CN111803109A - X-ray detector and X-ray imaging system - Google Patents
X-ray detector and X-ray imaging system Download PDFInfo
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- CN111803109A CN111803109A CN202010817010.XA CN202010817010A CN111803109A CN 111803109 A CN111803109 A CN 111803109A CN 202010817010 A CN202010817010 A CN 202010817010A CN 111803109 A CN111803109 A CN 111803109A
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Abstract
The application discloses an X-ray detector and an X-ray imaging system. The X-ray detector comprises a panel provided with a photosensitive area array; the photosensitive area array comprises a plurality of rows of photosensitive areas and a plurality of columns of photosensitive areas, wherein each row of photosensitive areas extend along a first direction and are arranged in a row, the photosensitive areas extend along a second direction, two adjacent rows of photosensitive areas have intervals between the photosensitive areas, the first direction is perpendicular to the second direction, and sensors used for sensing the intensity of X rays irradiated on the photosensitive areas are arranged on the photosensitive areas.
Description
Technical Field
The application relates to the field of medical equipment, in particular to an X-ray detector and an X-ray imaging system.
Background
An X-ray detector is a device for receiving and sensing information of X-rays, which is often used for X-ray imaging. For example, X-ray detectors are often used to receive X-rays in methods of X-ray phase contrast imaging. The principle of X-ray phase contrast imaging is: when the X-ray passes through the object, refraction occurs, which inevitably causes a phase change, which can be displayed by observing the intensity change of the X-ray, and information of the object can be restored by the phase change, thereby realizing imaging of the object.
Disclosure of Invention
One embodiment of the present application provides an X-ray detector, which includes a panel having an array of photosensitive regions; the photosensitive area array comprises a plurality of rows of photosensitive areas and a plurality of columns of photosensitive areas, wherein each row of photosensitive areas extend along a first direction and are arranged in a row, the photosensitive areas extend along a second direction, two adjacent rows of photosensitive areas have intervals between the photosensitive areas, the first direction is perpendicular to the second direction, and sensors used for sensing the intensity of X rays irradiated on the photosensitive areas are arranged on the photosensitive areas.
One of the embodiments of the present application provides an X-ray imaging system including an X-ray detector according to any of the embodiments of the present application.
One of the embodiments of the present application provides an X-ray imaging system, which includes a radiation source, a mask plate, a processor, and the X-ray detector according to any one of the above technical solutions; the ray source is used for emitting X rays; the mask plate is arranged between the ray source and the X-ray detector and is used for dividing X-rays emitted by the ray source into a plurality of sub-rays, and the plurality of sub-rays irradiate on a panel of the X-ray detector; the processor is used for receiving the information of the sensor so as to determine the intensity of the sub-rays irradiated on the panel, which are respectively sensed by the photosensitive areas at different positions.
Drawings
The present application will be further explained by way of exemplary embodiments, which will be described in detail by way of the accompanying drawings. These embodiments are not intended to be limiting, and in these embodiments like numerals are used to indicate like structures, wherein:
FIG. 1 is a perspective view of an X-ray detector according to some embodiments of the present application;
FIG. 2 is a schematic illustration of a panel structure of an X-ray detector according to some embodiments of the present application;
FIG. 3 is a schematic perspective view of an X-ray detector according to other embodiments of the present application;
FIG. 4 is a schematic illustration of a panel structure of an X-ray detector according to further embodiments of the present application;
FIG. 5 is a schematic diagram of a configuration of an X-ray imaging system according to some embodiments of the present application.
In the figure, 10 is an X-ray detector, 1 is a panel, 2 is a photosensitive area, 20 is a mask plate, 30 is a radiation source, 40 is a first driving device, 50 is a second driving device, and 100 is an X-ray imaging system.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
On the contrary, this application is intended to cover any alternatives, modifications, equivalents, and alternatives that may be included within the spirit and scope of the application as defined by the appended claims. Furthermore, in the following detailed description of the present application, certain specific details are set forth in order to provide a better understanding of the present application. It will be apparent to one skilled in the art that the present application may be practiced without these specific details.
The embodiment of the application relates to an X-ray detector and an X-ray imaging system, wherein the panel of the X-ray detector is provided with a photosensitive area array, and the X-ray detector can move along a first direction, namely the panel (the photosensitive area array) can move along the first direction. By arranging the photosensitive area array on the panel, when the phase contrast imaging of X-rays is required, the X-ray detector can be directly used for the phase contrast imaging of the X-rays without arranging a mask plate covering the detector. The X-ray detector of the present application can be applied to various devices capable of emitting X-rays, including but not limited to CT, DR, X-ray machines, and the like. Preferably, the X-ray detector of the present application can be applied to an apparatus capable of X-ray phase contrast imaging.
FIG. 1 is a perspective view of an X-ray detector according to some embodiments of the present application; FIG. 2 is a schematic diagram of a structure of an X-ray detector according to some embodiments of the present application. The X-ray detector according to the embodiment of the present application will be described in detail below with reference to fig. 1 to 2. It should be noted that the following examples are only for explaining the present application and do not constitute a limitation to the present application.
In an embodiment of the present application, as shown in fig. 1, the X-ray detector 10 comprises a panel 1 provided with an array of photosensitive areas. As shown in fig. 2, the photosensitive area array includes a plurality of rows of photosensitive areas 2 and a plurality of columns of photosensitive areas 2, each row of the photosensitive areas 2 extends along a first direction, each column of the photosensitive areas 2 extends along a second direction, and a space exists between two adjacent columns of the photosensitive areas. In an embodiment of the present application, the first direction is perpendicular to the second direction. The photosensitive area 2 is provided with a sensor for sensing the intensity of the X-ray irradiated thereto. The first and second orientations of the panel 1 have been indicated in figure 1. There is a space between two adjacent columns of photosensitive regions 2, and it is understood that a non-photosensitive region is disposed between two adjacent columns of photosensitive regions 2. In some embodiments, the sensor may comprise any sensor capable of sensing the intensity of X-rays. For example, the sensor may include a scintillation detector, a semiconductor detector, or the like. As shown in fig. 2, it is understood that in each square grid area, the right rectangular area is a photosensitive area, and as indicated by reference numeral 2, the left blank area in the grid is a non-photosensitive area.
In the embodiment of the present application, the panel 1 may enable the photosensitive area array on the panel 1 to move along the first direction through the movement of the X-ray detector 10 along the first direction, and the sensors disposed on the photosensitive areas 2 may respectively sense the intensity of the X-rays irradiated to the photosensitive areas 2 before and after the photosensitive areas 2 move, so as to implement phase contrast imaging of the X-rays.
In some embodiments, as shown in fig. 1, the X-ray detector 10 may be connected to a first driving device 40 (e.g., a stepping motor, a servo motor, etc.), and the first driving device 40 may be capable of driving the X-ray detector 10 to move in a first direction. In some embodiments, the X-ray detector 10 may be connected to the first drive device 40 by a first transmission. In some embodiments, the first transmission device may include a screw rod disposed along the first direction and a nut disposed on the X-ray detector 10, the nut being capable of cooperating with the screw rod, the screw rod being connected to the first driving device 40. The first driving device 40 can drive the lead screw to rotate, so that the nut moves on the lead screw, and the X-ray detector 10 is driven to move along the first direction. In other embodiments, the first transmission device may include a rack disposed in the first direction and provided on the X-ray detector, and a gear capable of meshing with the rack. The first driving device 40 can drive the gear to rotate so as to make the rack move, and then drive the X-ray detector 10 to move along the first direction. Those skilled in the art can make various reasonable changes to the technical scheme of the application on the basis of the application. For example, the number of motors, the arrangement of the motors and/or the types of the motors can be specifically set according to actual needs. Also for example, the first transmission may also comprise a belt transmission, a chain transmission or the like.
In an embodiment of the present application, the X-ray detector 10 can be used in combination with a mask plate and a radiation source to realize phase contrast imaging of X-rays. The mask plate has a plurality of holes corresponding to the shape, size and position of the photosensitive region 2 on the X-ray detector 10. In some embodiments, one hole on the mask plate may correspond to one photosensitive region 2; alternatively, one aperture in the mask plate may correspond to a plurality of photosensitive regions 2 (e.g., a column of photosensitive regions). The mask plate is located between the radiation source and the X-ray detector 10, and the object to be imaged is located between the mask plate and the X-ray detector 10. In a specific imaging process, an X-ray emitted from the radiation source passes through the mask plate and is divided into a plurality of sub-rays, and the plurality of sub-rays are irradiated on the panel 1 on the X-ray detector 10. Each sub-ray may correspondingly impinge on one or a column of photosensitive areas 2. After the imaging object is placed, a first partial area (e.g., a half area) of the photosensitive area 2 is covered with the irradiation area of the sub-radiation, and first exposure is performed to obtain first X-ray intensity information. Then, the panel 1 is moved in the first direction so that a second partial region (for example, the other half region) different from the first partial region in the photosensitive region is covered with the irradiated region of the sub-radiation, and then, a second exposure is performed to obtain second X-ray intensity information. Since the sub-rays divided by the mask plate pass through the object to be imaged, the phases of the sub-rays are changed, which is reflected as ray refraction, and thus the intensity of the sub-rays detected by each photosensitive area 2 after two exposures is changed. By processing the two pieces of X-ray intensity information, the refraction angle information of the X-rays can be obtained, and thus the phase change information of the X-rays can be obtained.
In some embodiments, the photosensitive area 2 has a rectangular shape, and the wide side of the rectangle is parallel to the first direction. In some embodiments, the photosensitive regions 2 in each column may be end-to-end; alternatively, a certain gap may be left between adjacent photosensitive regions 2 in each column. By setting the photosensitive area 2 to be rectangular, it is possible to facilitate extraction of one-dimensional refraction angle (i.e., an angle at which X-rays are deflected toward one direction) information. When the shape of the photosensitive area 2 is a rectangle, the shape of the hole of the mask plate used in conjunction with the X-ray detector in the X-ray imaging system may be a long strip or a rectangle.
In some embodiments, when the photosensitive regions 2 are rectangular, the width a of each photosensitive region 2 is equal to the separation distance b between any two adjacent columns of photosensitive regions 2. With this arrangement, the adjustment of the moving distance of the panel 1 in the first direction can be facilitated during the X-ray phase contrast imaging. For example, after the first exposure is performed and the first X-ray intensity information is obtained, the panel 1 may be moved by 0.5 cycles (the cycle corresponding to the distance between the center points of adjacent photosensitive areas 2 in the first direction). Alternatively, the distance that the panel 1 moves may be an odd multiple of 0.5 cycles (e.g., 1.5 cycles, 2.5 cycles, etc.). After the panel 1 is moved into position, a second exposure may be performed to obtain second X-ray intensity information. In some alternative embodiments, the width a of the photosensitive regions 2 and the separation distance b between any two adjacent columns of photosensitive regions 2 may not be equal. For example, the width a of the photosensitive regions 2 may be smaller than the separation distance b between any two adjacent columns of photosensitive regions 2. Such as 4/5, 2/3, 1/2, etc., where the width a of the photosensitive regions 2 may be the separation distance b between any two adjacent columns of photosensitive regions 2.
Fig. 3 is a schematic perspective view of the X-ray detector 10 according to other embodiments of the present application, and fig. 4 is a schematic structural view of the X-ray detector 10 according to other embodiments of the present application. As shown in fig. 3-4, there is a space between two adjacent columns of photosensitive areas 2 in the plurality of columns of photosensitive areas 2, and a space between two adjacent rows of photosensitive areas 2 in the plurality of rows of photosensitive areas 2, so that the photosensitive areas 2 are staggered when viewed from at least two rows or at least two columns. The interval between two adjacent rows of photosensitive areas 2 is understood to be a non-photosensitive area (e.g., an area with a large X-ray absorption rate) between two adjacent rows of photosensitive areas 2. In some embodiments, the X-ray detector 10 can be moved in either the first or second direction. At this time, in the panel 1, in the process of the X-ray phase contrast imaging, after the panel 1 moves along the first direction to perform the second exposure, the panel 1 may also move along the second direction for a certain distance to perform the third exposure, so that the two-dimensional refraction angle (i.e., the angle at which the X-ray is deflected toward the two directions) information of the X-ray may be extracted.
In some embodiments, as shown in fig. 4, the shape of the photosensitive region 2 may be a square, the sides of the square being parallel to the first direction or the second direction. The square photosensitive area 2 facilitates extraction of two-dimensional refraction angle information and processing and manufacturing. In some embodiments, the side length c of each photosensitive region 2 is equal to the separation distance d between any two adjacent columns of photosensitive regions 2, and the side length c of each photosensitive region 2 is also equal to the separation distance e between any two adjacent rows of photosensitive regions 2. By such an arrangement, the adjustment and determination of the moving distance of the panel 1 in the first and second directions can be facilitated during the X-ray phase contrast imaging. In some alternative embodiments, the side length c of the photosensitive regions 2 may not be equal to the separation distance d between any two adjacent columns of photosensitive regions 2, and/or the side length c of the photosensitive regions 2 may not be equal to the separation distance e between any two adjacent rows of photosensitive regions 2.
In some embodiments, as shown in fig. 3, the X-ray detector 10 may be connected to a second driving device 50 (e.g., a stepping motor, a servo motor, etc.), and the second driving device 50 may be capable of driving the X-ray detector 10 to move along the second direction. In some embodiments, the X-ray detector 10 may be connected to the second drive device 50 by a second transmission. In some embodiments, the first transmission and the second transmission may be similarly configured.
Possible benefits of the X-ray detector disclosed herein include, but are not limited to: (1) the relative position of the irradiation area of the X-ray and the photosensitive area on the panel can be conveniently adjusted; (2) a mask plate in front of the X-ray detector is not needed to be used for partially shielding the X-rays, so that the cost and the operation difficulty of X-ray phase contrast imaging can be reduced; (3) the method can be used for acquiring one-dimensional refraction angle information or two-dimensional refraction angle information, thereby ensuring the imaging effect. It is to be noted that different embodiments may produce different advantages, and in different embodiments, any one or combination of the above advantages may be produced, or any other advantages may be obtained.
Another embodiment of the present application is also directed to an X-ray imaging system, and fig. 5 is a schematic structural diagram of an X-ray imaging system according to some embodiments of the present application. As shown in fig. 5, the X-ray imaging system 100 includes a radiation source 30, a mask plate 20, a processor, and the X-ray detector 10 according to any of the above-mentioned embodiments. The radiation source 30 is used to emit X-rays. The mask plate 20 is disposed between the radiation source 30 and the X-ray detector 10, and serves to divide the X-rays emitted from the radiation source 30 into a plurality of sub-rays, which are irradiated onto the panel 1 of the X-ray detector 10. The processor is used for receiving the information of the sensor to determine the intensity of the sub-rays irradiated on the photosensitive area 2 on the panel 1, which are respectively sensed when the photosensitive area is at different positions. In embodiments of the present application, source 30 may be selected from a tube of rays commonly used in the art for CT or DR imaging. During use of the X-ray imaging system 100, an imaging subject is placed between the mask plate 20 and the X-ray detector 10.
In some embodiments, the shape of the photosensitive area 2 is a rectangle, and the wide side of the rectangle is parallel to the first direction; the mask plate 20 includes a plurality of bar-shaped holes arranged in parallel at intervals in the first direction, and the width of the sub-ray irradiated on the panel 1 of the X-ray detector 10 through the plurality of bar-shaped holes is equal to the width of the rectangle. Specifically, the width of the strip-shaped hole of the mask plate 20 may be proportional to the width of the photosensitive area 2, and the ratio may be determined according to the distance between the mask plate 20 and the X-ray detector 10, so as to ensure that the width of the irradiation area of the sub-ray on the panel 1 is equal to the width of the rectangular photosensitive area 2. In this embodiment, the irradiation area of the sub-ray beam divided by the bar-shaped hole may cover a row of photosensitive areas of the photosensitive area array. For example, the width of the irradiation area of the sub-ray may be equal to the width of the rectangle, and the length of the irradiation area of the sub-ray may be equal to the length of a column of photosensitive areas. Through the arrangement, the duty ratio of the photosensitive area 2 is improved, and meanwhile, the photosensitive area 2 and the mask plate 20 can be ensured to be stably matched to realize phase contrast imaging, and meanwhile, the production and the manufacture of the mask plate can be facilitated.
In some embodiments, when the photosensitive area is rectangular, the different positions may include a first position and a second position of the photosensitive area 2. When the photosensitive area 2 is located at the first position, a part (e.g., half) of the photosensitive area is covered with the irradiation area of the sub-rays; when the photosensitive region 2 is located at the second position, another partial region (e.g., the other half region) of the photosensitive region is covered with the irradiation region of the sub-radiation. When the imaging object is not placed between the mask plate 20 and the X-ray detector 10, the intensity of the sub-rays irradiated on the photosensitive area 2 on the panel 1 recorded by the processor is the same in the first position and the second position, and when the imaging object is placed between the mask plate 20 and the X-ray detector 10, the X-rays are refracted after passing through the imaging object, so that the intensity of the sub-rays irradiated on the photosensitive area 2 on the panel 1 recorded by the processor is different in the first position and the second position. And obtaining one-dimensional refraction angle data of the sub-rays according to the intensity difference of the sub-rays acquired twice.
In some embodiments, there is a space between two adjacent rows of photosensitive areas 2 of the plurality of rows of photosensitive areas 2 arranged along the second direction, the panel 1 of the X-ray detector 10 is capable of moving along the second direction, the shape of the photosensitive areas 2 is square, and the sides of the square are parallel to the first direction or the second direction; the mask plate 20 includes a square hole array, and the shape of a sub-ray irradiated by an X-ray onto the panel 1 of the X-ray detector 10 through a plurality of square holes on the square hole array is the same as the shape of the photosensitive region 2 (e.g., a square with the same size). In some embodiments, the side length of the square hole of the mask plate 20 may be in a certain ratio to the side length of the photosensitive area 2, and the ratio may be determined according to the distance between the mask plate 20 and the X-ray detector 10, so as to ensure that the irradiation area of the sub-ray irradiated by the X-ray onto the panel 1 of the X-ray detector 10 through the plurality of square holes on the square hole array has the same shape as the photosensitive area 2. Through the arrangement, the photosensitive area 2 and the mask plate 20 can be ensured to be stably matched to realize phase contrast imaging.
In some embodiments, when the photosensitive region 2 is square, the different positions may include a third position, a fourth position, and a fifth position of the photosensitive region 2. When the photosensitive area 2 is located at the third position, the first sub-area in the photosensitive area 2 is covered by the irradiation area of the sub-rays; when the photosensitive area 2 is located at the fourth position, the second sub-area in the photosensitive area 2 is covered by the irradiation area of the sub-rays; when the photosensitive region 2 is located at the fifth position, the third sub-region in the photosensitive region 2 is covered with the irradiation region of the sub-rays. The first sub-area, the second sub-area and the third sub-area are sub-squares, the side length of each sub-square is half of the side length of the photosensitive area 2, the first sub-area and the second sub-area are arranged adjacently along the first direction, and the second sub-area and the third sub-area are arranged adjacently along the second direction. When the imaging object is not placed between the mask plate 20 and the X-ray detector 10, the intensity of the sub-rays irradiated on the photosensitive area 2 on the panel 1 recorded by the processor is the same in the third position, the fourth position and the fifth position, and when the imaging object is placed between the mask plate 20 and the X-ray detector 10, the X-rays are refracted after passing through the imaging object, so that the intensity of the sub-rays irradiated on the photosensitive area 2 on the panel 1 recorded by the processor is different in the third position, the fourth position and the fifth position. According to the intensity difference of the sub-rays acquired three times, two-dimensional refraction angle data of the sub-rays can be obtained. For example, according to the intensity of the sub-ray of the photosensitive area 2 at the third position and the fourth position on the panel under the recording of the processor, the refraction angle data of the sub-ray deflected in the first direction can be obtained; the refraction angle data of the sub-ray deflected in the second direction can be obtained according to the intensity of the sub-ray of the photosensitive area 2 at the fourth position and the fifth position on the panel recorded by the processor.
In some embodiments, the processor is further configured to determine phase information of the X-ray according to intensities of sub-rays impinging thereon respectively sensed by the photosensitive areas 2 at different positions on the panel 1. Since the sub-rays will deflect after passing through the object to be imaged, the refraction angle information of the X-ray and further the phase information of the sub-ray can be obtained by the sub-ray intensity of the photosensitive area 2 on the panel 1 at different positions. Further, an image of the imaged object may be determined from the phase information of the sub-rays.
The imaging method of the X-ray imaging system 100 in the embodiment of the present application may include the following steps (taking the photosensitive area as a rectangle as an example):
firstly, enabling a photosensitive area 2 to be at a first position; for example, the panel 1 of the X-ray detector 10 may be controlled to move in a first direction, so that the photosensitive area moves to a first position;
secondly, placing an imaging object between the mask plate 20 and the X-ray detector 10;
thirdly, carrying out first exposure to enable the sub-rays to penetrate through the imaging object, and controlling the sensor to respectively collect the intensity of the sub-rays irradiated on each photosensitive area 2 to obtain first ray intensity information;
controlling the panel 1 of the X-ray detector 10 to move along the first direction so as to enable the photosensitive area 2 to be at the second position;
fifthly, carrying out second exposure, and controlling the sensor to respectively collect the intensity of the sub-rays irradiated on each photosensitive area 2 to obtain second ray intensity information;
and step six, the processor obtains the refraction angle information of the sub-rays irradiated on each photosensitive area 2 according to the first ray intensity information and the second ray intensity information, and further obtains the phase information of the sub-rays.
The benefits that may be brought about by the X-ray imaging system disclosed herein include, but are not limited to: (1) through the cooperation of the light source, the mask plate, the X-ray detector and the processor, refraction angle information of the X-ray after the X-ray passes through the imaging object can be obtained, and then phase information of the X-ray is obtained. (2) The relative position of the irradiation area of the X-ray and the photosensitive area on the panel can be conveniently adjusted; (3) a mask plate in front of the X-ray detector is not needed to be used for partially shielding the X-rays, so that the cost and the operation difficulty of X-ray phase contrast imaging can be reduced; (4) the method can be used for acquiring one-dimensional refraction angle information or two-dimensional refraction angle information, so that the imaging effect can be improved after the phase information is acquired. It is to be noted that different embodiments may produce different advantages, and in different embodiments, any one or combination of the above advantages may be produced, or any other advantages may be obtained.
The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed.
Claims (15)
1. The utility model provides an X-ray detector, its characterized in that, is including the panel that is equipped with the photosensitive area array, the photosensitive area array includes multirow photosensitive area and multiseriate photosensitive area, and each row photosensitive area extends along the first direction, and each is listed as photosensitive area extends along the second direction, and adjacent two are listed as there is the interval between the photosensitive area, the first direction with the second direction is perpendicular, be equipped with on the photosensitive area and be used for responding to shine on it the sensor of X ray's intensity.
2. The X-ray detector of claim 1, wherein the X-ray detector is configured to be movable along the first direction.
3. The X-ray detector of claim 1, wherein a space exists between two adjacent rows of the plurality of rows of photosensitive regions.
4. The X-ray detector of claim 1, wherein the photosensitive area is rectangular in shape, a broad side of the rectangle being parallel to the first direction.
5. The X-ray detector of claim 4, wherein the width of the photosensitive regions is equal to a separation distance between any two adjacent columns of the photosensitive regions.
6. An X-ray detector as claimed in claim 3, characterized in that the X-ray detector is configured to be movable along the second direction.
7. The X-ray detector of claim 6, wherein the photosensitive region is square in shape, the sides of the square being parallel to the first direction or the second direction.
8. The X-ray detector of claim 6, wherein a side length of the photosensitive regions is equal to a separation distance between any two adjacent columns of the photosensitive regions, and the side length of the photosensitive regions is also equal to a separation distance between any two adjacent rows of the photosensitive regions.
9. An X-ray imaging system, characterized in that it comprises an X-ray detector according to any one of claims 1 to 8.
10. An X-ray imaging system, which is characterized by comprising a ray source, a mask plate, a processor and the X-ray detector of claim 1;
the ray source is used for emitting X rays;
the mask plate is arranged between the ray source and the X-ray detector and is used for dividing X-rays emitted by the ray source into a plurality of sub-rays, and the plurality of sub-rays irradiate on a panel of the X-ray detector;
the processor is used for receiving the information of the sensor so as to determine the intensity of the sub-rays irradiated on the panel, which are respectively sensed by the photosensitive areas at different positions.
11. The X-ray imaging system of claim 10, wherein the photosensitive area is rectangular in shape, a broad side of the rectangle being parallel to the first direction;
the mask plate comprises a plurality of strip-shaped holes which are arranged in parallel at intervals along the first direction, and the width of a sub-ray which is irradiated to the panel of the X-ray detector through the strip-shaped holes is equal to the width of the rectangle.
12. The X-ray imaging system of claim 11, wherein the different locations include a first location and a second location of the photosensitive region;
when the photosensitive area is located at the first position, a first partial area in the photosensitive area is covered by the irradiation area of the sub-ray;
when the photosensitive area is located at the second position, a second partial area different from the first partial area in the photosensitive area is covered by the irradiation area of the sub-ray.
13. The X-ray imaging system of claim 10, wherein there is a space between two adjacent rows of the plurality of rows of photosensitive areas, the X-ray detector further being movable along the second direction, the photosensitive areas being square in shape, sides of the square being parallel to the first direction or the second direction;
the mask plate comprises a square hole array, and the shape of sub-rays irradiated to the panel of the X-ray detector through a plurality of square holes in the square hole array is the same as that of the photosensitive area.
14. The X-ray imaging system of claim 13, wherein the different locations include a third location, a fourth location, and a fifth location of the photosensitive region;
when the photosensitive area is located at the third position, the first sub-area in the photosensitive area is covered by the irradiation area of the sub-ray;
when the photosensitive area is located at the fourth position, a second sub-area in the photosensitive area is covered by the irradiation area of the sub-ray;
when the photosensitive area is located at the fifth position, a third sub-area in the photosensitive area is covered by the irradiation area of the sub-ray; wherein,
the first sub-area, the second sub-area and the third sub-area are sub-squares respectively, the side length of each sub-square is half of the side length of the photosensitive area, the first sub-area and the second sub-area are adjacently arranged along the first direction, and the second sub-area and the third sub-area are adjacently arranged along the second direction.
15. The X-ray imaging system of claim 10, wherein the processor is further configured to determine phase information based on intensities of respective sub-rays impinging thereon sensed at different locations of the photosensitive area on the panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1127553A (en) * | 1993-04-05 | 1996-07-24 | 卡迪亚航海者公司 | X-ray detector for a low dosage scanning beam digital X-ray imaging system |
| JP2008197495A (en) * | 2007-02-14 | 2008-08-28 | Konica Minolta Medical & Graphic Inc | X-ray imaging film and production method, x-ray imaging method and system |
| CN101495853A (en) * | 2006-07-12 | 2009-07-29 | 保罗·谢勒学院 | X-ray interferometer for phase contrast imaging |
| US20120128126A1 (en) * | 2010-11-24 | 2012-05-24 | Fujifilm Corporation | Radiation phase image obtainment method and radiation phase image radiographic apparatus |
| CN102713679A (en) * | 2010-01-29 | 2012-10-03 | 佳能株式会社 | X-ray imaging apparatus and X-ray imaging method |
| CN107427271A (en) * | 2015-04-09 | 2017-12-01 | 株式会社岛津制作所 | X-ray imaging device |
| WO2019183002A2 (en) * | 2018-03-19 | 2019-09-26 | Xenselab Llc | X-ray tomography |
-
2020
- 2020-08-14 CN CN202010817010.XA patent/CN111803109A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1127553A (en) * | 1993-04-05 | 1996-07-24 | 卡迪亚航海者公司 | X-ray detector for a low dosage scanning beam digital X-ray imaging system |
| CN101495853A (en) * | 2006-07-12 | 2009-07-29 | 保罗·谢勒学院 | X-ray interferometer for phase contrast imaging |
| JP2008197495A (en) * | 2007-02-14 | 2008-08-28 | Konica Minolta Medical & Graphic Inc | X-ray imaging film and production method, x-ray imaging method and system |
| CN102713679A (en) * | 2010-01-29 | 2012-10-03 | 佳能株式会社 | X-ray imaging apparatus and X-ray imaging method |
| US20120128126A1 (en) * | 2010-11-24 | 2012-05-24 | Fujifilm Corporation | Radiation phase image obtainment method and radiation phase image radiographic apparatus |
| CN107427271A (en) * | 2015-04-09 | 2017-12-01 | 株式会社岛津制作所 | X-ray imaging device |
| WO2019183002A2 (en) * | 2018-03-19 | 2019-09-26 | Xenselab Llc | X-ray tomography |
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