CN111913066A - System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester - Google Patents
System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester Download PDFInfo
- Publication number
- CN111913066A CN111913066A CN202010692256.9A CN202010692256A CN111913066A CN 111913066 A CN111913066 A CN 111913066A CN 202010692256 A CN202010692256 A CN 202010692256A CN 111913066 A CN111913066 A CN 111913066A
- Authority
- CN
- China
- Prior art keywords
- wave
- current
- metal oxide
- voltage
- oxide arrester
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910044991 metal oxide Inorganic materials 0.000 title claims abstract description 53
- 150000004706 metal oxides Chemical class 0.000 title claims abstract description 53
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000005259 measurement Methods 0.000 claims abstract description 16
- 230000001105 regulatory effect Effects 0.000 claims description 33
- 239000003990 capacitor Substances 0.000 claims description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 8
- 239000010703 silicon Substances 0.000 claims description 8
- 238000012360 testing method Methods 0.000 claims description 6
- 238000007599 discharging Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 10
- 238000004590 computer program Methods 0.000 description 7
- 230000006870 function Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000003860 storage Methods 0.000 description 3
- 229910018540 Si C Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention provides a system and a method for measuring residual voltage of a resistor disc of an extra-high voltage metal oxide arrester. According to the system and the method, an alternating current input voltage is provided for a measurement loop through a power supply capable of adjusting the input voltage, the alternating current of the measurement loop is adjusted into direct current through a wave adjusting circuit, the amplitude and the waveform of the current are adjusted through the combined action of a wave adjusting resistor and a wave adjusting inductor in the wave adjusting circuit, so that the wave head time, the wave tail time and the waveform amplitude of the current waveform generated in the loop are variable, and the performance of a resistor disc can be measured more comprehensively and accurately through a voltage and current measurement unit connected with a resistance disc of the ultra-high voltage metal oxide lightning arrester to be measured, so that data are provided for better determining the volt-ampere characteristics of the ultra-high voltage metal oxide lightning arrester.
Description
Technical Field
The invention relates to the field of power measurement, in particular to a system and a method for measuring residual voltage of an ultra-high voltage metal oxide arrester resistor disc.
Background
The measurement of the residual voltage of the arrester resistance card is the basis for determining the residual voltage of the arrester, and is also the basis for determining the lightning impulse protection level and the operation impulse protection level of the arrester. The lightning current and the operation impact current are unipolar pulse waves and can be characterized by parameters such as wave head, wavelength, gradient, amplitude and the like, and the parameters are variables. Lightning current and operational surge current magnitudes are generally characterized using cumulative probability distributions. The voltage values (called ampere-second characteristics) of the lightning arrester resistor disc under different current waveforms are different. Since SiC appeared in the second thirty years of the 20 th century, residual voltage test waveforms aiming at the Si C resistance card are all impulse voltage waveforms approximate to 1.2/50 mu s or 1.5/40 mu s, and the waveforms can not accurately reflect the lightning impulse residual voltage level and the operation impulse residual voltage level of the lightning arrester resistance card. Therefore, the lightning current and the operation impact current waveform are accurately simulated in a laboratory, and the voltage values of the lightning arrester resistance card under different current waveforms are measured, so that the method has great significance for establishing an accurate lightning arrester calculation model.
Disclosure of Invention
In order to solve the problem that in the prior art, a test loop and a test waveform for measuring the residual voltage of a metal oxide arrester resistor disc are not accurate enough, so that the residual voltage level of the arrester resistor disc cannot be accurately reflected, the invention provides a system for measuring the residual voltage of an extra-high voltage metal oxide arrester resistor disc, which comprises:
the wave modulation circuit is connected with the resistance card of the ultra-high voltage metal oxide arrester to be measured and is used for modulating alternating current input in the measurement loop into direct current and modulating the amplitude and waveform of the direct current;
and the measuring unit is connected with the to-be-measured ultrahigh voltage metal oxide arrester resistance card and is used for measuring the voltage and the current of the to-be-measured ultrahigh voltage metal oxide arrester resistance card.
Further, the system also includes a power supply connected to the wave modulating circuit for modulating the ac input voltage of the measurement loop, the power supply including:
the voltage regulator is connected with the transformer and is used for regulating the primary side voltage of the transformer;
and the primary side of the transformer is connected with the voltage regulator, and the secondary side of the transformer is connected with the wave regulating circuit and used for regulating the voltage and the current output to the wave regulating circuit.
Further, the wave modulation circuit includes:
one end of the silicon stack is connected with the transformer, and the other end of the silicon stack is connected with the charging capacitor and used for adjusting alternating current in the measuring loop into direct current;
one end of the charging capacitor is connected with the silicon stack and the wave modulating resistor, and the other end of the charging capacitor is connected with the secondary side of the transformer and used for charging and discharging the measuring loop;
one end of the wave regulating resistor is connected with the charging capacitor, the other end of the wave regulating resistor is connected with the wave regulating inductor, and the wave regulating resistor and the wave regulating inductor jointly regulate the amplitude waveform of the direct current of the measuring loop, wherein the waveform comprises wave front time and wave tail time;
and one end of the wave regulating inductor is connected with the wave regulating resistor, the other end of the wave regulating inductor is connected with the discharge gap, and the wave regulating inductor and the wave regulating resistor jointly regulate the amplitude and the waveform of the direct current.
Further, the measurement unit includes:
one end of the voltage divider is connected with the discharge gap and the resistance card of the extra-high voltage metal oxide arrester to be tested, and the other end of the voltage divider is grounded and used for measuring the voltage of the resistance card of the extra-high voltage metal oxide arrester to be tested together with the tester;
one end of the shunt is connected with the charging capacitor, and the other end of the shunt is grounded and is used for measuring the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured together with the tester;
and the two testers are respectively connected with the voltage divider and the shunt in parallel and are used for measuring the voltage and the current of the resistance card of the ultra-high voltage metal oxide arrester to be tested.
Further, the tester is an oscilloscope or a wave recorder.
Further, the waveforms of the steep wave impact current generated by the system are (1 ± 0.1)/(not less than 3 μ s) and (0.5 ± 0.1)/(not less than 1.5 μ s), and the current is 1.5kA to 50 kA.
Further, the waveform of the lightning impulse current generated by the system is (8 +/-1)/(20 +/-2) mus, and the current is 0.5 kA-100 kA.
Further, the system generates an operation impact current with the waveform of (30-60) mu s/2 times of wave head and the current of 0.1 kA-40 kA.
Further, the wave form of the slow wave front operation impact current generated by the system is (1000 +/-100)/2 times of wave head, and the current is 0.1 kA-3 kA.
According to another aspect of the invention, the invention provides a method for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc by using the system for measuring residual voltage of the extra-high voltage metal oxide arrester resistor disc, which comprises the following steps:
connecting an extra-high voltage metal oxide arrester resistance card to be measured into the measuring loop;
according to the corresponding relation between the model of the resistance card of the extra-high voltage metal oxide arrester to be tested and the wave modulating resistor and the wave modulating inductor, adjusting the resistance value of the wave modulating resistor and the inductance value of the wave modulating inductor to enable the system to generate current pulses required by testing;
and measuring the voltage and the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured under the current pulse.
According to the system and the method for measuring the residual voltage of the resistor disc of the extra-high voltage metal oxide arrester, the alternating current input voltage is provided for the measuring loop through the power supply capable of adjusting the input voltage, the alternating current of the measuring loop is adjusted into the direct current through the wave adjusting circuit, the amplitude and the waveform of the current are adjusted through the combined action of the wave adjusting resistor and the wave adjusting voltage in the wave adjusting circuit, so that the wave head time, the wave tail time and the waveform amplitude of the current waveform generated in the loop can be changed, and the performance of the resistor disc can be measured more comprehensively and accurately through the measuring unit connected with the resistor disc of the extra-high voltage metal oxide arrester to be measured, so that data are provided for better determining the volt-ampere characteristics of the extra-high voltage metal oxide arrester.
Drawings
A more complete understanding of exemplary embodiments of the present invention may be had by reference to the following drawings in which:
fig. 1 is a schematic structural diagram of a system for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc according to a preferred embodiment of the invention;
fig. 2 is a flowchart of a method for measuring residual voltage of an ultra-high voltage metal oxide arrester resistor disc according to a preferred embodiment of the invention.
Detailed Description
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.
Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
Fig. 1 is a schematic structural diagram of a system for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc according to a preferred embodiment of the invention. As shown in fig. 1, a system 100 for measuring residual voltage of an ultra-high voltage metal oxide arrester resistor disc according to the preferred embodiment includes:
a power supply 101 connected to the wave modulation circuit 102 for modulating an ac input voltage of the measurement loop, the power supply 101 comprising:
a voltage regulator 111 connected to the transformer 112 for regulating a primary side voltage of the transformer;
and a transformer 112 having a primary side connected to the voltage regulator and a secondary side connected to the waveform modulation circuit, for modulating the voltage and current output to the waveform modulation circuit.
The device comprises a wave regulating circuit 102, a power supply 101, a resistance card 104 of the ultra-high voltage metal oxide arrester to be measured, a voltage measuring circuit and a voltage measuring circuit, wherein one end of the wave regulating circuit is connected with the power supply 101, and the other end of the wave regulating circuit is connected with the resistance card 104 of the ultra-high voltage metal oxide arrester to be measured, and is used for regulating alternating current input in a measuring loop;
and the measuring unit 103 is connected with the to-be-measured ultrahigh voltage metal oxide arrester resistance card 104 and is used for measuring the voltage and the current of the to-be-measured ultrahigh voltage metal oxide arrester resistance card.
Preferably, the wave modulation circuit 102 includes:
a silicon stack 121, one end of which is connected to the transformer 112 and the other end of which is connected to the charging capacitor 122, for adjusting the ac in the measurement loop to dc, and generally configured by using 300kV and 0.5A parameters with excellent performance;
one end of the charging capacitor 122 is connected with the silicon stack 121 and the wave modulating resistor 123, and the other end is connected with the secondary side of the transformer 112, and is used for charging and discharging a measuring loop, wherein the capacitors of 150kV/0.15 muF, 150kV/0.5 muF, 100kV/0.5 muF and 100kV/3.5 muF are generally selected and combined, parameters are comprehensive, and configuration is flexible;
one end of the wave modulation resistor 123 is connected with the charging capacitor 122, the other end of the wave modulation resistor is connected with the wave modulation inductor 124, and the wave modulation inductor 124 and the wave modulation resistor jointly adjust the amplitude waveform of the direct current of the measurement loop, wherein the waveform comprises wave front time and wave tail time, parameters are adjustable, and configuration is flexible;
one end of the wave modulation inductor 124 is connected with the wave modulation resistor 123, the other end of the wave modulation inductor is connected with the discharge gap, and the wave modulation inductor and the wave modulation resistor 123 jointly adjust the amplitude and the waveform of direct current, so that the parameters are adjustable, and the configuration is flexible.
Preferably, the measurement unit 103 includes:
the voltage divider 131 is connected with the discharge gap and the to-be-tested ultrahigh voltage metal oxide arrester resistor disc 104 at one end, is grounded at the other end, is used for measuring the voltage of the to-be-tested ultrahigh voltage metal oxide arrester resistor disc together with a tester, and comprises a high-voltage arm 1 and a low-voltage arm 2;
one end of the shunt 132 is connected with the charging capacitor 122, the other end of the shunt is grounded, the shunt is used for measuring the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured together with the tester, parameters are adjustable, and configuration is flexible;
and two testers 133 and 134, which are respectively connected in parallel with the voltage divider 131 and the current divider 132, for measuring the voltage and the current of the ultra-high voltage metal oxide arrester resistor disc 104 to be tested.
Preferably, the testers 133 and 134 are oscilloscopes or oscilloscopes.
Preferably, the waveforms of the steep wave impact current generated by the system are (1 ± 0.1)/(not less than 3 μ s) and (0.5 ± 0.1)/(not less than 1.5 μ s), and the current is 1.5kA to 50 kA.
Preferably, the waveform of the lightning impulse current generated by the system is (8 +/-1)/(20 +/-2) mus, and the current is 0.5 kA-100 kA.
Preferably, the system generates the operating impact current with the waveform of (30-60) mu s/2 times wave head and the current is 0.1 kA-40 kA.
Preferably, the wave form of the slow wave front operation impact current generated by the system is (1000 +/-100)/2 times of wave head, and the current is 0.1 kA-3 kA.
Fig. 2 is a flowchart of a method for measuring residual voltage of an ultra-high voltage metal oxide arrester resistor disc according to a preferred embodiment of the invention. As shown in fig. 2, a method 200 for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc by using the residual voltage measuring system for measuring an extra-high voltage metal oxide arrester resistor disc according to the present invention in the preferred embodiment starts from step 201.
In step 201, the resistance card of the ultra-high voltage metal oxide arrester to be measured is connected to the measurement loop.
In step 202, according to the correspondence between the model of the resistance card of the ultra-high voltage metal oxide arrester to be tested and the wave modulating resistor and the wave modulating inductor, the resistance value of the wave modulating resistor and the inductance value of the wave modulating inductor are adjusted, so that the system generates current pulses required by the test.
In step 203, measuring the voltage and the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured under the current pulse.
The invention has been described with reference to a few embodiments. However, other embodiments of the invention than the one disclosed above are equally possible within the scope of the invention, as would be apparent to a person skilled in the art from the appended patent claims.
Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the technical field, unless explicitly defined otherwise herein. All references to "a/an/the [ device, component, etc ]" are to be interpreted openly as referring to at least one instance of said device, component, etc., unless explicitly stated otherwise. The steps of any method disclosed herein do not have to be performed in the exact order disclosed, unless explicitly stated.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solutions of the present invention and not for limiting the same, and although the present invention is described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: modifications and equivalents may be made to the embodiments of the invention without departing from the spirit and scope of the invention, which is to be covered by the claims.
Claims (10)
1. A system for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc is characterized by comprising:
the wave modulation circuit is connected with the resistance card of the ultra-high voltage metal oxide arrester to be measured and is used for modulating alternating current input in the measurement loop into direct current and modulating the amplitude and waveform of the direct current;
and the measuring unit is connected with the to-be-measured ultrahigh voltage metal oxide arrester resistance card and is used for measuring the voltage and the current of the to-be-measured ultrahigh voltage metal oxide arrester resistance card.
2. The system of claim 1, further comprising a power supply coupled to the wave tuning circuit for adjusting the ac input voltage of the measurement loop, the power supply comprising:
the voltage regulator is connected with the transformer and is used for regulating the primary side voltage of the transformer;
and the primary side of the transformer is connected with the voltage regulator, and the secondary side of the transformer is connected with the wave regulating circuit and used for regulating the voltage and the current output to the wave regulating circuit.
3. The system of claim 1, wherein the wave modulation circuit comprises:
one end of the silicon stack is connected with the transformer, and the other end of the silicon stack is connected with the charging capacitor and used for adjusting alternating current in the measuring loop into direct current;
one end of the charging capacitor is connected with the silicon stack and the wave modulating resistor, and the other end of the charging capacitor is connected with the secondary side of the transformer and used for charging and discharging the measuring loop;
one end of the wave regulating resistor is connected with the charging capacitor, the other end of the wave regulating resistor is connected with the wave regulating inductor, and the wave regulating resistor and the wave regulating inductor jointly regulate the amplitude and the waveform of the direct current of the measuring loop, wherein the waveform comprises wave front time and wave tail time;
and one end of the wave regulating inductor is connected with the wave regulating resistor, the other end of the wave regulating inductor is connected with the discharge gap, and the wave regulating inductor and the wave regulating resistor jointly regulate the amplitude and the waveform of the direct current.
4. The system of claim 1, wherein the measurement unit comprises:
one end of the voltage divider is connected with the discharge gap and the resistance card of the extra-high voltage metal oxide arrester to be tested, and the other end of the voltage divider is grounded and used for measuring the voltage of the resistance card of the extra-high voltage metal oxide arrester to be tested together with the tester;
one end of the shunt is connected with the charging capacitor, and the other end of the shunt is grounded and is used for measuring the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured together with the tester;
and the two testers are respectively connected with the voltage divider and the shunt in parallel and are used for measuring the voltage and the current of the resistance card of the ultra-high voltage metal oxide arrester to be tested.
5. The system of claim 4, wherein the tester is an oscilloscope or a wave recorder.
6. The system of claim 1, wherein the steep wave impact current produced by the system has a waveform of (1 ± 0.1)/not less than 3 μ s and (0.5 ± 0.1)/not less than 1.5 μ s, with a current of 1.5kA to 50 kA.
7. The system of claim 1, wherein the lightning impulse current generated by the system has a waveform of (8 ± 1)/(20 ± 2) μ s and a current of 0.5kA to 100 kA.
8. The system of claim 1, wherein the system generates an operational surge current having a waveform of (30-60) μ s/2 times the wave head, and a current of 0.1kA to 40 kA.
9. The system of claim 1, wherein the system generates a slow wavefront operation impact current with a waveform of (1000 ± 100)/2 times of a wave head and a current of 0.1kA to 3 kA.
10. A method for measuring residual voltage of an extra-high voltage metal oxide arrester resistor disc by using any one system of claims 1 to 9, wherein the method comprises the following steps:
connecting an extra-high voltage metal oxide arrester resistance card to be measured into the measuring loop;
according to the corresponding relation between the model of the resistance card of the extra-high voltage metal oxide arrester to be tested and the wave modulating resistor and the wave modulating inductor, adjusting the resistance value of the wave modulating resistor and the inductance value of the wave modulating inductor to enable the system to generate current pulses required by testing;
and measuring the voltage and the current of the resistance card of the ultra-high voltage metal oxide arrester to be measured under the current pulse.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010692256.9A CN111913066A (en) | 2020-07-17 | 2020-07-17 | System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010692256.9A CN111913066A (en) | 2020-07-17 | 2020-07-17 | System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111913066A true CN111913066A (en) | 2020-11-10 |
Family
ID=73280426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010692256.9A Pending CN111913066A (en) | 2020-07-17 | 2020-07-17 | System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111913066A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112305465A (en) * | 2020-09-23 | 2021-02-02 | 中国电力科学研究院有限公司 | Measuring system and measuring method for determining fusing state of fuse in high-voltage capacitor |
| CN112904116A (en) * | 2021-01-20 | 2021-06-04 | 云南电网有限责任公司电力科学研究院 | System and method for evaluating dynamic characteristics of valve plate of lightning arrester under action of impact current |
| CN113125916A (en) * | 2021-04-25 | 2021-07-16 | 西安交通大学 | Lightning arrester test device with direct current superposition impact |
| CN113358951A (en) * | 2021-05-18 | 2021-09-07 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Method and device for testing volt-ampere characteristic of zinc oxide lightning arrester valve plate |
-
2020
- 2020-07-17 CN CN202010692256.9A patent/CN111913066A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112305465A (en) * | 2020-09-23 | 2021-02-02 | 中国电力科学研究院有限公司 | Measuring system and measuring method for determining fusing state of fuse in high-voltage capacitor |
| CN112305465B (en) * | 2020-09-23 | 2023-07-21 | 中国电力科学研究院有限公司 | Measuring system and measuring method for determining fusing state of fuse wire in high-voltage capacitor |
| CN112904116A (en) * | 2021-01-20 | 2021-06-04 | 云南电网有限责任公司电力科学研究院 | System and method for evaluating dynamic characteristics of valve plate of lightning arrester under action of impact current |
| CN113125916A (en) * | 2021-04-25 | 2021-07-16 | 西安交通大学 | Lightning arrester test device with direct current superposition impact |
| CN113358951A (en) * | 2021-05-18 | 2021-09-07 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Method and device for testing volt-ampere characteristic of zinc oxide lightning arrester valve plate |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111913066A (en) | System and method for measuring residual voltage of resistance card of extra-high voltage metal oxide arrester | |
| Schon | High impulse voltage and current measurement techniques | |
| Chundru et al. | Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels-part I: Reference event | |
| Yoshida et al. | Evaluation of UHF method for partial discharge measurement by simultaneous observation of UHF signal and current pulse waveforms | |
| WO2021008336A1 (en) | Method and system for measuring power frequency and superimposed impulse voltage waveforms | |
| CN110716166A (en) | Method for verifying electromagnetic compatibility test result of electrical secondary equipment | |
| US20240152445A1 (en) | Relay and Metering Test Instrument | |
| CN111983339B (en) | Method and system for determining volt-ampere characteristic of resistance card of extra-high voltage metal oxide arrester | |
| CN109799407A (en) | The immune degree acquisition methods of Device under test voltage dip and test macro | |
| CN112557732A (en) | Magnitude tracing method and system of impulse current measuring device based on induction coil | |
| Prochazka et al. | Determination of frequency characteristics of high voltage dividers in frequency domain | |
| JP2004309153A (en) | Noise tester | |
| Petit | Comparison of PD amplitudes of stator bars taken with different instruments | |
| CN111289940A (en) | Step delay-based direct-current voltage mutual inductance transient characteristic testing method | |
| Clarkson et al. | Sensitivity analysis of flickermeter implementations to waveforms for testing to the requirements of IEC 61000-4-15 | |
| EP3730953A1 (en) | Impulse voltage generator and method for protecting power semiconductor switch | |
| CN107247189B (en) | Impact grounding impedance testing system and method thereof | |
| Wallace | 6 GHz time domain measurement of fast-transient events | |
| CN115015729B (en) | Test loop, method and system for checking performance of thyristor converter valve and damping loop thereof | |
| Papastamatis et al. | Investigation of the frequency response compensation method for ESD current reconstruction for different test levels and ESD test generators | |
| Crotti et al. | Frequency calibration of MV voltage transformer under actual waveforms | |
| WO2020119348A1 (en) | Impulse voltage standard wave generating device and use method therefor | |
| CN114114124A (en) | Method for testing protection characteristics of direct current transformer | |
| Faifer et al. | Characterization of an arbitrary medium voltage signal generator | |
| CN111044782B (en) | System and method for measuring frequency characteristic of capacitive voltage divider |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |