CN111323770A - Test positioning system and method thereof - Google Patents
Test positioning system and method thereof Download PDFInfo
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- CN111323770A CN111323770A CN201811525311.4A CN201811525311A CN111323770A CN 111323770 A CN111323770 A CN 111323770A CN 201811525311 A CN201811525311 A CN 201811525311A CN 111323770 A CN111323770 A CN 111323770A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/74—Systems using reradiation of radio waves, e.g. secondary radar systems; Analogous systems
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Abstract
The invention provides a test positioning system and a method thereof.A plurality of machines to be tested positioned on a rack of a test station are connected to a plurality of exchangers supporting different transmission speeds arranged on the test station according to corresponding test requirements, and then a test host sends out detection signals to the machines to be tested so as to receive corresponding response signals; the test host acquires configuration data for the connection relation between the connection parts and the machines to be tested, which are included in the exchangers, based on the response signals; and the test host calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data. Therefore, a plurality of switches can be configured on the rack of a single test station to test different batches of machines to be tested.
Description
Technical Field
The present invention relates to a positioning system and a method thereof, and more particularly, to a test positioning system and a method thereof.
Background
The production line tests the machine to be tested by connecting with the network, each test station is connected with the network according to the switch configured by the test station, and the test positioning system also positions the machine to be tested by depending on the access state between the switch and the network card of the machine to be tested. Wherein the switch is bound to the test station in a one-to-one relationship.
However, when a machine under test (i.e., a new model) appears that requires testing using switches of different wire speeds, the switches of the current test station may not be able to meet the test requirements. If the test area is enlarged, the production cost and the consumption of production space and time are increased. If the branching test is performed according to the new model or the old model, the test station is wasted. If the testing area of the factory is limited, the binding relationship between the testing stations and the switches needs to be modified manually before the testing of the machines to be tested in different batches (i.e. new and old machines) is performed, which wastes labor and time.
In summary, it can be seen that there are problems in the prior art that the switch needs to be replaced manually and the association between the binding test station and the switch needs to be modified before the machine to be tested with different test requirements due to the one-to-one binding between the switch and the test station is tested, which wastes manpower and time, increases the production cost due to the need to enlarge the test area, or wastes the test station due to the need to perform the branching test.
Disclosure of Invention
The invention provides a test positioning system and a method thereof.
First, the present invention provides a test positioning system, which includes: more than two exchangers, a plurality of machines to be tested and a test host. The switches are arranged at the test station and used for supporting different transmission speeds, and each switch comprises a plurality of connecting parts. The machines to be tested are arranged on the rack positioned at the test station, and are connected with the connecting parts in a one-to-one mode according to the corresponding test requirements. The testing host is electrically connected with the exchangers and comprises a processing unit, a connection positioning program and a storage unit, wherein the storage unit stores the connection positioning program, and the processing unit is used for executing the connection positioning program. Wherein, the connection positioning program comprises the following steps: the processing unit sends out detection signals which are respectively transmitted to the machines to be detected through the connecting parts; the processing unit receives a response signal of each machine to be tested to the detection signal; the processing unit identifies the connecting parts of the exchangers currently connected to each machine to be tested based on the response signals; the processing unit obtains configuration data, and the configuration data maps the connection relation between the connection parts and the machines to be tested; and the processing unit calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data.
In addition, the invention provides a test positioning method, which comprises the following steps: providing a test positioning system which comprises more than two exchangers, a plurality of machines to be tested and a test host, wherein the test host comprises a processing unit, a connection positioning program and a storage unit, and the storage unit stores the connection positioning program; arranging the switches on a test station and supporting different transmission speeds, wherein each switch comprises a plurality of connecting parts; the machines to be tested are arranged on the rack positioned at the test station and are connected with the connecting parts in a one-to-one mode according to the corresponding test requirements; electrically connecting the test host to the exchangers; and the processing unit executes a connection positioning program, wherein the connection positioning program comprises the following steps: the processing unit sends out detection signals which are respectively transmitted to the machines to be detected through the connecting parts; the processing unit receives a response signal of each machine to be tested to the detection signal; the processing unit identifies the connecting parts of the exchangers currently connected to each machine to be tested based on the response signals; the processing unit obtains configuration data, and the configuration data maps the connection relation between the connection parts and the machines to be tested; and the processing unit calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data.
The system and the method disclosed by the invention are different from the prior art in that after a plurality of machines to be tested on a rack of a test station are connected to a plurality of exchangers supporting different transmission speeds on the test station according to corresponding test requirements, a test host sends out detection signals to the machines to be tested so as to receive corresponding response signals; the test host acquires configuration data for the connection relation between the connection parts and the machines to be tested, which are included in the exchangers, based on the response signals; and the test host calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data.
Through the technical means, the invention can deploy new exchangers under the condition that the number of the existing test stations is not changed, so that the new exchangers and the old exchangers exist in the same test station at the same time, and the exchanger can be selected for access according to the corresponding test requirements of the machine to be tested no matter the machine to be tested is an old machine type or a new machine type, so that the test host can obtain the connection relation between each machine to be tested and the exchanger and which test position on the rack thereof through the connection positioning program, thereby achieving the technical effects of saving space and improving the utilization rate of the test stations.
Drawings
FIG. 1 is a system block diagram of an embodiment of a test position location system of the present invention.
FIG. 2 is a flowchart of a method of the test positioning system of FIG. 1 for performing an embodiment of a test positioning method.
Fig. 3 is a flowchart of a method of an embodiment of a link-locating procedure executed by the processing unit of fig. 1.
Description of the symbols:
50 processing unit
60 link positioning procedure
70 storage unit
80 authentication procedure
90 test procedure
100 test positioning system
110 exchanger
120 machine under test
130 test host
Detailed Description
The following detailed description of the embodiments of the present invention will be provided in conjunction with the accompanying drawings and examples, so that how to implement the technical means for solving the technical problems and achieving the technical effects of the present invention can be fully understood and implemented.
Referring to fig. 1 and fig. 2, fig. 1 is a system block diagram of an embodiment of a test positioning system of the present invention, and fig. 2 is a flow chart of an embodiment of a test positioning method executed by the test positioning system of fig. 1. In the present embodiment, the test positioning system 100 includes: the method includes steps of two or more switches 110, a plurality of machines under test 120, and a test host 130, wherein the test host 130 includes a processing unit 50, a connection positioning program 60, and a storage unit 70, and the storage unit 70 stores the connection positioning program 60 (step 210). The number of the switches 110 may be, but not limited to, two, and the number of the devices 120 to be tested may be, but not limited to, eight, but the present embodiment is not intended to limit the invention, and may be adjusted according to actual requirements.
The switch 110, the machine under test 120, the test host 130, the processing unit 50, the connection positioning program 60, and the storage unit 70 can be implemented by various methods, including software, hardware, firmware, or any combination thereof. The techniques presented in the embodiments may be stored on a machine-readable storage medium using software or firmware, such as: read Only Memory (ROM), Random Access Memory (RAM), magnetic disk storage media, optical storage media, flash memory devices, etc., and can be implemented by one or more general-purpose or special-purpose programmable microprocessors. The switch 110, the machine under test 120, and the test host 130 may be connected to each other in a wireless or wired manner for transmitting signals and data.
The switches 110 are disposed in the test station and support different transmission speeds, wherein each switch 110 includes a plurality of connections (step 220). In other words, the two switches 110 of the present embodiment can support 1G and 10G transmission speeds, respectively, and each switch 110 can include eight connecting portions, but the present embodiment is not limited to the present invention and can be adjusted according to actual requirements. Each switch 110 may include a number of connections equal to a number of test sites included in a rack located at the test station.
The dut 120 is configured on a rack located at a testing station, and the connecting portions are connected in a one-to-one manner according to their corresponding testing requirements (step 230). More specifically, after the equipments 120 to be tested on the assembly line are assembled, the field operator arranges the equipments 120 to be tested on the corresponding rack according to the test position data corresponding to each of the equipments 120 to be tested output by the intelligent test station management system, moves the equipments 120 to be tested to the corresponding test station according to the test position data corresponding to the rack fully loaded with the equipments 120 to be tested output by the intelligent test station management system, and connects the equipments 120 to be tested to the connection portion of the corresponding switch 110 according to the test requirement corresponding to each of the equipments 120 to be tested (i.e. the equipments 120 to be tested of different models are connected to the respective switch 110).
The testing host 130 is electrically connected to the switches 110 (step 240), and the processing unit 50 is configured to execute the connection positioning procedure 60 (step 250). In other words, after the different types of the devices 120 under test access the respective switches 110, the test host 130 is electrically connected to the switches 110, so that the processing unit 50 of the test host 130 executes the connection positioning program 60.
Referring to fig. 1 and 3, fig. 3 is a flowchart illustrating a method of an embodiment of a link positioning procedure executed by the processing unit of fig. 1. In this embodiment, the connection positioning procedure includes the following steps: the processing unit sends out detection signals, and the detection signals are respectively transmitted to the machines to be tested through the connecting parts (step 310); the processing unit receives a response signal from each of the testers to the detection signal (step 320); the processing unit identifies the connection parts of the switches currently connected to each machine under test based on the response signals (step 330); the processing unit obtains configuration data, and the configuration data maps the connection relation between the connection parts and the machines to be tested (step 340); and the processing unit calculates and obtains which test position each of the dut is located on the rack according to the configuration data and the configuration data (step 350).
More specifically, the processing unit 50 transmits a detection signal to the dut 120 connected to the corresponding connection through the connection of each switch 110 (step 310), and when any connection is connected to the dut 120, the dut 120 receives the detection signal and generates a response signal accordingly, and then transmits the response signal to the processing unit 50 through the connection correspondingly connected thereto (step 320). Through steps 310 to 320, the processing unit 50 may be configured to detect whether each connection portion is correspondingly connected to the dut 120, and receive a response signal returned by the dut 120 if the connection portion has the corresponding connected dut 120; if the connection part has no corresponding connected machine under test 120, the connection part is a null connection. The response signal returned by each dut 120 corresponding to the detection signal may include the identification information of each dut 120. In the embodiment, the identification information may be, but is not limited to, Media Access Control (MAC) information of a network card of the device under test 120, but the embodiment is not limited to the invention and can be adjusted according to actual requirements.
In step 330, since each piece of mac information has the model of the to-be-tested machine 120 bound, after the processing unit 50 receives the response signal (the identification information thereof) returned from the corresponding detection signal cable of each to-be-tested machine 120, the connection relationship between the connection portions currently connected with the to-be-tested machine 120 and the models of the to-be-tested machines 120 can be identified based on the response signal, and then configuration data can be obtained (step 340).
Before the rack with the full-loaded machines 120 to be tested moves to the corresponding test stations, the intelligent test station management system may output the test position data corresponding to each machine 120 to be tested so that the field operator may configure the machines 120 to be tested on the corresponding rack, and therefore, the processing unit 50 may calculate and obtain which test position each machine 120 to be tested is configured at on the rack according to the configuration data (including the test position data corresponding to each machine 120 to be tested) and the configuration data. Each testing position is a position where each device under test 120 can be configured on the rack. In this embodiment, the number of test positions on the rack may be, but is not limited to, eight, but the present invention is not limited thereto, and the number may be adjusted according to actual requirements.
Through the steps, the plurality of exchangers can be allowed to be correspondingly arranged on one test station, and the connection relation between the machine to be tested and the exchanger and the test position of the machine to be tested on the rack can be judged no matter which exchanger is connected with the machine to be tested, so that the technical effect of positioning each machine to be tested before the test program is carried out on the machine to be tested is achieved.
In addition, referring to fig. 1, the test host 130 may further include a verification program 80, the storage unit 70 stores the verification program 80, the processing unit 50 is configured to execute the verification program 80, and the verification program 80 may include the following steps: the processing unit 50 determines whether the switch 110 connected to each dut 120 is faulty according to the configuration data and the test script corresponding to each dut 120. Since the field operator connects each dut 120 to the corresponding connection of the switch 110 according to the testing requirement corresponding to the dut 120, the verification process 80 can be executed before the testing host 130 performs the testing process on each dut 120 to avoid any error by the field operator. More specifically, since the test script can be, but is not limited to, a script planned by the maintenance engineer according to the test requirements of the customer, that is, a script planned according to the test requirements corresponding to each of the to-be-tested machines 120, the processing unit 50 can obtain the connection relationship between each of the to-be-tested machines 120 and the switch 110 according to the configuration data, and compare whether there is an error in the switch 110 connected to each of the to-be-tested machines 120 according to the connection relationship between each of the to-be-tested machines 120 and the switch and the test script corresponding to each of the to-be-tested machines 120. When the processing unit 50 finds that there is a fault in the switch 110 connected to a certain machine under test 120, it can remind the operator to make an adjustment in the field by sound or image.
Furthermore, referring to fig. 1, the test host 130 may further include a test program 90, the storage unit 70 stores the test program 90, and the processing unit 50 is configured to execute the test program 90, where the test program 90 may include the following steps: setting each switch 110 to master mode (master) and each machine under test 120 to slave mode (slave); the test host 130 sends a test signal to the correspondingly connected to-be-tested machine 120 through each connecting part according to the configuration data and the test script corresponding to each to-be-tested machine so as to test the correspondingly connected to-be-tested machine 120; and each switch 110 records the test result of each dut 120 and returns to the test host 130. In other words, the test host 130 may generate a test signal corresponding to each of the devices under test 120 according to the configuration data and the test script corresponding to each of the devices under test 120, and transmit the test signals to the corresponding devices under test 120 through the connecting portions, so as to test the devices under test 120 respectively. When each of the dut 120 finishes testing, the testing result is returned to the corresponding switch 110, so that the switches 110 record all the testing results and return all the testing results to the testing host 130, so that the processing unit 50 executes the testing program 90.
In summary, it can be seen that the difference between the present invention and the prior art is that after a plurality of machines to be tested on a rack of a test station are connected to a plurality of switches supporting different transmission speeds on the test station according to their corresponding test requirements, a test host sends out detection signals to the machines to be tested to receive corresponding response signals; the test host acquires configuration data for the connection relation between the connection parts and the machines to be tested, which are included in the exchangers, based on the response signals; the test host acquires which test position each machine to be tested is configured on the rack according to the configuration data, so that the technical means can solve the problems existing in the prior art, and further can allow a plurality of exchangers to be correspondingly configured on one test station under the condition that the number of the existing test stations is not changed, and no matter which type of machine to be tested is, one exchanger can be selected to access according to the corresponding test requirement, so that the test host can acquire the connection relation between each machine to be tested and the exchanger and which test position on the rack through a connection positioning program, and further the technical effects of saving space and improving the utilization rate of the test stations are achieved.
Although the present invention has been described with reference to the foregoing embodiments, it should be understood that various changes and modifications can be made therein by those skilled in the art without departing from the spirit and scope of the invention.
Claims (10)
1. A test positioning system, comprising:
more than two switches are arranged at the test station and used for supporting different transmission speeds, and each switch comprises a plurality of connecting parts;
the multiple to-be-tested machines are arranged on the rack positioned at the testing station and are connected with the connecting parts in a one-to-one mode according to corresponding testing requirements; and
the testing host computer, the electrical behavior links to these exchangers, the testing host computer includes processing unit, connection positioning procedure and storage unit, the storage unit stores the connection positioning procedure, the processing unit is used for carrying out the connection positioning procedure, the connection positioning procedure includes the following steps:
the processing unit sends out detection signals which are respectively transmitted to the machines to be detected through the connecting parts;
the processing unit receives a response signal from each machine to be tested to the detection signal;
the processing unit identifies the connecting parts of the exchangers currently connected to each machine to be tested based on the response signal;
the processing unit obtains configuration data which maps the connection relation between the connection parts and the machines to be tested; and
the processing unit calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data.
2. The system of claim 1, wherein the test host further comprises a verification program, the storage unit stores the verification program, the processing unit executes the verification program, and the verification program comprises: the processing unit judges whether the exchanger connected with each machine to be tested has errors according to the configuration data and the test script corresponding to each machine to be tested.
3. The test fixture of claim 1 wherein the test host further comprises a test program, the storage unit stores the test program, the processing unit executes the test program, the test program comprises:
setting each exchanger as a master mode and each machine to be tested as a slave mode;
the test host sends a test signal to the correspondingly connected machine to be tested through each connecting part according to the configuration data and the test script corresponding to each machine to be tested so as to test the correspondingly connected machine to be tested; and
each exchanger records the test result of each machine to be tested and returns the test result to the test host.
4. The test positioning system of claim 1, wherein the response signal of each of the plurality of test machines to the detection signal comprises identification information of each of the plurality of test machines.
5. The test fixture of claim 4 wherein the identification information is media access control information.
6. A test positioning method is characterized by comprising the following steps:
providing a test positioning system which comprises more than two exchangers, a plurality of machines to be tested and a test host, wherein the test host comprises a processing unit, a connection positioning program and a storage unit, and the storage unit stores the connection positioning program;
arranging the switches on a test station and supporting different transmission speeds, wherein each switch comprises a plurality of connecting parts;
the machines to be tested are arranged on the rack positioned at the test station and are connected with the connecting parts in a one-to-one mode according to the corresponding test requirements;
electrically connecting the test host to the exchangers; and
the processing unit executes the connection positioning program, and the connection positioning program comprises the following steps:
the processing unit sends out detection signals which are respectively transmitted to the machines to be detected through the connecting parts;
the processing unit receives a response signal from each machine to be tested to the detection signal;
the processing unit identifies the connecting parts of the exchangers currently connected to each machine to be tested based on the response signal;
the processing unit obtains configuration data which maps the connection relation between the connection parts and the machines to be tested; and
the processing unit calculates and obtains which test position of each machine to be tested on the rack according to the configuration data and the configuration data.
7. The test positioning method as claimed in claim 6, wherein the test host further comprises a verification program, the storage unit stores the verification program, the processing unit executes the verification program, and the verification program comprises: the processing unit judges whether the exchanger connected with each machine to be tested has errors according to the configuration data and the test script corresponding to each machine to be tested.
8. The test positioning method of claim 6, wherein the test host further comprises a test program, the storage unit stores the test program, the processing unit executes the test program, and the test program comprises:
setting each exchanger as a master mode and each machine to be tested as a slave mode;
the test host sends a test signal to the correspondingly connected machine to be tested through each connecting part according to the configuration data and the test script corresponding to each machine to be tested so as to test the correspondingly connected machine to be tested; and
each exchanger records the test result of each machine to be tested and returns the test result to the test host.
9. The test positioning method as claimed in claim 6, wherein the response signal of each of the plurality of the apparatuses under test to the detection signal includes identification information of each of the plurality of the apparatuses under test.
10. The test localization method of claim 9, wherein the discrimination information is medium access control information.
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