CN111400176A - Test sequence generation method and system, and test method and system of high-reliability software - Google Patents
Test sequence generation method and system, and test method and system of high-reliability software Download PDFInfo
- Publication number
- CN111400176A CN111400176A CN202010161800.7A CN202010161800A CN111400176A CN 111400176 A CN111400176 A CN 111400176A CN 202010161800 A CN202010161800 A CN 202010161800A CN 111400176 A CN111400176 A CN 111400176A
- Authority
- CN
- China
- Prior art keywords
- test sequence
- tested
- covered
- events
- subsequence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 210
- 238000000034 method Methods 0.000 title claims abstract description 42
- 238000010998 test method Methods 0.000 title abstract description 6
- 238000013101 initial test Methods 0.000 claims abstract description 41
- 238000013522 software testing Methods 0.000 description 5
- 238000010276 construction Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 230000003993 interaction Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3676—Test management for coverage analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
Abstract
The invention discloses a test sequence generation method and system, and a test method and system of high-reliability software. The test sequence generation method comprises the following steps: determining a subsequence set to be covered according to the event set to be tested and the sequential covering strength; determining an initial test sequence, and taking the initial test sequence as a current test sequence; judging whether the current test sequence completely covers each subsequence to be covered; if not, respectively and independently adding each event to be tested in the event set to be tested to the back of the current test sequence to obtain a plurality of candidate test sequences; selecting the candidate test sequence with the largest number of covering subsequences to be covered in the candidate test sequences to replace the current test sequence, and skipping to the step of judging whether the current test sequence completely covers each subsequence to be covered; and if so, taking the current test sequence which completely covers each subsequence to be covered as a test sequence for testing the high-reliability software. The invention can reduce the covering redundancy of the SCA sequence.
Description
Technical Field
The invention relates to the field of high-reliability software testing, in particular to a method and a system for generating a testing sequence of high-reliability software, and a method and a system for testing the high-reliability software.
Background
The testing of the highly trusted software provides important guarantee for the reliability of the highly trusted software. Event-driven software testing techniques have found widespread application in the field of highly trusted software testing, common examples of which span multiple domains, from embedded systems to web and GUI applications. Test methods based on event execution permutation are common in the field of software testing. Existing T-way strategies are very useful for detecting interaction failures between parameters, especially at higher interaction strengths, but still lack support for test event sequences or parameter occurrences. Kuhn et al provide an effective strategy using the combinatorial approach, and Table 1 shows an example of SCA generated by the sequence overlay array generator tool, and from Table 1 it can be seen that 3-way sequential overlay of 4 events generates 8 test sequences.
TABLE 1 3-way overlay test sequence of four events
It can be seen that in the above method, the generation of the SCA coverage array does not take into account that multiple test sequences may simultaneously cover the same sub-sequence of sequential events, thereby causing the problem of sequential coverage redundancy.
Disclosure of Invention
The invention aims to provide a test sequence generation method and system, a test method and a test system of high-reliability software, which can reduce SCA sequence coverage redundancy.
In order to achieve the purpose, the invention provides the following scheme:
the invention provides a test sequence generation method of high-reliability software, which comprises the following steps:
determining a set of events to be tested and the sequential coverage strength of the events to be tested;
determining a subsequence set to be covered according to the event set to be covered and the sequential covering strength;
determining an initial test sequence, and taking the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
judging whether the current test sequence completely covers each subsequence to be covered;
if not, respectively and independently adding each event to be tested in the event set to be tested to the back of the current test sequence to obtain a plurality of candidate test sequences;
selecting the candidate test sequence with the largest number of the subsequences to be covered in the candidate test sequences to replace the current test sequence, and skipping to the step of judging whether the current test sequence completely covers each subsequence to be covered;
and if so, taking the current test sequence which completely covers each subsequence to be covered as a test sequence for testing the high-reliability software.
Optionally, the determining a subsequence set to be covered according to the event set to be tested and the sequential coverage strength specifically includes:
and randomly selecting t events to be tested from the event set to be tested to be subjected to full permutation and combination to obtain a subsequence set to be covered, wherein t is the sequential covering strength.
Optionally, the determining an initial test sequence specifically includes:
and determining a sequence obtained by randomly arranging the events to be tested in the event set to be tested as the initial test sequence.
Optionally, before the determining the set of events to be tested, the method further includes:
carrying out uniform abstract expression on events to be tested to obtain marks representing the events to be tested;
and constructing the event set to be tested by adopting the mark of each event to be tested.
The invention also provides a test method of the high-reliability software, which comprises the following steps:
generating a test sequence by adopting the test sequence generation method of the high-reliability software provided by the invention;
and testing the high-reliability software by adopting the test sequence.
The invention also provides a test sequence generation system of the high-reliability software, which comprises the following steps:
the parameter determining module is used for determining a set of events to be tested and the sequential coverage strength of the events to be tested;
a to-be-covered subsequence determining module, configured to determine a to-be-covered subsequence set according to the to-be-tested event set and the sequential coverage strength;
the initial test sequence determining module is used for determining an initial test sequence and taking the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
the judging module is used for judging whether the current test sequence completely covers each subsequence to be covered;
a candidate test sequence generation module, configured to add each event to be tested in the set of events to be tested to the back of the current test sequence separately when the current test sequence does not completely cover each subsequence to be covered, so as to obtain multiple candidate test sequences;
a current test sequence updating module, configured to select a candidate test sequence with the largest number of sub-sequences to be covered in the candidate test sequences to replace the current test sequence;
and the test sequence determining module is used for taking the current test sequence which completely covers each subsequence to be covered as a test sequence for testing high-reliability software when the current test sequence completely covers each subsequence to be covered.
Optionally, the subsequence module to be covered specifically includes:
and the to-be-covered subsequence unit is used for performing full permutation and combination on any t to-be-tested events in the to-be-tested event set to obtain the to-be-covered subsequence set, wherein t is the sequential coverage strength.
Optionally, the initial test sequence determining module specifically includes:
and the initial test sequence determining unit is used for determining a sequence obtained by randomly arranging all events to be tested in the event set to be tested as the initial test sequence.
Optionally, the system further includes:
the event to be tested abstract description module is used for carrying out uniform abstract expression on the events to be tested to obtain marks representing the events to be tested;
and the to-be-tested event set building module is used for building the to-be-tested event set by adopting the marks of the to-be-tested events.
The invention also provides a test system of the high-reliability software, which comprises the following components:
the invention provides a test sequence generation system of high-reliability software; and the test system adopts the test sequence to test the high-reliability software.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects: when a test sequence is generated, only one event to be tested is added in each step on the basis of an initial test sequence, then a candidate test sequence with the largest number of subsequences to be covered is selected from a plurality of candidate test sequences to replace the current test sequence, then whether the current test sequence covers all sequences to be covered is judged, if not, an event to be tested is added behind the current test sequence, and the operation is repeated until the obtained current test sequence covers all sequences to be covered. The invention greatly reduces the coverage redundancy of the SCA sequence.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a flowchart of a method for generating a test sequence of highly trusted software according to an embodiment of the present invention;
FIG. 2 is a graph illustrating the relationship between the number of events included in the test sequence and the number of events to be tested according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a test sequence generation system of high-reliability software in the embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
A first aspect of the present invention provides a method for generating a test sequence of high-reliability software, as shown in fig. 1, the method for generating the test sequence includes the following steps:
step 101: determining a set of events to be tested and the sequential coverage strength of the events to be tested;
step 102: determining a subsequence set to be covered according to the event set to be covered and the sequential covering strength;
step 103: determining an initial test sequence, and taking the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
step 104: judging whether the current test sequence completely covers each subsequence to be covered;
step 105: if the current test sequence does not completely cover each subsequence to be covered, each event to be tested in the event set to be tested is independently added to the back of the current test sequence respectively to obtain a plurality of candidate test sequences;
step 106: selecting the candidate test sequence with the largest number of covering subsequences to be covered in the candidate test sequences to replace the current test sequence, and jumping to step 104;
step 107: and if the current test sequence completely covers each subsequence to be covered, taking the current test sequence completely covering each subsequence to be covered as a test sequence for testing the high-reliability software.
In each iteration, the embodiment only adds one event to be tested after the initial test sequence until a test sequence capable of covering all sequences to be covered is obtained. Compared with the prior art, the test sequence generated by the embodiment greatly reduces coverage redundancy.
In an embodiment, as a preferred implementation, step 102 may specifically be:
and randomly selecting t events to be tested from the event set to be tested to be subjected to full permutation and combination to obtain a subsequence set to be covered, wherein t is the sequential covering strength. The sequential coverage strength t refers to the sequential combined strength of the n events to be tested.
In an embodiment, as a preferred implementation manner, step 103 may specifically be:
and determining a sequence obtained by randomly arranging the events to be tested in the event set to be tested as the initial test sequence. For example, a list of initial test sequences is generated according to the input sequence of events to be tested.
The step is mainly to realize the construction of an initial test sequence and lay a foundation for meeting the requirement of t-way sequential coverage by expanding the sequence subsequently. The implementation method is to arrange the input events to be tested into a column in sequence, wherein the sequence of the events is unconstrained. Taking four events a, b, c, d as an example, four times are listed in sequence to obtain an initial sequence: a-b-c-d.
In the embodiment, as a preferred implementation, before step 101, the method may further include:
carrying out uniform abstract expression on events to be tested to obtain marks representing the events to be tested;
and constructing the event set to be tested by adopting the mark of each event to be tested.
In this embodiment, events to be tested that occur in the software testing process are abstracted uniformly, for example, if a certain testing event is a control command for executing a left turn, the testing event can be abstracted as an event a, and a control command for right turn can be abstracted as an event b. The representation of the test sequence and the generation of the test sequence is facilitated.
In an embodiment, steps 104-106 may include the following:
When the step 104 determines that the current test sequence does not cover all sequences to be covered, step 105 is executed: and constructing candidate test sequences, and adding the input n events to be tested to the rear of the current test sequence respectively and independently, thereby constructing n candidate test sequences. Step 105 is to extend the test sequence by adding each event to be tested separately to the tail end of the current test sequence, thereby constructing n candidate test sequences.
Step 106 checks the number of the n candidate test sequences covering the subsequences to be covered respectively, selects the candidate test sequences covering more subsequences to be covered to replace the current test sequence, updates the optimal covering number, and jumps to step 104. The method for checking the number of the sub-sequences to be covered by each candidate test sequence in step 106 is the same as the method for judging the sub-sequences to be covered in step 104.
Take the sequential testing of motion control commands of the controller embedded software as an example. The controller receives commands from an external communication protocol. In order to test whether the embedded software can still ensure the reliability of the embedded software under the condition of receiving various possible sequence combinations of instructions in all directions, a test case covering the sequence combinations of all events is designed. The direction commands that can be received include left turn (command a), right turn (command b), up (command c), down (command d), forward (command e), and backward (command f). Due to the coupling between the executing structures and other factors, after the controller receives the action command, the fault may be caused by executing another motion after a certain motion. Therefore, the event test sequence to be generated should cover the t-way sequential combination of the instructions of each direction to test the system.
Taking the number of input events as 6 and the sequential coverage strength t as 3 as an example, the 3-way coverage test sequence obtained by the test sequence generation method of the invention is as follows: left turn-right turn-up-down-forward-back-left turn-right turn-up-down-forward-left turn-back-right turn-up-down. Taking an input event as 6 and a sequential coverage strength t as 4 as an example, the 4-way coverage test sequence obtained by the test sequence generation method of the invention is as follows: left turn-right turn-up-down-forward-back-left turn-right turn-up-down-forward-left turn-back-right turn-up. By executing the commands in the above test sequence order, system faults triggered by the event sequence can be found, so that more faults are mined.
The test sequence generation method proposed by the present invention is compared with the existing t-seq generation method and SCA reduction method in general.
Tables 2 and 3 show a 3-way sequence and a 4-way overlay test sequence, respectively, for the number of events generated using the test sequence generation method of the present invention from 5 to 8.
TABLE 2 3-way overlay test sequences generated by the direct construction method
TABLE 3 4-way overlay test sequences generated by the direct construction method
| Number of events | 4-way |
| 5 | a-b-c-d-e-a-b-c-d-e-a-b-c-d-a-e-b |
| 6 | a-b-c-d-e-f-a-b-c-d-e-f-a-b-c-d-e-a-f-b-c |
| 7 | a-b-c-d-e-f-g-a-b-c-d-e-f-g-a-b-c-d-e-f-a-g-b-c-d |
| 8 | a-b-c-d-e-f-g-h-a-b-c-d-e-f-g-h-a-b-c-d-e-f-g-a-h-b-c-d-e |
Table 4 compares the number of events contained in the test sequence generated by the T-seq method, the number of events contained in the test sequence generated by the sequence overlay array SCA reduction method, and the number of events contained in the test sequence generated by the present invention.
TABLE 4 comparison of test sequence event number for satisfaction of 3-way and 4-way overlays
Fig. 2 shows the trend of the number of events included in the test sequence generated by each alignment method increasing with the number of test events. As can be seen from FIG. 2, compared with the T-seq method and the SCA reduction method, the number of test sequence events is greatly reduced on the basis that the same event sequence coverage is generated, so that the test time can be effectively reduced, and the test cost can be reduced.
The invention greatly compresses the event number of the test sequence, and particularly, the greater the event number to be tested, the greater the advantages of the invention compared with the SCA method and the simplified method.
The second aspect of the present invention provides a method for testing high-reliability software, including: generating a test sequence by adopting the test sequence generation method of the high-reliability software provided by the first aspect of the invention; and testing the high-reliability software by adopting the test sequence.
A third aspect of the present invention provides a test sequence generation system for highly trusted software, as shown in fig. 3, the system including:
a parameter determining module 301, configured to determine a set of events to be tested and a sequential coverage strength of the events to be tested;
a to-be-covered subsequence determining module 302, configured to determine a to-be-covered subsequence set according to the to-be-tested event set and the sequential coverage strength;
an initial test sequence determining module 303, configured to determine an initial test sequence, and use the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
a determining module 304, configured to determine whether the current test sequence completely covers each of the sub-sequences to be covered;
a candidate test sequence generating module 305, configured to add each to-be-tested event in the to-be-tested event set to the back of the current test sequence separately to obtain multiple candidate test sequences when the current test sequence does not completely cover each to-be-covered subsequence;
a current test sequence updating module 306, configured to select a candidate test sequence with the largest number of sub-sequences to be covered in the candidate test sequences to replace the current test sequence;
and a test sequence determining module 307, configured to, when the current test sequence completely covers each of the sub-sequences to be covered, use the current test sequence completely covering each of the sub-sequences to be covered as a test sequence for testing high-reliability software.
In an embodiment, as a preferred implementation manner, the sub-sequence to be covered module 302 may include:
and the to-be-covered subsequence unit is used for performing full permutation and combination on any t to-be-tested events in the to-be-tested event set to obtain the to-be-covered subsequence set, wherein t is the sequential coverage strength.
In an embodiment, as a preferred implementation, the initial test sequence determining module 303 may include:
and the initial test sequence determining unit is used for determining a sequence obtained by randomly arranging all events to be tested in the event set to be tested as the initial test sequence.
In an embodiment, as a preferred implementation manner, the test sequence generation system for highly trusted software provided by the present invention may further include:
the event to be tested abstract description module is used for carrying out uniform abstract expression on the events to be tested to obtain marks representing the events to be tested;
and the to-be-tested event set building module is used for building the to-be-tested event set by adopting the marks of the to-be-tested events.
A fourth aspect of the present invention provides a system for testing highly trusted software, the system comprising: the third aspect of the invention provides a system for generating a test sequence of high-reliability software; and the following steps are adopted: the test sequence generated by the test sequence generation system of the high-reliability software provided by the third aspect of the invention is a test system for testing the high-reliability software.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (10)
1. A test sequence generation method of high-reliability software is characterized by comprising the following steps:
determining a set of events to be tested and the sequential coverage strength of the events to be tested;
determining a subsequence set to be covered according to the event set to be covered and the sequential covering strength;
determining an initial test sequence, and taking the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
judging whether the current test sequence completely covers each subsequence to be covered;
if not, respectively and independently adding each event to be tested in the event set to be tested to the back of the current test sequence to obtain a plurality of candidate test sequences;
selecting the candidate test sequence with the largest number of the subsequences to be covered in the candidate test sequences to replace the current test sequence, and skipping to the step of judging whether the current test sequence completely covers each subsequence to be covered;
and if so, taking the current test sequence which completely covers each subsequence to be covered as a test sequence for testing the high-reliability software.
2. The method for generating the test sequence of the highly trusted software as claimed in claim 1, wherein the determining the set of subsequences to be covered according to the set of events to be tested and the sequential coverage strength specifically includes:
and randomly selecting t events to be tested from the event set to be tested to be subjected to full permutation and combination to obtain a subsequence set to be covered, wherein t is the sequential covering strength.
3. The method for generating a test sequence of highly trusted software according to claim 1, wherein the determining an initial test sequence specifically includes:
and determining a sequence obtained by randomly arranging the events to be tested in the event set to be tested as the initial test sequence.
4. The method for generating a test sequence of highly trusted software as claimed in claim 1, further comprising, before said determining a set of events to be tested:
carrying out uniform abstract expression on events to be tested to obtain marks representing the events to be tested;
and constructing the event set to be tested by adopting the mark of each event to be tested.
5. A method for testing high-reliability software is characterized by comprising the following steps:
generating a test sequence by adopting a test sequence generation method of the high-reliability software according to any one of claims 1 to 4;
and testing the high-reliability software by adopting the test sequence.
6. A test sequence generation system for highly trusted software, comprising:
the parameter determining module is used for determining a set of events to be tested and the sequential coverage strength of the events to be tested;
a to-be-covered subsequence determining module, configured to determine a to-be-covered subsequence set according to the to-be-tested event set and the sequential coverage strength;
the initial test sequence determining module is used for determining an initial test sequence and taking the initial test sequence as a current test sequence; the initial test sequence is a test sequence consisting of events to be tested in the event set to be tested;
the judging module is used for judging whether the current test sequence completely covers each subsequence to be covered;
a candidate test sequence generation module, configured to add each event to be tested in the set of events to be tested to the back of the current test sequence separately when the current test sequence does not completely cover each subsequence to be covered, so as to obtain multiple candidate test sequences;
a current test sequence updating module, configured to select a candidate test sequence with the largest number of sub-sequences to be covered in the candidate test sequences to replace the current test sequence;
and the test sequence determining module is used for taking the current test sequence which completely covers each subsequence to be covered as a test sequence for testing high-reliability software when the current test sequence completely covers each subsequence to be covered.
7. The system for generating a test sequence of highly trusted software according to claim 6, wherein the subsequence module to be covered specifically includes:
and the to-be-covered subsequence unit is used for performing full permutation and combination on any t to-be-tested events in the to-be-tested event set to obtain the to-be-covered subsequence set, wherein t is the sequential coverage strength.
8. The system for generating a test sequence of highly trusted software according to claim 6, wherein the initial test sequence determining module specifically includes:
and the initial test sequence determining unit is used for determining a sequence obtained by randomly arranging all events to be tested in the event set to be tested as the initial test sequence.
9. The system for generating a test sequence of highly trusted software as claimed in claim 6, further comprising:
the event to be tested abstract description module is used for carrying out uniform abstract expression on the events to be tested to obtain marks representing the events to be tested;
and the to-be-tested event set building module is used for building the to-be-tested event set by adopting the marks of the to-be-tested events.
10. A system for testing highly trusted software, comprising:
a test sequence generation system for highly trusted software as claimed in any one of claims 6 to 9; and the test system adopts the test sequence to test the high-reliability software.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010161800.7A CN111400176B (en) | 2020-03-10 | 2020-03-10 | Test sequence generation method and system, test method and system of high-credibility software |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010161800.7A CN111400176B (en) | 2020-03-10 | 2020-03-10 | Test sequence generation method and system, test method and system of high-credibility software |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111400176A true CN111400176A (en) | 2020-07-10 |
| CN111400176B CN111400176B (en) | 2023-12-08 |
Family
ID=71436089
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010161800.7A Active CN111400176B (en) | 2020-03-10 | 2020-03-10 | Test sequence generation method and system, test method and system of high-credibility software |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111400176B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111782544A (en) * | 2020-07-22 | 2020-10-16 | 中国人民解放军国防科技大学 | Software radio conformance testing method based on multi-population genetic algorithm |
| CN112951351A (en) * | 2021-03-31 | 2021-06-11 | 南京信息工程大学 | Drug clinical trial design method based on row-limited coverage array |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050081109A1 (en) * | 2003-10-14 | 2005-04-14 | Microsoft Corporation | Method and system for efficient testing of sequences of computer-related operations |
| CN101916225A (en) * | 2010-09-02 | 2010-12-15 | 于秀山 | Graphical user interface software function coverage testing method |
| US20130111267A1 (en) * | 2011-11-01 | 2013-05-02 | International Business Machines Corporation | Optimizing regression testing based on code coverage analysis |
| CN106095692A (en) * | 2016-08-12 | 2016-11-09 | 哈尔滨工业大学 | The one-parameter sequence of events test data generating method of embedded software |
| CN108415841A (en) * | 2018-03-19 | 2018-08-17 | 南京邮电大学 | A kind of combined test use-case prioritization method based on covering dynamics increment |
-
2020
- 2020-03-10 CN CN202010161800.7A patent/CN111400176B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050081109A1 (en) * | 2003-10-14 | 2005-04-14 | Microsoft Corporation | Method and system for efficient testing of sequences of computer-related operations |
| CN101916225A (en) * | 2010-09-02 | 2010-12-15 | 于秀山 | Graphical user interface software function coverage testing method |
| US20130111267A1 (en) * | 2011-11-01 | 2013-05-02 | International Business Machines Corporation | Optimizing regression testing based on code coverage analysis |
| CN106095692A (en) * | 2016-08-12 | 2016-11-09 | 哈尔滨工业大学 | The one-parameter sequence of events test data generating method of embedded software |
| CN108415841A (en) * | 2018-03-19 | 2018-08-17 | 南京邮电大学 | A kind of combined test use-case prioritization method based on covering dynamics increment |
Non-Patent Citations (3)
| Title |
|---|
| 孔庆彦;伦立军;刘永纯;宋益波;: "一种软件体系结构测试序列生成方法" * |
| 王子元;徐宝文;聂长海;: "组合测试用例生成技术" * |
| 陈翔;顾庆;王新平;陈道蓄;: "组合测试研究进展" * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111782544A (en) * | 2020-07-22 | 2020-10-16 | 中国人民解放军国防科技大学 | Software radio conformance testing method based on multi-population genetic algorithm |
| CN111782544B (en) * | 2020-07-22 | 2022-09-06 | 中国人民解放军国防科技大学 | Software radio conformance testing method based on multi-population genetic algorithm |
| CN112951351A (en) * | 2021-03-31 | 2021-06-11 | 南京信息工程大学 | Drug clinical trial design method based on row-limited coverage array |
| CN112951351B (en) * | 2021-03-31 | 2023-08-22 | 南京信息工程大学 | Drug clinical trial design method based on row limiting coverage array |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111400176B (en) | 2023-12-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111400176A (en) | Test sequence generation method and system, and test method and system of high-reliability software | |
| CN111327490B (en) | Byzantine fault-tolerant detection method of block chain and related device | |
| CN111274077A (en) | Disk array reliability testing method, system, terminal and storage medium | |
| CN104205917A (en) | Method for enabling a device under test (dut) to retry a portion of a pre-defined test sequence | |
| JPH09145800A (en) | Test pattern generation system | |
| CN115757157A (en) | Method and device for realizing efficient regression and storage medium | |
| US8533544B2 (en) | System for tree sequence testing of a device and method for tree sequence testing of a device in a test framework architecture | |
| CN104008056A (en) | Software testing method and device | |
| CN115328814B (en) | Fault injection method, device, equipment and storage medium based on mirror pair | |
| CN108983081B (en) | Secondary programming implementation method and system for electric tool switch test system | |
| Dutt | Mixed PLB and interconnect BIST for FPGAs without fault-free assumptions | |
| CN111581019B (en) | Test method and device for storage fault recovery | |
| WO2002097822A1 (en) | Semiconductor test apparatus | |
| CN110674042B (en) | Concurrency performance testing method and device | |
| CN108205490B (en) | Software watchdog test method and device | |
| CN107425996B (en) | Node linkage method and device | |
| CN109298983B (en) | Snapshot characteristic testing method, device, equipment and storage medium | |
| CN114492266A (en) | Chip verification method and device, electronic equipment and storage medium | |
| KR101989311B1 (en) | Apparatus and method for generating test scripts for testing embedded system | |
| Tu et al. | Rollout strategies for sequential fault diagnosis | |
| Xu et al. | A quasi-best random testing | |
| Piparia et al. | Combinatorial testing of context aware android applications | |
| JP3139742B2 (en) | Failure simulation method | |
| Pomeranz et al. | On maximizing the fault coverage for a given test length limit in a synchronous sequential circuit | |
| Bland | Enabling Application Resilience with and without the MPI Standard |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |