CN111537518B

CN111537518B - Method and device for detecting flaws of capacitor terminal, storage medium and processor

Info

Publication number: CN111537518B
Application number: CN202010450697.8A
Authority: CN
Inventors: 杨智慧; 宋明岑; 周海民
Original assignee: Gree Electric Appliances Inc of Zhuhai; Zhuhai Gree Intelligent Equipment Co Ltd
Current assignee: Gree Electric Appliances Inc of Zhuhai; Zhuhai Gree Intelligent Equipment Co Ltd
Priority date: 2020-05-25
Filing date: 2020-05-25
Publication date: 2024-05-28
Anticipated expiration: 2040-05-25
Also published as: CN111537518A

Abstract

The application provides a detection method, a device, a storage medium and a processor for flaws of a capacitor terminal, wherein the detection method comprises the following steps: acquiring a reference end face image, wherein the reference end face image comprises an image of a reference capacitor terminal and an image of a reference preset end face; acquiring an end face image of a capacitor to be measured, wherein the end face image comprises an image of a capacitor terminal to be measured and an image of an end face where the capacitor terminal to be measured is located; determining a reference offset angle according to the reference end face image, and determining an actual offset angle according to the end face image; the capacitor to be measured is controlled to rotate by a preset angle, a side image of a capacitor terminal to be measured is obtained, and the preset angle is calculated according to a reference offset angle and an actual offset angle; and determining flaws of the capacitor terminal to be detected according to the side image and the end image, so that the side image can show the charring flaws of the capacitor terminal, and whether the capacitor terminal is skewed or not can be determined through the end image, thereby improving the accuracy of flaw detection.

Description

Method and device for detecting flaws of capacitor terminal, storage medium and processor

Technical Field

The application relates to the field of detection of capacitance flaws, in particular to a method and a device for detecting flaws of a capacitance terminal, a storage medium and a processor.

Background

The existing appearance detection method for skew and scorching of the capacitor leading-out terminals (positive and negative electrodes) is to fix the product, rotate the product four times (90 degrees each time), photograph the product four times, and detect the flaws of each surface of the two terminals. Because the included angle between the two terminals in the qualified product is not exactly 90 degrees, the terminal skew is tolerant to a certain degree, and the qualified product is calculated within a specified skew angle. The existence of these circumstances makes the positive terminal leading-out end face or deviate from the surface of positive terminal bottom and the side of negative terminal leading-out end and can't present good effect in an image simultaneously, perhaps makes negative terminal leading-out end face or deviate from the surface of negative terminal bottom and the side of positive terminal leading-out end can't present good effect in an image simultaneously, leads to appearing the condition of misjudgement, also can appear same product and repeat the machine test, obtain the skew angle inconsistent, the deviation is great, cause the crooked angle critical value of judgement terminal to be difficult to confirm, also can have and leak judgement and misjudgement.

The above information disclosed in the background section is only for enhancement of understanding of the background art from the technology described herein and, therefore, may contain some information that does not form the prior art that is already known in the country to a person of ordinary skill in the art.

Disclosure of Invention

The application mainly aims to provide a method and a device for detecting flaws of a capacitor terminal, a storage medium and a processor, so as to solve the problem of inaccurate flaw detection of the capacitor terminal in the prior art.

According to an aspect of the embodiment of the present invention, there is provided a method for detecting flaws of a capacitor terminal, a capacitor to be detected including a capacitor body to be detected and a capacitor terminal to be detected, the capacitor terminal to be detected being located on a predetermined end face of the capacitor body to be detected, the method comprising: acquiring a reference end face image, wherein the reference end face image comprises an image of a reference capacitor terminal and an image of a reference preset end face, and a reference capacitor comprises a reference capacitor body and the reference capacitor terminal, and the reference capacitor terminal is positioned on the reference preset end face of the reference capacitor body; acquiring an end face image of the capacitor to be tested, wherein the end face image comprises an image of the capacitor terminal to be tested and an image of the end face of the capacitor terminal to be tested; determining a reference offset angle according to the reference end face image, and determining an actual offset angle according to the end face image; the capacitor to be measured is controlled to rotate by a preset angle, a side image of the capacitor terminal to be measured is obtained, and the preset angle is calculated according to the reference offset angle and the actual offset angle; and determining flaws of the capacitor terminal to be tested according to the side image and the end image.

Optionally, the reference capacitor includes a first negative terminal, the first negative terminal includes a first negative terminal leading-out end and a first negative terminal bottom end, the first negative terminal bottom end is located in contact with the reference predetermined end surface, the first surface is a surface of the first negative terminal leading-out end facing the first negative terminal bottom end, and the first surface is perpendicular to the reference predetermined end surface, the reference end surface image includes a first reference end surface image, and the process of acquiring the first reference end surface image includes: controlling the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the first surface in the reference side image; and acquiring a reference end face image, and determining the reference end face image as a first reference end face image.

Optionally, determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the first reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the first reference end face image, a Y axis of the coordinate system is parallel to a second edge of the first reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a first position point and a second position point, wherein the first position point and the second position point are points on the edge of the top surface of the first negative electrode terminal leading-out end in the first reference end surface image, and the positions of the first position point and the second position point are different; and determining an included angle between the first connecting line and the X axis to obtain a first reference offset angle.

Optionally, the reference capacitor includes a first positive terminal, the first positive terminal includes a first positive terminal lead-out end and a first positive terminal bottom end, the first positive terminal bottom end is located in contact with the reference predetermined end surface, the second surface is a surface of the first positive terminal lead-out end facing the first positive terminal bottom end, the reference end surface image includes a second reference end surface image, and a process of acquiring the second reference end surface image includes: controlling the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that the shadow of the second surface does not exist in the reference side image; and acquiring a reference end face image, and determining the reference end face image as a second reference end face image.

Optionally, determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the second reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the second reference end face image, a Y axis of the coordinate system is parallel to a second edge of the second reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a third position point and a fourth position point, and obtaining a second connecting line, wherein the third position point and the fourth position point are all points on the top surface edge of the first positive terminal leading-out end in the second reference end surface image, and the positions of the third position point and the fourth position point are different; and determining an included angle between the second connecting line and the X axis to obtain a second reference offset angle.

Optionally, the reference capacitor includes a first negative terminal, the first negative terminal includes a first negative terminal leading-out end and a first negative terminal bottom end, the first negative terminal bottom end is contactingly located on the reference predetermined end surface, the third surface is a surface of the first negative terminal leading-out end facing away from the first negative terminal bottom end, the reference end surface image includes a third reference end surface image, and the process of acquiring the third reference end surface image includes: controlling and rotating the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the third surface in the reference side image; and acquiring a reference end face image, and determining the reference end face image as a third reference end face image.

Optionally, determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the third reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the third reference end face image, a Y axis of the coordinate system is parallel to a second edge of the third reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a fifth position point and a sixth position point to obtain a third connecting line, wherein the fifth position point and the sixth position point are all points on the top surface edge of the first negative electrode terminal leading-out end in the third reference end surface image, and the positions of the fifth position point and the sixth position point are different; and determining an included angle between the third connecting line and the X axis to obtain a third reference offset angle.

Optionally, the reference capacitor includes a first positive terminal, the first positive terminal includes a first positive terminal lead-out end and a first positive terminal bottom end, the first positive terminal bottom end is located in contact with the reference predetermined end surface, the fourth surface is a surface of the first positive terminal lead-out end facing away from the first positive terminal bottom end, the reference end surface image includes a fourth reference end surface image, and the process of acquiring the fourth reference end surface image includes: controlling the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the fourth surface in the reference side image; and acquiring a reference end face image, and determining the reference end face image as a fourth reference end face image.

Optionally, determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the fourth reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the fourth reference end face image, a Y axis of the coordinate system is parallel to a second edge of the fourth reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a seventh position point and an eighth position point to obtain a fourth connecting line, wherein the seventh position point and the eighth position point are all points on the top surface edge of the first positive terminal leading-out end in the fourth reference end surface image, and the positions of the seventh position point and the eighth position point are different; and determining an included angle between the fourth connecting line and the X axis to obtain a fourth reference offset angle.

Optionally, determining an actual offset angle according to the end face image includes: establishing a coordinate system on the end face image, wherein an X axis of the coordinate system is parallel to a first edge of the end face image, a Y axis of the coordinate system is parallel to a second edge of the end face image, and the first edge is adjacent to and perpendicular to the second edge; and determining the actual offset angle according to the coordinate system.

Optionally, the capacitor to be tested includes a second negative terminal, where the second negative terminal includes a second negative terminal lead-out end and a second negative terminal bottom end, and the second negative terminal bottom end is located in contact with the predetermined end face, and the determining the actual offset angle according to the coordinate system includes: obtaining a connecting line of a ninth position point and a tenth position point to obtain a fifth connecting line, wherein the ninth position point and the tenth position point are all points on the top surface edge of the second negative terminal leading-out end in the end surface image, and the positions of the ninth position point and the tenth position point are different; and determining an included angle between the fifth connecting line and the X axis to obtain a first actual offset angle.

Optionally, the capacitor to be tested includes a second positive terminal, the second positive terminal includes a second positive terminal lead-out end and a second positive terminal bottom end, the second positive terminal bottom end is located in contact with the predetermined end face, and the determining the actual offset angle according to the coordinate system includes: obtaining a connecting line of an eleventh position point and a twelfth position point to obtain a sixth connecting line, wherein the eleventh position point and the twelfth position point are all points on the top surface edge of the second positive terminal leading-out end in the end surface image, and the positions of the eleventh position point and the twelfth position point are different; and determining an included angle between the sixth connecting line and the Y axis to obtain a second actual offset angle.

Optionally, rotating the capacitor to be measured by a corresponding predetermined angle, and acquiring a side image of the capacitor to be measured includes: rotating the capacitor to be measured by a first preset angle, wherein the first preset angle is a difference value obtained by subtracting the first reference offset angle from the first actual offset angle; and acquiring a side image of the capacitor to be detected, and obtaining a first side image.

Optionally, after rotating the capacitor to be measured by a first predetermined angle, rotating the capacitor to be measured by a corresponding predetermined angle, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a second preset angle, wherein the second preset angle is the sum of 90 degrees and a first difference value, the first difference value is the difference value obtained by subtracting the first preset angle from the second difference value, and the second difference value is the difference value between the second actual offset angle and the second reference offset angle; and acquiring a side image of the capacitor to be detected, and obtaining a second side image.

Optionally, after rotating the capacitor to be measured by a second predetermined angle, rotating the capacitor to be measured by a corresponding predetermined angle, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a third preset angle, wherein the third preset angle is the sum of 90 degrees and a third difference value, the third difference value is the difference value obtained by subtracting the second difference value from a fourth difference value, and the fourth difference value is the difference value between the first actual offset angle and the third reference offset angle; and acquiring a side image of the capacitor to be detected, and obtaining a third side image.

Optionally, after rotating the capacitor to be measured by a third predetermined angle, rotating the capacitor to be measured by a corresponding predetermined angle, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a fourth preset angle, wherein the fourth preset angle is the sum of 90 degrees and a fifth difference value, the fifth difference value is the difference value obtained by subtracting the fourth difference value from a sixth difference value, and the sixth difference value is the difference value between the second actual offset angle and the fourth reference offset angle; and acquiring a side image of the capacitor to be detected, and obtaining a fourth side image.

Optionally, determining the flaw of the capacitor terminal to be tested according to the side image and the end image includes: determining a scorching flaw of a fifth surface according to the first side image, wherein the fifth surface is a surface of the second negative terminal facing the bottom end of the second negative terminal; determining a scorching flaw of a sixth surface according to the second side image, wherein the sixth surface is a surface of the second positive terminal, which faces to the bottom end of the second positive terminal; determining a scorching flaw of a seventh surface according to the third side image, wherein the seventh surface is a surface of the second negative terminal, which is opposite to the bottom end of the second negative terminal; and determining a scorching flaw of an eighth surface according to the fourth side image, wherein the eighth surface is a surface of the second positive terminal, which is opposite to the bottom end of the second positive terminal.

Optionally, determining the flaw of the capacitor terminal to be tested according to the side image and the end image, further includes: obtaining a connection line of a thirteenth position point and a fourteenth position point to obtain a seventh connection line, wherein the thirteenth position point and the fourteenth position point are all points on the edge of the bottom end of the second negative electrode terminal in the end face image, the edge of the bottom end of the second negative electrode terminal is the edge of the bottom end of the second negative electrode terminal far away from the second negative electrode terminal leading-out end, and the thirteenth position point and the fourteenth position point are different in position; determining an included angle between the seventh connecting line and the fifth connecting line to obtain a first included angle; determining a first distance and a second distance, wherein the first distance is the distance from the thirteenth position point to the fifth connecting line, and the second distance is the distance from the fourteenth position point to the fifth connecting line; and determining whether the second negative electrode terminal is skewed according to the first included angle, the first distance and the second distance.

Optionally, determining whether the second negative terminal is skewed according to the first included angle, the first distance, and the second distance includes: and determining that the second negative terminal is not skewed in the case that the first included angle is within a first predetermined range, the first distance is within a second predetermined range, and the second distance is within a third predetermined range.

Optionally, the second positive terminal further includes a second positive terminal bottom end, and the determining the flaw of the capacitor terminal to be measured according to the side image and the end face image further includes: acquiring a connection line of a fifteenth position point and a sixteenth position point to obtain an eighth connection line, wherein the fifteenth position point and the sixteenth position point are all points on the edge of the bottom end of the second positive terminal in the end face image, the edge of the bottom end of the second positive terminal is the edge of the bottom end of the second positive terminal far away from the second positive terminal leading-out end, and the fifteenth position point and the sixteenth position point are different in position; determining an included angle between the eighth connecting line and the sixth connecting line to obtain a second included angle; determining a third distance and a fourth distance, wherein the third distance is the distance from the fifteenth position point to the sixth connecting line, and the fourth distance is the distance from the sixteenth position point to the sixth connecting line; and determining whether the second positive terminal is skewed according to the second included angle, the third distance and the fourth distance.

Optionally, determining whether the second positive terminal is skewed according to the second included angle, the third distance, and the fourth distance includes: and determining that the second positive terminal is not skewed in the case where the second included angle is within a fourth predetermined range, the third distance is within a fifth predetermined range, and the fourth distance is within a sixth predetermined range.

According to another aspect of the embodiments of the present invention, there is provided a device for detecting flaws of a capacitor terminal, where a capacitor to be detected includes a capacitor body to be detected and a capacitor terminal to be detected, the capacitor terminal to be detected is located on a predetermined end face of the capacitor body to be detected, the device includes: a first acquisition unit configured to acquire a reference end face image including an image of a reference capacitor terminal and an image of a reference predetermined end face, the reference capacitor including a reference capacitor body and the reference capacitor terminal, wherein the reference capacitor terminal is located on the reference predetermined end face of the reference capacitor body; the second acquisition unit is used for acquiring an end face image of the capacitor to be detected, wherein the end face image comprises an image of the capacitor terminal to be detected and an image of the end face where the capacitor terminal to be detected is located; a first determining unit, configured to determine a reference offset angle according to the reference end face image, and determine an actual offset angle according to the end face image; the third acquisition unit is used for controlling the capacitor to be detected to rotate by a preset angle, and acquiring a side image of the capacitor terminal to be detected, wherein the preset angle is calculated according to the reference offset angle and the actual offset angle; and the second determining unit is used for determining flaws of the capacitor terminal to be tested according to the side image and the end face image.

According to still another aspect of the embodiments of the present invention, there is also provided a storage medium including a stored program, wherein the program executes any one of the detection methods.

According to still another aspect of the embodiments of the present invention, there is further provided a processor, where the processor is configured to execute a program, where the program executes any one of the detection methods.

In the embodiment of the invention, in the detection method, a reference end face image is firstly obtained, then an end face image of a capacitor to be detected is obtained, then a reference offset angle is determined according to the reference end face image, an actual offset angle is determined according to the end face image, then a preset angle obtained by calculation according to the reference offset angle and the actual offset angle is obtained, the capacitor to be detected is controlled to rotate by a preset angle, a side face image of a capacitor terminal to be detected is obtained, and finally flaws of the capacitor terminal to be detected are determined according to the side face image and the end face image. According to the method, the reference offset angle is determined through the reference end face image, and the actual offset angle is determined through the end face image of the capacitor to be detected, so that the preset angle is calculated, the side face image of the capacitor terminal to be detected is obtained after the capacitor to be detected is controlled to rotate by the preset angle, the side face image of the capacitor terminal to be detected can show the burning defect of the capacitor terminal, whether the capacitor terminal is inclined or not can be determined through the image of the capacitor terminal to be detected in the end face image of the capacitor to be detected, the defect detection accuracy is improved, and the problem that the defect detection of the capacitor terminal in the prior art is inaccurate is solved.

Drawings

The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application. In the drawings:

Fig. 1 shows a flowchart of a method for detecting flaws in a capacitive terminal according to an embodiment of the present application;

FIG. 2 shows a schematic representation of a first reference side image according to an embodiment of the application;

FIG. 3 shows a schematic diagram of a reference side image containing shadows according to one embodiment of the present application;

FIG. 4 shows a schematic view of a first reference end face image according to an embodiment of the application;

FIG. 5 shows a schematic diagram of a second reference side image according to an embodiment of the application;

FIG. 6 shows a schematic diagram of a second reference end face image according to an embodiment of the application;

FIG. 7 shows a schematic representation of a third reference side image according to an embodiment of the application;

FIG. 8 shows a schematic representation of a third reference end face image according to an embodiment of the application;

FIG. 9 shows a schematic representation of a fourth reference side image according to an embodiment of the application;

FIG. 10 shows a schematic representation of a fourth reference end face image according to an embodiment of the application;

FIG. 11 shows a schematic diagram of an end-face image of a capacitance under test according to an embodiment of the application;

FIG. 12 shows a schematic representation of a first side image according to an embodiment of the application;

FIG. 13 shows a schematic diagram of a second side image according to an embodiment of the application;

FIG. 14 shows a schematic representation of a third side image according to an embodiment of the application;

FIG. 15 shows a schematic representation of a fourth side image according to an embodiment of the application;

FIG. 16 shows a schematic diagram of an end-face image of a capacitance under test according to another embodiment of the application;

FIG. 17 shows a schematic diagram of a device for detecting imperfections of a capacitive terminal according to an embodiment of the application;

Fig. 18 is a schematic diagram showing an application scenario of a method for detecting flaws of a capacitive terminal according to an embodiment of the present application;

FIG. 19 shows a flowchart of a process of acquiring a first reference offset angle and a second reference offset angle according to one embodiment of the application;

FIG. 20 shows a flowchart of a process of obtaining a third reference offset angle and a fourth reference offset angle in accordance with one embodiment of the application;

FIG. 21 shows a flow chart of a scorch flaw detection procedure according to one embodiment of the present application; and

Fig. 22 shows a flowchart of a skew flaw detection flow according to an embodiment of the present application.

Wherein the above figures include the following reference numerals:

10. A reference capacitance; 11. a reference capacitor body; 12. a first negative terminal lead; 121. a first surface; 122. a third surface; 123. a first location point; 124. a second location point; 125. a fifth location point; 126. a sixth location point; 13. a first positive terminal lead-out terminal; 131. a second surface; 132. a fourth surface; 133. a third location point; 134. a fourth location point; 135. a seventh location point; 136. an eighth location point; 14. a first negative terminal bottom end; 15. the bottom end of the first positive terminal; 20. capacitance to be measured; 21. a capacitor body to be measured; 22. a second negative terminal lead; 221. a fifth surface; 222. a seventh surface; 223. a ninth location point; 224. a tenth location point; 23. a second positive terminal lead-out terminal; 231. a sixth surface; 232. an eighth surface; 233. an eleventh location point; 234. a twelfth location point; 24. the bottom end of the second negative terminal; 241. a thirteenth location point; 242. a fourteenth location point; 25. the bottom end of the second positive terminal; 251. a fifteenth location point; 252. a sixteenth location point; 30. a turntable; 31. a fixing member; 40. a first camera; 50. a second camera; 60. and a third camera.

Detailed Description

It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other. The application will be described in detail below with reference to the drawings in connection with embodiments.

In order that those skilled in the art will better understand the present application, a technical solution in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present application without making any inventive effort, shall fall within the scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate in order to describe the embodiments of the application herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present. Furthermore, in the description and in the claims, when an element is described as being "connected" to another element, the element may be "directly connected" to the other element or "connected" to the other element through a third element.

As described in the background art, in order to solve the foregoing problem, in an exemplary embodiment of the present application, a method, an apparatus, a storage medium, and a processor for detecting a defect of a capacitor terminal are provided.

According to an embodiment of the present application, there is provided a method for detecting flaws of a capacitor terminal, as shown in fig. 11 to 16, a capacitor 20 to be measured includes a capacitor body 21 to be measured and a capacitor terminal to be measured, the capacitor terminal to be measured being located on a predetermined end face of the capacitor body 21 to be measured.

Fig. 1 is a flowchart of a method for detecting flaws in a capacitor terminal according to an embodiment of the present application. As shown in fig. 1, the method comprises the steps of:

Step S101, acquiring a reference end face image, where the reference end face image includes an image of a reference capacitor terminal and an image of a reference predetermined end face, and as shown in fig. 2 to 10, the reference capacitor 10 includes a reference capacitor body 11 and the reference capacitor terminal, where the reference capacitor terminal is located on the reference predetermined end face of the reference capacitor body 11;

Step S102, acquiring an end face image of the capacitor to be tested, wherein the end face image comprises an image of the capacitor terminal to be tested and an image of the end face of the capacitor terminal to be tested;

Step S103, determining a reference offset angle according to the reference end face image, and determining an actual offset angle according to the end face image;

step S104, controlling the capacitor to be tested to rotate by a preset angle, and acquiring a side image of the capacitor terminal to be tested, wherein the preset angle is calculated according to the reference offset angle and the actual offset angle;

and step S105, determining flaws of the capacitor terminals to be tested according to the side surface image and the end surface image.

In the detection method, firstly, a reference end face image is acquired, then, an end face image of a capacitor to be detected is acquired, then, a reference offset angle is determined according to the reference end face image, an actual offset angle is determined according to the end face image, then, a preset angle obtained through calculation according to the reference offset angle and the actual offset angle is controlled to rotate by a preset angle, a side face image of the capacitor terminal to be detected is acquired, and finally, flaws of the capacitor terminal to be detected are determined according to the side face image and the end face image. According to the method, the reference offset angle is determined through the reference end face image, and the actual offset angle is determined through the end face image of the capacitor to be detected, so that the preset angle is calculated, the side face image of the capacitor terminal to be detected is obtained after the capacitor to be detected is controlled to rotate by the preset angle, the side face image of the capacitor terminal to be detected can show the burning defect of the capacitor terminal, whether the capacitor terminal is inclined or not can be determined through the image of the capacitor terminal to be detected in the end face image of the capacitor to be detected, the defect detection accuracy is improved, and the problem that the defect detection of the capacitor terminal in the prior art is inaccurate is solved.

It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer executable instructions, and that although a logical order is illustrated in the flowcharts, in some cases the steps illustrated or described may be performed in an order other than that illustrated herein.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first negative terminal, the first negative terminal includes a first negative terminal lead-out end 12 and a first negative terminal bottom end 14, the first negative terminal bottom end 14 is located on the reference predetermined end surface in contact, the first surface 121 is a surface of the first negative terminal lead-out end 12 facing the first negative terminal bottom end 14, the first surface 121 is perpendicular to the reference predetermined end surface, the reference end surface image includes a first reference end surface image, and the process of acquiring the first reference end surface image includes: controlling the reference capacitor 10 to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor 10; when it is determined that the shadow of the first surface 121 does not exist in the reference side image, the reference capacitor 10 is controlled to stop rotating, and the reference side image is determined to be the first reference side image, as shown in fig. 2; and acquiring a reference end face image, and determining the reference end face image as a first reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the first surface 121 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a first reference side image, which may exhibit a scorching defect of the first surface, in which case a reference end face image is acquired, which is noted as a first reference end face image, so that the offset angle of the first surface 121 can be determined by the first reference end face image.

In the actual detection process, the angle of the side image selected by capturing the reference capacitor is not suitable, which may cause a shadow of the surface of the reference capacitor terminal in the side image, for example, as shown in fig. 3, a plurality of shadows exist on the first surface 121.

In one embodiment of the present application, as shown in fig. 4, the determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the first reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the first reference end face image, a Y axis of the coordinate system is parallel to a second edge of the first reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connection line between a first position point 123 and a second position point 124, to obtain a first connection line, where the first position point 123 and the second position point 124 are points on an edge of a top surface of the first negative terminal lead-out end in the first reference end surface image, and positions of the first position point and the second position point are different; and determining an included angle between the first connecting line and the X axis to obtain a first reference offset angle. Specifically, a coordinate system is established on the first reference end face image, two points, namely a first position point 123 and a second position point 124, are selected on the edge of the top face of the first negative terminal leading-out end, the top face is the surface with the largest distance from the bottom end 14 of the first negative terminal in the surface of the first negative terminal leading-out end, the two points are connected to obtain a first connecting line, the included angle between the first connecting line and the X axis is calculated, and the offset angle of the first surface can be obtained and is recorded as a first reference offset angle a, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the burning defect of the capacitor terminal can be acquired conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first positive electrode terminal, the first positive electrode terminal includes a first positive electrode terminal lead-out terminal 13 and a first positive electrode terminal bottom end 15, the first positive electrode terminal bottom end 15 is located on the reference predetermined end surface in contact, the second surface 131 is a surface of the first positive electrode terminal lead-out terminal 13 facing the first positive electrode terminal bottom end 15, the reference end surface image includes a second reference end surface image, and the process of acquiring the second reference end surface image includes: controlling the reference capacitor 10 to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor 10; in a case where it is determined that the shadow of the second surface 131 does not exist in the reference side image, the reference capacitor 10 is controlled to stop rotating, and the reference side image is determined to be the first reference side image, as shown in fig. 5; and acquiring a reference end face image, and determining the reference end face image as a second reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until no shadow of the second surface 131 exists in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a second reference side image, where the second reference side image may exhibit a scorching defect of the second surface 131, in which case a reference end face image is acquired and is recorded as a second reference end face image, so that the offset angle of the second surface 131 can be determined by the second reference end face image.

In one embodiment of the present application, as shown in fig. 6, the determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the second reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the second reference end face image, a Y axis of the coordinate system is parallel to a second edge of the second reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a second connection line by obtaining a connection line between a third position point 133 and a fourth position point 134, wherein the third position point 133 and the fourth position point 134 are points on the top surface edge of the first positive electrode terminal lead-out end in the second reference end surface image, and the positions of the third position point 133 and the fourth position point 134 are different; and determining an included angle between the second connecting line and the X axis to obtain a second reference offset angle. Specifically, a coordinate system is established on the second reference end face image, two points, namely a third position point 133 and a fourth position point 134, are selected on the top face edge of the first positive electrode terminal leading-out end, the top face is the surface with the largest distance from the bottom end 15 of the first positive electrode terminal in the surface of the first positive electrode terminal leading-out end, the two points are connected to obtain a second connecting line, the included angle between the second connecting line and the X axis is calculated, and the offset angle of the second surface can be obtained and is recorded as a second reference offset angle b, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the terminal scorching flaw can be obtained conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first negative terminal, the first negative terminal includes a first negative terminal lead-out end 12 and a first negative terminal bottom end 14, the first negative terminal bottom end 14 is located on the reference predetermined end surface in contact, the third surface 122 is a surface of the first negative terminal lead-out end 12 facing away from the first negative terminal bottom end 14, the reference end surface image includes a third reference end surface image, and the process of acquiring the third reference end surface image includes: controlling the reference capacitor 10 to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor 10; when it is determined that the shadow of the third surface 122 does not exist in the reference side image, the reference capacitor 10 is controlled to stop rotating, and the reference side image is determined to be a third reference side image, as shown in fig. 7; and acquiring a reference end face image, and determining the reference end face image as a third reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the third surface 122 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a third reference side image, where the third reference side image may present a scorching defect of the third surface 122, in this case, a reference end face image is acquired, and the reference end face image is recorded as a third reference end face image, so that the offset angle of the third surface 122 can be determined by the third reference end face image.

In one embodiment of the present application, as shown in fig. 8, the determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the third reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the third reference end face image, a Y axis of the coordinate system is parallel to a second edge of the third reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a third connection line by obtaining a connection line between a fifth position point 125 and a sixth position point 126, wherein the fifth position point 125 and the sixth position point 126 are points on the top surface edge of the first negative terminal lead-out end in the third reference end surface image, and the positions of the fifth position point 125 and the sixth position point 126 are different; and determining an included angle between the third connecting line and the X axis to obtain a third reference offset angle. Specifically, a coordinate system is established on the third reference end face image, two points, namely a fifth position point 125 and a sixth position point 126, are selected on the edge of the top face of the first negative terminal leading-out end, the top face is the surface with the largest distance from the bottom end 14 of the first negative terminal in the surface of the first negative terminal leading-out end, the two points are connected to obtain a third connecting line, the included angle between the third connecting line and the X axis is calculated, and the offset angle of the third surface can be obtained and is recorded as a third reference offset angle c, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the burning defect of the terminal can be acquired conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first positive electrode terminal, the first positive electrode terminal includes a first positive electrode terminal lead-out terminal 13 and a first positive electrode terminal bottom end 15, the first positive electrode terminal bottom end 15 is located on the reference predetermined end surface in contact, a fourth surface 132 is a surface of the first positive electrode terminal lead-out terminal 13 facing away from the first positive electrode terminal bottom end 15, the reference end surface image includes a fourth reference end surface image, and the process of acquiring the fourth reference end surface image includes: controlling the reference capacitor 10 to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor 10; when it is determined that the shadow of the fourth surface 132 does not exist in the reference side image, the reference capacitor 10 is controlled to stop rotating, and the reference side image is determined to be a fourth reference side image, as shown in fig. 9; and acquiring a reference end face image, and determining the reference end face image as a fourth reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the fourth surface 132 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a fourth reference side image, which may present a scorch defect of the fourth surface 132, in which case a reference end face image is acquired, which is denoted as a fourth reference end face image, so that the offset angle of the fourth surface 132 can be determined by the fourth reference end face image.

In one embodiment of the present application, as shown in fig. 10, the determining a reference offset angle according to the reference end face image further includes: establishing a coordinate system on the fourth reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the fourth reference end face image, a Y axis of the coordinate system is parallel to a second edge of the fourth reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a fourth connecting line by obtaining a connecting line of a seventh position point 135 and an eighth position point 136, wherein the seventh position point 135 and the eighth position point 136 are all points on the top surface edge of the first positive electrode terminal lead-out end in the fourth reference end surface image, and the positions of the seventh position point 135 and the eighth position point 136 are different; and determining an included angle between the fourth connecting line and the X axis to obtain a fourth reference offset angle. Specifically, a coordinate system is established on the fourth reference end face image, two points, namely a seventh position point 135 and an eighth position point 136, are selected on the top face edge of the first positive electrode terminal leading-out end, the top face is the surface with the largest distance from the bottom end 15 of the first positive electrode terminal in the surface of the first positive electrode terminal leading-out end, the two points are connected to obtain a fourth connecting line, an included angle between the fourth connecting line and the X axis is calculated, and the offset angle of the fourth surface can be obtained and is recorded as a fourth reference offset angle d, so that the rotation angle of the capacitor to be measured can be corrected conveniently and the side face image which can present the terminal scorching flaw can be obtained conveniently.

In one embodiment of the present application, as shown in fig. 11, determining the actual offset angle according to the end face image includes: establishing a coordinate system on the end face image, wherein an X axis of the coordinate system is parallel to a first edge of the end face image, a Y axis of the coordinate system is parallel to a second edge of the end face image, and the first edge is adjacent to and perpendicular to the second edge; and determining the actual offset angle according to the coordinate system. Specifically, a coordinate system is established on an end face image of the capacitor to be measured, namely, an actual offset angle can be calculated according to the coordinate system, wherein the actual offset angle comprises an offset angle of the second negative terminal leading-out end and the second positive terminal leading-out end.

In one embodiment of the present application, as shown in fig. 11 to 16, the capacitor to be measured 20 includes a second negative terminal, the second negative terminal includes a second negative terminal lead 22 and a second negative terminal bottom 24, the second negative terminal bottom 24 is located on the predetermined end face in contact, and determining the actual offset angle according to the coordinate system includes: obtaining a fifth connection line by obtaining a connection line between a ninth position point 223 and a tenth position point 224, wherein, as shown in fig. 11, the ninth position point 223 and the tenth position point 224 are points on the top surface edge of the second negative terminal lead-out terminal 22 in the end surface image, and the positions of the ninth position point 223 and the tenth position point 224 are different; and determining an included angle between the fifth connecting line and the X axis to obtain a first actual offset angle. Specifically, two points, namely a ninth position point 223 and the tenth position point 224, are selected on the edge of the top surface of the second negative terminal lead-out end 22, where the top surface is the surface with the largest distance from the bottom end 24 of the second negative terminal, and the two points are connected to obtain a fifth connection line, and an included angle between the fifth connection line and the X axis is calculated, so that an offset angle of the second negative terminal lead-out end 22 is obtained and is recorded as a first actual offset angle e, so that a proper predetermined angle is conveniently determined.

In one embodiment of the present application, as shown in fig. 11 to 16, the capacitor 20 to be measured includes a second positive terminal, the second positive terminal includes a second positive terminal lead-out end 23 and a second positive terminal bottom end 25, the second positive terminal bottom end 25 is located on the predetermined end face in contact, and determining the actual offset angle according to the coordinate system includes: obtaining a sixth connection line by obtaining a connection line between an eleventh position point 233 and a twelfth position point 234, wherein each of the eleventh position point 233 and the twelfth position point 234 is a point on a top surface edge of the second positive electrode terminal lead-out terminal in the end surface image, and positions of the eleventh position point 233 and the twelfth position point 234 are different from each other, as shown in fig. 11; and determining an included angle between the sixth connecting line and the Y axis to obtain a second actual offset angle. Specifically, two points, namely an eleventh position point 233 and a twelfth position point 234, are selected on the edge of the top surface of the second positive terminal lead-out end 23, the top surface is the surface with the largest distance from the bottom end 25 of the second positive terminal, the two points are connected to obtain a sixth connecting line, and an included angle between the sixth connecting line and the X axis is calculated, so that an offset angle of the second positive terminal lead-out end 23 is obtained and is recorded as a second actual offset angle f, so that a proper predetermined angle can be conveniently determined.

In one embodiment of the present application, rotating the capacitor to be measured by a predetermined angle to obtain a side image of the capacitor to be measured includes: rotating the capacitor to be measured by a first preset angle, wherein the first preset angle is a difference value obtained by subtracting the first reference offset angle from the first actual offset angle; and acquiring the side image of the capacitor to be measured to obtain a first side image, as shown in fig. 12. Specifically, a first predetermined angle a is calculated according to the first actual offset angle e and the first reference offset angle a, that is, a=e-a, after the capacitor to be measured is rotated by the first predetermined angle a, a side image of the capacitor to be measured is obtained, and a first side image is obtained, as shown in fig. 12, where the first side image may exhibit a scorching defect of the fifth surface 221, that is, a scorching defect of a surface of the second negative terminal lead-out end 22 facing the second negative terminal bottom end 24.

In an embodiment of the present application, after rotating the capacitor to be measured by a first predetermined angle, rotating the capacitor to be measured by a predetermined angle corresponding to the rotation, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a second preset angle, wherein the second preset angle is the sum of 90 degrees and a first difference value, the first difference value is the difference value obtained by subtracting the first preset angle from the second difference value, and the second difference value is the difference value between the second actual offset angle and the second reference offset angle; and acquiring a side image of the capacitor to be measured to obtain a second side image, as shown in fig. 13. Specifically, a second predetermined angle B is calculated according to the first actual offset angle e, the second actual offset angle f, the first reference offset angle a and the second reference offset angle B, that is, b=90+ (e-c) - (f-B), after the capacitor to be measured is rotated by the second predetermined angle B, a side image of the capacitor to be measured is obtained, and a second side image is obtained, as shown in fig. 13, the second side image may exhibit a scorch defect of the sixth surface 231, that is, a scorch defect of a surface of the second positive terminal lead-out terminal 23 facing the second positive terminal bottom end 25.

In an embodiment of the present application, after rotating the capacitor to be measured by a second predetermined angle, rotating the capacitor to be measured by a predetermined angle corresponding to the rotation, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a third preset angle, wherein the third preset angle is the sum of 90 degrees and a third difference value, the third difference value is the difference value obtained by subtracting the second difference value from a fourth difference value, and the fourth difference value is the difference value between the first actual offset angle and the third reference offset angle; and acquiring a side image of the capacitor to be measured to obtain a third side image, as shown in fig. 14. Specifically, a third predetermined angle C is calculated according to the first actual offset angle e, the second actual offset angle f, the second reference offset angle b and the third reference offset angle C, that is, c=90+ (e-C) - (f-b), after the capacitor to be measured is rotated by the third predetermined angle C, a side image of the capacitor to be measured is obtained, and a third side image is obtained, as shown in fig. 14, the third side image may exhibit a scorching defect of the seventh surface 222, that is, a scorching defect of a surface of the second negative terminal lead-out end 22 facing away from the second negative terminal bottom end 24.

In an embodiment of the present application, after rotating the capacitor to be measured by a third predetermined angle, rotating the capacitor to be measured by a predetermined angle corresponding to the rotation, to obtain a side image of the capacitor to be measured, and further including: rotating the capacitor to be measured by a fourth preset angle, wherein the fourth preset angle is the sum of 90 degrees and a fifth difference value, the fifth difference value is the difference value obtained by subtracting the fourth difference value from a sixth difference value, and the sixth difference value is the difference value between the second actual offset angle and the fourth reference offset angle; and acquiring a side image of the capacitor to be measured to obtain a fourth side image, as shown in fig. 15. Specifically, a fourth predetermined angle D is calculated according to the first actual offset angle e, the second actual offset angle f, the third reference offset angle c and the fourth reference offset angle D, that is, d=90+ (f-D) - (e-c), after the capacitor to be measured is rotated by the fourth predetermined angle D, a side image of the capacitor to be measured is obtained, and a fourth side image is obtained, as shown in fig. 15, the fourth side image may exhibit a scorching defect of the eighth surface 232, that is, a scorching defect of a surface of the second positive terminal lead-out terminal 23 facing away from the second positive terminal bottom end 25.

In one embodiment of the present application, determining the defect of the capacitor terminal to be tested according to the side image and the end image includes: determining a scorching flaw of a fifth surface according to the first side image, wherein the fifth surface is a surface of the second negative terminal, which faces to the bottom end of the second negative terminal; determining a scorching defect of a sixth surface according to the second side image, wherein the sixth surface is a surface of the second positive terminal, which faces the bottom end of the second positive terminal; determining a scorching defect of a seventh surface according to the third side image, wherein the seventh surface is a surface of the second negative electrode terminal, which is opposite to the bottom end of the second negative electrode terminal; and determining a scorching defect of an eighth surface according to the fourth side image, wherein the eighth surface is a surface of the second positive terminal, which is opposite to the bottom end of the second positive terminal. Specifically, the scorching flaws of the fifth surface, i.e., the scorching flaws of the surface of the second negative terminal lead-out 22 facing the second negative terminal bottom end 24 are detected by the first side image, the scorching flaws of the sixth surface, i.e., the scorching flaws of the surface of the second positive terminal lead-out 23 facing the second positive terminal bottom end 25 are detected by the second side image, the scorching flaws of the seventh surface, i.e., the scorching flaws of the surface of the second negative terminal lead-out 22 facing away from the second negative terminal bottom end 24 are detected by the third side image, and the scorching flaws of the eighth surface, i.e., the scorching flaws of the surface of the second positive terminal lead-out 23 facing away from the second positive terminal bottom end 25, are detected by the fourth side image, are determined by the first side image.

In one embodiment of the present application, as shown in fig. 16, determining the defect of the capacitor terminal to be tested according to the side image and the end image further includes: obtaining a seventh connection line by obtaining a connection line between a thirteenth position point 241 and a fourteenth position point 242, wherein the thirteenth position point 241 and the fourteenth position point 242 are points on an edge of the second negative terminal bottom end 24 in the end face image, the edge of the second negative terminal bottom end is an edge of the second negative terminal bottom end 24 away from the second negative terminal lead-out end, and positions of the thirteenth position point 241 and the fourteenth position point 242 are different; determining an included angle between the seventh connecting line and the fifth connecting line to obtain a first included angle; determining a first distance from the thirteenth position point 241 to the fifth line and a second distance from the fourteenth position point 242 to the fifth line; and determining whether the second negative electrode terminal is skewed according to the first included angle, the first distance and the second distance. Specifically, two points are taken at the edge of the bottom end of the second negative electrode terminal, a seventh connecting line is obtained by connecting the two points, the connecting line of the two points on the edge of the top surface of the leading-out end of the second negative electrode terminal is a fifth connecting line, whether the second negative electrode terminal is inclined or not is determined according to the first included angle, the first distance and the second distance, namely whether the second negative electrode terminal is inclined or not is judged according to the included angle between the fifth connecting line and the seventh connecting line and the three data of the distances from the two ends of the seventh connecting line to the fifth connecting line, and the accuracy of skew flaw detection is improved.

In one embodiment of the present application, determining whether the second negative electrode terminal is skewed according to the first included angle, the first distance, and the second distance includes: and determining that the second negative electrode terminal is not skewed when the first included angle is within a first predetermined range, the first distance is within a second predetermined range, and the second distance is within a third predetermined range. Specifically, the first included angle is in a first preset range, the first distance is in a second preset range and the second distance is in a third preset range, namely, the included angle between the fifth connecting line and the seventh connecting line and the distance from the two ends of the seventh connecting line to the fifth connecting line are all in the corresponding preset ranges, so that the second negative electrode terminal can be determined not to be askew, skew flaw detection omission is further avoided, and accuracy of skew flaw detection is improved.

It should be noted that, a person skilled in the art may select the appropriate first predetermined range, second predetermined range, and third predetermined range according to the actual situation.

In one embodiment of the present application, as shown in fig. 16, the second positive terminal further includes a second positive terminal bottom end, and the determining the defect of the capacitor terminal to be tested according to the side image and the end image further includes: obtaining a connection line between a fifteenth position point 251 and a sixteenth position point 252, to obtain an eighth connection line, wherein the fifteenth position point 251 and the sixteenth position point 252 are points on edges of the bottom end of the second positive electrode terminal in the end face image, the edges of the bottom end of the second positive electrode terminal are edges of the bottom end 25 of the second positive electrode terminal far from the second positive electrode terminal leading-out end, and positions of the fifteenth position point 251 and the sixteenth position point 252 are different; determining an included angle between the eighth connecting line and the sixth connecting line to obtain a second included angle; determining a third distance and a fourth distance, wherein the third distance is a distance from the fifteenth location point 251 to the sixth connecting line, and the fourth distance is a distance from the sixteenth location point 252 to the sixth connecting line; and determining whether the second positive terminal is skewed according to the second included angle, the third distance and the fourth distance. Specifically, two points are taken at the edge of the bottom end of the second positive terminal, an eighth connecting line is obtained by connecting the two points, a sixth connecting line is connected to the two points on the edge of the top surface of the leading-out end of the second positive terminal, whether the second positive terminal is skewed or not is determined according to the second included angle, the third distance and the fourth distance, namely whether the second positive terminal is skewed or not is judged through three data of the included angle between the sixth connecting line and the eighth connecting line and the distance from the two ends of the eighth connecting line to the sixth connecting line, and accuracy of skew flaw detection is improved.

In one embodiment of the present application, determining whether the second positive terminal is skewed according to the second included angle, the third distance, and the fourth distance includes: and determining that the second positive electrode terminal is not skewed when the second included angle is within a fourth predetermined range, the third distance is within a fifth predetermined range, and the fourth distance is within a sixth predetermined range. Specifically, the second included angle is in a fourth preset range, the third distance is in a fifth preset range and the fourth distance is in a sixth preset range, namely, the included angle between the sixth connecting line and the eighth connecting line and the distance between the two ends of the eighth connecting line and the sixth connecting line are all in the corresponding preset ranges, so that the second positive terminal can be determined not to be askew, skew flaw missing detection is further avoided, and accuracy of skew flaw detection is improved.

It should be noted that, a person skilled in the art may select the fourth predetermined range, the fifth predetermined range, and the sixth predetermined range as appropriate according to the actual situation.

The embodiment of the application also provides a device for detecting flaws of a capacitor terminal, as shown in fig. 11 to 16, the capacitor 20 to be detected includes a capacitor body 21 to be detected and a capacitor terminal to be detected, where the capacitor terminal to be detected is located on a predetermined end face of the capacitor body 21 to be detected. The detection device for the defects of the capacitor terminal according to the embodiment of the application can be used for executing the detection method for the defects of the capacitor terminal provided by the embodiment of the application. The following describes a device for detecting flaws of a capacitor terminal provided by an embodiment of the present application.

Fig. 17 is a schematic diagram of a device for detecting flaws of a capacitor terminal according to an embodiment of the present application. As shown in fig. 17, the apparatus includes:

A first acquisition unit 100 configured to acquire a reference end face image including an image of a reference capacitor terminal and an image of a reference predetermined end face, as shown in fig. 2 to 10, the reference capacitor 10 including a reference capacitor body 11 and the reference capacitor terminal, wherein the reference capacitor terminal is located on the reference predetermined end face of the reference capacitor body 11;

A second obtaining unit 200, configured to obtain an end face image of the capacitor to be measured, where the end face image includes an image of the capacitor terminal to be measured and an image of an end face where the capacitor terminal to be measured is located;

A first determining unit 300 for determining a reference offset angle based on the reference end face image and determining an actual offset angle based on the end face image;

A third obtaining unit 400, configured to control the capacitor to be tested to rotate by a predetermined angle, and obtain a side image of the capacitor terminal to be tested, where the predetermined angle is calculated according to the reference offset angle and the actual offset angle;

And a second determining unit 500 for determining flaws of the capacitor terminals to be tested according to the side image and the end image.

In the above detection device, the first acquisition unit acquires a reference end face image, the second acquisition unit acquires an end face image of the capacitor to be detected, the first determination unit determines a reference offset angle according to the reference end face image, the first determination unit determines an actual offset angle according to the end face image, the third acquisition unit calculates a predetermined angle according to the reference offset angle and the actual offset angle, and controls the capacitor to be detected to rotate by a predetermined angle, so as to acquire a side face image of the capacitor terminal to be detected, and the second determination unit determines flaws of the capacitor terminal to be detected according to the side face image and the end face image. According to the device, the reference offset angle is determined through the reference end face image, and the actual offset angle is determined through the end face image of the capacitor to be detected, so that the preset angle is calculated, the side face image of the capacitor terminal to be detected is obtained after the capacitor to be detected is controlled to rotate by the preset angle, the side face image of the capacitor terminal to be detected can show the burning defect of the capacitor terminal, whether the capacitor terminal is inclined or not can be determined through the image of the capacitor terminal to be detected in the end face image of the capacitor to be detected, the defect detection accuracy is improved, and the problem that the defect detection of the capacitor terminal in the prior art is inaccurate is solved.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first negative terminal, the first negative terminal includes a first negative terminal lead-out end 12 and a first negative terminal bottom end 14, the first negative terminal bottom end 14 is located in contact with the reference predetermined end surface, a first surface 121 is a surface of the first negative terminal lead-out end 12 facing the first negative terminal bottom end 14, the first surface 121 is perpendicular to the reference predetermined end surface, the reference end surface image includes a first reference end surface image, the first acquisition unit includes a first acquisition module, a first determination module, and a second acquisition module, wherein the first acquisition module is configured to control the reference capacitor 10 to rotate and acquire a reference side surface image, and the reference side surface image is a side surface image of the reference capacitor 10; the first determining module is configured to control the reference capacitor 10 to stop rotating when it is determined that the shadow of the first surface 121 does not exist in the reference side image, and determine that the reference side image is the first reference side image, as shown in fig. 2; the second acquisition module is used for acquiring a reference end face image and determining the reference end face image as a first reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the first surface 121 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a first reference side image, which may exhibit a scorching defect of the first surface, in which case a reference end face image is acquired, which is noted as a first reference end face image, so that the offset angle of the first surface 121 can be determined by the first reference end face image.

In one embodiment of the present application, as shown in fig. 4, the first determining unit further includes a first processing module, a third obtaining module, and a second determining module, where the first processing module is configured to establish a coordinate system on the first reference end face image, an X axis of the coordinate system is parallel to a first edge of the first reference end face image, a Y axis of the coordinate system is parallel to a second edge of the first reference end face image, and the first edge is adjacent to and perpendicular to the second edge; the third obtaining module is configured to obtain a connection between a first location point 123 and a second location point 124, where the first location point 123 and the second location point 124 are points on an edge of a top surface of the first negative terminal lead-out end in the first reference end surface image, and locations of the first location point and the second location point are different; the second determining module is used for determining an included angle between the first connecting line and the X axis to obtain a first reference deviation angle. Specifically, a coordinate system is established on the first reference end face image, two points, namely a first position point 123 and a second position point 124, are selected on the edge of the top face of the first negative terminal leading-out end, the top face is the surface with the largest distance from the bottom end 14 of the first negative terminal in the surface of the first negative terminal leading-out end, the two points are connected to obtain a first connecting line, the included angle between the first connecting line and the X axis is calculated, and the offset angle of the first surface can be obtained and is recorded as a first reference offset angle a, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the burning defect of the capacitor terminal can be acquired conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first positive electrode terminal, the first positive electrode terminal includes a first positive electrode terminal lead-out terminal 13 and a first positive electrode terminal bottom end 15, the first positive electrode terminal bottom end 15 is located on the reference predetermined end surface in contact, the second surface 131 is a surface of the first positive electrode terminal lead-out terminal 13 facing the first positive electrode terminal bottom end 15, the reference end surface image includes a second reference end surface image, and the first acquisition unit includes a fourth acquisition module, a third determination module, and a fifth acquisition module, wherein the fourth acquisition module is configured to control the reference capacitor 10 to rotate and acquire a reference side surface image, and the reference side surface image is a side surface image of the reference capacitor 10; the third determining module is configured to control the reference capacitor 10 to stop rotating when it is determined that the shadow of the second surface 131 does not exist in the reference side image, and determine that the reference side image is a first reference side image, as shown in fig. 5; the fifth acquisition module is configured to acquire a reference end face image, and determine that the reference end face image is a second reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until no shadow of the second surface 131 exists in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a second reference side image, where the second reference side image may exhibit a scorching defect of the second surface 131, in which case a reference end face image is acquired and is recorded as a second reference end face image, so that the offset angle of the second surface 131 can be determined by the second reference end face image.

In one embodiment of the present application, as shown in fig. 6, the first determining unit further includes a second processing module, a sixth obtaining module, and a fourth determining module, where the second processing module is configured to establish a coordinate system on the second reference end face image, an X axis of the coordinate system is parallel to a first edge of the second reference end face image, a Y axis of the coordinate system is parallel to a second edge of the second reference end face image, and the first edge is adjacent to and perpendicular to the second edge; the sixth obtaining module is configured to obtain a connection line between a third location point 133 and a fourth location point 134, to obtain a second connection line, where the third location point 133 and the fourth location point 134 are points on a top surface edge of the first positive terminal lead-out end in the second reference end surface image, and locations of the third location point 133 and the fourth location point 134 are different; the fourth determining module is configured to determine an angle between the second connecting line and the X axis, so as to obtain a second reference offset angle. Specifically, a coordinate system is established on the second reference end face image, two points, namely a third position point 133 and a fourth position point 134, are selected on the top face edge of the first positive electrode terminal leading-out end, the top face is the surface with the largest distance from the bottom end 15 of the first positive electrode terminal in the surface of the first positive electrode terminal leading-out end, the two points are connected to obtain a second connecting line, the included angle between the second connecting line and the X axis is calculated, and the offset angle of the second surface can be obtained and is recorded as a second reference offset angle b, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the terminal scorching flaw can be obtained conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first negative terminal, the first negative terminal includes a first negative terminal lead-out end 12 and a first negative terminal bottom end 14, the first negative terminal bottom end 14 is located on the reference predetermined end surface in contact, a third surface 122 is a surface of the first negative terminal lead-out end 12 facing away from the first negative terminal bottom end 14, the reference end surface image includes a third reference end surface image, the first acquisition unit includes a seventh acquisition module, a fifth determination module, and an eighth acquisition module, wherein the seventh acquisition module is configured to control rotation of the reference capacitor 10 and acquire a reference side surface image, and the reference side surface image is a side surface image of the reference capacitor 10; the fifth determining module is configured to control the reference capacitor 10 to stop rotating when it is determined that the shadow of the third surface 122 does not exist in the reference side image, and determine that the reference side image is a third reference side image, as shown in fig. 7; the eighth acquisition module is configured to acquire a reference end face image, and determine that the reference end face image is a third reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the third surface 122 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a third reference side image, where the third reference side image may present a scorching defect of the third surface 122, in this case, a reference end face image is acquired, and the reference end face image is recorded as a third reference end face image, so that the offset angle of the third surface 122 can be determined by the third reference end face image.

In one embodiment of the present application, as shown in fig. 8, the first determining unit further includes a third processing module, an eighth obtaining module, and a sixth determining module, where the third processing module is configured to establish a coordinate system on the third reference end face image, an X axis of the coordinate system is parallel to a first edge of the third reference end face image, a Y axis of the coordinate system is parallel to a second edge of the third reference end face image, and the first edge is adjacent to and perpendicular to the second edge; the eighth obtaining module is configured to obtain a third connection line by obtaining a connection line between a fifth location point 125 and a sixth location point 126, where the fifth location point 125 and the sixth location point 126 are points on a top surface edge of the first negative terminal lead-out end in the third reference end surface image, and locations of the fifth location point 125 and the sixth location point 126 are different; the sixth determining module is configured to determine an angle between the third connecting line and the X axis, so as to obtain a third reference offset angle. Specifically, a coordinate system is established on the third reference end face image, two points, namely a fifth position point 125 and a sixth position point 126, are selected on the edge of the top face of the first negative terminal leading-out end, the top face is the surface with the largest distance from the bottom end 14 of the first negative terminal in the surface of the first negative terminal leading-out end, the two points are connected to obtain a third connecting line, the included angle between the third connecting line and the X axis is calculated, and the offset angle of the third surface can be obtained and is recorded as a third reference offset angle c, so that the rotation angle of the capacitor to be measured can be corrected conveniently, and the side face image which can present the burning defect of the terminal can be acquired conveniently.

In one embodiment of the present application, as shown in fig. 2 to 10, the reference capacitor 10 includes a first positive electrode terminal, the first positive electrode terminal includes a first positive electrode terminal lead-out terminal 13 and a first positive electrode terminal bottom end 15, the first positive electrode terminal bottom end 15 is located on the reference predetermined end surface in contact, a fourth surface 132 is a surface of the first positive electrode terminal lead-out terminal 13 facing away from the first positive electrode terminal bottom end 15, the reference end surface image includes a fourth reference end surface image, and the first acquisition unit includes a ninth acquisition module, a seventh determination module, and a tenth acquisition module, wherein the ninth acquisition module is configured to control the reference capacitor 10 to rotate and acquire a reference side surface image, the reference side surface image being a side surface image of the reference capacitor 10; the seventh determining module is configured to control the reference capacitor 10 to stop rotating when it is determined that the shadow of the fourth surface 132 does not exist in the reference side image, and determine that the reference side image is a fourth reference side image, as shown in fig. 9; the tenth acquisition module is configured to acquire a reference end face image, and determine that the reference end face image is a fourth reference end face image. Specifically, the reference capacitor 10 is controlled to rotate while the side image of the reference capacitor 10 is acquired until the shadow of the fourth surface 132 is not present in the reference side image, and the reference capacitor 10 is controlled to stop rotating to obtain a fourth reference side image, which may present a scorch defect of the fourth surface 132, in which case a reference end face image is acquired, which is denoted as a fourth reference end face image, so that the offset angle of the fourth surface 132 can be determined by the fourth reference end face image.

In one embodiment of the present application, as shown in fig. 10, the first determining unit further includes a fourth processing module, an eleventh obtaining module, and an eighth determining module, where the fourth processing module is configured to establish a coordinate system on the fourth reference end face image, an X axis of the coordinate system is parallel to a first edge of the fourth reference end face image, a Y axis of the coordinate system is parallel to a second edge of the fourth reference end face image, and the first edge is adjacent to and perpendicular to the second edge; the eleven acquisition module is configured to acquire a connection line between a seventh position point 135 and an eighth position point 136 to obtain a fourth connection line, where the seventh position point 135 and the eighth position point 136 are each a point on an edge of a top surface of the first positive terminal lead out end in the fourth reference end surface image, and positions of the seventh position point 135 and the eighth position point 136 are different; the eighth determining module is configured to determine an angle between the fourth connecting line and the X axis, so as to obtain a fourth reference offset angle. Specifically, a coordinate system is established on the fourth reference end face image, two points, namely a seventh position point 135 and an eighth position point 136, are selected on the top face edge of the first positive electrode terminal leading-out end, the top face is the surface with the largest distance from the bottom end 15 of the first positive electrode terminal in the surface of the first positive electrode terminal leading-out end, the two points are connected to obtain a fourth connecting line, an included angle between the fourth connecting line and the X axis is calculated, and the offset angle of the fourth surface can be obtained and is recorded as a fourth reference offset angle d, so that the rotation angle of the capacitor to be measured can be corrected conveniently and the side face image which can present the terminal scorching flaw can be obtained conveniently.

In one embodiment of the present application, as shown in fig. 11, the first determining unit further includes a fifth processing module and a ninth determining module, where the fifth processing module is configured to establish a coordinate system on the end face image, an X-axis of the coordinate system is parallel to a first edge of the end face image, a Y-axis of the coordinate system is parallel to a second edge of the end face image, and the first edge is adjacent to and perpendicular to the second edge; the ninth determining module is configured to determine the actual offset angle according to the coordinate system. Specifically, a coordinate system is established on an end face image of the capacitor to be measured, namely, an actual offset angle can be calculated according to the coordinate system, wherein the actual offset angle comprises an offset angle of the second negative terminal leading-out end and the second positive terminal leading-out end.

In one embodiment of the present application, as shown in fig. 11 to 16, the capacitor 20 to be tested includes a second negative terminal, where the second negative terminal includes a second negative terminal lead-out end 22 and a second negative terminal bottom end 24, where the second negative terminal bottom end 24 is located in contact with the predetermined end surface, and the ninth determining module includes a first acquiring sub-module and a first determining sub-module, where the first acquiring sub-module is configured to acquire a connection line between a ninth position point 223 and a tenth position point 224 to obtain a fifth connection line, and as shown in fig. 11, the ninth position point 223 and the tenth position point 224 are all points on a top surface edge of the second negative terminal lead-out end 22 in the end surface image, and positions of the ninth position point 223 and the tenth position point 224 are different; the first determining submodule is used for determining an included angle between the fifth connecting line and the X axis to obtain a first actual deviation angle. Specifically, two points, namely a ninth position point 223 and the tenth position point 224, are selected on the edge of the top surface of the second negative terminal lead-out end 22, where the top surface is the surface with the largest distance from the bottom end 24 of the second negative terminal, and the two points are connected to obtain a fifth connection line, and an included angle between the fifth connection line and the X axis is calculated, so that an offset angle of the second negative terminal lead-out end 22 is obtained and is recorded as a first actual offset angle e, so that a proper predetermined angle is conveniently determined.

In one embodiment of the present application, as shown in fig. 11 to 16, the capacitor 20 to be tested includes a second positive terminal, where the second positive terminal includes a second positive terminal lead-out terminal 23 and a second positive terminal bottom 25, where the second positive terminal bottom 25 is located on the predetermined end face in contact with the first positive terminal lead-out terminal, and the ninth determining module further includes a second acquiring sub-module and a second determining sub-module, where the second acquiring sub-module is configured to acquire a connection line between an eleventh position point 233 and a twelfth position point 234 to obtain a sixth connection line, and as shown in fig. 11, the eleventh position point 233 and the twelfth position point 234 are points on a top surface edge of the second positive terminal lead-out terminal in the end face image, and positions of the eleventh position point 233 and the twelfth position point 234 are different; the second determining submodule is used for determining an included angle between the sixth connecting line and the Y axis to obtain a second actual offset angle. Specifically, two points, namely an eleventh position point 233 and a twelfth position point 234, are selected on the edge of the top surface of the second positive terminal lead-out end 23, the top surface is the surface with the largest distance from the bottom end 25 of the second positive terminal, the two points are connected to obtain a sixth connecting line, and an included angle between the sixth connecting line and the X axis is calculated, so that an offset angle of the second positive terminal lead-out end 23 is obtained and is recorded as a second actual offset angle f, so that a proper predetermined angle can be conveniently determined.

In an embodiment of the application, the third obtaining unit includes a sixth processing module and a twelfth obtaining module, where the sixth processing module is configured to rotate the capacitor to be measured by a first predetermined angle, and the first predetermined angle is a difference obtained by subtracting the first reference offset angle from the first actual offset angle; the twelfth acquisition module is configured to acquire a side image of the capacitor to be measured, so as to obtain a first side image, as shown in fig. 12. Specifically, a first predetermined angle a is calculated according to the first actual offset angle e and the first reference offset angle a, that is, a=e-a, after the capacitor to be measured is rotated by the first predetermined angle a, a side image of the capacitor to be measured is obtained, and a first side image is obtained, as shown in fig. 12, where the first side image may exhibit a scorching defect of the fifth surface 221, that is, a scorching defect of a surface of the second negative terminal lead-out end 22 facing the second negative terminal bottom end 24.

In an embodiment of the present application, the third obtaining unit further includes a seventh processing module and a thirteenth obtaining module, where the seventh processing module is configured to rotate the capacitor to be measured by a second predetermined angle after rotating the capacitor to be measured by a first predetermined angle, where the second predetermined angle is a sum of 90 ° and a first difference, where the first difference is a difference obtained by subtracting the first predetermined angle from a second difference, and where the second difference is a difference between the second actual offset angle and the second reference offset angle; the thirteenth acquiring module is configured to acquire a side image of the capacitor to be measured, and obtain a second side image, as shown in fig. 13. Specifically, a second predetermined angle B is calculated according to the first actual offset angle e, the second actual offset angle f, the first reference offset angle a and the second reference offset angle B, that is, b=90+ (e-c) - (f-B), after the capacitor to be measured is rotated by the second predetermined angle B, a side image of the capacitor to be measured is obtained, and a second side image is obtained, as shown in fig. 13, the second side image may exhibit a scorch defect of the sixth surface 231, that is, a scorch defect of a surface of the second positive terminal lead-out terminal 23 facing the second positive terminal bottom end 25.

In an embodiment of the present application, the third obtaining unit further includes an eighth processing module and a fourteenth obtaining module, where the eighth processing module is configured to rotate the capacitor to be measured by a third predetermined angle after rotating the capacitor to be measured by a second predetermined angle, where the third predetermined angle is a sum of 90 ° and a third difference, where the third difference is a difference obtained by subtracting the second difference from a fourth difference, and where the fourth difference is a difference between the first actual offset angle and the third reference offset angle; the fourteenth acquisition module is configured to acquire a side image of the capacitor to be measured, so as to obtain a third side image, as shown in fig. 14. Specifically, a third predetermined angle C is calculated according to the first actual offset angle e, the second actual offset angle f, the second reference offset angle b and the third reference offset angle C, that is, c=90+ (e-C) - (f-b), after the capacitor to be measured is rotated by the third predetermined angle C, a side image of the capacitor to be measured is obtained, and a third side image is obtained, as shown in fig. 14, the third side image may exhibit a scorching defect of the seventh surface 222, that is, a scorching defect of a surface of the second negative terminal lead-out end 22 facing away from the second negative terminal bottom end 24.

In an embodiment of the present application, the third obtaining unit further includes a ninth processing module and a fifteenth obtaining module, where the ninth processing module is configured to rotate the capacitor to be measured by a fourth predetermined angle after rotating the capacitor to be measured by a third predetermined angle, where the fourth predetermined angle is a sum of 90 ° and a fifth difference, where the fifth difference is a difference obtained by subtracting the fourth difference from a sixth difference, and where the sixth difference is a difference between the second actual offset angle and the fourth reference offset angle; the fifteenth acquiring module is configured to acquire a side image of the capacitor to be measured, so as to obtain a fourth side image, as shown in fig. 15. Specifically, a fourth predetermined angle D is calculated according to the first actual offset angle e, the second actual offset angle f, the third reference offset angle c and the fourth reference offset angle D, that is, d=90+ (f-D) - (e-c), after the capacitor to be measured is rotated by the fourth predetermined angle D, a side image of the capacitor to be measured is obtained, and a fourth side image is obtained, as shown in fig. 15, the fourth side image may exhibit a scorching defect of the eighth surface 232, that is, a scorching defect of a surface of the second positive terminal lead-out terminal 23 facing away from the second positive terminal bottom end 25.

In one embodiment of the present application, the second determining unit includes a tenth determining module, an eleventh determining module, a twelfth determining module, and a thirteenth determining module, where the tenth determining module is configured to determine a scorching flaw of a fifth surface according to the first side image, and the fifth surface is a surface of the second negative terminal facing a bottom end of the second negative terminal; the eleventh determining module is configured to determine a scorching defect of a sixth surface according to the second side image, where the sixth surface is a surface of the second positive terminal that faces the bottom end of the second positive terminal; the twelfth determining module is configured to determine a scorching defect of a seventh surface according to the third side image, where the seventh surface is a surface of the second negative terminal facing away from the bottom end of the second negative terminal; the thirteenth determining module is configured to determine a scorching defect of an eighth surface according to the fourth side image, where the eighth surface is a surface of the second positive terminal facing away from the bottom end of the second positive terminal. Specifically, the scorching flaws of the fifth surface, i.e., the scorching flaws of the surface of the second negative terminal lead-out 22 facing the second negative terminal bottom end 24 are detected by the first side image, the scorching flaws of the sixth surface, i.e., the scorching flaws of the surface of the second positive terminal lead-out 23 facing the second positive terminal bottom end 25 are detected by the second side image, the scorching flaws of the seventh surface, i.e., the scorching flaws of the surface of the second negative terminal lead-out 22 facing away from the second negative terminal bottom end 24 are detected by the third side image, and the scorching flaws of the eighth surface, i.e., the scorching flaws of the surface of the second positive terminal lead-out 23 facing away from the second positive terminal bottom end 25, are detected by the fourth side image, are determined by the first side image.

In one embodiment of the present application, as shown in fig. 16, the second determining unit further includes a sixteenth obtaining module, a fourteenth determining module, a fifteenth determining module, and a sixteenth determining module, where the sixteenth obtaining module is configured to obtain a connection line between a thirteenth location point 241 and a fourteenth location point 242, to obtain a seventh connection line, where the thirteenth location point 241 and the fourteenth location point 242 are both points on an edge of the second negative terminal bottom end 24 in the end face image, the edge of the second negative terminal bottom end is an edge of the second negative terminal bottom end 24 away from the second negative terminal lead-out end, and locations of the thirteenth location point 241 and the fourteenth location point 242 are different; the fourteenth determining module is configured to determine an included angle between the seventh connecting line and the fifth connecting line, so as to obtain a first included angle; the fifteenth determining module is configured to determine a first distance from the thirteenth location point 241 to the fifth connecting line and a second distance from the fourteenth location point 242 to the fifth connecting line; the sixteenth determining module is configured to determine whether the second negative terminal is skewed according to the first included angle, the first distance, and the second distance. Specifically, two points are taken at the edge of the bottom end of the second negative electrode terminal, a seventh connecting line is obtained by connecting the two points, the connecting line of the two points on the edge of the top surface of the leading-out end of the second negative electrode terminal is a fifth connecting line, whether the second negative electrode terminal is inclined or not is determined according to the first included angle, the first distance and the second distance, namely whether the second negative electrode terminal is inclined or not is judged according to the included angle between the fifth connecting line and the seventh connecting line and the three data of the distances from the two ends of the seventh connecting line to the fifth connecting line, and the accuracy of skew flaw detection is improved.

In one embodiment of the present application, the sixteenth determining module includes a third determining sub-module for determining that the second negative terminal is not skewed in a case where the first included angle is within a first predetermined range, the first distance is within a second predetermined range, and the second distance is within a third predetermined range. Specifically, the first included angle is in a first preset range, the first distance is in a second preset range and the second distance is in a third preset range, namely, the included angle between the fifth connecting line and the seventh connecting line and the distance from the two ends of the seventh connecting line to the fifth connecting line are all in the corresponding preset ranges, so that the second negative electrode terminal can be determined not to be askew, skew flaw detection omission is further avoided, and accuracy of skew flaw detection is improved.

In one embodiment of the present application, as shown in fig. 16, the second positive terminal further includes a second positive terminal bottom end, the second determining unit further includes a seventeenth acquiring module, a seventeenth determining module, an eighteenth determining module, and a nineteenth determining module, where the seventeenth acquiring module is configured to acquire a connection line between a fifteenth location point 251 and a sixteenth location point 252 to obtain an eighth connection line, where the fifteenth location point 251 and the sixteenth location point 252 are each a point on an edge of the second positive terminal bottom end in the end face image, the edge of the second positive terminal bottom end is an edge of the second positive terminal bottom end 25 away from the second positive terminal lead-out end, and locations of the fifteenth location point 251 and the sixteenth location point 252 are different; the seventeenth determining module is configured to determine an included angle between the eighth connecting line and the sixth connecting line, to obtain a second included angle; the eighteenth determining module is configured to determine a third distance and a fourth distance, where the third distance is a distance from the fifteenth location point 251 to the sixth connection line, and the fourth distance is a distance from the sixteenth location point 252 to the sixth connection line; the nineteenth determining module is configured to determine whether the second positive terminal is skewed according to the second included angle, the third distance, and the fourth distance. Specifically, two points are taken at the edge of the bottom end of the second positive terminal, an eighth connecting line is obtained by connecting the two points, a sixth connecting line is connected to the two points on the edge of the top surface of the leading-out end of the second positive terminal, whether the second positive terminal is skewed or not is determined according to the second included angle, the third distance and the fourth distance, namely whether the second positive terminal is skewed or not is judged through three data of the included angle between the sixth connecting line and the eighth connecting line and the distance from the two ends of the eighth connecting line to the sixth connecting line, and accuracy of skew flaw detection is improved.

In one embodiment of the present application, the nineteenth determining module includes a fourth determining submodule configured to determine that the second positive terminal is not skewed when the second included angle is within a fourth predetermined range, the third distance is within a fifth predetermined range, and the fourth distance is within a sixth predetermined range. Specifically, the second included angle is in a fourth preset range, the third distance is in a fifth preset range and the fourth distance is in a sixth preset range, namely, the included angle between the sixth connecting line and the eighth connecting line and the distance between the two ends of the eighth connecting line and the sixth connecting line are all in the corresponding preset ranges, so that the second positive terminal can be determined not to be askew, skew flaw missing detection is further avoided, and accuracy of skew flaw detection is improved.

In order to enable those skilled in the art to more clearly understand the technical solution of the present application, the technical solution of the present application will be described below with reference to specific embodiments.

Examples

As shown in fig. 18, in an application scenario of the method for detecting a flaw of a capacitor terminal, the method includes a turntable 30, a first camera 40, a second camera 50, and a third camera 60, where the turntable 30 includes a fixing member 31, and a capacitor is fixed on the turntable 30 by the fixing member 31, so that the fixed capacitor can rotate with the turntable 30 and also can rotate automatically, a station of the turntable 30 corresponding to the first camera is a first station, a station of the turntable 30 corresponding to the second camera is a second station, and a station of the turntable 30 corresponding to the third camera is a third station.

The process of implementing the flaw detection method of the capacitor terminal by adopting the application scene comprises a first reference deviation angle and a second reference deviation angle acquisition process, a third reference deviation angle and a fourth reference deviation angle acquisition process, a skew flaw detection process and a scorching flaw detection process. Until no shadow exists in the reference side image, controlling the reference capacitor to stop rotating

As shown in fig. 19, the acquisition flow of the first reference offset angle and the second reference offset angle includes the steps of: and controlling the reference capacitor to move to a second station, controlling the reference capacitor to rotate, controlling a second camera to acquire a reference side image, wherein the reference side image is a side image of the reference capacitor, controlling the reference capacitor to stop rotating when it is determined that no shadow exists on the first surface in the reference side image, determining the reference side image as the first reference side image, controlling a turntable to rotate so that the reference capacitor moves to the first station, controlling a first camera to acquire the reference end image, determining the reference end image as the first reference end image, establishing a coordinate system on the first reference end image, setting an X axis of the coordinate system to be parallel to a first edge of the first reference end image, setting a Y axis of the coordinate system to be parallel to a second edge of the first reference end image, setting the first edge to be adjacent to the second edge and perpendicular to the second edge, acquiring a connecting line of a first position point and a second position point, obtaining a first connecting line, wherein the first position point and the second position point are both connecting points on the first end face of the first end image and the first end face, and the first position of the first position point are different from each other, and determining a first angle of the first position and the second position point.

The process of obtaining the first reference offset angle and the second reference offset angle further comprises the following steps: and controlling the turntable to rotate so that the reference capacitor moves to a second station, controlling the reference capacitor to rotate, controlling a second camera to acquire a reference side image, wherein the reference side image is a side image of the reference capacitor, controlling the reference capacitor to stop rotating when it is determined that no shadow exists on the second surface in the reference side image, determining the reference side image as a first reference side image, controlling the turntable to rotate so that the reference capacitor moves to the first station, controlling a first camera to acquire a reference end face image, determining the reference end face image as a second reference end face image, establishing a coordinate system on the second reference end face image, establishing an X axis of the coordinate system to be parallel to a first edge of the second reference end face image, establishing a Y axis of the coordinate system to be parallel to a second edge of the second reference end face image, acquiring a connecting line of a third position point and a fourth position point, wherein the third position point and the fourth position point are both connecting lines of the third position point and the fourth position point, and determining an included angle between the third position point and the fourth position point and the second position point are different from each other.

As shown in fig. 20, the acquisition flow of the third reference offset angle and the fourth reference offset angle includes the steps of: and controlling the turntable to rotate so that the reference capacitor moves to a third station, controlling the reference capacitor to rotate, controlling a third camera to acquire a reference side image, wherein the reference side image is a side image of the reference capacitor, controlling the reference capacitor to stop rotating when it is determined that no shadow exists on the third surface in the reference side image, determining the reference side image as the third reference side image, controlling the turntable to rotate so that the reference capacitor moves to a first station, controlling a first camera to acquire a reference end face image, determining the reference end face image as the third reference end face image, establishing a coordinate system on the third reference end face image, establishing an X axis of the coordinate system to be parallel to a first edge of the third reference end face image, establishing a Y axis of the coordinate system to be parallel to a second edge of the third reference end face image, acquiring a connecting line of a fifth position point and a sixth position point, respectively, acquiring a connecting line of the fifth position point and the sixth position point as a third connecting line of the third position point, and a third position point of the third position point and the third position point of the third position point, and the third position point of the third position point being different from the third position point.

The process of obtaining the third reference offset angle and the fourth reference offset angle further includes the steps of: and controlling the turntable to rotate so that the reference capacitor moves to a third station, controlling the reference capacitor to rotate, controlling a third camera to acquire a reference side image, wherein the reference side image is a side image of the reference capacitor, controlling the reference capacitor to stop rotating when it is determined that no shadow exists on the fourth surface in the reference side image, determining the reference side image as a fourth reference side image, controlling the turntable to rotate so that the reference capacitor moves to a first station, controlling a first camera to acquire a reference end face image, determining the reference end face image as a fourth reference end face image, establishing a coordinate system on the fourth reference end face image, establishing an X axis of the coordinate system to be parallel to a first edge of the fourth reference end face image, establishing a Y axis of the coordinate system to be parallel to a second edge of the fourth reference end face image, acquiring a connecting line of a seventh position point and an eighth position point, wherein the seventh position point and the eighth position point are both connecting lines of the seventh position point and the eighth position point, and determining an included angle between the seventh position point and the fourth position point are different from each other.

As shown in fig. 21, the scorching flaw detection flow includes the steps of: and establishing a coordinate system on the end face image, wherein an X axis of the coordinate system is parallel to a first edge of the end face image, a Y axis of the coordinate system is parallel to a second edge of the end face image, the first edge is adjacent to and perpendicular to the second edge, a connection line between a ninth position point and a tenth position point is obtained, the ninth position point and the tenth position point are all points on the top surface edge of the second negative electrode terminal lead-out end in the end face image, the ninth position point and the tenth position point are different in position, an included angle between the fifth connection line and the X axis is determined, a first actual offset angle is obtained, a connection line between an eleventh position point and a twelfth position point is obtained, a sixth connection line is obtained, the eleventh position point and the twelfth position point are all points on the top surface edge of the second positive electrode terminal lead-out end in the end face image, the position of the eleventh position point and the twelfth position point are different, and the sixth actual offset angle is determined, and the included angle is obtained.

The scorching flaw detection process further includes the steps of: controlling the rotation of the turntable to enable the reference capacitor to move to a second station, rotating the capacitor to be measured by a first preset angle, wherein the first preset angle is a difference value obtained by subtracting the first reference offset angle from the first actual offset angle, controlling a second camera to acquire a side image of the capacitor to be measured to obtain a first side image, rotating the capacitor to be measured by a second preset angle which is a sum of 90 degrees and a first difference value, subtracting the first preset angle from the first difference value, controlling the second camera to acquire the side image of the capacitor to be measured by subtracting the first reference offset angle from the second actual offset angle to obtain a second side image, controlling the rotation of the turntable to enable the reference capacitor to move to a third station, rotating the capacitor to be measured by a third preset angle, wherein the third preset angle is the sum of 90 degrees and a third difference value, the third difference value is the difference value obtained by subtracting the second difference value from a fourth difference value, the fourth difference value is the difference value between the first actual offset angle and the third reference offset angle, a third camera is controlled to acquire a side image of the capacitor to be measured to obtain a third side image, the capacitor to be measured is rotated by a fourth preset angle, the fourth preset angle is the sum of 90 degrees and a fifth difference value, the fifth difference value is the difference value obtained by subtracting the fourth difference value from a sixth difference value, the sixth difference value is the difference value between the second actual offset angle and the fourth reference offset angle, and the third camera is controlled to acquire the side image of the capacitor to be measured to obtain a fourth side image.

The scorching flaw detection process further includes the steps of: determining a scorching defect of a fifth surface according to the first side image, wherein the fifth surface is a surface of a second negative electrode terminal facing a bottom end of the second negative electrode terminal, determining a scorching defect of a sixth surface according to the second side image, wherein the sixth surface is a surface of a second positive electrode terminal facing the bottom end of the second positive electrode terminal, determining a scorching defect of a seventh surface according to the third side image, wherein the seventh surface is a surface of the second negative electrode terminal facing away from the bottom end of the second negative electrode terminal, determining a scorching defect of an eighth surface according to the fourth side image, and wherein the eighth surface is a surface of the second positive electrode terminal facing away from the bottom end of the second positive electrode terminal.

As shown in fig. 22, the skew flaw detection flow includes the steps of: obtaining a connection line of a thirteenth position point and a fourteenth position point, obtaining a seventh connection line, wherein the thirteenth position point and the fourteenth position point are all points on the edge of the bottom end of the second negative electrode terminal in the end face image, the edge of the bottom end of the second negative electrode terminal is the edge of the bottom end of the second negative electrode terminal far away from the second negative electrode terminal leading end, the thirteenth position point and the fourteenth position point are different in position, determining an included angle between the seventh connection line and the fifth connection line to obtain a first included angle, determining a first distance and a second distance, wherein the first distance is a distance from the thirteenth position point to the fifth connection line, the second distance is a distance from the fourteenth position point to the fifth connection line, and if the first included angle is within a first preset range, the first distance is within a second preset range, and the second distance is within a third preset range, determining that the second negative electrode terminal is not skewed, otherwise, determining the second negative electrode terminal is skewed.

The skew flaw detection process further includes the steps of: obtaining a connection line between a fifteenth position point and a sixteenth position point, obtaining an eighth connection line, wherein the fifteenth position point and the sixteenth position point are all points on the edge of the bottom end of the second positive terminal in the end face image, the edge of the bottom end of the second positive terminal is the edge of the bottom end of the second positive terminal far away from the second positive terminal leading end, the fifteenth position point and the sixteenth position point are different in position, determining an included angle between the eighth connection line and the sixth connection line to obtain a second included angle, determining a third distance and a fourth distance, wherein the third distance is a distance between the fifteenth position point and the sixth connection line, the fourth distance is a distance between the sixteenth position point and the sixth connection line, and determining that the second positive terminal is not skewed when the second included angle is within a fourth predetermined range, the third distance is within a fifth predetermined range, and the fourth distance is within the sixth predetermined range, otherwise determining that the second positive terminal is skewed.

The detection device comprises a processor and a memory, wherein the first acquisition unit, the second acquisition unit, the first determination unit, the third acquisition unit, the second determination unit and the like are all stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.

The processor includes a kernel, and the kernel fetches the corresponding program unit from the memory. The inner core can be provided with one or more than one core, and the problem of inaccurate flaw monitoring of the capacitor terminal in the prior art is solved by adjusting the parameters of the inner core.

The memory may include volatile memory, random Access Memory (RAM), and/or nonvolatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM), among other forms in computer readable media, the memory including at least one memory chip.

An embodiment of the present invention provides a storage medium having a program stored thereon, which when executed by a processor, implements the above-described detection method.

The embodiment of the invention provides a processor, which is used for running a program, wherein the detection method is executed when the program runs.

The embodiment of the invention provides equipment, which comprises a processor, a memory and a program stored in the memory and capable of running on the processor, wherein the processor realizes at least the following steps when executing the program:

Step S101, acquiring a reference end face image, wherein the reference end face image comprises an image of a reference capacitor terminal and an image of a reference preset end face, and the reference capacitor comprises a reference capacitor body and the reference capacitor terminal, and the reference capacitor terminal is positioned on the reference preset end face of the reference capacitor body;

The device herein may be a server, PC, PAD, cell phone, etc.

The application also provides a computer program product adapted to perform, when executed on a data processing device, a program initialized with at least the following method steps:

In the foregoing embodiments of the present invention, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.

In the several embodiments provided in the present application, it should be understood that the disclosed technology may be implemented in other manners. The above-described embodiments of the apparatus are merely exemplary, and the division of the units may be a logic function division, and there may be another division manner when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interfaces, units or modules, or may be in electrical or other forms.

The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated units described above, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the above-mentioned method of the various embodiments of the present invention. And the aforementioned storage medium includes: a usb disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing program codes.

From the above description, it can be seen that the above embodiments of the present application achieve the following technical effects:

1) In the detection method, a reference end face image is firstly obtained, then an end face image of a capacitor to be detected is obtained, then a reference offset angle is determined according to the reference end face image, an actual offset angle is determined according to the end face image, then a preset angle obtained by calculation according to the reference offset angle and the actual offset angle is controlled to rotate by a preset angle, a side face image of a capacitor terminal to be detected is obtained, and finally flaws of the capacitor terminal to be detected are determined according to the side face image and the end face image. According to the method, the reference offset angle is determined through the reference end face image, and the actual offset angle is determined through the end face image of the capacitor to be detected, so that the preset angle is calculated, the side face image of the capacitor terminal to be detected is obtained after the capacitor to be detected is controlled to rotate by the preset angle, the side face image of the capacitor terminal to be detected can show the burning defect of the capacitor terminal, whether the capacitor terminal is inclined or not can be determined through the image of the capacitor terminal to be detected in the end face image of the capacitor to be detected, the defect detection accuracy is improved, and the problem that the defect detection of the capacitor terminal in the prior art is inaccurate is solved.

2) In the detection device, a first acquisition unit acquires a reference end face image, a second acquisition unit acquires an end face image of a capacitor to be detected, a first determination unit determines a reference offset angle according to the reference end face image, an actual offset angle is determined according to the end face image, a third acquisition unit calculates a preset angle according to the reference offset angle and the actual offset angle, controls the capacitor to be detected to rotate by a preset angle, acquires a side face image of a capacitor terminal to be detected, and a second determination unit determines flaws of the capacitor terminal to be detected according to the side face image and the end face image. According to the device, the reference offset angle is determined through the reference end face image, and the actual offset angle is determined through the end face image of the capacitor to be detected, so that the preset angle is calculated, the side face image of the capacitor terminal to be detected is obtained after the capacitor to be detected is controlled to rotate by the preset angle, the side face image of the capacitor terminal to be detected can show the burning defect of the capacitor terminal, whether the capacitor terminal is inclined or not can be determined through the image of the capacitor terminal to be detected in the end face image of the capacitor to be detected, the defect detection accuracy is improved, and the problem that the defect detection of the capacitor terminal in the prior art is inaccurate is solved.

The above description is only of the preferred embodiments of the present application and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. The utility model provides a detection method of flaw of electric capacity terminal, its characterized in that, electric capacity that awaits measuring includes electric capacity body and electric capacity terminal that awaits measuring, electric capacity terminal that awaits measuring is located on the predetermined terminal surface of electric capacity body that awaits measuring, the detection method includes:

Acquiring a reference end face image, wherein the reference end face image comprises an image of a reference capacitor terminal and an image of a reference preset end face, and a reference capacitor comprises a reference capacitor body and the reference capacitor terminal, and the reference capacitor terminal is positioned on the reference preset end face of the reference capacitor body;

acquiring an end face image of the capacitor to be tested, wherein the end face image comprises an image of the capacitor terminal to be tested and an image of the end face of the capacitor terminal to be tested;

Determining a reference offset angle according to the reference end face image, and determining an actual offset angle according to the end face image;

The capacitor to be measured is controlled to rotate by a preset angle, a side image of the capacitor terminal to be measured is obtained, and the preset angle is calculated according to the reference offset angle and the actual offset angle;

Determining flaws of the capacitor terminal to be detected according to the side image and the end face image, wherein the reference capacitor comprises a first negative terminal, the first negative terminal comprises a first negative terminal leading-out end and a first negative terminal bottom end, the first negative terminal bottom end is contactingly positioned on the reference preset end face, the first surface is a surface of the first negative terminal leading-out end, which faces the first negative terminal bottom end, and is perpendicular to the reference preset end face, the reference end face image comprises a first reference end face image, and the process of acquiring the first reference end face image comprises the following steps: controlling the reference capacitor to rotate, acquiring a reference side image, the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the first surface in the reference side image; acquiring a reference end face image, determining the reference end face image as a first reference end face image, determining a reference offset angle according to the reference end face image, and further comprising: establishing a coordinate system on the first reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the first reference end face image, a Y axis of the coordinate system is parallel to a second edge of the first reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a first position point and a second position point, wherein the first position point and the second position point are points on the edge of the top surface of the first negative electrode terminal leading-out end in the first reference end surface image, and the positions of the first position point and the second position point are different; determining an included angle between the first connecting line and the X axis to obtain a first reference offset angle, and determining an actual offset angle according to the end face image, wherein the determining comprises the following steps: establishing a coordinate system on the end face image, wherein an X axis of the coordinate system is parallel to a first edge of the end face image, a Y axis of the coordinate system is parallel to a second edge of the end face image, and the first edge is adjacent to and perpendicular to the second edge; determining the actual offset angle according to the coordinate system, wherein the capacitor to be measured comprises a second negative electrode terminal, the second negative electrode terminal comprises a second negative electrode terminal leading-out end and a second negative electrode terminal bottom end, the second negative electrode terminal bottom end is contactingly positioned on the preset end face, and determining the actual offset angle according to the coordinate system comprises the following steps: obtaining a connecting line of a ninth position point and a tenth position point to obtain a fifth connecting line, wherein the ninth position point and the tenth position point are all points on the top surface edge of the second negative terminal leading-out end in the end surface image, and the positions of the ninth position point and the tenth position point are different; determining an included angle between the fifth connecting line and the X axis to obtain a first actual offset angle, rotating the capacitor to be measured by a predetermined angle corresponding to the rotation of the capacitor to be measured, and obtaining a side image of the capacitor to be measured, wherein the method comprises the following steps: rotating the capacitor to be measured by a first preset angle, wherein the first preset angle is a difference value obtained by subtracting the first reference offset angle from the first actual offset angle; acquiring a side image of the capacitor to be measured, obtaining a first side image, determining a scorching flaw of a fifth surface according to the first side image, wherein the fifth surface is a surface of the second negative electrode terminal facing the bottom end of the second negative electrode terminal, determining the flaw of the capacitor terminal to be measured according to the side image and the end image, and further comprising: obtaining a connection line of a thirteenth position point and a fourteenth position point to obtain a seventh connection line, wherein the thirteenth position point and the fourteenth position point are all points on the edge of the bottom end of the second negative electrode terminal in the end face image, the edge of the bottom end of the second negative electrode terminal is the edge of the bottom end of the second negative electrode terminal far away from the leading-out end of the second negative electrode terminal, the thirteenth location point and the fourteenth location point are different in position; determining an included angle between the seventh connecting line and the fifth connecting line to obtain a first included angle; determining a first distance and a second distance, wherein the first distance is the distance from the thirteenth position point to the fifth connecting line, and the second distance is the distance from the fourteenth position point to the fifth connecting line; determining whether the second negative electrode terminal is skewed according to the first included angle, the first distance and the second distance, wherein the reference capacitor comprises a first positive electrode terminal, the first positive electrode terminal comprises a first positive electrode terminal leading-out end and a first positive electrode terminal bottom end, the first positive electrode terminal bottom end is positioned on the reference preset end face in a contact manner, the second surface is a surface, facing the first positive electrode terminal bottom end, of the first positive electrode terminal leading-out end, the reference end face image comprises a second reference end face image, and the process for acquiring the second reference end face image comprises the following steps: controlling the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; controlling the reference capacitor to stop rotating in a case where it is determined that the shadow of the second surface does not exist in the reference side image; acquiring a reference end face image, determining the reference end face image as a second reference end face image, determining a reference offset angle according to the reference end face image, and further comprising: establishing a coordinate system on the second reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the second reference end face image, a Y axis of the coordinate system is parallel to a second edge of the second reference end face image, and the first edge is adjacent to and perpendicular to the second edge; obtaining a connecting line of a third position point and a fourth position point, and obtaining a second connecting line, wherein the third position point and the fourth position point are all points on the top surface edge of the first positive terminal leading-out end in the second reference end surface image, and the positions of the third position point and the fourth position point are different; determining an included angle between the second connecting line and the X axis to obtain a second reference offset angle, wherein the capacitor to be measured comprises a second positive terminal, the second positive terminal comprises a second positive terminal leading-out end and a second positive terminal bottom end, the second positive terminal bottom end is positioned on the preset end face in a contact manner, and the actual offset angle is determined according to the coordinate system, and the method comprises the following steps: obtaining a connecting line of an eleventh position point and a twelfth position point to obtain a sixth connecting line, wherein the eleventh position point and the twelfth position point are all points on the top surface edge of the second positive terminal leading-out end in the end surface image, and the positions of the eleventh position point and the twelfth position point are different; determining an included angle between the sixth connecting line and the Y axis to obtain a second actual offset angle, rotating the capacitor to be measured by a predetermined angle corresponding to the rotation of the capacitor to be measured after rotating the capacitor to be measured by a first predetermined angle, and obtaining a side image of the capacitor to be measured, and further comprising: rotating the capacitor to be measured by a second preset angle, wherein the second preset angle is the sum of 90 degrees and a first difference value, the first difference value is the difference value obtained by subtracting the first preset angle from the second difference value, and the second difference value is the difference value between the second actual offset angle and the second reference offset angle; and acquiring a side image of the capacitor to be detected, and obtaining a second side image.

2. The method of detecting according to claim 1, wherein the reference capacitor includes a first negative terminal including a first negative terminal lead-out and a first negative terminal bottom end, the first negative terminal bottom end being contactingly located on the reference predetermined end face, a third surface being a surface of the first negative terminal lead-out facing away from the first negative terminal bottom end, the reference end face image including a third reference end face image, the process of acquiring the third reference end face image including:

controlling and rotating the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor;

Controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the third surface in the reference side image;

and acquiring a reference end face image, and determining the reference end face image as a third reference end face image.

3. The detection method according to claim 2, wherein determining a reference offset angle from the reference end face image further comprises:

establishing a coordinate system on the third reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the third reference end face image, a Y axis of the coordinate system is parallel to a second edge of the third reference end face image, and the first edge is adjacent to and perpendicular to the second edge;

Obtaining a connecting line of a fifth position point and a sixth position point to obtain a third connecting line, wherein the fifth position point and the sixth position point are all points on the top surface edge of the first negative electrode terminal leading-out end in the third reference end surface image, and the positions of the fifth position point and the sixth position point are different;

and determining an included angle between the third connecting line and the X axis to obtain a third reference offset angle.

4. The method of detecting according to claim 3, wherein the reference capacitor includes a first positive terminal including a first positive terminal lead-out end and a first positive terminal bottom end, the first positive terminal bottom end being contactingly located on the reference predetermined end face, a fourth surface being a surface of the first positive terminal lead-out end facing away from the first positive terminal bottom end, the reference end face image including a fourth reference end face image, the process of acquiring the fourth reference end face image including:

controlling the reference capacitor to rotate, and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor;

controlling the reference capacitor to stop rotating in a case where it is determined that there is no shadow of the fourth surface in the reference side image;

And acquiring a reference end face image, and determining the reference end face image as a fourth reference end face image.

5. The method of detecting according to claim 4, wherein determining a reference offset angle from the reference end face image further comprises:

Establishing a coordinate system on the fourth reference end face image, wherein an X axis of the coordinate system is parallel to a first edge of the fourth reference end face image, a Y axis of the coordinate system is parallel to a second edge of the fourth reference end face image, and the first edge is adjacent to and perpendicular to the second edge;

Obtaining a connecting line of a seventh position point and an eighth position point to obtain a fourth connecting line, wherein the seventh position point and the eighth position point are all points on the top surface edge of the first positive terminal leading-out end in the fourth reference end surface image, and the positions of the seventh position point and the eighth position point are different;

and determining an included angle between the fourth connecting line and the X axis to obtain a fourth reference offset angle.

6. The method according to claim 5, wherein after rotating the capacitor to be measured by a second predetermined angle, rotating the capacitor to be measured by a corresponding predetermined angle, obtaining a side image of the capacitor to be measured, further comprising:

rotating the capacitor to be measured by a third preset angle, wherein the third preset angle is the sum of 90 degrees and a third difference value, the third difference value is the difference value obtained by subtracting the second difference value from a fourth difference value, and the fourth difference value is the difference value between the first actual offset angle and the third reference offset angle;

and acquiring a side image of the capacitor to be detected, and obtaining a third side image.

7. The method according to claim 6, wherein after rotating the capacitor to be measured by a third predetermined angle, rotating the capacitor to be measured by a corresponding predetermined angle, obtaining a side image of the capacitor to be measured, further comprising:

rotating the capacitor to be measured by a fourth preset angle, wherein the fourth preset angle is the sum of 90 degrees and a fifth difference value, the fifth difference value is the difference value obtained by subtracting the fourth difference value from a sixth difference value, and the sixth difference value is the difference value between the second actual offset angle and the fourth reference offset angle;

and acquiring a side image of the capacitor to be detected, and obtaining a fourth side image.

8. The method of detecting according to claim 7, wherein determining flaws of the capacitor terminals to be detected from the side image and the end image includes:

determining a scorching flaw of a fifth surface according to the first side image, wherein the fifth surface is a surface of the second negative terminal facing the bottom end of the second negative terminal;

determining a scorching flaw of a sixth surface according to the second side image, wherein the sixth surface is a surface of the second positive terminal, which faces to the bottom end of the second positive terminal;

Determining a scorching flaw of a seventh surface according to the third side image, wherein the seventh surface is a surface of the second negative terminal, which is opposite to the bottom end of the second negative terminal;

And determining a scorching flaw of an eighth surface according to the fourth side image, wherein the eighth surface is a surface of the second positive terminal, which is opposite to the bottom end of the second positive terminal.

9. The method of detecting according to claim 1, wherein determining whether the second negative terminal is skewed based on the first included angle, the first distance, and the second distance comprises:

and determining that the second negative terminal is not skewed in the case that the first included angle is within a first predetermined range, the first distance is within a second predetermined range, and the second distance is within a third predetermined range.

10. The method of detecting according to claim 1, wherein the second positive terminal further includes a second positive terminal bottom end, determining a flaw of the capacitor terminal to be detected from the side image and the end face image, further comprising:

Acquiring a connection line of a fifteenth position point and a sixteenth position point to obtain an eighth connection line, wherein the fifteenth position point and the sixteenth position point are all points on the edge of the bottom end of the second positive terminal in the end face image, the edge of the bottom end of the second positive terminal is the edge of the bottom end of the second positive terminal far away from the second positive terminal leading-out end, and the fifteenth position point and the sixteenth position point are different in position;

Determining an included angle between the eighth connecting line and the sixth connecting line to obtain a second included angle;

Determining a third distance and a fourth distance, wherein the third distance is the distance from the fifteenth position point to the sixth connecting line, and the fourth distance is the distance from the sixteenth position point to the sixth connecting line;

And determining whether the second positive terminal is skewed according to the second included angle, the third distance and the fourth distance.

11. The method of detecting according to claim 10, wherein determining whether the second positive terminal is skewed based on the second included angle, the third distance, and the fourth distance comprises:

and determining that the second positive terminal is not skewed in the case where the second included angle is within a fourth predetermined range, the third distance is within a fifth predetermined range, and the fourth distance is within a sixth predetermined range.

12. The utility model provides a detection device of flaw of electric capacity terminal, its characterized in that, electric capacity that awaits measuring includes electric capacity body and electric capacity terminal that awaits measuring, electric capacity terminal that awaits measuring is located on the predetermined terminal surface of electric capacity body that awaits measuring, detection device includes:

A first acquisition unit configured to acquire a reference end face image including an image of a reference capacitor terminal and an image of a reference predetermined end face, the reference capacitor including a reference capacitor body and the reference capacitor terminal, wherein the reference capacitor terminal is located on the reference predetermined end face of the reference capacitor body;

the second acquisition unit is used for acquiring an end face image of the capacitor to be detected, wherein the end face image comprises an image of the capacitor terminal to be detected and an image of the end face where the capacitor terminal to be detected is located;

a first determining unit, configured to determine a reference offset angle according to the reference end face image, and determine an actual offset angle according to the end face image;

The third acquisition unit is used for controlling the capacitor to be detected to rotate by a preset angle, and acquiring a side image of the capacitor terminal to be detected, wherein the preset angle is calculated according to the reference offset angle and the actual offset angle;

A second determining unit configured to determine a flaw of the capacitor terminal to be tested according to the side image and the end surface image, the reference capacitor includes a first negative terminal including a first negative terminal lead-out end and a first negative terminal bottom end, the first negative terminal bottom end is located in contact with the reference predetermined end surface, a first surface is a surface of the first negative terminal lead-out end facing the first negative terminal bottom end, the first surface is perpendicular to the reference predetermined end surface, the reference end surface image includes a first reference end surface image, the first acquiring unit includes a first acquiring module, a first determining module, and a second acquiring module, the first acquisition module is used for controlling the reference capacitor to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; the first determining module is used for controlling the reference capacitor to stop rotating under the condition that the shadow of the first surface does not exist in the reference side image, and determining the reference side image as a first reference side image; the second acquisition module is used for acquiring a reference end face image, determining the reference end face image as a first reference end face image, the first determination unit further comprises a first processing module, a third acquisition module and a second determination module, wherein the first processing module is used for establishing a coordinate system on the first reference end face image, an X axis of the coordinate system is parallel to a first edge of the first reference end face image, a Y axis of the coordinate system is parallel to a second edge of the first reference end face image, and the first edge is adjacent to and perpendicular to the second edge; the third acquisition module is used for acquiring a connecting line of a first position point and a second position point to obtain a first connecting line, wherein the first position point and the second position point are points on the top surface edge of the first negative electrode terminal leading-out end in the first reference end surface image, and the positions of the first position point and the second position point are different; the second determining module is configured to determine an included angle between the first connection line and the X axis to obtain a first reference offset angle, and the first determining unit further includes a fifth processing module and a ninth determining module, where the fifth processing module is configured to establish a coordinate system on the end face image, an X axis of the coordinate system is parallel to a first edge of the end face image, a Y axis of the coordinate system is parallel to a second edge of the end face image, and the first edge is adjacent to and perpendicular to the second edge; the ninth determining module is configured to determine the actual offset angle according to the coordinate system, the capacitor to be measured includes a second negative terminal, the second negative terminal includes a second negative terminal lead-out end and a second negative terminal bottom end, the second negative terminal bottom end is located on the predetermined end face in a contact manner, the ninth determining module includes a first obtaining sub-module and a first determining sub-module, where the first obtaining sub-module is configured to obtain a connection line of a ninth location point and a tenth location point, to obtain a fifth connection line, where the ninth location point and the tenth location point are all points on a top surface edge of the second negative terminal lead-out end in the end face image, the ninth location point and the tenth location point are different in location; the first determining submodule is used for determining an included angle between the fifth connecting line and the X axis to obtain a first actual offset angle, and the third obtaining unit comprises a sixth processing module and a twelfth obtaining module, wherein the sixth processing module is used for rotating the capacitor to be tested by a first preset angle, and the first preset angle is a difference value obtained by subtracting the first reference offset angle from the first actual offset angle; the twelfth acquisition module is configured to acquire a side image of the capacitor to be measured, obtain a first side image, determine a scorching defect of a fifth surface according to the first side image, where the fifth surface is a surface of the second negative terminal facing the bottom end of the second negative terminal, the second determination unit further includes a sixteenth acquisition module, a fourteenth determination module, a fifteenth determination module, and a sixteenth determination module, where the sixteenth acquisition module is configured to acquire a connection between a thirteenth location point and a fourteenth location point, to obtain a seventh connection, where the thirteenth location point and the fourteenth location point are both points on an edge of the bottom end of the second negative terminal in the end image, the edge of the bottom end of the second negative electrode terminal is the edge of the bottom end of the second negative electrode terminal far away from the leading-out end of the second negative electrode terminal, and the thirteenth position point and the fourteenth position point are different in position; the fourteenth determining module is configured to determine an included angle between the seventh connecting line and the fifth connecting line, so as to obtain a first included angle; the fifteenth determining module is configured to determine a first distance and a second distance, where the first distance is a distance from the thirteenth location point to the fifth connection line, and the second distance is a distance from the fourteenth location point to the fifth connection line; the sixteenth determining module is configured to determine whether the second negative electrode terminal is skewed according to the first included angle, the first distance, and the second distance, the reference capacitor includes a first positive electrode terminal, the first positive electrode terminal includes a first positive electrode terminal lead-out end and a first positive electrode terminal bottom end, the first positive electrode terminal bottom end is located on the reference predetermined end face in contact, the second surface is a surface of the first positive electrode terminal lead-out end facing the first positive electrode terminal bottom end, the reference end face image includes a second reference end face image, the first acquiring unit includes a fourth acquiring module, a third determining module, and a fifth acquiring module, where, the fourth acquisition module is used for controlling the reference capacitor to rotate and acquiring a reference side image, wherein the reference side image is a side image of the reference capacitor; the third determining module is used for controlling the reference capacitor to stop rotating under the condition that the shadow of the second surface does not exist in the reference side image, determining the reference side image as a second reference side image, the first determining unit further comprises a second processing module, a sixth acquiring module and a fourth determining module, wherein the second processing module is used for establishing a coordinate system on the second reference end surface image, an X axis of the coordinate system is parallel to a first edge of the second reference end surface image, a Y axis of the coordinate system is parallel to a second edge of the second reference end surface image, and the first edge is adjacent to and perpendicular to the second edge; the sixth obtaining module is configured to obtain a connection line between a third location point and a fourth location point, where the third location point and the fourth location point are all points on an edge of a top surface of the first positive terminal lead-out end in the second reference end surface image, and locations of the third location point and the fourth location point are different; the fourth determining module is configured to determine an included angle between the second connection line and the X axis to obtain a second reference offset angle, where the capacitor to be tested includes a second positive terminal, the second positive terminal includes a second positive terminal lead-out end and a second positive terminal bottom end, the second positive terminal bottom end is located on the predetermined end face in contact with the first positive terminal lead-out end, the ninth determining module further includes a second obtaining sub-module and a second determining sub-module, where the second obtaining sub-module is configured to obtain a connection line between an eleventh location point and a twelfth location point to obtain a sixth connection line, where the eleventh location point and the twelfth location point are all points on an edge of a top surface of the second positive terminal lead-out end in the end face image, the eleventh location point and the twelfth location point are different in position; the second determining submodule is used for determining an included angle between the sixth connecting line and the Y axis to obtain a second actual offset angle, the third obtaining unit further comprises a seventh processing module and a thirteenth obtaining module, wherein the seventh processing module is used for rotating the capacitor to be measured by a second preset angle after rotating the capacitor to be measured by a first preset angle, the second preset angle is the sum of 90 degrees and a first difference value, the first difference value is the difference value obtained by subtracting the first preset angle from the second difference value, and the second difference value is the difference value between the second actual offset angle and the second reference offset angle; the thirteenth acquisition module is used for acquiring a side image of the capacitor to be detected to obtain a second side image.

13. A storage medium comprising a stored program, wherein the program performs the detection method of any one of claims 1 to 11.

14. A processor for running a program, wherein the program when run performs the detection method of any one of claims 1 to 11.