CN111818438B - Semi-finished product testing method and system of wireless earphone and computer readable storage medium - Google Patents
Semi-finished product testing method and system of wireless earphone and computer readable storage medium Download PDFInfo
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- CN111818438B CN111818438B CN202010606820.0A CN202010606820A CN111818438B CN 111818438 B CN111818438 B CN 111818438B CN 202010606820 A CN202010606820 A CN 202010606820A CN 111818438 B CN111818438 B CN 111818438B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R29/00—Monitoring arrangements; Testing arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
Abstract
The invention discloses a semi-finished product testing method, a system and a computer readable storage medium of a wireless earphone, wherein the method comprises the following steps: reading test voltage values corresponding to all devices to be tested in the semi-finished product, and carrying out voltage test based on all the test voltage values; when the voltage test is detected to pass, sending a reading instruction to the semi-finished product so that the semi-finished product can read the device information according to the reading instruction and feed back the reading information; when the read information is received, carrying out communication test based on the read information; and when the communication test is detected to pass, performing software test on the semi-finished product. According to the invention, the test voltage value is automatically read and the voltage test is carried out, the reading instruction is automatically sent and the communication test is carried out, and whether the voltage test and the communication test pass or not is automatically detected and the software test is carried out, so that the hardware test and the software test of the semi-finished product are automatically realized, and the semi-finished product test efficiency of the wireless earphone is improved.
Description
Technical Field
The invention relates to the field of function test of wireless earphone semi-finished products, in particular to a wireless earphone semi-finished product test method, a wireless earphone semi-finished product test system and a computer readable storage medium.
Background
At present, the wireless earphone semi-finished product test mainly comprises hardware test, software test, radio frequency test, acoustic test and other multi-aspect tests, wherein for the hardware test and the software test, a program is generally manually burnt, and all functions of the wireless earphone semi-finished product are tested one by one item by item, and because the hardware test and the software test have large workload and are tedious in work, the test is long in time consumption due to manual operation and testing, and the test efficiency is low. Therefore, the testing efficiency of the current wireless earphone semi-finished product testing is low.
Disclosure of Invention
The invention mainly aims to provide a method and a system for testing a semi-finished product of a wireless earphone and a computer readable storage medium, and aims to solve the technical problem of low testing efficiency of the conventional testing of the semi-finished product of the wireless earphone.
In order to achieve the above object, the present invention provides a method for testing a semi-finished product of a wireless headset, which is characterized in that the method for testing the semi-finished product of the wireless headset comprises the following steps:
reading test voltage values corresponding to all devices to be tested in the semi-finished product, and carrying out voltage test based on all the test voltage values;
when the voltage test is detected to pass, sending a reading instruction to the semi-finished product so that the semi-finished product can read device information according to the reading instruction and feed back the reading information;
when the reading information is received, carrying out communication test based on the reading information;
and when the communication test is detected to pass, performing software test on the semi-finished product.
Optionally, the step of reading a test voltage value corresponding to each device to be tested in the semi-finished product, and performing a voltage test based on each test voltage value includes:
reading a test voltage value corresponding to each device to be tested in the semi-finished product, and detecting whether a target test voltage value exists in each test voltage value, wherein the target test voltage value is out of a preset voltage range of the device to be tested corresponding to the target test voltage value;
if the target test voltage value is detected to be absent, determining that the voltage test is passed;
and if the target test voltage value is detected to exist, determining that the voltage test fails.
Optionally, when receiving the read information, the step of performing a communication test based on the read information includes:
when the reading information is received, detecting whether the reading information is the same as preset information or not;
if the read information is detected to be the same as the preset information, determining that the communication test is passed;
and if the read information is detected to be different from the preset information, determining that the communication test fails.
Optionally, when it is detected that the communication test passes, the step of performing a software test on the semi-finished product includes:
when the communication test is detected to pass, detecting whether to respond to the triggering action of sensor interruption;
and if the response to the trigger action is detected, reading the level change amplitude of the interrupt pin corresponding to each sensor, and calibrating each sensor according to each level change amplitude.
Optionally, the step of calibrating each of the sensors according to each of the level variation amplitudes comprises:
detecting whether a first target sensor exists in each sensor, wherein a first level change amplitude corresponding to the first target sensor is out of a first preset level range;
if the first target sensor exists, acquiring a first parameter corresponding to the first target sensor, and determining a first interruption parameter based on the first parameter and a first preset expected difference value.
Optionally, the step of calibrating each of the sensors according to each of the level variation amplitudes comprises:
detecting whether a second target sensor exists in each sensor, wherein a second level change amplitude corresponding to the second target sensor is within a second preset level range;
if the second target sensor exists, acquiring a second parameter corresponding to the second target sensor, and determining a parameter difference value based on the second parameter and a second interruption parameter;
detecting whether the parameter difference value is smaller than or equal to a second preset expected difference value;
and if the detected parameter difference is smaller than or equal to a second preset expected difference, determining a third interruption parameter based on the second parameter and the second preset expected difference.
Optionally, after the step of performing a communication test based on the read information when the read information is received, the method further includes:
when the communication test is detected not to pass, acquiring a first device corresponding to the read information;
and determining first device information corresponding to the first device, and displaying the first device information so that a user can analyze the first device according to the first device information.
Optionally, after the step of reading the test voltage value corresponding to each device to be tested in the semi-finished product and performing the voltage test based on each test voltage value, the method further includes:
when the voltage test is detected not to pass, acquiring a first device to be tested corresponding to the target test voltage value;
and determining a first test voltage value corresponding to the first device to be tested, and displaying the first test voltage value so that a user can analyze the first device to be tested according to the first test voltage value.
In addition, in order to achieve the above object, the present invention further provides a semi-finished product testing system for wireless earphones, which includes a memory, a processor, and a semi-finished product testing program for wireless earphones, stored in the memory and running on the processor, wherein the steps of the method for testing the semi-finished product of wireless earphones as described above are implemented when the semi-finished product testing program for wireless earphones is completed by the processor.
In addition, to achieve the above object, the present invention further provides a computer readable storage medium, where a semi-finished product testing program of a wireless headset is stored, and when the semi-finished product testing program of the wireless headset is completed by a processor, the steps of the method for testing a semi-finished product of a wireless headset as described above are implemented.
The invention realizes that the voltage test is carried out by reading the test voltage value corresponding to each device to be tested in the semi-finished product and based on each test voltage value, when the voltage test is detected to pass, a reading instruction is sent to the semi-finished product so that the semi-finished product can read the device information according to the reading instruction and feed back the reading information, when the reading information is received, the communication test is carried out based on the reading information, and when the communication test is detected to pass, the software test is carried out on the semi-finished product. Therefore, in the process of determining the test result, the test voltage value is automatically read and the voltage test is carried out, the reading instruction is automatically sent and the communication test is carried out, whether the voltage test and the communication test are passed or not is automatically detected, the software test is carried out, and the hardware test and the software test do not need to be carried out on the semi-finished product of the wireless earphone one by one, so that the hardware test and the software test on the semi-finished product of the wireless earphone are automatically carried out, the automatic test on the semi-finished product of the wireless earphone is realized, and the test efficiency of the test on the semi-finished product of the wireless earphone is improved.
Drawings
Fig. 1 is a schematic flow chart of a first embodiment of a semi-finished testing method for a wireless headset according to the present invention;
FIG. 2 is a schematic structural diagram of a preferred semi-finished testing device for wireless earphones according to the present invention;
fig. 3 is a schematic structural diagram of a hardware operating environment according to an embodiment of the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The invention provides a semi-finished product testing method of a wireless earphone, and referring to fig. 1, fig. 1 is a schematic flow chart of a first embodiment of the semi-finished product testing method of the wireless earphone.
While a logical order is shown in the flow chart, in some cases, the steps shown or described may be performed in a different order than that shown or described herein.
The semi-finished product testing method of the wireless earphone comprises the following steps:
and step S10, reading the test voltage value corresponding to each device to be tested in the semi-finished product, and performing voltage test based on each test voltage value.
Before the test system reads the test voltage value corresponding to each device to be tested in the semi-finished product of the wireless earphone, the tester installs a Flexible Printed Circuit (FPC) in the test system through a Connector interface, and connects the test system with a Personal Computer (PC) through a Universal Serial Bus (USB) interface, the test system detects whether the semi-finished product of the wireless earphone exists on a clamp of the semi-finished product of the wireless earphone, if the semi-finished product of the wireless earphone exists, the test system records a test program of the wireless earphone and detects whether a start instruction exists, if the test system detects that the start instruction is sent out by a key by the tester, the test system enables the power device to the semi-finished product of the wireless earphone through a power module, and then reads the voltage value corresponding to the test point of each device to be tested in the semi-finished product of the wireless earphone through a probe, and then detecting whether the voltage value corresponding to each device to be tested meets the preset voltage condition in the test system or not, and completing the test of each device to be tested according to the detection result. If no wireless earphone semi-finished product exists, the testing system detects the wireless earphone semi-finished product clamp in real time.
The testing system is an automatic testing system for a wireless earphone semi-finished product, and comprises but is not limited to a wireless earphone semi-finished product clamp, a main controller, a power supply module, a storage device, an LCD (liquid crystal display) display screen, keys, an LED (light emitting diode), a Connector interface and a USB interface. The wireless earphone semi-finished product clamp can fix a wireless earphone semi-finished product and is connected with a test point on the wireless earphone semi-finished product through a probe; the power supply module provides stable voltage for the test system and the wireless earphone semi-finished product; the main controller is internally provided with a test program which can automatically complete the function test; the LCD screen is used for displaying the test result and interacting with the tester; the storage device is used for storing the test result of the semi-finished wireless earphone; the key is used for starting the test system and issuing a specified command; the LED is used for displaying the working state of the test system; the Connector interface is used for connecting a wireless earphone FPC; the USB interface is used to connect PC (desktop, notebook, and tablet) computers. The wireless headset blank includes, but is not limited to, a wireless headset PCBA (Printed Circuit Board Assembly) and a sip (system In a package) module. The device under test includes, but is not limited to, an infrared sensor, an accelerometer sensor, a touch sensor, a temperature sensor, an electricity meter, a microphone, a speaker, an LDO (Low Dropout Regulator) and a DCDC (voltage to voltage power device). The preset voltage condition is set according to the requirement, and the embodiment is not limited.
Further, the step S10 includes:
a, reading a test voltage value corresponding to each device to be tested in the semi-finished product, and detecting whether a target test voltage value exists in each test voltage value, wherein the target test voltage value is out of a preset voltage range of the device to be tested corresponding to the target test voltage value;
b, if the target test voltage value is detected to be absent, determining that the voltage test is passed;
and c, if the target test voltage value is detected to exist, determining that the voltage test fails.
Specifically, the test system reads test voltage values corresponding to test points of each device to be tested in the semi-finished wireless earphone through a probe, then detects whether a target test voltage value outside a preset voltage range corresponding to the device to be tested exists in each test voltage value, if the target test voltage value does not exist, the test voltage values corresponding to all the devices to be tested are indicated to be within the preset voltage range corresponding to the device to be tested, the test system determines that the voltage test is passed, and if the target test voltage value exists, the test system determines that the test voltage value corresponding to at least one device to be tested is outside the preset voltage range corresponding to the device to be tested, the test system determines that the voltage test is not passed.
In this embodiment, for example, the preset voltage range of the infrared sensor is 3.2V (volts) to 3.4V, and the test system determines that the voltage test of the infrared sensor passes after enabling the power supply device to the wireless headset semi-finished product through the power supply module and reading that the test voltage value of the test point of the infrared sensor is 3.3V.
And step S20, when the voltage test is detected to pass, sending a reading instruction to the semi-finished product so that the semi-finished product can read the device information according to the reading instruction and feed back the reading information.
When the test system detects that the voltage test is passed, a reading instruction is sent to the wireless earphone semi-finished product, after the wireless earphone semi-finished product receives the reading instruction, device information corresponding to the device to be tested is read in the register through the communication bus, reading information is generated according to the read device information, and the reading information is fed back to the test system. The communication bus includes, but is not limited to, I2C (bidirectional two-wire synchronous Serial bus), UART (Universal Asynchronous Receiver/Transmitter), and SPI (Serial Peripheral Interface).
It should be noted that the test system sends a reading instruction to the wireless headset semi-finished product only when detecting that the voltage test passes. The wireless earphone semi-finished product is internally provided with a plurality of chips, and different chips can complete different functions.
And step S30, when the reading information is received, a communication test is carried out based on the reading information.
And when the test system receives the read information, analyzing whether the read information before receiving and the read information after receiving are changed or not, and completing the communication test on the device to be tested according to the analysis result.
Further, the step S30 includes:
step d, when receiving the reading information, detecting whether the reading information is the same as the preset information;
step e, if the read information is detected to be the same as the preset information, determining that the communication test is passed;
and f, if the read information is detected to be different from the preset information, determining that the communication test is failed.
Specifically, when the test system receives the read information, it is detected whether the read information is the same as the preset information of the test system, and if it is detected that the read information is the same as the preset information, it indicates that the read information has not changed in the transmission process or/and the reading process, that is, the read information is correct, and the test system determines that the communication test is passed. If the read information is detected to be different from the preset information, the read information is changed in the transmission process or/and the reading process, namely the read information is wrong, and the test system determines that the communication test fails.
In this embodiment, for example, when the test system receives the read information, it is detected whether a device ID (Identity Document) value in the read information is the same as a preset ID value in the preset information, and if it is detected that the device ID value is the same as the preset ID value, it indicates that the device ID value has not changed during transmission or/and during reading, that is, the read information is correct, and the test system determines that the communication test passes. If the device ID value is detected to be different from the preset ID value, the device ID value is changed in the transmission process or/and the reading process, namely, the information is read wrongly, and the test system determines that the communication test is failed.
It should be noted that, in the devices to be tested, not all the devices to be tested have device ID values, and when the test system reads the device ID values, the test system may read the device ID values of a plurality of devices to be tested, or may read the device ID value of one device to be tested, which is not limited in this embodiment.
And step S40, when the communication test is detected to pass, performing software test on the semi-finished product.
And when the testing system detects that the communication test is passed, the software function test is carried out on the wireless earphone semi-finished product, and the sensor parameters of each sensor in the wireless earphone semi-finished product are calibrated according to the test result of the software function test. The software function test comprises infrared in-ear detection, knocking detection, touch detection, MIC (microphone built-in) pickup, loudspeaker broadcasting, electric quantity detection, temperature detection and the like, and the sensor parameter calibration comprises but is not limited to an infrared sensor, an accelerometer and a touch sensor.
It should be noted that the test system performs software test on the semi-finished wireless headset only after detecting that the communication test is passed. Other sensors and devices, besides infrared sensors, accelerometers and touch sensors, are not involved in sensor parameter calibration. The tests of the electricity meter and the temperature sensor are that the Bluetooth chip is directly controlled to read a corresponding register to obtain sensor parameters. The test of MIC and speaker is that direct control bluetooth chip lets the speaker broadcast fixed sound, and the MIC records and keeps the recording file.
Further, the step S40 includes:
step g, when the communication test is detected to pass, detecting whether to respond to the triggering action of sensor interruption;
and h, if the response to the trigger action is detected, reading the level variation amplitude of the interrupt pin corresponding to each sensor, and calibrating each sensor according to the level variation amplitude.
Specifically, when the test system detects that the communication test is passed, the test system detects whether a trigger action of sensor interrupt is responded, if the trigger action of response is detected, the test system reads first level data of interrupt pins corresponding to each sensor before the trigger action and second level data of the interrupt pins corresponding to each sensor after the trigger action, determines the level change amplitude of the interrupt pins corresponding to each sensor according to the first level data and the second level, and calibrates each sensor according to the obtained level change amplitude. It should be noted that the triggering action of the sensor interrupt is performed by the tester.
Further, the step h includes:
step i, detecting whether a first target sensor exists in each sensor, wherein a first level change amplitude corresponding to the first target sensor is out of a first preset level range;
and j, if the first target sensor exists, acquiring a first parameter corresponding to the first target sensor, and determining a first interruption parameter based on the first parameter and a first preset expected difference value.
Specifically, the test system detects whether a first level variation amplitude of a first target sensor is out of a first preset level range, if the first target sensor is detected to exist, the test system determines that no interruption occurs to an interruption pin of the first target sensor, then obtains a first parameter corresponding to the first target sensor after a trigger action, and makes a difference between the first parameter and a first preset expected difference value corresponding to the first target sensor, and determines the obtained difference value as a first interruption parameter, namely, the first interruption parameter replaces an original interruption parameter of the first target sensor to be used as a new interruption parameter of the first target sensor. The first preset level range and the first preset expected difference are set according to requirements, and the embodiment is not limited.
It should be noted that one of the reasons why the interrupt pin of the first target sensor does not generate an interrupt is that the original interrupt parameter setting of the first target sensor is too high.
In this embodiment, for example, the first preset level range is 3.1V to 3.3V, the first preset expected difference value is 0.2G (gravitational acceleration), the original interrupt parameter of the acceleration sensor is 1.8G, the test system detects that the first level data of the acceleration sensor before the trigger action is 0V, detects that the second level data of the acceleration sensor after the trigger action is 0V, the test system determines that the level variation amplitude of the acceleration sensor is 0V, outside the first preset level range of 3.1V to 3.3V, it is thus determined that the acceleration sensor is not generating an interrupt, then obtaining a first parameter of 1.5G corresponding to the acceleration sensor after triggering action, obtaining 1.3G by subtracting the first parameter of 1.5G from a first preset expected difference value of 0.2G, determining a first interruption parameter of 1.3G, i.e. the original interrupt parameter 1.8G of the acceleration sensor is replaced by the first interrupt parameter 1.3G.
Step k, detecting whether a second target sensor exists in each sensor, wherein a second level change amplitude corresponding to the second target sensor is within a second preset level range;
step l, if the second target sensor exists, acquiring a second parameter corresponding to the second target sensor, and determining a parameter difference value based on the second parameter and a second interrupt parameter;
step m, detecting whether the parameter difference value is smaller than or equal to a second preset expected difference value;
and n, if the detected parameter difference value is smaller than or equal to a second preset expected difference value, determining a third interruption parameter based on the second parameter and the second preset expected difference value.
Specifically, the test system detects whether a second level variation amplitude of a second target sensor is within a second preset level range, if the second target sensor is detected to exist, the test system determines that an interrupt pin of the second target sensor generates interrupt, then acquires a corresponding second parameter of the second target sensor after a trigger action, and makes a difference between the second parameter and the corresponding second interrupt parameter of the second target sensor, that is, makes a difference between the second parameter and an original interrupt parameter corresponding to the second target sensor to obtain a parameter difference value, and detects whether the parameter difference value is smaller than or equal to a second preset expected difference value, if the parameter difference value is smaller than or equal to the second preset expected difference value, the test system makes a difference between the second parameter and the second preset expected difference value corresponding to the second target sensor to determine the obtained difference value as a third interrupt parameter, i.e., replacing the second interrupt parameter with the third interrupt parameter as the new interrupt parameter for the second target sensor. If the parameter difference is detected to be larger than the second preset expected difference, the second interruption parameter is proved to meet the setting requirement, and resetting is not needed. The second interruption parameter and the second preset expected difference are set according to requirements, and the embodiment is not limited.
It should be noted that if the test system detects a parameter difference less than or equal to the second predetermined expected difference, the sensor is insensitive and cannot trigger an interrupt in some special cases.
In this embodiment, for example, the second preset level range is 3.0V to 3.5V, the second preset expected difference value is 0.3N (newton), the second interrupt parameter of the gravity sensor is 2.1N, the test system detects that the first level data of the gravity sensor before the triggering action is 0V, detects that the second level data of the gravity sensor after the triggering action is 3.3V, and determines that the level variation amplitude of the gravity sensor is 3.3V, within a second predetermined level range of 3.0V to 3.5V, thus determining that the gravity sensor generates an interrupt, then obtaining a second parameter of 2.5N corresponding to the gravity sensor after triggering action, and obtaining a parameter difference value of 0.4N by making a difference between the second parameter of 2.5N and a second interruption parameter of 2.1N, and then detecting that the parameter difference value 0.4N is greater than a second preset expected difference value 0.3N, and determining that a second interruption parameter 2.1N of the gravity sensor meets the set requirement by the test system.
Further, the second preset level range is 3.0V to 3.5V, the second preset expected difference value is 0.3N, the second interruption parameter of the pressure sensor is 2.1N, the test system detects that the first level data of the pressure sensor before the triggering action is 3.3V, the second level data of the pressure sensor after the triggering action is 0V, the test system determines that the level variation amplitude of the pressure sensor is 3.3V, and is within the second preset level range of 3.0V to 3.5V, so that the pressure sensor is determined to generate interruption, then the corresponding second parameter of the pressure sensor after the triggering action is obtained as 2.3N, the second parameter 2.3N is differed from the second interruption parameter 2.1N to obtain the parameter difference value of 0.2N, then the test system detects that the parameter difference value of 0.2N is smaller than the second preset expected difference value of 0.3N, and the first preset expected difference value of 0.3N to obtain the third parameter of 2.3N, i.e. the second interrupt parameter 2.1N of the pressure sensor is replaced by a third interrupt parameter 2.0N.
The embodiment realizes that a voltage test is carried out by reading test voltage values corresponding to all devices to be tested in the semi-finished product and based on the test voltage values, when the voltage test is detected to pass, a reading instruction is sent to the semi-finished product so that the semi-finished product can read device information according to the reading instruction and feed back the reading information, when the reading information is received, a communication test is carried out based on the reading information, and when the communication test is detected to pass, a software test is carried out on the semi-finished product. Therefore, in the process of determining the test result, the test voltage value is automatically read and the voltage test is carried out, the reading instruction is automatically sent and the communication test is carried out, whether the voltage test and the communication test are passed or not is automatically detected, the software test is carried out, and the hardware test and the software test do not need to be carried out on the semi-finished product of the wireless earphone one by one, so that the hardware test and the software test on the semi-finished product of the wireless earphone are automatically realized. Moreover, this embodiment can once only accomplish half-finished hardware test and software functional test automatically to according to software test result automatic calibration sensor parameter, and need not test repeatedly, the loaded down with trivial details process of transferring the parameter, reduced the interference of human factor, thereby realized the automatic test to wireless earphone half-finished product, thereby promoted the test efficiency of wireless earphone half-finished product test, improved the standardization level of wireless earphone half-finished product test simultaneously, shortened research and development cycle.
Further, a second embodiment of the method for testing a semi-finished product of a wireless headset according to the present invention is provided.
The second embodiment of the method for testing a semi-finished product of a wireless headset differs from the first embodiment of the method for testing a semi-finished product of a wireless headset in that the method for testing a semi-finished product of a wireless headset further comprises:
step o, when the communication test is detected not to pass, acquiring a first device corresponding to the read information;
and p, determining first device information corresponding to the first device, and displaying the first device information so that a user can analyze the first device according to the first device information.
Specifically, when the test system detects that the communication test fails, the test is ended, the first device corresponding to the read information is obtained, then the first device information corresponding to the first device is determined, the first device information is displayed in the LCD screen, and a tester analyzes the communication fault in the transmission process or/and the information reading process according to the first device information displayed in the LCD screen. Device information includes, but is not limited to, device name, device status, and device failure, among others.
When the embodiment detects that the communication test is not passed, a first device corresponding to the read information is obtained; and determining first device information corresponding to the first device, and displaying the first device information so that a user can analyze the first device according to the first device information. Therefore, when the communication test is detected to fail in the embodiment, the test is automatically ended and the corresponding device information is displayed for the user to analyze, so that the test flow is simplified.
Further, a third embodiment of the method for testing a semi-finished product of a wireless headset according to the present invention is provided.
The third embodiment of the method for testing a semi-finished product of a wireless headset differs from the first or/and second embodiments of the method for testing a semi-finished product of a wireless headset in that the method for testing a semi-finished product of a wireless headset further comprises:
step q, when the voltage test is not passed, acquiring a first device to be tested corresponding to the target test voltage value;
and r, determining a first test voltage value corresponding to the first device to be tested, and displaying the first test voltage value for a user to analyze the first device to be tested according to the first test voltage value.
Specifically, when the test system detects that the voltage test fails, the test is ended, a first device to be tested corresponding to the target test voltage value is obtained, then a first test voltage value corresponding to the first device to be tested is determined, and the first test voltage value is displayed on the LCD screen, so that a user can analyze the fault information of the first device to be tested according to the first test voltage value displayed on the LCD screen.
When the embodiment detects that the voltage test fails, a first device to be tested corresponding to the target test voltage value is obtained; and determining a first test voltage value corresponding to the first device to be tested, and displaying the first test voltage value so that a user can analyze the first device to be tested according to the first test voltage value. Therefore, when the voltage test is detected to fail in the embodiment, the test is automatically ended and the corresponding first test voltage value is displayed for the user to analyze, so that the test flow is simplified.
In addition, the present invention also provides a semi-finished product testing apparatus for a wireless headset, and referring to fig. 2, the semi-finished product testing apparatus for a wireless headset includes:
the reading module 10 is used for reading the test voltage value corresponding to each device to be tested in the semi-finished product;
a test module 20, configured to perform a voltage test based on each of the test voltage values;
the sending module 30 is configured to send a read instruction to the semi-finished product when the voltage test is passed, so that the semi-finished product reads device information according to the read instruction and feeds back read information;
the test module 20 is further configured to perform a communication test based on the read information when receiving the read information; and when the communication test is detected to pass, performing software test on the semi-finished product.
Further, the reading module 10 also reads the test voltage value corresponding to each device to be tested in the semi-finished product.
Further, the test module 20 includes:
the detection unit is used for detecting whether a target test voltage value exists in the test voltage values, wherein the target test voltage value is out of a preset voltage range of a device to be tested corresponding to the target test voltage value;
the determining unit is used for determining that the voltage test is passed if the target test voltage value is detected to be absent; if the target test voltage value is detected to exist, determining that the voltage test fails;
the detection unit is further used for detecting whether the read information is the same as preset information or not when the read information is received;
the determining unit is further configured to determine that the communication test passes if it is detected that the read information is the same as the preset information; if the read information is detected to be different from the preset information, determining that the communication test is not passed;
the detection unit is used for detecting whether to respond to the triggering action of sensor interruption when the communication test is passed;
the reading unit is used for reading the level variation amplitude of the interrupt pin corresponding to each sensor if the response to the trigger action is detected;
and the calibration unit is used for calibrating each sensor according to each level change amplitude.
Further, the calibration unit includes:
the detection subunit is configured to detect whether a first target sensor exists in each of the sensors, where a first level change amplitude corresponding to the first target sensor is outside a first preset level range;
the acquiring subunit is configured to acquire, if the first target sensor exists, a first parameter corresponding to the first target sensor;
a determining subunit, configured to determine a first interruption parameter based on the first parameter and a first preset expected difference;
the detection subunit is further configured to detect whether a second target sensor exists in each of the sensors, where a second level variation amplitude corresponding to the second target sensor is within a second preset level range;
the obtaining subunit is further configured to obtain, if the second target sensor exists, a second parameter corresponding to the second target sensor;
the determining subunit is further configured to determine a parameter difference based on the second parameter and a second interrupt parameter;
the detection subunit is further configured to detect whether the parameter difference is less than or equal to a second preset expected difference;
the determining subunit is further configured to determine a third interruption parameter based on the second parameter and a second preset expected difference value if it is detected that the parameter difference value is smaller than or equal to the second preset expected difference value.
Further, the semi-finished product testing device of the wireless earphone further comprises:
the acquisition module is used for acquiring a first device corresponding to the read information when the communication test is not passed;
the determining module is used for determining first device information corresponding to the first device;
and the display module is used for displaying the first device information so that a user can analyze the first device according to the first device information.
The obtaining module is further configured to obtain a first device to be tested corresponding to the target test voltage value when detecting that the voltage test fails;
the determining module is further used for determining a first test voltage value corresponding to the first device to be tested;
the display module is further used for displaying the first test voltage value so that a user can analyze the first device to be tested according to the first test voltage value.
The specific implementation of the wireless headset-based semi-finished product testing device of the present invention is substantially the same as the above-mentioned wireless headset-based semi-finished product testing method, and is not described herein again.
In addition, the invention also provides a semi-finished product testing system of the wireless earphone. As shown in fig. 3, fig. 3 is a schematic structural diagram of a hardware operating environment according to an embodiment of the present invention.
It should be noted that fig. 3 is a schematic structural diagram of a hardware operating environment of a semi-finished product testing system of a wireless headset.
As shown in fig. 3, the semi-finished test system of the wireless headset may include: a processor 1001, such as a CPU (Central Processing Unit), a memory 1005, a user interface 1003, a network interface 1004, and a communication bus 1002. A communication bus 1002 is used to enable connection communications between these components. The user interface 1003 may include a Display screen (Display), an input unit such as a keyboard (board), and the optional user interface 1003 may include a standard wired interface (e.g., a USB (Universal Serial Bus) interface), and a wireless interface (e.g., a bluetooth interface). The network interface 1004 may optionally include a standard wired interface, a Wireless interface (e.g., a WI-FI interface). The memory 1005 may be a high-speed RAM memory or a non-volatile memory (e.g., a magnetic disk memory). The memory 1005 may alternatively be a storage device separate from the processor 1001.
Optionally, the semi-finished test system of the wireless headset may further include an RF (Radio Frequency) circuit, a sensor, a WiFi module, and the like.
Those skilled in the art will appreciate that the semi-finished test system configuration of the wireless headset shown in fig. 3 does not constitute a limitation of the semi-finished test system of the wireless headset, and may include more or fewer components than those shown, or some components in combination, or a different arrangement of components.
As shown in fig. 3, a memory 1005, which is a kind of computer storage medium, may include therein a semi-finished test program of an operating device, a network communication module, a user interface module, and a wireless headset. The operating device is a program for managing and controlling hardware and software resources of a semi-finished test system of the wireless headset, and supports the running of the semi-finished test program of the wireless headset and other software or programs.
In the semi-finished test system of the wireless headset shown in the figure, the user interface 1003 is mainly used for a PC computer to perform data communication with the test system; the network interface 1004 is mainly used for testing the system so as to carry out data communication with a PC computer and a wireless headset FPC; the processor 1001 may be configured to call the semi-finished test program of the wireless headset stored in the memory 1005 and complete the steps of the control method of the semi-finished test system of the wireless headset as described above.
The specific implementation of the semi-finished product testing system of the wireless headset of the present invention is basically the same as the embodiments of the semi-finished product testing method of the wireless headset, and will not be described herein again.
In addition, an embodiment of the present invention further provides a computer-readable storage medium, where a semi-finished product testing program of a wireless headset is stored on the computer-readable storage medium, and when the semi-finished product testing program of the wireless headset is completed by a processor, the steps of the above-mentioned semi-finished product testing method of the wireless headset are implemented.
The specific implementation manner of the computer readable storage medium of the present invention is substantially the same as that of the above-mentioned embodiments of the method for testing a semi-finished product of a wireless headset, and will not be described herein again.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but the former is a better implementation manner in many cases. Based on such understanding, the technical solution of the present invention may be embodied in the form of software goods, which are stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk), and include instructions for enabling a semi-finished testing system of a wireless headset to perform the method according to the embodiments of the present invention.
Claims (8)
1. A semi-finished product testing method of a wireless earphone is characterized by comprising the following steps:
reading test voltage values corresponding to all devices to be tested in the semi-finished product, and carrying out voltage test based on all the test voltage values;
when the voltage test is detected to pass, sending a reading instruction to the semi-finished product so that the semi-finished product can read device information according to the reading instruction and feed back the reading information;
when the reading information is received, carrying out communication test based on the reading information;
when the communication test is detected to pass, performing software test on the semi-finished product;
wherein, when the communication test is detected to pass, the step of performing software test on the semi-finished product comprises:
when the communication test is detected to pass, detecting whether to respond to the triggering action of sensor interruption;
if the response to the trigger action is detected, reading the level variation amplitude of the interrupt pin corresponding to each sensor, and calibrating each sensor according to the level variation amplitude;
said step of calibrating each of said sensors according to each of said level change magnitudes comprises:
detecting whether a first target sensor with a first level change amplitude outside a first preset level range exists in each sensor, wherein the first target sensor is an acceleration sensor;
if the first target sensor exists, acquiring a first parameter corresponding to the first target sensor, wherein the first parameter is the gravity acceleration of the first target sensor after a triggering action;
the first parameter is differenced with a first preset expected difference value corresponding to the first target sensor, and the obtained difference value is determined as a first interruption parameter;
replacing the original interrupt parameter of the first target sensor with the first interrupt parameter as a new interrupt parameter of the first target sensor.
2. The method for testing a semi-finished product of a wireless headset according to claim 1, wherein the step of reading a test voltage value corresponding to each device to be tested in the semi-finished product and performing a voltage test based on each test voltage value comprises:
reading a test voltage value corresponding to each device to be tested in the semi-finished product, and detecting whether a target test voltage value exists in each test voltage value, wherein the target test voltage value is out of a preset voltage range of the device to be tested corresponding to the target test voltage value;
if the target test voltage value is detected to be absent, determining that the voltage test is passed;
and if the target test voltage value is detected to exist, determining that the voltage test fails.
3. The method for testing a semi-finished product of a wireless headset according to claim 1, wherein the step of performing a communication test based on the read information upon receiving the read information comprises:
when the reading information is received, detecting whether the reading information is the same as preset information or not;
if the read information is detected to be the same as the preset information, determining that the communication test is passed;
and if the read information is detected to be different from the preset information, determining that the communication test fails.
4. The method for semi-finished testing of a wireless headset of claim 1, wherein the step of calibrating each of the sensors according to each of the level variation magnitudes comprises:
detecting whether a second target sensor with a second level change amplitude within a second preset level range exists in each sensor, wherein the second target sensor is a gravity sensor;
if the second target sensor exists, acquiring a second parameter corresponding to the second target sensor, wherein the second parameter is a gravity value of the second target sensor after a triggering action;
the second parameter is differenced with a second interruption parameter corresponding to the second target sensor, and the obtained difference is determined as a parameter difference value, wherein the second interruption parameter is an original interruption parameter corresponding to the second target sensor;
detecting whether the parameter difference is smaller than or equal to a second preset expected difference corresponding to the second target sensor;
and if the detected parameter difference value is smaller than or equal to the second preset expected difference value, subtracting the second parameter from the second preset expected difference value, determining a third interruption parameter, and replacing the second interruption parameter with the third interruption parameter to serve as a new interruption parameter of the second target sensor.
5. The method for testing a semi-finished product of a wireless headset according to claim 1, wherein after the step of performing a communication test based on the read information when the read information is received, the method further comprises:
when the communication test is detected not to pass, acquiring a first device corresponding to the read information;
and determining first device information corresponding to the first device, and displaying the first device information so that a user can analyze the first device according to the first device information.
6. The method for testing a semi-finished product of a wireless headset according to claim 2, wherein after the step of reading the test voltage value corresponding to each device to be tested in the semi-finished product and performing the voltage test based on each test voltage value, the method further comprises:
when the voltage test is detected not to pass, acquiring a first device to be tested corresponding to the target test voltage value;
and determining a first test voltage value corresponding to the first device to be tested, and displaying the first test voltage value so that a user can analyze the first device to be tested according to the first test voltage value.
7. A semi-finished test system for wireless headsets, characterized in that the semi-finished test system for wireless headsets comprises a memory, a processor and a semi-finished test program for wireless headsets stored on the memory and running on the processor, the semi-finished test program for wireless headsets realizing the steps of the semi-finished test method for wireless headsets according to any one of claims 1 to 6 when completed by the processor.
8. A computer-readable storage medium, characterized in that the computer-readable storage medium has stored thereon a semi-finished test program for a wireless headset, which when completed by a processor implements the steps of the method for semi-finished test of a wireless headset according to any one of claims 1 to 6.
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