CN111427732A - Aging test method, aging test device, terminal and computer-readable storage medium - Google Patents
Aging test method, aging test device, terminal and computer-readable storage medium Download PDFInfo
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- CN111427732A CN111427732A CN202010170901.0A CN202010170901A CN111427732A CN 111427732 A CN111427732 A CN 111427732A CN 202010170901 A CN202010170901 A CN 202010170901A CN 111427732 A CN111427732 A CN 111427732A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3024—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a central processing unit [CPU]
Abstract
The application is applicable to the technical field of testing, and provides an aging testing method and an identifying system, wherein the aging testing method comprises the following steps: detecting whether the terminal meets an aging test mode entering condition or not; if the terminal meets the aging test mode entering condition, entering a terminal system in an aging test mode; and monitoring whether the terminal runs abnormally under a full-load running state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when an aging test mode exit condition is met, so that the problem that the running state of the terminal under an extreme condition cannot be monitored by a traditional aging test method is solved, and the terminal equipment running abnormally under the extreme condition is prevented from flowing into the market.
Description
Technical Field
The present application belongs to the field of testing technologies, and in particular, to an aging testing method, an aging testing device, a terminal, and a computer-readable storage medium.
Background
Burn-in testing of terminals is an effective way to diagnose whether a terminal has a system or hardware problem. In the traditional terminal aging test, when the terminal is detected to enter a terminal system in an aging test mode, all external instructions except an instruction for exiting the aging test mode are shielded, the aging test is carried out in a conventional user state, and if the terminal does not run abnormally within a specified time, the aging test is finished.
However, the conventional burn-in test method cannot monitor the operation state of the terminal under the extreme conditions, so that some terminal devices which are abnormally operated under the extreme conditions are introduced into the market.
Disclosure of Invention
The embodiment of the application provides an aging test method, an aging test device, a terminal and a computer readable storage medium, which can monitor the running state of the terminal under extreme conditions and prevent terminal equipment which runs abnormally under the extreme conditions from flowing into the market.
A first aspect of an embodiment of the present application provides an aging test method, including:
detecting whether the terminal meets an aging test mode entering condition or not;
if the terminal meets the aging test mode entering condition, entering a terminal system in an aging test mode;
and monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the terminal meets an aging test mode exit condition.
A second aspect of the embodiments of the present application provides an aging test apparatus, including:
the terminal comprises a detection unit, a judging unit and a control unit, wherein the detection unit is used for detecting whether the terminal meets an aging test mode entering condition or not;
an entering unit, configured to enter a terminal system in an aging test mode if the terminal meets the aging test mode entering condition;
and the aging test unit is used for monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the terminal meets an aging test mode exit condition.
A third aspect of the embodiments of the present application provides a terminal, including a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the method when executing the computer program.
A fourth aspect of the embodiments of the present application provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program implements the steps of the above method.
In a fifth aspect, embodiments of the present application provide a computer program product, which when run on a terminal device, causes the terminal device to perform the steps of the method.
In the embodiment of the application, when the terminal meets the entering condition of the aging test mode, the terminal system is entered into the aging test mode, and the terminal is monitored to determine whether the terminal runs abnormally under the full-load running state, so that the obtained aging test result of the terminal comprises the result of whether the terminal runs abnormally under the full-load running state, and then when the exiting condition of the aging test mode is met, the aging test of the terminal is finished, therefore, a worker can recycle the terminal equipment which runs abnormally under the full-load running state in the aging test result, the problem that the traditional aging test method cannot monitor the running state of the terminal under the extreme condition is solved, and the terminal equipment which runs abnormally under the extreme condition is prevented from flowing into the market.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is a schematic flowchart of a first implementation of a burn-in test method according to an embodiment of the present application;
fig. 2 is a schematic diagram illustrating that an upper computer sends an aging test instruction to a terminal according to an embodiment of the present application;
fig. 3 is a schematic diagram illustrating operation state information of a display terminal in a full-load operation state according to an embodiment of the present application;
FIG. 4 is a schematic structural diagram of a burn-in test apparatus according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a terminal according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
Burn-in testing of terminals is an effective way to diagnose whether a terminal has a system or hardware problem. In the traditional terminal aging test, when the terminal is detected to enter a terminal system in an aging test mode, all external instructions except an instruction for exiting the aging test mode are shielded, the aging test is carried out in a conventional user state, and if the terminal does not run abnormally within a specified time, the aging test is finished.
However, the conventional burn-in test method cannot monitor the operation state of the terminal under the extreme conditions, so that some terminal devices which are abnormally operated under the extreme conditions are introduced into the market.
Based on this, the embodiment of the application provides an aging test method, an aging test device, a terminal and a computer-readable storage medium, which can monitor the operation state of the terminal under the extreme condition and prevent the terminal equipment with abnormal operation from flowing into the market under the extreme condition.
In order to explain the technical means of the present application, the following description will be given by way of specific examples.
Fig. 1 shows a schematic implementation flow diagram of a burn-in test method provided by an embodiment of the present application, where the method may be applied to a terminal, may be executed by a burn-in test apparatus configured on the terminal, and is suitable for a situation where an operation state of the terminal under an extreme condition needs to be monitored. The terminal can be an intelligent terminal such as a smart phone, a computer and a smart television. The burn-in test method may include steps 101 to 103.
In the embodiment of the application, when the terminal needs to be subjected to the aging test, the terminal system often needs to enter the aging test mode, and the terminal system performs the aging test of the terminal in the aging test mode, so that before the aging test of the terminal is performed, whether the terminal meets the aging test mode entering condition needs to be detected, and whether the terminal needs to be subjected to the aging test needs to be judged.
Specifically, in some embodiments of the present application, the detecting whether the terminal satisfies the entry condition of the burn-in test mode may include: whether the terminal receives the aging test mode entry file or not is scanned, and if the terminal receives the aging test mode entry file, it is determined that the terminal meets the aging test mode entry condition.
The aging test mode entering file is a file for guiding the terminal to enter the aging test mode.
In some embodiments of the application, whether the terminal receives the aging test mode entry file is scanned, and if the terminal receives the aging test mode entry file, it is indicated that the terminal needs to enter the terminal system in the aging test mode for performing an aging test.
For example, a worker or a user may insert a usb disk carrying an aging test mode entry file into the smart television, and when the smart television scans the aging test mode entry file carried in the usb disk, it is indicated that the smart television needs to enter the smart television system in the aging test mode for performing an aging test, so that it can be determined that the smart television meets the aging test mode entry condition.
In other embodiments of the present application, the detecting whether the terminal satisfies the burn-in test mode entry condition may include: detecting whether the terminal receives an aging test instruction sent by an upper computer; and if the terminal is detected to receive the aging test instruction sent by the upper computer, determining that the terminal meets the aging test mode entering condition.
The upper computer is a terminal capable of sending instructions to the terminal.
As shown in fig. 2, in some embodiments of the present application, the upper computer 21 may send an aging test instruction to the terminal 22, and when the terminal 22 receives the aging test instruction sent by the upper computer 21, it indicates that the terminal 22 needs to enter the terminal 22 system in an aging test mode for performing an aging test, so that it may be determined that the terminal 22 meets an aging test mode entry condition.
It should be noted that the aging test mode entry condition for other trigger terminals to enter the terminal system in the aging test mode is also applicable to the present application, and the present application is not limited thereto.
And 102, if the terminal meets the aging test mode entering condition, entering a terminal system in an aging test mode.
In the embodiment of the application, if the terminal meets the condition of entering the aging test mode, the terminal system enters the aging test mode, so that the terminal system entering the aging test mode performs the aging test on the terminal.
In some embodiments of the application, a terminal can enter a bootstrap program after being started, at this time, the terminal can perform the operation of detecting whether the terminal meets an aging test mode entering condition or not, and can modify an environment variable when the terminal is determined to meet the aging test mode entering condition, then the terminal enters a kernel program and then enters an L inux operating system, then the terminal can detect whether the environment variable is modified or not when the terminal enters an android operating system, and if the environment variable is modified, the terminal needs to enter the terminal system in an aging test mode for performing an aging test, so that the terminal can enter the terminal system in the aging test mode and perform the aging test on the terminal.
When the aging test is carried out, other instructions except the instruction for exiting the aging test mode can influence the aging test result; for example, after detecting that the terminal receives another instruction sent by the upper computer, the terminal ends the aging test incorrectly when the aging test on the terminal is not completed, so that the aging test result is lost or incomplete. In order to avoid the influence of other instructions except the instruction for exiting the burn-in test mode on the burn-in test, in some embodiments of the present application, after the terminal enters the terminal system in the burn-in test mode, the terminal may shield the other instructions except the instruction for exiting the burn-in test mode, so as to avoid the influence of the other instructions except the instruction for exiting the burn-in test mode on the burn-in test result.
It should be noted that, in some embodiments of the present application, if the terminal does not satisfy the burn-in test mode entry condition, the terminal may enter the terminal system in a user mode, so that the user may use the terminal normally.
And 103, monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the aging test mode exit condition is met.
In some embodiments of the present application, whether the operation abnormality exists in the monitoring terminal in the full-load operation state may include: and monitoring whether the terminal has abnormal operation in the operating state of the CPU and/or the GPU in full load.
Specifically, after the terminal enters the terminal system in the aging test mode, the terminal can play the ultra-high-definition video by creating a plurality of threads and utilizing the plurality of threads respectively, so that the CPU and/or the GPU are in a full-load running state when the terminal performs the aging test.
It should be noted that, because the full-load operating states corresponding to different terminals are different, for example, the CPU full-load states of different terminals are different, and the GPU full-load states of different terminals are different, before the ultra high definition videos are played by using multiple threads, the aging test schemes corresponding to different terminals may be obtained through the interface, and then multiple threads are created according to different test schemes, and the threads are used to play the ultra high definition videos, so that different terminals can be in the full-load operating states during the aging test.
In some embodiments of the present application, after entering the terminal system in the aging test mode and monitoring whether the terminal has an abnormal operation in a full-load operation state, the terminal may end the aging test of the terminal when the aging test mode exit condition is satisfied.
It should be noted that, when the terminal satisfies the condition for exiting the burn-in test mode, the ending the burn-in test of the terminal may include: the aging test of the terminal is finished by detecting whether the terminal receives an aging test mode exit instruction sent by the upper computer or not and detecting that the terminal receives the aging test mode exit instruction sent by the upper computer.
For convenience of production and use, the terminating the burn-in test of the terminal when the terminal satisfies the burn-in test mode exit condition may further include: monitoring whether the accumulated time length of the monitoring terminal with abnormal operation is greater than the preset time length or not in the full-load operation state, and finishing the aging test of the terminal when the accumulated time length is greater than the preset time length.
The preset time length may be a time length set by a user or a worker as required, or a time length obtained in advance according to practical experience and capable of effectively detecting all possible abnormal operations in the aging test, which is not limited in the present application.
In the embodiment of the application, whether the accumulated time of the abnormal operation of the monitoring terminal in the full-load operation state is longer than the preset time or not is monitored, so that the automation of the aging test can be realized, namely, the aging test of the terminal is automatically finished when the accumulated time is longer than the preset time, and the terminal is convenient to produce and use.
Generally, in a conventional terminal aging test, after entering a terminal system in an aging test mode, whether a terminal is in an abnormal operation state under a normal user state is monitored to obtain an aging test result of the terminal, and the conventional aging test method cannot monitor the operation state of the terminal under an extreme condition; for example, it is impossible to monitor whether or not there is an operational abnormality in an operating state in which the CPU and/or the GPU is fully loaded, resulting in a situation where a part of the terminal devices having an operational abnormality in an operating state in which the CPU and/or the GPU is fully loaded is brought into the market.
In the embodiment of the application, when the terminal meets the entering condition of the aging test mode, the terminal system is entered into the aging test mode, and the terminal is monitored to determine whether the terminal runs abnormally under the full-load running state, so that the obtained aging test result of the terminal comprises the result of whether the terminal runs abnormally under the full-load running state, and then when the exiting condition of the aging test mode is met, the aging test of the terminal is finished, therefore, a worker can recycle the terminal equipment which runs abnormally under the full-load running state in the aging test result, the problem that the traditional aging test method cannot monitor the running state of the terminal under the extreme condition is solved, and the terminal equipment which runs abnormally under the extreme condition is prevented from flowing into the market.
In order to facilitate real-time monitoring of the operation state of the terminal, in some embodiments of the present application, whether the operation of the monitoring terminal is abnormal in a full-load operation state may include: and displaying the running state information of the terminal in the full-load running state.
The running state information may include one or more of terminal CPU running state information, terminal GPU running state information, and software running state information.
Specifically, the terminal can realize real-time monitoring of the operation state of the terminal by loading the UI interface and displaying the operation state information of the terminal in the UI interface under the full-load operation state.
For example, as shown in fig. 3, the smart tv 31 may load a movable UI control 301, and display terminal CPU running state information, terminal GPU running state information, and aging test duration in the UI control 301.
It should be noted that other methods for displaying the operation state information of the terminal in the full load operation state are also applicable to the present application, and the present application does not limit this.
Generally, when a conventional burn-in test method is used for burn-in test, if a terminal runs abnormally, the terminal may burn out hardware, and there is also a possibility that an interface is not displayed or powered off, so that the terminal cannot record related information of the running abnormality, which causes difficulty for a developer or a user to reproduce the running abnormality or search a reason for the running abnormality.
To further facilitate production and use, in some embodiments of the present application, after obtaining the aging test result of the terminal, the method may include: and sending the aging test result to an upper computer.
In other embodiments of the present application, after the aging test result of the terminal is obtained, the aging test result may be uploaded to a cloud server, or other terminals that enable a developer to check the aging test result, which is not limited in this application.
According to the method and the device, the running state information of the terminal in the full-load running state is displayed, the aging test result is reported in real time, the relevant information of running abnormity is recorded in real time, and therefore the device is convenient for developers to quickly position, analyze and solve problems.
It should be noted that, for simplicity of description, the foregoing method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present application is not limited by the order of acts, as some steps may, in accordance with the present application, occur in other orders.
Fig. 4 is a schematic structural diagram of a burn-in test apparatus 400 according to an embodiment of the present disclosure, where the burn-in test apparatus 400 may include: a detection unit 401, an entry unit 402 and a burn-in test unit 403.
A detecting unit 401, configured to detect whether the terminal meets an aging test mode entry condition;
an entering unit 402, configured to enter a terminal system in an aging test mode if the terminal meets the aging test mode entering condition;
the aging test unit 403 is configured to monitor whether the terminal runs abnormally in a full-load running state, obtain an aging test result of the terminal, and end the aging test of the terminal when the terminal meets an aging test mode exit condition.
In some embodiments of the present application, the detecting unit 401 is further specifically configured to: detecting whether the terminal receives an aging test instruction sent by an upper computer; if the terminal is detected to receive an aging test instruction sent by the upper computer, determining that the terminal meets the aging test mode entering condition; or, whether the terminal receives an aging test mode entry file is scanned, and if the terminal receives the aging test mode entry file, it is determined that the terminal satisfies the aging test mode entry condition.
In some embodiments of the present application, the entering unit 402 is further specifically configured to: modifying the environment variable; detecting whether the environment variable is modified; and if the environment variable is modified, entering the terminal system in an aging test mode.
In some embodiments of the present application, the burn-in test apparatus further includes a sending unit, configured to send the burn-in test result to an upper computer.
In some embodiments of the present application, the entering unit 402 is further specifically configured to: and if the terminal does not meet the aging test mode entering condition, entering the terminal system in a user mode.
In some embodiments of the present application, the aging test apparatus further includes a display unit, configured to display operating state information of the terminal in a full-load operating state; the running state information comprises one or more of terminal CPU running state information, terminal GPU running state information and software running state information.
In some embodiments of the present application, the aging test unit 403 is further specifically configured to: monitoring whether the accumulated time for monitoring whether the terminal has abnormal operation in a full-load operation state is longer than the preset time, and finishing the aging test of the terminal when the accumulated time is longer than the preset time.
It should be noted that, for convenience and simplicity of description, the specific working process of the aging test apparatus 400 described above may refer to the corresponding process of the method described in fig. 1 to fig. 3, and is not described herein again.
Fig. 5 is a schematic diagram of a terminal according to an embodiment of the present application. The terminal 5 may include: a processor 50, a memory 51 and a computer program 52, such as a burn-in test program, stored in said memory 51 and executable on said processor 50. The processor 50, when executing the computer program 52, implements the steps in the various burn-in test method embodiments described above, such as the steps 101 through 103 shown in fig. 1. Alternatively, the processor 50, when executing the computer program 52, implements the functions of each module/unit in each device embodiment described above, for example, the functions of the units 401 to 403 shown in fig. 4.
The computer program may be divided into one or more modules/units, which are stored in the memory 51 and executed by the processor 50 to accomplish the present application. The one or more modules/units may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution of the computer program in the terminal. For example, the computer program may be divided into a detection unit, an entry unit, and a burn-in test unit, each unit having the following specific functions: the terminal comprises a detection unit, a judging unit and a control unit, wherein the detection unit is used for detecting whether the terminal meets an aging test mode entering condition or not; an entering unit, configured to enter a terminal system in an aging test mode if the terminal meets the aging test mode entering condition; and the aging test unit is used for monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the terminal meets an aging test mode exit condition.
The terminal can be a mobile terminal such as a smart television, or a computing device such as a smart phone, a desktop computer, a notebook, a palm computer and a cloud server. The terminal may include, but is not limited to, a processor 50, a memory 51. Those skilled in the art will appreciate that fig. 5 is only an example of a terminal and is not intended to be limiting and may include more or fewer components than those shown, or some components may be combined, or different components, e.g., the terminal may also include input-output devices, network access devices, buses, etc.
The Processor 50 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 51 may be an internal storage unit of the terminal, such as a hard disk or a memory of the terminal. The memory 51 may also be an external storage device of the terminal, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like provided on the terminal. Further, the memory 51 may also include both an internal storage unit and an external storage device of the terminal. The memory 51 is used for storing the computer program and other programs and data required by the terminal. The memory 51 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal and method may be implemented in other ways. For example, the above-described apparatus/terminal embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated modules/units, if implemented in the form of software functional units and sold or used as separate products, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow in the method of the embodiments described above can be realized by a computer program, which can be stored in a computer-readable storage medium and can realize the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A method for burn-in testing of a terminal, comprising:
detecting whether the terminal meets an aging test mode entering condition or not;
if the terminal meets the aging test mode entering condition, entering a terminal system in an aging test mode;
and monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the terminal meets an aging test mode exit condition.
2. The burn-in test method of claim 1, wherein said detecting whether the terminal satisfies a burn-in test mode entry condition comprises:
detecting whether the terminal receives an aging test instruction sent by an upper computer; if the terminal is detected to receive an aging test instruction sent by the upper computer, determining that the terminal meets the aging test mode entering condition;
alternatively, the first and second electrodes may be,
whether the terminal receives an aging test mode entering file or not is scanned, and if the terminal receives the aging test mode entering file, the terminal is determined to meet the aging test mode entering condition.
3. The burn-in test method of claim 2, after said determining that said terminal satisfies said burn-in test mode entry condition, comprising: modifying the environment variable;
the entering terminal system in the aging test mode comprises the following steps:
detecting whether the environment variable is modified;
and if the environment variable is modified, entering the terminal system in an aging test mode.
4. The burn-in test method of claim 2, after obtaining the results of the burn-in test of the terminal, further comprising:
and sending the aging test result to an upper computer.
5. The burn-in test method of claim 1, wherein after detecting whether the terminal satisfies the burn-in test mode entry condition, the method comprises:
and if the terminal does not meet the aging test mode entering condition, entering the terminal system in a user mode.
6. The aging test method according to any one of claims 1 to 5, wherein the monitoring whether the terminal has an abnormal operation in a full-load operation state includes:
displaying the running state information of the terminal in a full-load running state; the running state information comprises one or more of terminal CPU running state information, terminal GPU running state information and software running state information.
7. The burn-in test method of claim 1, wherein said terminating the burn-in test of the terminal when the terminal satisfies a burn-in test mode exit condition comprises:
monitoring whether the accumulated time for monitoring whether the terminal has abnormal operation in a full-load operation state is longer than the preset time, and finishing the aging test of the terminal when the accumulated time is longer than the preset time.
8. A burn-in apparatus, comprising:
the terminal comprises a detection unit, a judging unit and a control unit, wherein the detection unit is used for detecting whether the terminal meets an aging test mode entering condition or not;
an entering unit, configured to enter a terminal system in an aging test mode if the terminal meets the aging test mode entering condition;
and the aging test unit is used for monitoring whether the terminal has abnormal operation in a full-load operation state to obtain an aging test result of the terminal, and finishing the aging test of the terminal when the terminal meets an aging test mode exit condition.
9. A terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any of claims 1-7 when executing the computer program.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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| CN113125938A (en) * | 2021-03-17 | 2021-07-16 | 东莞市金锐显数码科技有限公司 | Aging test monitoring method and system |
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| CN117110763A (en) * | 2023-10-12 | 2023-11-24 | 广州伊索自动化科技有限公司 | Aging detection system and method for automobile electronic product and storage medium |
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