CN111884734B - Performance test method and system for millimeter wave terminal - Google Patents
Performance test method and system for millimeter wave terminal Download PDFInfo
- Publication number
- CN111884734B CN111884734B CN202010682118.2A CN202010682118A CN111884734B CN 111884734 B CN111884734 B CN 111884734B CN 202010682118 A CN202010682118 A CN 202010682118A CN 111884734 B CN111884734 B CN 111884734B
- Authority
- CN
- China
- Prior art keywords
- millimeter wave
- probe
- channel
- model
- channel model
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0087—Monitoring; Testing using service channels; using auxiliary channels using auxiliary channels or channel simulators
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/29—Performance testing
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Mobile Radio Communication Systems (AREA)
Abstract
The embodiment of the application provides a performance test method and a system for a millimeter wave terminal, wherein the method comprises the following steps: generating a downlink millimeter wave signal, superposing fading characteristics corresponding to a channel model, selecting a test probe, constructing an angle power spectrum which is the same as that of the channel model by the test probe, and sending the angle power spectrum to a millimeter wave terminal; the millimeter wave terminal receives the signal and returns an uplink millimeter wave signal; superposing the fading characteristics corresponding to the channel model, and analyzing to obtain the performance parameters of the millimeter wave terminal under the condition of the channel model; and replacing the test channel model and repeatedly testing. The application also provides a device suitable for the method. Compared with the traditional multi-probe air interface test method and system, the method and system have the advantages of being reciprocal in uplink and downlink and capable of achieving multi-model multi-scene performance test through a small number of probes.
Description
Technical Field
The application relates to the technical field of wireless communication, in particular to a performance testing method and system for a millimeter wave terminal.
Background
The performance test methods of communication equipment can be divided into two categories: a conduction method and an air interface method. The transmission method is connected with the base station, the channel simulator and the terminal through wires to form an end-to-end link so as to carry out performance test. Because the conduction method needs the base station and the terminal to provide a conduction interface for wire-in, and the conduction interface of the millimeter wave equipment is usually lacked, the conduction method is not suitable for the performance test of the millimeter wave equipment any more. The traditional mainstream air interface method mainly comprises a reverberation chamber method, a two-step method, a multi-probe method and the like. The multi-probe method is adopted by CTIA, ITU, 3GPP and other international organizations as a standard air interface test method for terminal performance test. However, the conventional multi-probe air interface test system for terminal performance test can not be used for performance test of the millimeter wave terminal any more, and the reasons are mainly as follows: devices in a traditional multi-probe air interface test system do not support millimeter wave frequency bands, and a millimeter wave end-to-end link cannot be constructed. Probes in the traditional multi-probe air interface test system are uniformly distributed on a two-dimensional ring and are not in accordance with the characteristics of three-dimensionality, power centralization and the like of a millimeter wave channel. And thirdly, the base station side of the traditional multi-probe air interface test system still accesses the test system in a conduction mode, and the base station side in the millimeter wave terminal performance test is a millimeter wave base station without a conduction interface. In addition, the conventional multi-probe air interface test system has some disadvantages, for example, uplink and downlink are not reciprocal, so that uplink test cannot be performed, the number of probes required is too large, and the like.
Disclosure of Invention
The application provides a performance testing method and system for a millimeter wave terminal, and solves the problems that in the prior art, the uplink and the downlink do not have reciprocity and the number of probes required is too large.
The embodiment of the application adopts the following technical scheme:
the embodiment of the application provides a performance test method for a millimeter wave terminal, which is characterized by comprising the following steps: generating a downlink millimeter wave signal, selecting a tested channel model, superposing the downlink millimeter wave signal on fading characteristics corresponding to the channel model, selecting a test probe, enabling the test probe to construct an angle power spectrum which is the same as that of the channel model, and sending the angle power spectrum to a millimeter wave terminal; the millimeter wave terminal receives the signal and returns an uplink millimeter wave signal; superposing the uplink millimeter wave signal on the fading characteristics corresponding to the channel model, and analyzing the obtained signal to obtain the performance parameters of the millimeter wave terminal under the condition of the channel model; and replacing the test channel model, and repeating the steps for testing.
Preferably, the superimposing the downlink millimeter wave signal on the fading characteristic corresponding to the channel model further includes: reducing the frequency of the downlink millimeter wave signal; superposing fading characteristics corresponding to the channel model; the signal is up-converted to a millimeter wave signal.
Preferably, the superimposing, by the uplink millimeter wave signal, the fading characteristic corresponding to the channel model further includes: down-converting the uplink millimeter wave signal; superposing fading characteristics corresponding to the channel model; the signal is up-converted to a millimeter wave signal.
Preferably, the selecting a test probe, and constructing the same angular power spectrum as the channel model further includes: superposing the clusters of the channel models to obtain a combined model; selecting an optimal probe set from all probes, wherein the number of the probes is S, the S is an integer not less than 1, and the similarity between an angle power spectrum constructed by the optimal probe set and an angle power spectrum of a combined model is maximum; selecting a channel model to be tested, selecting K probes from the optimal probe set as a test probe combination, wherein K is an integer not less than 1 and not more than S, and the similarity between an angle power spectrum constructed by the test probe combination and an angle power spectrum of the channel model to be tested is the largest; and replacing one channel model to be tested, repeating the steps, and selecting test probe combinations for all the channel models to be tested.
Preferably, the superimposing the clusters of the channel models to obtain the joint model further includes: selecting a channel model to be tested, and sequencing clusters of the channel model from large to small according to original power; taking the departure angle of the cluster with the maximum power as the beam direction of the base station, and calculating to obtain the forming shape of the beam of the base station and the gain in the direction of each cluster in space; calculating to obtain the comprehensive power of each cluster according to the original power of each cluster and the beam gain of the base station in the direction of the cluster; sorting clusters of the channel model from large to small according to the comprehensive power, reserving the clusters which occupy 99.99% of the total power accumulatively, and removing the rest low-power clusters to obtain a simplified model of the current channel model; replacing the channel models, and repeating the steps to obtain simplified models of all the channel models to be tested; and moving the cluster arrival angles of the simplified models of the channel models to enable the arrival angle directions of the clusters with the maximum comprehensive power of the channel models to be coincident.
Preferably, the selecting an optimal probe set from all the probes further comprises: distributing an initial number of probes for each cluster, wherein the number ratio of the probes distributed for each cluster is the same as the cluster power ratio of the combined model, and the total number of the probes is S; selecting a corresponding number of probes distributed closest to each cluster around each cluster, and determining an initial probe position set; calculating the similarity between the angle power spectrum constructed by the initial probe and the angle power spectrum of the joint channel model to obtain a weight vector corresponding to the probe set; setting the probe with the minimum weight to be in an unselected state, randomly selecting a new probe from the selectable probe set, and recalculating the power spectrum similarity; and repeating the steps to ensure that the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model is the maximum, so as to obtain an optimal probe set.
Preferably, the calculating the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the channel model further comprises: calculating a target angle power spectrum of the combined model:
wherein the content of the first and second substances,
for the joint model target angle power spectrum, Pti(omega) is the angle power spectrum of a single model, and N is the number of channel models to be measured;
The similarity between the angle power spectrum constructed by the discrete probe and the angle power spectrum of the channel model is as follows:
wherein, the PSP is the similarity between the angle power spectrum constructed by the discrete probe and the angle power spectrum of the channel model, and is
Is a power spectrum of the angle of the channel model,
for the angular power spectrum constructed by the darkroom probe,
is a set of probe positions that are,
is the weight vector corresponding to the probe position set;
the target of probe position selection is to make PSP obtain the maximum value, which is converted into the following solution:
the embodiment of the present application further provides a performance test system for a millimeter wave terminal, including: base station module, first frequency conversion amplifirer, channel simulator, second frequency conversion amplifirer, switch matrix, probe: the base station module is used for sending downlink millimeter wave signals to the first variable frequency power amplifier and receiving and analyzing uplink millimeter wave signals returned by the first variable frequency power amplifier; the first frequency conversion power amplifier is configured to receive the downlink millimeter wave signal, down-convert the downlink millimeter wave signal to a signal suitable for the channel simulator, send the signal to the channel simulator, and receive an uplink signal returned by the channel simulator; the channel simulator is configured to receive a downlink signal sent by the first variable-frequency power amplifier, superimpose a fading characteristic corresponding to a current channel model, send the downlink signal to a second variable-frequency power amplifier, receive an uplink signal sent by the second variable-frequency power amplifier, superimpose a fading characteristic corresponding to the current channel model, and send the uplink signal to the first variable-frequency power amplifier; the second variable frequency power amplifier is used for receiving the downlink signal sent by the channel simulator, increasing the frequency to a millimeter wave signal and sending the millimeter wave signal to the switch matrix, receiving the uplink millimeter wave signal returned by the switch matrix, decreasing the frequency to a signal suitable for the channel simulator, and sending the signal to the channel simulator; the switch matrix is used for selecting a test probe used by the current channel model, receiving the downlink millimeter wave signal sent by the second variable frequency power amplifier and sending the downlink millimeter wave signal to the test probe, and receiving the uplink millimeter wave signal sent by the test probe and sending the uplink millimeter wave signal to the second variable frequency power amplifier; the test probe is used for receiving downlink millimeter wave signals sent by the switch matrix, transmitting the downlink millimeter wave signals to the millimeter wave terminal to be tested, receiving uplink millimeter wave signals returned by the millimeter wave terminal to be tested, and sending the uplink millimeter wave signals to the switch matrix.
Preferably, the base station module is a millimeter wave comprehensive tester or a millimeter wave base station accessed through an air interface mode, or a millimeter wave base station accessed through a conduction mode and providing a conduction interface.
Preferably, the first frequency conversion power amplifier and the second frequency conversion power amplifier have a bidirectional frequency conversion function.
Preferably, the first frequency conversion power amplifier and the second frequency conversion power amplifier are calibrated through link power and synchronized with a base station module time slot.
Preferably, the distances from the test probe to the millimeter wave terminal to be tested are equal.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects: compared with the traditional multi-probe air interface test method and system, the method and system have the advantages of being reciprocal in uplink and downlink and capable of achieving multi-model multi-scene performance test through a small number of probes.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic diagram of a conduction testing system;
FIG. 2 is a schematic structural diagram of a conventional darkroom multi-probe-based terminal performance testing system;
FIG. 3 is a diagram showing distribution of cluster arrival angles of two international standard models, 3GPP FR2 InO CDL-A and 3GPP FR2 UMi CDL-C;
fig. 4 is a flowchart of an embodiment of a millimeter wave terminal-oriented performance testing method;
fig. 5 is a flowchart of a fading characteristic method corresponding to a channel model for superimposing downlink millimeter wave signals;
fig. 6 is a flowchart of a method for superimposing an uplink millimeter wave signal on a fading characteristic corresponding to a channel model;
FIG. 7 is a flow chart of a method for selecting a test probe to construct an angle power spectrum identical to a channel model;
FIG. 8 is a flow chart of a method of generating a joined model;
FIG. 9 is a schematic diagram of millimeter wave base station beamforming gain;
FIG. 10 is a simplified front-to-back power comparison diagram of a channel model;
FIGS. 11(a), (b) are schematic diagrams of the distribution of arrival angles of multiple models before and after shifting;
FIG. 12 is a flow chart of a method of selecting an optimal probe set;
FIG. 13 is a schematic view of an angular power spectrum;
FIG. 14 is a schematic view of a set of probe positions;
FIG. 15 is a flow chart of a method of calculating similarity between an angle power spectrum constructed by a probe and an angle power spectrum of a channel model;
FIG. 16 is a schematic diagram of the final probe layout of 3GPP FR2 InO CDL-A and UMi CDL-C models;
FIG. 17 is a schematic structural diagram of an embodiment of a performance testing system for a millimeter wave terminal;
FIG. 18 is a schematic diagram of switching of a multi-mode test probe.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only a few embodiments of the present application, and not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort belong to the protection scope of the present application.
The frequency bands adopted by the 5G wireless communication technology can be divided into two bands: sub 6GHz band and millimeter wave band. The 5G network of Sub 6GHz frequency band has been deployed in each major city in China, while the 5G network of millimeter wave frequency band is first deployed in the major area of some cities in the United states. The Sub 6GHz band 5G network has larger coverage area, and the millimeter wave band 5G network has higher speed, lower time delay and larger capacity. The two frequency bands of 5G complement each other, so that the method has wide application prospect and can provide great driving force for industrial upgrading and revolution in the 5G era. As an important component of 5G wireless communication technology, the wide application of millimeter wave communication technology is in the near future, which means that millimeter wave mobile terminals are about to be applied in large scale, and thus the performance test requirements for millimeter wave devices are also increased sharply.
The performance test methods of communication equipment can be divided into two categories: a conduction method and an air interface method. Fig. 1 is a schematic structural diagram of a conduction test system. The transmission method is connected with the base station, the channel simulator and the terminal through wires to form an end-to-end link for performance test. Because the conduction method needs the base station and the terminal to provide a conduction interface for wire-in, and the conduction interface of the millimeter wave equipment is usually lacked, the conduction method is not suitable for the performance test of the millimeter wave equipment any more. Fig. 2 is a schematic structural diagram of a conventional darkroom multi-probe based terminal performance testing system, in which an LNA is a low noise amplifier, a PA is a power amplifier, and a DUT is a device under test. The traditional mainstream air interface method mainly comprises a reverberation chamber method, a two-step method, a multi-probe method and the like. The multi-probe method is also adopted by international organizations such as CTIA, ITU, 3GPP and the like as a standard air interface test method for terminal performance test. However, the conventional multi-probe air interface test system for terminal performance test can not be used for performance test of the millimeter wave terminal any more, and the reasons are mainly as follows: devices in a traditional multi-probe air interface test system do not support millimeter wave frequency bands, and a millimeter wave end-to-end link cannot be constructed. Probes in the traditional multi-probe air interface test system are uniformly distributed on a two-dimensional ring and are not in accordance with the characteristics of three-dimensionality, power centralization and the like of a millimeter wave channel. And thirdly, the base station side of the traditional multi-probe air interface test system still accesses the test system in a conduction mode, and the base station side in the millimeter wave terminal performance test is a millimeter wave base station without a conduction interface. In addition, the conventional multi-probe air interface test system has some disadvantages, for example, uplink and downlink are not reciprocal, so that uplink test cannot be performed, the number of probes required is too large, and the like.
The invention provides an end-to-end performance test system for millimeter wave terminal performance test and a method applied when the system is realized. First, on the test system architecture:
1. the one-way and two-way performance test of the millimeter wave terminal is effectively supported by using the frequency conversion power amplifier equipment which supports TDD time slot synchronization and can balance the uplink and downlink loss by adjusting the power amplifier size.
2. The terminal side adopts a mode of combining multiple probes and a switch matrix, different probe sets are accessed to different channel models in different scenes, and the multi-model and multi-scene millimeter wave terminal performance test is supported efficiently.
The invention provides an end-to-end performance test system for millimeter wave terminal performance test, which is characterized in that a hardware system is built by using devices such as a darkroom, a probe, a channel simulator, a variable frequency amplifier, a switch matrix and the like, so that the performance test of a millimeter wave terminal with reciprocal uplink and downlink is realized.
In addition, the invention also describes a specific method adopted for realizing the point 2, namely how to determine the corresponding probe position sets for a plurality of specific channel models. The method comprises the steps of model simplification, model shift, multi-model combined probe position optimization, single-model probe position selection, probe combination switching and the like, achieves multi-model multi-scene performance testing by using a small number of probes and switching combination, and can effectively support multi-scene multi-model millimeter wave terminal performance testing. The system can effectively meet the requirements of millimeter wave terminal performance test, supports the modeling of a standard CDL channel model and an actual propagation environment channel model, and effectively reduces the system cost and complexity while ensuring the reliability of the system and the repeatability of the test result.
Different channel models, or actual propagation environments, may have different power distributions. FIG. 3 is a cluster angle-of-arrival distribution diagram of two international standard models, 3GPP FR2 InO CDL-A and 3GPP FR2 UMi CDL-C, from which it can be seen that: firstly, the cluster arrival angle distribution range of the same model is large, so that the probe sharing among different clusters of the same model is difficult; ② the cluster arrival angle distribution of different models is very different, which makes it difficult to share the probe among different models. Due to the limitation of the number of channels of the channel simulator, the number K of actually available probes in actual test is far smaller than the total number of clusters of multiple models, so that the invention provides a millimeter wave terminal darkroom probe layout method for effectively supporting multi-model and multi-scene performance test by using a small number of probes, wherein the method relates to multiple steps of model simplification, multi-model centralized processing, multi-model joint probe position optimization, single-model probe position selection, probe combination switching and the like.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Fig. 4 is a flowchart of an embodiment of a performance testing method for a millimeter wave terminal. The performance test method for the millimeter wave terminal comprises the following steps:
step 11: generating a downlink millimeter wave signal, selecting a tested channel model, superposing the downlink millimeter wave signal on the fading characteristics corresponding to the channel model, and selecting a test probe, so that the test probe constructs an angle power spectrum which is the same as that of the channel model and sends the angle power spectrum to a millimeter wave terminal.
Firstly, generating a downlink millimeter wave signal, when a plurality of channel models need to be tested, selecting a tested channel model to obtain fading characteristics and an angle power spectrum corresponding to the channel model, superposing the downlink millimeter wave signal on the fading characteristics corresponding to the channel model, selecting a test probe capable of constructing the same angle power spectrum as the channel model, generally comprising a plurality of probes, transmitting the downlink signal by the selected test probe, and receiving by a millimeter wave terminal to be tested.
For example, a downlink millimeter wave signal is generated first, then a tested channel model is selected first, common channel models include a 3GPP FR2 InO CDL-a model, a 3GPP FR2 UMi CDL-C model and the like, each channel model corresponds to different fading characteristics and angle power spectrums, for example, a 3GPP FR2 InO CDL-a model is selected, the downlink millimeter wave signal is superimposed on the fading characteristics corresponding to the 3GPP FR2 InO CDL-a model, and a test probe is selected to construct an angle power spectrum the same as that of the 3GPP FR2 InO CDL-a model, the selected test probe generally consists of a plurality of probes, for example, there are 7 probes in total, and the selected test probes are 6 probes, for example. And transmitting a downlink signal by the selected test probe, and receiving by the millimeter wave terminal to be tested.
Step 12: and the millimeter wave terminal receives the signal and returns an uplink millimeter wave signal.
The measured millimeter wave terminal receives the downlink signal generated in the step 11, and returns a signal, namely an uplink millimeter wave signal after processing.
For example, in step 11, the test probe sends a downlink signal to the millimeter wave terminal, for example, the tested channel model is a 3GPP FR2 InO CDL-a model, and the downlink signal is received by the millimeter wave terminal to be tested and processed to return a signal, that is, an uplink millimeter wave signal.
Step 13: and superposing the uplink millimeter wave signal with the fading characteristics corresponding to the channel model, and analyzing the obtained signal to obtain the performance parameters of the millimeter wave terminal under the condition of the channel model.
And superposing an uplink millimeter wave signal returned by the millimeter wave terminal on the fading characteristic corresponding to the currently tested channel model, and then analyzing the obtained signal to obtain the performance parameters of the millimeter wave terminal under the condition of the channel model.
For example, the tested channel model is a 3GPP FR2 InO CDL-A model, an uplink millimeter wave signal returned by the millimeter wave terminal is superposed with the fading characteristics corresponding to the 3GPP FR2 InO CDL-A model, and the obtained signal is analyzed, so that the performance parameters of the millimeter wave terminal under the condition of the 3GPP FR2 InO CDL-A model are obtained.
Step 14: and replacing the test channel model, and repeating the steps for testing.
And after the test of one channel model is finished, continuing to test the next channel model, which is the same as the steps 11-13.
For example, after the channel model 3GPP FR2 InO CDL-A is tested, the next channel model is replaced to perform the test, for example, the 3GPP FR2 UMi CDL-C model, and the steps 11-13 are repeated to perform the test.
Fig. 5 is a flowchart of a method for superimposing a downlink millimeter wave signal on a fading characteristic corresponding to a channel model. The superimposing the downlink millimeter wave signal on the fading characteristic corresponding to the channel model further includes:
step 21: and reducing the frequency of the downlink millimeter wave signal.
In an actual usage scenario, the device used in step 22 may not support the millimeter wave frequency band, and the downlink millimeter wave signal needs to be down-converted to a frequency band that can be processed.
For example, the downlink millimeter wave signal is in a millimeter wave frequency band, and needs to be down-converted to a low frequency band and then processed.
Step 22: and superposing fading characteristics corresponding to the channel model.
And step 21, after the down millimeter wave signal is subjected to frequency reduction, superposing the fading characteristics corresponding to the channel model.
For example, in step 21, down-converting the downlink millimeter wave signal to a low frequency band, and then superimposing the fading characteristics corresponding to the channel model, for example, if the tested channel model is the 3GPP FR2 InO CDL-a model, superimposing the fading characteristics corresponding to the 3GPP FR2 InO CDL-a model.
Step 23: the signal is up-converted to a millimeter wave signal.
In step 22, after the fading characteristics are superimposed on the downlink signal, the downlink signal needs to be up-converted to a millimeter wave signal, and then is transmitted.
For example, the tested channel model is a 3GPP FR2 InO CDL-a model, and in step 22, the downlink signal is superimposed on the fading characteristics of the 3GPP FR2 InO CDL-a model, and then is up-converted to a millimeter wave signal.
Fig. 6 is a flowchart of a method for superimposing an uplink millimeter wave signal on a fading characteristic corresponding to a channel model. The superimposing the uplink millimeter wave signal on the fading characteristic corresponding to the channel model further includes:
step 31: and reducing the frequency of the uplink millimeter wave signal.
In an actual usage scenario, the device used in step 32 may not support the millimeter wave frequency band, and the uplink millimeter wave signal needs to be down-converted to a frequency band that can be processed.
For example, the uplink millimeter wave signal is in a millimeter wave frequency band, and needs to be down-converted to a low frequency band and then processed.
Step 32: and superposing fading characteristics corresponding to the channel model.
And step 31, after the uplink millimeter wave signal is subjected to frequency reduction, superposing the fading characteristics corresponding to the channel model.
For example, in step 31, the uplink millimeter wave signal is down-converted to a low frequency band, and then fading characteristics corresponding to the channel model are superimposed, for example, if the tested channel model is a 3GPP FR2 InO CDL-a model, fading characteristics corresponding to a 3GPP FR2 InO CDL-a model are superimposed.
Step 33: the signal is up-converted to a millimeter wave signal.
In step 32, after the uplink signal is superimposed with the fading characteristic, the uplink signal needs to be up-converted to the millimeter wave signal, and then is transmitted.
For example, the tested channel model is a 3GPP FR2 InO CDL-a model, and in step 32, the uplink signal is frequency-up-converted to a millimeter wave signal after being superimposed on the fading characteristics of the 3GPP FR2 InO CDL-a model.
FIG. 7 is a flowchart of a method for selecting a test probe to construct the same angle power spectrum as the channel model. The selecting a test probe and constructing the same angle power spectrum as the channel model further comprises:
step 41: and superposing the clusters of the channel models to obtain a combined model.
Different channel models, or actual propagation environments, may have different power distributions. The clusters of the multiple channel models are superposed to obtain a combined model, so that the distribution of the arrival angles of the multiple models tends to be centralized, and different models can share one part of probes.
For example, the channel models to be tested comprise a 3GPP FR2 InO CDL-A model and a 3GPP FR2 UMi CDL-C model, and clusters of the two channel models are superposed to obtain a combined model.
Step 42: and selecting an optimal probe set from all probes, wherein the number of the probes is S, the S is an integer not less than 1, and the similarity between an angle power spectrum constructed by the optimal probe set and an angle power spectrum of the combined model is the largest.
The method comprises the steps that an angle Power spectrum of a target channel model can be constructed through discrete probes, the Similarity (PSP) between the angle Power spectrum constructed by the discrete probes and the angle Power spectrum of the target channel model is used as a key index for determining the positions of the probes, S probe positions for multi-model testing can be obtained from potential M space positions in a space through joint model probe position optimization when the total number of selectable positions of the probes in the space is M, the Similarity between the angle Power spectrum constructed by the optimal probe set and the angle Power spectrum of the joint model is the largest, the S probes are not required by all models, and when one channel model is tested independently, the testing probes are selected from the S probe positions.
For example, when the total number M of selectable positions of probes in the space is 80, the position of the optimal probe set is selected, the similarity between the constructed angle power spectrum and the angle power spectrum of the joint model is the largest, the number of probes in the optimal probe set is, for example, S is 8, and when a channel model is tested independently, the test probes are all selected from the set consisting of the 8 probes.
Step 43: selecting a channel model to be tested, selecting K probes from the optimal probe set as a test probe combination, wherein K is an integer not less than 1 and not more than S, and the similarity between an angle power spectrum constructed by the test probe combination and the angle power spectrum of the channel model to be tested is the largest.
The number of probes of the optimal probe set corresponding to the combined model is S, the S probes are not required by all models, in addition, the number of channels of the channel simulator in actual use also limits the actual number of probes, and the actual number of available probes K<And S. Therefore, when any single channel model is loaded for testing, K probes are selected from the S probes to serve as a test probe combination, K is an integer which is not less than 1 and not more than S, and the similarity between the angle power spectrum constructed by the test probe combination and the angle power spectrum of the channel model to be tested is the largest. Because the values of S and K are smaller under general conditions, the optimal K probes for the current single model can be selected in an ergodic mode, and the total number of the combination is
The method comprises the following specific steps:
step 43-1: selecting a channel model i, i belongs to [1,2]I is initially 1 and N is the total number of channel models. Target angular power spectrum at this time
Step 43-2: go through
Probe position set corresponding to each probe combination
And calculating the angle power spectrum similarity one by one.
Step 43-3: and when the angle power spectrum similarity is maximum, the corresponding K probes are the test probe combination of the current channel model.
Through the single model probe selection process, a corresponding optimal probe set can be selected for each channel model. In the actual test, the corresponding probe combination is switched through the switch matrix, so that the multi-model multi-scene millimeter wave terminal performance test is flexibly supported.
For example, the number of probes in the optimal probe set corresponding to the joint model is S-8, the number of channels of the channel simulator in actual use is 6, and the number of probes used for testing each channel model is K-6, and 6 probes are selected from the 8 probes as the test probe set by using a traversal method, so that the similarity between the angle power spectrum constructed by the test probe set and the angle power spectrum of the channel model to be tested is the maximum.
And step 44: and replacing a channel model to be tested, repeating the steps, and selecting test probe combinations for all the channel models to be tested.
And (4) selecting a test probe set by using the method for all the channel models to be tested, then carrying out step 43-3, if i is less than N and i is i +1, repeatedly executing the steps, and otherwise, ending the circulation.
For example, there are 2 channel models to be tested, for example, the 3GPP FR2 InO CDL-a model test probe set is selected first, and after the selection is finished, the 3GPP FR2 UMi CDL-C model test probe set is selected, and after both channel models are selected, the selection is finished.
FIG. 8 is a flow chart of a method of generating a joined model. The stacking the clusters of the channel models to obtain the combined model further comprises:
step 51: and selecting a channel model to be tested, and sequencing clusters of the channel model from large to small according to the original power.
The magnitude of the composite fading on the signal for each path (cluster) from the base station to the terminal should be the base station side gain on that path plus the eigen-space fading of that path. The inherent spatial fading differences on each path may be relatively close, which may result in a large number of paths. If the beamforming gain at the base station side is considered, the synthetic fading of each path may have a difference, and the number of paths is small at this time. With this feature, the channel model can be simplified. The method comprises the steps of selecting a channel model to be tested, and sequencing clusters of the channel model from large to small according to original power.
For example, a 3GPP FR2InO CDL-A model is selected as a test channel model, and clusters of the 3GPP FR2InO CDL-A model are sorted from large to small according to original power.
Step 52: and taking the departure angle of the cluster with the maximum power as the beam direction of the base station, and calculating to obtain the forming shape of the beam of the base station and the gain in the direction of each cluster in space.
And taking the departure angle AOD & ZOD of the cluster with the strongest power obtained in the step 51 as a beam direction, and calculating to obtain a beam forming shape of the base station side. At this time, the gain of the base station beam in each cluster direction in space can be known. The millimeter wave base station usually has strong beam forming capability, and due to the beam forming function, the power gain in the center direction is much larger than that in other directions.
For example, as shown in fig. 9, fig. 9 is a schematic diagram of a millimeter wave base station beam forming gain, and a forming shape of a base station beam and a gain in each cluster direction in space are obtained by calculating, with an exit angle of a cluster with the largest power as a base station beam direction.
Step 53: and calculating to obtain the comprehensive power of each cluster according to the original power of each cluster and the beam gain of the base station in the direction of the cluster.
The magnitude of the composite fading on the signal for each path (cluster) from the base station to the terminal should be the base station side gain on that path plus the eigen-space fading of that path. The inherent spatial fading differences on each path may be relatively close, when the number of paths is large. If the beamforming gain at the base station side is considered, the comprehensive fading of each path may have a large difference, and the number of paths is small at this time. With this feature, the channel model can be simplified. In this step, the comprehensive power of each cluster is calculated according to the original power of each cluster and the beam gain of the base station in the direction of the cluster, and the model is simplified according to the comprehensive power.
For example, the test channel model is a 3GPP FR2 InO CDL-a model, and the shaped shape of the base station beam is, for example, as shown in fig. 9, the integrated power of each cluster is calculated according to the original power of each cluster of the channel model and the base station beam gain in the direction in which the cluster is located.
Step 54: and sequencing the clusters of the channel model from large to small according to the comprehensive power, reserving the clusters which occupy 99.99% of the total power accumulatively, and removing the rest low-power clusters to obtain the simplified model of the current channel model.
In step 53, the beamforming gain at the base station side is considered, the possible difference of the comprehensive fading of each path is large, and the selected clusters which occupy 99.99% of the total power cumulatively can represent the basic situation of the original channel model equivalently, so that the remaining low-power clusters can be eliminated, and the cluster dispersion degree is reduced by reducing the number of unnecessary clusters, so that the simplified model of the current channel model is obtained.
For example, the tested channel model is 3GPP 38.827FR2 InO CDL-a model, fig. 10 is a power comparison diagram before and after simplification of the channel model, before simplification, the power difference between most clusters and the strongest cluster is less than 20dB, and after simplification, the power difference between other clusters and the strongest cluster is greater than 60 dB. Ignoring the low power clusters, the model of the original 19 clusters can now be reduced to a single cluster model.
Step 55: and (4) replacing the channel models, and repeating the steps to obtain simplified models of all the channel models to be tested.
All channel models can be simplified according to steps 51-54.
Step 56: and moving the cluster arrival angles of the simplified models of the channel models to enable the arrival angle directions of the clusters with the maximum comprehensive power of the channel models to be coincident.
The model simplification process is independently operated for each model, and the cluster dispersion degree is reduced by reducing the number of unnecessary clusters. The step is to perform multi-model concentration, which is a joint operation aiming at the multi-model, and the arrival angle distribution of the multi-model tends to be centralized through the spatial displacement of the arrival angle at the terminal side of the channel model. The method comprises the following specific steps:
step 56-1: and determining the strongest cluster of each model according to the comprehensive power of each cluster after model simplification.
Step 56-2: and moving the arrival angles of the clusters (ZOA and AOA) by taking the (ZOA-0 and AOA-0) direction or the direction of the strongest cluster arrival angle of any model as a reference, so that the directions of the strongest cluster arrival angles of the clusters coincide. During the move, the relative difference in arrival angle of each cluster within a single model remains unchanged.
By centralized processing of multiple models, the dispersion degree of the arrival angles of the multiple models can be reduced, and the universality of the probe is further improved.
For example, as shown in fig. 11(a) and (b), the distribution of arrival angles of multiple models before and after shifting is shown, fig. 11(a) is before shifting, and fig. 11(b) is after shifting. In the initial state, the horizontal range of the arrival angles of the two models is 120 °, and the range of the arrival angles is only 40 ° after the two models are moved with reference to the (ZOA ═ 0, AOA ═ 0) direction.
FIG. 12 is a flow chart of a method of selecting an optimal probe set. After the angular distribution of arrival of the multiple models is determined, the multiple model joint probe position optimization needs to be carried out according to the multiple model angular power spectrum determined by the multiple model joint probe position optimization, namely S probes are selected from M potential probe positions for placing the probes. The selecting an optimal probe set from all the probes further comprises:
step 61: and allocating an initial number of probes to each cluster, wherein the proportion of the number of the probes allocated to each cluster is the same as the cluster power ratio of the combined model, and the total number of the probes is S.
The total number of potential probe positions in the space is M, the total number of probes used for testing is S, S probes need to be selected, the S probes are firstly distributed to each cluster of the combined model, and the proportion of the number of the probes distributed to each cluster is the same as the cluster power ratio of the combined model.
For example, if the combined model has 4 clusters, the power ratio is, for example, 0.4:0.3:0.2:0.1, and the number of probe positions to be finally determined is S, the initial number of probes to be divided into the 4 clusters is 0.4S, 0.3S, 0.2S, and 0.1S, respectively.
Step 62: and selecting the corresponding number of probes which are distributed closest to the cluster around each cluster, and determining an initial probe position set.
The corresponding number of probes allocated closest to each cluster is selected around each cluster, generally one by one starting from the cluster with the strongest power, and the number of probes is the corresponding number of probes allocated in step 61, thereby determining an initial probe position set.
For example, the joint model has 4 clusters, the initial number of probes divided into 4 clusters is 0.4S, 0.3S, 0.2S, and 0.1S, respectively, the probes allocated to the cluster with the strongest power are selected one by one from the cluster with the strongest power, and the number of the probes selected in 4 clusters is 0.4S, 0.3S, 0.2S, and 0.1S, for example, as shown in fig. 14, fig. 14 is a schematic diagram of a probe position set.
And step 63: calculating the similarity between the angle power spectrum constructed by the initial probe and the angle power spectrum of the joint channel model to obtain a weight vector corresponding to the probe set
The angle power spectrum represents the power distribution of signals in space, and the construction of the angle power spectrum consistent with a target channel model is the key for performing the performance test of the millimeter wave terminal. The angle power spectrum similarity is used here to consider the consistency of the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model. And calculating the similarity between the angle power spectrum constructed by the initial probe and the angle power spectrum of the joint channel model, and obtaining a weight vector corresponding to the probe set.
For example, as shown in fig. 13, fig. 13 is an angle power spectrum diagram, and the angle power spectrum similarity is used to consider the consistency between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model.
Step 64: and setting the probe with the minimum weight to be in an unselected state, randomly selecting a new probe from the selectable probe set, and recalculating the power spectrum similarity.
And setting the probe with the minimum weight to be in an unselected state, randomly selecting a new probe from the rest selectable probe sets to form a new probe set, and recalculating the power spectrum similarity.
For example, the weight vector corresponding to the probe set is calculated in step 63, the weights are sorted from large to small, the probe with the smallest weight is set in an unselected state, a new probe is randomly selected from the selectable probe set, and the power spectrum similarity is recalculated.
Step 65: and repeating the steps to ensure that the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model is the maximum, so as to obtain an optimal probe set.
Repeating the steps 63-64, optimizing, and when the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model is maximum, taking the obtained probe set as an optimal probe set 
FIG. 15 is a flowchart of a method for calculating similarity between an angle power spectrum constructed by a probe and an angle power spectrum of a channel model. The calculating the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the channel model further comprises the following steps:
step 71: calculating a target angle power spectrum of the combined model:
wherein, the first and the second end of the pipe are connected with each other,
for the joint model target angle power spectrum, PtiAnd (omega) is an angle power spectrum of a single model, N is the number of channel models to be detected, and omega is a three-dimensional space angle coordinate.
Step 72: the similarity between the angle power spectrum constructed by the discrete probe and the angle power spectrum of the channel model is as follows:
wherein, the PSP is the similarity between the angle power spectrum constructed by the discrete probe and the angle power spectrum of the channel model, and is
Is a spectrum of the angular power of the channel model,
for the angular power spectrum constructed by the darkroom probe,
is a set of probe positions that are,
is the weight vector corresponding to the set of probe positions.
Step 73: the target of probe position selection is to make PSP obtain the maximum value, which is converted into the following solution:
and (4) simplifying the maximum similarity between the angle power spectrum constructed by the probe in the step (63-65) and the angle power spectrum of the joint channel model into the minimum of the equation (3), wherein the minimum obtained by the equation is the maximum similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model.
For example, as shown in FIG. 16, FIG. 16 is a schematic diagram of the final probe layout of the 3GPP FR2 InO CDL-A and UMi CDL-C models. The method of the present invention ultimately results in the probe layout shown in fig. 16. A total of 7 probes are used and 6 probes are used in the single model, wherein 5 probes are shared and one probe is exclusive to each other. Therefore, in practical use, only one-to-two switch matrix needs to be added to effectively construct two models in a darkroom.
Fig. 17 is a schematic structural diagram of an embodiment of a performance testing system for a millimeter wave terminal. The performance test system for the millimeter wave terminal provided by the embodiment of the application comprises: a base station module 101, a first variable frequency power amplifier 102, a channel simulator 103, a second variable frequency power amplifier 104, a switch matrix 105, and a test probe 106: the base station module 101 is configured to send a downlink millimeter wave signal to the first variable frequency power amplifier 102, and receive and analyze an uplink millimeter wave signal returned by the first variable frequency power amplifier 102; the first frequency conversion power amplifier 102 is configured to receive the downlink millimeter wave signal, down-convert the downlink millimeter wave signal to a signal suitable for the channel simulator 103, send the signal to the channel simulator 103, and receive an uplink signal returned by the channel simulator 103; the channel simulator 103 is configured to receive a downlink signal sent by the first variable frequency power amplifier 102, superimpose a fading characteristic corresponding to a current channel model, send the downlink signal to the second variable frequency power amplifier 104, receive an uplink signal sent by the second variable frequency power amplifier 104, superimpose a fading characteristic corresponding to the current channel model, and send the uplink signal to the first variable frequency power amplifier 102; the second variable frequency power amplifier 104 is configured to receive a downlink signal sent by the channel simulator 103, boost the downlink signal to a millimeter wave signal and send the millimeter wave signal to the switch matrix 105, receive an uplink millimeter wave signal returned by the switch matrix 105, down-convert the uplink millimeter wave signal to a signal suitable for the channel simulator 103, and send the signal to the channel simulator 103; the switch matrix 105 is configured to select a test probe 106 used by a current channel model, receive a downlink millimeter wave signal sent by the second variable frequency power amplifier 104 and send the downlink millimeter wave signal to the test probe 106, and receive an uplink millimeter wave signal sent by the test probe 106 and send the uplink millimeter wave signal to the second variable frequency power amplifier 104; the test probe 106 is configured to receive the downlink millimeter wave signal sent by the switch matrix 105, transmit the downlink millimeter wave signal to the millimeter wave terminal to be tested, receive the uplink millimeter wave signal returned by the millimeter wave terminal to be tested, and send the uplink millimeter wave signal to the switch matrix 105.
In the following exemplary embodiment, the millimeter wave signal from the base station module 101 is input to the first frequency conversion amplifier 102 and then down-converted to a low frequency signal suitable for the channel simulator 103. After superimposing the fading characteristics on the low-frequency signal, the channel simulator 103 inputs the low-frequency signal into the second variable frequency amplifier 104, and the second variable frequency amplifier 104 upconverts the low-frequency signal to a millimeter wave signal. The millimeter wave signals then propagate through switch matrix 105 and test probe 106 in communication therewith to a test area in the darkroom and are ultimately received by the millimeter wave terminals in the test area.
In the above embodiment, the millimeter wave signal from the millimeter wave terminal sequentially passes through the darkroom space of the terminal, the test probe 106 and the switch matrix 105, then propagates to the second frequency conversion amplifier 104, and is down-converted to be input to the channel simulator 103. After superimposing the fading characteristics on the signal, the channel simulator 103 inputs the signal into the first frequency conversion amplifier 102, and the first frequency conversion amplifier 102 up-converts the low frequency signal to a millimeter wave signal, and finally, the millimeter wave signal is received by the base station module 101.
The distribution of the test probes 106 is shown in fig. 18, for example, and fig. 18 is a switching diagram of a multi-model test probe. The probe wall has 8 probes, and the number of probes required by each model is 6. Now, 8 probes are used for realizing A, B, C three models, wherein 1, 2, 3, 4, 5 and 7 participate in model a, 1, 2, 3, 4, 5 and 6 participate in model B, and 1, 2, 3, 4, 5 and 8 participate in model C, so that multi-model testing can be realized by using a one-to-three switch matrix 105. The concrete mode is as follows: the five common probes 1, 2, 3, 4, and 5 are directly connected to the ports of the second variable frequency power amplifier 104, when testing the model a, the probe 7 is connected to the second variable frequency power amplifier 104 through the switch matrix 105, when testing the model B, the probe 6 is connected to the second variable frequency power amplifier 104 through the switch matrix 105, and when testing the model C, the probe 8 is connected to the second variable frequency power amplifier 104 through the switch matrix 105.
Preferably, the base station module 101 is a millimeter wave comprehensive tester or a millimeter wave base station accessed through an air interface, or a millimeter wave base station accessed through a conduction mode and providing a conduction interface.
The base station module 101 is configured to implement receiving and transmitting of signals at the side of the 5G millimeter wave base station, and an entity of the base station module may be a millimeter wave comprehensive tester or a millimeter wave base station accessed through an air interface, or a millimeter wave base station accessed through a conduction mode and providing a conduction interface.
Preferably, the first frequency conversion amplifier 102 and the second frequency conversion amplifier 104 have a bidirectional frequency conversion function.
The first variable frequency power amplifier 102 and the second variable frequency power amplifier 104 both have a bidirectional variable frequency function, that is, if a low frequency signal is input, a millimeter wave signal is output, and if a millimeter wave signal is input, a low frequency signal is output.
Preferably, the first frequency conversion power amplifier 102 and the second frequency conversion power amplifier 104 are calibrated by link power and synchronized with the time slot of the base station module 101.
The first variable frequency power amplifier 102 and the second variable frequency power amplifier 104 can enable the system to support a bidirectional performance test of uplink and downlink reciprocity through link power calibration and time slot synchronization with the base station module 101.
Preferably, the distances from the test probe 106 to the millimeter wave terminal to be tested are equal.
The test probe 106 is arranged at a specific position of a terminal darkroom and is fixed on a spherical surface with the same distance with a millimeter wave terminal to be tested through a probe wall or a bracket and other equipment.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art to which the present application pertains. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (11)
1. A performance test method for a millimeter wave terminal is characterized by comprising the following steps:
Generating a downlink millimeter wave signal, selecting a tested channel model, superposing the downlink millimeter wave signal on fading characteristics corresponding to the channel model, selecting a test probe, enabling the test probe to construct an angle power spectrum which is the same as that of the channel model, and sending the angle power spectrum to a millimeter wave terminal;
the selecting a test probe and constructing the same angle power spectrum as the channel model further comprises:
superposing the clusters of the channel models to obtain a combined model;
selecting an optimal probe set from all probes, wherein the number of the probes is S, the S is an integer not less than 1, and the similarity between an angle power spectrum constructed by the optimal probe set and an angle power spectrum of a combined model is maximum;
selecting a channel model to be tested, selecting K probes from the optimal probe set as a test probe combination, wherein K is an integer not less than 1 and not more than S, and the similarity between an angle power spectrum constructed by the test probe combination and an angle power spectrum of the channel model to be tested is the largest;
replacing a channel model to be tested, repeating the steps, and selecting test probe combinations for all the channel models to be tested;
the millimeter wave terminal receives the signal and returns an uplink millimeter wave signal;
Superposing the uplink millimeter wave signal on the fading characteristics corresponding to the channel model, and analyzing the obtained signal to obtain the performance parameters of the millimeter wave terminal under the condition of the channel model;
and replacing the test channel model, and repeating the steps for testing.
2. The method of claim 1, wherein said superimposing the downlink millimeter wave signal with the fading characteristics corresponding to the channel model further comprises:
reducing the frequency of the downlink millimeter wave signal;
superposing fading characteristics corresponding to the channel model;
the signal is up-converted to a millimeter wave signal.
3. The method of claim 1, wherein said superimposing the uplink millimeter wave signal with the fading characteristics corresponding to the channel model further comprises:
reducing the frequency of the uplink millimeter wave signal;
superposing fading characteristics corresponding to the channel model;
the signal is up-converted to a millimeter wave signal.
4. The method of claim 1, wherein the superimposing clusters of channel models to obtain a joint model further comprises:
selecting a channel model to be tested, and sequencing clusters of the channel model from large to small according to original power;
Taking the departure angle of the cluster with the maximum power as the beam direction of the base station, and calculating to obtain the shaped shape of the beam of the base station and the gain in each cluster direction in space;
calculating to obtain the comprehensive power of each cluster according to the original power of each cluster and the beam gain of the base station in the direction of the cluster;
sorting clusters of the channel model from large to small according to the comprehensive power, reserving the clusters which occupy 99.99% of the total power accumulatively, and removing the rest low-power clusters to obtain a simplified model of the current channel model;
replacing the channel models, and repeating the steps to obtain simplified models of all the channel models to be tested;
and moving the cluster arrival angles of the simplified models of the channel models to enable the arrival angle directions of the clusters with the maximum comprehensive power of the channel models to be coincident.
5. The method of claim 1, wherein said selecting an optimal set of probes from all probes further comprises:
distributing an initial number of probes for each cluster, wherein the number proportion of the probes distributed for each cluster is the same as the cluster power ratio of the combined model, and the total number of the probes is S;
selecting a corresponding number of allocated probes nearest to each cluster around each cluster, and determining an initial probe position set;
calculating the similarity between the angle power spectrum constructed by the initial probe and the angle power spectrum of the joint channel model to obtain a weight vector corresponding to the probe set;
Setting the probe with the minimum weight to be in an unselected state, randomly selecting a new probe from the selectable probe set, and recalculating the power spectrum similarity;
and repeating the steps to ensure that the similarity between the angle power spectrum constructed by the probe and the angle power spectrum of the joint channel model is the maximum, so as to obtain an optimal probe set.
6. The method of claim 5, wherein calculating the similarity of the probe-constructed angular power spectrum to the angular power spectrum of the channel model, further comprises:
calculating a target angle power spectrum of the combined model:
wherein, the first and the second end of the pipe are connected with each other,
for the joint model target angle power spectrum, Pti(omega) is the angle power spectrum of a single model, and N is the number of channel models to be measured;
the similarity between the angle power spectrum constructed by the discrete probe and the angle power spectrum of the channel model is as follows:
wherein, PSP is an angle power spectrum and a channel mode constructed by a discrete probeThe angle power spectrum similarity of the type is
Is a spectrum of the angular power of the channel model,
for the angular power spectrum constructed by the darkroom probe,
is a set of probe positions that are,
is the weight vector corresponding to the probe position set;
the target of probe position selection is to make PSP obtain the maximum value, which is converted into the following solution:
7. a performance test system for a millimeter wave terminal, which is used for implementing the method of any one of claims 1 to 6, and is characterized by comprising: base station module, first frequency conversion power amplifier, channel simulator, second frequency conversion power amplifier, switch matrix, test probe:
The base station module is used for sending downlink millimeter wave signals to the first variable frequency power amplifier and receiving and analyzing uplink millimeter wave signals returned by the first variable frequency power amplifier;
the first frequency conversion power amplifier is configured to receive the downlink millimeter wave signal, down-convert the downlink millimeter wave signal to a signal suitable for the channel simulator, send the signal to the channel simulator, and receive an uplink signal returned by the channel simulator;
the channel simulator is configured to receive a downlink signal sent by the first variable-frequency power amplifier, superimpose a fading characteristic corresponding to a current channel model, send the downlink signal to a second variable-frequency power amplifier, receive an uplink signal sent by the second variable-frequency power amplifier, superimpose a fading characteristic corresponding to the current channel model, and send the uplink signal to the first variable-frequency power amplifier;
the second variable frequency power amplifier is used for receiving the downlink signal sent by the channel simulator, increasing the frequency to a millimeter wave signal and sending the millimeter wave signal to the switch matrix, receiving the uplink millimeter wave signal returned by the switch matrix, decreasing the frequency to a signal suitable for the channel simulator, and sending the signal to the channel simulator;
the switch matrix is used for selecting a test probe used by the current channel model, receiving the downlink millimeter wave signal sent by the second variable frequency power amplifier and sending the downlink millimeter wave signal to the test probe, and receiving the uplink millimeter wave signal sent by the test probe and sending the uplink millimeter wave signal to the second variable frequency power amplifier;
The test probe is used for receiving the downlink millimeter wave signals sent by the switch matrix, transmitting the downlink millimeter wave signals to the millimeter wave terminal to be tested, receiving the uplink millimeter wave signals returned by the millimeter wave terminal to be tested, and sending the uplink millimeter wave signals to the switch matrix.
8. The system of claim 7, wherein the base station module is a millimeter wave integrated tester or a millimeter wave base station accessed through an air interface manner, or a millimeter wave base station accessed through a conduction manner and providing a conduction interface.
9. The system of claim 7, wherein the first variable frequency amplifier and the second variable frequency amplifier have a bi-directional frequency conversion function.
10. The system of claim 7, wherein the first variable frequency power amplifier and the second variable frequency power amplifier are aligned with link power and are time slot synchronized with a base station module.
11. The system of claim 7, wherein the test probes are equidistant from the millimeter wave terminals under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010682118.2A CN111884734B (en) | 2020-07-15 | 2020-07-15 | Performance test method and system for millimeter wave terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010682118.2A CN111884734B (en) | 2020-07-15 | 2020-07-15 | Performance test method and system for millimeter wave terminal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111884734A CN111884734A (en) | 2020-11-03 |
| CN111884734B true CN111884734B (en) | 2022-05-24 |
Family
ID=73155447
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010682118.2A Active CN111884734B (en) | 2020-07-15 | 2020-07-15 | Performance test method and system for millimeter wave terminal |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111884734B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107800495A (en) * | 2016-09-01 | 2018-03-13 | 是德科技股份有限公司 | The system and method that radio channel for multiple-input, multiple-output Radio Link emulates |
| CN109787698A (en) * | 2018-12-18 | 2019-05-21 | 北京星河亮点技术股份有限公司 | Probe radiation right-value optimization method and system when channel simulation in Multi probe darkroom |
| CN110166143A (en) * | 2018-02-12 | 2019-08-23 | 中国信息通信研究院 | A kind of test method of base station performance, equipment and system |
| US10684318B1 (en) * | 2018-10-30 | 2020-06-16 | Keysight Technologies, Inc. | System and method for testing analog beamforming device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10110326B1 (en) * | 2017-09-30 | 2018-10-23 | Keysight Technologies, Inc. | Multi-probe anechoic chamber (MPAC) over-the-air (OTA) test system having a radio channel (RC) emulator that has a dynamically-variable channel model, and methods |
-
2020
- 2020-07-15 CN CN202010682118.2A patent/CN111884734B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107800495A (en) * | 2016-09-01 | 2018-03-13 | 是德科技股份有限公司 | The system and method that radio channel for multiple-input, multiple-output Radio Link emulates |
| CN110166143A (en) * | 2018-02-12 | 2019-08-23 | 中国信息通信研究院 | A kind of test method of base station performance, equipment and system |
| US10684318B1 (en) * | 2018-10-30 | 2020-06-16 | Keysight Technologies, Inc. | System and method for testing analog beamforming device |
| CN109787698A (en) * | 2018-12-18 | 2019-05-21 | 北京星河亮点技术股份有限公司 | Probe radiation right-value optimization method and system when channel simulation in Multi probe darkroom |
Non-Patent Citations (4)
| Title |
|---|
| 5G毫米波端到端性能测试技术研究;张翔等;《移动通信》;20200415;第44卷(第4期);第69-77页 * |
| Probe Selection and Power Weighting for MIMO OTA Testing with Multiple Users;Shitong Zhe等;《2019 IEEE 19th International Conference on Communication Technology (ICCT)》;20200102;第810-813页 * |
| Study on radiated metrics and test methodology for the verification of multi-antenna reception performance of NR user equipment (UE);3GPP;《R4-2006307 3GPP TR 38.827 V1.4.0》;20200615;第54-57页 * |
| 基于暗室多探头的Massive MIMO空口测试方法研究;乔尚兵;《中国优秀硕士学位论文全文数据库信息科技辑》;20190915;第27-44页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111884734A (en) | 2020-11-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Medbo et al. | Radio propagation modeling for 5G mobile and wireless communications | |
| Kyösti et al. | On radiated performance evaluation of massive MIMO devices in multiprobe anechoic chamber OTA setups | |
| CN108347268B (en) | System and method for performing multiple-input multiple-output (MIMO) over-the-air test | |
| CN109889239B (en) | Double-darkroom structure for MIMO OTA test and test method | |
| KR101328760B1 (en) | Over-the-air test | |
| CN110166143B (en) | Method, equipment and system for testing performance of base station | |
| Zhao et al. | Neural network and GBSM based time-varying and stochastic channel modeling for 5G millimeter wave communications | |
| Roivainen et al. | Geometry-based stochastic channel model for two-story lobby environment at 10 GHz | |
| CN106559149B (en) | A kind of throughput testing approach and device of multiple terminals | |
| CN108494512B (en) | Millimeter wave large-scale MIMO channel simulation system and method | |
| CN109586813A (en) | For executing the measuring system and method for test measurement | |
| CN105656569A (en) | Wireless signal measurement system | |
| CN114665998B (en) | Triple non-stationary wireless communication channel modeling method under space-time consistency | |
| WO2009117926A1 (en) | Virtual field wireless test system | |
| CN111884734B (en) | Performance test method and system for millimeter wave terminal | |
| Bhatia et al. | Efficient ray-tracing channel emulation in industrial environments: An analysis of propagation model impact | |
| Matsumura et al. | Development and initial implementation of large-scale wireless emulator toward beyond 5G | |
| Zhang et al. | Multifrequency wireless channel measurements and characterization in large indoor office environments | |
| Miao et al. | Simulation-based investigation on massive multi-antenna system as to spatial channel hardening for mobile single user in a controlled multipath environment | |
| CN106559276B (en) | Throughput testing method and device for multiple terminals | |
| Kyösti | Radio channel modelling for 5G telecommunication system evaluation and over the air testing | |
| Wollenschläger et al. | Antenna configurations for over-the-air testing of wireless automotive communication systems | |
| CN106559275B (en) | A kind of throughput testing approach and device of multiple terminals | |
| Aslam et al. | Massive MIMO channel performance analysis considering separation of simultaneous users | |
| Wang et al. | Millimeter wave channel characterization for a large waiting hall by measurements and simulations |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |