CN111830396A - Chip test system with chip test environment temperature detection function - Google Patents
Chip test system with chip test environment temperature detection function Download PDFInfo
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- CN111830396A CN111830396A CN202010683874.7A CN202010683874A CN111830396A CN 111830396 A CN111830396 A CN 111830396A CN 202010683874 A CN202010683874 A CN 202010683874A CN 111830396 A CN111830396 A CN 111830396A
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- testing
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- environment temperature
- temperature
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- 238000012360 testing method Methods 0.000 title claims abstract description 142
- 238000001514 detection method Methods 0.000 title claims abstract description 10
- 238000004891 communication Methods 0.000 claims abstract description 10
- 239000000523 sample Substances 0.000 abstract description 6
- 230000000149 penetrating effect Effects 0.000 abstract description 5
- 238000004806 packaging method and process Methods 0.000 abstract description 4
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 238000013100 final test Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
Abstract
The invention discloses a chip testing system with a chip testing environment temperature detection function, which comprises a testing machine, a testing circuit board, a testing clamp, a carrying device and a thermometer, wherein the thermometer is in communication connection with the testing machine, the testing clamp is provided with a through hole penetrating through the inner surface and the outer surface of the testing clamp, a probe of the thermometer extends into the testing clamp through the through hole to collect temperature information in the testing clamp and transmit the temperature information to the testing machine, and the testing machine writes the temperature information into a corresponding tested chip. The invention realizes the monitoring of the temperature of the test environment of the chip, improves the test quality of the chip, reduces the packaging cost of the rear section and ensures the application quality of the chip. Moreover, the tester writes the temperature information into the corresponding chip to be tested, and the testing environment temperature of the chip can be traced in the later period.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a chip testing system with a chip testing environment temperature detection function.
Background
After the chip is packaged in the packaging factory, Final Test (Final Test) of the finished product is required. The current common testing method is to perform testing on an automatic chip testing system. At the present stage, the automatic chip testing system is not equipped with a function of testing the testing environment temperature of the chip, the testing environment temperature of the chip cannot be monitored in real time, the actual testing environment temperature information of the chip cannot be tracked, and the testing environment temperature of the chip cannot be traced in the later stage.
Therefore, it is desirable to provide a chip testing system with a chip testing environment temperature detection function to solve the above problems.
Disclosure of Invention
The invention aims to provide a chip testing system capable of detecting the testing environment temperature of a chip in real time.
In order to achieve the above object, the present invention provides a chip testing system with a chip testing environment temperature detecting function, which includes a testing machine, a testing circuit board electrically connected to the testing machine, a testing fixture disposed on the testing circuit board and used for accommodating a chip to be tested, a carrying device in communication connection with the testing machine, and a thermometer in communication connection with the testing machine. The test fixture is provided with a through hole penetrating through the inner surface and the outer surface of the test fixture, a probe of the thermometer extends into the test fixture through the through hole to collect temperature information in the test fixture and transmit the temperature information to the test machine, and the test machine writes the temperature information into a corresponding chip to be tested. The carrying device is used for transferring the tested chip.
Preferably, the test fixture is provided with a plurality of through holes.
Specifically, the test fixture comprises four intersecting side walls, each side wall is provided with one through hole, and the distance between every two adjacent through holes is the same.
Preferably, the thermometer is in communication connection with the tester through a USB cable.
Preferably, two opposite sides of the test circuit board are respectively provided with a plurality of bull-horn connectors, and the bull-horn connectors are electrically connected with the tester through Cable wires.
Preferably, the handling device is in communication connection with the tester through a GPIB line.
Compared with the prior art, the test fixture is provided with the through hole penetrating through the inner surface and the outer surface of the test fixture, and the probe of the thermometer extends into the test fixture through the through hole to acquire the temperature information inside the test fixture, so that the actual test environment temperature of the chip is obtained, the temperature monitoring is realized, the test quality of the chip is improved, the packaging cost of the rear section is reduced, and the application quality of the chip is ensured. Moreover, the tester writes the temperature information into the corresponding chip to be tested, and the testing environment temperature of the chip can be traced in the later period.
Drawings
FIG. 1 is a diagram illustrating a chip testing system with a chip testing environment temperature detecting function according to an embodiment of the present invention.
Detailed Description
In order to explain technical contents and structural features of the present invention in detail, the following description is made with reference to the embodiments and the accompanying drawings. It is to be understood that the described embodiments are merely a subset of embodiments of the invention and not all embodiments of the invention, with the understanding that the invention is not limited to the example embodiments described herein. All other embodiments, which can be derived by a person skilled in the art from the described embodiments without inventive effort, shall fall within the scope of protection of the invention.
The invention provides a chip test system 100 with a chip test environment temperature detection function, which can realize the chip test environment temperature detection while realizing the chip test function (such as voltage and current test of a chip, LDO calibration test, frequency calibration test, scan chain test, register read-write test, power test, good code write-read test and the like) of the existing chip test system. As shown in fig. 1, the chip test system 100 having a chip test environment temperature detection function includes a tester 1, a test board 2, a test jig 3, a carrying device 4, and a thermometer 5. The testing machine 1 is electrically connected to the testing circuit board 2, the testing machine 1 is provided with a testing program for testing the chip, and in the testing process, the testing machine 1 sends a testing signal to the testing circuit board 2 according to the specific testing requirement of the chip to test the chip (prior art). The test fixture 3 is disposed on the test circuit board 2, and an accommodating space for accommodating the chip to be tested is formed in the test fixture 3, so that when the chip is tested, the chip to be tested is electrically connected to the test circuit board 2 by the test fixture 3 (prior art). The test fixture 3 is provided with a through hole 30 penetrating through the inner surface and the outer surface of the test fixture, and the probe 51 of the thermometer 5 extends into the accommodating space from the through hole 30. The thermometer 5 is in communication connection with the testing machine 1, collects temperature information in the accommodating space in real time, and transmits the temperature information to the testing machine 1. The tester 1 writes the temperature information into the corresponding chip to be tested, so that the temperature information of the test environment of the chip to be tested is stored in the chip to be tested, and the test environment temperature can be traced in the later period. The carrying device 4 is in communication connection with the testing machine 1, the testing machine 1 controls the carrying device 4 to transfer the tested chips to corresponding positions according to the test results, and the specific structure of the carrying device 4 and the matching protocol with the testing machine 1 are the prior art and are not described herein again.
Specifically, the test fixture 3 is provided with a plurality of through holes 30, so that the probe 51 of the thermometer 5 can be inserted into the accommodating space of the test fixture 3 nearby. In the embodiment shown in fig. 1, the test fixture 3 comprises four intersecting side walls. In this embodiment, each sidewall is formed with a through hole 30, the distance between every two adjacent through holes 30 is the same, and the through holes 30 are disposed adjacent to the position where each sidewall is connected to the other sidewall.
In a preferred embodiment, the testing machine 1 has a USB interface (not shown), the thermometer 5 is connected to the testing machine 1 by a USB cable 61, and the testing machine 1 reads temperature information in real time by a serial port. Of course, in some embodiments, the thermometer 5 and the testing machine 1 may be connected in a wired manner, or may be connected in a wireless manner, for example, WIFI communication, 5G communication, etc., so the disclosure should not be limited thereto. In this embodiment, a plurality of header connectors 21 are respectively disposed on two opposite sides of the test circuit board 2, and each header connector 21 is connected to the test machine 1 through a Cable line 62(General-Purpose interface bus), which is not limited in specific implementation. The transport apparatus 4 is connected to the tester 1 via a GPIB line 63, but this should not be construed as limiting.
Compared with the prior art, the test fixture 3 is provided with the through hole 30 penetrating through the inner surface and the outer surface of the test fixture 3, the probe 51 of the thermometer 5 extends into the test fixture 3 through the through hole 30 to acquire the temperature information inside the test fixture 3, so that the actual test environment temperature of the chip is obtained, the temperature monitoring is realized, the test quality of the chip is improved, the packaging cost of the rear section is reduced, and the application quality of the chip is ensured. Moreover, the tester 1 writes the temperature information into the corresponding chip to be tested, and the test environment temperature of the chip can be traced in the later period.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, therefore, the present invention is not limited by the appended claims.
Claims (6)
1. A chip testing system with a chip testing environment temperature detection function comprises a testing machine, a testing circuit board electrically connected with the testing machine, a testing clamp arranged on the testing circuit board and used for containing a chip to be tested, and a carrying device in communication connection with the testing machine and used for transferring the chip to be tested.
2. The chip testing system with the function of detecting the temperature of the chip testing environment as claimed in claim 1, wherein the testing jig is provided with a plurality of through holes.
3. The chip testing system with the function of detecting the temperature of the chip testing environment as claimed in claim 2, wherein the testing fixture comprises four intersecting sidewalls, each sidewall is provided with one through hole, and the distance between every two adjacent through holes is the same.
4. The chip test system with chip test environment temperature detection function as claimed in claim 1, wherein the thermometer is connected to the tester by USB cable.
5. The chip testing system with the function of detecting the temperature of the chip testing environment as claimed in claim 1, wherein a plurality of header connectors are respectively disposed on two opposite sides of the testing circuit board, and the header connectors are electrically connected to the testing machine through Cable wires.
6. The chip testing system with chip testing environment temperature detecting function as claimed in claim 1, wherein said handling device is communicatively connected to said testing machine via a GPIB line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010683874.7A CN111830396A (en) | 2020-07-15 | 2020-07-15 | Chip test system with chip test environment temperature detection function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010683874.7A CN111830396A (en) | 2020-07-15 | 2020-07-15 | Chip test system with chip test environment temperature detection function |
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| Publication Number | Publication Date |
|---|---|
| CN111830396A true CN111830396A (en) | 2020-10-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010683874.7A Pending CN111830396A (en) | 2020-07-15 | 2020-07-15 | Chip test system with chip test environment temperature detection function |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114167840A (en) * | 2021-12-06 | 2022-03-11 | 广东利扬芯片测试股份有限公司 | Wireless charging chip test system combined with peripheral MCU |
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2020
- 2020-07-15 CN CN202010683874.7A patent/CN111830396A/en active Pending
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| EP2770335A1 (en) * | 2013-02-20 | 2014-08-27 | Multitest elektronische Systeme GmbH | Apparatus and method for testing electronic devices |
| CN104122448A (en) * | 2014-07-23 | 2014-10-29 | 上海硅酸盐研究所中试基地 | High-temperature test fixture |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114167840A (en) * | 2021-12-06 | 2022-03-11 | 广东利扬芯片测试股份有限公司 | Wireless charging chip test system combined with peripheral MCU |
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Application publication date: 20201027 |
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