CN111397853A - Backlight self-checking system and method - Google Patents
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- CN111397853A CN111397853A CN202010174451.2A CN202010174451A CN111397853A CN 111397853 A CN111397853 A CN 111397853A CN 202010174451 A CN202010174451 A CN 202010174451A CN 111397853 A CN111397853 A CN 111397853A
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- G—PHYSICS
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The embodiment of the invention discloses a backlight self-checking system and a method, wherein the backlight self-checking system comprises: the device comprises a backlight source, a sampling unit and a processing unit; the sampling unit is electrically connected with the backlight source; the sampling unit is used for collecting working parameters of the backlight source; the working parameters of the backlight source comprise working current values; the processing unit is electrically connected with the sampling unit and used for determining the working backlight value of the backlight source according to the working current value of the backlight source and judging whether the backlight source works abnormally or not according to the working backlight value of the backlight source and a preset backlight value. The backlight self-inspection system and the method disclosed by the embodiment of the invention can automatically detect and judge the state of the backlight source and improve the detection efficiency of the backlight source.
Description
Technical Field
The embodiment of the invention relates to the field of display, in particular to a backlight self-checking system and method.
Background
A backlight (Back light, abbreviated as B L) is an important component of a display device, and the quality and the effect of providing light directly affect the display effect of the display device.
In the prior art, after a customer purchases a display device or when a production line is abnormal, a fault condition is often required to be described for a maintenance worker, and then a professional maintenance worker analyzes the fault.
Due to the fact that professional knowledge of the party is limited, description of the fault is often unclear, and therefore maintenance personnel cannot accurately judge the fault condition, and therefore the maintenance personnel need to arrive at a production line site or return a display device to repair by customers, the backlight maintenance mode is time-consuming, labor-consuming and low in efficiency.
Disclosure of Invention
The backlight self-checking system and the method provided by the embodiment of the invention aim to automatically detect and analyze the state of the backlight source and solve the problems that in the prior art, maintenance personnel cannot know the abnormal reason of the backlight source in time, the maintenance is time-consuming and labor-consuming, and the efficiency is low.
To achieve the object, in a first aspect, an embodiment of the present invention provides a backlight self-inspection system, including:
the device comprises a backlight source, a sampling unit and a processing unit;
the sampling unit is electrically connected with the backlight source; the sampling unit is used for collecting working parameters of the backlight source; the working parameters of the backlight source comprise working current values;
the processing unit is electrically connected with the sampling unit and used for determining the working backlight value of the backlight source according to the working current value of the backlight source and judging whether the backlight source works abnormally or not according to the working backlight value of the backlight source and a preset backlight value.
Optionally, the sampling unit is connected in series to the positive electrode of the backlight source or the negative electrode of the backlight source.
Optionally, the sampling unit includes a sampling resistor.
Optionally, the system further comprises a memory; the memory is electrically connected with the processor unit; and the memory is used for storing the working parameters of the backlight source after the backlight source is determined to be abnormal in working.
In a second aspect, an embodiment of the present invention further provides a backlight self-inspection method, which is performed by using the backlight self-inspection system according to the first aspect, and the backlight self-inspection method includes:
obtaining working parameters of a backlight source, wherein the working parameters of the backlight source comprise a working current value;
determining a working backlight value of the backlight source according to the working current value of the backlight source;
and judging whether the backlight source works abnormally or not according to the working backlight value and the preset backlight value of the backlight source.
Optionally, the determining the working backlight value of the backlight source according to the working current value of the backlight source includes:
the operating backlight value increases as the ratio of the operating current value to the maximum operating current value increases.
Optionally, determining whether the backlight source works abnormally according to the working backlight value and the preset backlight value of the backlight source includes:
when the deviation rate of the backlight value is larger than a preset deviation rate, determining that the backlight source works abnormally;
the relation formula satisfied by the backlight value deviation ratio includes a ratio of a difference value between the preset backlight value and the working backlight value to the preset backlight value.
Optionally, the backlight self-inspection system further includes a memory, the memory is electrically connected to the processing unit, and the backlight self-inspection method further includes:
and after the backlight source works abnormally, sending the working parameters of the backlight source to the memory.
In a third aspect, an embodiment of the present invention further provides a display device, which is implemented by using the backlight self-inspection system according to the first aspect.
In a fourth aspect, the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the backlight self-checking method as described in the second convenience above.
The backlight self-checking system and the method thereof disclosed by the embodiment of the invention have the advantages that the working parameters of the backlight source are collected by the sampling unit, and the collected working parameters of the backlight source are analyzed and processed by the processing unit, so that the system can automatically detect the working state of the backlight source and judge whether the backlight source works abnormally, when the backlight system breaks down, a maintenance worker can intuitively know the fault situation in time through the collected working parameters of the backlight source and analyze the brightness, thereby further accurately judging the reason of the abnormal screen brightness of the display device, improving the maintenance efficiency and shortening the maintenance period.
Drawings
Fig. 1 is a schematic structural diagram of a backlight self-inspection system according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a backlight self-inspection system according to an embodiment of the present invention.
Fig. 3 is a flowchart of a backlight self-testing method according to an embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a display device according to an embodiment of the present invention.
Detailed Description
In order to make the technical problems solved, the technical solutions adopted, and the technical effects achieved by the embodiments of the present invention clearer, the technical solutions of the present invention are further described below by way of specific embodiments with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some but not all of the relevant aspects of the present invention are shown in the drawings. Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts.
The backlight self-checking system provided by the embodiment of the invention is suitable for a display module with a thin film transistor externally attached with a backlight, when backlight is generated, a positive circuit and a negative circuit of the backlight source can generate current, wherein the current value is in direct proportion to the backlight brightness, a sampling unit in the backlight self-checking system is used for collecting working current in the backlight source circuit, a processing unit in the backlight self-checking system is used for determining the working backlight value of the backlight source, whether the backlight source works abnormally is judged according to the working backlight value of the backlight source and a preset backlight value, loop feedback is formed, and a processing result is directly provided for a user. The backlight self-checking system can be applied to mobile phone systems, flat panels, televisions and products with backlight display.
Fig. 1 is a schematic structural diagram of a backlight self-inspection system according to an embodiment of the present invention, and as shown in fig. 1, the backlight self-inspection system includes:
The sampling unit 2 is electrically connected with the backlight 1; the sampling unit 2 is used for collecting working parameters of the backlight source 1; the operating parameter of the backlight includes an operating current value.
The processing unit 3 is electrically connected to the sampling unit 2, and is configured to determine a working backlight value of the backlight source 1 according to a working current value of the backlight source 1, and determine whether the backlight source 1 works abnormally according to the working backlight value of the backlight source 1 and a preset backlight value.
The backlight source (Back light, abbreviated as B L) is a form of Display panel illumination in industry, for example, the backlight source 1 may be a light emitting diode (L acquired Crystal Display, abbreviated as L ED) to provide a light source for a screen, a working parameter of the backlight source 1 may be a working current value, the sampling unit 2 may include a sampling circuit, which is connected to a circuit of the backlight source 1 through the sampling circuit, collects a working current value of the backlight source 1 during working, transmits the collected working current value to the processing unit 3, performs analysis and calculation by using the processing unit 3, determines a working backlight value of the backlight source according to the working current value of the backlight source, and determines whether the backlight source works abnormally according to the working backlight value of the backlight source and a preset backlight value.
According to the backlight detection system provided by the embodiment of the invention, the working state of the backlight source 1 can be automatically detected without depending on external detection equipment, when the backlight source 1 works abnormally, a maintenance worker can intuitively know the fault condition in time through the collected working parameters of the backlight source 1 and analyze the screen brightness of the display device, so that the reason of the screen brightness abnormality is further accurately judged, the inaccuracy of analyzing the problem through description of the maintenance worker is avoided, the phenomenon that the maintenance cycle is too long due to the fact that a customer returns the display device for repair is avoided, the maintenance efficiency of the maintenance worker on the display device is improved, the maintenance cycle is shortened, and the experience of the customer is improved.
Optionally, the sampling unit 2 is connected in series with the positive electrode of the backlight source or the negative electrode of the backlight source.
For example, fig. 2 is a schematic diagram of a backlight self-test system according to an embodiment of the present invention, as shown in fig. 2, a sampling unit 2 is connected in series to a negative electrode of a backlight source, and in other embodiments, the sampling unit may be connected in series to a positive electrode of the backlight source, which is not limited herein. The working parameters of the negative electrode of the backlight source are collected through the sampling unit 2, the collected working parameters of the negative electrode of the backlight source are transmitted to the processing unit 3, the processing unit 3 analyzes and processes the working parameters of the negative electrode of the backlight source, and the sampling unit 2 is used for simply and conveniently collecting the working parameters of the backlight source, so that the convenience of the backlight self-checking system is improved.
With continued reference to fig. 2, optionally, the backlight self-inspection system further includes a driving chip 11; the sampling unit 2 is electrically connected between the driving chip 11 and the backlight.
The driving chip 11 can receive a control signal, so as to adjust the brightness of the backlight source to adjust the screen brightness. The driving chip 11 is used for adjusting the backlight source to be at different brightness values, and the sampling unit 2 can collect the working parameters of the backlight source when the backlight source is at each brightness value, and respectively judge the working state of the backlight source when the backlight source is at each brightness value. The working parameters may include, for example, a working current value, a working voltage value, and the like in a backlight circuit when the backlight source generates backlight; the working state comprises normal backlight working and abnormal backlight working.
Optionally, the sampling unit 2 includes a sampling resistor R1.
The sampling resistor R1 is connected in series to the positive electrode or the negative electrode of the backlight source, for example, as shown in fig. 2, the sampling resistor R1 is connected in series to the negative electrode of the backlight source, and the sampling unit 2 collects the voltage values at the two ends of the sampling resistor R1 as the working parameters of the backlight source, so that the sampling unit is simple and convenient. It will be appreciated that the sampling resistor R1 is selected to be accurate in order to reduce the current limiting effect on the backlight circuit and ensure that the sampling accuracy is not affected, and for example, a military grade resistor may be used as the sampling resistor. In addition, under the condition of not considering cost factors, the mutual inductor can be used for replacing the sampling resistor to sample the working parameters of the backlight source.
Optionally, the backlight self-inspection system further includes a memory 4; the memory 4 is electrically connected with the processor unit 3; the memory 4 is used for storing the working parameters of the backlight source after the backlight source working abnormity is determined.
After the processing unit 3 determines that the backlight source works abnormally, the processor 3 generates a log file and transmits the log file to the memory 4 for storage. The data processed by the processor 3 are stored through the memory 4, so that maintenance personnel can check the data in time conveniently, the reason of the abnormal work of the backlight source can be known quickly, the maintenance efficiency is improved, and the maintenance period is shortened.
Fig. 3 is a flowchart of a backlight self-test method according to an embodiment of the present invention, and as shown in fig. 3, a backlight self-test method implemented by using the backlight self-test system includes:
s101, obtaining working parameters of the backlight source, wherein the working parameters of the backlight source comprise a working current value.
The sampling unit is used for collecting working parameters of the backlight source, and the sampling unit is used for transmitting the collected working parameters of the backlight source to the processing unit, so that the parameters are simple and convenient to obtain, and the operation is easy.
And S102, determining the working backlight value of the backlight source according to the working current value of the backlight source.
The processing unit analyzes and calculates according to the working current of the backlight source to determine the backlight value of the backlight source, exemplarily, the sampling unit collects the working current value of the backlight source, the collected working current value is transmitted to the processing unit, and the processing unit calculates the working backlight value according to the working current value. The working backlight value is calculated through the collected working current value, the working state of the backlight source can be visually reflected, the maintenance personnel can conveniently analyze and process, the detection flow is simplified, and the detection efficiency is improved.
S103, judging whether the backlight source works abnormally or not according to the working backlight value and the preset backlight value of the backlight source.
The processing unit judges according to the calculated working backlight value and the preset backlight value, for example, when the difference between the working backlight value and the preset backlight value is too large, the processing unit judges that the backlight source works abnormally. Through processing unit automated inspection, can judge the operating condition of backlight in advance for whether maintenance personal can audio-visually know the backlight be in abnormal state, reduced maintenance personal's work load, promoted maintenance personal's work efficiency. Through the work backlight value of backlight and the comparison of predetermineeing the backlight value, can the operating condition of automated inspection backlight, need not to utilize external equipment to detect specially, improve the intellectuality that detects to when the backlight takes place unusually, maintenance personal can audio-visually know the fault situation, promoted the efficiency that detects, reduce maintenance cycle, reinforcing customer experience feels.
Optionally, determining an operating backlight value of the backlight source according to the operating current value of the backlight source includes:
the operating backlight value increases as the ratio of the operating current value to the maximum operating current value increases. Illustratively, the working backlight value is calculated using the following formula:
wherein, Iv is the working current value, Imax is the maximum working current value, value is the working backlight value, and Bl _ max is the maximum backlight value.
The sampling resistor in the sampling unit is connected in series with the negative electrode of the backlight source, the sampling unit is used for collecting working voltage values at two ends of the sampling resistor and transmitting the collected working voltage values to the analog-to-digital converter in the sampling unit, the analog signals of the collected working voltage values are converted into digital signals of the working voltage values through the analog-to-digital converter, the converted digital signals are transmitted to the processing unit, the processing unit is used for calculating the working current value Iv of the backlight source according to ohm's law, and finally the processing unit is used for calculating the backlight value through the formula. The processing unit automatically calculates the backlight value according to the formula, the work flow of maintenance personnel is simplified, the calculated backlight value is automatically provided, the calculation precision is improved, and the system intelligence is improved.
Optionally, judging whether the backlight source works abnormally according to the working backlight value and the preset backlight value of the backlight source includes:
when the deviation rate of the backlight value is larger than a preset deviation rate, determining that the backlight source works abnormally;
the relation formula satisfied by the backlight value deviation ratio includes a ratio of a difference value between the preset backlight value and the working backlight value to the preset backlight value.
Illustratively, the backlight value deviation ratio is obtained by the following formula:
when the deviation rate of the backlight value is greater than the preset deviation rate, determining that the backlight source works abnormally;
wherein, S is the backlight value deviation ratio, V is the preset backlight value, and value is the working backlight value.
The processing unit determines whether the backlight source works abnormally according to the formula, calculates a backlight value deviation ratio through the backlight value and the preset backlight value V, and accurately determines a difference value between the calculated backlight value and the preset backlight value V, and the preset deviation ratio may be 10% for example. Namely: and when the calculated backlight value deviation rate S is more than 10%, determining that the backlight source works abnormally. Whether the backlight source is in an abnormal working state or not is judged accurately through the backlight value deviation rate, the method is simple and effective, the working process of judging the backlight source by maintenance personnel is reduced, the working state of the backlight source is fed back to the maintenance personnel visually, and the working efficiency of the maintenance personnel is improved.
In other embodiments, the embodiment of the present invention may further determine whether the backlight source operates abnormally by using the following method:
the working parameters of the backlight source comprise working current; and calculating the ratio of the working current value of the backlight source to the maximum working current value to serve as a first ratio, calculating the difference value between the first ratio and a first preset standard ratio to serve as a first difference value, and determining that the backlight source works abnormally when the first difference value is larger than a first threshold value.
Illustratively, the maximum working current value is 1A, the first preset standard ratio is 0.8, the first threshold value is 0.1, the sampling resistor in the sampling unit is connected in series with the negative electrode of the backlight source, the sampling unit is used for collecting the working voltage values at two ends of the sampling resistor and transmitting the collected working voltage values to the analog-to-digital converter in the sampling unit, the analog signal of the collected working voltage values is converted into the digital signal of the working voltage values through the analog-to-digital converter, the converted digital signal is transmitted to the processing unit, and if the working current value of the backlight source calculated by the processing unit through the ohm law is 0.5A, the ratio of the working current value to the maximum working current value is 0.5, the difference between the ratio of the working current value to the maximum working current value and the first preset standard ratio is 0.3 and is greater than the first threshold value 0.1, so that the working backlight source can be determined to be.
In addition, another way for determining whether the backlight source works abnormally is provided in the embodiments of the present invention:
the working parameters of the backlight source comprise working current; and calculating the ratio of the working current value of the backlight source to the preset current value as a second ratio, calculating the difference value between the second ratio and a second preset standard ratio as a second difference value, and determining that the backlight source works abnormally when the second difference value is greater than a second threshold value.
Illustratively, the preset current value is 1A, the second preset standard ratio is 1.2, and the second threshold is 0.2, the acquisition unit is used to acquire and process the working voltage values at the two ends of the sampling resistor, and the processing unit calculates the working current value according to the working voltage values, which is not described herein again, assuming that the calculated working current value is 1.5A, the ratio of the working current to the preset current value is 1.5, and the difference between the ratio of the working current to the preset current value and the second preset standard ratio is 0.3 and is greater than the second threshold 0.2, so that the backlight source can be determined to be abnormal in operation. By the judging method, the working state of the backlight source can be simply, effectively and quickly judged, and the working efficiency of the backlight self-checking system is improved.
Optionally, the backlight self-inspection system further includes a memory, the memory is electrically connected to the processing unit, and the backlight self-inspection method further includes:
and after determining that the backlight source works abnormally, sending the working parameters of the backlight source to a memory.
When the backlight self-checking system confirms that the backlight source is in an abnormal state, the processing unit transmits the working parameters of the backlight source to the memory, and the memory stores the data transmitted by the processing unit so that maintenance personnel can analyze the data. Data when the backlight source is abnormal can be stored through the memory, the working state when the light emitting source is abnormal is recorded at any time, the data when the light emitting source is abnormal is visually displayed for maintenance personnel, the maintenance personnel can conveniently take and analyze the data at any time, the workload of the maintenance personnel is reduced, and the working efficiency of the maintenance personnel is improved.
Fig. 4 is a schematic structural diagram of a display device according to an embodiment of the present invention, and as shown in fig. 4, the display device 100 may include a backlight self-inspection system according to any embodiment of the present invention. The working parameters in the backlight source loop are collected through the backlight self-inspection system in the display device 100, the working state log file of the backlight system is generated through analysis and processing, the log file is stored in the display device, when the backlight system of the display device 100 is abnormal, a maintenance worker only needs to call the log file, the abnormal condition of the backlight system can be analyzed and processed in time, the situation that the maintenance worker needs to arrive at a production line site or return the display device 100 for repair is avoided, and the maintenance efficiency is improved. The display device 100 may be a mobile phone as shown in fig. 4, or may be a computer, a television, an intelligent wearable display device, and the like, which is not limited in this embodiment of the present invention.
Optionally, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the following steps:
s101, obtaining working parameters of the backlight source, wherein the working parameters of the backlight source comprise a working current value.
And S102, determining the working backlight value of the backlight source according to the working current value of the backlight source.
S103, judging whether the backlight source works abnormally or not according to the working backlight value and the preset backlight value of the backlight source.
According to the invention, by judging the working state of the backlight source in advance, maintenance personnel can intuitively know whether the backlight source is in an abnormal state, the workload of the maintenance personnel is reduced, and the working efficiency of the maintenance personnel is improved. Through the work backlight value of backlight and the comparison of predetermineeing the backlight value, can the operating condition of automated inspection backlight, need not to utilize external equipment to detect specially, improve the intellectuality that detects to when the backlight takes place unusually, maintenance personal can audio-visually know the fault situation, promoted the efficiency that detects, reduce maintenance cycle, reinforcing customer experience feels.
Of course, the storage medium provided by the embodiments of the present invention contains computer-executable instructions, and the computer-executable instructions are not limited to the method operations described above, and may also perform related operations in the backlight self-test method provided by any embodiment of the present invention.
Based on the understanding that the technical solutions of the present invention can be embodied in the form of software products, such as floppy disks, Read-Only memories (ROMs), Random Access Memories (RAMs), flash memories (F L ASHs), hard disks or optical disks of a computer, etc., and include instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods according to the embodiments of the present invention.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious modifications, rearrangements, combinations and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. Backlight self-checking system, characterized by, including:
the device comprises a backlight source, a sampling unit and a processing unit;
the sampling unit is electrically connected with the backlight source; the sampling unit is used for collecting working parameters of the backlight source; the working parameters of the backlight source comprise working current values;
the processing unit is electrically connected with the sampling unit and used for determining the working backlight value of the backlight source according to the working current value of the backlight source and judging whether the backlight source works abnormally or not according to the working backlight value of the backlight source and a preset backlight value.
2. The backlight self-inspection system of claim 1, wherein the sampling unit is connected in series with a positive pole of the backlight or a negative pole of the backlight.
3. The backlight self-inspection system of claim 1, wherein the sampling unit comprises a sampling resistor.
4. The backlight self-inspection system of claim 1, further comprising a memory; the memory is electrically connected with the processor unit; and the memory is used for storing the working parameters of the backlight source after the backlight source is determined to be abnormal in working.
5. A backlight self-checking method, performed by the backlight self-checking system of any one of claims 1-4, comprising:
obtaining working parameters of a backlight source, wherein the working parameters of the backlight source comprise a working current value;
determining a working backlight value of the backlight source according to the working current value of the backlight source;
and judging whether the backlight source works abnormally or not according to the working backlight value and the preset backlight value of the backlight source.
6. The backlight self-checking method according to claim 5, wherein the determining the operating backlight value of the backlight source according to the operating current value of the backlight source comprises:
the operating backlight value increases as the ratio of the operating current value to the maximum operating current value increases.
7. The backlight self-checking method of claim 5, wherein determining whether the backlight source is abnormal according to the working backlight value and a preset backlight value of the backlight source comprises:
when the deviation rate of the backlight value is larger than a preset deviation rate, determining that the backlight source works abnormally;
the relation formula satisfied by the backlight value deviation ratio includes a ratio of a difference value between the preset backlight value and the working backlight value to the preset backlight value.
8. The backlight self-test method according to claim 5, the backlight self-test system further comprising a memory electrically connected to the processing unit, wherein the backlight self-test method further comprises:
and after the backlight source works abnormally, sending the working parameters of the backlight source to the memory.
9. A display device comprising the backlight self-inspection system of any one of claims 1-4.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the backlight self-test method according to any one of claims 5 to 8.
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