CN111413613A - Multi-channel key open-circuit short-circuit test system and method - Google Patents
Multi-channel key open-circuit short-circuit test system and method Download PDFInfo
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- CN111413613A CN111413613A CN202010324052.XA CN202010324052A CN111413613A CN 111413613 A CN111413613 A CN 111413613A CN 202010324052 A CN202010324052 A CN 202010324052A CN 111413613 A CN111413613 A CN 111413613A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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Abstract
The invention discloses a multichannel key open-circuit short-circuit testing system which comprises a power supply module for supplying power to the whole system, a sampling module responsible for detecting the state of a circuit to be tested, an MCU module for communication and signal processing, a communication module, a cylinder driving module for driving key pressing and a plurality of action execution cylinders, wherein the power supply module is electrically connected with the MCU module, the communication module and the cylinder driving module respectively, the MCU module is interacted with the sampling module, the communication module and the cylinder driving module respectively, the cylinder driving module drives the action execution cylinders to press keys, the sampling module collects the key states of the circuit to be tested before and after the keys are pressed, and the sampling module sends the key states to the MCU module for open-circuit analysis. The sampling module satisfies a plurality of test channels simultaneously, and efficiency of software testing is high, and degree of automation is high, and full-automatic communication mode makes the test more stable, rapid. The invention also discloses a multi-channel key open-circuit short-circuit test method.
Description
Technical Field
The invention relates to the field of electronics, in particular to a multi-channel key open-circuit short-circuit testing system and method.
Background
At present, most of tests of keys by an intelligent test terminal are manually measured by using instrument equipment, and the intelligent test terminal is not intelligent, large in size, high in cost and few in channel number; the testing equipment is not intelligent enough, the volume of the testing equipment can not be reduced, the production cost of the testing equipment can not be reduced, and the measuring requirements of customers on automation, low cost, small volume and multiple channels can not be met. In the semi-automatic or automatic testing industry of electronic consumer intelligent products, some automatic testing equipment needs to perform open-circuit short-circuit testing on the keys so as to judge whether the keys to be tested are normal or not.
However, the existing key open-circuit short-circuit test process has the following defects:
1. the current market tests are complete equipment instruments, the test process is complex, the instruments are expensive, the current situation that people are not easy to approach to daily life is caused, and the test efficiency and the automation degree are low.
2. It is not intelligent, need the manual press button.
3. High cost and large volume.
Disclosure of Invention
In order to overcome the defects of the prior art, an object of the present invention is to provide a multi-channel open-short testing system and method, which can solve the problems of low testing efficiency and low automation degree.
One of the purposes of the invention is realized by adopting the following technical scheme:
a multichannel button short circuit test system that opens a way which characterized in that: including the power module who is the entire system power supply, be responsible for the sampling module that circuit state detected that awaits measuring, be used for communication and signal processing's MCU module, communication module, be used for driving cylinder drive module and a plurality of action execution cylinder that the button was pressed, power module respectively with MCU module, communication module and cylinder drive module establish the electricity and connect, MCU module respectively with sampling module communication module reaches cylinder drive module is mutual, cylinder drive module drives a plurality of action execution cylinder presses the button, sampling module gathers the button state of the circuit that awaits measuring before pressing the button and after pressing the button, sampling module sends to the MCU module analysis of opening a way.
Further, the cylinder driving module includes a darlington transistor, and the darlington transistor is connected with the action execution cylinder.
Further, the action execution cylinder comprises a piston and a cylinder body, the piston is slidably mounted on the cylinder body, and the movement direction of the piston relative to the cylinder body is perpendicular to the keys.
Furthermore, the sampling module comprises a plurality of sampling ends, and the sampling ends are connected with a plurality of keys to be tested.
Further, the number of the sampling ends is 8-20.
Furthermore, the multichannel key open-circuit short-circuit test system further comprises a control end, and the control end and the MCU module are interacted through the communication module.
A multichannel key open circuit short circuit test method is applied to a multichannel key open circuit short circuit test system, the multichannel key open circuit short circuit test system comprises a power supply module, a sampling module, an MCU module, a communication module, a cylinder driving module and a plurality of action execution cylinders, and the multichannel key open circuit short circuit test method comprises the following steps:
an initial preparation step: the sampling module is connected with a line to be tested;
a primary collection step: the sampling module collects the state of a key in a line to be tested to form open-circuit test information;
an open circuit detection step: the MCU module reads the open circuit test information and sends the open circuit test information to the control end, the control end judges whether the key is in an open circuit state, if not, the test is stopped, and if yes, the next step is executed;
a pressing step: the cylinder driving module drives the action execution cylinder to execute a pressing command and press a key;
a secondary collection step: the sampling module collects the state of a key in a line to be tested to form short test information;
short circuit detection: the MCU module reads the short circuit test information and sends the short circuit test information to the control end, and the control end judges whether the key is in a short circuit state.
Further, in the step of collecting once, before the sampling module collects, the MCU module sends an instruction to the cylinder driving module, and the action execution cylinder releases the key.
Further, in the step of detecting the open circuit, if the key is in the open circuit state, the MCU module reads the open circuit test information and transmits the read open circuit test information to the control terminal.
Further, in the pressing step, after the action execution cylinder executes the pressing command, the secondary acquisition step is executed, and the MCU module reads the short circuit test information and transmits the short circuit test information to the control end.
Compared with the prior art, the invention has the beneficial effects that:
the power supply module is respectively and electrically connected with the MCU module, the communication module and the cylinder driving module, the MCU module is respectively and interactively connected with the sampling module, the communication module and the cylinder driving module, the cylinder driving module drives a plurality of the action execution cylinder presses a key, the sampling module collects the key state of a circuit to be tested before and after the key is pressed, and the sampling module sends the MCU module to perform open circuit analysis. The sampling module satisfies a plurality of test channels simultaneously, and efficiency of software testing is high, and degree of automation is high, and full-automatic communication mode makes the test more stable, rapid.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented in accordance with the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more clearly understood, the following preferred embodiments are described in detail with reference to the accompanying drawings.
Drawings
FIG. 1 is a block diagram of a multi-channel key open/short test system according to a preferred embodiment of the present invention;
FIG. 2 is another block diagram of the multi-channel key open/short test system shown in FIG. 1;
FIG. 3 is a flow chart of a multi-channel key open-short test method.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the detailed description, and it should be noted that any combination of the embodiments or technical features described below can be used to form a new embodiment without conflict.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1-2, a multi-channel key open/short circuit test system is characterized in that: including the power module who is the entire system power supply, be responsible for the sampling module that circuit state detected that awaits measuring, be used for communication and signal processing's MCU module, communication module, be used for driving cylinder drive module and a plurality of action execution cylinder that the button was pressed, power module respectively with MCU module, communication module and cylinder drive module establish the electricity and connect, MCU module respectively with sampling module communication module reaches cylinder drive module is mutual, cylinder drive module drives a plurality of action execution cylinder presses the button, sampling module gathers the button state of the circuit that awaits measuring before pressing the button and after pressing the button, sampling module sends to the MCU module analysis of opening a way. The sampling module satisfies a plurality of test channels simultaneously, and efficiency of software testing is high, and degree of automation is high, and full-automatic communication mode makes the test more stable, rapid.
Preferably, the cylinder driving module includes a darlington transistor, and the darlington transistor is connected to the action performing cylinder. The action execution cylinder comprises a piston and a cylinder body, the piston is slidably mounted on the cylinder body, and the motion direction of the piston relative to the cylinder body is perpendicular to the keys. Through the action of pressing of action actuating cylinder corresponding button has ensured degree of automation and efficiency on the one hand, and on the other hand has solved the high problem of artifical test error, has liberated the labour.
Preferably, the sampling module comprises a plurality of sampling ends, and the sampling ends are connected with a plurality of keys to be tested. The number of the sampling ends is 8-20. Specifically, in this embodiment, the number of sampling ends is 8, satisfies 8 passageways simultaneously, can the accurate state of measuring the open circuit short circuit of button, and the test value satisfies customer's test demand. The design of multichannel, miniature volume, the design of integrated circuit board level has greatly reduced automatic test equipment's volume and cost, more and more satisfies low-cost, miniaturized automatic test era trend.
Preferably, the multi-channel key open-circuit short-circuit test system further comprises a control end, and the control end and the MCU module are interacted through the communication module. The power supply module supplies power to the whole test system; the sampling module is responsible for the input detection of the open-circuit short-circuit state to be detected of the multi-channel keys to be detected; the MCU module is used as the core of the whole test system, is responsible for processing a sampling signal, is in communication with the IPC and is responsible for driving the key cylinder; the communication module is a bridge for communicating the test board card with a control terminal (IPC); the cylinder driving module is responsible for driving the key pressing.
Referring to fig. 3, a multi-channel open-key short circuit testing method is applied to a multi-channel open-key short circuit testing system, where the multi-channel open-key short circuit testing system includes a power supply module, a sampling module, an MCU module, a communication module, a cylinder driving module, and a plurality of motion execution cylinders, and includes the following steps:
an initial preparation step: the sampling module is connected with a line to be tested;
a primary collection step: the sampling module collects the state of a key in a line to be tested to form open-circuit test information; preferably, in the step of collecting once, before the sampling module collects, the MCU module sends an instruction to the cylinder driving module to actuate the actuating cylinder to release the button. The open circuit information is prevented from being collected in a pressing state, and interference is avoided for sampling.
An open circuit detection step: the MCU module reads the open circuit test information and sends the open circuit test information to the control end, the control end judges whether the key is in an open circuit state, if not, the test is stopped, and if yes, the next step is executed; preferably, in the step of detecting the open circuit, if the key is in the open circuit state, the MCU module reads the open circuit test information and sends the open circuit test information to the control terminal.
A pressing step: the cylinder driving module drives the action execution cylinder to execute a pressing command and press a key; preferably, in the pressing step, after the action execution cylinder executes the pressing command, the secondary acquisition step is executed, and the MCU module reads the short circuit test information and transmits the short circuit test information to the control terminal. The control end firstly detects whether the execution of the pressing action is successful, and then collects the pressing action, so that the problem of insufficient pressing is avoided, and the problem of misjudgment is solved.
A secondary collection step: the sampling module collects the state of a key in a line to be tested to form short test information;
short circuit detection: the MCU module reads the short circuit test information and sends the short circuit test information to the control end, and the control end judges whether the key is in a short circuit state. The test requirements of customers on special customization are well met, and the system caters to the development trend of electronic products in the world of gradual intellectualization and miniaturization.
The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention is not limited thereby, and any insubstantial changes and substitutions made by those skilled in the art based on the present invention are within the protection scope of the present invention.
Claims (10)
1. A multichannel button short circuit test system that opens a way which characterized in that: including the power module who is the entire system power supply, be responsible for the sampling module that circuit state detected that awaits measuring, be used for communication and signal processing's MCU module, communication module, be used for driving cylinder drive module and a plurality of action execution cylinder that the button was pressed, power module respectively with MCU module, communication module and cylinder drive module establish the electricity and connect, MCU module respectively with sampling module communication module reaches cylinder drive module is mutual, cylinder drive module drives a plurality of action execution cylinder presses the button, sampling module gathers the button state of the circuit that awaits measuring before pressing the button and after pressing the button, sampling module sends to the MCU module analysis of opening a way.
2. The multi-channel key open short test system of claim 1, wherein: the cylinder driving module comprises a Darlington transistor, and the Darlington transistor is connected with the action execution cylinder.
3. The multi-channel key open short test system of claim 2, wherein: the action execution cylinder comprises a piston and a cylinder body, the piston is slidably mounted on the cylinder body, and the motion direction of the piston relative to the cylinder body is perpendicular to the keys.
4. The multi-channel key open short test system of claim 1, wherein: the sampling module comprises a plurality of sampling ends, and the sampling ends are connected with a plurality of keys to be tested.
5. The multi-channel key open short test system of claim 4, wherein: the number of the sampling ends is 8-20.
6. The multi-channel key open short test system of claim 1, wherein: the multichannel key open-circuit short-circuit test system further comprises a control end, and the control end and the MCU module are interacted through the communication module.
7. A multi-channel open-key short circuit test method is applied to the multi-channel open-key short circuit test system of any one of claims 1 to 6, the multi-channel open-key short circuit test system comprises a power supply module, a sampling module, an MCU module, a communication module, a cylinder driving module and a plurality of action execution cylinders, and is characterized by comprising the following steps:
an initial preparation step: the sampling module is connected with a line to be tested;
a primary collection step: the sampling module collects the state of a key in a line to be tested to form open-circuit test information;
an open circuit detection step: the MCU module reads the open circuit test information and sends the open circuit test information to the control end, the control end judges whether the key is in an open circuit state, if not, the test is stopped, and if yes, the next step is executed;
a pressing step: the cylinder driving module drives the action execution cylinder to execute a pressing command and press a key;
a secondary collection step: the sampling module collects the state of a key in a line to be tested to form short test information;
short circuit detection: the MCU module reads the short circuit test information and sends the short circuit test information to the control end, and the control end judges whether the key is in a short circuit state.
8. The multi-channel key open-short test method of claim 7, wherein: in the primary collection step, before the collection of the sampling module, the MCU module sends an instruction to the cylinder driving module, and the action execution cylinder releases the key.
9. The multi-channel key open-short test method of claim 7, wherein: in the step of detecting the open circuit, if the key is in the open circuit state, the MCU module reads the open circuit test information and transmits the open circuit test information to the control end.
10. The multi-channel key open-short test method of claim 7, wherein: in the pressing step, after the action execution cylinder executes a pressing command, the secondary acquisition step is executed, and the MCU module reads the short circuit test information and transmits the short circuit test information to the control end.
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| CN202010324052.XA CN111413613A (en) | 2020-04-22 | 2020-04-22 | Multi-channel key open-circuit short-circuit test system and method |
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| CN202010324052.XA CN111413613A (en) | 2020-04-22 | 2020-04-22 | Multi-channel key open-circuit short-circuit test system and method |
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