CN111412828A - Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe - Google Patents

Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe Download PDF

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Publication number
CN111412828A
CN111412828A CN202010430846.4A CN202010430846A CN111412828A CN 111412828 A CN111412828 A CN 111412828A CN 202010430846 A CN202010430846 A CN 202010430846A CN 111412828 A CN111412828 A CN 111412828A
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China
Prior art keywords
passing channel
liquid
liquid passing
embedded
liquid film
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CN202010430846.4A
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Chinese (zh)
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顾汉洋
刘莉
刘帅
张亨伟
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Shanghai Jiaotong University
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Shanghai Jiaotong University
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Priority to CN202010430846.4A priority Critical patent/CN111412828A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The invention provides a pipe wall liquid film thickness collecting device based on an embedded type conductivity probe, which comprises an installation base and a plurality of conductivity probes, wherein the side wall of the installation base is circumferentially provided with a plurality of through embedding holes which are radially arranged, the conductivity probes are embedded in the embedding holes, one end of each conductivity probe close to a liquid passing channel is flush with the wall surface of the liquid passing channel and is always in contact with liquid in the liquid passing channel, one end of each conductivity probe far away from the liquid passing channel extends out of the embedding hole, and the conductivity probes are used for collecting the liquid film thickness of the pipe wall of the liquid passing channel. The measuring range is wide.

Description

Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe
Technical Field
The invention belongs to the technical field of multiphase flow measurement, and particularly relates to a pipe wall liquid film thickness acquisition device and a measuring device based on an embedded conductivity probe.
Background
In the industrial fields of petroleum, chemical engineering, nuclear power and the like, gas-liquid laminar flow and annular flow are common two-phase flow forms, and the thickness of a liquid film in the flow forms is an important parameter. The accurate non-invasive measurement of the thickness of the liquid film on the pipe wall is not only the basis of obtaining parameters such as gas-liquid phase separation speed, flow and the like, but also has important significance for deeply researching the flow heat transfer characteristics of stratified flow and annular flow, and directly influences the development of a gas-liquid two-phase flow pattern and the adjustment of a process.
At present, the method for measuring the thickness of the liquid film mainly includes an optical method, a ray method, a high-speed camera method, an ultrasonic method, an electrical method and the like according to different measurement principles. In the measuring method, the optical method and the ray method have higher measuring precision, but the use of the method is greatly limited due to the factors of high equipment price, large volume, complex operation and the like; the high-speed photography method can dynamically record the interface at a high speed, so that a structure with finer interface fluctuation can be provided, but the method has high requirements on operators, needs to solve optical problems such as illumination, focusing and the like, and has limited application range; the ray method has serious safety protection problem due to the adoption of radioactive substances; when ultrasonic measurement is adopted, a medium, namely a fusing agent, is needed, and the fitting degree between the transducer and the pipeline inevitably influences the intensity of an ultrasonic echo signal, so that larger measurement deviation is caused.
The electrical method has the advantages of low price, simple equipment, convenient operation, high response speed, stable performance, easy realization and the like, and is widely researched in the measurement of the thickness of the liquid film and the phase content of the cross section in the field of multiphase flow in recent years, wherein the phase content is measured by adopting a metal wire, but the invasion of the metal wire into the fluid can disturb a flow field, so that the measurement of the thickness of the liquid film on the wall is inaccurate. In summary, the above methods for measuring the thickness of the liquid film all have certain limitations, and it is difficult to realize high-precision real-time measurement of the thickness of the fluctuating gas-containing liquid film in the tube.
Disclosure of Invention
The invention aims to provide a pipe wall liquid film thickness acquisition device and a measuring device based on an embedded conductivity probe, which have strong operability and high measuring precision and meet the requirement of interference-free measurement of a convection field.
In order to solve the problems, the technical scheme of the invention is as follows:
a pipe wall liquid film thickness collecting device based on an embedded type conductance probe comprises an installation base and a plurality of conductance probes;
the center of the mounting base is provided with a vertically through liquid passing channel, the upper end surface of the mounting base is circumferentially provided with a plurality of first bolt holes, the lower end surface of the mounting base is circumferentially provided with a plurality of second bolt holes, the first bolt holes and the second bolt holes are used for fixedly mounting the mounting base between pipelines to be tested, the side wall of the mounting base is circumferentially provided with a plurality of through radially-arranged embedding holes, the axes of the embedding holes are perpendicular to the axes of the liquid passing channel, and the number of the embedding holes is consistent with the number of the conductance probes;
the conductive probes are coaxially embedded in the embedding holes respectively, one end, close to the liquid passing channel, of each conductive probe is flush with the wall surface of the liquid passing channel and is always in contact with liquid in the liquid passing channel, one end, far away from the liquid passing channel, of each conductive probe extends out of the embedding hole, and each conductive probe is used for collecting the thickness of a liquid film on the wall of the liquid passing channel.
Preferably, the conductance probe comprises a receiving electrode, an insulating layer and an excitation electrode, the cross section of the receiving electrode is cylindrical, the cross sections of the insulating layer and the excitation electrode are both circular rings, and the receiving electrode, the insulating layer and the excitation electrode are coaxially assembled from inside to outside in sequence.
Preferably, the receiving electrode, the insulating layer and one end of the excitation electrode close to the liquid passing channel are all flush with the wall surface of the liquid passing channel, one end of the insulating layer far from the liquid passing channel axially extends out of the excitation electrode, one end of the receiving electrode far from the liquid passing channel axially extends out of the insulating layer, one end of the receiving electrode far from the liquid passing channel is connected with a first external data wire, and one end of the excitation electrode far from the liquid passing channel is connected with a second external data wire.
Preferably, the receiving electrode is made of stainless steel, and the exciting electrode is made of stainless steel.
Preferably, the insulating layer is made of phenolic resin.
Preferably, the diameter of the conductance probe is equal to the diameter of the insertion hole, and the conductance probe is coaxially inserted into the insertion hole.
Preferably, the diameter of the liquid passing channel is equal to the liquid passing inner diameter of the measured pipeline.
Based on the same inventive concept, the invention also provides a pipe wall liquid film thickness measuring device based on the embedded conductivity probe, which comprises the pipe wall liquid film thickness collecting device based on the embedded conductivity probe.
Due to the adoption of the technical scheme, compared with the prior art, the invention has the following advantages and positive effects:
1) the invention provides a pipe wall liquid film thickness collecting device based on an embedded type conductivity probe, which comprises an installation base and a plurality of conductivity probes, wherein the side wall of the installation base is circumferentially provided with a plurality of through embedding holes which are radially arranged, the conductivity probes are embedded in the embedding holes, one end of each conductivity probe close to a liquid passing channel is flush with the wall surface of the liquid passing channel and is always in contact with liquid in the liquid passing channel, one end of each conductivity probe far away from the liquid passing channel extends out of the embedding hole, and the conductivity probes are used for collecting the liquid film thickness of the pipe wall of the liquid passing channel, the distribution information of the thickness of the liquid film on the cross section of the liquid passage can be obtained along the circumferential direction, and the measuring range is wide.
2) The invention provides a pipe wall liquid film thickness collecting device based on an embedded type conductivity probe, wherein the conductivity probe comprises a receiving electrode, an insulating layer and an excitation electrode, the cross section of the receiving electrode is cylindrical, the cross sections of the insulating layer and the excitation electrode are both circular, the receiving electrode, the insulating layer and the excitation electrode are coaxially assembled from inside to outside in sequence, a central electrode is used as the receiving electrode, an outer ring electrode is used as the excitation electrode, the output signal of the receiving electrode can be directly analyzed, and errors generated by unstable external factors on the measuring result are eliminated.
3) The pipe wall liquid film thickness acquisition device based on the embedded conductivity probe provided by the invention has strong working condition adaptability, can meet the requirement of measuring the thickness of a static or slow-flow liquid film, and can also measure the thickness of the liquid film during high-speed movement.
Drawings
Fig. 1 is a top view of a device for collecting a thickness of a liquid film on a tube wall based on an embedded conductance probe according to an embodiment of the present invention;
fig. 2 is a sectional view a-a of the device for collecting the thickness of the liquid film on the wall of the tube based on the embedded conductance probe according to the embodiment of the present invention.
Description of reference numerals:
1: installing a base; 11: a liquid passing channel; 12: a first bolt hole; 13: an insertion hole; 2: a conductance probe; 21: a receiving electrode; 22: an insulating layer; 23: the electrodes are activated.
Detailed Description
The present invention provides a wall liquid film thickness collecting device and a measuring device based on an embedded conductance probe, which are further described in detail with reference to the accompanying drawings and specific embodiments. Advantages and features of the present invention will become apparent from the following description and from the claims.
Example one
Referring to fig. 1 and 2, the invention provides a pipe wall liquid film thickness collecting device based on an embedded conductivity probe, which comprises a mounting base 1 and a plurality of conductivity probes 2;
the center of the mounting base 1 is provided with a vertically through liquid passing channel 11, in the embodiment, the mounting base 1 is cylindrical, the center of the mounting base is provided with the cylindrical liquid passing channel 11, the diameter of the liquid passing channel 11 is consistent with the inner diameter of the pipeline to be measured, the upper end of the liquid passing channel 11 is a liquid inlet, and the lower end of the liquid passing channel 11 is a liquid outlet;
in the embodiment, four first bolt holes 12 are uniformly distributed on the upper end surface of the mounting base 1 along the circumferential direction, four second bolt holes are uniformly distributed on the lower end surface of the mounting base 1 along the circumferential direction, and the first bolt holes 12 and the second bolt holes are used for fixedly mounting the mounting base 1 between the pipelines to be tested;
the lateral wall of installation base 1 has seted up the radial embedding hole 13 that arranges that is that a plurality of link up along circumference, and in this embodiment, the lateral wall of installation base 1 has four embedding holes 13 along the circumference equipartition, and the axis of embedding hole 13 is mutually perpendicular with the axis of crossing liquid passageway 11, and just the embedding hole 13 is unanimous with the quantity of conductance probe 2.
The diameter of the conductance probe 2 is equal to that of the embedding hole 13, the plurality of conductance probes 2 are coaxially embedded in the plurality of embedding holes 13 respectively, one end, close to the liquid passing channel 11, of the conductance probe 2 is flush with the wall surface of the liquid passing channel 11 and is always in contact with liquid in the liquid passing channel 11, one end, far away from the liquid passing channel 11, of the conductance probe 2 extends into the embedding hole 13, and the conductance probe 2 is used for collecting the thickness of a liquid film on the pipe wall of the liquid passing channel 11;
in this embodiment, the conductance probe 2 includes a receiving electrode 21, an insulating layer 22 and an excitation electrode 23, the cross section of the receiving electrode 21 is cylindrical, the cross sections of the insulating layer 22 and the excitation electrode 23 are both circular rings, the receiving electrode 21, the insulating layer 22 and the excitation electrode 23 are coaxially assembled from inside to outside in sequence, a central electrode is adopted as the receiving electrode 21, an outer ring electrode is adopted as an arrangement mode of the excitation electrode 23, an output signal of the receiving electrode can be directly analyzed, and an error of an unstable external factor on a measurement result is eliminated.
In this embodiment, the receiving electrode 21, the insulating layer 22 and one end of the excitation electrode 23 close to the liquid passing channel 11 are all flush with the wall surface of the liquid passing channel 11, one end of the insulating layer 22 far from the liquid passing channel 11 axially extends out of the excitation electrode 23, the excitation electrode 23 is connected with an external data wire and used for receiving an instruction and sending out an excitation signal, and one end of the receiving electrode 21 far from the liquid passing channel 11 axially extends out of the insulating layer 22 and is connected with the external data wire and used for outputting and processing the collected liquid film thickness data.
The invention provides a pipe wall liquid film thickness collecting device based on an embedded type conductivity probe, which comprises a working process that the diameter of a liquid passing channel 11 on a mounting base 1 is determined according to the inner diameter of a measured pipeline, and the diameter of the liquid passing channel 11 is consistent with the inner diameter of the measured pipeline in size; then, the mounting base 1 is fixedly mounted between the pipelines to be tested through the first bolt holes 12 and the second bolt holes on the upper end surface and the lower end surface of the mounting base 1, when liquid in the pipelines to be tested flows through the liquid channel 11, the excitation electrode 23 sends out an excitation signal, the receiving electrode 21 quickly collects the attenuated excitation signal transmitted through the liquid film, the attenuated excitation signal is transmitted to an external digital-to-analog conversion circuit through a data lead and processed, and finally the liquid film thickness distribution signal value at the pipe wall of the liquid channel 11 at the moment is obtained.
The invention provides a pipe wall liquid film thickness collecting device based on an embedded type conductivity probe, which comprises an installation base 1 and a plurality of conductivity probes 2, wherein the side wall of the installation base 1 is circumferentially provided with a plurality of through radially-arranged embedding holes 13, the conductivity probes 2 are embedded in the embedding holes 13, one ends of the conductivity probes 2 close to a liquid passage 11 are flush with the wall surface of the liquid passage 11 and are always in contact with liquid in the liquid passage 11, one ends of the conductivity probes 2 far away from the liquid passage 11 extend out of the embedding holes 13, and the conductivity probes 2 are used for collecting the liquid film thickness of the pipe wall of the liquid passage, the distribution information of the thickness of the liquid film on the cross section of the liquid passing channel can be obtained along the circumferential direction, and the measuring range is wide; meanwhile, the pipe wall liquid film thickness acquisition device based on the embedded conductivity probe has strong working condition adaptability, can meet the requirement of measuring the thickness of a static or slow-flow liquid film, and can also measure the thickness of the liquid film during high-speed movement.
Example two
Based on the same inventive concept, the invention also provides a pipe wall liquid film thickness measuring device based on the embedded conductivity probe, which comprises the pipe wall liquid film thickness collecting device based on the embedded conductivity probe.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments. Even if various changes are made to the present invention, it is still within the scope of the present invention if they fall within the scope of the claims of the present invention and their equivalents.

Claims (8)

1. A pipe wall liquid film thickness collecting device based on an embedded type conductance probe is characterized by comprising an installation base and a plurality of conductance probes;
the center of the mounting base is provided with a vertically through liquid passing channel, the upper end surface of the mounting base is circumferentially provided with a plurality of first bolt holes, the lower end surface of the mounting base is circumferentially provided with a plurality of second bolt holes, the first bolt holes and the second bolt holes are used for fixedly mounting the mounting base between pipelines to be tested, the side wall of the mounting base is circumferentially provided with a plurality of through radially-arranged embedding holes, the axes of the embedding holes are perpendicular to the axes of the liquid passing channel, and the number of the embedding holes is consistent with the number of the conductance probes;
the conductive probes are coaxially embedded in the embedding holes respectively, one end, close to the liquid passing channel, of each conductive probe is flush with the wall surface of the liquid passing channel and is always in contact with liquid in the liquid passing channel, one end, far away from the liquid passing channel, of each conductive probe extends out of the embedding hole, and each conductive probe is used for collecting the thickness of a liquid film on the wall of the liquid passing channel.
2. The device for collecting the thickness of the liquid film on the tube wall based on the embedded conductivity probe as claimed in claim 1, wherein the conductivity probe comprises a receiving electrode, an insulating layer and an excitation electrode, the cross section of the receiving electrode is cylindrical, the cross sections of the insulating layer and the excitation electrode are both circular rings, and the receiving electrode, the insulating layer and the excitation electrode are coaxially assembled from inside to outside in sequence.
3. The device for acquiring the thickness of the liquid film on the tube wall based on the embedded conductance probe as claimed in claim 2, wherein the ends of the receiving electrode, the insulating layer and the exciting electrode close to the liquid passing channel are all flush with the wall surface of the liquid passing channel, the end of the insulating layer far from the liquid passing channel axially extends out of the exciting electrode, the end of the receiving electrode far from the liquid passing channel axially extends out of the insulating layer, the end of the receiving electrode far from the liquid passing channel is connected with a first external data wire, and the end of the exciting electrode far from the liquid passing channel is connected with a second external data wire.
4. The device for collecting the liquid film thickness on the tube wall based on the embedded conductance probe of claim 2, wherein the receiving electrode is made of stainless steel, and the exciting electrode is made of stainless steel.
5. The device for collecting the liquid film thickness on the pipe wall based on the embedded conductivity probe as claimed in claim 2, wherein the insulating layer is made of phenolic resin.
6. The device for collecting the liquid film thickness on the pipe wall based on the embedded conductivity probe as claimed in claim 1, wherein the diameter of the conductivity probe is equal to the diameter of the embedding hole, and the conductivity probe is coaxially embedded in the embedding hole.
7. The device for acquiring the liquid film thickness on the pipe wall based on the embedded conductivity probe as claimed in claim 1, wherein the diameter of the liquid passing channel is equal to the liquid passing inner diameter of the pipe to be detected.
8. The device for measuring the thickness of the liquid film on the pipe wall based on the embedded conductivity probe is characterized by comprising the device for acquiring the thickness of the liquid film on the pipe wall based on the embedded conductivity probe as claimed in any one of claims 1 to 7.
CN202010430846.4A 2020-05-20 2020-05-20 Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe Pending CN111412828A (en)

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CN202010430846.4A CN111412828A (en) 2020-05-20 2020-05-20 Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe

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Application Number Priority Date Filing Date Title
CN202010430846.4A CN111412828A (en) 2020-05-20 2020-05-20 Pipe wall liquid film thickness collecting device and measuring device based on embedded conductivity probe

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CN111412828A true CN111412828A (en) 2020-07-14

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113465489A (en) * 2021-06-17 2021-10-01 上海交通大学 Conductivity probe and device for measuring wall space multipoint liquid film thickness in real time

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113465489A (en) * 2021-06-17 2021-10-01 上海交通大学 Conductivity probe and device for measuring wall space multipoint liquid film thickness in real time

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