CN111555930A - Method and system for measuring digital signal time jitter - Google Patents
Method and system for measuring digital signal time jitter Download PDFInfo
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- CN111555930A CN111555930A CN202010324887.5A CN202010324887A CN111555930A CN 111555930 A CN111555930 A CN 111555930A CN 202010324887 A CN202010324887 A CN 202010324887A CN 111555930 A CN111555930 A CN 111555930A
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Abstract
The invention relates to a method and a system for measuring digital signal time jitter, wherein the method comprises the following steps: A. through the sampling pulse with adjustable period, the width of the sampling pulse is less than one period of the tested digital signal, and the first sampling is completed in one period of the tested digital signal; B. after pulse after sampling is widened and quantized, recording parameters of the sampling; C. repeating sampling in one period of the digital signal to be tested, sequentially increasing the step value of the sampling pulse period which is multiple times corresponding to the sampling times to the period of the sampling pulse when sampling is performed each time in the follow-up period, and repeating the step B after each sampling until the sampling of the preset times in one period of the digital signal to be tested is completed; D. and carrying out time jitter numerical calculation according to all the sampling parameters to obtain a digital signal time jitter result. The invention can modularize the measuring system, can measure on line and effectively reduce the difficulty and cost of quantizing the sampling pulse amplitude.
Description
Technical Field
The invention relates to a method for measuring time jitter in the field of digital signals, in particular to a method and a system for measuring time jitter of periodic digital signals.
Background
In a digital communication system, the technical index of the periodic digital signal time jitter directly affects the performance of a transmission system, such as bit error rate, coding and decoding performance and the like. With the development of high-performance digital communication technology, accurate measurement of digital signal time jitter is required in practical applications to ensure the normal operation of the system. At present, the commonly used measuring methods for digital signal time jitter mainly include frequency domain spectrum measurement and analysis methods and time domain high-speed sampling and calculation.
The spectrum measurement and analysis method comprises the steps of measuring the power spectral density of a periodic digital signal through a spectrum analyzer, separating the noise power spectral density from the power spectral density, and analyzing the noise power spectral density to obtain the time jitter characteristic of the signal.
The high-speed sampling and calculating method is to measure the periodical digital signal directly with real-time oscilloscope and to see the fluctuation of pulse directly. And further calculating to obtain each parameter of the digital signal time jitter.
The two common methods have the advantages of convenience and easiness, but have the following defects: 1. the online real-time measurement of the jitter can not be realized by manually accessing a broadband spectrum analyzer or an oscilloscope with a high sampling rate and software thereof; 2. the cost of a broadband spectrum analyzer or an oscilloscope with high sampling rate is high; 3. the method has huge data and resource consumption and slow measuring speed. Therefore, a time jitter measuring method and system with the characteristics of online, low cost and simplicity and feasibility are needed to meet the requirement of online measurement.
Disclosure of Invention
The invention provides a method and a system for measuring digital signal time jitter, which can measure the time jitter of a digital signal on line in real time, reduce the measurement cost and improve the measurement convenience.
The invention discloses a method for measuring digital signal time jitter, which comprises the following steps:
A. generating a sampling pulse with adjustable period, wherein the width of the sampling pulse is less than one period of the tested digital signal, and then multiplying the tested digital signal by the sampling pulse in one period of the tested digital signal to finish the first sampling of the tested digital signal;
B. pulse broadening is carried out on the pulse obtained after sampling, then the amplitude of the pulse is obtained through quantification, and the parameter of the sampling is recorded;
C. repeating the sampling of the digital signal to be tested in one period of the digital signal to be tested, sequentially increasing the step value of the sampling pulse period which is multiple times corresponding to the sampling times to the period of the sampling pulse when the sampling is performed at each subsequent time, and repeating the step B after each sampling is completed until the sampling of the digital signal to be tested for the preset times in one period is completed;
D. and carrying out time jitter numerical calculation according to all the sampling parameters to obtain the time jitter result of the measured digital signal.
The invention realizes the sampling of the tested digital signal and the measurement of the time jitter of the tested digital signal by the digital signal period reconstruction of narrow pulse and repeated equidistant delay sampling. The on-line real-time measurement of the jitter can be realized without accessing devices such as a broadband spectrum analyzer or an oscilloscope with high sampling rate. When the time jitter is calculated according to the sampling parameters, a conventional calculation method in the art may be adopted, for example, an average value of the measured digital signal, an average value of the time jitter, a peak-to-peak value, a mean-square value, and the like may be obtained according to the sampling parameters, or a specific calculation may be performed according to the sampling parameters according to specific needs.
Further, in step A, the period of the sampling pulse is T1And T is1＝T0+ Δ t.n, where T0Is an initial value, Δ T is the step value of the sampling pulse period, n is the sampling times, the range is an integer greater than or equal to 0, the width of the sampling pulse is Δ τ, and Δ τ is far smaller than the period T of the digital signal to be measured2Wherein T is2Δ T · n, the first sampling, n being 0, the period T of the sampling pulse1＝T0。
Specifically, in step C, in the second sampling, n is 1, and the period T of the sampling pulse is set to be equal to1＝T0+ Δ t; in the third sampling, n is 2, and the period T of the sampling pulse1＝T0+2 Δ t, and so on until the set n samples are completed.
Further, the initial value T of the sampling pulse period0Period T of digital signal to be measured2The specific value may depend on the parameters of the system.
Furthermore, the width delta tau of the sampling pulse is less than or equal to the stepping value delta t of the sampling pulse period.
Preferably, within one period of the digital signal to be measured, the sampling frequency n is more than or equal to 3, so as to improve the measurement precision within one period, and the specific value of n is determined according to the required measurement precision.
Preferably, in order to improve the overall measurement accuracy and adapt to the characteristics of the periodic digital signal to be measured, step D is performed after repeating the sampling of step a to step C for at least 2 cycles of the digital signal to be measured.
The invention also provides a system for measuring the digital signal time jitter, which is used for the measuring method and comprises a sampling pulse generator for generating sampling pulses, wherein the sampling pulses and the digital signals to be measured, which are generated by the sampling pulse generator, are received by a multiplier, the processed sampling signals are output to a sampling pulse quantization module through a sampling pulse stretching module, and the sampling pulse quantization module also receives synchronous signals generated by the sampling pulse generator and outputs quantized pulse amplitude signals after calculation through a data processing module.
The invention can modularize the measuring system, can measure on line, effectively reduces the difficulty and cost of quantizing the sampling pulse amplitude by widening the sampled pulse, and can flexibly set corresponding parameters by flexibly selecting the sampling period, the sampling interval, the pulse width and the digital signal period, thereby having wide adaptability.
The present invention will be described in further detail with reference to the following examples. This should not be understood as limiting the scope of the above-described subject matter of the present invention to the following examples. Various substitutions and alterations according to the general knowledge and conventional practice in the art are intended to be included within the scope of the present invention without departing from the technical spirit of the present invention as described above.
Drawings
Fig. 1 is a block diagram of a digital signal time jitter measurement system according to the present invention.
FIG. 2 is a flow chart of the method for measuring digital signal time jitter according to the present invention.
Detailed Description
The system for measuring digital signal time jitter according to the present invention as shown in fig. 1 comprises a sampling pulse generator for generating sampling pulses, a multiplier for receiving the sampling pulses and the digital signals to be measured, a multiplier for multiplying the sampling pulses and the digital signals to be measured to complete sampling, a sampling pulse stretching module for outputting the sampling signals to a sampling pulse quantization module, and a data processing module for calculating and outputting the quantized pulse amplitude signals.
As shown in fig. 2, the measuring system for measuring the time jitter of the digital signal under test comprises:
A. firstly, setting related parameters including width Delta tau of sampling pulse and initial value T of sampling pulse period0The number of sampling times n and the step value delta T of the sampling pulse period, the period T of the digital signal to be measured2And the total number of measurement cycles N.
Then a sampling pulse generator generates a sampling pulse with adjustable period, and the period of the sampling pulse is T1And T is1＝T0+ Δ t.n, where T0The value is an initial value, Δ t is a step value of a sampling pulse period, n is a sampling frequency, the range is an integer greater than or equal to 0, and n is generally set to be greater than or equal to 3 in order to ensure the measurement precision in one period. The width of the sampling pulse is delta tau, delta tau is less than or equal to the step value delta T of the sampling pulse period, and delta tau is far less than the period T of the digital signal to be measured2Wherein T is2Δ T · n, and an initial value T of the sampling pulse period0Period T of digital signal to be measured2。
At the time of the first sampling, n is 0, and the period T of the sampling pulse1＝T0In one period T of the digital signal to be measured2The sampling pulse is multiplied by the tested digital signal through a multiplier, and the first sampling of the tested digital signal is completed.
B. Pulse signals obtained after sampling are subjected to pulse broadening through a pulse broadening module, then the amplitude of pulses is quantized through a sampling pulse quantization module, finally obtained data are sent to a data processing module to record parameters of the sampling, and the abscissa is time and the ordinate is amplitude.
C. In said one period T of the digital signal to be measured2The digital signal under test is internally repeatedly sampled, and the period of the sampling pulse is sequentially increased by a step value Δ T of the sampling pulse period corresponding to a multiple of the number of times of sampling every time sampling is subsequently performed, for example, in the second sampling, n is 1, and the period T of the sampling pulse is1＝T0+ Δ t; in the third sampling, n is 2, and the period T of the sampling pulse1＝T0+2 Δ t, and so on. And repeating the step B after each sampling is finished until n times of sampling set in one period of the digital signal to be tested are finished.
D. In order to improve the overall measurement accuracy and adapt to the characteristics of periodic measured digital signals, after repeating sampling in steps A to C for at least 2 cycles (N is more than or equal to 2) of the measured digital signals, time jitter numerical calculation is performed according to all sampling parameters, for example, a common calculation mode can be adopted, the average value of the measured digital signal pulses, the average value of the time jitter, the peak-to-peak value, the mean-to-square value and the like can be obtained according to the sampling parameters, and targeted calculation can be performed according to specific requirements according to the sampling parameters, so that the result of the time jitter of the measured digital signals is finally obtained.
The invention realizes the sampling of the digital signal to be tested and the measurement of the time jitter thereof by the digital signal period reconstruction of narrow pulse and repeated equidistant delay sampling. The online real-time measurement of the time jitter can be realized without accessing devices such as a broadband spectrum analyzer or an oscilloscope with high sampling rate.
Example (b):
sampling pulse generation and control: generating a period of T by a sampling pulse generator1And a sampling pulse of adjustable period and pulse width Deltatau, where T1＝T0+Δt·n，T0For the initial value, T is set010ns, where n is a positive integer (1,2, ….. n), which represents the number of sampling times, and the width Δ τ of the sampling pulse is much smaller than the period T of the digital signal to be measured2And T is2Δ t · n. The period of the measured digital signal is T21ns pseudo-random code (non-return-to-zero code) with rate 1Gb/s, setting n to 10; the width of the sampling pulse is delta tau 0.05 ns; the step value delta t of the sampling pulse period is 0.1 ns; the method meets the preset conditions: t is0≥T2，Δτ≤Δt，n≥3。
At the time of the first sampling, n is 0, T1＝T0At the time of 10ns, sampling is completed by multiplying a sampling pulse and a digital signal to be measured in a multiplier, then the pulse obtained after sampling is widened by 10 times through a pulse widening module, data of pulse amplitude is obtained through quantization, the data of the pulse amplitude is sent to a data processing module, and the parameter of the current sampling is recorded, wherein the abscissa is time, and the ordinate is amplitude.
At the time of the second sampling, n is 1, T1At the time of 10.1ns, sampling is completed by multiplying the sampling pulse and the digital signal to be measured in a multiplier, then similarly, the sampled pulse is widened by 10 times, data of pulse amplitude is obtained by quantization, and the data are sent to a data processing module to record the parameter of the current sampling, wherein the abscissa is time, and the ordinate is amplitude.
By analogy, in one period T of the digital signal to be tested2In the formula, n is respectively set to be 2, 3, 4, 5, 6, 7, 8, 9 and 10 and is respectively at corresponding T1At the moment, sampling is completed by multiplying a sampling pulse by a digital signal to be tested, then the pulse is widened by 10 times, data of the amplitude of the pulse is obtained through quantization, the data are sent to a data processing module to record the parameter of the sampling, the abscissa is time, and the ordinate is amplitude.
Thus, a tested digital signal period T is completed2Is typically required to obtain accurate dataThe digital signal under test is repeatedly sampled for N cycles, where N is 100 in this embodiment.
And repeating the sampling process, and finally carrying out corresponding calculation on the obtained data to obtain the jitter characteristic of the digital signal to be tested.
Claims (8)
1. The method for measuring the time jitter of the digital signal is characterized by comprising the following steps:
A. generating a sampling pulse with adjustable period, wherein the width of the sampling pulse is less than one period of the tested digital signal, and then multiplying the tested digital signal by the sampling pulse in one period of the tested digital signal to finish the first sampling of the tested digital signal;
B. pulse broadening is carried out on the pulse obtained after sampling, then the amplitude of the pulse is obtained through quantification, and the parameter of the sampling is recorded;
C. repeating the sampling of the digital signal to be tested in one period of the digital signal to be tested, sequentially increasing the step value of the sampling pulse period which is multiple times corresponding to the sampling times to the period of the sampling pulse when the sampling is performed at each subsequent time, and repeating the step B after each sampling is completed until the sampling of the digital signal to be tested for the preset times in one period is completed;
D. and carrying out time jitter numerical calculation according to all the sampling parameters to obtain the time jitter result of the measured digital signal.
2. A method of measuring time jitter of a digital signal as claimed in claim 1, characterized by: in step A, the period of the sampling pulse is T1And T is1＝T0+ Δ t.n, where T0Is an initial value, Δ T is the step value of the sampling pulse period, n is the sampling times, the range is an integer greater than or equal to 0, the width of the sampling pulse is Δ τ, and Δ τ is far smaller than the period T of the digital signal to be measured2Wherein T is2Δ T · n, the first sampling, n being 0, the period T of the sampling pulse1＝T0。
3. A method of measuring time jitter of a digital signal as claimed in claim 2, characterized by: in step C, in the second sampling, n is 1, and the period T of the sampling pulse is1＝T0+ Δ t; in the third sampling, n is 2, and the period T of the sampling pulse1＝T0+2 Δ t, and so on until the set n samples are completed.
4. A method of measuring time jitter of a digital signal as claimed in claim 2, characterized by: initial value T of sampling pulse period0Period T of digital signal to be measured2。
5. A method of measuring time jitter of a digital signal as claimed in claim 2, characterized by: the width delta tau of the sampling pulse is less than or equal to the step value delta t of the sampling pulse period.
6. A method of measuring time jitter of a digital signal as claimed in claim 2, characterized by: in one period of the digital signal to be tested, the sampling frequency n is more than or equal to 3.
7. A method of measuring time jitter of a digital signal according to any one of claims 1 to 6, wherein: and D, repeating sampling for at least 2 cycles of the digital signal to be tested through the steps A to C, and then executing the step D.
8. A system for measuring the time jitter of a digital signal as claimed in any one of claims 1 to 7, characterized by: the sampling pulse quantization module also receives a synchronous signal generated by the sampling pulse generator and outputs a quantized pulse amplitude signal after calculation through the data processing module.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114726437A (en) * | 2022-06-08 | 2022-07-08 | 电子科技大学 | Digital optical transmitter edge jitter detector and detection method |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1825377A (en) * | 2006-03-14 | 2006-08-30 | 上海微电子装备有限公司 | High-precision calibrating method for pulse wave intensity samping synchronization |
| CN101676787A (en) * | 2008-09-17 | 2010-03-24 | 中国科学院半导体研究所 | Optical pulse time domain broadening analog-to-digital converter |
| US20110267671A1 (en) * | 2008-03-31 | 2011-11-03 | Electro Scientific Industries, Inc. | Combining multiple laser beams to form high repetition rate, high average power polarized laser beam |
| CN203012312U (en) * | 2012-11-28 | 2013-06-19 | 广东汉唐量子光电科技有限公司 | Frequency division multiplexing spectrum coherent combination amplification device |
| US20130317336A1 (en) * | 2012-05-22 | 2013-11-28 | Siemens Medical Solutions Usa, Inc. | Adaptive ECG Trigger Signal Jitter detection for Imaging |
| CN103580656A (en) * | 2013-10-11 | 2014-02-12 | 中国电子科技集团公司第四十一研究所 | Triggering vibration real-time correction circuit and method in random sampling process |
| CN103905137A (en) * | 2014-04-23 | 2014-07-02 | 南京磐能电力科技股份有限公司 | Synchronous pulse jitter suppression method and system based on FPGA |
| CN104935308A (en) * | 2015-07-02 | 2015-09-23 | 北京无线电计量测试研究所 | Space delay line-based time jitter compensation device and method |
| CN107192890A (en) * | 2017-07-02 | 2017-09-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of measuring method of radio-frequency pulse shake |
| CN109901119A (en) * | 2019-01-31 | 2019-06-18 | 西南电子技术研究所（中国电子科技集团公司第十研究所） | The real-time Processing for removing method of radar pulse signal sampling dithering |
-
2020
- 2020-04-23 CN CN202010324887.5A patent/CN111555930B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1825377A (en) * | 2006-03-14 | 2006-08-30 | 上海微电子装备有限公司 | High-precision calibrating method for pulse wave intensity samping synchronization |
| US20110267671A1 (en) * | 2008-03-31 | 2011-11-03 | Electro Scientific Industries, Inc. | Combining multiple laser beams to form high repetition rate, high average power polarized laser beam |
| CN101676787A (en) * | 2008-09-17 | 2010-03-24 | 中国科学院半导体研究所 | Optical pulse time domain broadening analog-to-digital converter |
| US20130317336A1 (en) * | 2012-05-22 | 2013-11-28 | Siemens Medical Solutions Usa, Inc. | Adaptive ECG Trigger Signal Jitter detection for Imaging |
| CN203012312U (en) * | 2012-11-28 | 2013-06-19 | 广东汉唐量子光电科技有限公司 | Frequency division multiplexing spectrum coherent combination amplification device |
| CN103580656A (en) * | 2013-10-11 | 2014-02-12 | 中国电子科技集团公司第四十一研究所 | Triggering vibration real-time correction circuit and method in random sampling process |
| CN103905137A (en) * | 2014-04-23 | 2014-07-02 | 南京磐能电力科技股份有限公司 | Synchronous pulse jitter suppression method and system based on FPGA |
| CN104935308A (en) * | 2015-07-02 | 2015-09-23 | 北京无线电计量测试研究所 | Space delay line-based time jitter compensation device and method |
| CN107192890A (en) * | 2017-07-02 | 2017-09-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of measuring method of radio-frequency pulse shake |
| CN109901119A (en) * | 2019-01-31 | 2019-06-18 | 西南电子技术研究所（中国电子科技集团公司第十研究所） | The real-time Processing for removing method of radar pulse signal sampling dithering |
Non-Patent Citations (3)
| Title |
|---|
| TIANHANG ZHANG，QI QIU等: "Experimental Study on a 4-b Serial Optical Digital to Analog Convertor", 《IEEE PHOTONICS JOURNAL》 * |
| WANG, YUNXIANG等: "Tracking performance of optical phase locking loop with frequency discrimination and control subloop", 《OPTICAL ENGINEERING》 * |
| 肖刚: "基于PPM与LDPC的迭代解调中脉冲展宽与时间抖动对系统性能研究", 《信息通信》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114726437A (en) * | 2022-06-08 | 2022-07-08 | 电子科技大学 | Digital optical transmitter edge jitter detector and detection method |
| CN114726437B (en) * | 2022-06-08 | 2022-10-14 | 电子科技大学 | Digital optical transmitter edge jitter detector |
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