CN111505399A - Method for measuring space charge distribution of polymer dielectric film - Google Patents

Method for measuring space charge distribution of polymer dielectric film Download PDF

Info

Publication number
CN111505399A
CN111505399A CN202010351989.6A CN202010351989A CN111505399A CN 111505399 A CN111505399 A CN 111505399A CN 202010351989 A CN202010351989 A CN 202010351989A CN 111505399 A CN111505399 A CN 111505399A
Authority
CN
China
Prior art keywords
dielectric film
polymer dielectric
expression
frequency domain
response current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202010351989.6A
Other languages
Chinese (zh)
Other versions
CN111505399B (en
Inventor
郑飞虎
黄陈昱
张冶文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tongji University
Original Assignee
Tongji University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tongji University filed Critical Tongji University
Priority to CN202010351989.6A priority Critical patent/CN111505399B/en
Publication of CN111505399A publication Critical patent/CN111505399A/en
Application granted granted Critical
Publication of CN111505399B publication Critical patent/CN111505399B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24Arrangements for measuring quantities of charge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

The invention relates to the field of polymer dielectric films, in particular to a method for measuring space charge distribution of a polymer dielectric film, which comprises the following steps: carrying out metallization treatment on two sides of the polymer dielectric film, and applying direct-current voltage; pulse laser is hit to a metallized electrode on one side of the polymer dielectric film, the generated response current is measured, and a time domain response current expression is constructed; carrying out Fourier transform on the time domain response current expression by combining a Poisson equation and a one-dimensional heat conduction equation to obtain a frequency domain expression of response current related to space charge distribution; performing high-frequency approximation on the frequency domain expression to obtain an approximate frequency domain expression; and solving the approximate frequency domain expression to obtain space charge distribution. Compared with the prior art, the efficiency of data analysis is improved, the sensitivity of the data analysis to noise is reduced, and the precision of the measurement result is improved.

Description

Method for measuring space charge distribution of polymer dielectric film
Technical Field
The invention relates to the field of polymer dielectric films, in particular to a method for measuring space charge distribution of a polymer dielectric film.
Background
The space charge distribution in a polymer dielectric film has a crucial influence on its performance. In the existing measurement method for space charge, the heat pulse method has the advantages of short measurement period, high resolution and the like, and is particularly suitable for measuring micron-sized polymer films. The method generates thermal disturbance by applying a thermal pulse to a sample, and the thermal pulse drives charges in the process of propagating in a medium to trigger a measurable thermal response displacement current. The data analysis of the displacement current relates to a first Fredholm integral equation, and a proper numerical calculation method is adopted for solving. Traditionally in data analysis of non-polar dielectrics, the solution to the equation is aimed at the electric field distribution in the medium. From the poisson equation, space charge distribution information can be obtained from the calculation result by simple differentiation.
The first class of Fredholm integral equation is mathematically ill-conditioned, and very small data errors can lead to completely different results, i.e., ill-characterization. In actual measurement, a displacement current signal generated by a film sample is a nanoamp-level weak signal, so that the displacement current signal is easily interfered by an experimental circuit and the environment, and a noise signal is inevitably superposed on the current signal, thereby bringing certain difficulty to mathematical processing. At present, several numerical methods widely used in experiments for solving the displacement current equation, such as a scale transformation method, a Tikhonov regularization method, a Monte Carlo method, and the like, have certain sensitivity to noise. Therefore, in the data analysis of the measured signal, the electric field distribution curve obtained may have a certain jitter due to the existence of noise in the current signal and the characteristics of the algorithm. In this case, the spatial charge distribution curve obtained by performing differential calculation on the electric field may have unreasonable distributions such as partial regional distortion and frequent polarity inversion, and has a large deviation from the actual distribution. Therefore, when data processing is performed, the electric field calculation result is required to be smooth at a later stage, but the true information of partial charge distribution can be masked.
Disclosure of Invention
The present invention is directed to a method for measuring space charge distribution of a polymer dielectric thin film, which overcomes the above-mentioned drawbacks of the prior art.
The purpose of the invention can be realized by the following technical scheme:
a method for measuring space charge distribution of a polymer dielectric film, the method comprising the steps of:
step S1: carrying out metallization treatment on two sides of the polymer dielectric film, and applying direct-current voltage;
step S2: pulse laser is hit to a metallized electrode on one side of the polymer dielectric film, the generated response current is measured, and a time domain response current expression is constructed;
step S3: carrying out Fourier transform on the time domain response current expression by combining a Poisson equation and a one-dimensional heat conduction equation to obtain a frequency domain expression of response current related to space charge distribution;
step S4: performing high-frequency approximation on the frequency domain expression to obtain an approximate frequency domain expression;
step S5: and solving the approximate frequency domain expression to obtain space charge distribution.
The time domain response current expression is a Fredholm integral equation, and the time domain response current expression is as follows:
Figure BDA0002472218420000021
wherein i (T) is a response current time domain representation, x is a spatial position, T is time, Δ T (x, T) is a temperature change of the polymer dielectric film, A is an irradiation area of the polymer dielectric film hit by the pulsed laser, d is a thickness of the polymer dielectric film, and g (x) is a distribution function.
For non-polar media, g (x) is expressed as:
g(x)=0 r(α-αx)E(x)
wherein, αIs temperature coefficient of dielectric constant, αxWhich is the coefficient of thermal expansion of the polymer dielectric film,0in order to have a dielectric constant in a vacuum,re (x) is the electric field distribution of the polymer dielectric film.
The frequency domain expression is as follows:
Figure BDA0002472218420000022
wherein D is the thermal diffusion coefficient, p, of the polymer dielectric film(x) Is the space charge distribution of the polymer dielectric film, omega is the angular frequency, x is the spatial position, A is the irradiated area of the polymer dielectric film struck by the pulsed laser, d is the thickness of the polymer dielectric film, αIs temperature coefficient of dielectric constant, αxΔ T (x, ω) is a frequency domain representation of the temperature change of the polymer dielectric film, and I (ω) is a frequency domain representation of the response current, which is the coefficient of thermal expansion of the polymer dielectric film.
In the frequency domain expression, let:
Figure BDA0002472218420000031
an approximate frequency domain expression is obtained, where q is the energy density of the pulsed laser at the metal electrode, η is the absorption rate of the pulsed laser at the metal electrode, k is the thermal conductivity of the polymer dielectric thin film,
Figure BDA0002472218420000032
the approximate frequency domain expression is as follows:
Figure BDA0002472218420000033
wherein M isρ=cρod/[ηq(α-αx)]And c is the specific heat capacity, rho, of the polymer dielectric film0Is the density of the polymer dielectric film.
The step S5 is solved by a scaling method.
The space charge distribution obtained by the scale transformation method is as follows:
Figure BDA0002472218420000034
wherein the content of the first and second substances,
Figure BDA0002472218420000035
denotes the difference between the real and imaginary parts of I (ω) multiplied by γ.
The metallization treatment is to evaporate electrodes on two sides of the polymer dielectric film.
Compared with the prior art, the invention has the following advantages:
(1) the solution target is directly converted into space charge distribution, the space charge distribution can be obtained only by solving the numerical value of a first Fredholm integral equation, namely, the space charge distribution in the tested polymer dielectric film can be directly obtained only by solving a ill-condition equation, and the efficiency of data analysis is improved.
(2) The sensitivity of data analysis to noise is improved, the differential operation process is avoided, the influence of the noise on electric field distribution calculation is prevented from being further amplified in a space charge distribution curve, and the sensitivity to the noise in actual measurement is lower.
(3) The unreasonable oscillation of space charge data is greatly reduced, and the precision of the measurement result is improved.
Drawings
FIG. 1 is a flow chart of the present invention;
FIG. 2 is a graph showing the results of the present invention.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments. The present embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
Examples
In this embodiment, the space charge distribution of the thermal pulse data processing is directly calculated by taking a scale transform method in the frequency domain as an example. The first Fredholm integral equation (response current expression) involved in the analysis of the thermal pulse method measurement space charge data is as follows:
Figure BDA0002472218420000041
wherein i (T) is a response current time domain representation, x is a spatial position, T is time, Δ T (x, T) is a temperature change of the polymer dielectric film, A is an irradiation area of the polymer dielectric film hit by the pulsed laser, d is a thickness of the polymer dielectric film, g (x) is a distribution function, and g (x) is expressed as:
g(x)=0 r(α-αx)E(x) (2)
wherein, αIs temperature coefficient of dielectric constant, αxWhich is the coefficient of thermal expansion of the polymer dielectric film,0in order to have a dielectric constant in a vacuum,re (x) is the electric field distribution of the polymer dielectric film.
The basic steps are as follows:
performing metallization treatment on the polymer dielectric film (evaporating electrodes on two sides), applying direct-current voltage, striking pulse laser to the metal electrode on one side of the polymer dielectric film, measuring response current generated by the pulse laser, and constructing a response current expression;
according to one-dimensional heat conduction equation
Figure BDA0002472218420000042
Where D is the thermal diffusivity of the polymer dielectric film, equation (1) translates to:
Figure BDA0002472218420000043
and Fourier transform is carried out on the response current expression, and the formula (1) is converted into a first Fredholm integral equation in a frequency domain form:
Figure BDA0002472218420000044
where Δ T (x, ω) is a frequency domain representation of the temperature change of the polymer dielectric film.
According to the Poisson equation
e0erdE(x)/dx=ρ(x) (6)
Converting equation (5) into a frequency domain expression of the response current with respect to the space charge distribution, which is targeted for solving the space charge distribution ρ (x) of the polymer dielectric thin film:
Figure BDA0002472218420000051
where D is the thermal diffusion coefficient of the polymer dielectric thin film, and I (ω) is the frequency domain representation of the response current.
The polymer dielectric film can be considered adiabatic on both sides during the measurement time, approximating the spatial position derivative for temperature change:
Figure BDA0002472218420000052
where q is the energy density of the pulsed laser at the metal electrode, η is the absorption rate of the pulsed laser at the metal electrode, k is the thermal conductivity of the polymer dielectric thin film,
Figure BDA0002472218420000053
from equation (8), an approximate expression of equation (7) is obtained:
Figure BDA0002472218420000054
wherein M isρ=cρ0d/[ηq(α-αx)]And c is the specific heat capacity, rho, of the polymer dielectric film0Is the density of the polymer dielectric film.
Solving the charge density distribution solution in the polymer dielectric film according to a scale conversion method:
Figure BDA0002472218420000055
wherein the content of the first and second substances,
Figure BDA0002472218420000056
is the real part and imaginary part after multiplying I (omega) by gammaThe difference of the sections.
The following is a specific example:
in the case where a certain level of noise is superimposed on the response current, the result of comparing the method of the present embodiment with the conventional method is shown in fig. 2, and it can be seen that the method of the present embodiment obtains a more accurate result.

Claims (9)

1. A method for measuring space charge distribution of a polymer dielectric film, comprising the steps of:
step S1: carrying out metallization treatment on two sides of the polymer dielectric film, and applying direct-current voltage;
step S2: pulse laser is hit to a metallized electrode on one side of the polymer dielectric film, the generated response current is measured, and a time domain response current expression is constructed;
step S3: carrying out Fourier transform on the time domain response current expression by combining a Poisson equation and a one-dimensional heat conduction equation to obtain a frequency domain expression of response current related to space charge distribution;
step S4: performing high-frequency approximation on the frequency domain expression to obtain an approximate frequency domain expression;
step S5: and solving the approximate frequency domain expression to obtain space charge distribution.
2. The method as claimed in claim 1, wherein the time-domain response current expression is Fredholm integral equation, and the time-domain response current expression is:
Figure FDA0002472218410000011
wherein i (T) is a response current time domain representation, x is a spatial position, T is time, Δ T (x, T) is a temperature change of the polymer dielectric film, A is an irradiation area of the polymer dielectric film hit by the pulsed laser, d is a thickness of the polymer dielectric film, and g (x) is a distribution function.
3. The method of claim 2, wherein g (x) is expressed as:
g(x)=0 r(α-αx)E(x)
wherein, αIs temperature coefficient of dielectric constant, αxWhich is the coefficient of thermal expansion of the polymer dielectric film,0in order to have a dielectric constant in a vacuum,re (x) is the electric field distribution of the polymer dielectric film.
4. The method as claimed in claim 1, wherein the frequency domain expression is:
Figure FDA0002472218410000012
wherein D is the thermal diffusion coefficient of the polymer dielectric film, ρ (x) is the space charge distribution of the polymer dielectric film, ω is the angular frequency, x is the spatial position, A is the irradiation area of the polymer dielectric film struck by the pulsed laser, D is the thickness of the polymer dielectric film, αIs temperature coefficient of dielectric constant, αxΔ T (x, ω) is a frequency domain representation of the temperature change of the polymer dielectric film, and I (ω) is a frequency domain representation of the response current, which is the coefficient of thermal expansion of the polymer dielectric film.
5. The method as claimed in claim 4, wherein in the frequency domain expression, the following steps are performed:
Figure FDA0002472218410000021
obtaining an approximate frequency domain expression, wherein q is the energy density of the pulse laser at the metal electrode, and η is the pulseThe absorption of the laser light at the metal electrode, k is the thermal conductivity of the polymer dielectric film,
Figure FDA0002472218410000022
6. the method as claimed in claim 5, wherein the approximate frequency domain expression is:
Figure FDA0002472218410000023
wherein M isρ=cρ0d/[ηq(α-αx)]And c is the specific heat capacity, rho, of the polymer dielectric film0Is the density of the polymer dielectric film.
7. The method as claimed in claim 6, wherein the step S5 is solved by a scale transformation method.
8. The method of claim 7, wherein the space charge distribution obtained by the scaling method is:
Figure FDA0002472218410000024
wherein the content of the first and second substances,
Figure FDA0002472218410000025
denotes the difference between the real and imaginary parts of I (ω) multiplied by γ.
9. The method as claimed in claim 1, wherein the metallization process is evaporation plating of electrodes on both sides of the polymer dielectric film.
CN202010351989.6A 2020-04-28 2020-04-28 Method for measuring space charge distribution of polymer dielectric film Active CN111505399B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010351989.6A CN111505399B (en) 2020-04-28 2020-04-28 Method for measuring space charge distribution of polymer dielectric film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010351989.6A CN111505399B (en) 2020-04-28 2020-04-28 Method for measuring space charge distribution of polymer dielectric film

Publications (2)

Publication Number Publication Date
CN111505399A true CN111505399A (en) 2020-08-07
CN111505399B CN111505399B (en) 2021-11-09

Family

ID=71874960

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010351989.6A Active CN111505399B (en) 2020-04-28 2020-04-28 Method for measuring space charge distribution of polymer dielectric film

Country Status (1)

Country Link
CN (1) CN111505399B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113419120A (en) * 2021-05-08 2021-09-21 同济大学 Method and system for measuring thermal resistance of dielectric film and metal interface

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006259178A (en) * 2005-03-16 2006-09-28 Ricoh Co Ltd Method, device, and element for optical modulation
WO2012083031A1 (en) * 2010-12-16 2012-06-21 Indiana University Research And Technology Corporation Charge detection mass spectrometer with multiple detection stages
CN103605008A (en) * 2013-11-20 2014-02-26 上海电力学院 System and method for measuring high voltage cable space charges based on electroacoustic pulse method
CN104698296A (en) * 2015-02-09 2015-06-10 南方电网科学研究院有限责任公司 Space charge measuring signal attenuation and dispersion factor compensation method
CN106018987A (en) * 2016-08-04 2016-10-12 上海电力学院 Space charge testing system and method
CN205880067U (en) * 2016-07-22 2017-01-11 国网上海市电力公司 Electrode system based on cable space charge is measured to electroacoustic impulse method
CN109557129A (en) * 2018-10-29 2019-04-02 同济大学 A kind of measurement method of film thermal diffusion coefficient
CN110909292A (en) * 2019-10-24 2020-03-24 同济大学 Monte Carlo data processing method for determining material electric field distribution by thermal pulse method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006259178A (en) * 2005-03-16 2006-09-28 Ricoh Co Ltd Method, device, and element for optical modulation
WO2012083031A1 (en) * 2010-12-16 2012-06-21 Indiana University Research And Technology Corporation Charge detection mass spectrometer with multiple detection stages
CN103605008A (en) * 2013-11-20 2014-02-26 上海电力学院 System and method for measuring high voltage cable space charges based on electroacoustic pulse method
CN104698296A (en) * 2015-02-09 2015-06-10 南方电网科学研究院有限责任公司 Space charge measuring signal attenuation and dispersion factor compensation method
CN205880067U (en) * 2016-07-22 2017-01-11 国网上海市电力公司 Electrode system based on cable space charge is measured to electroacoustic impulse method
CN106018987A (en) * 2016-08-04 2016-10-12 上海电力学院 Space charge testing system and method
CN109557129A (en) * 2018-10-29 2019-04-02 同济大学 A kind of measurement method of film thermal diffusion coefficient
CN110909292A (en) * 2019-10-24 2020-03-24 同济大学 Monte Carlo data processing method for determining material electric field distribution by thermal pulse method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
孙志: "《扫描探针显微镜研究聚合物表面电特性》", 《哈尔滨理工大学博士论文》 *
张冶文等: "《固体绝缘介质中空间电荷分布测量技术及其在电气工业中的应用》", 《高电压技术》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113419120A (en) * 2021-05-08 2021-09-21 同济大学 Method and system for measuring thermal resistance of dielectric film and metal interface

Also Published As

Publication number Publication date
CN111505399B (en) 2021-11-09

Similar Documents

Publication Publication Date Title
US9709530B2 (en) Fast-switching dual-polarity ion mobility spectrometry
EP2481074B1 (en) Apparatus and method for measuring plasma parameters
CN111505399B (en) Method for measuring space charge distribution of polymer dielectric film
WO2012083031A1 (en) Charge detection mass spectrometer with multiple detection stages
Sedlak et al. Adsorption–desorption noise in QCM gas sensors
Varghese et al. Noncontact photo-acoustic defect detection in drug tablets
CN102829732B (en) A kind of twin-laser On-line sampling system device and method for glow-discharge sputtering depth survey
CN114264695A (en) Method and system for measuring heat conductivity coefficient of trace liquid
Lang Fredholm integral equation of the Laser Intensity Modulation Method (LIMM): Solution with the polynomial regularization and L-curve methods
Burger et al. Frequency domain and wavelet analysis of the laser-induced plasma shock waves
Plotnikov et al. An approach to the reconstruction of true concentration profile from transient signal in spatially resolved analysis by means of laser ablation ICP MS
CN113484702B (en) Displacement current prediction method for pulse discharge
CN109060732B (en) Method for detecting molecular rotation wave packet
Meehan et al. Two component electric field dynamics of a ns-SDBD plasma with sub-nanosecond resolution by femtosecond EFISH
Zheng et al. Space charge data analysis for thermal pulse method
Chen et al. Interface thermal resistance of micron-thin film
CN114460131A (en) Method and device for measuring cross-scale solid heat conductivity coefficient
Koettig et al. Study of temperature wave propagation in superfluid helium focusing on radio-frequency cavity cooling
Pacheco et al. Real time determination of the laser ablated mass by means of electric field-perturbation measurement
Lang et al. A comparison of three techniques for solving the Fredholm integral equation of the Laser Intensity Modulation Method (LIMM)
Alkhawwam et al. Characterization of laser induced tantalum plasma by spatio-temporal resolved optical emission spectroscopy
CN113125867B (en) Full-field correction method for thermal pulse method response signal correction
Ren et al. Research challenges on space charge measurement at high speed under the condition of high-frequency voltage
McGrane et al. Ultrafast dynamic ellipsometry and spectroscopy of laser shocked materials
CN111856162B (en) Vacuum air chamber electric field intensity measuring device and method based on time-of-flight mass spectrum

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant