CN111708708A - Automatic test method and device for interval occupation logic check function - Google Patents
Automatic test method and device for interval occupation logic check function Download PDFInfo
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Abstract
The invention discloses a method and a device for automatically testing interval occupation logic check kinetic energy, which relate to the technical field of railway signal train control interlocking integrated system testing and are used for quickly improving the testing efficiency and accuracy, and the main technical scheme of the invention is as follows: obtaining a station line section sequencing table, wherein the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded; generating test instructions according to the station line section sorting table and the test items to obtain a mapping relation between each test item and each test instruction; and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation. The method and the device are applied to finishing the automatic logic check operation of the interval occupation.
Description
Technical Field
The invention relates to the technical field of railway signal train control and interlocking integrated system testing, in particular to a method and a device for automatically testing interval occupation logic check kinetic energy.
Background
Along with the high-speed development of railway construction in China, higher requirements are put forward on railway signal products. The interval occupation logic check function of a railway signal train control interlocking integrated system (TIS) product plays an active role in protecting the bad shunting problem of railway line intervals, and strict indoor test is required for ensuring the stable operation of the interval occupation logic check function.
However, in the process of indoor testing with the logic check function occupied by the interval, the testing needs to be performed manually item by item, the testing content and the repeated labor occupy a long time, the traversal testing of the equipment states of all the intervals cannot be performed, the fatigue of testers is increased due to long-time testing, the correctness of the testing result is affected, a large amount of labor cost is consumed, the efficiency is low, and the testing accuracy is low.
Disclosure of Invention
In view of the above, the present invention provides a method and an apparatus for automatically testing interval occupancy logic check function, and mainly aims to optimize the interval occupancy logic check function test so as to rapidly improve the test efficiency and accuracy.
In order to solve the above problems, the present invention mainly provides the following technical solutions:
in one aspect, the invention provides an automatic testing method for interval occupancy logic check kinetic energy, which comprises the following steps:
obtaining a station line section sequencing table, wherein the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded;
generating test instructions according to the station line section sorting table and the test items to obtain a mapping relation between each test item and each test instruction;
and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation.
Optionally, the invoking, according to a preset test sequence rule and according to the mapping relationship, a test instruction corresponding to different test items to perform an interval occupation logic check function test includes:
adding a test identifier for each test item in advance;
sequencing the test identifications according to the test requirements to obtain a test identification queue;
when a trigger execution test operation instruction is received, according to the test identifier queue, and according to the sequence from the first test identifier to the last test identifier in the queue, gradually acquiring a test item corresponding to each test identifier;
searching a test instruction corresponding to each test item according to the mapping relation;
and calling the searched test instruction to execute the test operation.
Optionally, the method further includes:
outputting a test report by collecting a test result corresponding to each test item, wherein the test report shows the operation process that the test item does not pass;
counting the number of times of failing corresponding to each test item;
sequencing the plurality of test items according to the order of the number of times of failure from high to low to obtain a test queue consisting of the plurality of test items;
and adding a test priority to each test item according to the sequence from the first bit to the last bit in the test queue, wherein the priority of the test item ranked first in the test queue is higher than the priority of the test item ranked next.
Optionally, the invoking, according to a preset test sequence rule and according to the mapping relationship, a test instruction corresponding to different test items to perform an interval occupation logic check function test includes:
and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
On the other hand, the invention also provides an automatic testing device for the interval occupation logic inspection kinetic energy, which comprises:
the acquisition unit is used for acquiring a station line section sequencing table, and the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded;
the generating unit is used for generating test instructions according to the station line section sequencing table and the test items acquired by the acquiring unit to obtain a mapping relation between each test item and each test instruction;
and the test unit is used for calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation.
Optionally, the test unit includes:
the adding module is used for adding a test identifier for each test item in advance;
the sequencing module is used for sequencing the test identifiers added by the adding module according to the test requirements to obtain a test identifier queue;
the acquisition module is used for acquiring the test items corresponding to each test identifier one by one according to the test identifier queue and the sequence from the first test identifier to the last test identifier in the queue when receiving a trigger execution test operation instruction;
the searching module is used for searching a test instruction corresponding to the test item acquired by each acquiring module according to the mapping relation;
and the calling module is used for calling the searched test instruction searched by the searching module to execute the test operation.
Optionally, the apparatus further comprises:
the output unit is used for outputting a test report by collecting a test result corresponding to each test item, and the test report shows the operation process that the test item does not pass;
the statistical unit is used for counting the number of times of non-passing corresponding to each test item;
the sequencing unit is used for sequencing the plurality of test items according to the sequence from high to low of the number of times of non-passing counted by the counting unit to obtain a test queue consisting of the plurality of test items;
and the adding unit is used for adding a test priority to each test item according to the sequence from the first bit to the last bit in the test queue obtained by the sorting unit, wherein the priority of the test item sorted in the test queue in the first order is higher than the priority of the test item sorted in the second order.
Optionally, the test unit includes:
the calling module is further configured to call test instructions corresponding to different test items to perform an interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
In yet another aspect, the present invention also provides an electronic device, including: the automatic testing method comprises a memory, a processor and a program which is stored on the memory and can run on the processor, wherein when the processor executes the program, the automatic testing method for the interval occupation logic inspection kinetic energy is realized.
In still another aspect, the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed to implement the automatic test method for checking the kinetic energy of the interval occupancy logic.
By the technical scheme, the technical scheme provided by the invention at least has the following advantages:
the invention provides a method and a device for automatically testing interval occupancy logic check kinetic energy. Compared with the prior art, the method and the device solve the problems of large labor cost consumption, low efficiency and low test accuracy in the existing interval occupation logic inspection test process, optimize the interval occupation logic inspection function test, replace manual item-by-item test with automatic test, and rapidly improve the test efficiency and accuracy.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 is a flowchart of an automatic kinetic energy testing method for interval occupancy logic check according to an embodiment of the present invention;
fig. 2 is a flowchart of another automatic kinetic energy testing method for checking interval occupancy logic according to an embodiment of the present invention;
fig. 3 is a block diagram of an automatic testing apparatus for checking kinetic energy of interval occupancy logic according to an embodiment of the present invention;
fig. 4 is a block diagram of another automatic testing apparatus for checking kinetic energy of interval occupancy logic according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
The embodiment of the invention provides an automatic testing method for interval occupancy logic check kinetic energy, which is characterized in that as shown in fig. 1, an indoor simulation testing platform is set up in advance, and then an automatic test is completed in the testing platform, and the following specific steps are provided for the embodiment of the invention:
101. obtain station circuit district section sequencing table, include at least in the station circuit district section sequencing table: the station access signal machine name, the adjacent station block partition name and the local station block partition name are obtained by the method.
In the embodiment of the present invention, first, a station line section ranking table is input to an indoor simulation test platform, the station line section ranking table is pre-programmed according to a signal plane layout diagram ranking sequence and is used for defining a vehicle station test range, as shown in the following table one, the station line section ranking table at least includes: the station entering inner side first section name, the corresponding station entering signal machine name, the adjacent station blocking partition name, the local station inter-block partition name and the like.
Table one: station line section sequencing table
In the embodiment of the present invention, the test operation of the plurality of test items is performed according to the pre-programmed station line section ranking table.
For the embodiment of the invention, after the station line section sequencing table is input into the indoor simulation test platform, the script program can be automatically triggered to check the station line section sequencing table, for example: and automatically reading the first table, popping up an alarm to 'please confirm whether the item is empty' if the first table is not filled, prompting a tester to confirm, and waiting for triggering to execute test operation according to the test item after the tester confirms that no error exists.
102. And generating a test instruction according to the station line section sorting table and the test items to obtain the mapping relation between each test item and the test instruction.
The test items are pre-programmed according to a test standard specified in "the notification of the general Chinese railway company about issuing the" temporary technical condition for logic check of train control center section ", and specifically, the pre-programmed test items may include the following:
it is first necessary to explain the words in the following test items, including: 1. the 'section traversal' is the combination condition of all sections in the same occlusion partition; 2. the equipment state: acquiring all combination conditions of states and ZPW2000 track circuit communication code bit information by using a relay in the same interval section; 3. pink band represents fault occupancy: 4. blue band represents idle: 5. red band represents normal occupancy: 6. the orange band represents loss of shunt:
test item 1: for the "local block partition name 1" in the table i, an occupancy clear-out 3s test is performed, specifically, the logic check content is as follows:
setting SN intervals of a tested station as idle states of all block subareas of a departure direction, a first section of an interior side of an entering station and the SN intervals, traversing the sections by using the names 1 of the block subareas of the intervals, and setting the corresponding equipment state as 0. If the name 1 of the blocking partition in the maintenance platform (SDM) of the train control interlocking integrated system and the man-machine interface (MMI) of the train control interlocking integrated system shows pink light band in the same period, the test item passes; if the SDM and MMI do not show a pink band, the test item does not pass.
If the device state is set to be 1 and is more than or equal to 3s, if the name 1 of the occlusion partition in the SDM and the MMI shows a blue light band, the test item passes; if the blue band is not present in the SDM and MMI, the test entry does not pass.
And traversing the SN region block partition names 2-N of the station, and repeating the test process.
Test item 2: for the test from the fault occupation to the normal occupation of the "local block partition name 1" in the table i, the specific logical check content is as follows:
step (1), setting SN regions of a tested station as departure directions, a first region in the station entering interior and all block partitions of the SN regions to be in idle states, traversing region names 1 of the block partitions of the regions, setting corresponding device states as '0', and displaying the name 1 of the block partition of the region by SDM and MMI in the same period to form pink light bands;
step (2) automatic test software conducts zone traversal on the zone blocking partition name 2, the corresponding equipment state is set to be 0, and the SDM and the MMI display the pink light band of the zone blocking partition name 2 in the same period;
step (3) automatic test software conducts zone traversal on the zone blocking partition name 1, the corresponding equipment state is set to be 1, and when the corresponding equipment state is more than or equal to 3s, the zone blocking partition name 1 in the SDM and the MMI displays a blue light band and the zone blocking partition name 2 displays a red light band;
and (4) if the phenomena 1-3 do not accord with the expected result, the test item does not pass.
In the above, the section block partition name 1 is sequentially replaced with all the combination cases of the section block partition name 2 to the section block partition name N, the section block partition name 2 is sequentially replaced with all the combination cases of the section block partition name 3 to the adjacent station block partition name 2, and the test procedures of the above steps (1) to (4).
Test item 3: for the "local block partition name 1" in the table i, a test from an idle state to a normal occupancy is performed, specifically, the logic check content is as follows:
setting SN areas of a tested station as departure directions, a first section inside the departure station and all block subareas of the SN areas to be in idle states, handling any one outbound signal machine of the station to the departure route of an SN port, and occupying the first section inside the inbound signal machine after the outbound signal is opened;
step (2), the automatic test software conducts zone traversal on the zone blocking partition name 1, the corresponding equipment state is set to be 0, and the SDM and the MMI display a red light band of the zone blocking partition name 1 in the same period;
step (3), the automatic test software sets the equipment states of all the section areas to be 0 in sequence according to the reading sequence of the names of the forward administration section areas in the table 1, and the SDM and the MMI sequentially display the names of the section block partitions 1 to the red light bands of the section block partitions N according to the line sequence;
and (4) if the phenomena in the steps (1) to (3) do not accord with the expected result, the test item does not pass.
It should be noted that, in the embodiment of the present invention, the above 3 test items may be included, but not limited to, specifically, according to the test requirement of the present station, a variety of test items may be written in advance, which is not illustrated here.
In the embodiment of the invention, after the station line section sequencing table and the test items are obtained, the test instructions are generated to further obtain the mapping relation between each test item and each test instruction, and each test instruction comprises a test script for automatically executing the corresponding test item, so that when the test item needs to be tested, the test instruction corresponding to the test item can be directly called, and the test operation is automatically executed according to the test instruction, so that the logic check of the section occupation corresponding to the test item is completed.
103. And calling test instructions corresponding to different test items according to a preset test sequence rule and the mapping relation to perform interval occupation logic check function test.
In the embodiment of the invention, each pre-written test item is independent, and further, when the logic check is needed to be carried out on which interval occupation, the corresponding test instruction can be called to execute the test operation. Because each test item is mutually independent, in order to meet different test requirements and improve test efficiency, corresponding regulations can be preset for some test items according to a certain preset test sequence rule, and then when a test operation instruction is triggered to be executed, a plurality of different test items can automatically execute test operation according to the preset test sequence rule, so that batch test operation is executed, and logic check is performed on a plurality of different test items corresponding to interval occupation.
The embodiment of the invention provides an automatic testing method for interval occupancy logic check kinetic energy. Compared with the prior art, the method and the device solve the problems of large labor cost consumption, low efficiency and low test accuracy in the existing interval occupation logic inspection test process.
In order to describe the above embodiment in more detail, another automatic test method for checking kinetic energy of interval occupancy logic is further provided in the embodiment of the present invention, as shown in fig. 2, which is a detailed statement and a supplementary statement of the method provided in the above embodiment, and the following is specifically stated:
201. and acquiring a station line section sequencing list.
The station line section sequencing table at least comprises: the station access signal machine name, the adjacent station block partition name and the local station block partition name are obtained by the method.
202. And generating a test instruction according to the station line section sorting table and the test items to obtain the mapping relation between each test item and the test instruction.
In the embodiment of the present invention, in the above steps 201-201, please refer to steps 101-102, which are not described herein again.
203. And calling test instructions corresponding to different test items according to a preset test sequence rule and the mapping relation to perform interval occupation logic check function test.
In the embodiment of the present invention, the detailed statement about the step may include the following:
firstly, adding a test identifier for each test item in advance, and sequencing the test identifiers according to test requirements to obtain a test identifier queue. In the embodiment of the invention, the sequence rule for testing the test items is recorded by taking the stored test identifier as a queue form, so that management and control on different test operations are facilitated.
Secondly, when a trigger execution test operation instruction is received, according to the test identifier queue, and according to the sequence from the first test identifier to the last test identifier in the queue, the test item corresponding to each test identifier is acquired successively. And searching for the test instruction corresponding to the test item according to the mapping relationship between each test item and the test instruction obtained in the step 202. And calling the searched test instruction to execute the test operation.
204. And outputting a test report by collecting the test result corresponding to each test item, wherein the test report shows the operation process that the test item does not pass.
205. And counting the corresponding times of failure of each test item.
In the embodiment of the present invention, after the test of the logic check function of the occupied zone of the local station is completed, all test results may be automatically derived to describe in detail the operation process of the test item failing, where "failing" refers to "failing" occurring in the logic check corresponding to the test item as exemplified in step 102.
Next, in the embodiment of the present invention, further, analysis may be performed according to the test report output by the previous test task, so as to formulate a test sequence rule corresponding to the test item in the next test task, as in step 206 and 207, which is specifically stated as follows:
206. and sequencing the plurality of test items according to the order of the failure times from high to low to obtain a test queue consisting of the plurality of test items.
207. And adding a test priority for each test item according to the sequence from the first bit to the last bit in the test queue, wherein the priority of the test item ranked first in the test queue is higher than the priority of the test item ranked next, and executing test operation according to the priority as a test sequence rule.
In the embodiment of the present invention, in step 206-. And calling test instructions corresponding to different test items to perform interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
Or, the number of times of failing in the test result corresponding to each test item may be counted, if the number of times reaches a threshold, the test item is identified to be required to be tested again, and then the number of times of failing and the threshold are combined to screen which test items are required to be tested again/for many times. For the embodiment of the invention, the method is equivalent to automatically screening the test items and performing the focus test.
Further, as an implementation of the method shown in fig. 1 and fig. 2, an embodiment of the present invention provides an automatic testing apparatus for checking kinetic energy of interval occupancy logic. The embodiment of the apparatus corresponds to the embodiment of the method, and for convenience of reading, details in the embodiment of the apparatus are not repeated one by one, but it should be clear that the apparatus in the embodiment can correspondingly implement all the contents in the embodiment of the method. The device is applied to complete the automatic test of the interval occupation logic check, and specifically as shown in fig. 3, the device comprises:
an obtaining unit 31, configured to obtain a station line section ranking table, where the station line section ranking table at least includes: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded;
the generating unit 32 is configured to generate a test instruction according to the station line section sorting table and the test items acquired by the acquiring unit 31, and obtain a mapping relationship between each test item and the test instruction;
and the test unit 33 is configured to invoke test instructions corresponding to different test items to perform interval occupation logic check function tests according to a preset test sequence rule and the mapping relationship.
Further, as shown in fig. 4, the test unit 33 includes:
an adding module 331, configured to add a test identifier to each test item in advance;
the sorting module 332 is configured to sort the test identifiers added by the adding module according to the test requirements, so as to obtain a test identifier queue;
an obtaining module 333, configured to, when receiving a trigger execution test operation instruction, sequentially obtain, according to the test identifier queue, a test item corresponding to each test identifier according to a sequence from a first test identifier to a last test identifier in the queue;
the searching module 334 is configured to search, according to the mapping relationship, a test instruction corresponding to the test item acquired by each acquiring module 333;
a calling module 334, configured to call the found test instruction found by the finding module 334 to perform a test operation.
Further, as shown in fig. 4, the apparatus further includes:
the output unit 34 is configured to output a test report by collecting a test result corresponding to each test item, where the test report shows an operation process in which the test item does not pass;
a counting unit 35, configured to count the number of times of failing to pass corresponding to each test item;
a sorting unit 36, configured to sort the plurality of test items according to the sequence from high to low of the number of times of non-passing counted by the counting unit 35, so as to obtain a test queue composed of the plurality of test items;
an adding unit 37, configured to add a test priority to each test item according to an order from a first bit to a last bit in the test queue obtained by the sorting unit 36, where a priority of a test item sorted first in the test queue is higher than a priority of a test item sorted next.
Further, as shown in fig. 4, the test unit 33 includes:
the invoking module 335 is further configured to invoke a test instruction corresponding to different test items to perform an interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
In summary, the present invention provides a method and an apparatus for automatically testing interval occupancy logic check kinetic energy, in which an indoor simulation test platform is set up in advance, a pre-programmed station line section sorting table and pre-programmed test items are input to the platform to generate test instructions, and test instructions corresponding to different test items are called to perform an interval occupancy logic check function test according to a preset test sequence rule. Compared with the prior art, the method and the device solve the problems of large labor cost consumption, low efficiency and low test accuracy in the existing interval occupation logic inspection test process.
The automatic testing device for the interval occupation logic inspection kinetic energy comprises a processor and a memory, wherein the acquisition unit, the generation unit, the testing unit and the like are stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.
The processor comprises a kernel, and the kernel calls the corresponding program unit from the memory. The kernel can be set to be one or more than one, and the kernel parameter optimization interval is adjusted to occupy the logic check function test so as to rapidly improve the test efficiency and accuracy.
The memory may include volatile memory in a computer readable medium, Random Access Memory (RAM) and/or nonvolatile memory such as Read Only Memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.
An embodiment of the present invention provides an electronic device, including: the processor executes the program, and realizes the automatic test method for the interval occupation logic check kinetic energy.
The embodiment of the invention provides a computer-readable storage medium, wherein a computer program is stored on the computer-readable storage medium, and the program can realize the automatic test method for the interval occupancy logic check kinetic energy when running.
The device herein may be a server, a PC, a PAD, a mobile phone, etc.
The present application further provides a computer program product adapted to perform program code for initializing the following method steps when executed on a data processing device: obtaining a station line section sequencing table, wherein the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded; generating test instructions according to the station line section sorting table and the test items to obtain a mapping relation between each test item and each test instruction; and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). The memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include transitory computer readable media (trahsity media) such as modulated data signals and carrier waves.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. An automatic test method for interval occupancy logic check kinetic energy, which is characterized by comprising the following steps:
obtaining a station line section sequencing table, wherein the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded;
generating test instructions according to the station line section sorting table and the test items to obtain a mapping relation between each test item and each test instruction;
and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation.
2. The method according to claim 1, wherein the invoking test instructions corresponding to different test items according to the mapping relationship according to a preset test sequence rule to perform an interval occupation logic check function test comprises:
adding a test identifier for each test item in advance;
sequencing the test identifications according to the test requirements to obtain a test identification queue;
when a trigger execution test operation instruction is received, according to the test identifier queue, and according to the sequence from the first test identifier to the last test identifier in the queue, gradually acquiring a test item corresponding to each test identifier;
searching a test instruction corresponding to each test item according to the mapping relation;
and calling the searched test instruction to execute the test operation.
3. The method of claim 1, further comprising:
outputting a test report by collecting a test result corresponding to each test item, wherein the test report shows the operation process that the test item does not pass;
counting the number of times of failing corresponding to each test item;
sequencing the plurality of test items according to the order of the number of times of failure from high to low to obtain a test queue consisting of the plurality of test items;
and adding a test priority to each test item according to the sequence from the first bit to the last bit in the test queue, wherein the priority of the test item ranked first in the test queue is higher than the priority of the test item ranked next.
4. The method according to claim 3, wherein the invoking test instructions corresponding to different test items according to the mapping relationship according to a preset test sequence rule to perform an interval occupation logic check function test comprises:
and calling test instructions corresponding to different test items to perform interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
5. An automatic testing device for checking kinetic energy of interval occupation logic, which is characterized by comprising:
the acquisition unit is used for acquiring a station line section sequencing table, and the station line section sequencing table at least comprises: the method comprises the following steps that the name of a first section inside the station is entered, the name of a station entering signal machine of a corresponding station, the name of a blocking partition of an adjacent station and the name of a blocking partition of an interval of a local station are corresponded;
the generating unit is used for generating test instructions according to the station line section sequencing table and the test items acquired by the acquiring unit to obtain a mapping relation between each test item and each test instruction;
and the test unit is used for calling test instructions corresponding to different test items to perform interval occupation logic check function test according to a preset test sequence rule and the mapping relation.
6. The apparatus of claim 5, wherein the test unit comprises:
the adding module is used for adding a test identifier for each test item in advance;
the sequencing module is used for sequencing the test identifiers added by the adding module according to the test requirements to obtain a test identifier queue;
the acquisition module is used for acquiring the test items corresponding to each test identifier one by one according to the test identifier queue and the sequence from the first test identifier to the last test identifier in the queue when receiving a trigger execution test operation instruction;
the searching module is used for searching a test instruction corresponding to the test item acquired by each acquiring module according to the mapping relation;
and the calling module is used for calling the searched test instruction searched by the searching module to execute the test operation.
7. The apparatus of claim 5, further comprising:
the output unit is used for outputting a test report by collecting a test result corresponding to each test item, and the test report shows the operation process that the test item does not pass;
the statistical unit is used for counting the number of times of non-passing corresponding to each test item;
the sequencing unit is used for sequencing the plurality of test items according to the sequence from high to low of the number of times of non-passing counted by the counting unit to obtain a test queue consisting of the plurality of test items;
and the adding unit is used for adding a test priority to each test item according to the sequence from the first bit to the last bit in the test queue obtained by the sorting unit, wherein the priority of the test item sorted in the test queue in the first order is higher than the priority of the test item sorted in the second order.
8. The apparatus of claim 7, wherein the test unit comprises:
the calling module is further configured to call test instructions corresponding to different test items to perform an interval occupation logic check function test according to the priority level corresponding to each test item in the test queue.
9. An electronic device, comprising: a memory, a processor and a program stored on the memory and executable on the processor, the processor implementing the interval occupancy logic check kinetic energy automatic test method as claimed in any one of claims 1 to 4 when executing the program.
10. A computer-readable storage medium, on which a computer program is stored, wherein the program is operable to implement the method for automatic testing of interval occupancy logic check kinetic energy according to any one of claims 1 to 4.
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