CN111524105B - Stripe tube field curvature measuring method, device, computer equipment and readable storage medium - Google Patents
Stripe tube field curvature measuring method, device, computer equipment and readable storage medium Download PDFInfo
- Publication number
- CN111524105B CN111524105B CN202010287032.XA CN202010287032A CN111524105B CN 111524105 B CN111524105 B CN 111524105B CN 202010287032 A CN202010287032 A CN 202010287032A CN 111524105 B CN111524105 B CN 111524105B
- Authority
- CN
- China
- Prior art keywords
- fluorescent screen
- spherical
- axis height
- height
- screen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
The invention provides a field curvature measuring method, a device, computer equipment and a readable storage medium for a streak tube, which are applied to a static test scene of the streak tube, wherein the static test scene of the streak tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the field curvature measuring method of the streak tube comprises the following steps: the method comprises the steps of obtaining a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after electron beams emitted by the same object height of a streak tube strike a first spherical fluorescent screen, a second spherical fluorescent screen and a plane fluorescent screen; according to the intensity curve of the electron beam striking the fluorescent screen and a first preset algorithm, calculating to obtain the beam spot diameter of the electron beam forming beam spots on the field curved surface of the stripe tube; and calculating to obtain a field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen. The invention can effectively measure the field curvature of the streak tube and generate an expression of the field curvature.
Description
Technical Field
The invention relates to the technical field of streak tubes, in particular to a streak tube field curvature measuring method, a streak tube field curvature measuring device, computer equipment and a readable storage medium.
Background
A streak camera is an ultrafast imaging device capable of providing high spatial resolution, and is widely used in many fields including laser scanning radar using streak tubes, plant photosynthesis, fluorescence lifetime attenuation analysis of biological samples, and ultralight propagation occurring in a substance detected by a combination with a digital micromirror array and an image reconstruction method. The imaging performance of a streak camera depends on its core component streak tube, and as a wide-beam imaging device, like a geometrical imaging system, an increase in the detection area will lead to a sharp increase in field curvature. Since the refractive index inside the fringe tube is continuously changed, field curvature correction cannot be performed by using a lens group like a geometrical optical system, and therefore, the field curvature needs to be considered when selecting the fringe tube. While the prior art lacks an effective method for measuring field curvature of a striped tube.
Disclosure of Invention
In view of the above, the present invention provides a striped tube field curvature measuring method, apparatus, computer device, and readable storage medium for effectively measuring the field curvature of a striped tube and generating an expression of the field curvature.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
a field curvature measuring method of a streak tube is applied to a static test scene of the streak tube, wherein the static test scene of the streak tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the field curvature measuring method of the streak tube comprises the following steps:
the method comprises the steps of obtaining a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after electron beams emitted by the same object height of a streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen;
according to the intensity curve of the electron beams emitted by the same object height striking the fluorescent screen and a first preset algorithm, calculating to obtain the beam spot diameter of the beam spot formed by the electron beams emitted by the same object height on the field curved surface of the streak tube;
and calculating to obtain a field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen.
Preferably, in the method for measuring fringe field curvature, the step of obtaining the first off-axis height, the second off-axis height, and the third off-axis height of the beam spot formed after the electron beam emitted by the same object height of the fringe tube strikes the first spherical screen, the second spherical screen, and the planar screen includes:
reading a first intensity curve, a second intensity curve and a third intensity curve of beam spots formed by the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen by using a preset CCD sensor;
and respectively calculating and obtaining the first off-axis height, the second off-axis height and the third off-axis height according to the first intensity curve, the second intensity curve and the third intensity curve.
Preferably, in the striped tube field curvature measuring method, the formula of the first preset algorithm includes:
wherein R is o Is the beam spot diameter; i max 、I min I nos Respectively the peak value, the adjacent valley value and the background noise of the intensity curve; f is the spatial resolution.
Preferably, in the method for measuring field curvature of a striped tube, the calculating to obtain the field curvature expression of the striped tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, and the curvature of each spherical screen includes:
calculating and obtaining the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, the curvature of each spherical fluorescent screen and a second preset algorithm;
and fitting and calculating to obtain the field curvature by using the distances of a plurality of different electron beams and a third preset algorithm.
Preferably, in the striped tube field curvature measuring method, the formula of the second preset algorithm includes:
wherein d is the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height; the R is 1 、R 2 、R P R is as follows o The diameters of beam spots of the electron beams emitted by the same object height on the first spherical fluorescent screen, the second spherical fluorescent screen, the plane fluorescent screen and the field curved surface are respectively; ρ 1 And ρ 2 Curvature of the first spherical screen and the second spherical screen, respectively; r is (r) 1 And r 2 The first off-axis height and the second off-axis height.
Preferably, in the streak tube field curvature measuring method,
the formula of the third preset algorithm comprises:
wherein C is the field curvature; d, d i A distance between a field curved surface and the flat screen for a beam spot of an ith electron beam; r is (r) 1_i And r 2_i The first off-axis height and the second off-axis height of the beam spot of the ith electron beam, respectively; w is a weighting coefficient; x is the image height of the beam spot of any electron beam.
Preferably, in the fringe field switching method, the curvature of the first spherical screen is smaller than the curvature of the second spherical screen.
The invention also provides a field curvature measuring device of the stripe tube, which is applied to a static test scene of the stripe tube, wherein the static test scene of the stripe tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the striped tube field curvature measuring device comprises:
the off-axis height acquisition module is used for acquiring a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after the electron beams emitted by the same object height of the streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen;
the beam spot diameter calculation module is used for calculating and obtaining the beam spot diameter of the beam spot formed on the field curved surface of the streak tube by the electron beam emitted by the same object height according to the intensity curve of the electron beam emitted by the same object height and a first preset algorithm;
and the field curvature calculation module is used for calculating and obtaining the field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen.
The invention also provides a computer device comprising a memory and a processor, wherein the memory stores a computer program, and the processor runs the computer program to enable the computer device to execute the stripe tube field curvature measuring method.
The invention also provides a readable storage medium storing a computer program which when run on a processor performs the striped tube field curvature measuring method.
The invention provides a field curvature measuring method of a streak tube, which is applied to a static test scene of the streak tube, wherein the static test scene of the streak tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the field curvature measuring method of the streak tube comprises the following steps: the method comprises the steps of obtaining a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after electron beams emitted by the same object height of a streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen; according to the intensity curve of the electron beams emitted by the same object height striking the fluorescent screen and a first preset algorithm, calculating to obtain the beam spot diameter of the beam spot formed by the electron beams emitted by the same object height on the field curved surface of the streak tube; and calculating to obtain a field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen. By the method for measuring the field curvature of the streak tube, the field curvature of the streak tube can be effectively measured, and an expression of the field curvature can be generated, so that the subsequent application of the streak tube is facilitated.
In order to make the above objects, features and advantages of the present invention more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the present invention, the drawings that are required for the embodiments will be briefly described, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope of the present invention. Like elements are numbered alike in the various figures.
FIG. 1 is a flow chart of a field curvature measuring method for a striped tube provided by the embodiment 1 of the present invention;
fig. 2 is a schematic diagram of a static test scenario of a streak tube provided in embodiment 1 of the present invention;
FIG. 3 is a flow chart of calculating off-axis height according to embodiment 2 of the present invention;
FIG. 4 is a flowchart of a method for calculating curvature of field according to embodiment 3 of the present invention;
fig. 5 is a schematic structural diagram of a field curvature measuring device for a striped tube according to embodiment 1 of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments.
The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present invention.
The terms "comprises," "comprising," "including," or any other variation thereof, are intended to cover a specific feature, number, step, operation, element, component, or combination of the foregoing, which may be used in various embodiments of the present invention, and are not intended to first exclude the presence of or increase the likelihood of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.
Furthermore, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which various embodiments of the invention belong. The terms (such as those defined in commonly used dictionaries) will be interpreted as having a meaning that is the same as the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in connection with the various embodiments of the invention.
Example 1
Fig. 1 is a flowchart of a field curvature measuring method for a striped tube according to embodiment 1 of the present invention, where the method is applied to a static test scene of the striped tube, and the static test scene of the striped tube includes a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen, and a planar fluorescent screen, and includes the following steps:
step S11: and obtaining a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after the electron beams emitted by the same object height of the streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen.
Fig. 2 is a schematic view of a static test scenario of a striped tube provided in embodiment 1 of the present invention, where the static test scenario of the striped tube includes a spatial Screen-R64 mm (Spherical Screen with a curvature of 64 mm), a spatial Screen-R83 mm (Spherical Screen with a curvature of 83 mm), a Planar Screen (Planar Screen), and a Petzval Image Plane (petzval surface), where the screens can be replaced after being detached, and in the process of performing electron beam impact by using the striped tube, beam spots on each Screen and corresponding data are obtained by replacing the screens, and the petzval surface is an ideal surface of the striped tube, that is, a field curvature. The point O is the original image point, the point A is the intersection point of the electron beam and the axis, L s The whole length of the strip pipe is; the green curve is the shape and position of the Petzval surface, where the electron beam is focused on I ideal Spot, beam spot diameter of R o The beam spot diameters of the electron beams on the spherical fluorescent screen and the plane fluorescent screen are respectively R 64 ，R 83 ，R s The method comprises the steps of carrying out a first treatment on the surface of the The distance between the intersection point of the electron beam and the Bei Cifa mole surface and the plane surface of the spherical screen is d, d respectively 1 ,d 2 The off-axis heights are r respectively 0 ，r 1 ，r 2 . The spherical screen with the curvature of 64mm and the spherical screen with the curvature of 83mm are one implementation scene, and the screen with other curvatures can be selected specifically, and the implementation scene is not limited herein.
In the embodiment of the invention, after the streak tube is used for emitting the electron beam emitted by the same object height, the plane fluorescent screen and the first spherical fluorescent screen and the second spherical fluorescent screen can be replaced in a static test scene of the streak tube so as to receive the electron beam, the electron beam can strike on different fluorescent screens to generate beam spots, and then a CCD image sensor (CCD, charge Coupled Device, charge coupling) is arranged after passing through the fluorescent screens to convert the optical signals of the beam spots into electric signals, and the off-axis heights of the beam spots on each fluorescent screen are obtained after analysis and calculation by computer equipment. The calculating and equipment can be provided with an application program for calculating the off-axis heights of the beam spots on the fluorescent screens, and after the electric signals of the CCD image sensor are received, the off-axis heights of the beam spots of the electron beams emitted by the same object height on different fluorescent screens are obtained by calculation through the electric signals.
Step S12: and calculating and obtaining the beam spot diameter of the beam spot formed on the field curved surface of the streak tube by the electron beam emitted by the same object height according to the intensity curve of the electron beam emitted by the same object height and the first preset algorithm.
In the embodiment of the invention, the intensity curves of the beam spots on different fluorescent screens can be generated according to the electric signals obtained by the CCD image sensor. For example, an application or algorithm for generating an intensity profile may be provided in the computer device, from which an appropriate intensity profile is generated after receiving the electrical signal, without limitation. The beam spot diameter forming the beam spot on the field curved surface of the streak tube can be calculated according to the intensity curve and a first preset algorithm, wherein the intensity curve can be the intensity curve of the first spherical fluorescent screen or the second spherical fluorescent screen or the plane fluorescent screen, and the method is not limited.
In an embodiment of the present invention,
the formula of the first preset algorithm comprises:
wherein R is o Is the beam spot diameter; i max 、I min I nos Respectively the peak value, the adjacent valley value and the background noise of the intensity curve; f is the spatial resolution. An application program based on the first preset algorithm can be arranged in the computer equipment, and after the intensity curve is acquired, the intensity curve can be input into the application program so as to calculate the beam spot diameter on the corresponding field curved surface.
Step S13: and calculating to obtain a field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen.
In the embodiment of the invention, the beam spot diameter on the field curved surface is obtained through calculation, and the corresponding first off-axis height, second off-axis height, third off-axis height, beam spot diameter and curvature of each spherical screen are obtained, so that the field of the streak tube can be calculated through the relation among all parameters. The field curvature is a relational expression, and is generated by fitting a plurality of beam spots generated after different electron beams strike each fluorescent screen and then acquiring the parameters. Therefore, by the method for measuring the field curvature of the streak tube, the field curvature of the streak tube can be effectively measured, and an expression of the field curvature can be generated, so that the subsequent application of the streak tube is facilitated.
Example 2
FIG. 3 is a flowchart for calculating the off-axis height according to embodiment 2 of the present invention, comprising the steps of:
step S31: and reading the first intensity curve, the second intensity curve and the third intensity curve of the beam spots formed by the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen by using a preset CCD sensor.
Step S32: and respectively calculating and obtaining the first off-axis height, the second off-axis height and the third off-axis height according to the first intensity curve, the second intensity curve and the third intensity curve.
In the embodiment of the present invention, the off-axis height of the beam spot may also be obtained through an intensity curve, and the process of obtaining the off-axis height by using the intensity curve may be implemented in a computer device by using an algorithm or an application program, for example, an application program for calculating the off-axis height by using the intensity curve may be provided in the computer device, and after obtaining the intensity curve of the beam spot formed by the first spherical fluorescent screen, the second spherical fluorescent screen and the planar fluorescent screen, the intensity curve is input into the application program to obtain the corresponding off-axis height.
Example 3
Fig. 4 is a flowchart of field curvature calculation provided in embodiment 3 of the present invention, which includes the following steps:
step S41: and calculating and obtaining the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, the curvature of each spherical fluorescent screen and a second preset algorithm.
In an embodiment of the present invention, the formula of the second preset algorithm includes:
wherein d is the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height; the R is 1 、R 2 、R P R is as follows o The electron beams emitted respectively for the same object height are arranged on the first spherical fluorescent screen and the first spherical fluorescent screenThe diameters of the beam spots on the second spherical fluorescent screen, the plane fluorescent screen and the field curved surface; ρ 1 And ρ 2 Curvature of the first spherical screen and the second spherical screen, respectively; r is (r) 1 And r 2 The first off-axis height and the second off-axis height. Wherein the curvature of the first spherical screen is smaller than the curvature of the second spherical screen. Wherein an application program based on a second preset algorithm can be arranged in the computer equipment to calculate the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height, for example, after the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter and the curvature of each spherical fluorescent screen are obtained, the distance between the field curved surface and the plane fluorescent screen of the beam spot can be input into the high application program to be calculated. The distance between the beam spot and the field curved surface and the plane fluorescent screen, namely the relation expression between the field curvature and each parameter, can find out the field curvature of the streak tube in a fitting mode after calculating the distance between the field curved surface and the plane fluorescent screen of a large number of beam spots of any electron beam through the expression.
Step S42: and fitting and calculating to obtain the field curvature by using the distances of a plurality of different electron beams and a third preset algorithm.
In an embodiment of the present invention,
the formula of the third preset algorithm comprises:
wherein C is the field curvature; d, d i A distance between a field curved surface and the flat screen for a beam spot of an ith electron beam; r is (r) 1_i And r 2_i The first off-axis height and the second off-axis height of the beam spot of the ith electron beam, respectively; w is a weighting coefficient; x is the image height of the beam spot of any electron beam. Likewise, in a computer deviceAn application program based on the third preset algorithm is arranged to fit the final field curvature expression. And a threshold value can be set in the computer equipment, and after the acquired number of the distances exceeds a high threshold value, the fitting of the field curvature is performed, so that the accuracy of the fitting of the field curvature is ensured by the number of the distance values.
Example 4
Fig. 5 is a schematic structural diagram of a field curvature measuring device for a striped tube according to embodiment 1 of the present invention.
The streak tube field curvature measuring device 500 includes:
an off-axis height obtaining module 510, configured to obtain a first off-axis height, a second off-axis height, and a third off-axis height of beam spots formed after the electron beams emitted by the same object height of the streak tube strike the first spherical screen, the second spherical screen, and the planar screen;
the beam spot diameter calculation module 520 is configured to calculate, according to an intensity curve of the electron beam emitted by the same object height striking the fluorescent screen and a first preset algorithm, a beam spot diameter of a beam spot formed by the electron beam emitted by the same object height on a field curved surface of the streak tube;
and a field curvature calculating module 530, configured to calculate and obtain a field curvature expression of the streak tube according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, and the curvature of each spherical screen.
In the embodiment of the present invention, the more detailed functional description of each module may refer to the content of the corresponding portion in the foregoing embodiment, which is not described herein.
In addition, the invention also provides computer equipment, which can comprise a smart phone, a tablet personal computer, a vehicle-mounted computer, intelligent wearing equipment and the like. The computer device comprises a memory operable to store a computer program and a processor operable to cause the computer device to perform the functions of the above-described method or the various modules in the above-described streak tube field curvature measuring apparatus by running the computer program.
The memory may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function (such as a sound playing function, an image playing function, etc.), and the like; the storage data area may store data created according to the use of the computer device (such as audio data, phonebooks, etc.), and the like. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid-state storage device.
The present embodiment also provides a readable storage medium for storing a computer program for use in the above-described computer device.
In the several embodiments provided in this application, it should be understood that the disclosed apparatus and method may be implemented in other manners as well. The apparatus embodiments described above are merely illustrative, for example, of the flow diagrams and block diagrams in the figures, which illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, functional modules or units in various embodiments of the invention may be integrated together to form a single part, or the modules may exist alone, or two or more modules may be integrated to form a single part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a smart phone, a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (6)
1. A field curvature measuring method of a streak tube is characterized by being applied to a static test scene of the streak tube, wherein the static test scene of the streak tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the field curvature measuring method of the streak tube comprises the following steps:
the method comprises the steps of obtaining a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after electron beams emitted by the same object height of a streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen;
according to the intensity curve of the electron beams emitted by the same object height striking the fluorescent screen and a first preset algorithm, calculating to obtain the beam spot diameter of the beam spot formed by the electron beams emitted by the same object height on the field curved surface of the streak tube;
calculating and obtaining the distance between the beam spot of the electron beam emitted by the same object height and the field curved surface and the plane fluorescent screen according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, the curvature of each spherical fluorescent screen and a second preset algorithm, and fitting and calculating by utilizing the distances of a plurality of different electron beams and the third preset algorithm to obtain the field curvature;
the formula of the first preset algorithm comprises:
wherein R is o Is the beam spot diameter; i max 、I min I nos Respectively the peak value, the adjacent valley value and the background noise of the intensity curve; f is the spatial resolution;
the formula of the second preset algorithm comprises:
wherein d is the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height; the R is 1 、R 2 、R P R is as follows o The diameters of beam spots of the electron beams emitted by the same object height on the first spherical fluorescent screen, the second spherical fluorescent screen, the plane fluorescent screen and the field curved surface are respectively; ρ 1 And ρ 2 Curvature of the first spherical screen and the second spherical screen, respectively; r is (r) 1 And r 2 The first off-axis height and the second off-axis height;
the formula of the third preset algorithm comprises:
wherein C is the field curvature; d, d i A distance between a field curved surface and the flat screen for a beam spot of an ith electron beam; r is (r) 1_i And r 2_i The first off-axis height and the second off-axis height of the beam spot of the ith electron beam, respectively; w is a weighting coefficient; x is the image height of the beam spot of any electron beam.
2. The method of claim 1, wherein the step of obtaining the first off-axis height, the second off-axis height, and the third off-axis height of the beam spot after the electron beam emitted by the same height of the fringe tube strikes the first spherical screen, the second spherical screen, and the planar screen comprises:
reading a first intensity curve, a second intensity curve and a third intensity curve of beam spots formed by the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen by using a preset CCD sensor;
and respectively calculating and obtaining the first off-axis height, the second off-axis height and the third off-axis height according to the first intensity curve, the second intensity curve and the third intensity curve.
3. The striped tube field curvature measuring method according to claim 1, wherein the curvature of the first spherical screen is smaller than the curvature of the second spherical screen.
4. The field curvature measuring device for the streak tube is characterized by being applied to a static test scene of the streak tube, wherein the static test scene of the streak tube comprises a replaceable first spherical fluorescent screen, a replaceable second spherical fluorescent screen and a replaceable plane fluorescent screen; the striped tube field curvature measuring device comprises:
the off-axis height acquisition module is used for acquiring a first off-axis height, a second off-axis height and a third off-axis height of beam spots formed after the electron beams emitted by the same object height of the streak tube strike the first spherical fluorescent screen, the second spherical fluorescent screen and the plane fluorescent screen;
the beam spot diameter calculation module is used for calculating and obtaining the beam spot diameter of the beam spot formed on the field curved surface of the streak tube by the electron beam emitted by the same object height according to the intensity curve of the electron beam emitted by the same object height and a first preset algorithm;
the field curvature calculation module is used for calculating and obtaining the distance between the beam spot of the electron beam emitted by the same object height and the field curved surface and the plane fluorescent screen according to the first off-axis height, the second off-axis height, the third off-axis height, the beam spot diameter, the curvature of each spherical fluorescent screen and a second preset algorithm, and fitting and calculating by utilizing the distances of a plurality of different electron beams and the third preset algorithm to obtain the field curvature;
the formula of the first preset algorithm comprises:
wherein R is o Is the beam spot diameter; i max 、I min I nos Respectively the peak value, the adjacent valley value and the background noise of the intensity curve; f is the spatial resolution;
the formula of the second preset algorithm comprises:
wherein d is the distance between the field curved surface and the plane fluorescent screen of the beam spot of the electron beam emitted by the same object height; the R is 1 、R 2 、R P R is as follows o The diameters of beam spots of the electron beams emitted by the same object height on the first spherical fluorescent screen, the second spherical fluorescent screen, the plane fluorescent screen and the field curved surface are respectively; ρ 1 And ρ 2 Curvature of the first spherical screen and the second spherical screen, respectively; r is (r) 1 And r 2 The first off-axis height and the second off-axis height;
the formula of the third preset algorithm comprises:
wherein C is the field curvature; d, d i A distance between a field curved surface and the flat screen for a beam spot of an ith electron beam; r is (r) 1_i And r 2_i The first off-axis height and the second off-axis height of the beam spot of the ith electron beam, respectively; w is a weighting coefficient; x is the image height of the beam spot of any electron beam.
5. A computer device comprising a memory storing a computer program and a processor that runs the computer program to cause the computer device to perform the striped tube field curvature measuring method according to any of claims 1 to 3.
6. A readable storage medium, characterized in that it stores a computer program which, when run on a processor, performs the striped tube field curvature measuring method according to any one of claims 1 to 3.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010287032.XA CN111524105B (en) | 2020-04-13 | 2020-04-13 | Stripe tube field curvature measuring method, device, computer equipment and readable storage medium |
| PCT/CN2020/102691 WO2021208282A1 (en) | 2020-04-13 | 2020-07-17 | Field curvature measurement method and apparatus for streak tube, computer device, and readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010287032.XA CN111524105B (en) | 2020-04-13 | 2020-04-13 | Stripe tube field curvature measuring method, device, computer equipment and readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111524105A CN111524105A (en) | 2020-08-11 |
| CN111524105B true CN111524105B (en) | 2023-04-25 |
Family
ID=71902978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010287032.XA Active CN111524105B (en) | 2020-04-13 | 2020-04-13 | Stripe tube field curvature measuring method, device, computer equipment and readable storage medium |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN111524105B (en) |
| WO (1) | WO2021208282A1 (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102353345A (en) * | 2011-06-14 | 2012-02-15 | 梁海锋 | Curvature radius measuring method |
| CN104567721A (en) * | 2015-01-23 | 2015-04-29 | 清华大学 | Continuous shear interference measurement method |
| CN107422336A (en) * | 2016-07-25 | 2017-12-01 | 北京理工大学 | A kind of variable resolution Non-scanning mode streak tube laser imaging system of the big depth of field of big visual field |
| CN108012144A (en) * | 2017-12-13 | 2018-05-08 | 深圳大学 | A kind of X-ray streak camera imaging performance tests system and method |
| CN110531578A (en) * | 2019-09-02 | 2019-12-03 | 深圳大学 | More picture frame imaging method, apparatus and equipment |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0727762B2 (en) * | 1989-12-01 | 1995-03-29 | 浜松ホトニクス株式会社 | Streak tube |
| CN202886732U (en) * | 2012-10-24 | 2013-04-17 | 北京凯普林光电科技有限公司 | Compensatory light source system and train operation fault dynamic image detection equipment |
| CN103077873B (en) * | 2012-12-29 | 2015-09-02 | 中国科学院西安光学精密机械研究所 | A kind of striped image converter tube shelves frock and rack mounting method |
| CN206134645U (en) * | 2016-09-27 | 2017-04-26 | 中国科学院西安光学精密机械研究所 | Subminiature stripe transshaping pipe |
| CN107039223B (en) * | 2017-04-26 | 2019-01-04 | 深圳大学 | Big object plane X-ray striped image converter tube and electron optical imaging system |
-
2020
- 2020-04-13 CN CN202010287032.XA patent/CN111524105B/en active Active
- 2020-07-17 WO PCT/CN2020/102691 patent/WO2021208282A1/en active Application Filing
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102353345A (en) * | 2011-06-14 | 2012-02-15 | 梁海锋 | Curvature radius measuring method |
| CN104567721A (en) * | 2015-01-23 | 2015-04-29 | 清华大学 | Continuous shear interference measurement method |
| CN107422336A (en) * | 2016-07-25 | 2017-12-01 | 北京理工大学 | A kind of variable resolution Non-scanning mode streak tube laser imaging system of the big depth of field of big visual field |
| CN108012144A (en) * | 2017-12-13 | 2018-05-08 | 深圳大学 | A kind of X-ray streak camera imaging performance tests system and method |
| CN110531578A (en) * | 2019-09-02 | 2019-12-03 | 深圳大学 | More picture frame imaging method, apparatus and equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111524105A (en) | 2020-08-11 |
| WO2021208282A1 (en) | 2021-10-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10482617B2 (en) | Distance estimation method based on handheld light field camera | |
| US8773550B2 (en) | Range measurement using multiple coded apertures | |
| JP5681954B2 (en) | Imaging apparatus and imaging system | |
| US7215493B2 (en) | Imaging system with a lens having increased light collection efficiency and a deblurring equalizer | |
| JP5358039B1 (en) | Imaging device | |
| US8330852B2 (en) | Range measurement using symmetric coded apertures | |
| CN115456002A (en) | Two-dimensional code identification method, two-dimensional code positioning identification model establishment method and device | |
| US20100310176A1 (en) | Apparatus and Method for Measuring Depth and Method for Computing Image Defocus and Blur Status | |
| CN110807439B (en) | Method and device for detecting obstacle | |
| JP2013531268A (en) | Measuring distance using coded aperture | |
| CN106054379B (en) | Method for determining zoom lens focal length | |
| CN111311562B (en) | Ambiguity detection method and device for virtual focus image | |
| CN111524105B (en) | Stripe tube field curvature measuring method, device, computer equipment and readable storage medium | |
| KR102025113B1 (en) | Method for generating an image using a lidar and device for the same | |
| CN111812670B (en) | Single photon laser radar space transformation noise judgment and filtering method and device | |
| CN116597016A (en) | Optical fiber endoscope image calibration method | |
| CN108960226B (en) | Pointer instrument type representation value reading method and device | |
| Luzi et al. | Automatic evaluation of vertex structural defects on the anode surface of a low-light-level image intensifier based on proposed individual image processing strategies | |
| US20160086335A1 (en) | Image processing apparatus, image processing method, and storage medium | |
| CN109859135A (en) | A kind of image enhancement processing method applied to relevance imaging | |
| CN112639868A (en) | Image processing method and device and movable platform | |
| CN113838075A (en) | Monocular distance measuring method, device and computer readable storage medium | |
| CN108414195B (en) | Detection method, device and system of light source emitter to be detected and storage device | |
| US7193196B2 (en) | Methods and systems for evaluating optical systems | |
| US20180165409A1 (en) | Method and device for identifying single molecule and method and device for counting single molecule |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |