CN111583183B - 一种用于pcb板图像缺陷检测的数据增强方法和系统 - Google Patents
一种用于pcb板图像缺陷检测的数据增强方法和系统 Download PDFInfo
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- CN111583183B CN111583183B CN202010285649.8A CN202010285649A CN111583183B CN 111583183 B CN111583183 B CN 111583183B CN 202010285649 A CN202010285649 A CN 202010285649A CN 111583183 B CN111583183 B CN 111583183B
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- 238000000034 method Methods 0.000 title claims abstract description 32
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20112—Image segmentation details
- G06T2207/20132—Image cropping
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
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- Computer Vision & Pattern Recognition (AREA)
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Abstract
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CN202010285649.8A CN111583183B (zh) | 2020-04-13 | 2020-04-13 | 一种用于pcb板图像缺陷检测的数据增强方法和系统 |
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CN111583183B true CN111583183B (zh) | 2022-12-06 |
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Families Citing this family (4)
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CN112085722B (zh) * | 2020-09-07 | 2024-04-09 | 凌云光技术股份有限公司 | 一种训练样本图像获取方法及装置 |
CN112784844B (zh) * | 2020-12-31 | 2022-08-12 | 上海微亿智造科技有限公司 | 一种制作语义分割网训练样本的方法、系统及介质 |
CN112950618B (zh) * | 2021-03-25 | 2023-03-21 | 深圳市华汉伟业科技有限公司 | 一种外观缺陷检测方法与系统 |
CN116091500B (zh) * | 2023-04-07 | 2023-07-04 | 成都数之联科技股份有限公司 | 扩散板缺陷检测方法、模型训练方法、装置、设备和介质 |
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JP6345961B2 (ja) * | 2014-03-28 | 2018-06-20 | 株式会社メガチップス | 画像復号化装置および画像復号化方法 |
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CN109166095B (zh) * | 2018-07-11 | 2021-06-25 | 广东技术师范学院 | 一种基于生成对抗机制的眼底影像杯盘分割方法 |
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2020
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Application publication date: 20200825 Assignee: Chengdu Haijixian Intelligent Technology Co.,Ltd. Assignor: Chengdu shuzhilian Technology Co.,Ltd. Contract record no.: X2024510000011 Denomination of invention: A data augmentation method and system for PCB board image defect detection Granted publication date: 20221206 License type: Common License Record date: 20240717 |
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