CN111506986B - Reliability evaluation method for small sample power supply system - Google Patents
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Abstract
The invention discloses a reliability evaluation method of a small sample power supply system, and relates to the technical field of power supply system evaluation. The invention comprises the following steps: s01, establishing a Simulink simulation circuit model: respectively establishing a simulation model for the linear power supply system and the Buck switching power supply system by using Simulink to replace a linear power supply board and a Buck switching power supply board; s02, determining a power supply system test sample: let the input voltage of the power supply system be V in The output voltage is V out The method comprises the steps of carrying out a first treatment on the surface of the S03, expanding according to the number of the degradation performance characteristic samples: obtaining a large number of simulation samples of the degradation performance characteristics of the power supply system through Simulink simulation; s04, evaluating the reliability of the power supply system. According to the invention, the performance degradation test data and the Simulink simulation are combined to finally achieve the aim of expanding the test performance degradation characteristic sample, and the reliability of the power supply system is evaluated by using the simulation data.
Description
Technical Field
The invention belongs to the technical field of power system evaluation, and particularly relates to a reliability evaluation method of a small-sample power system.
Background
In actual engineering, reliability evaluation work is carried out on products, and because of the limitations of factors such as cost, test environment and the like, the number of test pieces is relatively small, so that characteristic degradation data in the test process of the products are seriously insufficient, and great difficulty is brought to subsequent reliability evaluation work.
The power supply system comprises a linear voltage-stabilized power supply and a Buck switching power supply, and the two types of power supplies are limited by circuit design price, chip price, plate making price and test environment conditions, so that the number of test pieces for carrying out reliability tests is seriously insufficient (several blocks to more than ten blocks), and the collected power supply performance degradation data sample size is relatively insufficient. Based on the method, the invention provides a reliability evaluation method of a small sample power supply system, which can effectively solve the problem of small samples of the power supply system and expand the sample size of performance characteristic degradation so as to achieve the aim of reliability evaluation of the power supply system.
Disclosure of Invention
The invention provides a reliability evaluation method of a small sample power supply system, which solves the problems.
In order to solve the technical problems, the invention is realized by the following technical scheme:
the invention relates to a reliability evaluation method of a small sample power supply system, which comprises the following steps:
s01, establishing a Simulink simulation circuit model: respectively establishing a simulation model for the linear power supply system and the Buck switching power supply system by using Simulink to replace a linear power supply board and a Buck switching power supply board;
s02, determining a power supply system test sample: let the input voltage of the power supply system be V in The output voltage is V out ；
S03, expanding according to the number of the degradation performance characteristic samples: obtaining a large number of simulation samples of the degradation performance characteristics of the power supply system through Simulink simulation;
s04, evaluating reliability of the power supply system: and (3) carrying out reliability evaluation on the power supply system by adopting a Monte Carlo method, and solving the reliability under each test stress level.
Further, the expanding of the number of degraded performance characteristic samples in step S03 includes expanding the number of degraded samples of the linear power supply system: for a linear stabilized power supply system, a set of reference voltage levels is obtained according to known output voltage values and a relation between available output voltage and input voltage, and the set of reference voltage levels are used as inputs of a Simulink simulation, so that only one set of output voltage values can be obtained.
Further, in the process of expanding the degradation sample size of the linear power supply system, a range R= [ R ] of resistance error is introduced - ,R + ]In the error range of R, k groups of R values R= (R) are obtained in the range in a mode of uniformly taking values 1 ,R 2 ,…,R k ) By substituting the k-group resistance values into the relational expression of the output voltage and the input voltage, the k-group output voltage values can be obtained, and the m-group performance degradation parameters of the m-group test pieces can be expanded into s=k·m groups by the method.
Further, the expanding of the number of degraded performance characteristic samples in the step S03 includes expanding the number of degraded samples of the Buck power supply system: the duty ratio D is taken as the input of the Buck device, the rest is taken as a system for analysis, the stress level of a test piece is known as x, the output voltage value is V aiming at the Buck switching power supply system, and the method can expand the performance degradation parameters of m groups of test pieces into s=k.m groups.
Further, in the Buck power supply system degradation sample size expansion, for one stress level, the duty ratio also has an error d= [ D ] - ,D + ]And uniformly and randomly obtaining k groups of duty ratio values in an error range, and obtaining the k groups of duty ratio values and k groups of output voltage values according to one stress level.
Compared with the prior art, the invention has the following beneficial effects:
according to the method, performance degradation test data and Simulink simulation are combined to finally achieve the aim of expanding the test performance degradation characteristic sample, and the reliability of the power supply system is evaluated by using the simulation data.
Of course, it is not necessary for any one product to practice the invention to achieve all of the advantages set forth above at the same time.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a step diagram of a reliability evaluation method of a small sample power supply system according to the present invention;
FIG. 2 is a circuit block diagram of a linear regulated power supply system;
fig. 3 is a circuit configuration diagram of the Buck switching power supply system.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-3, a reliability evaluation method of a small sample power supply system of the present invention includes the following steps:
1. simulink simulation circuit model
Firstly, respectively establishing a simulation model for a linear power supply system and a Buck switching power supply system by using Simulink to replace the linear power supply board and the Buck switching power supply board, wherein specific simulation circuits are respectively shown in fig. 2 and 3;
the basic circuit of LDO linear voltage stabilizer is shown in FIG. 2, and the circuit is composed of P-channel FET and sampling resistor R 1 And R is 2 The device comprises a comparison amplifier and a band gap reference source. The band gap reference source is added at the non-inverting input end of the comparator and is compared with partial output voltage value added at the inverting input end, and after the difference value of the non-inverting input end and the partial output voltage value is amplified by the amplifier Erroramp;
for LDO circuit, its target output voltage V out The value is obtained by adjusting two voltage dividing resistors R in a circuit 1 And R is 2 Is controlled by the value of (a). The final output voltage of the LDO circuit can be obtained according to the voltage division law of the circuit in the formula (1) and is shown in the formula (2);
wherein V is ref Representing a voltage value set by the band gap reference source;
the schematic diagram of the Buck switching power supply circuit is shown in figure 3;
the working principle of the Buck circuit is mainly that a PWM comparator is used for controlling the on and off of a PMOS tube by comparing the output voltage value of an amplifier with a sawtooth wave so as to adjust the duty ratio of the output PWM wave and adjust the output voltage to achieve the acquisition target V out The purpose of the value. Because ofThe relation between the output voltage and the input voltage is shown in the formula (3);
wherein T is on Representing the time of switch closure in a cycle, T off Indicating the time of switch opening in a cycle, T on +T off I.e. the duty cycle of the PWM wave, i.e. the ratio of the high level pulse width in one period to the whole period, i.e. the output voltage is the product of the input voltage and the duty cycle of the control signal.
2. Power supply system test sample
Let the input voltage of the power supply system be V in The output voltage is V out The final output voltage will change due to environmental stress changes during the power system reliability test. For example, the environmental stress levels are respectively x= (x 1 ,x 2 ,…,x n ) N is the number of stress levels, and the corresponding output voltage level is v out ＝(v out1 ,v out2 ,…,v outn ). When the number of test pieces is m, the number of m groups of stress levels and m groups of output voltage levels are obtained, and the m value is always smaller due to the limitation of the number of the test pieces.
3. Degraded performance feature sample number extension
In order to expand the number of the degradation performance characteristic samples, the invention introduces Simulink simulation to obtain a large number of simulation samples of the degradation performance characteristics of the power supply system.
1. Linear power system degradation sample size expansion:
for a linear stabilized power supply system, the output voltage value is shown as formula (2). It is known that the stress level of a test piece is x= (x) 1 ,x 2 ,…,x n ) The output voltage value is v out ＝(v out1 ,v out2 ,…,v outn ) From the known output voltage value and equation (2), a set of reference voltage levels v can be obtained ref ＝(v ref1 ,v ref2 ,…,v refn ). The set of reference voltages v ref As input to Simulink simulation, only one set of output voltage values v can be obtained out To extend the number of degraded samples, the present invention introduces a range of resistance errors.
The resistor is manufactured by the processes of materials and the like, and has an error value within a range of R= [ R ] - ,R + ]. The invention obtains k groups of R values R= (R) in the error range of R according to a uniform value taking mode 1 ,R 2 ,…,R k ). Substituting k groups of resistance values into the formula (2) to obtain k groups of output voltage values v out (i)＝(v out1 (i),v out2 (i),…,v outn (i))(i∈[1,k]) By this method, the m-group performance degradation parameters of the m-group test pieces can be expanded into s=k·m groups.
2. Buck power system degradation sample size extension
The output voltage of the Buck device is closely related to the duty cycle in the circuit, and the duty cycle is referred to herein as the analysis method of the linear voltage regulator circuitThe rest is regarded as a system.
Analysis was performed. A stress level of a test piece is known for Buck switching power supply systems as x= (x) 1 ,x 2 ,…,x n ) The output voltage value is v out ＝(v out1 ,v out2 ,…,v outn ) Its corresponding duty cycle is d= (D) 1 ,D 2 ,…D n ). For one of the stress levels, there is also an error d= [ D ] in the duty cycle - ,D + ]And uniformly and randomly obtaining k groups of duty ratio values in an error range. For one of the stress levels, k groups of duty cycle values and k groups of output voltage values v can be obtained out (i)＝(v out1 (i),v out2 (i),…,v outn (i))(i∈[1,k]) By this method, the m-group performance degradation parameters of the m-group test pieces can be expanded into s=k·m groups.
4. Power supply system reliability assessment
According to the invention, after the number of the performance degradation characteristic samples under each stress level is expanded into s groups through the simulation method, when the value of k is larger, the value of s is also larger, and then the reliability evaluation can be carried out on the power supply system by adopting the Monte Carlo method, so that the reliability under each test stress level is obtained. Each stress level can be evaluated according to a failure threshold value set in advance by the output voltage, and the specific calculation is shown as the formula (4):
n in (4) i The value represents the number of output voltage values less than the failure threshold voltage at the ith stress level, N i(s) The total number of output voltage values at the ith stress level is indicated.
Compared with the prior art, the invention has the following beneficial effects:
the topology of the present invention has the following advantages over the conventional TSBB (Two-switch buck-boost):
(1) The fault-tolerant function is realized, and the fault tolerance of any switching tube of the topology can be realized by only using one additional power switching tube.
(2) Because the two switching tubes are grounded, the design of the driving circuit is more convenient.
The preferred embodiments of the invention disclosed above are intended only to assist in the explanation of the invention. The preferred embodiments are not exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.
Claims (1)
1. A reliability evaluation method of a small sample power supply system, comprising the steps of:
s01, establishing a Simulink simulation circuit model: respectively establishing a simulation model for the linear power supply system and the Buck switching power supply system by using Simulink to replace a linear power supply board and a Buck switching power supply board;
s02, determining a power supply system test sample: let the input voltage of the power supply system be V in The output voltage is V out ；
S03, expanding according to the number of the degradation performance characteristic samples: obtaining a large number of simulation samples of the degradation performance characteristics of the power supply system through Simulink simulation;
linear power system degradation sample size expansion:
aiming at a linear stabilized voltage power supply system, the output voltage value formula is as follows;
wherein V is ref Representing a voltage value set by the band gap reference source;
it is known that the stress level of a test piece is x= (x) 1 ,x 2 ,…,x n ) The output voltage value is v out ＝(v out1 ,v out2 ,…,v outn ) A set of reference voltage levels v can be obtained from a known output voltage value and an output voltage value formula ref ＝(v ref1 ,v ref2 ,…,v refn ) The method comprises the steps of carrying out a first treatment on the surface of the The set of reference voltages v ref As input to Simulink simulation, only one set of output voltage values v can be obtained out To expand the number of degraded samples, a range of resistance errors is introduced;
the resistor is manufactured by the processes of materials and the like, and has an error value within a range of R= [ R ] - ,R + ]The method comprises the steps of carrying out a first treatment on the surface of the In the error range of R, k groups of R values R= (R) are obtained in the range in a uniform value 1 ,R 2 ,…,R k ) The method comprises the steps of carrying out a first treatment on the surface of the Substituting k groups of resistance values into the output voltage value formula to obtain k groups of output voltage values v out (i)＝(v out1 (i),v out2 (i),…,v outn (i))(i∈[1,k]) By the method, the performance degradation parameters of m groups of test pieces can be expanded into s=k.m groups;
buck power system degradation sample size expansion:
the output voltage of the Buck device is closely related to the duty cycle in the circuit, and the duty cycle is referred to herein as the analysis method of the linear voltage regulator circuit:
the input of the Buck device is regarded as input, and the rest is regarded as a system;
analyzing; a stress level of a test piece is known for Buck switching power supply systems as x= (x) 1 ,x 2 ,…,x n ) The output voltage value is v out ＝(v out1 ,v out2 ,…,v outn ) Its corresponding duty cycle is d= (D) 1 ,D 2 ,…D n ) The method comprises the steps of carrying out a first treatment on the surface of the For one of the stress levels, there is also an error d= [ D ] in the duty cycle - ,D + ]Uniformly and randomly obtaining k groups of duty ratio values in an error range; for one of the stress levels, k groups of duty cycle values and k groups of output voltage values v can be obtained out (i)＝(v out1 (i),v out2 (i),…,v outn (i))(i∈[1,k]) By the method, the performance degradation parameters of m groups of test pieces can be expanded into s=k.m groups;
s04, evaluating reliability of the power supply system: performing reliability evaluation on a power supply system by adopting a Monte Carlo method, and solving the reliability of each test stress level;
after the number of the performance degradation characteristic samples under each stress level is expanded into s groups by the simulation method, when the value of k is larger, the value of s is also larger, and then the reliability evaluation can be carried out on the power supply system by adopting a Monte Carlo method, so that the reliability under each test stress level is obtained; according to the failure threshold value set in advance by the output voltage, each stress level can be evaluated, and the following formula is specifically calculated:
wherein N is i The value represents the number of output voltage values less than the failure threshold voltage at the ith stress level, N i(s) The total number of output voltage values at the ith stress level is indicated.
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| WO2011089258A2 (en) * | 2010-01-25 | 2011-07-28 | Imec | A variability-aware reliability simulation method of electronic systems |
| CN107729660A (en) * | 2017-10-23 | 2018-02-23 | 哈尔滨工业大学 | A kind of relay class unit Estimation of The Storage Reliability method of combination emulation |
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