CN111723005A - Configuration method of automatic test software of test system - Google Patents
Configuration method of automatic test software of test system Download PDFInfo
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- CN111723005A CN111723005A CN202010446177.XA CN202010446177A CN111723005A CN 111723005 A CN111723005 A CN 111723005A CN 202010446177 A CN202010446177 A CN 202010446177A CN 111723005 A CN111723005 A CN 111723005A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/445—Program loading or initiating
- G06F9/44505—Configuring for program initiating, e.g. using registry, configuration files
- G06F9/4451—User profiles; Roaming
Abstract
The invention discloses a configuration method of automatic test software of a test system, which comprises the following steps: s1: storing automatic test configuration data in a configuration file, and storing the configuration file in a preset storage area, wherein the automatic test configuration data comprises test steps arranged according to a preset sequence, setting parameters of each test step and test time of each test step; s2: when the automatic test software is started, reading a configuration file from a preset storage area, and loading automatic test configuration data in the configuration file; s3: and when the automatic test software is operated, automatically setting corresponding test equipment according to the setting parameters of each test step according to the sequence of each test step and continuing the test time. The test results of each test step are respectively stored in different names; if the automatic test configuration data contains a loop test value, a predetermined time is spaced for the loop test. The invention can improve the universality of the software and reduce the secondary development cost of the software.
Description
Technical Field
The invention relates to the technical field of automatic testing, in particular to a configuration method of automatic testing software of a testing system.
Background
With the progress of computer technology, intelligent instruments, information management and other technologies, the development of automatic test technology, computer technology, intelligent instrument technology and the like, computer hardware and software and the development of traditional test theory, test technology and test method are changed. The development of computers enhances the functions of measurement and instruments, improves the efficiency and forms a plurality of convenient and practical automatic test systems.
However, the conventional test of factory is an automatic test which can only realize a single test, and has some disadvantages:
1. after the automatic test software is written, the test program is solidified, and for different test products, the automatic test software may face the difficult problem of being unusable as long as the test methods are the same and the parameters are set differently;
2. aiming at different parameter settings and tests with the same test method, secondary development of automatic test software is required, which is equivalent to re-developing one automatic test software;
3. although the secondary developed automatic test software can be used, the adjustment is carried out through a reserved window on a software interface, and the secondary developed automatic test software is complex;
4. the test of products such as long-term, timing, uninterrupted, step-by-step, repeated and the like can not be carried out,
therefore, in the prior art, when tests with the same test method and different parameter settings are performed, the program code of automatic test software may become very long, and the software development period is increased doubly, so that a long way is needed to implement full-automatic tests.
Disclosure of Invention
The invention aims to provide a configuration method for automatically testing software of a test system, which can improve the universality of the software and reduce the secondary development cost of the software.
In order to solve the technical problems, the invention adopts a technical scheme that: the configuration method for the automatic test software of the test system comprises the following steps: s1: storing automatic test configuration data in a configuration table, and storing the configuration table in a preset storage area, wherein the automatic test configuration data comprises test steps arranged according to a preset sequence, setting parameters of each test step and test time of each test step; s2: when the automatic test software is started, reading the configuration table from the preset storage area, and loading the automatic test configuration data in the configuration table; s3: and when the automatic test software is operated, automatically setting corresponding test equipment according to the setting parameters of each test step according to the sequence of each test step and continuing the test time.
Preferably, the step S2 further includes: and storing the automatic test configuration data in a cache region so as to be directly loaded when the same test is carried out next time, wherein the cache region is a default storage region of the automatic test software.
Preferably, the configuration file is a database, a text document or a table.
Preferably, when the configuration file is a table, the configuration file is an excel or wps table.
Preferably, the step S3 further includes: and when the setting parameter of the current testing step is null or a specific character and the testing time is null or a specific character, ending the test.
Preferably, the step S3 further includes: and when the setting parameter of the current testing step is null or a specific character and the testing time is not null or the specific character, not executing the current testing step and continuing the testing time.
Preferably, the configuration method further includes: s4: and respectively storing the test result of each test step by different names.
Preferably, the configuration method further includes: s5: and judging whether the automatic test configuration data comprises a cycle test value, if so, repeating the steps S3 and S4 at preset time intervals until all the test steps are finished.
Different from the prior art, the invention has the beneficial effects that: the automatic test software becomes more flexible and universal, and the development period of the software can be shortened.
Drawings
FIG. 1 is a flow chart of a configuration method of automatic test software of a test system according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a configuration file when the configuration method according to the embodiment of the present invention is applied to an antenna pattern automatic test.
Fig. 3 is a schematic diagram of a configuration file when the configuration method according to the embodiment of the present invention is applied to an automatic test of a power module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, the configuration method of the automatic test software of the test system according to the embodiment of the present invention includes the following steps:
s1: storing the automatic test configuration data in a configuration file, and storing the configuration file in a preset storage area, wherein the automatic test configuration data comprises test steps arranged according to a preset sequence, setting parameters of each test step and test time of each test step.
The configuration file can be a database, a text document or a table, and when the configuration file is a table, the configuration file is an excel or wps table. The preset storage area is an arbitrary storage position in the computer.
S2: and when the automatic test software is started, reading the configuration file from the preset storage area, and loading the automatic test configuration data in the configuration file.
In this embodiment, step S2 further includes: and storing the automatic test configuration data in a cache region so as to be directly loaded when the same test is carried out next time, wherein the cache region is a default storage region of the automatic test software.
Wherein, in general, the cache area cannot change the storage position.
S3: and when the automatic test software is operated, automatically setting corresponding test equipment according to the setting parameters of each test step according to the sequence of each test step and continuing the test time.
In this embodiment, step S3 further includes: when the set parameters of the current testing step are null or specific characters and the testing time is null or specific characters, ending the test; and when the setting parameter of the current testing step is null or a specific character and the testing time is not null or the specific character, not executing the current testing step and continuing the testing time.
The setting parameters correspond to the corresponding test equipment, and the test equipment needing to be set and how to set the test equipment can be determined through the setting parameters.
In order to facilitate management and classification of the test results, in this embodiment, the configuration method further includes:
s4: and respectively storing the test result of each test step by different names.
Further, the configuration method further comprises: s5: and judging whether the automatic test configuration data comprises a cycle test value, if so, repeating the steps S3 and S4 at preset time intervals until all the test steps are finished.
The following describes in detail a configuration method of automatic test software of a test system according to an embodiment of the present invention with reference to fig. 2 and 3.
Fig. 2 is a schematic diagram of a configuration file when the configuration method according to the embodiment of the present invention is applied to an antenna pattern automatic test. The automatic test configuration data is stored in an Excel table, the automatic test configuration data only comprises 7 test steps in the example, 65536 test steps can be set in other examples at most, and the automatic test configuration data can realize the control of 3 turntables (an X-axis turntable, a Y-axis turntable and a Z-axis turntable), the control of 2 signal sources (a transmitting source and a local vibration source) and the control of 1 spectrometer. When step S3 is performed, the method specifically includes:
step 1: and setting the X-axis turntable to rotate from the current position to the 0-degree position at the speed of 91 degrees/minute and setting the Y-axis turntable to rotate from the current position to the 0-degree position at the speed of 91 degrees/minute, namely initializing the turntable. It should be noted that the test time in step 1 is the time taken for the X-axis turret to rotate from the current position to the 0 degree position at a speed of 91 degrees/min.
Step 2: the frequency of the spectrometer is set to be 25.5Ghz, the frequency of the emission source is set to be 25.6GHz, and the frequency of the local vibration source is set to be 10.3 GHz. The spectrometer starts scanning, the X-axis turntable rotates from 0 degree to 180 degrees at 91 degree/min, and the spectrometer stops scanning when the turntable rotates to 180 degrees. The test results are stored under the name "SPF 1". It should be noted that the test time in step 2 is the time taken for the X-axis turret to rotate from 0 to 180 at 91 degrees/min.
And 3, step 3: the frequency of the spectrometer is set to be 26.5Ghz, the frequency of the emission source is set to be 26.6GHz, and the frequency of the local vibration source is set to be 10.4 GHz. The spectrometer starts scanning, the X-axis turntable rotates from 180 degrees to 0 degree at 91 degrees/min, and the spectrometer stops scanning when the turntable rotates to 0 degree. The test results are stored under the name "SPF 2". It should be noted that the test time in step 3 is the time taken for the X-axis turret to rotate from 180 degrees to the 0 degree position at a speed of 91 degrees/min.
And 4, step 4: the Y-axis turntable is set to rotate from the current position to the 90-degree position at a speed of 91 degrees/min. It should be noted that the test time at step 4 is the time taken for the Y-axis turret to rotate from the current position to the 90-degree position at a speed of 91 degrees/min.
And 5, step 5: the frequency of the spectrometer is set to be 25.5Ghz, the frequency of the emission source is set to be 25.6GHz, and the frequency of the local vibration source is set to be 10.3 GHz. The spectrometer starts scanning, the X-axis turntable rotates from 0 degree to 180 degrees at 91 degree/min, and the spectrometer stops scanning when the turntable rotates to 180 degrees. The test results are stored under the designation "CZF 1". It should be noted that the test time in step 5 is the time taken for the X-axis turret to rotate from 0 to 180 at 91 deg/min.
And 6, step 6: the frequency of the spectrometer is set to be 26.5Ghz, the frequency of the emission source is set to be 26.6GHz, and the frequency of the local vibration source is set to be 10.4 GHz. The spectrometer starts scanning, the X-axis turntable rotates from 180 degrees to 0 degree at 91 degrees/min, and the spectrometer stops scanning when the turntable rotates to 0 degree. The test results are stored under the designation "CZF 2". It should be noted that the test time in step 6 is the time taken for the X-axis turret to rotate from 180 degrees to the 0 degree position at a speed of 91 degrees/min.
And 7, step 7: and setting the Y-axis rotary table to rotate from 90 degrees to 0 degree at the speed of 91 degrees/minute, namely, the rotary table returns to zero, namely, the test is finished.
Fig. 3 is a schematic diagram of a configuration file when the configuration method according to the embodiment of the present invention is applied to an automatic test of a power module. The automatic test configuration data is stored in an Excel table, in the example, the automatic test configuration data only comprises 4 test steps, in other examples, 65536 test steps can be set at most, and the test items in the figure represent the test steps. The automatic test configuration data can realize the control of 12-path rear-stage load and the control of 4-path input power supply. When step S3 is performed, the method specifically includes:
step 1: (product No. 2010.001 tested at-40 deg.C) first turning on the 1 st input power supply, turning on the 2 nd input power supply at 3 s, turning on the 3 rd and 4 th input power supplies at 6 s, testing the output voltage in no-load, and recording; opening the 'load on' tests of the electronic loads of the 1 st path, the 2 nd path, the 7 th path and the 8 th path at the same time at the 11 th second, and recording the output voltage; disconnecting the load test at the 21 st second, opening the short circuit test, and recording the output voltage; and (3) disconnecting the 1 st path, the 2 nd path, the 7 th path and the 8 th path of the electronic load from the short circuit and on-load tests at the 23 th second, and simultaneously disconnecting the input power supply. The test results were stored under the designation "Low temperature-40 ℃ 2010.001". After the test of step 1 is completed, the corresponding test time is 23 seconds, and after waiting for 60 seconds (i.e. 1 minute), the test of step 2 is performed, i.e. the product 2010.001 is tested at low temperature.
Step 2: (product No. 2010.002 on test machine at-40 ℃ C.) the procedure was as described in "step 1", and the test results were stored under the designation "Low-40 ℃ 2010.002". After the 2 nd test is finished, the corresponding test time is 23 seconds, and after 7200S (namely 2 hours), the 3 rd test is carried out, namely, the 2010.002 # product is tested at low temperature.
And 3, step 3: the test (product No. 2010.001 at high temperature +60 ℃ C.) was carried out as described in step 1, and the test results were stored under the designation "high temperature +60 ℃ 2010.001". After the 3 rd test is finished, the corresponding test time is 23 seconds, and after waiting for 60 seconds (namely 1 minute), the 4 th test is carried out, namely, the product No. 2010.001 is tested at high temperature.
And 4, step 4: the test (product No. 2010.002 at high temperature +60 ℃ C.) was carried out as described in step 1, and the test results were stored under the designation "high temperature +60 ℃ 2010.002". And (6) completing the test. The corresponding test time was 23 seconds, i.e. product No. 2010.002 was tested at elevated temperature.
Through the mode, the configuration method of the automatic test software of the test system provided by the embodiment of the invention aims at different test products, the automatic test software with different parameter settings can be applied as long as the test methods are the same, the automatic test software becomes more flexible and universal, the development period of the software can be shortened, the method has the advantages of rapidness, simplicity, high efficiency, flexibility and applicability, the universality of the software can be improved, and the secondary development cost of the software can be reduced.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (8)
1. A configuration method for automatic test software of a test system is characterized by comprising the following steps:
s1: storing automatic test configuration data in a configuration file, and storing the configuration file in a preset storage area, wherein the automatic test configuration data comprises test steps arranged according to a preset sequence, setting parameters of each test step and test time of each test step;
s2: when the automatic test software is started, reading the configuration file from the preset storage area, and loading the automatic test configuration data in the configuration file;
s3: and when the automatic test software is operated, automatically setting corresponding test equipment according to the setting parameters of each test step according to the sequence of each test step and continuing the test time.
2. The configuration method according to claim 1, wherein the step S2 further comprises:
and storing the automatic test configuration data in a cache region so as to be directly loaded when the same test is carried out next time, wherein the cache region is a default storage region of the automatic test software.
3. The configuration method of claim 1, wherein the configuration file is a database, a text document, or a table.
4. The configuration method according to claim 1, wherein when the configuration file is a table, the configuration file is an excel or wps table.
5. The configuration method according to claim 1, wherein the step S3 further comprises:
and when the setting parameter of the current testing step is null or a specific character and the testing time is null or a specific character, ending the test.
6. The configuration method according to claim 1, wherein the step S3 further comprises:
and when the setting parameter of the current testing step is null or a specific character and the testing time is not null or the specific character, not executing the current testing step and continuing the testing time.
7. The configuration method according to claim 1, further comprising:
s4: and respectively storing the test result of each test step by different names.
8. The configuration method according to claim 1, further comprising:
s5: and judging whether the automatic test configuration data comprises a cycle test value, if so, repeating the steps S3 and S4 at preset time intervals until all the test steps are finished.
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| CN113806362A (en) * | 2021-08-23 | 2021-12-17 | 网易（杭州）网络有限公司 | Test record information generation method and device, computer equipment and storage medium |
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