level of each first sensor.
5. The method of claim 1, further comprising:
and determining a display identifier corresponding to the second sensor of which the resistance value of the sensor to be detected does not meet the preset resistance value.
6. A sensor testing apparatus, the apparatus comprising:
the resistance acquisition module is used for acquiring the resistance value of at least one sensor to be detected;
the resistance value screening module is used for determining a first sensor meeting a preset resistance value according to the resistance value of the at least one sensor to be tested;
the voltage acquisition module is used for acquiring a first voltage value of each first sensor at a first preset test temperature and a second voltage value of each first sensor at a second preset test temperature;
and the sensitivity judgment module is used for determining the sensitivity grade of each first sensor according to a preset sensitivity division rule and the first voltage value and the second voltage value of each first sensor.
7. The apparatus of claim 6, wherein the resistance acquisition module is further configured to detect a first test temperature of the sensor testing device;
and when the first test temperature reaches the first preset test temperature, acquiring the resistance value of the at least one sensor to be tested.
8. The apparatus of claim 6, wherein the sensitivity determining module is further configured to obtain a difference between a first voltage value and a second voltage value of the first sensor;
and determining the sensitivity grade of each first sensor according to the difference and the preset sensitivity division rule.
9. The apparatus according to any one of claims 6-8, wherein the apparatus further comprises a display module;
the display module is used for determining a display identifier corresponding to the sensitivity level of each first sensor;
and the display identifier is used for displaying the display identifier corresponding to the sensitivity level of the first sensor.
10. The device according to claim 6, wherein the display module is further configured to determine a display identifier corresponding to a second sensor having a resistance value that does not satisfy a preset resistance value;
and the display identifier is used for displaying the display identifier corresponding to the second sensor.
11. A sensor testing apparatus, characterized in that the apparatus comprises: a processor, and a memory storing computer program instructions;
the processor reads and executes the computer program instructions to implement the sensor testing method of any one of claims 1-5.
12. A computer storage medium having computer program instructions stored thereon which, when executed by a processor, implement the sensor testing method of any one of claims 1-5.
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