Disclosure of Invention
The invention aims to provide a gas component measuring method, a device, equipment and a computer readable storage medium, which can avoid the problem that a single infrared cell is difficult to accurately measure the content of a specific component in a gas stream.
In order to solve the technical problems, the invention provides a gas component measuring method, which comprises the following steps:
controlling the air flow of the gas to be detected to be respectively introduced into an infrared high tank and an infrared low tank, wherein the tank length of the infrared high tank is longer than that of the infrared low tank;
the particle numbers of specific components in the gas to be detected in the infrared high tank and the infrared low tank are collected in real time, so that the particle numbers of a plurality of infrared high tanks and the particle numbers of a plurality of infrared low tanks are obtained;
and determining the particle number of the specific component in the gas to be detected according to the infrared high-cell particle number and the infrared low-cell particle number.
Optionally, determining the particle number of the specific component in the gas to be measured according to the infrared high-cell particle number and the infrared low-cell particle number includes:
when the number of the infrared high-pool particles is larger than the preset number of particles, taking the number of the infrared high-pool particles as the number of the particles of the specific component;
and when the infrared high-pool particle number is smaller than the preset particle number, taking the infrared low-pool particle number as the particle number of the specific component.
Optionally, determining the particle number of the specific component in the gas to be measured according to the infrared high-cell particle number and the infrared low-cell particle number includes:
When the number of the infrared high-pool particles is larger than a first preset particle number, taking the number of the infrared high-pool particles as the particle number of the specific component;
when the infrared low-pool particle number is smaller than a second preset particle number, taking the infrared low-pool particle number as the particle number of the specific component;
when the number of the infrared high-pool particles is smaller than the first preset particle number and the number of the infrared low-pool particles is larger than the second preset particle number, according to a particle number formula of the specific component in the transition section: n=a·n+ (1-a) ·n', obtaining the particle number; wherein N is the number of particles of the specific component, a is a weight coefficient, a is more than 0 and less than 1, N is the number of infrared high-pool particles, and N' is the number of infrared low-pool particles; the first predetermined number of particles is greater than the second predetermined number of particles.
Optionally, determining the particle number of the specific component in the gas to be measured according to the infrared high-cell particle number and the infrared low-cell particle number includes:
according to the continuously and repeatedly measured size change trend of the infrared high-pool particles, determining an ascending measurement interval in which the number of the infrared high-pool particles is in an increasing trend, and determining a descending measurement interval in which the number of the infrared high-pool particles is in a decreasing trend;
Obtaining a first reference infrared high pool particle number with the smallest difference between the infrared high pool particle number measured in the ascending measurement area and a third preset particle number; obtaining a second reference infrared high pool particle number with the smallest difference between the infrared high pool particle number measured in the descending measurement area and the fourth preset particle number;
taking a measurement interval in a preset measurement frequency range where the first reference infrared high-pool particle number is adjacent as a first transition interval, and taking a measurement interval in a preset measurement frequency range where the second reference infrared high-pool particle number is adjacent as a second transition interval; calculating and obtaining the particle number of the specific component measured in the first transition zone and the second transition zone according to a first transition formula and a second transition formula respectively;
an infrared low pool particle number measured with the infrared low pool in each measurement within the rising measurement interval before the first transition interval and within the falling measurement interval after the second transition interval as a particle number of the specific component;
the infrared high pool particle number measured with the infrared Gao Chi in each measurement after the first transition interval in the rising measurement interval and before the second transition interval in the falling measurement interval is the particle number of the specific component.
Optionally, calculating the number of particles of the specific component measured in the first transition zone and the second transition zone with a first transition formula and a second transition formula, respectively, includes:
combining the first transition formula according to the first reference infrared high pool particle number, the first infrared low pool particle number and the first transition formula:calculating the particle number N of the specific component in the first transition zone 1 Where k is the measurement number constant, p 1 For the first index coefficient, n is the number of infrared high pool particles, n' is the number of infrared low pool particlesAn amount of;
combining the second transition formula according to the measured infrared high pool particle number and the measured infrared low pool particle number k times before the second reference infrared high pool particle number:calculating the particle number N of the specific component in the second transition zone 2 Wherein p is 2 Is the second exponential coefficient.
Optionally, calculating the number N of particles of the specific component to obtain the first transition zone 1 Comprising:
when the rising slope of the quantity of the infrared high pool particles measured in the first transition zone is larger than a preset slope, the first index coefficient p is increased 1 ;
Correspondingly, the particle number N of the specific component of the first transition zone is calculated 1 Comprising:
when the magnitude of the decreasing slope of the quantity of the infrared high pool particles measured in the second transition section is larger than the preset slope, the second index coefficient p is increased 2 。
There is also provided herein a gas composition measuring device comprising:
the air flow control module is used for controlling the air flow of the air to be detected to be respectively led into the infrared high tank and the infrared low tank, wherein the tank length of the infrared high tank is longer than that of the infrared low tank;
the data acquisition module is used for acquiring the particle numbers of specific components in the gas to be detected in the infrared high tank and the infrared low tank in real time to obtain a plurality of infrared high tank particle numbers and a plurality of infrared low tank particle numbers;
and the data operation module is used for determining the particle number of the specific component in the gas to be detected according to the infrared high-pool particle number and the infrared low-pool particle number.
Optionally, the data operation module includes:
the interval dividing unit is used for determining an ascending measurement interval in which the quantity of the infrared high-tank particles is in an increasing trend and determining a descending measurement interval in which the quantity of the infrared high-tank particles is in a decreasing trend according to the continuously measured quantity change trend of the infrared high-tank particles for multiple times;
The reference particle number unit is used for obtaining a first reference infrared high-pool particle number with the smallest difference value between the infrared high-pool particle number measured in the ascending measurement area and the third preset particle number; obtaining a second reference infrared high-pool particle number with the smallest difference between the infrared high-pool particle number measured in the descending measurement area and the fourth preset particle number;
the transition interval unit is used for taking a measurement interval in a preset measurement frequency range adjacent to the first reference infrared high-pool particle number as a first transition interval and taking a measurement interval in a preset measurement frequency range adjacent to the second reference infrared high-pool particle number as a second transition interval; calculating and obtaining the particle number of the specific component measured in the first transition zone and the second transition zone according to a first transition formula and a second transition formula respectively;
an infrared low pool particle unit for taking the number of infrared low pool particles measured by the infrared low pool as the number of particles of the specific component in each measurement within the rising measurement interval before the first transition interval and within the falling measurement interval after the second transition interval;
An infrared high pool particle unit for taking the infrared high pool particle number measured by the infrared Gao Chi as the particle number of the specific component in each measurement after the first transition interval in the rising measurement interval and before the second transition interval in the falling measurement interval.
The application also provides a gas component measuring device, which comprises a sample chamber to be measured, a flow stabilizing valve, infrared Gao Chi, an infrared low cell, a first infrared sensor, a second infrared sensor and a processor;
the output end of the sample chamber to be tested is connected with the input end of the flow stabilizing valve, the first output end of the flow stabilizing valve is connected with the infrared high tank, the second output end of the flow stabilizing valve is connected with the infrared low tank, and Chi Changxiao of the infrared high tank is longer than that of the infrared low tank;
the first infrared sensor is used for detecting infrared light energy in the infrared high-tank and outputting infrared high-tank response voltage;
the second infrared sensor is used for detecting infrared light energy in the infrared low tank and outputting infrared low tank response voltage;
the processor is configured to obtain an infrared high cell particle number and an infrared low cell particle number from the infrared high cell response voltage and the infrared low cell response voltage, respectively, to perform the operating steps of implementing the gas component measurement method as described in any one of the above.
The present application also provides a computer-readable storage medium storing a computer program that is executed by a processor to perform the operational steps of the gas composition measurement method according to any one of the above.
The gas component measuring method provided by the invention comprises the steps of controlling the gas flow of the gas to be measured to be respectively introduced into an infrared high tank and an infrared low tank, wherein the tank length of the infrared high tank is longer than that of the infrared low tank; the particle numbers of specific components in the gas to be detected in the infrared high tank and the infrared low tank are collected in real time, so that the particle numbers of a plurality of infrared high tanks and the particle numbers of a plurality of infrared low tanks are obtained; and determining the particle number of the specific component in the gas to be detected according to the infrared high-cell particle number and the infrared low-cell particle number.
In the application, when measuring the gas components, an infrared high tank and an infrared low tank are used for parallel measurement, the air flow to be measured is simultaneously introduced into the infrared high tank and the infrared low tank, and the final measurement result is determined jointly by combining the measurement results of the infrared high tank and the infrared low tank. The measuring mode largely avoids the problems that the infrared Gao Chi or infrared low pool can not be used or the infrared Gao Chi is used or the infrared low pool is used because the concentration of the air flow to be measured is unknown and the air flow is in a change trend along with the inflow of the air flow, and the measuring result is inaccurate.
The application also provides a gas component measuring device, equipment and a computer readable storage medium, which have the beneficial effects.
Detailed Description
When the content of substances or elements is measured in the infrared pool, the substances or elements are converted into gas states to form gas to be measured, the gas flow of the gas to be measured flows through the infrared pool, and the substances or elements in the gas to be measured are determined according to the magnitude of infrared induction signals measured by the infrared sensor based on the lambert beer law.
However, if the substance or element to be measured exists in a solid or liquid form, it is often necessary to convert the state of the substance or element into a gaseous state by means of a chemical reaction such as combustion, and the speed of the gas to be measured generated in the chemical reaction process is often not constant, which results in that the concentration of the gas to be measured introduced into the infrared cell is changed.
Based on the requirement of the accuracy of the infrared cell measurement, when the concentration of the gas to be measured is larger, an infrared high cell with shorter length is needed, and when the concentration of the gas to be measured is smaller, an infrared low cell with longer length is needed. The concentration of the air flow introduced into the infrared pool is in a changing state, so that the particle number of a specific substance of the air flow to be measured in the air flow at each time point along with the air flow is accurately measured in real time, and the measurement precision can be influenced by singly using the infrared high pool or the infrared low pool.
The infrared high pool and the infrared low pool are mutually switched, so that the measurement accuracy can be improved. However, because the specific concentration change of the airflow to be measured is unknown, it is difficult to determine a more accurate switching time, and thus the inaccuracy of the measurement result is caused.
Therefore, the technical scheme for measuring the content of the components in the gas by using the infrared pool is provided, and the measurement accuracy can be improved to a certain extent.
In order to better understand the aspects of the present invention, the present invention will be described in further detail with reference to the accompanying drawings and detailed description. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
As shown in fig. 1, fig. 1 is a schematic flow chart of a gas component measurement method according to an embodiment of the present application, where the method may include:
s11: controlling the air flow of the gas to be tested to be respectively introduced into the infrared high tank and the infrared low tank.
Wherein, the pool length of the infrared high pool is longer than that of the infrared low pool.
The specific sizes of the infrared high tank and the infrared low tank can be reasonably set according to the particle number concentration range of specific components to be measured in the gas to be measured.
S12: and acquiring the particle numbers of specific components in the gas to be detected in the infrared high tank and the infrared low tank in real time to obtain a plurality of infrared high tank particle numbers and a plurality of infrared low tank particle numbers.
When the airflow to be measured flows in the infrared cell, the particle number corresponding to the specific component in the infrared cell needs to be continuously monitored until all the gas is exhausted from the infrared cell; and determining the content of the specific component in the air flow according to the total particle number of the specific component in the air flow measured in the whole process.
In quantitative analysis of gas components, infrared absorption detection is achieved by using different polar molecules having different characteristic wavelengths of infrared absorption, e.g. CO 2 The wavelength of the infrared light mainly absorbing 4.25 μm and the infrared light absorbing CO is 4.65 μm and SO 2 The wavelength of the absorbed infrared light is 8.69 μm and H 2 The wavelength of the infrared light absorbed by O was 6.6. Mu.m. The absorption of infrared energy by gases follows lambert-beer's law: i=i 0 ·e -KCL 。
Wherein: k is the infrared absorption coefficient of the gas to be measured; c is the concentration of the gas to be measured; l is the thickness of the infrared absorbing layer (i.e., cell length); i 0 Infrared energy emitted by an infrared light source in the infrared pool; i is the infrared energy remaining after absorption by the gas to be measured.
Because the energy received by the infrared detector is in direct proportion to the output voltage of the infrared detector, the infrared tank can convert the concentration information of the gas into an electric signal for output; the concentration of the gas to be detected in the infrared pool is in direct proportion to the particle number of the gas to be detected in the infrared pool, so that the particle number of the corresponding specific component can be obtained according to the measured gas concentration.
S13: and determining the particle number of the specific component in the gas to be detected according to the infrared high-cell particle number and the infrared low-cell particle number.
In this embodiment, when the gas flows of the gas to be measured are simultaneously input into the infrared high tank and the infrared low tank in parallel, the two branch gas flows are detected simultaneously by the infrared high tank and the infrared low tank to obtain two groups of measurement data, so as to obtain the number of particles in the infrared high tank and the number of particles in the infrared low tank.
As described above, the infrared Gao Chi measures the concentration of the air flow with high concentration more accurately, and the infrared low-tank measures the concentration of the air flow with low concentration more accurately, and after two sets of different particle number data are measured by the infrared high-tank and the infrared low-tank at the same time, it can be determined whether the gas concentration is high or low in the infrared tank at the moment corresponding to the measured data, and thus more accurate measurement results can be obtained by analysis.
In summary, in the method, when monitoring the specific components in the gas, the infrared high tank and the infrared low tank are simultaneously and parallelly detected, so that the problem of inaccurate measurement results caused by improper switching time of the infrared high tank and the infrared low tank is avoided; and the finally determined measurement result is obtained based on the combination of the measurement data of the infrared high cell and the infrared low cell, thereby ensuring the accuracy of the measurement result.
There are many different ways to determine the exact number of particles in the ir cell in combination with the number of ir high cell particles and the number of ir low cell particles, and this will be described in the following with specific examples.
In an alternative embodiment of the present application, the process of determining the particle count of a particular component in combination with the infrared high pool particle count and the infrared low pool particle count may include:
when the number of the infrared high-pool particles is larger than the preset number of particles, taking the number of the infrared high-pool particles as the number of particles of the specific component;
when the number of the infrared high-cell particles is smaller than the preset number of particles, the number of the infrared low-cell particles is taken as the number of the particles of the specific component.
As previously described, the concentration of particles in the infrared cell is varied in real time, and thus, each time the amount of infrared high cell particles and the amount of infrared low cell particles measured, a more accurate amount of particles measured at the time is determined.
The size of the preset particle number can be determined according to the measurable measuring range of the infrared high tank and the infrared low tank, or reasonably adjusted according to the measured particle number of the infrared high tank and the infrared low tank.
In another alternative embodiment of the present application, the process of determining the particle count of a particular component in combination with the infrared high pool particle count and the infrared low pool particle count may include:
When the number of the infrared high-pool particles is larger than the first preset particle number, taking the number of the infrared high-pool particles as the particle number of the specific component;
when the number of the infrared low-cell particles is smaller than the second preset particle number, taking the number of the infrared low-cell particles as the particle number of the specific component;
when the number of the infrared high-pool particles is smaller than the first preset particle number and the number of the infrared low-pool particles is larger than the second preset particle number, the particle number formula of the specific component in the transition section is shown as follows: n=a·n+ (1-a) ·n', obtaining the particle number; wherein N is the number of particles of a specific component, a is a weight coefficient, a is more than 0 and less than 1, N is the number of infrared high-pool particles, and N' is the number of infrared low-pool particles; the first predetermined number of particles is greater than the second predetermined number of particles.
It should be noted that, for the infrared high cell, the particle number of the gas to be measured with low concentration can be measured, only the error of the measured result is larger, and the infrared low cell can accurately measure the particle number of the specific component with low concentration, so that the infrared high cell and the infrared low cell form complementation.
There is no clear criterion for the concentration demarcation lines measured for the infrared high and low cells, whereby it is difficult to determine whether the result measured by infrared Gao Chi is more accurate or the result measured by infrared low cell is more accurate when the particle concentration in the infrared cell belongs to the middle transition section of the measurable concentration of the infrared high and low cells.
For this reason, in this embodiment, a first preset particle number and a second preset particle number are set, and the first preset particle number is greater than the second preset particle number; when the number of infrared high cell particles measured by infrared Gao Chi is greater than the first preset number of particles, it is indicated that the particle concentration in the infrared high cell and the infrared low cell is relatively high, the data of the measured number of particles in the infrared high cell should be taken as the data of the final measured specific component, and when the number of infrared low cell infrared particles measured by the infrared low cell is less than the second preset number of particles, it is indicated that the particle concentration in the infrared high cell and the infrared low cell is relatively low, the data of the measured number of particles in the infrared low cell should be taken as the final measured data. And when the number of the infrared high pond particles is smaller than the first preset particle number and the number of the infrared low pond particles is larger than the second preset particle number, the infrared high pond and the infrared low pond are in a range which is difficult to define. To this end, this section may be set as a transition section, using the transition section formula: n=a·n+ (1-a) ·n', and the number of particles measured this time is determined.
In addition, in the transition zone formula, the weight coefficient a may be set empirically, and it is understood that if the number of particles is larger, the number of particles in the infrared high pool should be more valuable as a reference, whereas if the number of particles is smaller, the number of particles in the infrared low pool should be more valuable as a reference. Therefore, when determining the weight coefficient a, the weight coefficient a may be appropriately increased according to the measured infrared high-cell particle number and the measured infrared low-cell particle number being relatively larger, that is, the measured infrared high-cell particle number and the measured infrared low-cell particle number are more biased to the first preset particle number; conversely, if the number of infrared high pool particles and the number of infrared low pool particles are more biased toward the second preset particle number, the weight coefficient a may be appropriately reduced.
As shown in fig. 2 and fig. 3, fig. 2 is a schematic flow chart for determining the particle number of a specific component according to an embodiment of the present application, and fig. 3 is a schematic change diagram of the particle number of the specific component in an infrared cell. In an alternative embodiment of the present application, there is also provided another way of determining the particle count of a particular component in combination with the infrared high pool particle count and the infrared low pool particle count, the process may include:
s21: according to the continuous multiple measured change trend of the number of the infrared high-pool particles, determining an ascending measurement interval in which the number of the infrared high-pool particles is in an increasing trend, and determining a descending measurement interval in which the number of the infrared high-pool particles is in a decreasing trend.
Referring to fig. 3, the trend of the particle number of the specific component measured in the infrared cell in fig. 3 generally shows a trend of increasing and then decreasing, and accordingly, the infrared Gao Chigong particle number measured by the infrared high cell and the infrared low cell in this embodiment should also be a trend of increasing and then decreasing.
The data detected in the entire process can thus be divided into a rising measurement section and a falling measurement section, i.e. measurement sections for the number of particles corresponding to periods of increased and decreased number of particles in the infrared cell. Since the infrared low pool particle number becomes very inaccurate after the particle concentration exceeds a certain amount, the infrared high pool particle number is more valuable as a reference in demarcating the ascending and descending measurement sections.
In addition, for the specific determination of the ascending measurement section and the descending measurement section, the change rule of the particle number in the whole measurement process can be utilized to directly find the maximum value of the particle number of the infrared high pond in the whole measurement process as the demarcation point of the ascending measurement section and the descending measurement section, the infrared high pond particle number and the infrared low pond particle number measured before the maximum infrared high pond particle number are used as the measurement data of the ascending measurement section, and the infrared high pond particle number and the infrared low pond particle number measured after the maximum infrared high pond particle number are used as the measurement data of the descending measurement section, so that the interference of the fluctuation of the small range of the particle number data measured in the measurement process to the ascending measurement section and the descending measurement section is avoided.
S22: obtaining a first reference infrared high pool particle number with the smallest difference between the infrared high pool particle number measured in the ascending measurement area and a third preset particle number; and obtaining a second reference infrared high pool particle number with the smallest difference between the infrared high pool particle number measured in the descending measurement area and the fourth preset particle number.
S23: taking a measuring interval in a preset measuring frequency range adjacent to the first reference infrared high-pool particle number as a first transition interval, and taking a measuring interval in a preset measuring frequency range adjacent to the second reference infrared high-pool particle number as a second transition interval; and calculating and obtaining the particle quantity of the specific component measured in the first transition zone and the second transition zone according to the first transition formula and the second transition formula respectively.
As previously mentioned, it is clearly not accurate to directly set a threshold value for the number of particles to switch the data of the infrared high cell and the infrared low cell, for which purpose a transition zone may be set in each of the increasing and decreasing measurement zones of the number of particles in the infrared cell.
The number of particles for the first transition interval may be according to a first transition formula:
and combining the quantity of the infrared high-pool particles and the quantity of the infrared low-pool particles to calculate; where k is the measurement number constant, p 1 And n is the number of the infrared high-pool particles, and n' is the number of the infrared low-pool particles.
It should be noted that, for the first transition interval, the measurement interval may be a measurement interval within a preset measurement frequency range adjacent to the first reference infrared high pool particle number, where the preset measurement frequency is k; in addition, for the first index coefficient p 1 The setting of (2) can be determined according to the speed of the particle concentration change in the first transition zone, when the measured rising slope of the quantity of the infrared high pond particles in the first transition zone is larger than the preset slope, the first index coefficient p can be properly increased 1 。
Similarly, the corresponding second transition formula for the second transition section may be:
Wherein the measurement frequency constant k, n the infrared high pool particle number n, the infrared low pool particle number n' takes a value similar to that in the first transition formula, and the description is omitted, p 2 The value of the second index coefficient can be set according to the descending trend of the infrared high pool particle number, and when the descending slope of the infrared high pool particle number measured in the second transition interval is larger than the preset slope, the second index coefficient p can be properly increased 2 。
S24: the number of infrared low pool particles measured with the infrared low pool in each measurement before the first transition zone in the rising measurement zone and after the second transition zone in the falling measurement zone is the number of particles of the specific component.
S25: the number of infrared high cell particles measured in infrared Gao Chi in each measurement after the first transition interval in the rising measurement interval and before the second transition interval in the falling measurement interval is the number of particles of the specific component.
It should be noted that, after the first transition section and the second transition section are determined, the execution sequence of the steps S23 to S25 may be arbitrarily adjusted, which is not particularly limited in this application.
Of course, it will be appreciated that when actually processing the data of the measured ir high pool particle count and ir low pool particle count, unified processing may be performed after all ir high pool particle count and ir low pool particle count measurements are completed, but such processing is apparent to reduce the overall data processing speed. Therefore, the method of parallel data acquisition and data processing can also be adopted in the actual process.
For example, after the gas is introduced from the beginning, each time a group of infrared high-pool particle data and infrared low-pool particle data is measured, comparing the infrared high-pool particle data with a third preset particle number until a first reference infrared high-pool particle number closest to the third preset particle number is obtained, and correspondingly, the first transition section is sequentially determined, and the data measured before the first reference infrared high-pool particle number can be processed;
after the first reference infrared high-pool particle data are determined, the judgment of the maximum infrared high-pool particle data can be continuously carried out on the number of the plurality of infrared high-pool particles measured subsequently, and when the number of certain infrared high-pool particles is maximum relative to the number of the plurality of adjacent infrared high-pool particles, the number of the infrared high-pool particles can be determined to be the junction point of the ascending measurement section and the descending measurement section; after the boundary point is determined, the infrared high-pool particle data measured subsequently and the fourth preset particle number can be compared, and finally the second reference infrared high-pool particle data is determined. Thus, the parallel performance of data measurement and data processing can be realized.
Of course, the embodiment of the integrated process after the infrared high pool particle data and the infrared low pool particle data are obtained in the whole measuring process is not excluded in the present application.
The gas component measuring apparatus according to the embodiment of the present invention will be described below, and the gas component measuring apparatus described below and the gas component measuring method described above may be referred to correspondingly to each other.
Fig. 4 is a block diagram of a gas component measurement apparatus according to an embodiment of the present invention, and referring to fig. 4, the gas component measurement apparatus may include:
the airflow control module 100 is used for controlling the airflow of the gas to be tested to be respectively led into the infrared high tank and the infrared low tank, wherein the tank length of the infrared high tank is longer than that of the infrared low tank;
the data acquisition module 200 is used for simultaneously measuring and obtaining a plurality of infrared high-tank particle numbers and a plurality of infrared low-tank particle numbers of specific components in the gas to be measured in the infrared high-tank and the infrared low-tank along with the gas flow change of the gas to be measured in the infrared high-tank and the infrared low-tank respectively;
the data operation module 300 is configured to determine the particle number of the specific component in the gas to be measured according to the infrared high cell particle number and the infrared low cell particle number.
In an alternative embodiment of the present application, the data operation module 300 includes:
the interval dividing unit is used for determining an ascending measurement interval in which the quantity of the infrared high-tank particles is in an increasing trend and determining a descending measurement interval in which the quantity of the infrared high-tank particles is in a decreasing trend according to the continuously measured quantity change trend of the infrared high-tank particles for multiple times;
The reference particle number unit is used for obtaining a first reference infrared high-pool particle number with the smallest difference value between the infrared high-pool particle number measured in the ascending measurement area and the third preset particle number; obtaining a second reference infrared high-pool particle number with the smallest difference between the infrared high-pool particle number measured in the descending measurement area and the fourth preset particle number;
the transition interval unit is used for taking a measurement interval in a preset measurement frequency range adjacent to the first reference infrared high-pool particle number as a first transition interval and taking a measurement interval in a preset measurement frequency range adjacent to the second reference infrared high-pool particle number as a second transition interval; calculating and obtaining the particle number of the specific component measured in the first transition zone and the second transition zone according to a first transition formula and a second transition formula respectively;
an infrared low pool particle unit for taking the number of infrared low pool particles measured by the infrared low pool as the number of particles of the specific component in each measurement within the rising measurement interval before the first transition interval and within the falling measurement interval after the second transition interval;
An infrared high pool particle unit for taking the infrared high pool particle number measured by the infrared Gao Chi as the particle number of the specific component in each measurement after the first transition interval in the rising measurement interval and before the second transition interval in the falling measurement interval.
The gas component measurement apparatus of the present embodiment is used to implement the foregoing gas component measurement method, and thus, specific embodiments of the gas component measurement apparatus may be found in the foregoing example portions of the method, for example, the gas flow control module 100, the data acquisition module 200, and the data operation module 300, which are respectively used to implement steps S11, S12, S13, and S14 in the foregoing gas component measurement method, so, specific embodiments thereof may refer to descriptions of respective partial examples, and will not be repeated herein.
The application also provides a gas component measurement device, referring to fig. 5, fig. 5 is a schematic diagram of a frame structure of the gas component measurement device provided in the embodiment of the application, including a sample chamber 1 to be measured, a flow stabilizing valve 2, infrared Gao Chi 3, an infrared low cell 4, a first infrared sensor 5, a second infrared sensor 6 and a processor 7;
the output end of the sample chamber 1 to be tested is connected with the input end of the flow stabilizing valve 2, the first output end of the flow stabilizing valve 2 is connected with the infrared high tank 3, the second output end of the flow stabilizing valve 2 is connected with the infrared low tank 4, and the tank length of the infrared high tank 3 is smaller than that of the infrared low tank 4;
The first infrared sensor 5 is used for detecting infrared light energy in the infrared high pond 3 and outputting infrared high pond response voltage;
the second infrared sensor 6 is used for detecting infrared light energy in the infrared low tank 4 and outputting infrared low tank response voltage;
the processor 7 is configured to obtain the number of infrared high cell particles and the number of infrared low cell particles from the infrared high cell response voltage and the infrared low cell response voltage, respectively, to perform the operational steps of implementing the gas composition measurement method as described in any of the embodiments above.
In the gas component measuring equipment provided by the embodiment, the infrared Gao Chi and the infrared low tank 4 are simultaneously connected with the output port of the pressure stabilizing valve 2, and the pressure stabilizing valve 2 controls the air flow to flow into the infrared Gao Chi and the infrared low tank 4 uniformly at the same time, so that the equality of the air flow in the infrared Gao Chi and the infrared low tank 4 is ensured; and infrared Gao Chi 3 and infrared low pond 4 are connected in parallel, simultaneously carry out synchronous detection to same gas, need not to carry out infrared Gao Chi and infrared low pond 4's switching for the particle quantity of the specific component of final determination can be confirmed jointly according to infrared Gao Chi 3 and infrared low pond 4's measuring result, has promoted measuring result's degree of accuracy to a great extent.
Embodiments of a computer readable storage medium storing a computer program for executing the operating steps of the method for measuring a gas composition according to any of the embodiments above by a processor are also provided.
The computer readable storage medium may include Random Access Memory (RAM), memory, read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements is inherent to. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. In addition, the parts of the above technical solutions provided in the embodiments of the present application, which are consistent with the implementation principles of the corresponding technical solutions in the prior art, are not described in detail, so that redundant descriptions are avoided.