CN111781218A - Method for positioning minerals in ore by utilizing alpha track etching - Google Patents
Method for positioning minerals in ore by utilizing alpha track etching Download PDFInfo
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- CN111781218A CN111781218A CN202010650608.4A CN202010650608A CN111781218A CN 111781218 A CN111781218 A CN 111781218A CN 202010650608 A CN202010650608 A CN 202010650608A CN 111781218 A CN111781218 A CN 111781218A
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- 229910052500 inorganic mineral Inorganic materials 0.000 title claims abstract description 100
- 239000011707 mineral Substances 0.000 title claims abstract description 100
- 238000005530 etching Methods 0.000 title claims abstract description 52
- 238000000034 method Methods 0.000 title claims abstract description 28
- 239000000523 sample Substances 0.000 claims abstract description 30
- 230000003287 optical effect Effects 0.000 claims abstract description 10
- 238000004140 cleaning Methods 0.000 claims abstract description 3
- 230000001678 irradiating effect Effects 0.000 claims abstract description 3
- 229910052721 tungsten Inorganic materials 0.000 claims description 25
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 24
- 239000010937 tungsten Substances 0.000 claims description 24
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 claims description 21
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 15
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 10
- KWYUFKZDYYNOTN-UHFFFAOYSA-M potassium hydroxide Substances [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 claims description 9
- 150000002910 rare earth metals Chemical class 0.000 claims description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- WZECUPJJEIXUKY-UHFFFAOYSA-N [O-2].[O-2].[O-2].[U+6] Chemical compound [O-2].[O-2].[O-2].[U+6] WZECUPJJEIXUKY-UHFFFAOYSA-N 0.000 claims description 4
- 239000012286 potassium permanganate Substances 0.000 claims description 4
- 238000005507 spraying Methods 0.000 claims description 4
- ZCUFMDLYAMJYST-UHFFFAOYSA-N thorium dioxide Chemical compound O=[Th]=O ZCUFMDLYAMJYST-UHFFFAOYSA-N 0.000 claims description 4
- 229910003452 thorium oxide Inorganic materials 0.000 claims description 4
- 229910000439 uranium oxide Inorganic materials 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 238000010183 spectrum analysis Methods 0.000 claims description 3
- 238000012216 screening Methods 0.000 claims description 2
- 230000002285 radioactive effect Effects 0.000 abstract description 5
- 235000010755 mineral Nutrition 0.000 description 72
- 239000002585 base Substances 0.000 description 11
- 229910052770 Uranium Inorganic materials 0.000 description 9
- 238000002474 experimental method Methods 0.000 description 9
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 7
- 238000005406 washing Methods 0.000 description 7
- 238000011160 research Methods 0.000 description 6
- 229910052758 niobium Inorganic materials 0.000 description 5
- 239000010955 niobium Substances 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 229910052776 Thorium Inorganic materials 0.000 description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 4
- 229910052845 zircon Inorganic materials 0.000 description 4
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 4
- 239000003513 alkali Substances 0.000 description 3
- ZXOKVTWPEIAYAB-UHFFFAOYSA-N dioxido(oxo)tungsten Chemical group [O-][W]([O-])=O ZXOKVTWPEIAYAB-UHFFFAOYSA-N 0.000 description 3
- 238000000095 laser ablation inductively coupled plasma mass spectrometry Methods 0.000 description 3
- 238000012113 quantitative test Methods 0.000 description 3
- 229910052847 thorite Inorganic materials 0.000 description 3
- XSSPKPCFRBQLBU-UHFFFAOYSA-N thorium(iv) orthosilicate Chemical compound [Th+4].[O-][Si]([O-])([O-])[O-] XSSPKPCFRBQLBU-UHFFFAOYSA-N 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- GFRMDONOCHESDE-UHFFFAOYSA-N [Th].[U] Chemical compound [Th].[U] GFRMDONOCHESDE-UHFFFAOYSA-N 0.000 description 2
- 229910052586 apatite Inorganic materials 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- VSIIXMUUUJUKCM-UHFFFAOYSA-D pentacalcium;fluoride;triphosphate Chemical compound [F-].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O VSIIXMUUUJUKCM-UHFFFAOYSA-D 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 238000002791 soaking Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910001200 Ferrotitanium Inorganic materials 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000033558 biomineral tissue development Effects 0.000 description 1
- 229910052626 biotite Inorganic materials 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- IKNAJTLCCWPIQD-UHFFFAOYSA-K cerium(3+);lanthanum(3+);neodymium(3+);oxygen(2-);phosphate Chemical compound [O-2].[La+3].[Ce+3].[Nd+3].[O-]P([O-])([O-])=O IKNAJTLCCWPIQD-UHFFFAOYSA-K 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000010433 feldspar Substances 0.000 description 1
- 239000010436 fluorite Substances 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- YDZQQRWRVYGNER-UHFFFAOYSA-N iron;titanium;trihydrate Chemical compound O.O.O.[Ti].[Fe] YDZQQRWRVYGNER-UHFFFAOYSA-N 0.000 description 1
- 239000004816 latex Substances 0.000 description 1
- 229920000126 latex Polymers 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052590 monazite Inorganic materials 0.000 description 1
- RJSRQTFBFAJJIL-UHFFFAOYSA-N niobium titanium Chemical compound [Ti].[Nb] RJSRQTFBFAJJIL-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229940072033 potash Drugs 0.000 description 1
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Substances [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 1
- 235000015320 potassium carbonate Nutrition 0.000 description 1
- 239000011028 pyrite Substances 0.000 description 1
- NIFIFKQPDTWWGU-UHFFFAOYSA-N pyrite Chemical compound [Fe+2].[S-][S-] NIFIFKQPDTWWGU-UHFFFAOYSA-N 0.000 description 1
- 229910052683 pyrite Inorganic materials 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- -1 rare earth fluorocarbon salt Chemical class 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N titanium dioxide Inorganic materials O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 239000011573 trace mineral Substances 0.000 description 1
- 235000013619 trace mineral Nutrition 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
The invention relates to a method for positioning minerals in ores by utilizing alpha track etching, which comprises the steps of preparing the ores into probe pieces; removing the film on the surface of the camera film; covering a camera film on the probe sheet, and then irradiating; taking down the camera film, etching with an etching solution, and cleaning; searching for etching dense points on a camera film under an optical microscope and marking; marking is performed on the corresponding position of the probe card, and then the mineral composition at the marked position on the probe card is analyzed by a detecting instrument to confirm the mineral species. The method can quickly and efficiently search and locate the minerals containing the radioactive elements in the ores.
Description
Technical Field
The invention relates to a method for positioning minerals in ores by utilizing alpha track etching.
Background
The tungsten-containing mineral carries a large amount of tungsten mineralization information and has long been an important research object for research on tungsten deposit cause. The wolframite group minerals and the scheelite group minerals are the two most important ore minerals in the tungsten deposit, however, the tungsten-containing minerals are far more than these two types of minerals. Because the chemical properties of W and Nb, Ta, Ti, Sn and other elements are very similar, they often form a class-likeness substitution relationship, and therefore, tungsten-containing mineral species are abundant, typically: black and thin gold ore, columbite mineral, easy-to-dissolve stone mineral, mountain-riding ore, ilmenite, rutile, fine crystal and the like. However, the content of the minerals is usually very low, the mineral particles are small, and the minerals are uncommon and are difficult to be accurately identified only by using an optical microscope, while the direct use of scanning electron microscopes and electron probes is time-consuming and uneconomical, so that the method is not an ideal method for searching the minerals, and the research work specially aiming at the minerals is not easy to be carried out.
Disclosure of Invention
The invention aims to provide a method for positioning minerals in ores by utilizing alpha track etching, which can quickly and efficiently search and position minerals containing radioactive elements in the ores.
In order to solve the technical problems, the invention adopts the following technical scheme:
the invention provides a method for positioning minerals in ores by utilizing alpha track etching, which comprises the following steps:
(1) preparing the ore into a probe sheet;
(2) removing the film on the surface of the camera film;
(3) covering the camera film processed in the step (2) on the probe sheet prepared in the step (1), and then irradiating;
(4) taking down the camera film irradiated in the step (3) from the probe sheet, etching by using an etching solution, and then cleaning;
(5) searching for etching dense points of the camera film cleaned in the step (4) under an optical microscope and marking the points;
(6) marking the corresponding positions of the probe sheet according to the etching dense points on the camera film marked in the step (5), and analyzing the mineral components at the marked positions on the probe sheet by using a detecting instrument to confirm the mineral types.
Preferably, the mineral is a mineral with a mass content of uranium oxide less than or equal to 1%, or a mineral with a mass content of thorium oxide less than or equal to 1%, or a mineral with a total mass content of uranium oxide and thorium oxide less than or equal to 1%.
In the present invention, the mass content of the oxide means the mass fraction of the corresponding element converted into the oxide.
Preferably, the crystal grain size of the mineral is 2-100 microns, preferably 2-50 microns, further preferably 2-20 microns, and especially preferably 2-5 microns. The method of the invention can not only identify the minerals with large grain size, but also identify and locate the minerals with small grain size.
Preferably, the mineral is a tungsten-rich mineral and/or a rare earth metal-containing mineral.
Preferably, the camera film can be washed with an alkali solution in step (2) to remove the film from the camera film.
Further preferably, the alkali liquor in the step (2) comprises a NaOH solution with the concentration of 8-12%.
More preferably, after the camera film in the step (2) is soaked and washed by alkali liquor, the film which is not completely peeled off can be manually rubbed off under flowing water, so as to ensure that the film on the surface layer of the film is completely peeled off.
Preferably, in the step (3), the camera film processed in the step (2) is cut to be slightly larger than the size of the probe sheet.
Preferably, the irradiation process in the step (3) can be performed in a dust-free, dry and normal-temperature environment, so as to ensure that the irradiation process is not interfered by an external environment.
Preferably, the irradiation time in the step (3) is controlled to be 25-30 days.
Preferably, the etching solution used in step (4) comprises 5-15 wt% of KOH, 10-20 wt% of NaOH, and 2-5 wt% of KMnO4And 70-80 wt% of water.
Further preferably, the etching solution used in step (4) comprises 6-9 wt% of KOH, 12-16 wt% of NaOH, and 3-4.5 wt% of KMnO4And 72 to 78 wt% of water.
Preferably, in the step (4), the camera films after being taken down are firstly threaded individually by using iron wires and then etched by using the etching solution, so that the camera films are prevented from stacking irradiation sites generating errors in the etching solution and the etching is not sufficient.
Preferably, in the step (4), the etching is carried out at a temperature of 60-65 ℃ for 50-70 min.
Preferably, in step (4), the etching solution is continuously stirred by a glass rod during the etching process to ensure that the camera film is sufficiently etched.
Preferably, in the step (4), the washing step includes immersing the etched camera films in water, washing the camera films one by one under flowing water, immersing the washed camera films in a solution prepared from HCl and water in a volume ratio of 1:1 to dissolve surface precipitates of the camera films, washing the camera films under flowing water, and drying the camera films.
Preferably, the detecting instrument comprises one or more of a probe and a scanning electron microscope. Wherein, the scanning electron microscope can preliminarily identify the mineral species; the electronic probe obtains the main component quantitatively, and the mineral species can be further determined.
Preferably, the qualitative analysis method in step (6) includes spraying carbon or gold on the marked position of the probe sheet, performing energy spectrum analysis on the mineral at the marked position by using a scanning electron microscope, screening and marking the mineral, and acquiring a back-scattered electron image of the mineral.
Furthermore, after the mineral species is preliminarily determined, the method can further assist in researching the mineral by laser Raman, LA-ICP-MS and the like.
Compared with the prior art, the invention has the following advantages:
the invention designs the alpha track etching experiment by utilizing the characteristic that the mineral contains U, Th elements, can quickly and efficiently search and position the target mineral by matching with an optical microscope and a detecting instrument, greatly reduces the workload of searching the target mineral, shortens the working time, and prepares for subsequent electron probe experiments, LA-ICP-MS experiments and SIMS experiments.
Drawings
FIG. 1 is a photograph of marked α track etch spots in a substrate under an optical microscope;
FIG. 2 is a photograph of the film (a, b, c) and the probe sheet (a ', b ', c ') at the corresponding etching points under an optical microscope;
fig. 3 is a back scattering picture of a uranium-thorium element-rich mineral.
In fig. 3, 1 represents bastnaesite, 2 represents a niobium-rich titanium-containing heavy rare earth mineral, 3 represents a niobium-rich uranium-containing ferrotitanium oxide, 4 represents biotite, 5 represents uranium-rich thorite, 6 represents zircon, 7 represents potash feldspar, 8 represents thoriated zircon, 9 represents pyrite, 10 represents crystalline uranium ore, 11 represents a W-containing niobate mineral, 12 represents a yttrium-rich titanium niobate mineral, 13 represents a complex rare earth fluorocarbon mineral, 14 represents scheelite, 15 represents quartz, and 16 represents apatite.
Detailed Description
The invention will be further described with reference to examples of embodiments shown in the drawings to which the invention is attached. However, the present invention is not limited to the following examples. The implementation conditions adopted in the embodiments can be further adjusted according to different requirements of specific use, and the implementation conditions not mentioned are conventional conditions in the industry. The technical features of the embodiments of the present invention may be combined with each other as long as they do not conflict with each other.
Example 1
In the present example, all the ore samples were collected from the gathering tungsten mine tunnel, all the testing works were performed in the nuclear resource and environmental national key laboratory of the university of eastern China science and technology, and the backscattered electron image (BSE) was performed under the SEM450 field emission scanning electron microscope, under the experimental conditions of 15kV acceleration voltage and 2.0 × 10 working current-8A, the diameter of the electron beam spot was 4 μm.
Sample and test instrument and experimental method:
(1) firstly, grinding the ore into a probe sheet for later use.
(2) The film of the camera is soaked and washed by NaOH solution with the concentration of 10 percent to remove the latex film on the surface of the film, and the film which does not completely fall off can be manually rubbed off under flowing water, so as to ensure that the film on the surface layer of the film completely falls off.
(3) Washing the camera film (film base) with flowing water, cutting to a size slightly larger than that of the probe sheet, covering and fixing on the probe sheet, and scribing the sheet number and the probe sheet outline on the film base by a knife. Placing the film in a dustless, dry and normal-temperature environment, and taking down the film base for later use after the film base is irradiated for 27 days.
(4) 10g KOH, 20g NaOH and 5g KMnO were weighed4Adding 100ml of H one by one2And O, fully stirring to prepare an etching solution.
(5) The film base is individually threaded by iron wires one by one, and is placed in etching solution for full soaking, and the etching solution is continuously stirred by a glass rod in a constant-temperature water bath kettle at the temperature of 60-65 ℃, and the process lasts for about 60 minutes, so that the film base is ensured to be fully etched.
(6) And taking the film base out, soaking and washing the film base in water, washing the film base one by one under flowing water, dissolving the precipitate on the surface of the film base by using HCl solution with the volume ratio of 1:1, washing the film base under the flowing water, and airing for later use.
(7) Under an optical microscope, etch dense spots in the substrate were found, marked with a marker pen and photographed (see FIG. 1, FIGS. 2a, b, c). The corresponding position of the probe chip is marked, and then a suspected tungsten-containing mineral enriched with U, Th radioactive elements is screened in the chip by an optical microscope and photographed (figure 2).
(8) After carbon spraying, a scanning electron microscope is utilized to carry out energy spectrum analysis on the suspected tungsten-containing minerals, the W-rich minerals are screened out and marked, and back scattered electron images of characteristic minerals are collected (shown in figure 3).
The total number of the probe sheets used in this example was 7, and the etching area was generally 0.5 to 2mm at the etching concentration point 322The etching concentration points have different shapes and sizes and different densities (such as figure 1, figure 2a, figure 2b and figure 2c), 37 minerals rich in radioactive elements are defined in a circle after microscopic examination (such as figure 2a ', figure 2 b' and figure 2c), a back scattering picture is taken under a scanning electron microscope after carbon spraying (such as figure 3), and an energy spectrum is developedThe measurement results are shown in figure 3, and the energy spectrum semi-quantitative test data of the tungsten-containing mineral 17 are shown in table 1.
TABLE 1 semi-quantitative test data (Wt%)
After preliminary calculation, it can be seen that tungsten-containing ore species in the poly-source tungsten ore are abundant, and besides common wolframite and scheelite, at least 4 kinds of tungsten-containing or tungsten-rich niobate minerals exist.
In addition, radioactive element-rich minerals such as uranium and thorium, such as zircon, thorite, apatite, monazite, niobium-and titanium-rich heavy rare earth minerals, rare earth-rich fluorite, and crystalline uranium ore, were found near the etching concentration point (table 2).
TABLE 2 semi-quantitative test data (Wt%) of other mineral energy spectra containing rare earth, niobium and zirconium
Note: the "-" in tables 1 and 2 indicates that the content is below the detection limit of the spectrum and that carbon is not involved in the content.
The invention utilizes the alpha track etching experiment to match with the optical microscope and the scanning electron microscope energy spectrum experiment to search for the tungsten-containing mineral, the alpha track etching experiment is carried out on 7 slices to search for a track etching concentration point 32, after the scanning electron microscope is used for further inspection, the existence of various tungsten-containing niobate minerals is determined, and according to the semi-quantitative determination result, the roughly determined tungsten-containing minerals comprise: scheelite, wolframite, and at least 4 different types of tungsten-containing and tungsten-rich niobate minerals (e.g., table 1), and rare, rare earth and uranium-thorium element-rich minerals such as zircon, niobium tantalite, crystalline uranium, thorite, rare earth fluorocarbon salt minerals, and the like have been discovered. The preliminary spectral data are not enough to accurately identify the mineral species, but are enough to effectively locate the target mineral for the development of subsequent other experiments (such as mineral in-situ LA-ICP-MS/SIMS trace elements or chronology research). The method greatly reduces the workload of searching the tungsten-containing minerals, shortens the working time, and is a means for quickly and efficiently searching and positioning the tungsten-containing minerals.
In summary, the embodiments of the present invention demonstrate that minerals in ores can be located through α track etching, minerals containing uranium and/or thorium can be located mainly, and tungsten-rich minerals and/or minerals containing rare earth metals can be located further, which can be used as an auxiliary research means for related mineral research.
The present invention has been described in detail in order to enable those skilled in the art to understand the invention and to practice it, and it is not intended to limit the scope of the invention, and all equivalent changes and modifications made according to the spirit of the present invention should be covered by the present invention.
Claims (10)
1. A method for locating minerals in an ore by utilizing alpha track etching, which is characterized by comprising the following steps: the method comprises the following steps:
(1) preparing the ore into a probe sheet;
(2) removing the film on the surface of the camera film;
(3) covering the camera film processed in the step (2) on the probe sheet prepared in the step (1), and then irradiating;
(4) taking down the camera film irradiated in the step (3) from the probe sheet, etching by using an etching solution, and then cleaning;
(5) searching for etching dense points of the camera film cleaned in the step (4) under an optical microscope and marking the points;
(6) marking the corresponding positions of the probe sheet according to the etching dense points on the camera film marked in the step (5), and analyzing the mineral components at the marked positions on the probe sheet by using a detecting instrument to confirm the mineral types.
2. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: the mineral is a mineral with the mass content of uranium oxide being less than or equal to 1%, or a mineral with the mass content of thorium oxide being less than or equal to 1%, or a mineral with the total mass content of uranium oxide and thorium oxide being less than or equal to 1%.
3. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: the grain size of the mineral is 2-100 mu m.
4. A method for locating minerals in ore using alpha track etching according to any one of claims 1 to 3, wherein: the mineral is a tungsten-rich mineral and/or a rare earth metal-containing mineral.
5. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: and (4) controlling the irradiation time of the step (3) to be 25-30 days.
6. The method for locating minerals in ore by utilizing α track etching as claimed in claim 1, wherein the etching solution used in step (4) comprises 5-15 wt% KOH, 10-20 wt% NaOH, 2-5 wt% KMnO4And 70-80 wt% of water.
7. The method for locating minerals in ore by utilizing α track etching as claimed in claim 6, wherein the etching solution used in step (4) comprises 6-9 wt% KOH, 12-16 wt% NaOH, 3-4.5 wt% KMnO4And 72 to 78 wt% of water.
8. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: in the step (4), the etching temperature is 60-65 ℃, and the etching time is 50-70 min.
9. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: the detecting instrument comprises one or more of a probe and a scanning electron microscope.
10. The method of locating minerals in an ore using alpha track etching as claimed in claim 1 wherein: and (6) after spraying carbon or gold on the marked part of the probe sheet, carrying out energy spectrum analysis on the mineral at the marked part by using a scanning electron microscope, screening and marking the mineral, and simultaneously collecting a back scattered electron image of the mineral.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010650608.4A CN111781218A (en) | 2020-07-08 | 2020-07-08 | Method for positioning minerals in ore by utilizing alpha track etching |
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| CN202010650608.4A CN111781218A (en) | 2020-07-08 | 2020-07-08 | Method for positioning minerals in ore by utilizing alpha track etching |
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| CN116609421A (en) * | 2023-07-17 | 2023-08-18 | 中国科学院青藏高原研究所 | Annual survey method based on monazite fission track |
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