CN111896559A - 一种隐形材料性能衰变点频式检测方法及其系统装置 - Google Patents
一种隐形材料性能衰变点频式检测方法及其系统装置 Download PDFInfo
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU7568000A (en) * | 1999-09-17 | 2001-04-17 | Food Radar System In Sweden Ab | Apparatus and method for detection of foreign bodies in products |
US20080143344A1 (en) * | 2006-11-30 | 2008-06-19 | Focia Ronald J | Systems and methods for detecting anomalies on internal surfaces of hollow elongate structures using time domain or frequencey domain reflectometry |
JP2008298658A (ja) * | 2007-06-01 | 2008-12-11 | Shimizu Corp | 腐食部検出方法及び腐食部検出装置 |
CN103809175A (zh) * | 2014-02-26 | 2014-05-21 | 北京航空航天大学 | 隐身飞机散射特性现场快速评估系统 |
CN104820987A (zh) * | 2015-04-30 | 2015-08-05 | 中国电子科技集团公司第四十一研究所 | 一种基于光学图像及微波图像检测目标散射性能缺陷的方法 |
CN110133001A (zh) * | 2019-06-13 | 2019-08-16 | 北京测威科技有限公司 | 一种吸波材料表征反射率失效评估方法 |
CN209342916U (zh) * | 2018-08-31 | 2019-09-03 | 沈阳航天测控技术有限公司 | 一种雷达导引头 |
JP2020091169A (ja) * | 2018-12-05 | 2020-06-11 | 日本電信電話株式会社 | 異常検出装置および固定構造 |
CN111551591A (zh) * | 2020-06-30 | 2020-08-18 | 爱德森(厦门)电子有限公司 | 一种表面结构件雷达波吸波涂覆层的检测方法及其装置 |
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Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU7568000A (en) * | 1999-09-17 | 2001-04-17 | Food Radar System In Sweden Ab | Apparatus and method for detection of foreign bodies in products |
US20080143344A1 (en) * | 2006-11-30 | 2008-06-19 | Focia Ronald J | Systems and methods for detecting anomalies on internal surfaces of hollow elongate structures using time domain or frequencey domain reflectometry |
JP2008298658A (ja) * | 2007-06-01 | 2008-12-11 | Shimizu Corp | 腐食部検出方法及び腐食部検出装置 |
CN103809175A (zh) * | 2014-02-26 | 2014-05-21 | 北京航空航天大学 | 隐身飞机散射特性现场快速评估系统 |
CN104820987A (zh) * | 2015-04-30 | 2015-08-05 | 中国电子科技集团公司第四十一研究所 | 一种基于光学图像及微波图像检测目标散射性能缺陷的方法 |
CN209342916U (zh) * | 2018-08-31 | 2019-09-03 | 沈阳航天测控技术有限公司 | 一种雷达导引头 |
JP2020091169A (ja) * | 2018-12-05 | 2020-06-11 | 日本電信電話株式会社 | 異常検出装置および固定構造 |
CN110133001A (zh) * | 2019-06-13 | 2019-08-16 | 北京测威科技有限公司 | 一种吸波材料表征反射率失效评估方法 |
CN111551591A (zh) * | 2020-06-30 | 2020-08-18 | 爱德森(厦门)电子有限公司 | 一种表面结构件雷达波吸波涂覆层的检测方法及其装置 |
Non-Patent Citations (1)
Title |
---|
张云鹏: "隐身涂层微波反射率现场检测技术研究", 《中国博士学位论文全文数据库 工程科技Ⅱ辑》 * |
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