CN111487523A - Hall sensor testing method for carrying IC tester - Google Patents
Hall sensor testing method for carrying IC tester Download PDFInfo
- Publication number
- CN111487523A CN111487523A CN202010359794.6A CN202010359794A CN111487523A CN 111487523 A CN111487523 A CN 111487523A CN 202010359794 A CN202010359794 A CN 202010359794A CN 111487523 A CN111487523 A CN 111487523A
- Authority
- CN
- China
- Prior art keywords
- tester
- magnetic field
- hall sensor
- sensor
- test seat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/142—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measuring Magnetic Variables (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a Hall sensor testing method for carrying an IC tester, which is characterized in that a relationship between the magnetic field intensity H of a sensor testing seat at a fixed position in a Helmholtz coil and the input current I of the coil is calibrated by using a tested magnetic field intensity tester; inputting the calibrated array into an IC tester; controlling the stepping motor by using an IC tester so as to control the sensor test seat to enter a fixed position in the Helmholtz coil; after the sensor test seat enters a fixed position in the Helmholtz coil, the IC tester starts to apply current I to the Helmholtz coil so as to control the magnetic field intensity H; the IC tester controls the magnetic field intensity H and simultaneously tests the device mounted on the sensor test seat through the connecting wire joint. The Hall sensor testing device for carrying the IC tester can be carried on the IC tester to detect the Hall sensor, so that related tests can be realized.
Description
Technical Field
The invention relates to a digital circuit testing device, in particular to a Hall sensor testing method for carrying an IC tester.
Background
The integrated circuit industry is rapidly developed, the types of integrated circuits are more and more, digital integrated circuits occupy a large share, the functions of the digital integrated circuits are various, the speed is different, the development of the digital integrated ionization industry lays a solid foundation for digital living pursuit, a large number of chips are produced, since the chip may fail during the design, manufacture and use of the package, it is necessary to perform tests, including functional tests, dc parametric tests and ac parametric tests, the traditional digital integrated circuit tester comprises a measurement vector memory, a test vector reading module, a formatting coding module, an input level conversion module, a program control power supply module, an output level conversion module, a test result acquisition and judgment module, a result writing vector module and a result memory.
However, the existing IC tester does not have the capability of testing the hall sensor, and the hall sensor test usually controls the magnetic field distribution at the product to be tested by manually controlling the distance of the magnet, so that the automation degree is not high, and the test efficiency is low.
Therefore, a new solution is needed to solve this problem.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide the Hall sensor testing device for carrying the IC tester, which can be conveniently carried on the IC tester to test the Hall sensor, is convenient to install and has high testing efficiency.
The technical purpose of the invention is realized by the following technical scheme: the utility model provides a hall sensor test method for carrying on IC tester, adopts a hall sensor testing arrangement for carrying on the IC tester to carry out the operation, and a hall sensor test for carrying on the IC tester includes the base, installs the magnetic field mechanism that is used for producing fixed magnetic field on the base, still be provided with the sensor detection mechanism that is used for settling the product that awaits measuring on the base, sensor detection mechanism is connected with drive arrangement and is used for the drive product business turn over magnetic field mechanism that awaits measuring, magnetic field mechanism, sensor detection mechanism and drive arrangement all are provided with the coil joint that is used for being connected to the IC tester.
The specific test method is as follows:
1. Calibrating the relationship between the magnetic field intensity H of the sensor test seat at the fixed position in the Helmholtz coil and the input current I of the coil by using a calibrated magnetic field intensity tester;
2. Inputting the calibrated array into an IC tester;
3. Controlling a stepping motor by using an IC tester, controlling the sliding block to slide forwards after leaving an initial position by using the stepping motor, and controlling a sensor test seat to enter a fixed position in a Helmholtz coil;
4. After the sensor test seat enters a fixed position in the Helmholtz coil, the IC tester starts to apply current I to the Helmholtz coil so as to control the magnetic field intensity H;
5. The IC tester controls the magnetic field intensity H and simultaneously tests the device arranged on the sensor test seat through the connecting wire joint;
6. After the test is finished, the IC tester is used for controlling the stepping motor, and the stepping motor controls the sliding block to slide backwards, so that the sensor test seat is controlled to leave a fixed position in the Helmholtz coil and return to an initial position.
The invention is further configured to: the magnetic field mechanism is arranged as a Helmholtz coil.
The invention is further configured to: the base is provided with a sliding rail, and the sensor detection mechanism is installed on the sliding rail.
The invention is further configured to: and the sliding rail is provided with a limiting mechanism for limiting the stroke of the sensor detection mechanism.
The invention is further configured to: the driving device comprises a stepping motor, and the stepping motor is used for driving the sensor detection mechanism to move back and forth along the sliding rail.
The invention is further configured to: the sensor detection mechanism comprises a sliding block, the sliding block is connected to the sliding rail in a sliding mode, a test seat mounting plate is fixed to the sliding block, a sensor test seat is arranged at one end of the test seat mounting plate and used for mounting a product to be tested, and the test seat mounting plate is used for sliding along the sliding rail to enable the sensor test seat to enter and exit the magnetic field mechanism.
The invention is further configured to: the test seat mounting plate and the sensor test seat are made of resin materials.
The invention is further configured to: the limiting device comprises a front limiting bulge and a rear limiting bulge which are arranged on the sliding rail, and the sensor detection mechanism is arranged between the front limiting bulge and the rear limiting bulge.
The invention is further configured to: the slider is fixedly provided with a support, and the test seat mounting plate is slidably connected to the support.
The invention is further configured to: the test seat mounting plate is arranged in a triangular shape.
In conclusion, the invention has the following beneficial effects:
firstly, the magnetic field mechanism, the sensor test seat and the driving device are carried on an IC tester through a coil joint, so that the detection data can be tested and displayed through the IC tester;
②, a Helmholtz coil is used for replacing a permanent magnet induction excitation mode, so that the influence caused by magnetic attenuation is avoided;
the Helmholtz coil can provide a uniform magnetic field in a small range, so that the stability and accuracy of test data can be better ensured, and the influence caused by the positioning error of the clamp is avoided;
④, limiting devices are additionally arranged at the front and the rear of the track, so that the position of a product to be measured in the coil can be more accurately positioned;
⑤, the sensor test seat and the test seat mounting plate are made of resin materials so as to reduce the influence on the magnetic field;
flexibly carrying the test card to different IC testers by changing the interface mode;
⑦, the height of the test seat mounting plate can be adjusted by sliding, the test seat mounting plate is arranged in a triangle shape and is used for convenient automatic positioning, the product to be tested is conveyed to the central position of the magnetic field mechanism, and the test data is more accurate
the testing device has low manufacturing cost, simple principle, easy realization and convenient maintenance
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
In the figure: 1. a magnetic field mechanism; 2. a base; 3. a bolt; 4. a coil control terminal; 5. a connecting wire joint; 6. a front limiting bulge; 7. a slide rail; 8. a stepping motor; 9. a sensor test seat; 10. a test seat mounting plate; 11. a support; 12. a slider; 13. a rear limiting bulge.
Detailed Description
The invention is described in detail below with reference to the figures and examples.
The utility model provides a hall sensor testing arrangement for carrying on IC tester, as shown in fig. 1, including a base 2, base 2 is a cuboid plane board, be provided with magnetic field mechanism 1 on base 2, magnetic field mechanism 1's effect is mainly used for producing invariable magnetic field, preferably adopts the Helmholtz coil, be about to the Helmholtz coil pass through the bolt fastening on base 1 to still fixed mounting has slide rail 7 on base 1, the cross-section of slide rail 7 is the setting of T type, install sensor detection mechanism on slide rail 7.
Sensor detection mechanism includes slider 12, slider 12 is installed and can be slided along slide rail 7 on slide rail 7, install support 11 on slider 12, support 11 sets up perpendicular to base 2, it fixes to slider 12 with support 11 through fixing bolt 3, fix test seat mounting panel 10 on support 11, fix the other end to test seat mounting panel 10 with sensor test seat 9 through the adhesive mode, sensor test seat 9 is used for installing the product that awaits measuring and detects the effect, wherein sensor test seat 9 and test seat mounting panel 10 preferentially adopt resin material to make, be used for avoiding causing the interference to measuring environment.
Still install step motor 8 on base 2, step motor 8 passes through fixing bolt 3 to be fixed to the base on, step motor 8's output is used for being connected with slider 12 transmission, through step motor 8's drive, thereby make slider 12 can realize reciprocating motion along slide rail 7, and for the further slip range of restriction slider, consequently still be provided with preceding spacing arch and back spacing arch on the base, with preceding spacing arch 6, back spacing arch 13 direct mount on slide rail 7, wherein connect coil control joint 4 with the coil, sensor test seat 9 and step motor 8 are connected to the test interface of IC tester on, just so the installation has been accomplished.
Further, in order to improve the accuracy and efficiency of detection, the test socket mounting plate 10 is slidably connected to the bracket 11, so that the height of the test socket mounting plate 10 can be adjusted, thereby adjusting the position of the product to be detected at the helmholtz coil, and in order to ensure that the product can be detected at the center of the helmholtz coil at each time, the test socket mounting plate 10 is set to be triangular, which is shown to be strip-shaped in the figure, when the product to be detected on the test socket mounting plate 10 enters the helmholtz coil, one side of the triangular test socket mounting plate 10 gradually touches the coil, and as the stepping motor 8 is driven to be close to the helmholtz coil, the test socket mounting plate 10 is gradually stressed, thereby realizing the passive adjustment of the height, so that when the stepping motor 8 just sends the product to be detected to the middle position of the helmholtz coil, the height of the device can be just positioned at the central position, so that the automatic height adjustment is realized, and the accuracy of detection is ensured.
A Hall sensor testing method for carrying an IC tester adopts a Hall sensor testing device for carrying an IC tester to carry out operation, and the operation method comprises the following steps:
1. Calibrating the relationship between the magnetic field intensity H of the sensor test seat 9 at the fixed position in the Helmholtz coil and the input current I of the coil by using a calibrated magnetic field intensity tester;
2. Inputting the calibrated array into an IC tester;
3. The step motor 8 is controlled by the IC tester, the step motor 8 controls the slide block 12 to leave the initial position and slide forwards, and therefore the sensor test seat 9 is controlled to enter the fixed position in the Helmholtz coil;
4. After the sensor test seat 9 enters a fixed position in the helmholtz coil, the IC tester starts to apply a current I to the helmholtz coil, thereby controlling the magnetic field strength H;
5. The IC tester controls the magnetic field intensity H and simultaneously tests the device arranged on the sensor test seat 9 through the connecting wire joint 5;
6. After the test is finished, the stepping motor 8 is controlled by the IC tester, the stepping motor 8 controls the sliding block 12 to slide backwards, and therefore the sensor test seat 9 is controlled to leave a fixed position in the Helmholtz coil and return to an initial position.
Just can accomplish a test above, need detect more products then repeat such process can, set up the IC tester that can cooperate the different grade type like this to simple structure, convenient operation, detection efficiency is high.
The above description is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may occur to those skilled in the art without departing from the principle of the invention, and are considered to be within the scope of the invention.
Claims (10)
1. A Hall sensor testing method for carrying an IC tester is characterized in that: the Hall sensor testing device for carrying the IC tester is adopted for operation, the Hall sensor testing device for carrying the IC tester comprises a base (2), a magnetic field mechanism (1) for generating a fixed magnetic field is mounted on the base (2), a sensor detection mechanism for placing a product to be tested is further arranged on the base (2), the sensor detection mechanism is connected with a driving device for driving the product to be tested to enter and exit the magnetic field mechanism (1), and the magnetic field mechanism (1), the sensor detection mechanism and the driving device are all provided with coil joints for being connected to the IC tester;
The specific test method is as follows:
1. Calibrating the relationship between the magnetic field intensity H of the sensor test seat at the fixed position in the Helmholtz coil and the input current I of the coil by using a calibrated magnetic field intensity tester;
2. Inputting the calibrated array into an IC tester;
3. Controlling a stepping motor by using an IC tester, controlling the sliding block to slide forwards after leaving an initial position by using the stepping motor, and controlling a sensor test seat to enter a fixed position in a Helmholtz coil;
4. After the sensor test seat enters a fixed position in the Helmholtz coil, the IC tester starts to apply current I to the Helmholtz coil so as to control the magnetic field intensity H;
5. The IC tester controls the magnetic field intensity H and simultaneously tests the device arranged on the sensor test seat through the connecting wire joint;
6. After the test is finished, the IC tester is used for controlling the stepping motor, and the stepping motor controls the sliding block to slide backwards, so that the sensor test seat is controlled to leave a fixed position in the Helmholtz coil and return to an initial position.
2. The hall sensor test method for an IC tester according to claim 1, characterized in that: the magnetic field mechanism (1) is arranged as a Helmholtz coil.
3. The hall sensor test method for an IC tester according to claim 1, characterized in that: the base (2) is provided with a sliding rail (7), and the sensor detection mechanism is installed on the sliding rail (7).
4. The hall sensor test method for an IC tester according to claim 3, characterized in that: and the sliding rail (7) is provided with a limiting mechanism for limiting the stroke of the sensor detection mechanism.
5. The hall sensor test method for IC tester-equipped hall sensor according to claim 3 or 4, characterized in that: the driving device comprises a stepping motor (8), and the stepping motor (8) is used for driving the sensor detection mechanism to move back and forth along the sliding rail (7).
6. The hall sensor test method for IC tester-equipped hall sensor according to claim 1 or 3, characterized in that: sensor detection mechanism includes slider (12), slider (12) slide and connect in slide rail (7), be fixed with test seat mounting panel (10) on slider (12), the one end of test seat mounting panel (10) is provided with sensor test seat (9) and is used for installing the product that awaits measuring, test seat mounting panel (10) are used for sliding along slide rail (7) and make sensor test seat (9) business turn over magnetic field mechanism (1).
7. The hall sensor test method for the IC tester according to claim 6, wherein: the test seat mounting plate (10) and the sensor test seat (9) are made of resin materials.
8. The hall sensor test method for an IC tester according to claim 4, characterized in that: the limiting device comprises a front limiting bulge (6) and a rear limiting bulge (13) which are arranged on the sliding rail (7), and the sensor detection mechanism is positioned between the front limiting bulge (6) and the rear limiting bulge (13).
9. The hall sensor test method for the IC tester according to claim 6, wherein: fixed mounting has support (11) on slider (12), but test seat mounting panel (10) sliding connection is on support (11).
10. The hall sensor test method for an IC tester according to claim 9, wherein: the test seat mounting plate (10) is arranged in a triangular shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010359794.6A CN111487523B (en) | 2020-04-29 | 2020-04-29 | Hall sensor testing method for carrying IC tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010359794.6A CN111487523B (en) | 2020-04-29 | 2020-04-29 | Hall sensor testing method for carrying IC tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111487523A true CN111487523A (en) | 2020-08-04 |
| CN111487523B CN111487523B (en) | 2021-04-06 |
Family
ID=71813218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010359794.6A Active CN111487523B (en) | 2020-04-29 | 2020-04-29 | Hall sensor testing method for carrying IC tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111487523B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112229433A (en) * | 2020-10-14 | 2021-01-15 | 江苏海洋大学 | Engine sensor testing tool, testing monitoring system and testing monitoring method |
| CN112268568A (en) * | 2020-10-14 | 2021-01-26 | 江苏海洋大学 | Engine sensor testing tool, testing system and testing method |
| CN112268567A (en) * | 2020-10-14 | 2021-01-26 | 江苏海洋大学 | Engine sensor detection tool, detection system and detection method |
| CN113030828A (en) * | 2021-03-25 | 2021-06-25 | 河南省计量科学研究院 | Alternating magnetometer verification system and method |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR950000744B1 (en) * | 1991-09-18 | 1995-01-28 | 이용호 | Apparatus for measuring magnetization |
| CN201017506Y (en) * | 2007-02-09 | 2008-02-06 | 杭州大华仪器制造有限公司 | Three-dimensional helmholtz coil magnetic field experiment instrument |
| CN201387681Y (en) * | 2008-12-11 | 2010-01-20 | 浙江天煌科技实业有限公司 | Helmholtz coil magnetic field measuring experimental apparatus |
| CN105182267A (en) * | 2015-10-13 | 2015-12-23 | 三峡大学 | System for controlling calibration of magnetic sensor based on Labview |
| CN208044049U (en) * | 2018-05-05 | 2018-11-02 | 淮阴师范学院 | A kind of Hai Muhuoci coil magnetic fields experimental provision |
| CN208060688U (en) * | 2018-04-16 | 2018-11-06 | 徐靖宇 | It is a kind of can pin-point reading Helmholtz coil magnetic field measuring device |
| CN109342985A (en) * | 2018-11-16 | 2019-02-15 | 南方电网科学研究院有限责任公司 | A kind of magnetoresistive chip calibration correction system and method |
| CN109596863A (en) * | 2018-12-03 | 2019-04-09 | 清华大学 | A kind of Helmholtz coil test measured piece stationary fixture |
| CN110082668A (en) * | 2019-05-23 | 2019-08-02 | 南京师范大学泰州学院 | A kind of component-fixing device for Helmholtz coil measurement of magnetic field |
-
2020
- 2020-04-29 CN CN202010359794.6A patent/CN111487523B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR950000744B1 (en) * | 1991-09-18 | 1995-01-28 | 이용호 | Apparatus for measuring magnetization |
| CN201017506Y (en) * | 2007-02-09 | 2008-02-06 | 杭州大华仪器制造有限公司 | Three-dimensional helmholtz coil magnetic field experiment instrument |
| CN201387681Y (en) * | 2008-12-11 | 2010-01-20 | 浙江天煌科技实业有限公司 | Helmholtz coil magnetic field measuring experimental apparatus |
| CN105182267A (en) * | 2015-10-13 | 2015-12-23 | 三峡大学 | System for controlling calibration of magnetic sensor based on Labview |
| CN208060688U (en) * | 2018-04-16 | 2018-11-06 | 徐靖宇 | It is a kind of can pin-point reading Helmholtz coil magnetic field measuring device |
| CN208044049U (en) * | 2018-05-05 | 2018-11-02 | 淮阴师范学院 | A kind of Hai Muhuoci coil magnetic fields experimental provision |
| CN109342985A (en) * | 2018-11-16 | 2019-02-15 | 南方电网科学研究院有限责任公司 | A kind of magnetoresistive chip calibration correction system and method |
| CN109596863A (en) * | 2018-12-03 | 2019-04-09 | 清华大学 | A kind of Helmholtz coil test measured piece stationary fixture |
| CN110082668A (en) * | 2019-05-23 | 2019-08-02 | 南京师范大学泰州学院 | A kind of component-fixing device for Helmholtz coil measurement of magnetic field |
Non-Patent Citations (2)
| Title |
|---|
| 吕红英等: "基于LabVIEW的亥姆霍兹线圈磁场自动测量系统", 《物理实验》 * |
| 王青狮等: "亥姆霍兹线圈轴线磁场计算机测量实验研究", 《大学物理实验》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112229433A (en) * | 2020-10-14 | 2021-01-15 | 江苏海洋大学 | Engine sensor testing tool, testing monitoring system and testing monitoring method |
| CN112268568A (en) * | 2020-10-14 | 2021-01-26 | 江苏海洋大学 | Engine sensor testing tool, testing system and testing method |
| CN112268567A (en) * | 2020-10-14 | 2021-01-26 | 江苏海洋大学 | Engine sensor detection tool, detection system and detection method |
| CN113030828A (en) * | 2021-03-25 | 2021-06-25 | 河南省计量科学研究院 | Alternating magnetometer verification system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111487523B (en) | 2021-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111487523B (en) | Hall sensor testing method for carrying IC tester | |
| CN103033738A (en) | Automatic test system for circuit board | |
| CN1816751A (en) | Apparatus and method for electromechanical testing and validation of probe cards | |
| CN105513990A (en) | Probe station image positioning device and vision alignment method | |
| CN111487522B (en) | Hall sensor testing device for carrying IC tester | |
| CN2872379Y (en) | Device for testing multiple chips simultaneouslly and single chip tester | |
| CN207798993U (en) | USB plugs measurement jig | |
| CN203178431U (en) | Full-automatic testing system for circuit boards | |
| CN104655168A (en) | Sensor calibration verifying device | |
| CN201514460U (en) | Test device for voice type integrated circuit | |
| CN214097026U (en) | Calibrating device based on absolute method weight deflectometer that falls | |
| CN106526327A (en) | DCR micro resistor automatic measuring machine | |
| CN206618399U (en) | It is automatic to survey workpiece height instrument | |
| CN203929054U (en) | Automobile radiators pick-up unit | |
| CN216144938U (en) | Card holds in palm socket detection mechanism | |
| CN208606701U (en) | A kind of hot press heating plate testing flatness device | |
| CN208224470U (en) | A kind of rotating electromagnet torsion-testing tooling | |
| CN208156123U (en) | A kind of antenna Board Test System | |
| CN112747776A (en) | Standard gap simulation test method and circuit for gap sensor | |
| CN218675203U (en) | Special application PCBA electrical performance test system | |
| CN218240146U (en) | Multi-module electrical measuring device for MiniLED product | |
| CN220872623U (en) | Closed-loop motor test fixture | |
| CN2453454Y (en) | Printed circuit plate programmed control prob positioning device | |
| CN215866998U (en) | Reset chip performance verification device | |
| CN205787063U (en) | A kind of magnetic flux precision measurement mechanism |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |