CN111858382A - Application program testing method, device, server, system and storage medium - Google Patents

Application program testing method, device, server, system and storage medium Download PDF

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CN111858382A
CN111858382A CN202010766698.3A CN202010766698A CN111858382A CN 111858382 A CN111858382 A CN 111858382A CN 202010766698 A CN202010766698 A CN 202010766698A CN 111858382 A CN111858382 A CN 111858382A
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time
consuming data
test
fusion
application program
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李仁伟
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Beijing Dajia Internet Information Technology Co Ltd
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Beijing Dajia Internet Information Technology Co Ltd
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    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3644Software debugging by instrumenting at runtime
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/366Software debugging using diagnostics

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Abstract

The disclosure relates to an application program testing method, an application program testing device, a server, an application program testing system and a storage medium, and belongs to the technical field of computers. The method comprises the following steps: the method comprises the steps of obtaining an equipment identifier of a target terminal to be tested, inquiring a plurality of time-consuming data corresponding to the equipment identifier from an application server, wherein each time-consuming data and the corresponding equipment identifier are obtained by the application server through a point burying program added in a first application program, adopting at least two fusion processing modes, carrying out fusion processing on the time-consuming data to obtain at least two fusion time-consuming data, determining a scene time-consuming result of the first application program, adopting different fusion modes to carry out fusion processing on the time-consuming data, enabling the fusion time-consuming data to describe the time consumed by page jump operation more accurately, and improving the accuracy of the obtained fusion time-consuming data. And different fusion time-consuming data are obtained, the considered angles are different, the information quantity is improved, and the accuracy of the obtained page jump result is further improved.

Description

Application program testing method, device, server, system and storage medium
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a method, an apparatus, a server, a system, and a storage medium for testing an application program.
Background
With the rapid development of computer technology, various applications appear, and with the continuous improvement of user requirements, performance testing needs to be performed on the applications to meet the requirements of users. An important index affecting the performance of the application is the time-consuming data consumed by the application running scenario, and therefore, a method for testing the time-consuming data is urgently needed.
In the related art, an application program receives a scene test instruction, starts to run a preset test scene indicated by the scene test instruction, records start time, records end time when running of the preset test scene is finished, and determines a time interval between the start time and the end time as time consumption data for running the preset test scene.
However, only the time interval between the start time and the end time is determined as the time-consuming data, and the amount of information to be considered is small, resulting in low accuracy of the time-consuming data.
Disclosure of Invention
The present disclosure provides an application program testing method, apparatus, server, system, and storage medium, which can improve the accuracy of the obtained fused time-consuming data, improve the amount of information, and further improve the accuracy of the obtained scene time-consuming result.
According to a first aspect of the embodiments of the present disclosure, there is provided an application program testing method, the method including:
acquiring a device identifier of a target terminal to be tested, wherein the target terminal is used for receiving a preset-frequency scene test instruction sent by a test terminal and calling a first application program to run a preset test scene for the preset frequency;
querying a plurality of time-consuming data corresponding to the device identifier from an application server, wherein each time-consuming data is used for indicating the time-consuming duration of the first application program running once in the preset test scenario, and each time-consuming data and the corresponding device identifier are acquired by the application server through a point-embedded program added in the first application program;
and performing fusion processing on the plurality of time-consuming data by adopting at least two fusion processing modes to obtain at least two fusion time-consuming data, and determining the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
In a possible implementation manner, the application server is configured to obtain a start time and an end time through the embedded point program, and determine a time interval between the start time and the end time as time-consuming data, where the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
In another possible implementation manner, the at least two fusion processing manners are adopted to perform fusion processing on the multiple time-consuming data to obtain at least two fusion time-consuming data, which include at least two of the following items:
determining the average duration of the plurality of time-consuming data by adopting an average processing mode to serve as first fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the time length of the multiple time-consuming data in a quantile selection processing mode to serve as second fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length; alternatively, the first and second electrodes may be,
and determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
In another possible implementation, the method further includes:
acquiring at least two historical fusion time-consuming data corresponding to the at least two fusion processing modes, wherein each historical fusion time-consuming data is obtained by adopting the corresponding fusion processing mode to perform fusion processing on a plurality of historical time-consuming data of a second application program, and the second application program is a historical version of the first application program;
comparing the at least two fusion time-consuming data with corresponding historical fusion time-consuming data respectively, and determining a test result of the first application program, wherein the historical fusion time-consuming data corresponding to the fusion time-consuming data is historical fusion time-consuming data obtained by adopting the same fusion processing mode as the fusion time-consuming data.
In another possible implementation manner, the comparing the at least two fused time-consuming data with corresponding historical fused time-consuming data, and determining the test result of the first application program includes:
when the at least two pieces of fusion time-consuming data are both smaller than the corresponding historical fusion time-consuming data, determining that the first application program is successfully tested; alternatively, the first and second electrodes may be,
and when any fused time-consuming data in the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, determining that the first application program fails to test.
In another possible implementation, the method further includes:
and storing the at least two types of fusion time-consuming data, historical fusion time-consuming data corresponding to each type of fusion time-consuming data, a difference value between each type of fusion time-consuming data and the corresponding historical fusion time-consuming data, and a test result of the first application program.
In another possible implementation manner, the querying, from the application server, a plurality of time-consuming data corresponding to the device identifier includes:
sending a time acquisition instruction to the application server, wherein the time acquisition instruction comprises the equipment identifier, and the application server is used for inquiring a plurality of time-consuming data corresponding to the equipment identifier from the acquired time-consuming data;
and receiving the plurality of time-consuming data sent by the application server.
In another possible implementation manner, the time obtaining instruction further includes a test start time and a test end time, and the receiving the multiple pieces of time-consuming data sent by the application server includes:
and receiving a plurality of time-consuming data acquired by the application server through the buried point program in the time period between the test starting time and the test ending time.
In another possible implementation manner, obtaining the device identifier of the target terminal to be tested includes:
receiving a test processing instruction sent by the test terminal;
and acquiring the equipment identification from the test processing instruction.
In another possible implementation manner, the test processing instruction further includes version information of the first application program, where the version information is used to indicate a version of the first application program.
In another possible implementation manner, the querying, from the application server, a plurality of time-consuming data corresponding to the device identifier includes:
and calling a network interface of the application server, and inquiring a plurality of time-consuming data corresponding to the equipment identification.
According to a second aspect of embodiments of the present disclosure, there is provided a test system, comprising: the system comprises a test terminal, a target terminal to be tested, an application server and a test server;
the test terminal is used for sending scene test instructions of preset times to the target terminal;
the target terminal is used for receiving the scene test instruction of the preset times and calling a first application program to operate the preset test scene of the preset times;
the application server is used for acquiring time-consuming data and corresponding equipment identification, wherein the time-consuming data is obtained by the first application program through a preset test scene which is added in the first application program and runs for the preset times, and each time-consuming data is used for indicating the time-consuming duration of the first application program running the preset test scene once;
the test server is used for acquiring the equipment identifier of the target terminal and inquiring a plurality of time-consuming data corresponding to the equipment identifier of the target terminal from the application server;
the test server is further configured to perform fusion processing on the plurality of time-consuming data by using at least two fusion processing modes to obtain at least two fusion time-consuming data, and determine the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
In a possible implementation manner, the application server is configured to obtain a start time and an end time through the embedded point program, and determine a time interval between the start time and the end time as time-consuming data, where the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
In another possible implementation manner, the application server is configured to obtain each time-consuming data and a corresponding device identifier through a fixed point program added in the first application program; and correspondingly storing each time-consuming data and the corresponding equipment identification.
In another possible implementation manner, the application server is configured to obtain each time-consuming data and corresponding device identifier and version information through a fixed point program added in the first application program; and correspondingly storing the time-consuming data, the corresponding equipment identification and the version information.
In another possible implementation manner, the test server is configured to send a time obtaining instruction to the application server, where the time obtaining instruction includes the device identifier;
the application server is used for inquiring a plurality of time-consuming data corresponding to the equipment identification from the acquired time-consuming data and sending the time-consuming data to the test server;
the test server is used for receiving the plurality of time-consuming data sent by the application server.
In another possible implementation manner, the time obtaining instruction further includes version information of the first application program;
the application server is used for inquiring a plurality of time-consuming data corresponding to the equipment identification and the version information from the acquired time-consuming data.
In another possible implementation manner, the time obtaining instruction further includes a test start time and a test end time;
the application server is used for acquiring a plurality of time-consuming data in a time period between the test starting time and the test ending time from the acquired time-consuming data.
In another possible implementation manner, the test server is configured to receive a test processing instruction sent by the test terminal, where the test processing instruction includes the device identifier;
the test server is used for acquiring the equipment identification from the test processing instruction.
In another possible implementation manner, the test processing instruction further includes version information of the first application program, where the version information is used to indicate a version of the first application program.
In another possible implementation manner, the test server is configured to invoke a network interface provided by the application server, and query a plurality of time-consuming data corresponding to the device identifier.
In another possible implementation manner, the target terminal is configured to send a test end instruction to the test terminal after running the preset test scenario for the preset number of times, where the test end instruction is used to instruct the first application program to end the test.
In another possible implementation manner, the test terminal is configured to obtain a scene test parameter, where the scene test parameter includes the preset number of times, and the preset number of times is greater than 1; and generating the scene test instruction of the preset times for the first application program.
In another possible implementation manner, the scene test parameters further include a first page and a second page; the preset times of scene test instructions comprise the first page and the second page, so that the target terminal calls the first application program to respond to the preset times of scene test instructions, and the preset times of operation of jumping from the first page to the second page is executed.
According to a third aspect of the embodiments of the present disclosure, there is provided an application program testing method applied to a testing system, where the testing system includes: the system comprises a test terminal, a target terminal to be tested, an application server and a test server; the method comprises the following steps:
the test terminal sends a scene test instruction with preset times to the target terminal;
the target terminal receives the scene test instruction of the preset times, and calls a first application program to run the preset test scene of the preset times;
the application server acquires time-consuming data and corresponding equipment identification, which are obtained when the first application program runs the preset test scene for the preset times, through a point burying program added in the first application program, wherein each time-consuming data is used for indicating the time-consuming duration of the first application program running the preset test scene once;
the test server acquires the equipment identification of the target terminal, and inquires a plurality of time-consuming data corresponding to the equipment identification of the target terminal from the application server;
the test server performs fusion processing on the plurality of time-consuming data by adopting at least two fusion processing modes to obtain at least two fusion time-consuming data, and determines the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
According to a fourth aspect of the embodiments of the present disclosure, there is provided an application testing apparatus, the apparatus including:
the system comprises an identification acquisition unit, a first application program and a second application program, wherein the identification acquisition unit is configured to acquire a device identification of a target terminal to be tested, and the target terminal is used for receiving a preset-frequency scene test instruction sent by the test terminal and calling the first application program to run a preset test scene for the preset frequency;
a time-consuming data acquiring unit configured to query, from an application server, a plurality of time-consuming data corresponding to the device identifier, where each time-consuming data is used to indicate a time-consuming duration of the first application program running in the preset test scenario, and each time-consuming data and the corresponding device identifier are acquired by the application server through a buried point program added in the first application program;
and the fusion processing unit is configured to perform fusion processing on the plurality of time-consuming data by adopting at least two fusion processing modes to obtain at least two fusion time-consuming data, and determine the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
In a possible implementation manner, the application server is configured to obtain a start time and an end time through the embedded point program, and determine a time interval between the start time and the end time as time-consuming data, where the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
In another possible implementation manner, the fusion processing unit is configured to:
determining the average duration of the plurality of time-consuming data by adopting an average processing mode to serve as first fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the time length of the multiple time-consuming data in a quantile selection processing mode to serve as second fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length; alternatively, the first and second electrodes may be,
and determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
In another possible implementation manner, the apparatus further includes:
a history duration obtaining unit, configured to obtain at least two history fusion time-consuming data corresponding to the at least two fusion processing manners, where each history fusion time-consuming data is obtained by performing fusion processing on multiple history time-consuming data of a second application program in a corresponding fusion processing manner, and the second application program is a history version of the first application program;
and the result determining unit is configured to compare the at least two pieces of fusion time-consuming data with corresponding historical fusion time-consuming data respectively, and determine a test result of the first application program, wherein the historical fusion time-consuming data corresponding to the fusion time-consuming data is historical fusion time-consuming data obtained by adopting the same fusion processing mode as the fusion time-consuming data.
In another possible implementation manner, the result determining unit is configured to:
when the at least two pieces of fusion time-consuming data are both smaller than the corresponding historical fusion time-consuming data, determining that the first application program is successfully tested; alternatively, the first and second electrodes may be,
and when any fused time-consuming data in the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, determining that the first application program fails to test.
In another possible implementation manner, the apparatus further includes:
the storage unit is configured to store the at least two types of fused time-consuming data, historical fused time-consuming data corresponding to each type of fused time-consuming data, a difference value between each type of fused time-consuming data and the corresponding historical fused time-consuming data, and a test result of the first application program.
In another possible implementation manner, the time-consuming data obtaining unit includes:
the instruction sending subunit is configured to send a time obtaining instruction to the application server, where the time obtaining instruction includes the device identifier, and the application server is configured to query, from the obtained time-consuming data, a plurality of time-consuming data corresponding to the device identifier;
a time-consuming data receiving subunit configured to receive the plurality of time-consuming data sent by the application server.
In another possible implementation manner, the time obtaining instruction further includes a test start time and a test end time, and the time-consuming data receiving subunit is configured to: and receiving a plurality of time-consuming data acquired by the application server through the buried point program in the time period between the test starting time and the test ending time.
In another possible implementation manner, the identifier obtaining unit includes:
the instruction receiving subunit is configured to receive a test processing instruction sent by the test terminal;
an identification obtaining subunit configured to obtain the device identification from the test processing instruction.
In another possible implementation manner, the test processing instruction further includes version information of the first application program, where the version information is used to indicate a version of the first application program.
In another possible implementation manner, the time-consuming data obtaining unit is configured to invoke a network interface of the application server, and query a plurality of time-consuming data corresponding to the device identifier.
According to a fifth aspect of embodiments of the present disclosure, there is provided a test server, including:
one or more processors;
volatile or non-volatile memory for storing the one or more processor-executable commands;
wherein the one or more processors are configured to perform the application testing method of the first aspect.
According to a sixth aspect provided by embodiments of the present disclosure, there is provided a non-transitory computer readable storage medium, wherein instructions of the storage medium, when executed by a processor of a test server, enable the test server to perform the application testing method according to the first aspect.
According to a seventh aspect of embodiments of the present disclosure, there is provided a computer program product, wherein the instructions of the computer program product, when executed by a processor of a testing server, enable the testing server to perform the application testing method according to the first aspect.
The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects:
according to the scheme provided by the embodiment of the disclosure, through interaction among the test terminal, the target terminal and the application server, the preset test scene of the first application program in the target terminal is controlled to run for the preset times, so that the multiple time-consuming data of the first application program and the corresponding equipment identification are stored on the application server, each time-consuming data can represent the time-consuming duration of the first application program of the target terminal running for one preset test scene, the test server inquires the multiple time-consuming data corresponding to the equipment identification from the application server, fusion processing is performed on the multiple time-consuming data in different fusion modes, the obtained fusion time-consuming data can more accurately describe the time consumed by the first application program running the preset test scene, and the accuracy of the obtained fusion time-consuming data is improved. Different fusion time-consuming data are obtained by adopting different fusion processing modes, the considered angles are different, the information quantity is improved, and the accuracy of the obtained scene time-consuming result is further improved. And the test server can directly inquire the time-consuming data from the application server according to the equipment identification, so that the efficiency of acquiring the time-consuming data is improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.
FIG. 1 is a block diagram illustrating one implementation environment in accordance with an exemplary embodiment.
FIG. 2 is a flow chart illustrating a method of application testing according to an exemplary embodiment.
FIG. 3 is a flow chart illustrating a method of application testing according to an exemplary embodiment.
FIG. 4 is a flow chart illustrating a method of application testing according to an exemplary embodiment.
FIG. 5 is a schematic diagram illustrating testing of a first application according to an example embodiment.
FIG. 6 is a diagram illustrating a test report, according to an example embodiment.
Fig. 7 is a schematic structural diagram illustrating an application testing apparatus according to an exemplary embodiment.
Fig. 8 is a schematic structural diagram illustrating an application testing apparatus according to an exemplary embodiment.
Fig. 9 is a block diagram illustrating a terminal according to an example embodiment.
Fig. 10 is a schematic diagram illustrating a configuration of a server according to an example embodiment.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.
First, the terms referred to in the present application are explained:
the target terminal: a plurality of applications are installed and each application can be run, and the target terminal generates the running parameters of the application when running the application.
The application program comprises the following steps: a program running in the target terminal. For example, the application may be a camera program, an instant messaging program, an item recommendation program, and the like.
Testing a terminal: the method is used for testing the application program installed in the target terminal, can acquire the test parameters input by a tester, and controls the application program in the target terminal to run. For example, the application may be controlled to switch from a first page to a second page.
An application server: the method is used for collecting and storing the operation parameters generated when the target terminal operates the application program. And the data stored in the application server can be called by other servers for use by other servers.
The test server: the method is used for acquiring the operation parameters of any target terminal for operating the application program from the application server.
The application program testing method provided by the embodiment of the disclosure is applied to a testing system, which includes a target terminal 101, a testing terminal 102, a testing server 103, and an application server 104, as shown in fig. 1, the testing terminal 102 is respectively connected to the target terminal 101 and the testing server 103 through a network, the target terminal 101 is connected to the application server 104 through a network, and the testing server 103 is connected to the application server 104 through a network.
The target terminal 101 or the test terminal 102 may be various types of terminals such as a mobile phone, a tablet computer, and a computer, and the test server 103 or the application server 104 may be a server, a server cluster composed of a plurality of servers, or a cloud computing service center.
The test terminal 102 obtains the scene test instruction with the preset times, and sends the scene test instruction with the preset times to the target terminal 101 connected with the test terminal 102.
The target terminal 101 has an application installed therein, and the application is an application under test. The target terminal 101 receives the preset times of scene test instructions sent by the test terminal 102, runs the application program to respond to the preset times of scene test instructions, and runs the preset times of preset test scenes according to the scene test instructions.
In the process of running the application program by the target terminal 101, the application server 104 obtains time-consuming data of a preset test scene run by the application program and a corresponding device identifier of the target terminal 101 through a buried point program set in the application program of the target terminal 101, and stores the time-consuming data and the corresponding device identifier.
After the test terminal 102 controls the target terminal 101 to complete the test, a test processing instruction may also be sent to the test server 103, and after receiving the test processing instruction, the test server 103 obtains time-consuming data of a plurality of preset test scenarios corresponding to the device identifier of the target terminal 101 from the application server 104 according to the test processing instruction, and processes the time-consuming data to obtain a scenario time-consuming result of the application program.
Fig. 2 is a flowchart illustrating an application testing method applied to a testing server according to an exemplary embodiment, and referring to fig. 2, the method includes:
in step 201, a device identifier of a target terminal to be tested is obtained.
The target terminal is used for receiving the scene test instruction of the preset times sent by the test terminal and calling the first application program to run the preset test scene of the preset times.
In step 202, a plurality of time-consuming data corresponding to the device identifier is queried from the application server.
Each time-consuming data is used for indicating the time-consuming duration of the first application program running once in the preset test scenario, and each time-consuming data and the corresponding device identifier are acquired by the application server through the embedded point program added in the first application program.
In step 203, at least two fusion processing methods are adopted to perform fusion processing on the multiple time-consuming data to obtain at least two fusion time-consuming data, and the at least two fusion time-consuming data are determined as scene time-consuming results of the first application program.
According to the scheme provided by the embodiment of the disclosure, through interaction among the test terminal, the target terminal and the application server, the preset test scene of the first application program in the target terminal is controlled to run for the preset times, so that the multiple time-consuming data of the first application program and the corresponding equipment identification are stored on the application server, each time-consuming data can represent the time-consuming duration of the first application program of the target terminal running for one preset test scene, the test server inquires the multiple time-consuming data corresponding to the equipment identification from the application server, fusion processing is performed on the multiple time-consuming data in different fusion modes, the obtained fusion time-consuming data can more accurately describe the time consumed by the first application program running the preset test scene, and the accuracy of the obtained fusion time-consuming data is improved. Different fusion time-consuming data are obtained by adopting different fusion processing modes, the considered angles are different, the information quantity is improved, and the accuracy of the obtained scene time-consuming result is further improved. And the test server can directly inquire the time-consuming data from the application server according to the equipment identification, so that the efficiency of acquiring the time-consuming data is improved.
In one possible implementation manner, the application server is configured to obtain a start time and an end time through the embedded point program, and determine a time interval between the start time and the end time as time-consuming data, where the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
In another possible implementation manner, at least two fusion processing manners are adopted, and the multiple time-consuming data are subjected to fusion processing to obtain at least two fusion time-consuming data, which include at least two of the following items:
determining the average duration of a plurality of time-consuming data by adopting an average processing mode, and taking the average duration as first fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the quantile duration of a plurality of time-consuming data as second fusion time-consuming data by adopting a quantile selection processing mode; alternatively, the first and second electrodes may be,
determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length; alternatively, the first and second electrodes may be,
and determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
In another possible implementation, the method further includes:
acquiring at least two historical fusion time-consuming data corresponding to the at least two fusion processing modes, wherein each historical fusion time-consuming data is obtained by adopting the corresponding fusion processing mode to perform fusion processing on a plurality of historical time-consuming data of a second application program, and the second application program is a historical version of the first application program;
comparing at least two fusion time-consuming data with corresponding historical fusion time-consuming data respectively, and determining a test result of the first application program, wherein the historical fusion time-consuming data corresponding to the fusion time-consuming data is historical fusion time-consuming data obtained by adopting the same fusion processing mode as the fusion time-consuming data.
In another possible implementation manner, comparing at least two fused time-consuming data with corresponding historical fused time-consuming data, and determining a test result of the first application program includes:
when at least two pieces of fusion time-consuming data are smaller than the corresponding historical fusion time-consuming data, determining that the first application program is tested successfully; alternatively, the first and second electrodes may be,
and when any fused time-consuming data in the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, determining that the first application program fails to test.
In another possible implementation, the method further includes:
storing at least two kinds of fusion time-consuming data, historical fusion time-consuming data corresponding to each kind of fusion time-consuming data, a difference value between each kind of fusion time-consuming data and the corresponding historical fusion time-consuming data, and a test result of the first application program.
In another possible implementation manner, querying, from the application server, a plurality of time-consuming data corresponding to the device identifier includes:
sending a time acquisition instruction to an application server, wherein the time acquisition instruction comprises an equipment identifier, and the application server is used for inquiring a plurality of time-consuming data corresponding to the equipment identifier from the acquired time-consuming data;
and receiving a plurality of time-consuming data sent by the application server.
In another possible implementation manner, the time obtaining instruction further includes a test start time and a test end time, and receives a plurality of time-consuming data sent by the application server, where the time-consuming data includes:
and receiving a plurality of time-consuming data acquired by the application server through a buried point program in a time period between the test starting time and the test ending time.
In another possible implementation manner, obtaining the device identifier of the target terminal to be tested includes:
receiving a test processing instruction sent by a test terminal;
and acquiring the equipment identification from the test processing instruction.
In another possible implementation manner, the test processing instruction further includes version information of the first application program, and the version information is used for indicating the version of the first application program.
In another possible implementation manner, querying, from the application server, a plurality of time-consuming data corresponding to the device identifier includes:
and calling a network interface of the application server, and inquiring a plurality of time-consuming data corresponding to the equipment identification.
A process of obtaining a test result of a first application program by a test server is described below with the test server as an execution subject, and fig. 3 is a flowchart illustrating an application program testing method according to an exemplary embodiment, with reference to fig. 3, where the method includes:
step 301, the test server obtains the device identifier of the target terminal to be tested.
In the embodiment of the application, the test server can test the application program of the terminal and obtain the scene time-consuming result of the application program, so that the time-consuming situation of the application program when the preset test scene is operated can be known.
Taking the first application program on the target terminal as an example, the test server may first obtain the device identifier of the target terminal, so as to obtain the time-consuming data of the first application program according to the device identifier.
Wherein the device identifier is used for indicating the target terminal. The device identification is a mobile phone number of the target terminal, a device identification code, a nickname of a registered application program or other types of identifications.
Optionally, step 301 comprises: and the test server receives a test processing instruction sent by the test terminal and acquires the equipment identifier from the test processing instruction.
If the test server receives the test processing instruction sent by the test terminal, the test server starts to execute the test process to acquire the equipment identifier in the test processing instruction.
Optionally, the test processing instruction further includes version information of the first application program, where the version information is used to indicate a version of the first application program.
The application programs may include different types, but for the same type of application programs, the application programs may have different versions, and the version information may be used to indicate the different versions of the application programs, so as to distinguish the application programs of different versions.
The version information may be a version number or a code identification number. For example, version numbers 2019.06.004 and 2019.06.005 represent two versions of an application, respectively, and 2019.06.004 is a historical version of 2019.06.005. The code identification number is the identification number of the code packet of the application program. The code packets used by the application programs of different versions are different for the same type of application program, so that the different application programs can be distinguished through the code identification numbers of the application programs.
In step 302, the test server queries a plurality of time-consuming data corresponding to the device identifier from the application server.
In the embodiment of the application, the time-consuming data of the first application program on the target terminal can be acquired through interaction among the test terminal, the target terminal and the application server, and the time-consuming data and the equipment identifier of the target terminal are stored in the application server so as to be inquired in the following process. The following first describes the process of acquiring the time-consuming data and the device identifier thereof:
the method comprises the steps that a test terminal sends a scene test instruction with preset times to a target terminal, the target terminal receives the scene test instruction with the preset times sent by the test terminal, and a first application program is called to run the preset test scene with the preset times. The target terminal consumes time in the process of calling the first application program to run the preset test scene for the preset times, so that time-consuming data for running the preset test scene can be generated, the application server corresponding to the first application program can acquire the time-consuming data for running the preset test scene and the corresponding equipment identification, and the time-consuming data and the corresponding equipment identification are stored.
In order to test the performance of the first application program when the preset test scenario is run, the test server may obtain a plurality of time-consuming data obtained by running the preset test scenario for a preset number of times by the first application program, and then determine a scenario time-consuming result according to the plurality of time-consuming data.
Each time-consuming data is used for indicating the time-consuming duration of the first application program running the preset test scene once.
Because the application server already stores the time-consuming data and the corresponding device identifier of the first application program running preset test scene, the test server can query a plurality of time-consuming data corresponding to the device identifier from the application server according to the device identifier of the target terminal.
Optionally, step 302 includes: and the test server calls a network interface of the application server and inquires a plurality of time-consuming data corresponding to the equipment identification.
The network Interface provided by the Application server is an Application Programming Interface (API), and the test server obtains a plurality of time-consuming data corresponding to the device identifier of the target terminal by calling the API.
The test server can send the device identifier to the application server, and further obtain a plurality of time-consuming data corresponding to the device identifier.
Optionally, before the test server obtains the multiple pieces of time-consuming data corresponding to the device identifier from the application server, the test server sends a time obtaining instruction to the application server, after receiving the time obtaining instruction, the application server queries the multiple pieces of time-consuming data corresponding to the device identifier from the obtained time-consuming data, and sends the multiple pieces of time-consuming data corresponding to the device identifier to the test server, so that the test server may receive the multiple pieces of time-consuming data sent by the application server.
The time obtaining instruction comprises a device identifier of a target terminal to be tested, and the time obtaining instruction is used for indicating to obtain a plurality of time-consuming data corresponding to the device identifier.
Optionally, the time obtaining instruction further includes version information of the first application program. The version information may include at least one of a version number or a code identifier of the first application.
And if the time acquisition instruction comprises the version information of the first application program, after receiving the time acquisition instruction, the application server inquires a plurality of time-consuming data corresponding to the equipment identifier and the version information from the acquired time-consuming data.
In a possible implementation manner, when the time obtaining instruction includes a version number of the first application program, the application server determines time-consuming data corresponding to the version number of the first application program according to the version number of the first application program.
In another possible implementation manner, when the time obtaining instruction includes a code identification number of the first application program, the application server determines time-consuming data corresponding to the code packet of the first application program according to the code identification number of the first application program.
In another possible implementation manner, when the time obtaining instruction includes a version number of the first application program and a code identification number of the first application program, the application server obtains the time-consuming data that satisfies both the version number of the first application program and the code identification number of the first application program.
Optionally, the time obtaining instruction further includes a test start time and a test end time, the application server obtains a plurality of pieces of time-consuming data in a time period between the test start time and the test end time from the obtained time-consuming data, and the test server may receive the plurality of pieces of time-consuming data in the time period between the test start time and the test end time sent by the application server.
It should be noted that the time obtaining instruction in the embodiment of the present disclosure may further include a version number of the first application program, a code identification number of the first application program, a test start time, and a test end time. The application server can directly acquire the time-consuming data of the preset test scene meeting the mode according to the mode.
In step 303, the test server performs fusion processing on the multiple time-consuming data by using at least two fusion processing methods to obtain at least two fusion time-consuming data, and determines the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
In the embodiment of the disclosure, since the preset test scenario needs to be run for multiple times in the process of testing the first application program, after multiple pieces of time-consuming data corresponding to the multiple preset test scenarios are acquired, fusion processing needs to be performed on the acquired multiple pieces of time-consuming data to determine the fusion time-consuming data of the preset test scenarios, and the acquired fusion time-consuming data is determined as a scenario time-consuming result of the first application program.
The fusion time-consuming data is obtained by adopting a fusion processing mode, a plurality of time-consuming data corresponding to a plurality of preset test scenes are comprehensively considered, and the fusion time-consuming data obtained by adopting the fusion processing mode can represent the distribution situation of the time-consuming data of the plurality of preset test scenes, so that the performance of the first application program for operating the preset test scenes is reflected.
After the fusion processing is performed on the plurality of time-consuming data by adopting one fusion processing mode, one fusion time-consuming data is obtained, and after the fusion processing is performed on the plurality of time-consuming data by adopting a plurality of fusion processing modes, a plurality of fusion time-consuming data with the same type and quantity as those corresponding to the adopted fusion processing mode can be obtained.
For example, after the two fusion processing methods are adopted to perform fusion processing on a plurality of time-consuming data, two fusion time-consuming data can be obtained. And after the three fusion processing modes are adopted to perform fusion processing on the plurality of time-consuming data, three fusion time-consuming data can be obtained.
Optionally, the obtaining of the at least two fusion time-consuming data by using the at least two fusion processing methods may include at least two of the following:
1. and determining the average duration of the plurality of time-consuming data as the first fusion time-consuming data by adopting an average processing mode.
In the process of acquiring the first fused time-consuming data, the test server acquires the total duration of the plurality of time-consuming data, and then determines the first fused time-consuming data according to the number of the plurality of time-consuming data.
2. And determining the time length of the multiple time-consuming data in the quantile selection processing mode to serve as second fusion time-consuming data.
The quantile is used for representing the distribution situation of the time-consuming data after the time-consuming data are divided.
Optionally, the test server sorts the plurality of time-consuming data in the descending order, and then obtains the time length of the time division from the plurality of time-consuming data according to the sorting order of the plurality of time-consuming data.
Alternatively, the quantile may be a binary quantile, a quartile, or the like, depending on the manner of division.
For example, when the quantile is a quartile, the positions of a quarter-quantile, a quarter-quantile and a quarter-third are respectively determined according to the number of the plurality of time-consuming data, the plurality of time-consuming data are sorted from small to large, and then the time-consuming data at the positions of the quarter-quantile, the quarter-quantile and the quarter-third are respectively determined according to the arrangement sequence of the plurality of time-consuming data to be used as the quantile duration.
3. And determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length.
4. And determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
For example, in the embodiment of the present disclosure, 3 pieces of fusion time-consuming data may be obtained by using the fusion mode 1, the fusion mode 2, and the fusion mode 3, or 3 pieces of fusion time-consuming data may be obtained by using the fusion mode 1, the fusion mode 2, and the fusion mode 4, or fusion time-consuming data may be obtained by using another fusion mode.
It should be noted that, the embodiment of the present disclosure is only described by taking an example of acquiring fusion time-consuming data by using at least two of the above fusion manners. In another embodiment, the above multiple fusion modes may be combined, for example, the fusion mode 3 and the fusion mode 4 are adopted to exclude the minimum duration and the maximum duration from the multiple time-consuming data, and then the fusion mode 1 is adopted to obtain the average duration of the multiple time-consuming data after the minimum duration and the maximum duration are excluded as the fusion time-consuming data.
In step 304, the test server obtains at least two historical fusion time-consuming data corresponding to the at least two fusion processing methods.
In this embodiment, after obtaining the multiple pieces of fusion time-consuming data of the first application program, the test server needs to compare the multiple pieces of fusion time-consuming data of the current first application program with the multiple pieces of historical fusion time-consuming data corresponding to the historical version of the first application program, respectively, to determine the test result of the first application program, and then needs to obtain the fusion time-consuming data of the historical version of the first application program after obtaining the fusion time-consuming data of the first application program.
And each historical fusion time-consuming data is obtained by fusing a plurality of historical time-consuming data of a second application program in a corresponding fusion processing mode, wherein the second application program is a historical version of the first application program.
For example, when the fusion manner 1 in step 303 is used to obtain the fusion consumed time data, the historical fusion consumed time data obtained by using the fusion manner 1 in the second application program is obtained. When the fusion consuming time data is obtained by adopting the fusion mode 2 in the step 303, the historical fusion consuming time data obtained by adopting the fusion mode 2 in the second application program is obtained.
In step 305, the test server compares at least two fused time-consuming data with corresponding historical fused time-consuming data, respectively, and determines a test result of the first application program.
The historical fusion time-consuming data corresponding to any fusion time-consuming data is historical fusion time-consuming data obtained by adopting the same fusion processing mode as the fusion time-consuming data. When the fusion time-consuming data is compared with the corresponding historical fusion time-consuming data, a comparison result of the fusion time-consuming data can be obtained, and a test result of the first application program running the preset test scene can be determined according to the obtained comparison result.
Optionally, when at least two pieces of fused time-consuming data are both smaller than the corresponding historical fused time-consuming data, it is determined that the first application program is successfully tested.
When each piece of fused time-consuming data in the at least two pieces of fused time-consuming data is smaller than the corresponding historical fused time-consuming data, it is indicated that the time consumed for the first application program to operate the preset test scene is smaller than the time consumed for the second application program to operate the preset test scene, and it is also indicated that the first application program operates the preset test scene faster, and when it is determined that the obtained at least two pieces of fused time-consuming data are smaller than the corresponding historical fused time-consuming data, it is indicated that the first application program is successfully tested.
Optionally, when it is determined that at least two pieces of fused time-consuming data are both smaller than the corresponding historical fused time-consuming data, a difference between each piece of fused time-consuming data and the corresponding historical fused time-consuming data is obtained, and when a ratio of the obtained difference to the historical fused time-consuming data is larger than a preset value, it is determined that the first application program is successfully tested.
The preset value can be set by the test server, or set by the tester, or set by other methods.
Optionally, when any fused time-consuming data of the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, it is determined that the first application program fails to test.
When the fusion time-consuming data is not less than the corresponding historical fusion time-consuming data, it is indicated that the time consumed for the first application program to operate the preset test scene is not less than the time consumed for the second application program to operate the preset test scene, and it is also indicated that the first application program operates the preset test scene more slowly, and when it is determined that any one of the obtained at least two fusion time-consuming data is not less than the corresponding historical fusion time-consuming data, it is indicated that the first application program fails to test.
It should be noted that, in the embodiment of the present disclosure, the obtaining of the test result of the first application is merely taken as an example for description, and in another embodiment, the test server may further store at least two types of fusion time-consuming data, historical fusion time-consuming data corresponding to each type of fusion time-consuming data, a difference between each type of fusion time-consuming data and the corresponding historical fusion time-consuming data, and the test result of the first application.
According to the scheme provided by the embodiment of the disclosure, through interaction among the test terminal, the target terminal and the application server, the preset test scene of the first application program in the target terminal is controlled to run for the preset times, so that the multiple time-consuming data of the first application program and the corresponding equipment identification are stored on the application server, each time-consuming data can represent the time-consuming duration of the first application program of the target terminal running for one preset test scene, the test server inquires the multiple time-consuming data corresponding to the equipment identification from the application server, fusion processing is performed on the multiple time-consuming data in different fusion modes, the obtained fusion time-consuming data can more accurately describe the time consumed by the first application program running the preset test scene, and the accuracy of the obtained fusion time-consuming data is improved. Different fusion time-consuming data are obtained by adopting different fusion processing modes, the considered angles are different, the information quantity is improved, and the accuracy of the obtained scene time-consuming result is further improved. And the test server can directly inquire the time-consuming data from the application server according to the equipment identification, so that the efficiency of acquiring the time-consuming data is improved.
Moreover, the fusion time-consuming data of the first application program of the current version can be compared with the historical fusion time-consuming data of the first application program of the historical version, whether the speed of the preset test scene of the current version running is higher than that of the preset test scene of the historical version running can be determined through comparison, whether the performance of the first application program of the current version is higher than that of the first application program of the historical version is further determined, and the accuracy of the first application program test is improved. In the comparison process, the fusion time-consuming data is adopted for comparison, and the accuracy of the fusion time-consuming data is improved in the process of acquiring the fusion time-consuming data, so that the accuracy of the test result of the first application program can be improved when the test result of the first application program is determined by the fusion time-consuming data subsequently.
In addition, in the embodiment of the disclosure, a point burying mode is adopted to obtain the starting time and the ending time of the first application program running the preset test scene, the point burying program can timely detect the starting time and the ending time of the running of the preset test scene, and then the time-consuming data of the running of the preset test scene is determined according to the starting time and the ending time, so that the accuracy of obtaining the time-consuming data is improved, and the obtaining efficiency is improved.
Next, a process of the test server obtaining a scene time-consuming result is described with the test terminal, the target terminal, the test server and the application server as interaction subjects, and fig. 4 is a flowchart of an application program test method according to an exemplary embodiment. Referring to fig. 4, the method includes:
in step 401, the test terminal obtains scene test parameters.
In step 402, the test terminal generates a preset number of scene test instructions for the first application.
In the embodiment of the disclosure, the test terminal is connected with the target terminal, and the test terminal can control the target terminal to call the preset test scene in which the first application program runs for the preset times. The target terminal may be considered to be the terminal to be tested. In addition, the test terminal and the target terminal belong to testers, and the testers can operate the test terminal and the target terminal.
The first application program can be installed in any target terminal, and the target terminal where the first application program is installed can run the first application program. And the first application program may be a photographing program, an instant messaging program, an item recommendation program, and the like. Different types of application programs can be installed in the target terminal, and when the different types of application programs are operated, the operation preset test scenes are different. The preset test scenes comprise a page jump scene, an application starting scene, a function switching scene and the like. The preset times are set by a test terminal, or set by a tester, or set in other ways. The predetermined number may be 50, 100, 200, or other values.
Optionally, the preset test scenario is a page jump scenario, and the first application program may jump from one page to another page. The two pages involved in the page jump scenario are different. The page in the page jump scene may be a shooting page, an album page, a picture processing page, and the like. For example, when the first application is a shooting application, it is possible to jump from a shooting page to an album page, or from a shooting page to an image processing page. For another example, when the first application is an instant messenger, a jump may be made from a first user page to a second user page, or from a video page to a user recommendation page.
Optionally, if the preset test scenario is an application start scenario, the target terminal displays a main interface, where the main interface includes an application icon of a first application program, and when the target terminal detects a trigger operation on the first application program, the first application program is started, where the starting process may consume a certain time duration.
Optionally, the preset test scenario is a function switching scenario, the first application includes multiple functions, and if the user needs to use different functions in the first application, the user needs to switch the functions in the first application, and a certain duration may be consumed in the switching process.
The device identification is a device identification code of the target terminal, a user mobile phone number of the login application program, a user name of the login application program, a user account of the login application program and the like.
The target terminal is also connected with an application server, the application server is a server for logging in a first application program in the target terminal, time-consuming data of a preset test scene operated by the first application program is acquired by the application server through a point-embedding program added in the first application program, and the time-consuming data can be stored.
The test server is connected with the application server, so that the test server can acquire time-consuming data of the first application program running a plurality of preset test scenes from the application server, and process the acquired time-consuming data to obtain a test result of the first application program.
In addition, the test terminal can be connected with the test server, and after the test terminal completes the test on the first application program of the target terminal, the test server executes the steps of acquiring the operation parameters from the application server and processing to obtain the test result.
In the embodiment of the present disclosure, when the test terminal controls the target terminal to call the first application program to run the preset test scenario, the test terminal needs to first obtain the scenario test parameter, then generates the scenario test instruction according to the obtained scenario test parameter, and further controls the first application program of the target terminal to run the preset test scenario.
The scene test parameters comprise preset times, and the preset times are more than 1. And the preset times are set by a test terminal, set by a tester or set in other ways.
When the first application program of the target terminal is tested, the first application program can be controlled to run the preset test scenes for multiple times, and the test terminal can control the number of the preset test scenes for the running of the first application program by setting scene test parameters. It is also explained that in the embodiment of the present disclosure, the number of the generated plurality of scenario test instructions is equal to the preset number.
Optionally, the test terminal displays a test parameter input interface, and when the input operation of the tester is detected, the scene test parameters corresponding to the input operation can be acquired.
For example, when the preset number of times in the input scenario test parameter is 50, the first application program is controlled to run the preset test scenario for 50 times, or when the preset number of times in the input scenario test parameter is 100, the first application program is controlled to run the preset test scenario for 100 times.
Optionally, if the preset test scenario is a page jump scenario, the scenario test parameters further include a first page and a second page. When the scene test parameter includes the first page and the second page, after the first page and the second page are input in the scene test parameter, the first application program can be controlled to execute a jump operation from the first page to the second page.
After the test terminal acquires the scene test parameters, the test terminal can generate the scene test instructions with preset times according to the scene test parameters, and the scene test instructions with the preset times all comprise a first page and a second page, so that the target terminal calls the first application program to respond to the scene test instructions with the preset times, and the operation of jumping from the first page to the second page with the preset times is executed.
Optionally, if the preset test scenario is an application start scenario, the scenario test parameters further include a start instruction of the first application program, and the test terminal can control the first application program to start after acquiring the start instruction of the first application program.
It should be noted that, an automatic test module is installed in the test terminal in the present application, and the scene test parameters are obtained through the automatic test module. The automatic test module may be a UI (User Interface) automatic test module, or other modules.
In step 403, the test terminal sends a preset number of scene test instructions to the target terminal.
In step 404, the target terminal receives a preset number of scene test commands.
In step 405, the target terminal invokes a preset test scenario in which the first application program runs for a preset number of times.
After the target terminal receives the test scene instructions of the preset times sent by the test terminal, each scene test instruction is used for indicating the target terminal to call the first application program and operate the preset test scene, and therefore the target terminal calls the first application program to execute the corresponding operation of the preset test scene according to the preset test scene of the preset times.
And the target terminal operates the scene test instruction of the preset times according to the received preset test scene of the preset times, and then the test of the first application program in the target terminal is completed, so that the target terminal sends a test ending instruction to the test terminal to inform the test terminal that the operation of the preset test scene is completed. The test ending instruction is used for indicating the end of the test of the first application program.
In step 406, the application server obtains time-consuming data and a corresponding device identifier obtained by running a preset test scenario for a preset number of times by the first application program through a point burying program added to the first application program.
The first application program generates a plurality of time-consuming data in the process of running the preset test scene for the preset times, and the application server can acquire the time-consuming data and store the time-consuming data and the corresponding equipment identification.
Optionally, in the process of developing the first application program by the developer, a buried point program is added in the first application program in advance, so that when the target terminal calls the first application program to run a preset test scenario, the application server obtains the start time and the end time of the preset test scenario through the buried point program, and determines the time interval between the start time and the end time as time-consuming data.
For example, when the acquired start time is 13:51:22 and the acquired end time is 13:51:42, the time consumption data corresponding to the preset test scenario may be determined to be 20 seconds.
When the target terminal calls the first application program to operate the preset test scene, the embedded point program in the first application program intercepts an instruction of the first application program to start operating the preset test scene, the time at the moment is determined as the starting time, when the target terminal calls the first application program to finish operating the preset test scene, the embedded point program in the first application program intercepts an instruction of the first application program to finish operating the preset test scene, the time at the moment is determined as the ending time, and the embedded point program can send the acquired time-consuming data and the corresponding equipment identification to the application server to be stored by the application server. If the device identifier is the device identification code of the target terminal, the first application program can also obtain the device identification code of the target terminal when obtaining the time-consuming data of the preset test scene of the first application program, so that the time-consuming data and the device identification code are correspondingly stored.
For example, if the interface loading time is determined by the buried point program, the onCreate of activity is marked as the start time, and the onResume of activity is marked as the end time, then the difference between the end time and the start time is the interface loading time.
The device identification is a device identification code of the target terminal, a user mobile phone number of the login application program, a user name of the login application program, a user account of the login application program and the like. If the device identifier is the device identification code of the target terminal, the first application server can also obtain the device identification code of the target terminal when obtaining the time-consuming data of the preset test scene of the first application program operation, so as to correspondingly store the time-consuming data and the device identification code. If the device identifier is the user account of the login application program, the first application program can also acquire the user account of the login application program when acquiring the time-consuming data of the preset test scene of the first application program, so that the time-consuming data and the user account are correspondingly stored.
Optionally, the application server obtains each time-consuming data and the corresponding device identifier version information through a point burying program added in the first application program, and correspondingly stores each time-consuming data, the corresponding device identifier and the corresponding version information.
The version information is used to indicate a version of the first application. And the version information may include at least one of a version number or a code identifier of the first application.
When the application server acquires each time-consuming data through the embedded point program added in the first application program, the application server not only can acquire the equipment identifier of the target terminal where the first application program is located, but also can acquire the version information corresponding to the first application program, and after the time-consuming data is acquired each time, each time-consuming data, the corresponding equipment identifier and the corresponding version information are correspondingly stored.
According to the embodiment of the disclosure, by setting the point burying program, the starting time and the ending time of the operation of the preset test scene can be timely acquired, the time interval between the starting time and the ending time is determined as the time consumption data of the preset test scene, and the accuracy of the acquired time consumption data is improved.
In step 407, the test server obtains the device identifier of the target terminal, and queries a plurality of time-consuming data corresponding to the device identifier of the target terminal from the application server.
Optionally, the test server calls a network interface provided by the application server to obtain time-consuming data of the target terminal running a plurality of preset test scenarios.
The network Interface provided by the Application server is an Application Programming Interface (API), and the test server obtains time-consuming data of a plurality of preset test scenes operated by the target terminal by calling the API.
Before performing step 407, the method may further comprise: the test terminal sends a test processing instruction to the test server, the test processing instruction comprises the equipment identification of the target terminal, and the test server receives the test processing instruction and obtains the equipment identification in the test processing instruction.
After the test terminal determines that the first application program of the target terminal is tested, a test processing instruction can be sent to the test server, after the test server receives the test processing instruction, the device identification in the test processing instruction is obtained, and a plurality of time-consuming data corresponding to the device identification are inquired from the application server.
Optionally, the test processing instruction includes version information of the first application program. The version information includes at least one of a version number or a code identifier of the first application, the code identifier being an identifier of a code packet of the first application. Since each time-consuming data and the corresponding device identifier and version information are correspondingly stored in the application server, the test server can query a plurality of time-consuming data corresponding to the device identifier and version information from the application server after acquiring the device identifier of the target terminal and the version information of the first application program from the test processing instruction.
The test processing instruction further includes a test start time and a test end time, and the test server can acquire time consumption data of a plurality of preset test scenes in a time period between the test start time and the test end time from the application server after acquiring the test start time and the test end time from the test processing instruction.
In the embodiment of the disclosure, the time-consuming data of a plurality of preset test scenes are acquired through the test starting time and the test ending time, so that the time-consuming data outside the time period between the test starting time and the test ending time can be excluded, the data volume is reduced, and the data processing efficiency is improved.
In step 408, the test server performs fusion processing on the multiple time-consuming data by using at least two fusion processing methods to obtain at least two fusion time-consuming data, and determines the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
The process of step 408 is similar to that of step 303, and is not described herein again.
In the embodiment of the present disclosure, a flow of testing a first application program of a target terminal is shown in fig. 5. Referring to fig. 5, in the target terminal, scene test parameters are acquired through a UI automation frame, the UI automation frame automatically triggers an application program of the target terminal to run a preset test scene, the UI automation frame sets preset times of the preset test scene of the application program, an application server may acquire start time and end time of the preset test scene of the application program according to a buried point program set in the application program, and further determine time-consuming data of the preset test scene, the UI automation frame may also send a test processing instruction to the test server, the test server acquires the time-consuming data of the multiple preset test scenes of the application program from the application server, determines a test result of the application program according to the acquired time-consuming data, and displays the test result.
Optionally, the test server may further store at least two types of fused time-consuming data, historical fused time-consuming data corresponding to each type of fused time-consuming data, a difference between each type of fused time-consuming data and the corresponding historical fused time-consuming data, and a test result of the first application program.
And after the test server stores at least two types of fused time-consuming data, historical fused time-consuming data corresponding to each type of fused time-consuming data, a difference value between each type of fused time-consuming data and the corresponding historical fused time-consuming data and a test result of the first application program, other terminals can call the data stored in the test server for other users to check.
Optionally, the test server stores at least two types of fused time-consuming data, historical fused time-consuming data corresponding to each type of fused time-consuming data, a difference between each type of fused time-consuming data and the corresponding historical fused time-consuming data, and a test result of the first application program in a test report manner.
For example, as shown in fig. 6, the test report includes a test scenario, a historical average duration and an amplitude of the average duration corresponding to the average duration, a historical 25-minute duration and a 25-minute amplitude corresponding to the 25-minute duration, a historical 50-minute duration and a 50-minute amplitude corresponding to the 50-minute duration, a historical 75-minute duration and a 75-minute amplitude corresponding to the 75-minute duration, and a test result.
According to the scheme provided by the embodiment of the disclosure, through interaction among the test terminal, the target terminal and the application server, the preset test scene of the first application program in the target terminal is controlled to run for the preset times, so that the multiple time-consuming data of the first application program and the corresponding equipment identification are stored on the application server, each time-consuming data can represent the time-consuming duration of the first application program of the target terminal running for one preset test scene, the test server inquires the multiple time-consuming data corresponding to the equipment identification from the application server, fusion processing is performed on the multiple time-consuming data in different fusion modes, the obtained fusion time-consuming data can more accurately describe the time consumed by the first application program running the preset test scene, and the accuracy of the obtained fusion time-consuming data is improved. Different fusion time-consuming data are obtained by adopting different fusion processing modes, the considered angles are different, the information quantity is improved, and the accuracy of the obtained scene time-consuming result is further improved. And the test server can directly inquire the time-consuming data from the application server according to the equipment identification, so that the efficiency of acquiring the time-consuming data is improved.
In addition, the test server can also store the test result of the first application program, and other terminals can acquire the stored test result of the first application program from the test server, so that the test server is convenient for other personnel to check, the checking efficiency is improved, and the sharing of the test result is realized.
Fig. 7 is a schematic structural diagram illustrating an application testing apparatus according to an exemplary embodiment. Referring to fig. 7, the apparatus includes:
the identifier obtaining unit 701 is configured to obtain a device identifier of a target terminal to be tested, where the target terminal is configured to receive a preset number of scene test instructions sent by the test terminal and call a preset test scene in which the first application program runs for a preset number of times.
A time-consuming data obtaining unit 702, configured to query, from the application server, a plurality of time-consuming data corresponding to the device identifier, where each time-consuming data is used to indicate a time-consuming duration of the first application program running in the preset test scenario, and each time-consuming data and the corresponding device identifier are obtained by the application server through a fixed point program added in the first application program.
The fusion processing unit 703 is configured to perform fusion processing on the multiple time-consuming data by using at least two fusion processing manners to obtain at least two fusion time-consuming data, and determine the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
According to the scheme provided by the embodiment of the disclosure, through interaction among the test terminal, the target terminal and the application server, the preset test scene of the first application program in the target terminal is controlled to run for the preset times, so that the multiple time-consuming data of the first application program and the corresponding equipment identification are stored on the application server, each time-consuming data can represent the time-consuming duration of the first application program of the target terminal running for one preset test scene, the test server inquires the multiple time-consuming data corresponding to the equipment identification from the application server, fusion processing is performed on the multiple time-consuming data in different fusion modes, the obtained fusion time-consuming data can more accurately describe the time consumed by the first application program running the preset test scene, and the accuracy of the obtained fusion time-consuming data is improved. Different fusion time-consuming data are obtained by adopting different fusion processing modes, the considered angles are different, the information quantity is improved, and the accuracy of the obtained scene time-consuming result is further improved. And the test server can directly inquire the time-consuming data from the application server according to the equipment identification, so that the efficiency of acquiring the time-consuming data is improved.
In one possible implementation manner, the application server is configured to obtain a start time and an end time through the embedded point program, and determine a time interval between the start time and the end time as time-consuming data, where the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
In another possible implementation manner, the fusion processing unit 703 is configured to:
determining the average duration of a plurality of time-consuming data by adopting an average processing mode, and taking the average duration as first fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the quantile duration of a plurality of time-consuming data as second fusion time-consuming data by adopting a quantile selection processing mode; alternatively, the first and second electrodes may be,
determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length; alternatively, the first and second electrodes may be,
and determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
In another possible implementation, referring to fig. 8, the apparatus further includes:
a historical duration obtaining unit 704 configured to obtain at least two historical fusion time-consuming data corresponding to at least two fusion processing manners, where each historical fusion time-consuming data is obtained by performing fusion processing on multiple historical time-consuming data of a second application program in the corresponding fusion processing manner, and the second application program is a historical version of the first application program;
the result determining unit 705 is configured to compare at least two pieces of fused time-consuming data with corresponding historical fused time-consuming data, and determine a test result of the first application program, where the historical fused time-consuming data corresponding to the fused time-consuming data is historical fused time-consuming data obtained by using the same fusion processing manner as the fused time-consuming data.
In another possible implementation, the result determining unit 705 is configured to:
when at least two pieces of fusion time-consuming data are smaller than the corresponding historical fusion time-consuming data, determining that the first application program is tested successfully; alternatively, the first and second electrodes may be,
and when any fused time-consuming data in the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, determining that the first application program fails to test.
In another possible implementation, referring to fig. 8, the apparatus further includes:
the storage unit 706 is configured to store at least two types of fused time-consuming data, historical fused time-consuming data corresponding to each type of fused time-consuming data, a difference value between each type of fused time-consuming data and the corresponding historical fused time-consuming data, and a test result of the first application program.
In another possible implementation, referring to fig. 8, the time-consuming data obtaining unit 702 includes:
an instruction sending subunit 7021, configured to send a time obtaining instruction to an application server, where the time obtaining instruction includes a device identifier, and the application server is configured to query, from the obtained time-consuming data, a plurality of time-consuming data corresponding to the device identifier;
a time-consuming data receiving subunit 7022 configured to receive a plurality of time-consuming data sent by the application server.
In another possible implementation manner, the time obtaining instruction further includes a test start time and a test end time, and the time-consuming data receiving subunit 7022 is configured to: and receiving a plurality of time-consuming data acquired by the application server through a buried point program in a time period between the test starting time and the test ending time.
In another possible implementation manner, referring to fig. 8, the identifier obtaining unit 701 includes:
an instruction receiving subunit 7011 configured to receive a test processing instruction sent by the test terminal;
an identity retrieving subunit 7012 configured to retrieve the device identity from the test processing instruction.
In another possible implementation manner, the test processing instruction further includes version information of the first application program, and the version information is used for indicating the version of the first application program.
In another possible implementation manner, the time-consuming data obtaining unit 702 is configured to invoke a network interface of the application server, and query a plurality of time-consuming data corresponding to the device identifier.
With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
Fig. 9 is a block diagram illustrating a terminal according to an example embodiment. The terminal 900 may be a portable mobile terminal such as: a smart phone, a tablet computer, an MP3 player (Moving Picture Experts Group audio Layer III, motion Picture Experts compression standard audio Layer 3), an MP4 player (Moving Picture Experts Group audio Layer IV, motion Picture Experts compression standard audio Layer 4), a notebook computer, or a desktop computer. Terminal 900 may also be referred to by other names such as user equipment, portable terminals, laptop terminals, desktop terminals, and the like.
In general, terminal 900 includes: one or more processors 901 and one or more memories 902.
Processor 901 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and so forth. The processor 901 may be implemented in at least one hardware form of a DSP (Digital Signal Processing), an FPGA (Field-Programmable Gate Array), and a PLA (Programmable Logic Array). The processor 901 may also include a main processor and a coprocessor, where the main processor is a processor for processing data in an awake state, and is also called a Central Processing Unit (CPU); a coprocessor is a low power processor for processing data in a standby state. In some embodiments, the processor 901 may be integrated with a GPU (Graphics Processing Unit, data recommender), which is responsible for rendering and drawing the content required to be displayed on the display screen. In some embodiments, the processor 901 may further include an AI (Artificial Intelligence) processor for processing computing operations related to machine learning.
Memory 902 may include one or more computer-readable storage media, which may be non-transitory. The memory 902 may also include volatile memory or non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In some embodiments, a non-transitory computer readable storage medium in memory 902 is used to store at least one instruction for being possessed by processor 901 to implement the application testing methods provided by the method embodiments herein.
In some embodiments, terminal 900 can also optionally include: a peripheral interface 903 and at least one peripheral. The processor 901, memory 902, and peripheral interface 903 may be connected by buses or signal lines. Various peripheral devices may be connected to the peripheral interface 903 via a bus, signal line, or circuit board. Specifically, the peripheral device includes: at least one of a radio frequency circuit 904, a display screen 905, a camera assembly 906, an audio circuit 907, a positioning assembly 908, and a power supply 909.
The peripheral interface 903 may be used to connect at least one peripheral related to I/O (Input/Output) to the processor 901 and the memory 902. In some embodiments, the processor 901, memory 902, and peripheral interface 903 are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor 901, the memory 902 and the peripheral interface 903 may be implemented on a separate chip or circuit board, which is not limited by this embodiment.
The Radio Frequency circuit 904 is used for receiving and transmitting RF (Radio Frequency) signals, also called electromagnetic signals. The radio frequency circuitry 904 communicates with communication networks and other communication devices via electromagnetic signals. The radio frequency circuit 904 converts an electrical signal into an electromagnetic signal to transmit, or converts a received electromagnetic signal into an electrical signal. Optionally, the radio frequency circuit 904 comprises: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a subscriber identity module card, and so forth. The radio frequency circuit 904 may communicate with other terminals via at least one wireless communication protocol. The wireless communication protocols include, but are not limited to: metropolitan area networks, various generation mobile communication networks (2G, 3G, 4G, and 5G), Wireless local area networks, and/or WiFi (Wireless Fidelity) networks. In some embodiments, the radio frequency circuit 904 may also include NFC (Near Field Communication) related circuits, which are not limited in this application.
The display screen 905 is used to display a UI (User Interface). The UI may include graphics, text, icons, video, and any combination thereof. When the display screen 905 is a touch display screen, the display screen 905 also has the ability to capture touch signals on or over the surface of the display screen 905. The touch signal may be input to the processor 901 as a control signal for processing. At this point, the display 905 may also be used to provide virtual buttons and/or a virtual keyboard, also referred to as soft buttons and/or a soft keyboard. In some embodiments, the display 905 may be one, providing the front panel of the terminal 900; in other embodiments, the number of the display panels 905 may be at least two, and each of the display panels is disposed on a different surface of the terminal 900 or is in a foldable design; in other embodiments, the display 905 may be a flexible display disposed on a curved surface or a folded surface of the terminal 900. Even more, the display screen 905 may be arranged in a non-rectangular irregular figure, i.e. a shaped screen. The Display panel 905 can be made of LCD (liquid crystal Display), OLED (Organic Light-Emitting Diode), and the like.
The camera assembly 906 is used to capture images or video. Optionally, camera assembly 906 includes a front camera and a rear camera. Generally, a front camera is disposed at a front panel of the terminal, and a rear camera is disposed at a rear surface of the terminal. In some embodiments, the number of the rear cameras is at least two, and each rear camera is any one of a main camera, a depth-of-field camera, a wide-angle camera and a telephoto camera, so that the main camera and the depth-of-field camera are fused to realize a background blurring function, and the main camera and the wide-angle camera are fused to realize panoramic shooting and VR (Virtual Reality) shooting functions or other fusion shooting functions. In some embodiments, camera assembly 906 may also include a flash. The flash lamp can be a monochrome temperature flash lamp or a bicolor temperature flash lamp. The double-color-temperature flash lamp is a combination of a warm-light flash lamp and a cold-light flash lamp, and can be used for light compensation at different color temperatures.
Audio circuit 907 may include a microphone and a speaker. The microphone is used for collecting sound waves of a user and the environment, converting the sound waves into electric signals, and inputting the electric signals to the processor 901 for processing, or inputting the electric signals to the radio frequency circuit 904 for realizing voice communication. For stereo sound acquisition or noise reduction purposes, the microphones may be multiple and disposed at different locations of the terminal 900. The microphone may also be an array microphone or an omni-directional pick-up microphone. The speaker is used to convert electrical signals from the processor 901 or the radio frequency circuit 904 into sound waves. The loudspeaker can be a traditional film loudspeaker or a piezoelectric ceramic loudspeaker. When the speaker is a piezoelectric ceramic speaker, the speaker can be used for purposes such as converting an electric signal into a sound wave audible to a human being, or converting an electric signal into a sound wave inaudible to a human being to measure a distance. In some embodiments, audio circuit 907 may also include a headphone jack.
The positioning component 908 is used to locate the current geographic location of the terminal 900 to implement navigation or LBS (location based Service). The positioning component 908 may be a positioning component based on the GPS (global positioning System) of the united states, the beidou System of china, the graves System of russia, or the galileo System of the european union.
Power supply 909 is used to provide power to the various components in terminal 900. The power source 909 may be alternating current, direct current, disposable or rechargeable. When power source 909 comprises a rechargeable battery, the rechargeable battery may support wired or wireless charging. The rechargeable battery may also be used to support fast charge technology.
In some embodiments, terminal 900 can also include one or more sensors 910. The one or more sensors 910 include, but are not limited to: acceleration sensor 911, gyro sensor 912, pressure sensor 913, fingerprint sensor 914, optical sensor 915, and proximity sensor 916.
The acceleration sensor 911 can detect the magnitude of acceleration in three coordinate axes of the coordinate system established with the terminal 900. For example, the acceleration sensor 911 may be used to detect the components of the gravitational acceleration in three coordinate axes. The processor 901 can control the display screen 905 to display the user interface in a landscape view or a portrait view according to the gravitational acceleration signal collected by the acceleration sensor 911. The acceleration sensor 911 may also be used for acquisition of motion data of a game or a user.
The gyro sensor 912 may detect a body direction and a rotation angle of the terminal 900, and the gyro sensor 912 may cooperate with the acceleration sensor 911 to acquire a 3D motion of the user on the terminal 900. The processor 901 can implement the following functions according to the data collected by the gyro sensor 912: motion sensing (such as changing the UI according to a user's tilting operation), image stabilization at the time of photographing, game control, and inertial navigation.
The pressure sensor 913 may be disposed on a side bezel of the terminal 900 and/or underneath the display 905. When the pressure sensor 913 is disposed on the side frame of the terminal 900, the user's holding signal of the terminal 900 may be detected, and the processor 901 performs left-right hand recognition or shortcut operation according to the holding signal collected by the pressure sensor 913. When the pressure sensor 913 is disposed at a lower layer of the display screen 905, the processor 901 controls the operability control on the UI interface according to the pressure operation of the user on the display screen 905. The operability control comprises at least one of a button control, a scroll bar control, an icon control and a menu control.
The fingerprint sensor 914 is used for collecting a fingerprint of the user, and the processor 901 identifies the user according to the fingerprint collected by the fingerprint sensor 914, or the fingerprint sensor 914 identifies the user according to the collected fingerprint. Upon recognizing that the user's identity is a trusted identity, processor 901 authorizes the user to have relevant sensitive operations including unlocking the screen, viewing encrypted information, downloading software, paying, and changing settings, etc. The fingerprint sensor 914 may be disposed on the front, back, or side of the terminal 900. When a physical key or vendor Logo is provided on the terminal 900, the fingerprint sensor 914 may be integrated with the physical key or vendor Logo.
The optical sensor 915 is used to collect ambient light intensity. In one embodiment, the processor 901 may control the display brightness of the display screen 905 based on the ambient light intensity collected by the optical sensor 915. Specifically, when the ambient light intensity is high, the display brightness of the display screen 905 is increased; when the ambient light intensity is low, the display brightness of the display screen 905 is reduced. In another embodiment, the processor 901 can also dynamically adjust the shooting parameters of the camera assembly 906 according to the ambient light intensity collected by the optical sensor 915.
Proximity sensor 916, also known as a distance sensor, is typically disposed on the front panel of terminal 900. The proximity sensor 916 is used to collect the distance between the user and the front face of the terminal 900. In one embodiment, when the proximity sensor 916 detects that the distance between the user and the front face of the terminal 900 gradually decreases, the processor 901 controls the display 905 to switch from the bright screen state to the dark screen state; when the proximity sensor 916 detects that the distance between the user and the front surface of the terminal 900 gradually becomes larger, the display 905 is controlled by the processor 901 to switch from the breath screen state to the bright screen state.
Those skilled in the art will appreciate that the configuration shown in fig. 9 does not constitute a limitation of terminal 900, and may include more or fewer components than those shown, or may combine certain components, or may employ a different arrangement of components.
The terminal 900 in the embodiment of the present disclosure may be a test terminal or a target terminal according to the above embodiment.
Fig. 10 is a schematic structural diagram of a server according to an exemplary embodiment, where the server 1000 may generate a relatively large difference due to different configurations or performances, and may include one or more processors (CPUs) 1001 and one or more memories 1002, where the memory 1002 stores at least one instruction, and the at least one instruction is loaded and executed by the processors 1001 to implement the methods provided by the foregoing method embodiments. Of course, the server may also have components such as a wired or wireless network interface, a keyboard, and an input/output interface, so as to perform input/output, and the server may also include other components for implementing the functions of the device, which are not described herein again.
The server 900 may be used to perform the steps performed by the test server or application server in the application testing method described above.
In an exemplary embodiment, a non-transitory computer readable storage medium is also provided, which when executed by a processor of a testing server, enables the testing server to perform the steps performed by the testing server in the above application testing method.
In an exemplary embodiment, a computer program product is also provided, which when executed by a processor of a test server, enables the test server to perform the steps performed by the test server in the above-described application testing method.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims (10)

1. An application testing method, the method comprising:
acquiring a device identifier of a target terminal to be tested, wherein the target terminal is used for receiving a preset-frequency scene test instruction sent by a test terminal and calling a first application program to run a preset test scene for the preset frequency;
querying a plurality of time-consuming data corresponding to the device identifier from an application server, wherein each time-consuming data is used for indicating the time-consuming duration of the first application program running once in the preset test scenario, and each time-consuming data and the corresponding device identifier are acquired by the application server through a point-embedded program added in the first application program;
and performing fusion processing on the plurality of time-consuming data by adopting at least two fusion processing modes to obtain at least two fusion time-consuming data, and determining the at least two fusion time-consuming data as a scene time-consuming result of the first application program.
2. The method according to claim 1, wherein the application server is configured to obtain a start time and an end time through the buried point program, and determine a time interval between the start time and the end time as time-consuming data, the start time is a time when the first application program starts to run the preset test scenario, and the end time is a time when the first application program ends to run the preset test scenario.
3. The method according to claim 1, wherein at least two fusion processing manners are adopted to perform fusion processing on the plurality of time-consuming data to obtain at least two fusion time-consuming data, including at least two of:
determining the average duration of the plurality of time-consuming data by adopting an average processing mode to serve as first fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the time length of the multiple time-consuming data in a quantile selection processing mode to serve as second fusion time-consuming data; alternatively, the first and second electrodes may be,
determining the minimum time length in the plurality of time-consuming data as third fused time-consuming data by adopting a processing mode of selecting the minimum time length; alternatively, the first and second electrodes may be,
and determining the maximum time length of the plurality of time-consuming data as fourth fused time-consuming data by adopting a processing mode of selecting the maximum time length.
4. The method of claim 1, further comprising:
acquiring at least two historical fusion time-consuming data corresponding to the at least two fusion processing modes, wherein each historical fusion time-consuming data is obtained by adopting the corresponding fusion processing mode to perform fusion processing on a plurality of historical time-consuming data of a second application program, and the second application program is a historical version of the first application program;
comparing the at least two fusion time-consuming data with corresponding historical fusion time-consuming data respectively, and determining a test result of the first application program, wherein the historical fusion time-consuming data corresponding to the fusion time-consuming data is historical fusion time-consuming data obtained by adopting the same fusion processing mode as the fusion time-consuming data.
5. The method according to claim 4, wherein the comparing the at least two fused time-consuming data with the corresponding historical fused time-consuming data to determine the test result of the first application comprises:
when the at least two pieces of fusion time-consuming data are both smaller than the corresponding historical fusion time-consuming data, determining that the first application program is successfully tested; alternatively, the first and second electrodes may be,
and when any fused time-consuming data in the at least two fused time-consuming data is not less than the corresponding historical fused time-consuming data, determining that the first application program fails to test.
6. The method of claim 4, further comprising:
and storing the at least two types of fusion time-consuming data, historical fusion time-consuming data corresponding to each type of fusion time-consuming data, a difference value between each type of fusion time-consuming data and the corresponding historical fusion time-consuming data, and a test result of the first application program.
7. The method of claim 1, wherein the querying the plurality of time-consuming data corresponding to the device identifier from the application server comprises:
sending a time acquisition instruction to the application server, wherein the time acquisition instruction comprises the equipment identifier, and the application server is used for inquiring a plurality of time-consuming data corresponding to the equipment identifier from the acquired time-consuming data;
and receiving the plurality of time-consuming data sent by the application server.
8. The method according to claim 7, wherein the time obtaining instruction further includes a test start time and a test end time, and the receiving the plurality of time-consuming data sent by the application server includes:
and receiving a plurality of time-consuming data acquired by the application server through the buried point program in the time period between the test starting time and the test ending time.
9. The method of claim 1, wherein obtaining the device identifier of the target terminal to be tested comprises:
receiving a test processing instruction sent by the test terminal;
and acquiring the equipment identification from the test processing instruction.
10. The method according to claim 9, wherein the test processing instruction further includes version information of the first application program, and the version information indicates a version of the first application program.
CN202010766698.3A 2020-08-03 2020-08-03 Application program testing method, device, server, system and storage medium Pending CN111858382A (en)

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