CN111722281A - Foundation settlement calculation method based on surface wave exploration technology - Google Patents
Foundation settlement calculation method based on surface wave exploration technology Download PDFInfo
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- CN111722281A CN111722281A CN202010524774.XA CN202010524774A CN111722281A CN 111722281 A CN111722281 A CN 111722281A CN 202010524774 A CN202010524774 A CN 202010524774A CN 111722281 A CN111722281 A CN 111722281A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V1/00—Seismology; Seismic or acoustic prospecting or detecting
- G01V1/28—Processing seismic data, e.g. analysis, for interpretation, for correction
- G01V1/30—Analysis
- G01V1/306—Analysis for determining physical properties of the subsurface, e.g. impedance, porosity or attenuation profiles
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- E—FIXED CONSTRUCTIONS
- E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
- E02D—FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
- E02D33/00—Testing foundations or foundation structures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V1/00—Seismology; Seismic or acoustic prospecting or detecting
- G01V1/28—Processing seismic data, e.g. analysis, for interpretation, for correction
- G01V1/30—Analysis
- G01V1/303—Analysis for determining velocity profiles or travel times
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V2210/00—Details of seismic processing or analysis
- G01V2210/60—Analysis
- G01V2210/62—Physical property of subsurface
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V2210/00—Details of seismic processing or analysis
- G01V2210/60—Analysis
- G01V2210/62—Physical property of subsurface
- G01V2210/622—Velocity, density or impedance
- G01V2210/6222—Velocity; travel time
Abstract
The invention discloses a foundation settlement calculation method based on a surface wave exploration technology, which comprises the following steps: performing field surface wave exploration, acquiring and processing transient surface wave data, determining the foundation settlement influence depth, dividing soil layers, determining the thickness of each layer of soil, the number of the soil layers and the surface wave speed of each layer of soil in the foundation settlement influence depth range, and determining the type of each layer of soil; respectively calculating a foundation depth influence coefficient, an additional stress coefficient of each layer of soil body caused by foundation stress, each soil layer influence factor in a foundation settlement influence depth range and a settlement experience correction coefficient; and finally calculating to obtain the basic final sedimentation amount. The method has the advantages of simple and quick calculation process, high field adaptability, nondestructive detection, simple equipment, low investigation cost and high investigation efficiency, the required parameters are all from transient surface wave investigation, drilling, sounding and the like are not required, and the method still has higher calculation precision without using empirical correction coefficients, thereby having greater popularization and use values and wide application prospects.
Description
Technical Field
The invention belongs to the field of engineering geological exploration, and particularly relates to a foundation settlement calculation method based on a surface wave exploration technology.
Background
The calculation of the basic settlement is a key link of engineering design of railways, highways, industrial and civil buildings and the like, at present, the basic settlement is mainly calculated by adopting a layering summation method, and the method needs to provide calculation parameters such as the thickness, the compression modulus, the additional stress distribution and the like of each layer of soil within a calculation depth range.
The soil thickness and the compression modulus are obtained by in-situ testing methods such as a drilling sampling room test, a pre-drilling type lateral pressure test, a static sounding test and the like. The drilling sampling period is long, the cost is high, the implementation difficulty is high due to the fact that the traffic difficulty, the environmental protection requirement and the compensation expense are high in the areas such as hills, forest areas and farmlands, the sampling of coarse particle soil strata is difficult, and the compression modulus is difficult to obtain through an indoor test; the pre-drilling type side pressure also needs to be formed, so that the cost is high; the static sounding is mainly suitable for fine-particle soil, and has poor investigation effect on coarse-particle soil layers such as sandy soil, gravel soil and the like.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a foundation settlement calculation method based on a surface wave exploration technology. The surface wave is a geophysical prospecting method, has the characteristics of no damage, strong field adaptability and the like, the wave speed of the characteristic parameter of the surface wave is closely related to the physical and mechanical properties of the soil body, the foundation soil is obtained under the conditions that the in-situ stress state and the natural water content are unchanged, and the primary structure is not disturbed, and compared with a test in a drilling and sampling chamber, the surface wave can more accurately and truly reflect the physical and mechanical properties of the foundation soil body.
The technical purpose of the invention is realized by the following technical scheme.
A foundation settlement calculation method based on a surface wave exploration technology comprises the following steps:
step 1: carrying out field surface wave exploration and collecting transient surface wave data;
in the step 1, a seismometer is used for carrying out surface wave exploration, after the detectors are arranged, the detectors are fixed, the shot points start to move from one end of the arrangement of the detectors to a position with a certain horizontal distance away from the arrangement of the detectors, the moving track of the shot points is parallel to the arrangement of the detectors, the moving distance of each time of the shot points is equal to the distance between the detectors (namely the track distance), and transient surface wave data are collected once when the shot points move once until the shot points move to the position with the same horizontal distance away from the arrangement of the detectors at the other end of the arrangement of the detectors.
Step 2: transient surface wave data processing is carried out to obtain surface wave velocity distribution within a target depth range;
in step 2, each detector is taken as a common central point, all transient surface wave data taking the detector as the common central point are extracted and superposed, and surface wave velocity distribution in a target depth range is obtained through frequency dispersion curve extraction and velocity inversion. .
And step 3: determining the influence depth Z of the foundation settlement;
in step 3, the depth of influence Z of the foundation settlement is determined by the following procedure:
(1) when the adjacent load influence is avoided and the foundation width is within the range of 1-30 m, the foundation settlement influence depth Z is B (2.5-0.4lnB), wherein B is the base width and the unit is m; when the stratum with the wave speed larger than 300m/s exists in the calculated depth range, the foundation settlement influence depth Z is the distance from the substrate to the surface of the stratum;
(2) in the cases except for (1), the foundation settlement influence depth Z is determined by trial calculation according to a stress ratio method, which is specifically as follows: from the bottom of the foundation from the top to the bottom, when a stress sigma is applied at a certain depthZStress sigma of self weight of soil bodycSatisfy sigmaZ/σcWhen the depth is less than or equal to 0.2, the distance from the substrate to the depth is the foundation settlement influence depth Z.
And 4, step 4: dividing soil layers according to the change of the surface wave velocity along with the depth, determining the thickness delta Z of each layer of soil, the number k of strata and the surface wave velocity v of each layer of soil within the range of the foundation settlement influence depth Z, and determining the type of each layer of soil.
And 5: calculating a basic depth influence coefficient lambda;
in step 5, formula λ ═ 1.05(σ'v0/. DELTA.p) calculating a base depth influence coefficient lambda; wherein, σ'v0The effective stress of the soil body at the base in an initial state is expressed in MPa; Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions; wherein, when the lambda is less than 0.5, the lambda is 0.5.
Step 6: calculating additional stress coefficient K of i-th layer soil body caused by base stressszi；
In step 6, the additional stress coefficient K of the i-th layer soil body caused by the base stresssziAccording to the Boussinesq theory, the stress distribution is determined by looking up a table according to the stress distribution type of the substrate (rectangular distribution, circular distribution, strip distribution and the like).
And 7: determining soil layer influence factors a and b within a foundation settlement influence depth range;
in step 7, the soil layer influence factors a and b in the foundation settlement influence depth range are determined by the following method: when the i-th layer soil is clay, ai＝1.32241，bi0.00655; when the i-th layer soil is sandy soil, ai＝0.015，bi1.21; when the i-th layer soil is gravelly soil, ai＝0.329，bi＝0.812。
And 8: according to the formula
Calculating a base final sedimentation amount, wherein:
s is the basic final sedimentation amount in mm;
psi is a sedimentation empirical correction coefficient;
λ is a base depth influence coefficient;
Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions;
k is the number of the ground layers in the depth range of influence of the foundation settlement;
Ksziadding a stress coefficient to the i-th layer of soil body caused by the base pressure;
e is a natural constant;
viis the surface of the i-th layer of soil bodyWave velocity in m/s;
ai、bithe ith soil layer influence factor in the foundation settlement influence depth range is used;
ΔZithe thickness of the i-th layer of soil is m;
in step 8, the sedimentation empirical correction coefficient ψ is determined empirically from regional sedimentation observations, and ψ is taken to be 1.0 in an inexperienced region.
Compared with the prior art, the foundation settlement calculation method based on the surface wave exploration technology directly applies the transient surface wave test result to carry out foundation settlement calculation, the calculation process is simple and quick, the parameters required by calculation are all from transient surface wave exploration, drilling, sounding and the like are not needed, the inaccuracy of the test result caused by soil disturbance in drilling sampling and indoor geotechnical tests can be avoided, the defect that sounding is difficult to penetrate through coarse particle stratums is overcome, and the foundation settlement calculation method based on the surface wave exploration technology has obvious advantages particularly in the areas with difficult drilling and sounding implementation, such as hills and forest regions. The method has the advantages of strong field adaptability, nondestructive detection, small field damage, simple used equipment, low exploration cost, high exploration efficiency, higher calculation precision without using empirical correction coefficients, higher popularization and use values and wide application prospect.
Drawings
FIG. 1 is a flow chart of the method for calculating the basis settlement based on the surface wave exploration technology.
Detailed Description
As shown in FIG. 1, the method for calculating the foundation settlement based on the surface wave exploration technology comprises the following steps:
step 1: the method comprises the following steps of utilizing a seismograph to conduct field surface wave exploration and collecting transient surface wave data, wherein the specific process is as follows: after the detectors are arranged, the detectors are fixed, the shot points start to move from one end of the detector arrangement to a position with a certain horizontal distance away from the detector arrangement, the moving track of the shot points is parallel to the detector arrangement, the moving distance of the shot points each time is equal to the distance between the detectors (namely, the track distance), and transient surface wave data are collected once when the shot points move once until the shot points move to the position with the same horizontal distance away from the detector arrangement at the other end of the detector arrangement.
Step 2: and (3) processing the transient surface wave data acquired in the step (1), taking each detector as a common central point, extracting all transient surface wave data taking the detector as the common central point, superposing, and obtaining surface wave velocity distribution in a target depth range through dispersion curve extraction and velocity inversion. And step 3: determining the influence depth Z of the foundation settlement, wherein the specific process is as follows:
(1) when the adjacent load influence is avoided and the foundation width is within the range of 1-30 m, the foundation settlement influence depth Z is B (2.5-0.4lnB), wherein B is the base width and the unit is m; when the stratum with the wave speed larger than 300m/s exists in the calculated depth range, the foundation settlement influence depth Z is the distance from the substrate to the surface of the stratum;
(2) in the cases except for (1), the foundation settlement influence depth Z is determined by trial calculation according to a stress ratio method, which is specifically as follows: from the bottom of the foundation from the top to the bottom, when a stress sigma is applied at a certain depthZStress sigma of self weight of soil bodycSatisfy sigmaZ/σcWhen the depth is less than or equal to 0.2, the distance from the substrate to the depth is the foundation settlement influence depth Z.
And 4, step 4: dividing soil layers according to the change of the surface wave velocity along with the depth, determining the thickness delta Z of each layer of soil, the number k of strata and the surface wave velocity v of each layer of soil within the range of the foundation settlement influence depth Z, and determining the type of each layer of soil.
And 5: formula λ ═ 1.05(σ'v0/. DELTA.p) calculating a base depth influence coefficient lambda; wherein, σ'v0The effective stress of the soil body at the base in an initial state is expressed in MPa; Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions; wherein, when the lambda is less than 0.5, the lambda is 0.5.
Step 6: according to the Boussinesq theory, determining the additional stress coefficient K of the soil body at the i-th layer caused by the base stress according to the base stress distribution type (rectangular distribution, circular distribution, bar distribution and the like) table lookupszi(ii) a Due to additional stress coefficient KsziGradually attenuating along the depth direction, vertically layering soil body in settlement calculation, and enlarging soil layer unit when the same soil layer is thickDividing the number of layers, and obtaining additional stress coefficient K at the central position of the soil layer unitsziAs the calculation basis of the additional stress of the soil layer.
And 7: determining soil layer influence factors a and b in a foundation settlement influence depth range, specifically as follows: when the i-th layer soil is clay, ai＝1.32241，bi0.00655; when the i-th layer soil is sandy soil, ai＝0.015，bi1.21; when the i-th layer soil is gravelly soil, ai＝0.329，bi＝0.812。
And 8: according to the formula
Calculating a base final sedimentation amount, wherein:
s is the basic final sedimentation amount in mm;
psi is a sedimentation empirical correction coefficient, the sedimentation empirical correction coefficient psi is determined according to the sedimentation observation data of the region and experience, and psi is 1.0 in an inexperienced region;
λ is a base depth influence coefficient;
Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions;
k is the number of the ground layers in the depth range of influence of the foundation settlement;
Ksziadding a stress coefficient to the i-th layer of soil body caused by the base pressure;
e is a natural constant;
vithe surface wave speed of the i-th layer of soil is in m/s;
ai、bithe ith soil layer influence factor in the foundation settlement influence depth range is used;
ΔZithe thickness of the i-th layer of soil is m.
The basic settlement calculation method based on the surface wave exploration technology has the advantages of simple and quick calculation process, high field adaptability, nondestructive detection, small damage to the field, simple used equipment, low exploration cost, high exploration efficiency, higher calculation precision under the condition of not using empirical correction coefficients, higher popularization and use values and wide application prospect, and parameters required by calculation are all from transient surface wave exploration without drilling, sounding and the like.
Claims (8)
1. A foundation settlement calculation method based on a surface wave exploration technology is characterized by comprising the following steps:
step 1: carrying out field surface wave exploration and collecting transient surface wave data;
step 2: transient surface wave data processing is carried out to obtain surface wave velocity distribution within a target depth range;
and step 3: determining the influence depth Z of the foundation settlement;
and 4, step 4: dividing soil layers according to the change of the surface wave velocity along with the depth, determining the thickness delta Z of each layer of soil, the number k of strata and the surface wave velocity v of each layer of soil within the range of the foundation settlement influence depth Z, and determining the type of each layer of soil;
and 5: calculating a basic depth influence coefficient lambda;
step 6: calculating additional stress coefficient K of i-th layer soil body caused by base stressszi；
And 7: determining soil layer influence factors a and b within a foundation settlement influence depth range;
and 8: according to the formula
Calculating a base final sedimentation amount, wherein:
s is the basic final sedimentation amount in mm
Psi is a sedimentation empirical correction coefficient;
λ is a base depth influence coefficient;
Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions;
k is the number of the ground layers in the depth range of influence of the foundation settlement;
Ksziadding a stress coefficient to the i-th layer of soil body caused by the base pressure;
e is a natural constant;
viof the i-th soil bodySurface wave velocity in m/s
ai、biThe ith soil layer influence factor in the foundation settlement influence depth range is used;
ΔZithe thickness of the i-th layer of soil is m.
2. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein: in the step 1, a seismometer is used for carrying out surface wave exploration, after the detectors are arranged, the detectors are fixed, the shot points start to move from one end of the arrangement of the detectors to a position with a certain horizontal distance away from the arrangement of the detectors, the moving track of the shot points is parallel to the arrangement of the detectors, the moving distance of each time of the shot points is equal to the distance between the detectors, and transient surface wave data are collected once when the shot points move once until the shot points move to the position with the same horizontal distance away from the arrangement of the detectors at the other end of the arrangement of the detectors.
3. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein: in step 2, each detector is taken as a common central point, all transient surface wave data taking the detector as the common central point are extracted and superposed, and surface wave velocity distribution in a target depth range is obtained through frequency dispersion curve extraction and velocity inversion.
4. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein in step 3, the foundation settlement influence depth Z is determined by the following process:
(1) when the adjacent load influence is avoided and the foundation width is within the range of 1-30 m, the foundation settlement influence depth Z is B (2.5-0.4lnB), wherein B is the base width and the unit is m; when the stratum with the wave speed larger than 300m/s exists in the calculated depth range, the foundation settlement influence depth Z is the distance from the substrate to the surface of the stratum;
(2) in the cases except for (1), the foundation settlement influence depth Z is determined by trial calculation according to a stress ratio method, which is specifically as follows: from the bottom of the foundation from the top to the bottom, when a stress sigma is applied at a certain depthZStress sigma of self weight of soil bodycSatisfy sigmaZ/σcWhen the depth is less than or equal to 0.2, the distance from the substrate to the depth is the foundation settlement influence depth Z.
5. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein: in step 5, formula λ ═ 1.05(σ'v0/. DELTA.p) calculating a base depth influence coefficient lambda; wherein, σ'v0The effective stress of the soil body at the base in an initial state is expressed in MPa; Δ p is the substrate additional stress in MPa corresponding to the quasi-permanent combination of actions; wherein, when the lambda is less than 0.5, the lambda is 0.5.
6. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein: in step 6, the additional stress coefficient K of the i-th layer soil body caused by the base stresssziAccording to Boussinesq theory, the stress distribution is determined by looking up a table according to the substrate stress distribution type.
7. The method for calculating foundation settlement based on surface wave exploration technology according to claim 1, wherein in step 7, each soil layer influence factor a and b in the foundation settlement influence depth range is determined by the following method: when the i-th layer soil is clay, ai＝1.32241，bi0.00655; when the i-th layer soil is sandy soil, ai＝0.015，bi1.21; when the i-th layer soil is gravelly soil, ai＝0.329，bi＝0.812。
8. The method for calculating the foundation settlement based on the surface wave exploration technology as claimed in claim 1, wherein in step 8, the settlement empirical correction coefficient ψ is determined empirically from the observation data of the area settlement, and the inexperienced area is taken as ψ 1.0.
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