CN111562490A - 测试方法及系统 - Google Patents
测试方法及系统 Download PDFInfo
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- CN111562490A CN111562490A CN201910114750.4A CN201910114750A CN111562490A CN 111562490 A CN111562490 A CN 111562490A CN 201910114750 A CN201910114750 A CN 201910114750A CN 111562490 A CN111562490 A CN 111562490A
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- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000012360 testing method Methods 0.000 claims abstract description 535
- 238000000034 method Methods 0.000 claims abstract description 74
- 230000008569 process Effects 0.000 claims abstract description 56
- 230000005540 biological transmission Effects 0.000 claims abstract description 51
- 238000012545 processing Methods 0.000 claims abstract description 10
- 230000009471 action Effects 0.000 claims description 15
- 230000001360 synchronised effect Effects 0.000 claims description 13
- 230000001419 dependent effect Effects 0.000 claims description 8
- 230000007246 mechanism Effects 0.000 abstract description 5
- 230000002159 abnormal effect Effects 0.000 abstract description 4
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- 230000003287 optical effect Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
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- 238000013461 design Methods 0.000 description 1
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- 239000013307 optical fiber Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318566—Comparators; Diagnosing the device under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318594—Timing aspects
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2019
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