CN111933064A - Display device and method for inspecting display device - Google Patents
Display device and method for inspecting display device Download PDFInfo
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- CN111933064A CN111933064A CN202010384428.6A CN202010384428A CN111933064A CN 111933064 A CN111933064 A CN 111933064A CN 202010384428 A CN202010384428 A CN 202010384428A CN 111933064 A CN111933064 A CN 111933064A
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Abstract
The invention provides a display device and a method for inspecting the display device, which can make the inspection of the inspector simple by using the BIST function mounted on the display device. The display processing unit (50) performs automatic switching processing of the inspection patterns for sequentially displaying the inspection patterns on the display panel (11) by switching the inspection patterns to the next inspection pattern, executes the processing when an automatic switching signal for executing the processing is input to the inspection terminal (20), and temporarily stops the automatic switching processing of the inspection patterns when a temporary stop signal different from the automatic switching signal is input to the inspection terminal (20), and at this time executes temporary stop processing for continuously displaying the inspection patterns displayed on the display panel (11).
Description
Technical Field
The invention relates to a display device and an inspection method thereof.
Background
Patent documents 1 and 2 below describe an inspection device connected to a liquid crystal display device for inspecting the liquid crystal display device. In the following patent documents 1 and 2, image data of the inspection pattern or a signal of the inspection pattern is transmitted from an inspection device (in patent document 2, a pattern generator) and displayed on a display panel. On the other hand, a function called BIST (build-in Self Test) may be mounted in the display device. When there is an input to the inspection terminal provided in the drive circuit or the like, the BIST is a function of switching a plurality of determined inspection patterns to the next inspection pattern, for example, regardless of the input of the currently displayed image or the like, sequentially displaying the inspection patterns on the display panel, and comparing the display result with the expected value to self-inspect the display device itself. In addition, in some cases, by using this BIST, a plurality of inspection patterns are sequentially displayed on the display panel at the stage of inspection of the display device, and the inspector may visually inspect the display panel.
Documents of the prior art
Patent document
Patent document 1: japanese patent laid-open No. 2008-9208
Patent document 2: japanese patent laid-open publication No. 2004-349997
Disclosure of Invention
Technical problem to be solved by the invention
However, when there is an input to the inspection terminal, the BIST function can only display a plurality of inspection patterns in sequence, and when it is difficult to determine whether or not the inspection is appropriate, there is a problem that the inspection of the pattern cannot be stopped even if the inspection is performed for a long time. Therefore, it is difficult to adopt the BIST function for visual inspection, and for example, as in patent documents 1 and 2, a relatively complicated inspection apparatus has to be connected to perform inspection.
The present invention has been made in view of the above circumstances, and an object thereof is to provide a display device and a method of inspecting a display device, which enable an inspector to easily perform an inspection by using a BIST function mounted on the display device.
Means for solving the problems
(1) A display device according to an embodiment of the present invention includes: a display panel displaying an image; an inspection terminal provided on the display panel; and a display processing unit that performs processing for displaying at least an inspection pattern that is an image for inspecting the display panel on the display panel, wherein the display processing unit performs inspection pattern automatic switching processing for sequentially displaying a plurality of inspection patterns on the display panel to a next inspection pattern, performs the processing when an automatic switching signal for performing the processing is input to the inspection terminal, and performs the processing when a temporary stop signal different from the automatic switching signal is input to the inspection terminal, and performs temporary stop processing for temporarily stopping the inspection pattern automatic switching processing and continuously displaying the inspection pattern displayed on the display panel at this time.
(2) In addition, in the display device according to some embodiments of the present invention, in addition to the configuration of (1), the inspection terminal is selectively inputted with a high potential having a relatively high potential or a low potential having a relatively low potential, the automatic switching signal is inputted as a continuous high potential, and the temporary stop signal is inputted as a low potential pulse.
(3) In addition, in the display device according to the embodiment of the present invention, in addition to the configuration of (2), when the low potential is continuously input to the inspection terminal after the pulse input time elapses, the display processing unit ends execution of the inspection pattern automatic switching process.
(4) In addition to the configuration of any one of (1) to (3), the display processing unit according to some embodiments of the present invention performs a forward switching process of switching an inspection pattern displayed on the display panel from a current inspection pattern to a next inspection pattern when a forward switching signal is input to the inspection terminal during the execution of the temporary stop process.
(5) In addition to the configuration of (4), the display device according to some embodiments of the present invention is a display device in which the display processing unit performs a reverse switching process of switching the inspection pattern displayed on the display panel from the current inspection pattern to the previous inspection pattern when a reverse switching signal is input to the inspection terminal during the execution of the temporary stop process.
(6) In addition, in the display device according to the preferred embodiment of the present invention, in addition to the configuration of (5), one of the forward direction switching signal and the reverse direction switching signal and the pause signal are used as the same first signal, and the other of the forward direction switching signal and the reverse direction switching signal is used as a second signal different from the first signal.
(7) In addition, in the display device according to some embodiments of the present invention, in addition to the configuration of (6), the automatic switching signal is selectively input as a continuous high potential when the inspection terminal has a high potential or a low potential having a relatively low potential, the first signal is input as a pulse having a single low potential for a set time, and the second signal is input as a pulse having a double low potential for a set time.
(8) In addition, in the display device according to some embodiments of the present invention, in addition to any one of the configurations (1) to (7), the display processing unit executes the gradation increasing process of increasing the gradation of the inspection pattern displayed on the display panel when the gradation increasing signal is input to the inspection terminal and executes the gradation lowering process of lowering the gradation of the inspection pattern displayed on the display panel when the gradation lowering signal is input to the inspection terminal during the execution of the temporary stop process.
(9) In addition, in the display device according to the preferred embodiment of the present invention, in addition to the configuration of (8), the display processing unit performs a forward switching process of switching the inspection pattern displayed on the display panel from the inspection pattern at this time to the next inspection pattern when the forward switching signal is input to the inspection terminal during the execution of the temporary stop process, and performs a reverse switching process of switching the inspection pattern displayed on the display panel from the inspection pattern at this time to the previous inspection pattern when the reverse switching signal is input to the inspection terminal, and one of the gradation increase signal and the gradation decrease signal is set to be the same first signal as one of the forward switching signal and the reverse switching signal and the other of the gradation increase signal and the gradation decrease signal, the display processing unit performs switching between an inspection pattern changing mode in which an inspection pattern is changed by the forward switching processing and the reverse switching processing and a gradation changing mode in which a gradation of the inspection pattern is changed by the gradation increasing processing and the gradation decreasing processing when a mode switching signal is input to the inspection terminal.
(10) In addition, in the display device according to some embodiments of the present invention, in addition to the configuration of (9), the inspection terminal is selectively inputted with a high potential having a relatively high potential or a low potential having a relatively low potential, the automatic switching signal is inputted as a continuous high potential, the same first signal is inputted as a pulse having a single low potential for a set time, the same second signal is inputted as a pulse having a double low potential for a set time, and the mode switching signal is inputted as a pulse having a triple low potential for a set time.
(11) In addition, a display device inspection method according to another embodiment of the present invention includes: a display panel displaying an image; an inspection terminal provided on the display panel; a display processing unit configured to perform an automatic switching process of switching a plurality of inspection patterns to a next inspection pattern by itself and sequentially displaying the inspection patterns on the display panel, wherein the display processing unit is configured to execute an automatic switching process of the inspection patterns sequentially displayed on the display panel, the automatic switching process is executed when an automatic switching signal for executing the process is input to the inspection terminal, the automatic switching process is temporarily stopped when a temporary stop signal different from the automatic switching signal is input to the inspection terminal, and the temporary stop process of continuously displaying the inspection patterns displayed on the display panel at that time is executed, the display processing unit including: an automatic switching inspection step of inputting the automatic switching signal to the inspection terminal, wherein the display processing unit performs the inspection of the display panel in a state where the automatic switching process for the inspection pattern is executed, and a temporary stop inspection step of executing the temporary stop process in a state where the temporary stop signal is input to the inspection terminal, and wherein the display processing unit performs the temporary stop process and performs the inspection of the display panel in a state where the temporary stop is stopped.
(12) In addition to the feature of the above (11), a method for inspecting a display device according to an embodiment of the present invention is a method for inspecting a display device, in which an inspection device connected to the inspection terminal and outputting a signal to the inspection terminal is used, the inspection device including: a first button outputting the automatic switching signal when pressed; and a second button that outputs the temporary stop signal when pressed.
(13) In the inspection method for a display device according to some embodiments of the present invention, in addition to the feature of the above (12), the inspection device selectively inputs a high potential having a relatively high potential or a low potential having a relatively low potential, and switches the output potential between the high potential and the low potential each time the first button is pressed, and outputs a single pulse of the low potential for a set time when the second button is pressed, and the display processing unit executes the inspection pattern automatic switching process when the high potential is continuously input to the inspection terminal as the automatic switching signal, and executes the temporary stop process when the single pulse is input to the inspection terminal as the temporary stop signal.
(14) In addition, the inspection method of a display device according to some embodiments of the present invention, in addition to the feature of (13), includes: a third button configured to output a pulse of a low potential twice within the set time when the third button is pressed, wherein the display processing unit is configured to be capable of performing a forward switching process of switching the inspection pattern displayed on the display panel from the current inspection pattern to a next inspection pattern and a reverse switching process of switching the inspection pattern displayed on the display panel from the inspection pattern in that time to a previous inspection pattern, wherein one of the forward switching process and the reverse switching process is performed when the single pulse is input from the inspection terminal, and the other of the forward switching process and the reverse switching process is performed when the pulses of two times are input from the inspection terminal, and wherein the inspection process is temporarily stopped, the second button and the third button can switch the pattern for inspection.
(15) In addition to the feature of (14), the inspection method of a display device according to some embodiments of the present invention is a method of inspecting a display device, wherein the inspection device outputs a pulse having a low potential three times within a set time period when the first button is pressed for a long time, the display processing unit is configured to perform a gray scale increasing process of increasing a gray scale of an inspection pattern displayed on the display panel and a gray scale decreasing process of decreasing a gray scale of the inspection pattern displayed on the display panel during the execution of the temporary stop process, and to switch between an inspection pattern changing mode of changing the inspection pattern by the forward switching process and the reverse switching process and a gray scale changing mode of changing the gray scale of the inspection pattern by the gray scale increasing process and the gray scale decreasing process when the three pulses are input to the inspection terminal, in the gradation changing mode, when the single pulse is input from the inspection terminal, one of the gradation increasing process and the gradation decreasing process is executed, when the two pulses are input from the inspection terminal, the other of the gradation increasing process and the gradation decreasing process is executed, in the temporary stop inspection step, the processing unit switches the inspection pattern change mode and the gradation change mode by pressing the first button for a long time, in the inspection pattern changing mode, the inspection pattern is changed by pressing the second button and the third button, in the gradation change mode, the second button and the third button are pressed to change the gradation, and the display panel is inspected.
Effects of the invention
According to the present invention, it is possible to provide a display device and a display device inspection method that can easily perform an inspection by an inspector by using a BIST function mounted on the display device.
Drawings
Fig. 1 is a schematic view showing a display device according to an embodiment of the present invention and an inspection device for the display device.
Fig. 2 is a diagram showing a plurality of inspection patterns displayed on the display panel in the BIST function of the display device of the present embodiment.
Fig. 3A is a diagram showing a signal output by an operation of the first button of the inspection apparatus shown in fig. 1 and a process performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 3B is a diagram showing a signal output by an operation of the second button of the inspection apparatus shown in fig. 1 and a process performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 3C is a diagram showing a signal output by an operation of the third button of the inspection apparatus shown in fig. 1 and processing performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 4 is a diagram showing an example of a process performed with a time change in the potential inputted from the inspection terminal in the case of inspecting the display device of the present embodiment.
Fig. 5A is a diagram showing a signal output by an operation of the first button of the inspection apparatus shown in fig. 1 and processing performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 5B is a diagram showing a signal output by an operation of the second button of the inspection apparatus shown in fig. 1 and a process performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 5C is a diagram showing a signal output by an operation of the third button of the inspection apparatus shown in fig. 1 and processing performed by the signal thereof in the display apparatus of the present embodiment.
Fig. 6 is an example of a case where the display device of the present embodiment is inspected, and shows a process performed with a temporal change in potential inputted from the inspection terminal.
Fig. 7 is a flowchart showing a process executed in the display device of the present embodiment.
Fig. 8 is a block diagram showing a functional configuration of a display control unit provided in the display device of the present embodiment.
Detailed Description
Hereinafter, several embodiments of the present invention will be described in detail with reference to the drawings as a mode for carrying out the present invention. The present invention is not limited to the following examples, and various modifications, improvements, and the like can be made based on the knowledge of those skilled in the art.
[ example 1]
The display device 10 of the present embodiment is a liquid crystal display device, and mainly includes a liquid crystal panel 11 as a display panel. For simplicity, the liquid crystal panel 11 includes: a pair of substrates 12, 13; the liquid crystal layer is formed of liquid crystal molecules, which are materials that change optical characteristics when an electric field is applied, and are sandwiched between the pair of substrates 12 and 13. Of the pair of substrates 12 and 13 constituting the liquid crystal panel 11, the front side (front side) substrate is a CF substrate (counter substrate) 12, and the back side (back side) substrate is a matrix substrate (TFT substrate, display substrate, active matrix substrate) 13. Both the CF substrate 12 and the matrix substrate 13 are formed by laminating various films on the inner surface side of a glass substrate.
As shown in fig. 1, the matrix substrate 13 is longer in the short-side direction (vertical direction in fig. 1) than the CF substrate 12, and is bonded to the CF substrate 12 in a state of protruding in the short-side direction. The liquid crystal panel 11 further includes: the driver 14 is mounted on a portion of the matrix substrate 13 which is not overlapped with the CF substrate 12, and drives a TFT (thin film transistor) or the like. The display device 10 further includes: the flexible substrate is connected to the liquid crystal panel 11 and has a function of transmitting a signal shown by a display function to the driver 14 and the like.
< BIST function >
The liquid crystal display device 10 has a function called BIST (build-in Self Test), which is a function of Self-testing the liquid crystal display device 10 itself by switching a plurality of predetermined Test patterns to the next Test pattern, sequentially displaying the Test patterns on the liquid crystal panel 11, and comparing the display result with an expected value. Specifically, the liquid crystal display device 10 includes a single inspection terminal 20 provided on the liquid crystal panel 11, and when an input is made to the inspection terminal 20, self-inspection by BIST is performed. Specifically, a high potential having a relatively high potential or a low potential having a relatively low potential is selectively input to the inspection terminal 20, and the liquid crystal display device 10 performs BIST self-inspection when the high potential is continuously input to the inspection terminal 20.
The liquid crystal display device 10 further includes an inspection pattern generating circuit 21 (see fig. 8), and when a high potential is input to the inspection terminal 20, the inspection pattern P1 for inspecting an image of the liquid crystal panel 11 shown in fig. 2 is first displayed on the liquid crystal panel 11 by the inspection pattern generating circuit 21. Thereafter, the inspection patterns P2, P3 ·, which are next to each other, are switched at predetermined time intervals, and these inspection patterns are sequentially displayed on the liquid crystal panel 11. The liquid crystal panel 10 further includes a check circuit 22 (see fig. 8), and the result displayed on the liquid crystal panel 11 by the check circuit 22 is compared and checked with an expected value that is a normal configuration, thereby outputting whether or not the inspection is appropriate. In the liquid crystal display device 10 of the present embodiment, the inspection pattern generating circuit 21 executes an inspection pattern automatic switching process (hereinafter, sometimes referred to as "automatic switching process") for sequentially displaying a plurality of inspection patterns on the liquid crystal panel 11 while switching the inspection patterns to the next inspection pattern. In the present embodiment, as described above, the auto changeover signal, which is a signal for executing the auto changeover process, is a high potential input which is continued.
< automatic switching inspection step >
The liquid crystal display device 10 configured as described above may be inspected for whether or not an image is normally displayed in a manufacturing process or the like. The inspection is performed by visually judging whether or not there is a defect such as a lighting failure by an inspector. For this inspection, the display of an inspection pattern on the liquid crystal panel 11 by the BIST is used. The method of inspecting the liquid crystal device 10 is the method of inspecting the display device of the present embodiment, and the following description will be given together with the mechanism of the liquid crystal display device 10. In the inspection method of the present embodiment, the inspection device 25 shown in fig. 1 is connected to the inspection terminal 20 of the liquid crystal display device 10, and an inspector operates the inspection device 25 and outputs a signal to the inspection terminal 20 to perform a visual inspection while sequentially displaying BIST inspection patterns.
< temporary stop inspection step >
However, as described above, since the BIST function is only used, the inspection pattern is automatically switched to the next inspection pattern after a predetermined time has elapsed, it is difficult to determine whether or not the inspection pattern is closed, and a disadvantage occurs when the inspection is to be carefully performed. In view of this, the liquid crystal display device 10 of the present embodiment is configured to temporarily stop the automatic switching process when a temporary stop signal, which is a signal different from the automatic switching signal, is input to the inspection terminal 20, and to execute a temporary stop process of continuously displaying the inspection pattern displayed on the display panel.
Here, before explaining the temporary stop processing, the configuration of the inspection apparatus 25 will be explained. The inspection device 25 is mainly composed of a computer 30 having a CPU, a ROM, and a RAM, and is pressed by an inspector or the like via three buttons 31, 32, and 33 provided in the inspection device 25 to output signals. More specifically, the inspection device 25 is connected to the inspection terminal 20 of the liquid crystal display device 10 via one signal line 34, and selectively achieves a state (shown as High in the figure) in which a High potential (for example, 3.3V) which is a potential of the voltage supply unit 35 provided therein is output or a state (shown as low in the figure) in which a low potential (for example, 0V which is a ground state) is output (in the figure, in the present embodiment, it is considered that the state is a state in which no output is output). Then, as shown in fig. 3A, the inspection device 25 switches the output potential between the low potential and the high potential each time the first button 31 is pressed. That is, when the inspection device 25 is connected to the liquid crystal display device 10 and the first button 31 is first pressed, the output is switched from the low potential to the high potential, and the high potential is continuously output. Accordingly, in the liquid crystal display panel 10, the high potential is continuously input from the inspection terminal 20, and the auto-switching process is executed. When the first button 31 is pressed again during execution of the automatic switching process, the output of the inspection device 25 is switched from the high potential to the low potential, and the liquid crystal display device 10 ends execution of the automatic switching process.
Further, as shown in fig. 3B, the inspection device 25 continues to output the inspection data when the first button 31 is pressedWhen the second button 32 is pressed in the high state, the output is outputted for a set time t0A single low-potential pulse (hereinafter, sometimes simply referred to as "1 pulse") having an amplitude of not more than (e.g., 10 msec). Further, as shown in fig. 3C, the inspection device 25 presses the third button 33 in a state where the first button 31 is pressed and the high potential is continuously outputted, and then the set time t is set0The internal output is pulsed twice from the low potential (hereinafter, sometimes referred to as "2 pulses").
Next, a temporary stop process, which is not described yet, will be described. The temporary stop processing is executed when the 1 pulse is input from the inspection terminal 20 as a temporary stop signal which is a signal for executing the temporary stop processing during execution of the automatic switching processing. That is, during execution of the automatic switching process, the inspector pushes the second button 32 of the inspection device 25 to output 1 pulse from the inspection device 25, and the automatic transfer of the inspection pattern is temporarily stopped in the liquid crystal display device 10 by the temporary stopping process. Therefore, the liquid crystal display device 10 of the present embodiment can perform the visual inspection by the BIST function by performing the temporary stop processing for temporarily stopping the automatic transfer of the inspection pattern of the BIST function. In addition, the liquid crystal display device 10 of the present embodiment does not need to increase the number of terminals to which signals for executing the temporary stop process are input, since only a single inspection terminal 20 can receive both the automatic switching signal and the temporary stop signal.
In addition, in the present liquid crystal display device 10, the time t is set as described above0The low potential pulse is input to automatically switch the low potential state for over the set time t0In the case of (2), the process ends.
(I) Pattern change pattern for inspection
In the liquid crystal display device 10 of the present embodiment, the inspection pattern may be changed by inputting a signal from the inspection terminal 20 during the execution of the temporary stop process. Specifically, the liquid crystal display device 10 may perform a forward switching process for switching the inspection pattern from the current inspection pattern to the next inspection pattern and a reverse switching process for switching the inspection pattern to the previous inspection pattern.
First, the forward switching process is performed when a forward switching signal, which is a signal for performing the forward switching process, is input from the inspection terminal 20. The forward direction switching signal is 1 pulse, which is the same as the temporary stop signal. That is, as shown in fig. 3B, when the second button 32 of the inspection device 25 is pressed by the inspector during execution of the automatic switching process, and after the temporary stop process is executed in the liquid crystal display device 10, the second button 32 is pressed again by the inspector, 1 pulse as the first signal is output from the inspection device 25, and the forward switching process is executed in the liquid crystal display device 10 and the inspection pattern is switched to the next inspection pattern. For example, in the inspection pattern P3, when the temporary stop process is executed, the inspection pattern displayed on the liquid crystal panel 11 is sequentially switched to the inspection pattern P4 and the inspection pattern P5 each time the second button 32 is pressed.
On the other hand, the reverse switching process is executed when a reverse switching signal, which is a signal for executing the reverse switching process, is input from the inspection terminal 20. Which switches the signal inversely as said 2 pulses. That is, as shown in fig. 3C, when the inspector presses the third button 33 during the execution of the temporary stop process, 2 pulses as the second signal are output from the inspection device 25, and the liquid crystal display device 10 performs the reverse switching process to switch the inspection pattern to the previous inspection pattern. For example, when the inspection pattern P6 is displayed on the liquid crystal panel 11 by the temporary stop processing, the inspection patterns displayed on the liquid crystal panel 11 are sequentially switched to the inspection pattern P5, the inspection pattern P4, and the inspection pattern P3 each time the third button 33 is pressed.
An example of the case of inspecting the present liquid crystal display device 10 will be described with reference to a temporal change in the potential inputted from the inspection terminal 20 in fig. 4. After the present liquid crystal display device 10 and the inspection device 25 are connected, the inspector presses the first button 31 of the inspection device 25 to cause the inspection pattern automatic switching process to be executed. Then, during execution of the automatic switching process, the second button 32 is pressed to temporarily stop the execution of the process, and at this time, the inspection pattern (for example, inspection pattern) displayed on the liquid crystal panel 11 is continuously displayed. Thereby, the inspector can carefully inspect the inspection pattern P5. When the inspector wants to inspect the previous pattern for inspection P4 or P3 again, the inspector manually switches the inspection pattern by pressing the third button 33 and performing the reverse switching process or by pressing the second button 32 and performing the forward switching process, and can inspect each pattern for inspection carefully and improve the accuracy of visual inspection.
(II) Gray level Change mode
The liquid crystal panel 11 has a defect that it can be found only at certain specific gray scales. Therefore, the present liquid crystal display device 10 is configured to be able to change the gradation of the inspection pattern (particularly, the inspection pattern formed of one color of P1 to P5) displayed on the liquid crystal panel 11 by the temporary stop processing. Since the gray scale is changed by the second button 32 and the third button 33 of the inspection device 25, that is, by the 1 pulse and the 2 pulse inputted from the inspection terminal 20, the present liquid crystal display device 10 can be switched between the inspection pattern changing mode in which the inspection pattern is changed by the 1 pulse and the 2 pulse described above and the gray scale changing mode in which the gray scale is changed by the 1 pulse and the 2 pulse.
In the liquid crystal display device 10 of the present embodiment, the mode switching signal, which is a signal for switching the mode, is set to be a signal for the set time t0The pulse (hereinafter, may be referred to as "3 pulses") is inputted 3 times from the low potential. Further, as shown in fig. 5A, the inspection device 25 is pressed for a long time by the first button 31 and the set time t elapses1(e.g., 1.0sec), 3 pulses are output. That is, the inspection method of the liquid crystal display device 10 can be switched from the inspection pattern changing mode to the gradation changing mode and from the gradation changing mode to the inspection pattern changing mode every time the first button 31 of the inspection device 25 is pressed for a long time.
Then, in the present liquid crystal display device 10, in the gradation change mode, when the second button 32 is pressed and 1 pulse is input, gradation increase processing for increasing the gradation (turning on) is executed, and when the third button 33 is pressed and 2 pulses is input, gradation decrease processing for decreasing the gradation (turning off) is executed. That is, the gradation increasing signal, which is a signal for performing the gradation increasing process, is regarded as the same signal (the same first signal) as the forward switching signal, i.e., 1 pulse, and the gradation lowering signal, which is a signal for performing the gradation lowering process, is regarded as the same signal (the same second signal) as the reverse switching signal, i.e., 2 pulse.
Therefore, the liquid crystal display device 10 of the present embodiment can find out defects that appear only in a specific gradation, and improve the accuracy of visual inspection. In addition, the inspection pattern and the gray scale can be changed by the same first signal (1 pulse) and the same second signal (2 pulses), and the inspection device 25 can be simple. More specifically, the liquid crystal display device 10 of the present embodiment can execute the plurality of processes described above, but the input signals are only three signals of 1 pulse, 2 pulses, and 3 pulses, whereas the inspection method of the present embodiment is a simple inspection because only the three buttons 31, 32, and 33 provided in the inspection device 25 need to be operated. In the liquid crystal display device 10 of the present embodiment, even with a simple configuration in which a high potential or a low potential is selectively input to the inspection terminal 20, the inspector can manually change the inspection pattern and the gradation.
As shown in fig. 5B, when the second button 32 is pressed for a long time, the inspection device 25 sets a time t after the lapse of the set time t1Then, 1 pulse is continuously output, and the output is continued when the second button 32 is pressed. Similarly, as shown in fig. 5C, the inspection device 25, in the case where the third button 33 is pressed for a long time, sets a time t from the elapse1The 2 pulses are then continuously output, and when the third button 33 is pressed, the output is continued. In addition, the signal and the interval of the signal are regarded as larger than the amplitude t of the 1 pulse, 2 pulses and 3 pulses0T of2(e.g., 15msec), in the liquid crystal display device 10, the 1 pulse and the 2 pulses that are continuous are not recognized as the 2 pulse and the 3 pulse. Thus, a larger number of gray levels are set for the gray levels, but the inspection method of the present embodiment can be applied to the gray levelsThe gradation can be easily changed. Incidentally, the setting time t may be determined in consideration of the time for changing from the lower limit to the upper limit of the gradation2Based on which the time t is set2(in detail, the ratio t is2Shortened mode), determines the length t of the signal0。
An example of the case of inspecting the present liquid crystal display device 10 will be described with reference to a temporal change in the potential inputted from the inspection terminal 20 in fig. 6. After the present liquid crystal display device 10 and the inspection device 25 are connected, the inspector causes the inspection pattern automatic switching process to be executed by pressing the first button 31 of the inspection device 25. Further, in the execution of the automatic switching process, the execution of the process is temporarily stopped by pressing the second button 32, and at this time, the pattern for inspection displayed on the liquid crystal panel 11 is continuously displayed. Further, the inspector presses the first button 31 for a long time to switch from the inspection pattern to the gradation change mode. In this gradation change mode, the gradation can be increased by one gradation by pressing the second button 32, and the gradation can be continuously increased by pressing the second button 32 for a long time. In addition, by long-pressing the third button 33, the gradation can be made to continuously decrease. Therefore, according to the inspection method of the present embodiment, it is possible to inspect one pattern for inspection carefully while changing the gradation.
< flow of displaying inspection Pattern >
In the liquid crystal display device 10, a signal outputted from the inspection device 25 is inputted from the inspection terminal 20, and the processing of the flowchart shown in fig. 7 is executed based on the inputted signal. In the liquid crystal display device 10, when a high potential is continuously input from the inspection terminal 20, the process of the flowchart shown in fig. 7 is started. In this process, first, in step 1 (hereinafter, may be abbreviated as "S1" or the other steps are the same as described above), it is determined whether or not a pulse of a single low potential (1 pulse) is input, and if no input is input, in S2, the automatic pattern switching process for inspection is executed.
If the 1 pulse is input in S1, the temporary stop process is executed and the inspection pattern automatic switching process is temporarily stopped in S3, and the inspection pattern displayed on the liquid crystal panel 11 continues to be displayed. Next, in S4, it is determined whether or not 1 pulse is input, and if 1 pulse is input, the forward direction switching process is executed in S5 to switch to the next inspection pattern. In addition, in S6, it is determined whether or not 2 pulses are input, and when 2 pulses are input, in S7, the reverse switching process is executed and the previous inspection pattern is switched. Further, in S8, it is determined whether or not 3 pulses are input, and if no 3 pulses are input, the processing of S4 or less is repeated.
On the other hand, in S8, when the 3-pulse input is made, the mode is switched from the inspection pattern changing mode in the above-described processing from S4 to S7 to the gradation changing mode in the processing from S9 to S12. In the gradation change mode, it is determined whether or not 1 pulse is input in S9, and when 1 pulse is input, gradation increase processing is executed in S10 to increase the gradation by one level (to lighten). In addition, in S11, it is determined whether or not 2 pulses are input, and when 2 pulses are input, in S12, the gradation lowering process is executed, and the gradation is lowered by 1 level (darkened). Then, in S13, it is determined whether or not 3 pulses are input, and if no 3 pulses are input, the processing of S9 or less is repeated. In S13, when 3 pulses are input, the process is executed at S4 or less, and the mode returns from the gradation change mode to the inspection pattern change mode.
In the processing shown in the flowchart, the duration of the low potential exceeds the time t, which is the amplitude of 1 pulse, 2 pulses, and 3 pulses0And (4) end in the case of (1).
< functional Structure of display processing Unit >
The liquid crystal display device 10 may be considered to include: the display processing unit 50 executes a processing function unit shown in the flowchart, that is, performs processing for displaying an inspection pattern, which is at least an image for inspecting the liquid crystal panel 11, on the liquid crystal panel 11, which is a display panel. The display processing unit 50 has a functional configuration as shown in the block diagram of fig. 8, and may have several functional units.
Specifically, the display processing unit 50 includes an inspection pattern automatic switching processing unit as a functional unit for executing the inspection pattern automatic switching processing as the processing of S2, and the inspection pattern generating circuit 21 plays a role in the inspection pattern automatic switching unit. The display processing unit 50 further includes: and a temporary stop processing unit 51 that is a functional unit for performing the processing of S1 and S3, and executes the temporary stop processing when a temporary stop signal (1 pulse) is input to the inspection terminal 20.
The display processing unit 50 further includes: the inspection pattern change pattern execution unit 52 changes the inspection pattern as a functional unit for performing the processing of S4 to S7. The inspection pattern change pattern execution unit 52 includes: a forward switching processing unit 53 that is a functional unit for performing the processing of S4 and S5, and executes the forward switching processing when a forward switching signal (1 pulse, the same first signal) is input to the inspection terminal 20; and a reverse switching processing unit 54 configured to perform the reverse switching processing when the reverse switching signal (2 pulses, the same second signal) is input to the inspection terminal 20 as a functional unit for performing the processing of S6 and S7.
Further, the display processing unit 50 includes: and a gradation change mode execution unit 55 which is a functional unit for performing the processing of S9 to S12 and changes the gradation of the inspection pattern displayed on the liquid crystal panel 11. The gradation change pattern execution unit 55 includes: a tone scale enhancement processing unit 56 that performs tone scale enhancement processing when a tone scale enhancement signal (1 pulse, the same first signal) is input to the inspection terminal 20 as a functional unit for performing the processing of S9 and S10; the gradation lowering processing unit 57 is a functional unit for performing the processing of S11 and S12, and is configured to execute the gradation lowering processing when the gradation lowering signal (2 pulses, the same second signal) is input to the inspection terminal 20.
Then, the display processing unit 50 includes: and a mode switching unit 58 as a functional unit for performing the processing of S8 and S13, which selectively executes the processing by the inspection pattern change mode execution unit 52 and the processing by the gradation change mode execution unit 55 when a mode switching signal (3 pulses) is input to the inspection terminal 20.
< other embodiment >
The liquid crystal display device 10 of the above embodiment can execute the processing of changing the inspection pattern and the processing of changing the gradation, but the display device of the present invention may be configured to execute only the automatic inspection pattern switching processing and the temporary stop processing. For example, the automatic inspection pattern switching process may be configured to execute the temporary stop process when a 1 pulse, which is a temporary stop signal, is input, and to cancel the temporary stop process and execute the automatic inspection pattern switching process again when a 1 pulse is input again.
In addition, the liquid crystal display device 10 of the above embodiment is made as signals different from each other by making the number of pulses different, but may be made as signals different from each other by, for example, the amplitude (length) of the pulses.
The display device and the inspection method of the present invention are not limited to the liquid crystal display device, and can be applied to a display device using an organic EL panel, and the like.
Description of the reference numerals
10. Liquid crystal display device [ display device ], 11, liquid crystal panel [ display panel ], 20, inspection terminal, 21, inspection pattern generating circuit [ inspection pattern automatic switching processing part ], 25, inspection device, 31, first button, 32, second button, 33, third button, 50, display processing part, 51, temporary stop processing part, 52, inspection pattern change mode execution part, 53, forward direction switching processing part, 54, reverse direction switching processing part, 55, gray scale change mode execution part, 56, gray scale increase processing part, 57, gray scale reduction processing part, 58, mode switching part.
Claims (15)
1. A display device is characterized by comprising:
a display panel displaying an image; an inspection terminal provided on the display panel; and a display processing unit that performs processing for displaying at least an inspection pattern that is an image for inspecting the display panel on the display panel, wherein the display processing unit performs inspection pattern automatic switching processing for switching a plurality of inspection patterns to a next inspection pattern and sequentially displaying the inspection patterns on the display panel, the display processing unit performs the processing when an automatic switching signal for performing the processing is input to the inspection terminal, and the display processing unit performs temporary stopping processing for temporarily stopping the inspection pattern automatic switching processing when a temporary stopping signal different from the automatic switching signal is input to the inspection terminal, and continuously displaying the inspection pattern displayed on the display panel at this time.
2. The display device according to claim 1, wherein the inspection terminal is selectively inputted with a high potential having a relatively high potential or a low potential having a relatively low potential,
the automatic switching signal is inputted as a continuous high potential, and the temporary stop signal is inputted as a low potential pulse.
3. The display device according to claim 2, wherein the display processing unit ends execution of the inspection pattern automatic switching process when a low potential is continuously input to the inspection terminal after the pulse input time elapses.
4. The display device according to any one of claims 1 to 3, wherein the display processing unit executes, when a forward direction switching signal is input to the inspection terminal during execution of the temporary stop processing, forward direction switching processing for switching the inspection pattern displayed on the display panel from the current inspection pattern to a next inspection pattern.
5. The display device according to claim 4, wherein the display processing unit executes reverse switching processing for switching the inspection pattern displayed on the display panel from the current inspection pattern to a previous inspection pattern when a reverse switching signal is input to the inspection terminal during execution of the temporary stop processing.
6. The display device according to claim 5, wherein one of the forward direction switching signal and the reverse direction switching signal and the pause signal are used as a same first signal, and the other of the forward direction switching signal and the reverse direction switching signal is used as a second signal different from the first signal.
7. The display device according to claim 6, wherein the inspection terminal is selectively inputted with a high potential having a relatively high potential or a low potential having a relatively low potential,
the automatic switching signal is input as a continuous high potential, the first signal is input as a single pulse of a low potential within a set time, and the second signal is input as a pulse of a low potential twice within a set time.
8. The display device according to any one of claims 1 to 3 and 5 to 7, wherein the display processing unit executes, in the execution of the temporary stop processing, gradation increase processing for increasing a gradation of the inspection pattern displayed on the display panel when a gradation increase signal is input to the inspection terminal, and executes gradation reduction processing for reducing the gradation of the inspection pattern displayed on the display panel when a gradation reduction signal is input to the inspection terminal.
9. The display device according to claim 8, wherein the display processing section,
in the execution of the temporary stop processing, when a forward direction switching signal is input to the inspection terminal, forward direction switching processing for switching the inspection pattern displayed on the display panel from the current inspection pattern to a next inspection pattern is executed, and when a reverse direction switching signal is input to the inspection terminal, reverse direction switching processing for switching the inspection pattern displayed on the display panel from the current inspection pattern to a previous inspection pattern is executed,
one of the gradation increasing signal and the gradation decreasing signal is used as the same first signal as one of the forward switching signal and the reverse switching signal, and the other of the gradation increasing signal and the gradation decreasing signal is used as the same second signal as the other of the forward switching signal and the reverse switching signal,
the display processing unit performs switching between an inspection pattern changing mode in which the inspection pattern is changed by the forward switching processing and the reverse switching processing and a gradation changing mode in which the gradation of the inspection pattern is changed by the gradation increasing processing and the gradation decreasing processing when a mode switching signal is input to the inspection terminal.
10. The display device according to claim 9, wherein the inspection terminal is selectively inputted with a high potential having a relatively high potential or a low potential having a relatively low potential,
the automatic switching signal is input as a continuous high potential, the same first signal is input as a pulse of a single low potential for a set time, the same second signal is input as a pulse of a double low potential for a set time, and the mode switching signal is input as a pulse of a triple low potential for a set time.
11. A method for inspecting a display device,
the display device is used for checking the display device, and the display device is provided with: a display panel displaying an image; an inspection terminal provided on the display panel; a display processing unit that performs processing for displaying at least an inspection pattern, which is an image for inspecting the display panel, on the display panel,
the display processing unit is configured to perform automatic switching processing for switching a plurality of inspection patterns to a next inspection pattern and sequentially displaying the inspection patterns on the display panel, wherein the automatic switching processing is performed when an automatic switching signal for performing the automatic switching processing is input to the inspection terminal, and the automatic switching processing is temporarily stopped when a temporary stop signal different from the automatic switching signal is input to the inspection terminal, and the temporary stop processing for continuously displaying the inspection patterns displayed on the display panel at that time is performed,
comprises the following steps: an automatic switching inspection step of performing inspection of the display panel in a state where the display processing unit executes the inspection pattern automatic switching process by inputting the automatic switching signal to the inspection terminal,
and a temporary stop inspection step of executing the temporary stop process by the display processing unit when the temporary stop signal is input to the inspection terminal, and performing the inspection of the display panel in a state where the temporary stop process is temporarily stopped.
12. The method of inspecting a display device according to claim 11, wherein an inspection device connected to the inspection terminal and outputting a signal at the inspection terminal is used,
the inspection device is provided with: a first button outputting the automatic switching signal when pressed; and a second button that outputs the temporary stop signal when pressed.
13. The inspection method for a display device according to claim 12,
the inspection apparatus selectively inputs a high potential having a relatively high potential or a low potential having a relatively low potential,
the output potential is switched between high potential and low potential every time the first button is pressed, and under the condition that the second button is pressed, a single pulse with low potential within a set time is output,
the display processing unit executes the inspection pattern automatic switching processing when a high potential is continuously input to the inspection terminal as the automatic switching signal, and executes the temporary stopping processing when the single pulse is input to the inspection terminal as the temporary stopping signal.
14. The method of inspecting a display device according to claim 13, wherein the inspection device comprises: a third button, which outputs a pulse of a low potential twice within the set time when pressed,
the display processing unit is configured to be capable of performing forward switching processing for switching an inspection pattern displayed on the display panel from an inspection pattern at that time to a next inspection pattern and reverse switching processing for switching an inspection pattern displayed on the display panel from an inspection pattern at that time to a previous inspection pattern during execution of the temporary stop processing, and to perform one of the forward switching processing and the reverse switching processing when the single pulse is input from the inspection terminal and to perform the other of the forward switching processing and the reverse switching processing when the double pulses are input from the inspection terminal,
the temporary stop inspection step may switch the inspection pattern by the second button and the third button.
15. The inspection method for a display device according to claim 14,
the checking device outputs a pulse with a low potential three times in a set time when the first button is pressed for a long time,
the display processing section is configured to perform a display process,
in the execution of the temporary stop process, a gradation increase process of increasing the gradation of the inspection pattern displayed on the display panel and a gradation decrease process of decreasing the gradation of the inspection pattern displayed on the display panel may be executed,
wherein when the three-time pulse is input to the inspection terminal, an inspection pattern changing mode for changing the inspection pattern by the forward switching process and the reverse switching process and a gradation changing mode for changing the gradation of the inspection pattern by the gradation increasing process and the gradation decreasing process are switched,
in the gradation changing mode, one of the gradation increasing process and the gradation decreasing process is executed when the single pulse is input from the inspection terminal, and the other of the gradation increasing process and the gradation decreasing process is executed when the two pulses are input from the inspection terminal,
in the temporary-stop inspection step, the processing unit switches the inspection pattern change mode and the gradation change mode by pressing the first button for a long time, changes the inspection pattern by pressing the second button and the third button in the inspection pattern change mode, and performs the inspection of the display panel while changing the gradation by pressing the second button and the third button in the gradation change mode.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153565A (en) * | 1984-01-21 | 1985-08-13 | Hitachi Medical Corp | Method for forming characteristic curve in picture processing |
| CN1499467A (en) * | 2002-10-28 | 2004-05-26 | 精工爱普生株式会社 | Electrooptical device, its drive method and electronic appliance |
| CN1517971A (en) * | 2003-01-10 | 2004-08-04 | 夏普株式会社 | Display device, drive circuit, checking device, recording medium |
| KR20070079831A (en) * | 2006-02-03 | 2007-08-08 | 삼성전자주식회사 | Display apparatus and control method thereof |
| CN101277561A (en) * | 2007-03-28 | 2008-10-01 | 三洋电机株式会社 | Light emitting display device |
| CN104508736A (en) * | 2012-09-24 | 2015-04-08 | 松下知识产权经营株式会社 | Liquid crystal display device |
| CN205692545U (en) * | 2016-06-17 | 2016-11-16 | 深圳贝力佳电子科技有限公司 | A kind of screen test equipment |
-
2020
- 2020-05-07 CN CN202010384428.6A patent/CN111933064B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153565A (en) * | 1984-01-21 | 1985-08-13 | Hitachi Medical Corp | Method for forming characteristic curve in picture processing |
| CN1499467A (en) * | 2002-10-28 | 2004-05-26 | 精工爱普生株式会社 | Electrooptical device, its drive method and electronic appliance |
| CN1517971A (en) * | 2003-01-10 | 2004-08-04 | 夏普株式会社 | Display device, drive circuit, checking device, recording medium |
| KR20070079831A (en) * | 2006-02-03 | 2007-08-08 | 삼성전자주식회사 | Display apparatus and control method thereof |
| CN101277561A (en) * | 2007-03-28 | 2008-10-01 | 三洋电机株式会社 | Light emitting display device |
| CN104508736A (en) * | 2012-09-24 | 2015-04-08 | 松下知识产权经营株式会社 | Liquid crystal display device |
| CN205692545U (en) * | 2016-06-17 | 2016-11-16 | 深圳贝力佳电子科技有限公司 | A kind of screen test equipment |
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|---|---|
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